38 results about "Thz radiation" patented technology

A THz measuring method and a THz device for measuring a container with a joint, in particular, a blow mold container with a pinch-off seam, where a THZ sensor is adjusted relative to a container region in multiple positions with different orientations of the optical axis, THz radiation is emitted as a non-parallel beam bundle from the THz sensor towards the container region, and THz radiation partially reflected on the interior surface and the exterior surface of the container area is received, and one or more of the characteristics of the joint are determined.

The invention provides a ferromagnetic artificial neuron film and application thereof. The ferromagnetic artificial neuron film comprises a transparent substrate and a ferromagnetic heterojunction constructed on the transparent substrate, the ferromagnetic heterojunction comprises a ferromagnetic alloy layer, a heavy metal layer and an anti-oxidation layer. Nonlinear spin oscillation of the ferromagnetic artificial neuron film is excited through femtosecond laser, terahertz radiation with intensity nonlinear response is directly generated, and the ferromagnetic artificial neuron film serves as an artificial neuron of a space optical neural network. The activation function response meeting the performance requirement of the artificial neuron can be effectively generated without introducing the regulation and control of an external magnetic field, and a better artificial neuron function facing the optical space neural network is realized.

A method for quantitative detection of glucose in a liquid sample using continuous wave (CW) Terahertz (THz) spectroscopy such as THz cross-correlation spectroscopy (CCS) or THz frequency domain spectroscopy (FDS) in an attenuated total reflection (ATR) setup is disclosed. A continuous-wave (CW) light signal is used to generate a THz signal reflecting off an internal face of a sample surface of an ATR element. An electric detection signal resulting from an interference between THz radiation from the sample and the CW light signal can be recorded while a phase or a frequency domain parameter of the CW light signal is adjusted. A spectrum of the electric detection signal as a function of an adjustment of a phase or a frequency domain parameter is recorded while an external face of the sample surface is in contact with a sample comprising a liquid solution of glucose. The recorded spectrum is analysed using a supervised machine learning algorithm trained on similarly recorded spectra from similar liquid solutions with known glucose levels to estimate a glucose level in the liquid solution of the sample. The method can be used for quantitative, non-invasive, in-vivo detection of glucose in living subjects and other active metabolic systems.

A method for determining the thickness of a plurality of coating layers. The method comprises the steps of performing a calibration analysis on calibration data to determine initial values and search limits of optical parameters of the plurality of coating layers, irradiating the plurality of layers with a pulse of THz radiation in the range from 0.01 THz to 10 THz, detecting the reflected radiation to produce a sample response derived from the reflected radiation, producing a synthesized waveform using the optical parameters and predetermined initial thicknesses of the layers, varying the thicknesses and the optical parameters within the search limits to minimize the error measured between the sample response and the synthesized waveform, and outputting the thicknesses of the layers.

The invention relates to a THz sensor (2) for measuring an object to be measured (6), in particular, a pipe, the THz sensor (2) comprising:a THz transceiver (10) for emitting and receiving THz radiation,a lens (14) for bundling the THz radiation emitted by the THz transceiver (10) and emitting a THz transmission beam (8) along the optical axis (A) and for receiving a THz reflection beam (15),a support device (11), on which the lens (14) and / or the THz transceiver (10) is accommodated or fastened.Hereby, it is provided thata THz radiation-influencing compensation formation for modifying and / or reducing incident THz radiation is provided in a compensation area between the lens and the support device (11).

A physiological implement includes a terahertz material, a material that emits terahertz radiation in the frequency range of about 0.1-10 THz. The physiological implement may be a massage device and the massage device may be configured to vibrate, or a compression sleeve configured to extend around a limb of a person, a therapeutic composition for application to the skin of a person, a lens that is configured to extend over a light emitting device or laser, an air moving device, such as a hair dryer, a patch for application to a person's body, a sexual implement, an electronic device cover, a sleeping fabric or bag, a garment and the like.

Provided is a terahertz radiation detection device capable of efficiently detecting radiation in a long-wavelength region from far-infrared light to at or above the terahertz range. The terahertz radiation detection device includes an imaging lens, a detection element, and a filter unit. The imaging lens faces a subject. The detection element detects terahertz radiation generated from the subject among light incident through the imaging lens. The filter unit includes: a silicon substrate that is disposed closer to the subject than the detection element and absorbs visible light and near-infrared light; and a plurality of structures periodically arranged on the silicon substrate. The filter unit transmits THz radiation incident on the structures. The structures prevent the reflection of light from far-infrared light wavelengths to predetermined wavelengths including THz radiation wavelengths.

The present invention discloses a terahertz (THz) near-field fluorescence signal analysis system based on a scanning tunneling microscope (STM). The system comprises a THz radiation system, a THz transmission-characterization-modulation system, a THz coupling and fluorescence collection system, and a THz fluorescence data analysis system, all connected in sequence. The present invention enhances the ability to control THz characteristics such as polarity, carrier phase, polarization direction, intensity, and operating mode, and performs autocorrelation splitting and combining of THz beams, as well as measurement of far-field THz time-domain waveforms. By adopting a structure of a symmetrical plane mirror and an off-axis parabolic mirror that moves with the needle tip, THz can be conveniently coupled to the vicinity of the STM needle tip, and the THz incident direction can be planned in a two-dimensional plane, avoiding complex analysis in three-dimensional space. The fluorescence collection efficiency is significantly increased by designing an independent fluorescence collection structure. LABVIEW software is used to achieve synchronous analysis of THz near-field fluorescence signal measurement and STM operating system, expanding the research capabilities of THz near-field fluorescence phenomena.

The invention relates to the technical field of terahertz camera real-time imaging, and discloses a terahertz camera-based portable terahertz real-time imaging system, which comprises an optical part, a circuit part and a control part, the optical portion includes a terahertz photoconductive antenna for emitting pulsed terahertz radiation. Through the arrangement of the optical part, the circuit part and the control part, a complete and stable imaging system can be formed, and through the arrangement of the terahertz photoconductive antenna and the TPX lens group in the optical part, the purpose of greatly reducing the loss of terahertz radiation in the transmission process can be achieved; and optical images can be orderly presented on the sensor array of the terahertz camera through the terahertz lens, so that the purpose of better imaging effect is achieved, and the whole terahertz imaging technology has the effects of low cost and portability along with the arrangement of the circuit part and the control part.

A physiological implement includes a terahertz material, a material that emits terahertz radiation in the frequency range of about 0.1-10 THz. The physiological implement may be a massage device and the massage device may be configured to vibrate, or a compression sleeve configured to extend around a limb of a person, a therapeutic composition for application to the skin of a person, a lens that is configured to extend over a light emitting device or laser, an air moving device, such as a hair dryer, a patch for application to a person's body, a sexual implement, an electronic device cover, a sleeping fabric or bag, a garment and the like.

The present invention relates to a method and a system for manufacturing an electrically conductive layer having functionality, in particular electrical conductivity, which is as homogeneous as possible, specified, or locally different in a defined way. In the method, layer material is applied to a surface and is converted, by the action of preferably at least one energetic beam, into a preliminary electrically conductive layer having higher electrical conductivity. The preliminary electrically conductive layer is then scanned with at least one THz beam of continuous THz radiation, with spatial resolution. From a measurement of the reflectivity of the preliminary electrically conductive layer with respect to the THz beam, spatially resolved electrical conductivity of said layer is determined. If points in the preliminary electrically conductive layer which have too low or too high an electrical conductivity are detected, said points are then locally post-treated with the energetic beam in order to modify the electrical conductivity in order to obtain the electrically conductive layer having functionality which is as homogeneous as possible, specified, or locally different in a defined way. The method allows high-quality electrically conductive layers to be produced on an industrial scale.

A method for determining the thickness of a plurality of coating layers. The method comprises the steps of performing a calibration analysis on calibration data to determine initial values and search limits of optical parameters of the plurality of coating layers, irradiating the plurality of layers with a pulse of THz radiation in the range from 0.01 THz to 10 THz, detecting the reflected radiation to produce a sample response derived from the reflected radiation, producing a synthesized waveform using the optical parameters and predetermined initial thicknesses of the layers, varying the thicknesses and the optical parameters within the search limits to minimize the error measured between the sample response and the synthesized waveform, and outputting the thicknesses of the layers.

An antenna comprising: input and output coaxial horn antennas coupled with a self-assembled helical slow-wave structure cradled in a groove in a silicon-on-insulator wafer.

The invention provides a terahertz radiation source based on an AZO (aluminum-doped zinc oxide) material and a testing method of the terahertz radiation source, and the terahertz radiation source comprises an AZO thin film and a pump light source. The material is characterized in that the material is composed of a substrate, an aluminum oxide (Al2O3) layer and an AZO layer. A test material needs to be excited by using a femtosecond laser with specific parameters under an oblique incidence condition, and wide-spectrum terahertz radiation with relatively high power can be generated. The invention can be used for an efficient and transparent thin film wide-spectrum terahertz source, and can be widely used for terahertz devices and related instruments and equipment.

The present invention relates to a method and a system for producing an electrically conductive layer with as homogeneous, predetermined, or defined locally different functionality as possible, in particular electrical conductivity. In the method, layer material is applied to a surface and converted into a preliminary electrically conductive layer with higher electrical conductivity by exposure, preferably to at least one energetic beam. The preliminary electrically conductive layer is then spatially resolved with at least one THz beam of continuous THz radiation. A spatially resolved electrical conductivity of this layer is determined from a reflectivity measurement of the THz beam at the preliminary electrically conductive layer.If areas in the preliminary electrically conductive layer are identified that exhibit either too low or too high electrical conductivity, these areas are then locally treated with the energetic beam to modify the electrical conductivity in order to achieve the most homogeneous, predefined, or locally variable functionality possible in the electrically conductive layer. This process enables the production of high-quality electrically conductive layers on an industrial scale.

The invention relates to the field of optical engineering, and more particularly to detectors of terahertz (THz) radiation (having a frequency of 0.1-10 THz or a wavelength of 30-3000 μm), and can be used for the broadband detection of pulsed or continuous THz radiation or for measuring the power thereof. The technical result achieved by the invention consists in permitting high-sensitivity detection of continuous and pulsed THz radiation having a power of up to 500 mW at a temperature of from -10°C to +50°C in a frequency range of 0.1-10 THz with a sensitivity of not less than 30 mV / W, a noise equivalent power of at least 0.15 nW⋅Hz-1 / 2, a response time of not more than 20 μs and a modulation frequency of 1-40 Hz. This technical result is achieved by the use in the detector structure of a thermoelectric material that is highly sensitive to radiation in the THz frequency range, and also by the absence of resonant elements, such as an antenna and a metasurface, the use of which would cause the spectrum of detectable radiation to be narrowed to a specific frequency range. As a sensitive thermoelectric element, it is proposed to use thermoelectric branches made of a thin film of a solid solution of bismuth-antimony Bi1-xSbx.

This invention relates to a terahertz-X-ray generation device based on a free-electron laser, comprising an ultrafast laser system and, in sequence, an injector, a laser electron beam modulation system, a linear acceleration section, an X-ray radiation section, a terahertz radiation section, and an X-ray delay system. The ultrafast laser system includes an ultrafast laser, a pulse broadening and beam splitting system, a first beam splitter, and a first mirror. The ultrafast laser is configured to generate ultrafast laser pulses. The first beam splitter divides the ultrafast laser pulses into a first ultrafast laser path and a second ultrafast laser path. The first ultrafast laser path is transmitted to the injector, and the second ultrafast laser path is transmitted to the pulse broadening and beam splitting system. Upon receiving the first ultrafast laser path, the injector generates an electron beam. The pulse broadening and beam splitting system generates a double-pulse laser based on the second ultrafast laser path and transmits the double-pulse laser to the laser electron beam modulation system. The terahertz-X-rays generated by this invention exhibit high pulse energy, narrow spectral bandwidth, and good tunability.

The invention relates to a method for assembling an optical device compatible with terahertz radiation, comprising the following steps: providing first and second silicon elements each having a planar face; depositing on the planar face of the first element an adhesive having the following characteristics: a) epoxy resin curable by heat, b) Brookfield viscosity CP51, 25° C., speed 5 rpm: 50000 mPa·s±20%, and c) absence of fillers to make the adhesive electrically or thermally conductive; and applying the planar face of the second element to the adhesive deposited on the planar face of the first element.

The invention relates to a method for generating terahertz radiation and a THz radiation source. In the method according to the invention, a pump beam (14) emitted by a pump beam source is incident on a block of semiconductor nonlinear optical medium (10) having plane-parallel front and rear boundary surfaces (11, 12), wherein the pump beam (14) is decomposed into a set of sub pump beams by refraction on a periodic structure (13) formed by pairs of planar surfaces formed in the front boundary surface of the block. The sub pump beams travel in the direction of the angle y required to satisfy the velocity matching condition v p, cs cos(γ) = V THz,f . The envelope of the pump pulse front segments propagating in the sub pump beam segments propagates at the propagation velocity V THz,f of the terahertz radiation in a direction perpendicular to the rear boundary surface (12), which is the exit plane of the optical medium (10), and generates THz radiation in the semiconductor optical medium (10) by optical rectification in a manner satisfying the velocity matching condition v p,cs cos(γ) = V THz,f ; here v p,cs is the group velocity of the pump beam (14), V THz,f is the phase velocity of the THz radiation generated, and y is the angle between the envelope of the pulse front and phase front of the pump beam (14).

The present invention relates to a terahertz radiation system with adjustable spatial matching between laser filamentation and a liquid medium, belonging to the field of terahertz technology. The present invention includes an excitation module for providing a pulsed laser that can achieve breakdown of the liquid medium under the focusing action of a focusing device, and the pulse energy, pulse width, focusing energy, phase, and polarization are adjustable within a certain range, a medium module for providing a circulating liquid medium with adjustable shape, size, position, and flow rate, and a monitoring module for monitoring the spatial matching condition of the focusing region. Guided by the observation of the monitoring module, the present invention realizes the optimal spatial matching between the laser focusing region and the liquid medium through the collaborative work of the excitation module and the medium module, reduces the absorption of terahertz radiation by the medium on the premise of sufficient interaction between the laser and the medium, and significantly improves the terahertz excitation efficiency.

The invention relates to a method for processing data associated with a model, the model characterising a propagation of THz radiation, for example in the region of at least one Terahertz device and / o

The invention discloses a self-focusing strong-field terahertz radiation source system, and belongs to the technical field of terahertz application, the self-focusing strong-field terahertz radiation source system comprises a laser, a laser beam expanding system and a self-focusing terahertz conversion system which are sequentially arranged, the laser is a femtosecond pulse laser, the laser beam expanding system comprises a plano-concave lens and a plano-convex lens I which are sequentially arranged, and the self-focusing terahertz conversion system comprises a plano-convex lens II and a plano-convex lens II which are sequentially arranged. The self-focusing terahertz conversion system comprises a sample support, a spintronics terahertz source film and permanent magnets, the sample support is a copper sample support, the spintronics terahertz source film grows on the substrate so as to be installed on the sample support, and the permanent magnets are symmetrically arranged on the two sides of the sample support. By adopting the system, high-intensity terahertz radiation can be realized under the conditions that complex optical elements are not increased and the system cost is not increased.

The invention discloses a terahertz near-field fluorescence signal analysis system based on a scanning tunneling microscope. The system comprises a THz radiation system, a THz transmission-characterization-modulation system, a THz coupling and fluorescence collection system and a THz fluorescence data analysis system which are connected in sequence. According to the invention, the capability of regulating and controlling the characteristics of THz polarity, carrier phase, polarization direction, intensity, working mode and the like is improved, and the self-correlation beam splitting and beam combining of THz beams and the measurement of far-field THz time domain waveforms are completed; by adopting a structure of a symmetrical plane mirror and an off-axis parabolic mirror which move along with a needle point, THz can be conveniently coupled to a position near the needle point of the scanning tunneling microscope, and the incident direction of the THz is planned on a two-dimensional plane, so that complex analysis in a three-dimensional space is avoided; by designing an independent fluorescence collection structure device, the fluorescence collection efficiency is remarkably improved; through LABVIEW software design, THz near-field fluorescence signal measurement and synchronous analysis of an STM operating system are realized, and the research capability of a terahertz near-field fluorescence phenomenon is expanded.

A system for measuring the coating thickness on a target surface includes a terahertz spectroscopy device and a reference image projector. The terahertz spectroscopy device includes a radiation head operable to project a terahertz radiation beam onto the target surface and receive the reflected beam. The reference image projector includes a visible light device and is operable to project a reference image onto the target surface using the visible light device. Visual characteristics of the reference image indicate at least one of a distance, a rotational alignment, and an angular alignment of the radiation head relative to the target surface.

An apparatus includes at least one Terahertz (THz) device that transmits or receives THz radiation or transmits and receives THz radiation. The apparatus also provides a flow of protective gas in at least one portion of the beam path of the THz radiation.

An illumination source emitting low-coherence electromagnetic radiation in the terahertz (THz) frequency range is disclosed. The source includes a THz radiation emitter that emits input THz radiation and an enclosure forming a cavity coupled to the THz radiation emitter. The enclosure includes an inner wall enclosing the cavity and having a reflective surface that reflects the input THz radiation within the cavity as circulating THz radiation, and an optical output port that allows a portion of the circulating THz radiation to exit from the cavity as output THz radiation after multiple reflections off the reflective surface, the output THz radiation having a reduced coherence compared to that of the input THz radiation. The source also includes an optical perturbation element that acts on the input or circulating THz radiation to contribute, along with the multiple reflections off the reflective surface, to achieving the reduced coherence of the output THz radiation.

Terahertz (THz) radiation detectors based on the rectification of a THz signal via the non-linear Hall effect in thin films of non-centrosymmetric layered topological semimetals are provided. The THz detectors, which enable sensitive, broadband, and fast room-temperature terahertz radiation detection, can be fabricated with electrostatic gates to tune the terahertz rectification.

The invention relates to an organic nonlinear crystal material of a thermally enhanced frequency multiplication signal, a preparation method and application thereof, when the temperature of the organic nonlinear crystal material of the thermally enhanced frequency multiplication signal rises to 373K, the organic nonlinear crystal material of the thermally enhanced frequency multiplication signal is a polar monoclinic system P21 space group, the cell parameters are # imgabs0 # # imgabs1 # beta = 92.651 + / -0.006 DEG C, Z = 2, and Z = 1. The organic nonlinear crystal material disclosed by the invention can enhance a nonlinear signal by heating, is simple in synthesis method, low in cost, mild in reaction condition and relatively high in stability, and is a thermally induced nonlinear signal enhanced organic molecular compound with relatively high nonlinear optical strength. The material has good application prospects in the fields of second-order nonlinear frequency doubling switches, THz radiation source devices, birefringent crystal devices and scintillation imaging devices.

The invention relates to an oscillator assembly for generating THz radiation with an active laser layer structure (10) based on a semiconductor material for emitting laser light (107) of at least one wavelength, the main radiation direction of the active laser layer structure being substantially perpendicular to the main radiation surface. A 2D grating structure (200) arranged substantially parallel to the primary radiation plane interacts with the active laser layer structure for causing the active laser layer structure to be excited to form two laser modes of different frequencies (f1, f2). Furthermore, the oscillator assembly comprises a mixer structure (30) arranged in the radiation direction, the mixer structure being designed to form a differential signal from the two laser modes, and the oscillator assembly comprises an absorber element (301) arranged downstream, the absorber element being opaque for the two laser modes.

The invention relates to a THz measuring method and a THz device for measuring a container (1) with a seam (4), in particular a blow-molded container with a crimp seam, wherein a THz sensor (8) is adjusted relative to a container area (3) to several positions (Pi) with different orientations of the optical axis (B), THz radiation is emitted as a non-parallel beam (20) from the THz sensor onto the container area, and partially reflected THz radiation (R) is received at the inner surface (17) and the outer surface (16) of the container area (3), and one or more of the following properties of the seam (4) are determined: a length in its longitudinal direction, a width in a transverse direction, a layer thickness profile of the layer thickness in the longitudinal direction and the transverse direction (Q), a wave wall thickness of one or two waves formed on an inner surface, a residual wall thickness in a depression (15) between two waves, a seam angle of the seam on the inner surface in a depression between two waves.