30 results about "Terahertz pulse" patented technology

The invention belongs to the technical field of terahertz, relates to terahertz communication, and particularly discloses a quasi-optical resonant cavity and a terahertz pulse compression system. According to the invention, the pulse generation module and the coupling compensation module are connected in parallel and are connected to the common reflector through the common coupler, so that function decoupling is realized. In a pulse compression stage, the common coupler introduces an incident terahertz wave beam into two optical paths, and destructive interference occurs between two paths of leakage signals by adjusting the coupling compensation module, so that zero coupling loss is realized, and the problem of large energy loss is solved. Meanwhile, the pulse generation module can independently adjust the optical path of the pulse generation module to control the pulse width, and the adjustment process does not affect the optimized interference condition, so that the high robustness of adjustment is ensured. In the output stage, energy is released by switching the state of the common coupler. Compared with the prior art, low-loss accumulation and robust pulse width continuous adjustment are realized at the same time, so that the terahertz pulse compression effect is remarkably improved.

The invention discloses a thickness detection method. The method comprises the following steps: acquiring a blank time-domain signal, a time-domain signal of a standard sample with known thickness and a time-domain signal of a sample to be detected based on a terahertz time-domain spectroscopy system; performing corresponding frequency domain transformation on the time domain signals, and calculating a refractive index corresponding to each frequency component in the terahertz pulse signal based on a result after the frequency domain transformation; performing signal energy weighted average on all refractive indexes to obtain an equivalent average refractive index; and calculating the thickness of the to-be-measured sample by using the equivalent average refractive index. According to the method, the time-domain signal is converted into the frequency-domain signal, corresponding calculation is carried out, the refractive indexes corresponding to different frequency components in the terahertz pulse signal are obtained, then energy weighted averaging is carried out on the refractive indexes, the more accurate equivalent average refractive index is obtained, and when the thickness is calculated on the basis of the equivalent average refractive index subsequently, the thickness of the terahertz pulse signal is calculated more accurately. The influence caused by the dispersion phenomenon is effectively eliminated, and a more accurate thickness detection effect is obtained.

The application provides a chip-scale package interconnection structure failure analysis method and device, comprising: determining the failure external pin corresponding to the failure CSP package interconnection structure according to the current-voltage characteristic curve corresponding to each external pin; collecting and analyzing the time-domain reflection waveform of the failure external pin by using the electro-optical terahertz pulse reflection technology, positioning the target interconnection failure area in the interconnection path where the failure external pin is located according to the amplitude, time delay and waveform distortion characteristics of the reflection pulse; scanning the target interconnection failure area by using the three-dimensional X-ray microscopic imaging technology, and determining the target position of the failure point on the interconnection path where the failure external pin is located and the corresponding structural defects based on the scanning result. The application realizes the non-destructive failure analysis of the CSP package interconnection structure by combining the electro-optical terahertz pulse reflection technology and the three-dimensional X-ray microscopic imaging technology, and improves the failure point fault positioning accuracy and efficiency.

The application belongs to the technical field of terahertz pulse source generation, and provides a patterned wave front regulation method of a terahertz spin emitter. According to the patterned design, the method arranges a plurality of sequential terahertz spin film units and a plurality of reverse sequential terahertz spin film units in the terahertz spin emitter in space to obtain a terahertz light beam with a desired shape, realize spatial phase coding of the terahertz light field, and thus complete wave front regulation. Compared with the prior art, the application has the advantages of strong operability, wide applicability, low cost and the like.

The invention relates to a cookware recognition device, a kitchen range and a range hood, and the cookware recognition device is characterized by comprising a terahertz transmitting and receiving sensor which is arranged near a combustor of the kitchen range and can transmit terahertz pulse signals to cookware arranged above the combustor of the kitchen range, the first echo signal is directly reflected back from the outer surface of the cookware, and the second echo signal is reflected back from the inner surface of the cookware after the terahertz pulse signal penetrates through the wall of the cookware; the signal analysis module is used for processing the second echo signal detected by the terahertz transceiving sensor and judging the specific material of the cookware according to the phase difference between the transmitted terahertz pulse signal and the received second echo signal; and the signal sending module is connected with the signal analysis module and is used for sending the specific material of the cookware placed above the cooker burner to the cooker or the range hood. Compared with the prior art, the material of the cookware can be identified without a built-in chip.

The invention discloses a terahertz pulse width regulation and control method based on Co / Ru heterojunction, and belongs to the technical field of terahertz photoelectrons. The method comprises the steps of substrate treatment, Co / Ru heterojunction thin film preparation, terahertz emission and detection light path establishment, signal acquisition and treatment and pulse width regulation and control. Sequentially depositing a Co layer and a thickness-adjustable Ru layer on the substrate through magnetron sputtering to form a Co / Ru heterojunction; a femtosecond laser is utilized to excite a heterojunction to generate terahertz pulses, an electro-optical sampling system is utilized to collect time domain signals, and Hilbert transform is adopted to extract pulse width and delay time; based on the monotonic corresponding relation between the thickness of the Ru layer and the terahertz pulse width, continuous adjustment of the pulse width within the range of 100-500 fs is achieved by adjusting the thickness of the Ru layer, and meanwhile the spectral bandwidth and the peak delay time are synchronously regulated and controlled.

The application provides a method for generating a multi-pulse terahertz beam with adjustable time interval of single pulse, which comprises the following steps: generating a pulse signal from a same terahertz wave source, then generating two or more pulse signals with consistent performance parameters through beam distribution, generating time interval through different time delay paths, and achieving the detection purpose by hitting the same detection area of the same research object. The method is based on the high-speed and high-precision modulation technology of the terahertz pulse of the pulse beam quasi-optical slow wave generator, and can realize the adjustment of the time interval of the pulse beam.

A tomographic atom probe includes an analysis chamber intended to analyze a sample of material in the form of a nanotip mounted on an anti-vibration support, the nanotip being brought to a temperature of between 0 kelvin and ambient temperature, the nanotip being biased at an adjustable voltage of between 1 kV and 15 kV, the analysis chamber comprising a position-sensitive and time of flight-sensitive ion detector. The atom probe comprises a generator for generating high-peak-intensity single-cycle ultrashort terahertz pulses, the analysis chamber comprising optical means for focusing the terahertz pulses, the focusing of the terahertz pulses causing the atoms of the nanotip to evaporate through the field effect without thermal effects. The terahertz pulses are generated by a femtosecond pulsed laser emitting very high-power ultrashort optical pulses at a high rate.

The application provides a transverse high-resolution terahertz time-domain spectrum imaging method and system, and relates to the technical field of terahertz imaging. The method comprises the following steps: obtaining a terahertz time-domain pulse sampling signal; performing Fourier transform on the terahertz time-domain pulse sampling signal to obtain a frequency spectrum; performing inverse Fourier transform on the frequency spectrum after high-pass filtering and low-pass filtering processing to obtain a time-domain signal; establishing a point spread function; performing deconvolution operation on the time-domain signal and the time-domain form of the established point spread function to obtain an image reconstruction signal; and determining a transverse high-resolution terahertz time-domain spectrum image according to the image reconstruction signal of each sampling point in a scanning area and the time of flight of the terahertz pulse wave. Through the method, image blurring caused by terahertz beam distortion can be better eliminated, and the transverse resolution of the terahertz imaging system and the quality of the reconstructed image can be improved.

The application discloses a kind of based on Co / Ru heterojunction terahertz pulse width's regulation and control method, belong to terahertz optoelectronic technical field.The method includes: substrate processing, Co / Ru heterojunction film preparation, terahertz emission and detection optical path establishment, signal acquisition processing and pulse width regulation and control.Co layer and the Ru layer of adjustable thickness are sequentially deposited on substrate by magnetron sputtering, and Co / Ru heterojunction is formed;Terahertz pulse is generated by using femtosecond laser excitation heterojunction, time-domain signal is collected by electro-optic sampling system, and pulse width and delay time are extracted by using Hilbert transform;Based on the monotonic correspondence between Ru layer thickness and terahertz pulse width, the pulse width is continuously adjustable in the range of 100-500fs by adjusting the thickness of Ru layer, while the spectral bandwidth and peak delay time are simultaneously regulated.

This invention proposes a sensing device based on a folded continuous-domain bound-state all-dielectric crystal metasurface, comprising a terahertz emitter, an all-dielectric photonic crystal metasurface, and a terahertz receiver. The all-dielectric photonic crystal metasurface sensing device has a periodic aperture array structure on its surface, and in the x-direction, it forms a supercell periodic modulation structure through alternating large and small apertures, achieving Brillouin zone folding in the x-direction. When an incident terahertz pulse emitted by the terahertz emitter perpendicularly irradiates the all-dielectric photonic crystal metasurface, the transmitted terahertz pulse formed after interaction is received by the terahertz detector. When the all-dielectric photonic crystal metasurface is excited by a terahertz wave, the local electric field enhancement effect formed by the periodic aperture array structure at the edge and inside of its pores passively captures and enriches sample molecules of the tested solution sample in the hot spot region within the pores. This invention improves the detection sensitivity and operational convenience for trace samples.

The invention discloses a terahertz-based insulation operating rod internal humidity detection method and system, and belongs to the technical field of power equipment detection, and the method comprises the steps: enabling terahertz pulses to enter a to-be-detected region of an insulation operating rod, and receiving terahertz echo signals transmitted and reflected by the to-be-detected region, thereby obtaining time-domain spectral data; fourier transform is carried out on the time-domain spectral data to obtain a frequency-domain spectrum, a target spectral component in the frequency-domain spectrum is screened out based on the frequency absorption characteristic of water molecules, and an internal humidity detection parameter is obtained by using the target spectral component; and obtaining the internal humidity according to the detection parameters and a correlation model obtained based on the historical internal humidity of the historical insulation operating rod. The technical problem that the integrity of the insulating operating rod and the detection precision of the internal humidity are difficult to consider in the prior art is solved.

The invention provides a cavity external optical coupling system applied to an ultrahigh vacuum cavity of a scanning tunneling microscope. A femtosecond laser generates femtosecond pulse light; the first beam splitter splits the femtosecond pulse light to obtain a first light beam and a first residual light beam; the second beam splitter splits the first residual light beam into a second light beam and a second residual light beam; the third beam splitter splits the second residual light beam into a third light beam and a fourth light beam; the first light path module is used for processing the first light beam as first sampling light; the second light path module is used for processing the second light beam; the third light path module is used for processing the third light beam as second sampling light; the terahertz generation module is used for generating terahertz pulses according to the second light beam and the fourth light beam; the first parabolic mirror unit is used for focusing terahertz pulses to the electro-optical crystal; the electro-optical crystal is used for detecting THz light; the second parabolic mirror unit is used for focusing and emitting the terahertz pulse; and the gold reflector is used for guiding the terahertz pulse to the tunnel junction of the scanning tunneling microscope.

The invention relates to the technical field of semiconductor material nondestructive testing, and discloses a terahertz time-domain spectroscopy elliptical polarization semiconductor wafer electrical parameter nondestructive testing system, which comprises a terahertz transmitting module, a terahertz receiving module, a terahertz receiving module and a terahertz receiving module, the polarization control module regulates and controls the polarization state of the terahertz pulse; the sample fixing module fixes a wafer and adjusts an incident angle; the terahertz receiving module detects a reflected signal and performs time domain sampling; the data processing module extracts ellipsometry parameters and calculates resistivity, carrier concentration, mobility and dielectric constant; and the central control module judges whether the electrical parameters reach the standard or not according to the resistivity detection result, and performs feedback adjustment on the incident angle, the polarization state or the time domain sampling frequency of the next detection batch when the electrical parameters do not reach the standard, so that intelligent optimization and result consistency of the detection process are realized. According to the invention, the automation degree and the measurement stability of the electrical parameter detection of the semiconductor wafer are effectively improved.

The invention discloses a terahertz pulse train transmitting device which comprises a femtosecond laser, a half-wave plate, a beam splitter, a first reflector, a second reflector, a third reflector, a fourth reflector, a time delayer, a beam combiner and a terahertz source. The femtosecond laser outputs a linearly polarized femtosecond laser pulse, and after the femtosecond laser pulse passes through the half-wave plate, the polarization direction of the femtosecond laser pulse is changed to 45 degrees, and the femtosecond laser pulse enters the beam splitter; the beam splitter divides the pulse into two beams of laser with equal energy, and the polarization directions are orthogonal; the first laser beam sequentially passes through the first reflector and the second reflector and then enters the beam combiner, and the second laser beam sequentially passes through the third reflector, the time delayer and the fourth reflector and then enters the beam combiner; the time delay between the two laser beams is adjusted through a time delayer, and the two combined laser beams have the same propagation direction; the structure is cascaded for three times, and finally, eight femtosecond laser pulses with different time delays excite the terahertz source to generate a terahertz pulse string. The problem that an existing terahertz source is low in repetition frequency is solved.

This invention discloses a semiconductor chip testing system and method, relating to the field of chip testing technology. The method includes: scanning the semiconductor wafer under test using a terahertz time-domain spectroscopy device according to an initialization report; irradiating the surface of the semiconductor wafer under test with terahertz pulses; acquiring the reflection spectrum caused by lattice vibrations; analyzing the phonon spectrum characteristics of the reflection spectrum; determining the type and spatial distribution of lattice defects; generating a wafer defect distribution map; marking high-risk areas; extracting high-risk areas based on the wafer defect distribution map; adjusting the testing platform; scanning the high-risk areas; applying a test current to the test points of the semiconductor wafer under test using a superconducting quantum interference device array; acquiring electromagnetic field distribution data; and using a topological data analysis algorithm to calculate and construct a three-dimensional topological model, identify abnormal current loops, and generate a leakage path diagram. This invention provides a comprehensive quality assessment basis for chip production by using principal component analysis for dimensionality reduction and weighted linear regression scoring.

The present application relates to a kind of high signal-to-noise ratio terahertz pulse time-domain spectroscopy detection system, it includes: terahertz pulse generation optical path, terahertz pulse detection optical path and detection and control circuit based on phase-locked amplifier, in terahertz pulse generation optical path, original detection light beam is obtained the detection light beam of actual incidence nonlinear electro-optic crystal by one frequency multiplication processing optical path;The frequency multiplication processing optical path includes beam splitter, delay line device and beam combiner;The detection light beam has probe pulse and adjacent mark pulse;The electrical signal output by the phase-locked amplifier detection optical path detects: probe pulse relative to mark pulse, with the alternating information of the periodic appearance of the repetition frequency, and then according to the alternating information obtains the terahertz pulse time-domain spectroscopy.The present application carries out beam splitting-delay-beam combining processing to detection light beam, utilizes the measurement principle of phase-locked amplifier, excludes the system noise introduced in the propagation process of detection light beam, to improve signal-to-noise ratio.

This application provides a terahertz wave testing device and a method for correcting CO2 diffusion and solubility parameters, relating to the field of oil and gas field development technology. The device includes: a CO2 storage tank, a reference cylinder, a sample cylinder, a pulsed laser emitter, a beam splitter, a signal delayer, a reflector, a signal generator, a signal receiver, a first reflector, and a second reflector. The CO2 storage tank is connected to the reference cylinder, and the reference cylinder is connected to the sample cylinder. A controllable valve is also installed on the connecting pipeline between the reference cylinder and the sample cylinder to control the on / off state of the connecting pipeline. The beam splitter, signal delayer, and reflector are sequentially arranged in the laser emission direction of the pulsed laser emitter. The terahertz pulse wave generated by the signal generator is incident on the sample cylinder through the first reflector and then reflected to the signal receiver by the second reflector. The terahertz wave testing device of this application can monitor the bulk water content in real time based on terahertz wave time-domain spectroscopy, thereby correcting the diffusion coefficient and solubility of CO2 in heavy oil.

The invention provides an all-optical ultrafast strong magnetic field generation device. The device comprises an angular polarization terahertz generation module, a focusing system and a super-structure surface which are sequentially arranged along an optical path, the angular polarization terahertz generation module is used for outputting angular polarization terahertz pulses, the focusing system is used for focusing the angular polarization terahertz pulses and then enabling the angular polarization terahertz pulses to be incident to the metasurface, and the metasurface is used for exciting annular current through the angular polarization terahertz pulses. Therefore, longitudinal strong magnetic fields distributed along the optical axis direction are formed in the center and the rear area of the surface of the metasurface. The device adopts an all-optical driving mode, is simple in structure, does not need complex design and processing, and is easy to realize; the metasurface can be repeatedly used and is compatible with repetition frequency operation; the pulse width of the longitudinal strong magnetic field is in the femtosecond-picosecond magnitude and is adjustable, the magnetic field is quasi-monopole and controllable in direction, and the free space size of the magnetic field can reach the millimeter magnitude.

The invention relates to a method and device for identifying terahertz pulse signals reflected by a label on a skin, and the device comprises a reflective terahertz imaging system which comprises a terahertz transmitting / receiving unit and a data processing unit, and the method comprises the following steps: arranging a metal reflection label on the surface of the skin to be detected, the thickness of the metal reflection label is configured to enable a metal reflection label surface reflection signal and a skin surface reflection signal to generate distinguishable time delay in a time domain; transmitting a terahertz pulse to the metal reflection label and the skin by using the terahertz transmitting / receiving unit, and receiving a mixed time domain signal comprising a label reflection peak and a skin reflection peak; based on a theoretical optical path difference corresponding to the thickness of the metal reflection label, determining a time window corresponding to a reflection signal of the metal reflection label in the mixed time domain signal; signals in the time window are extracted, separation and identification of label reflection signals are achieved, and then the label reflection signals are used for label positioning or imaging.

The invention discloses a polarization-adjustable multi-cycle terahertz pulse generation method, which relates to the technical field of terahertz, and comprises the following steps: after femtosecond laser emitted by a femtosecond laser passes through a concave lens and a first off-axis parabolic mirror, the femtosecond laser is expanded into a large light spot and collimated, and the large light spot irradiates a terahertz source film in a terahertz pulse source; and a terahertz pulse string with a certain time delay is generated and is focused by the second off-axis parabolic mirror, and a multi-cycle terahertz pulse with space coincidence is formed at the focus. According to the invention, the terahertz source films are distributed along the steps through the step-shaped insulating step substrate, and the polarization state of the multi-period terahertz pulse can be changed by changing the magnetic field applied to the terahertz source films and changing the center frequency of the multi-period terahertz pulse by changing the height of the steps through externally applying the magnetic field; the device is simple in structure, convenient to operate, adjustable in polarization and large in frequency adjustment range.

The invention discloses a terahertz pulse communication system based on spin orbit moment regulation and control, and relates to the technical field of spintronics and communication, and the system is characterized in that a regulation and control module regulates and controls the magnetization direction of a spin electron emitter through spin orbit moment; the coding module is in control connection with the regulation and control module and adopts a two-phase coding mode; and the signal transmission module performs data transmission based on signal superposition or time interlaced transmission of the spin electron emitter array. A spin electron emitter is used as a terahertz wave source, and high-speed electric control modulation of the spin electron emitter is realized through a spin orbit moment technology, so that polarization control and high-speed communication of terahertz waves are realized. Ultra-fast magnetization direction switching is realized by using the SOT technology, polarization of terahertz waves is further controlled, and two system structures are designed to improve the communication rate and the integration level. The method has the advantages of high speed, high integration level, low power consumption and the like, and is suitable for a future ultra-high-speed wireless short-range communication system.

The invention discloses a terahertz photoacoustic effect-based artificial bone structure detection device, which comprises a femtosecond laser, a nonlinear crystal, a focusing light path, a detection module and a processing module, and is characterized in that the femtosecond laser is used for generating a femtosecond laser pulse, the femtosecond laser pulse is used for pumping the nonlinear crystal so as to excite a terahertz pulse, and the nonlinear crystal is used for pumping the terahertz pulse; the focusing light path is used for focusing the terahertz pulse on the detection module to excite a photoacoustic signal, the detection module is used for converting the photoacoustic signal into an electric signal, and the processing module is used for detecting the artificial bone structure according to the electric signal. According to the terahertz photoacoustic effect, the device can realize non-intrusive nondestructive detection of the artificial bone structure.

The invention provides a device and method for measuring wake electron density of a terahertz wave arc wind tunnel test model, and the device comprises an arc wind tunnel system, a terahertz transmitting module, a beam shaping module, a detection module, and a data processing and inversion module. The beam shaping module converts terahertz pulse signals into zero-order Bessel beams, and the detection module filters noise through confocal filtering. According to the method, a wake region plasma flow field is generated through an arc wind tunnel, and after wave beam conversion and filtering receiving, the data processing and inversion module inverts the electron density through the steps of phase dispersion model fitting, Abel inverse transformation and the like. Non-contact measurement is adopted, ablation particle interference is avoided, sub-millisecond magnitude spatial resolution measurement is achieved, measurement accuracy and reliability are improved, and reliable data support is provided for aircraft plasma sheath characteristic evaluation.

The application discloses a frequency-doubling relationship double-wavelength terahertz parametric generator and relates to the field of terahertz parametric generators, mainly comprising the following steps: first split pumped light after passing through a first reflection component and continuous seed light after passing through the first reflection component are injected into a first nonlinear crystal to generate first-order Stokes light and second-order Stokes light; the first-order Stokes light after passing through a second reflection component, the second-order Stokes light after passing through the second reflection component and the second pumped light after passing through a second split are injected into a second nonlinear crystal, and first terahertz light and second terahertz light are output on a high-resistance silicon prism. The two terahertz pulses generated by the application have high frequency stability, can keep accurate frequency-doubling relationship correlation, can realize equal power and same position output, and can realize a very small exit angle difference of the two frequency terahertz lights.

The application discloses a kind of spectrum and imaging systems based on optical fiber terahertz asynchronous sampling, it is related to terahertz spectrum imaging technical field, including scanning imaging module, terahertz pulse signal generation module, terahertz pulse signal receiving module, signal acquisition module and asynchronous trigger module;The present application is improved on method on the existing asynchronous sampling terahertz spectrum technology, and multiple asynchronous trigger signals generated by asynchronous trigger module respectively asynchronously trigger terahertz pulse signal generation module, terahertz pulse signal receiving module and signal acquisition module, and the asynchronous trigger signal has different repetition frequency, realizes the coherent synthesis trigger femtosecond laser trigger technology, solves the problems, such as the high difficulty of adjustment, trigger signal instability and so on, of the current two-photon or balanced detection and other trigger collection terahertz signal mode.

The invention discloses a semiconductor chip test system and method, and relates to the technical field of chip detection, and the method comprises the steps: scanning a to-be-tested semiconductor wafer through terahertz time-domain spectroscopy equipment according to an initialization report, transmitting terahertz pulses to irradiate the surface of the to-be-tested semiconductor wafer, and collecting a reflection spectrum caused by lattice vibration; analyzing phonon spectrum characteristics of the reflection spectrum, determining lattice defect types and spatial distribution, generating a wafer defect distribution diagram, marking a high-risk area, extracting the high-risk area according to the wafer defect distribution diagram, adjusting a test platform, and scanning the high-risk area; the method comprises the following steps: applying a test current to a test point of a semiconductor wafer to be tested through a superconducting quantum interference device array, then collecting electromagnetic field distribution data, carrying out calculation by using a topological data analysis algorithm, constructing a three-dimensional topological model, identifying an abnormal current loop, and generating a leakage path diagram; according to the method, a comprehensive quality evaluation basis is provided for chip production by using principal component analysis dimensionality reduction and weighted linear regression scoring.

The invention relates to a GIS thickness measuring method and system based on terahertz pulses and an off-axis lens. The GIS thickness measuring method comprises the steps that to-be-measured GIS equipment covered with a paint film is acquired; an incidence lens based on a terahertz source is aligned to GIS equipment to be measured, a terahertz reflection measurement light path based on an off-axis lens is aligned to a terahertz reflection surface, and the position of the reflection surface of the equipment is adjusted to a lens focus of the terahertz reflection measurement light path; after a terahertz source emits terahertz pulses, reflected pulses are collected through a terahertz reflection measurement light path, and reflected pulse waveform signals are obtained; calculating the thickness of the paint film according to the time delay between two adjacent reflection signal peak values in the reflection pulse waveform signal and the refractive index of the paint film; the refractive index of the paint film is corrected according to the roughness of the surface of the paint film. Compared with the prior art, the refractive index is corrected according to the roughness, so that the accuracy of a paint film thickness measurement result is improved; and accurate measurement of reflected signals is realized through the off-axis lens.

This invention discloses a terahertz autocorrelation near-field imaging spectroscopy system, relating to the interdisciplinary field of micro-nano photonics and terahertz photoelectric detection. The system includes: a terahertz emitter, an optical path adjustment unit, a scattering near-field scanning microscope, a terahertz receiver, a current amplifier, a lock-in amplifier, and a processor. This invention employs autocorrelation near-field imaging spectroscopy, which can obtain the time-domain information of terahertz waves by performing autocorrelation measurements on terahertz pulses. The autocorrelation near-field imaging spectroscopy method in this invention also has the ability to enhance signal intensity and suppress background noise. By controlling the optical path difference and adjusting the optical path, the two signals are accumulated to achieve a modulation of the probe resonance effect, which is beneficial for studying the resonance characteristics of the sample itself.

The application discloses a time-domain spectrum system capable of generating and detecting ultra-wideband terahertz pulses. The system comprises a laser light source, a light splitting module, an optical path adjustment coupling module, a terahertz emission module, a sample detection module and an electro-optic sampling module. After the laser pulses output by the laser light source are split, the pump light is chopped, modulated, expanded and irradiated to a spin terahertz emitter to generate ultra-wideband terahertz pulses of 0.1-10 THz. After the terahertz pulses interact with the sample through a confocal off-axis parabolic mirror, the terahertz pulses are collimated and output again. The detection light formed by light splitting is adjusted in optical path and coincides with the terahertz pulses in time and space, and is focused on an ultra-thin ZnTe crystal in the <110> crystal direction. Finally, the terahertz time-domain signal is obtained through electro-optic sampling. The system has the functions of emitting and detecting ultra-wideband terahertz pulses, and can be used not only in the fields of material detection and physicochemical analysis, but also in the precise verification of the characteristics of other terahertz sources and detection crystals.