The invention discloses a
semiconductor chip test information automatic analysis
system and method, and relates to the technical field of
information analysis, and the method comprises the steps: calculating a parameter reference value according to a standardized
test data set, carrying out the multi-dimensional discrimination
feature extraction based on the parameter reference value, generating a test
feature vector, and carrying out the analysis of the test
feature vector; injecting the test feature vectors into the parameter influence
network model, analyzing a dynamic interaction relationship among test parameters through an anomaly propagation
simulation algorithm, performing
root cause sorting and influence
path tracking based on the dynamic interaction relationship, generating an anomaly analysis report, calling an intelligent diagnosis mechanism according to the anomaly analysis report, and performing fault diagnosis on the test parameters according to the intelligent diagnosis mechanism. Generating a structured conclusion through historical case
library matching, and synchronously activating a
visualization function to perform
interactive presentation on the structured conclusion; according to the method, comprehensive representation of multi-dimensional discrimination information is realized through multi-dimensional
feature extraction, the defect that an existing method is limited to single-parameter statistics is overcome, and the test
feature vector expression capability is improved.