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87 results about "Thz time domain spectroscopy" patented technology

THz time-domain spectroscopy is used to characterize material properties by measuring the complex frequency response within the frequency range of 0.1 THz to tens of THz. In this regime various fundamental resonances can be found, such as electronic and phononic excitations in solid state materials.

Method for measuring concentrations of sulfate, nitrate solutions by utilizing terahertz time-domain spectroscopy

The invention relates to a method for measuring concentrations of sulfate, nitrate solutions by utilizing the terahertz time-domain spectroscopy. The method comprises the following steps: sample cells are selected, standard solution samples with different concentrations are prepared, terahertz time-domain spectra of the standard solution samples are measured, a terahertz time-domain spectra database of the standard solution samples is built, and the database comprises time-domain spectra, frequency-domain spectra, relation spectra of concentrations and absorption coefficients, relation spectra of concentrations and refractive indexes, relation spectra of concentrations and extinction coefficients of the standard solution samples. Terahertz time-domain spectra of the solutions to be measured are measured, the data is processed to obtain absorption coefficients of the solutions to be measured, and according to the terahertz time-domain spectra database of the standard solution samples, the concentrations of the solutions to be measured are analyzed and determined. The method utilizes the terahertz time-domain spectroscopy to measure solution concentrations, and is advantaged by simple operations, rapid measurement, simple data processing procedures, good repeatability, and high accuracy of results.
Owner:CHINA UNIV OF PETROLEUM (BEIJING)

Erosion morphology test method of thermal barrier coating based on terahertz technology

The invention provides an erosion morphology test method of a thermal barrier coating based on a terahertz technology. The method comprises the following steps of vertically emitting terahertz pulsesby using a reflective terahertz time-domain spectroscopy system to the thermal barrier coating; obtaining a time domain spectrogram; extracting the moment value of the front three times of reflectionpeaks in the spectrogram; obtaining the time delay of the two adjacent peaks; performing Fourier transform on the front three times of reflection peaks to obtain a frequency domain spectrogram; calculating the refractive index and the thickness of the ceramic layer of the thermal barrier coating; performing erosion on the thermal barrier coating; performing scanning; using the time-domain spectroscopy system for measurement so as to obtain a plurality of time-domain spectrograms; extracting the moment value of the first time reflection peak in the spectrogram; calculating the difference from the moment value of the first time reflection peak; calculating the thinning thickness value of the thermal barrier coating according to the difference value; obtaining the erosion morphology of the thermal barrier coating. The test method has the advantages that the step of measuring the refractive index of the thermal barrier coating is omitted; the thinning thickness of the thermal barrier coating after the erosion is calculated, so that the calculation by using the refractive index of the thermal barrier coating is not needed; therefore the error is reduced.
Owner:EAST CHINA UNIV OF SCI & TECH

Ultrafast RF spectrum measuring method and system

The invention discloses an ultrafast RF spectrum measuring method and an ultrafast RF spectrum measuring system based on all-optical Fourier transform and time-domain amplification. The ultrafast RF spectrum measuring method comprises the steps of: fully broadening an ultrashort optical pulse through dispersion to obtain a time-domain spectrum thereof; loading an RF signal to be measured onto the time-domain spectrum through intensity modulation; realizing inverse time-domain Fourier transform through subjecting the modulated time-domain spectrum to dispersion and compression; subjecting an optical signal carrying spectrum information of the signal to be measured in the time domain to time-domain stretching by adopting a time-domain lens magnification technology; and converting the obtained optical signal into an electrical signal, and acquiring accurate spectrum information through scaling and calibration. The ultrafast RF spectrum measuring system comprises a first ultrashort pulse light source, a first dispersion-compensation optical fiber, an MZ intensity modulator, a first single-mode optical fiber, a time-domain lens magnifying system, a photoelectric detector and a real-time oscilloscope. The ultrafast RF spectrum measuring method and the ultrafast RF spectrum measuring system have the advantages of realizing ultrafast RF spectrum measurement while ensuring high spectral resolution, having measurement frame rate up to 100 MHz, and are of great significance in application scenarios such as dynamic spectrum monitoring and transient spectrum capturing.
Owner:HUAZHONG UNIV OF SCI & TECH

Differential time domain spectroscopy method for measuring thin film dielectric properties

A non-contact, free-space method for determining the index of refraction of a thin film at a desired angular frequency. The method includes generating an input desired-frequency pulse and an optically detectable probe pulse. The thin film is moved in and out of the path of the input pulse, creating an output pulse that alternates between a transmitted signal, created when the film intercepts the input pulse path, and a reference signal, created when the sample is outside the input pulse path. The output pulse modulates the probe pulse, which is then detected with a photo detector, and the difference between the transmitted signal and the reference signal is calculated. The above steps are repeated over a plurality of delay times between the input pulse and the probe pulse until a complete field waveform of the differential signal is characterized. The index of refraction is calculated as a function of a ratio between the differential signal for the thin film and the reference signal. A complete field waveform of the reference signal may be characterized by repeating the above steps for a reference plate identical to the sample except having a non-transmissive film instead of the thin, transmissive film.
Owner:RENESSELAER POLYTECHNIC INST

Device for improving test accuracy of spectrum absorbance on basis of terahertz optical combs

ActiveCN106442378AAvoid the disadvantages of taking too long to scanAvoid imprecisionColor/spectral properties measurementsPulse beamFrequency standard
The invention relates to a device for improving the test accuracy of spectrum absorbance on the basis of terahertz optical combs. The device is characterized in that one of two ultrafast laser pulse beams with set repeat frequency difference is transmitted through a terahertz wave generating system to generate terahertz waves, terahertz wave signals and the other ultrafast laser pulse beam are respectively focused and are jointly transmitted into a photoconductive detection antenna, the terahertz waves can be quickly scanned by the aid of tiny repeat frequency difference between pump beams and probe beams, a digital converter is controlled by the aid of a cross-correlation instrument and a rubidium atom frequency standard, the signal acquisition time is prolonged to obtain time-domain spectra of continuous terahertz pulse chains, terahertz comb-shaped spectra are obtained by means of Fourier transformation, accurate change of the optical combs is compared before and after sample placement, and accordingly terahertz absorption spectrum lines of samples can be obtained. The device has the advantages that the shortcoming of excessive scanning time consumption of mechanical delay devices can be overcome, the problem of inaccuracy of existing terahertz super-continuous spectra due to laser pulse time jitter can be solved, and the test accuracy of the terahertz spectrum absorbance can be improved.
Owner:UNIV OF SHANGHAI FOR SCI & TECH

Glass fiber composite defect detecting method based on terahertz time-domain spectroscopy

The invention discloses a glass fiber composite defect detecting method based on terahertz time-domain spectroscopy. The method comprises the following steps: firstly, using a terahertz wave probe to scan a sample with the stepping frequency of 0.1mm/each time to 1mm/each time so as to obtain the terahertz time-domain transmission pulse of each scanning point of the sample; then analyzing the obtained time-domain transmission pulse data so as to obtain the time-domain transmission pulse amplitude Ii of each scanning point of the sample; comparing the time-domain pulse amplitude Ii of all samples so as to obtain the maximal value and the minimum value of the time-domain pulse amplitude of the sample; setting Imin corresponding gray value and Imax corresponding gray value for the obtained pulse amplitude Ii of each sample point, and solving the corresponding image gray value of the sample point i; and calculating the corresponding image gray values of all sample points so as to generate the gray-scale map of the sample. According to the invention, a transmission type terahertz time-domain spectral system is adopted to detect the composite material to extract the time-domain spectral data without the need of obtaining frequency domain data, the operation procedure is simple, and data acquisition is convenient.
Owner:开地(江苏)信息技术研究院有限公司

Terahertz time-domain spectrograph based on femtosecond laser

The invention discloses a terahertz time-domain spectrograph based on a femtosecond laser. The terahertz time-domain spectrograph has two modes of a transmission-type system and a reflection-type system. A terahertz wave generated by the focusing of the femtosecond laser is focused on a sample through a second off-axis parabolic mirror after being collimated by a first off-axis parabolic mirror, transmission or reflection mode measurement is carried out, the terahertz wave of the sample is focused on a detection crystal through a fourth off-axis parabolic mirror after being collected by a third off-axis parabolic mirror, and the terahertz time-domain spectrograph is obtained. The second off-axis parabolic mirror and the third off-axis parabolic mirror as well as a sample stand are integrated as a measuring module on a base plate. Two short-focus off-axis parabolic mirrors and a transmission sample stand are integrated into a transmission measuring module. Two long-focus off-axis parabolic mirrors and a reflection sample stand are integrated into a reflection measuring module. A five-dimensional adjusting device is adopted for clamping the first off-axis parabolic mirror and the fourth off-axis parabolic mirror, and is used for quickly recovering the optimum positions of the first off-axis parabolic mirror and the fourth off-axis parabolic mirror when a transmission mode or a reflection module is switched. The terahertz time-domain spectrograph disclosed by the invention is simple and quick in adjustment process, and integration and user operation of the terahertz time-domain spectrograph are facilitated.
Owner:DAHENG NEW EPOCH TECH

Fresnel matrix THz wave propagation model based high-precision thickness detection method for coatings

The invention discloses a Fresnel matrix THz wave propagation model based high-precision thickness detection method for coatings. Based on a electromagnetic field theory model, a reflecting propagation one-dimensional electric field model of normal incidence THz wave in a multi-layer medium structure is established according to a reflecting type THz time domain spectrum system used in coating thickness detection. On this basis, a Fresnel coefficient matrix and a phase matrix are introduced and a Fresnel matrix THz wave propagation model is proposed and validated. Quantitative detection of coating thickness is realized by utilizing the Fresnel matrix THz wave propagation model based LS (Least Squares) thickness optimization method and the coating thickness is solved through iterative optimization so as to minimize the minimal residual sum of squares of a simulation result and a measurement result and to realize the high precision optimization of thickness parameters. A distance parameter DTS between a THz emitter and a to-be-measured piece is introduced and visible treatment is performed on distance errors between the THz emitter and the to-be-measured piece, so that the accuracy ofcoating thickness detection is improved further.
Owner:CHANGCHUN UNIV OF SCI & TECH

Method for detecting amino acid content in grain by use of terahertz frequency-domain spectrum technology

The invention provides a method for detecting amino acid content in grain by use of terahertz frequency-domain spectrum technology. The method comprises the steps of grinding grain samples to be tested and then tableting the grain samples to be tested, directly testing the grain samples to be tested by use of a terahertz time-domain spectrum system in a transmission measurement mode under a nitrogen atmosphere to obtain the terahertz time-domain spectrum signals of the samples, performing Fourier transform on the time-domain spectrums to obtain the frequency-domain spectrums of the samples, performing normalization spectrum preprocessing on all the obtained frequency-domain spectrums, and finally, dividing the preprocessed frequency-domain spectrums of the grain tableted samples to be tested into calibration set frequency-domain spectrums and verification set frequency-domain spectrums, and establishing a quantitative analysis model by use of the partial least squares regression method so as to obtain the quantitative detection values of the various grain samples to be tested. The method for detecting the amino acid content in the grain by use of the terahertz frequency-domain spectrum technology is simple in sample preparation, simple to operate, and capable of truly and effectively realizing fast and accurate quantitative detection on the amino acids in the grain.
Owner:CAPITAL NORMAL UNIVERSITY +1

Matched test system for detecting spectrum characters generated by sample under electron beam excitation

The invention discloses a matched test system for detecting spectrum characters generated by a sample under electron beam excitation and belongs to the detection field of detection on THz radiation spectrum characters. The system includes: a vacuum chamber, a vacuumizing system, a rotation control rod, and an electron gun. The vacuumizing system supplies a high-vacuum test environment to the sample under free electron beam excitation; the rotation control rod not only can fix the electron gun but also can control angle and position of the sample under electron beam excitation; a pair of observation windows, which are mounted in the upper and lower parts of the vacuum chamber, can be used for performing real-time detection and analysis on a radiation field generated by the sample under the electron beam excitation in a THz time-domain spectroscopy analyzer conveniently, and a pair of observation windows, which are mounted in the front and rear parts of the vacuum chamber, allows a test operator to conveniently observe the situation in the interior of the vacuum chamber. The whole system has reasonable design. The system, when being matched with the THz time-domain spectroscopy analyzer, can conveniently detect the characters of THz radiation spectrum generated by the sample under the free electron beam excitation.
Owner:UNIV OF ELECTRONICS SCI & TECH OF CHINA

Method for detecting insect fragments in wheat flour based on Terahertz time domain spectra

InactiveCN103822899ASolve the problem of many independent variables and multiple correlations between independent variablesSolve the problem of quantitative analysis of dataMaterial analysis by optical meansTime domainThz time domain spectroscopy
The invention discloses a method for detecting insect fragments in wheat flour based on Terahertz time domain spectra. First, wheat flour samples containing the insect fragments are made and divided into a correcting sample set and a verifying sample set. The Terahertz time domain spectra of all the samples are collected, Fourier transformation is carried out on obtained time domain spectrum data so as to obtain a Terahertz frequency domain spectrum data group, and a spectral data group of Terahertz absorption coefficients is calculated. The insect fragments in the wheat flour are estimated based on Terahertz absorption spectra in combination with PLSR (Partial-Least-Squares Regression), optimal factor number in the PLSR is determined through the utilization of cross validation, and the rapid detection of the insect fragments in the wheat flour is realized. Modeling is carried out by introducing PLSR in the Terahertz absorption spectra, the problems that the independent variables of the Terahertz spectra are multiple and multiple correlations exist among the independent variables are solved, and the quantitative analysis problem of the Terahertz spectrum data is solved. The method has important practice meaning in ensuring the quality of the flour and sequent food.
Owner:HUAZHONG AGRI UNIV

Ultra-wide frequency spectrum terahertz wave time domain spectrum coherent detection method and device

The invention provides an ultra-wide frequency spectrum terahertz wave time domain spectrum coherent detection method and device, and belongs to the field of optoelectronics application. According to the method provided by the invention, the electric field time domain waveform signal of a Terahertz wave pulse is detected through laser secondary harmonic signals generated by the non-linear effect of the laser pulse electric field and the Terahertz wave pulse electric field with air atoms/ molecules in air media; the method belongs to a coherent detection method. A frequency doubling light signal generated in the device comprises optical intrinsic oscillation frequency doubling light generated in nonlinear crystals beta-BBO by using detection laser and also comprises detection laser and laser frequency doubling light generated by the Terahertz wave pulse electric field in the air media. The intrinsic oscillation source is generated by using beta-BBO crystals; the size of the oscillation source can be controlled through rotating an inclined angle formed between a fast shaft of the beta-BBO crystals and the polarization direction of the detection laser; the intrinsic oscillation source generation by using an external voltage modulator is not used; the cost is reduced; the detection method is simpler and more convenient; the detection can be performed under the all optical element conditions.
Owner:CHONGQING INST OF GREEN & INTELLIGENT TECH CHINESE ACADEMY OF SCI

Defect detection method and system based on terahertz imaging

The invention discloses a defect detection method and a defect detection system based on terahertz imaging. The defect detection method comprises the steps of: dividing a detected sample into a plurality of scanning points, and carrying out stepped scanning on the plurality of scanning points by utilizing terahertz waves to obtain terahertz time-domain transmission pulses corresponding to the plurality of scanning points; analyzing the plurality of terahertz time-domain transmission pulses to obtain time-domain transmission pulse amplitude values corresponding to the plurality of scanning points; calculating grayscale values corresponding to the plurality of scanning points according to the time-domain transmission pulse amplitude values to obtain a grayscale map of the detected sample; and positioning defect parts in the detected sample according to the light and shade contrast in the grayscale map. According to the defect detection method and the defect detection system, the detectedsample is imaged based on the terahertz imaging technology, the time domain spectral data can be extracted according to the detected sample, the corresponding grayscale map is finally generated, andthe obtained grayscale map can enable the forms of various internal defects of the to-be-detected sample to be visualized, so that the defect detection can be precisely conducted on the to-be-detectedsample.
Owner:YUNNAN POWER GRID CO LTD ELECTRIC POWER RES INST

Terahertz imaging-based biomacromolecule content relative quantitative detection method

The invention relates to a terahertz imaging-based biomacromolecule content relative quantitative detection method, and belongs to the field of biomacromolecule detection. The method comprises the following steps: S1, obtaining a nitrocellulose film or a polyvinylidene fluoride film containing biomacromolecules; S2, placing the to-be-detected film on a terahertz time-domain spectrometer, and carrying out scanning imaging to obtain a time-domain spectrum of a point; S3, performing Fourier transform and smoothing processing on the time domain spectral data, and taking the processed time domain spectral data as frequency domain spectral data; S4, taking N points on each to-be-detected film, measuring the thickness of the to-be-detected film, and taking a mean value as the thickness of the to-be-detected film; and S5, calculating, analyzing and recombining the frequency domain spectral data of each pixel point of the measurement film, and converting the frequency domain spectral data intogray values of the corresponding pixel points, so as to form a visual image reflecting the spatial distribution condition of the biomacromolecule content on the film. The method has the advantages ofno need of antibodies, simple operation, fast and accurate detection speed, time saving, labor cost saving, and realization of label-free detection.
Owner:CHONGQING INST OF GREEN & INTELLIGENT TECH CHINESE ACADEMY OF SCI
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