A PoF based method for calculating mission reliability of an electronic product comprises steps as follows: step one, information of all mission profiles of the product is collected, and an environment profile of each mission is determined; step two, thermal simulation and vibration simulation of environmental stress of each mission are performed, and a local response of the product to an environmental load is obtained; step three, a product simulation model is established; step four, simulation calculation of the product in all the mission profiles is completed, and the mean time to failure and a main failure mechanism of the product are obtained; and step five, the mission reliability of the product is calculated according to the mean time to failure. According to the PoF based method for calculating the mission reliability of the electronic product, all missions of the product during lifetime use are considered, the environmental stress of each mission is simulated, and the mean time to failure and the mission reliability of the product are comprehensively calculated. By means of a PoF model, the direction relation between parameters of a product material, structure, process and the like and the reliability can be obtained, and a design improvement direction is clearly and directly provided for the product.