Matched test system for detecting spectrum characters generated by sample under electron beam excitation

A technology for testing samples and spectral characteristics, which is applied in the field of experimental systems, can solve problems such as the inability to provide high-vacuum experimental environments for graphene samples that cannot be excited by electron injection, and achieve reasonable design effects

Inactive Publication Date: 2017-07-14
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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  • Abstract
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  • Application Information

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Problems solved by technology

However, the existing terahertz time-domain spectroscopy platform cannot provide a high-vacuum experimental environment for electron injection excitation of graphene samples.

Method used

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  • Matched test system for detecting spectrum characters generated by sample under electron beam excitation
  • Matched test system for detecting spectrum characters generated by sample under electron beam excitation
  • Matched test system for detecting spectrum characters generated by sample under electron beam excitation

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Embodiment Construction

[0023] In order to further understand the content of the invention, features and effects of the present invention, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments:

[0024] Such as Figure 1-Figure 5 As shown, the device of the present invention includes a mechanical pump 1, a molecular pump 2, a molecular pump and a mechanical pump control platform 3, and a vacuum chamber 4. The vacuum chamber 4 is provided with a chamber exhaust hole, an observation window 5 up and down, front and rear respectively and the chamber door 6, the chamber door 6 is opened and closed through a slideway, and the outer side is provided with a double-core electrode 7, the outer half of the electron gun rotation control rod 8-1 and a six-core electrode 9, and the inner side is provided with a sample stage 13 and The electron gun rotates the inner half of the lever 8-2. The shell of the vacuum chamber 4 is a metal structure,...

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Abstract

The invention discloses a matched test system for detecting spectrum characters generated by a sample under electron beam excitation and belongs to the detection field of detection on THz radiation spectrum characters. The system includes: a vacuum chamber, a vacuumizing system, a rotation control rod, and an electron gun. The vacuumizing system supplies a high-vacuum test environment to the sample under free electron beam excitation; the rotation control rod not only can fix the electron gun but also can control angle and position of the sample under electron beam excitation; a pair of observation windows, which are mounted in the upper and lower parts of the vacuum chamber, can be used for performing real-time detection and analysis on a radiation field generated by the sample under the electron beam excitation in a THz time-domain spectroscopy analyzer conveniently, and a pair of observation windows, which are mounted in the front and rear parts of the vacuum chamber, allows a test operator to conveniently observe the situation in the interior of the vacuum chamber. The whole system has reasonable design. The system, when being matched with the THz time-domain spectroscopy analyzer, can conveniently detect the characters of THz radiation spectrum generated by the sample under the free electron beam excitation.

Description

technical field [0001] The invention belongs to the technical field of detection of terahertz radiation spectral characteristics, and specifically relates to an experimental system for detecting the spectral characteristics of terahertz radiation produced by a sample under the excitation of free electron beams by using a terahertz time-domain spectrum analyzer. [0002] technical background [0003] Terahertz wave (THz) refers to electromagnetic waves with a frequency between 0.1THz and 10THz. Terahertz waves are between microwave and infrared waves. Terahertz waves have many unique properties and have important applications in security detection, imaging, biomedicine, wireless communication and other fields. Due to the high frequency of terahertz, its spatial resolution is also very high; and because its pulse is very short (picosecond level), it has very high time resolution. Terahertz imaging technology and terahertz spectroscopy technology thus constitute the two main ke...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/3586
CPCG01N21/3586
Inventor 吴振华胡旻武江周俊张雅鑫杨梓强刘盛纲
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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