Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

PoF (physics of failure) based method for calculating mission reliability of electronic product

A technology of fault physics and calculation methods, which is applied in computing, sustainable transportation, electrical digital data processing, etc., and can solve problems such as the reliability of computing product tasks

Active Publication Date: 2014-02-05
BEIHANG UNIV
View PDF3 Cites 47 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Through the novelty search and retrieval of existing technologies, there are no reports at home and abroad on the calculation of product task reliability based on the fault physical model and combining all tasks in the product life cycle

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • PoF (physics of failure) based method for calculating mission reliability of electronic product
  • PoF (physics of failure) based method for calculating mission reliability of electronic product
  • PoF (physics of failure) based method for calculating mission reliability of electronic product

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0061] The present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments.

[0062] The following examples are as follows figure 1 The implementation of the flow shown mainly includes determining the temperature and vibration environment profile of each task of the electronic controller, using Flotherm to simulate the temperature stress of the software, using ANSYS software to simulate the distribution of vibration stress, stress damage analysis, damage accumulation analysis, and selection of fault physics. The model is simulated by Monte Carlo method to determine the main failure mechanism and time before failure of the electronic controller in each task, and to count the main failure mechanism of the electronic controller and calculate the average time before failure. Electronic controller hardware components such as figure 2 As shown, it includes chassis, power supply module, CPU module, power conversion module, s...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A PoF based method for calculating mission reliability of an electronic product comprises steps as follows: step one, information of all mission profiles of the product is collected, and an environment profile of each mission is determined; step two, thermal simulation and vibration simulation of environmental stress of each mission are performed, and a local response of the product to an environmental load is obtained; step three, a product simulation model is established; step four, simulation calculation of the product in all the mission profiles is completed, and the mean time to failure and a main failure mechanism of the product are obtained; and step five, the mission reliability of the product is calculated according to the mean time to failure. According to the PoF based method for calculating the mission reliability of the electronic product, all missions of the product during lifetime use are considered, the environmental stress of each mission is simulated, and the mean time to failure and the mission reliability of the product are comprehensively calculated. By means of a PoF model, the direction relation between parameters of a product material, structure, process and the like and the reliability can be obtained, and a design improvement direction is clearly and directly provided for the product.

Description

technical field [0001] The invention provides a method for calculating the reliability of electronic tasks based on fault physics, in particular to a method for calculating the reliability of multi-task electronic products based on fault physics, which belongs to the field of product reliability prediction. Background technique [0002] With the rapid development of science and technology, the complexity of electronic products continues to increase. For electronic products with high reliability requirements, being able to analyze and quantitatively calculate their reliability in the design stage is of great significance for discovering weak links in product design and making design changes. Traditionally, in the early stage of design, engineers mainly use empirical methods to predict the reliability of electronic products. This method relies on the subjective judgment of engineers, which often causes inaccurate over-design problems or ignores certain weak parts. resulting i...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06F19/00G06F9/455G06F17/50
CPCY02T90/00
Inventor 骆明珠陈颖叶翠康锐
Owner BEIHANG UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com