The invention discloses an electronic material life cycle quality tracing method based on digital twinning, and relates to the technical field of
industrial Internet of Things, the digital twinning of an electronic material is constructed, a material
constitutive equation, a process parameter threshold
library and historical
quality data are integrated, and a multi-dimensional
virtual model is formed; a
production line real-
time data stream including an
equipment state, environmental parameters and material attributes is collected. According to the method, the
virtual model containing the material
constitutive equation and the process parameter threshold
library is constructed, the real-
time data flow dynamic evolution is combined, and the graph calculation and the
causal reasoning algorithm are applied, so that the interaction effect of the
equipment state, the environmental parameters and the material attributes can be associated, the core
influence factor chain of the quality
abnormality can be positioned, the single-point alarm limitation is broken through, and the quality
abnormality can be accurately detected. The quality problem is deeply analyzed from the angle of multi-factor
coupling, a comprehensive and systematic analysis framework is provided for accurate attribution, the source of the quality problem can be quickly and accurately found, and the efficiency and accuracy of quality tracing are improved.