Method for detecting insect fragments in wheat flour based on Terahertz time domain spectra

A terahertz time domain, pest debris technology, applied in measuring devices, material analysis by optical means, instruments, etc., can solve the problems of difficulty in automation, the influence of iodine liquid method, and low detection accuracy, and achieve reliable detection.

Inactive Publication Date: 2014-05-28
HUAZHONG AGRI UNIV
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Problems solved by technology

[0004] However, these methods have their own defects: the flotation method needs to use dangerous organic solvents; the iodine solution method will be seriously affected by different iodine solution concentrations, and the iodine solution concentration needs to be controlled in advance; DNA fingerprinting, protein fingerprinting and enzyme Linked immunosorbent assays al

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  • Method for detecting insect fragments in wheat flour based on Terahertz time domain spectra
  • Method for detecting insect fragments in wheat flour based on Terahertz time domain spectra
  • Method for detecting insect fragments in wheat flour based on Terahertz time domain spectra

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Embodiment 1

[0030] The stored grain pests in this embodiment are corn weevils, which are the most important primary pests. The stored grains are bitten by corn weevils, resulting in many broken grains and dust, which can easily cause the occurrence of late pests.

[0031] The terahertz time-domain spectrometer used is the Mini-Z3 terahertz time-domain spectrometer from Zomega, USA.

[0032] The mold used is a sample-holder produced by Zomega.

[0033] The method for detecting pest fragments in wheat flour based on terahertz time-domain spectroscopy comprises the following steps:

[0034] 1) Make multiple samples of wheat flour containing varying amounts of pest debris:

[0035] After several developmental stages (3-4 weeks) of eggs, larvae, pupae and adults, corn weevil adults were placed in a vacuum oven at 70°C for 12 hours, and then placed in a drying oven for 72 hours. Grind the dried corn elephant with a pulverizer, then sieve with 0.250mm (#60) and 0.425mm (#40) sieves, and the ob...

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Abstract

The invention discloses a method for detecting insect fragments in wheat flour based on Terahertz time domain spectra. First, wheat flour samples containing the insect fragments are made and divided into a correcting sample set and a verifying sample set. The Terahertz time domain spectra of all the samples are collected, Fourier transformation is carried out on obtained time domain spectrum data so as to obtain a Terahertz frequency domain spectrum data group, and a spectral data group of Terahertz absorption coefficients is calculated. The insect fragments in the wheat flour are estimated based on Terahertz absorption spectra in combination with PLSR (Partial-Least-Squares Regression), optimal factor number in the PLSR is determined through the utilization of cross validation, and the rapid detection of the insect fragments in the wheat flour is realized. Modeling is carried out by introducing PLSR in the Terahertz absorption spectra, the problems that the independent variables of the Terahertz spectra are multiple and multiple correlations exist among the independent variables are solved, and the quantitative analysis problem of the Terahertz spectrum data is solved. The method has important practice meaning in ensuring the quality of the flour and sequent food.

Description

technical field [0001] The invention relates to a method for detecting pest fragments in wheat flour, in particular to a method for detecting pest fragments in wheat flour based on terahertz time-domain spectroscopy. Background technique [0002] During grain storage, the harm of stored grain pests is very serious. Stored grain pests are one of the most serious factors that endanger the quality of stored grains and related cereals, including rice, flour, corn, millet, buckwheat and sorghum. Early pests such as corn weevil, rice weevil, grain weevil, grain beetle, bean weevil, wheat moth, etc. eat in the grain, and the eggs, larvae and pupae of these concealed pests inside the grain all grow and develop in the grain , Harm grains in the form of borers. This kind of hidden pests is neither easy to detect nor easy to get rid of. It is the main source of wheat flour pest fragments. The second food pests, Sawgrass, Reds, and Longhorn, can only harm the debris and powder of grai...

Claims

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Application Information

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IPC IPC(8): G01N21/3586G01N21/3563
Inventor 谭佐军谢静陈阳石舒宁陈璐
Owner HUAZHONG AGRI UNIV
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