25 results about "Life time" patented technology

The invention relates to a dynamic adjust gyroscope life forecasting method based on gray model. By data collection of vibration effective value, random drift and environmental temperature parameter which are preprocessed using radial neural networks, influence of environmental temperature on vibration effective value and random drift is eliminated and random drift and effective value just related to time are obtained by subtracting drift constant value term, then trend term of vibration effective value and random drift are extracted by using wavelet transformation and gray model are built separately for their trend term. The smaller data in two values of life predicted of dynamic adjust gyroscope unless two predicted values exceeding performance parameter limitation when dynamic adjust gyroscope is considered losing effect. The invention uses performance parameter of life probative period of product to predict its life, showing discipline of performance parameter and life of dynamic adjust gyroscope. It is easy and convenient economical and reliable.

The invention relates to the technical field of charging piles, and provides a service life prediction method and a service life prediction system for a direct current charging pile SPD, and the method comprises the steps: monitoring the working voltage of the direct current charging pile SPD, and generating a working voltage curve; the surge current and the duration time are calculated according to the working voltage curve; determining a corresponding maximum surge current derating curve according to the surge current and the duration; calculating the cumulative damage ratio of the SPD according to the maximum surge current derating curve; and predicting the life times of the SPD according to the cumulative damage ratio. The surge current is speculated by monitoring the working voltage of the SPD, the cumulative damage ratio of the SPD is calculated according to the speculated surge current, the service life times of the SPD are predicted according to the cumulative damage ratio, real-time online monitoring of the whole life cycle of the SPD in the direct-current charging pile is achieved, the service life state of the SPD can be accurately controlled, and the initiative and timeliness of SPD operation and maintenance management are remarkably improved.

To increase life times of non-volatile memory devices, the bad block information for a device includes not just whether a device is considered good or bad, but, for bad blocks data on the category of the block's failure. When the number of bad blocks exceeds a threshold level, blocks formerly marked bad can, based on their failure category, have their status updated to good for subsequent usage. This information can also be used during factory testing to update the status of blocks initially marked as bad based on failure category.

An organic electric element according to an embodiment of the present disclosure includes a first electrode, a second electrode, and an organic material layer formed between the first electrode and the second electrode. The organic material layer includes compounds represented by Formula 1 and Formula 2 of the present invention, thereby the driving voltage the organic electric element can be lowered, and the luminous efficiency and the life time of the organic electric element can be improved.

To provide a method for predicting life from information on a softened structure in molten metal in a welded zone of chrome steel.SOLUTION: A method for evaluating a life of a welded zone includes the steps of: providing a first welding part having a first softened structure; alternately repeating execution and halfway stopping of an acceleration test on the first welded zone multiple times, applying an ultrasonic wave to the first welded zone and measuring an echo value that is generated before starting the acceleration test and at each halfway stopping, and calculating an amount of increase A in the echo value; analyzing a correlation between the amount of increase A in the echo value and a life consumption rate at each halfway stopping using a ratio of a test time to a halfway stopping time of the acceleration test to a test time to an occurrence of a microscopic fracture in the first welded zone as the life consumption rate; applying an ultrasonic wave to a second welded zone having a second softened structure and measuring an echo value that occurs, and calculating an amount of increase B from the echo value measured in an early stage of the life of the second welded zone; and calculating a consumption rate of a life time corresponding to the amount of increase B from the correlation.SELECTED DRAWING: Figure 3

The application provides a kind of multi-site prediction filter failure time indication system and method, belong to filter service life monitoring field.Solve the problems of poor reliability of existing prediction device, low prediction accuracy in complex environment and adverse effects on filter filtering performance in prediction process.The prediction device mentioned in the application can accurately predict the filter failure time under complex conditions, providing a margin time for replacing a new filter.The prediction device has a simple structure and high reliability, and is suitable for use in various occasions.It operates independently without affecting the filtering capacity and structure of the filter during operation.Meanwhile, the prediction device can automatically adjust the prediction node according to the filter specifications for accurate prediction.

The invention discloses a laser service life prediction method, a laser service life prediction device and electronic equipment. The life prediction method comprises the following steps: controlling a to-be-tested object to output laser under a test condition to obtain a test failure time length of the to-be-tested object, a life acceleration model with determined parameters and a corresponding first failure life length; controlling the to-be-tested object to output laser under a normal working condition to obtain a second failure life length of the to-be-tested object; and finally, according to the test failure time length, the first failure life time length and the second failure life time length, determining a predicted failure time length of the to-be-tested object. According to the method, the failure data is obtained by simulating the continuous light emitting working state of the to-be-tested object in the actual application, the aging behavior of the to-be-tested object in the actual application can be truly reflected, and the accuracy is high.

The invention discloses a gadolinium-loaded metal hydride fuel short-life micro-reactor core design method and a reactor core, the reactor core is loaded with gadolinium-loaded metal hydride fuel with high enrichment degree and low uranium mass percent, and the existence form of gadolinium in the reactor core is set, and the uranium mass percent is matched with the gadolinium content; the reactor core adopts a rotating strand matched with a gadolinium burnable poison to control the residual reactivity of the reactor core, the rotating strand performs reactor core power adjustment, and the gadolinium adjusts the reactor core reactivity fluctuation in the life period. The reactor core power is 20 MWt, the reactor core life period is 50 EFPD, 2407 fuel rods are arranged in the reactor core, and the fuel rods comprise 847 gadolinium-loaded metal hydride fuel rods with low uranium mass fraction and 1560 gadolinium-loaded metal hydride fuel rods with high uranium mass fraction. According to the present invention, the strong absorption characteristic and the high burn-up rate of the gadolinium burnable poison are utilized, the existence form and the content of the gadolinium in the reactor core are adjusted, and the rotating strand is matched with the gadolinium burnable poison to control the residual reactivity of the reactor core so as to achieve the minimum fluctuation design of the reactivity of the reactor core in the whole life period, and improve the performance of the reactor core.

The present application relates to the technical field of data line, and specifically relates to a data line with plug-in life prompting function, which comprises a connector body; the connector body is provided with a plug-in cavity and a display cavity; a display disc is rotationally arranged in the display cavity; a plurality of sector display areas are equiangularly arranged on the circumferential surface of the display disc; a driving cylinder is connected to the display disc; the driving cylinder is provided with a driving groove; a driving block is slidingly arranged in the display cavity; the driving block is elastically connected with a driving pin; an elastic slide plate is movably arranged in the display cavity; a trigger assembly is arranged between the other end of the elastic slide plate and the display cavity; a linkage assembly is arranged between the trigger assembly and the driving block. Through the arrangement of the plurality of sector display areas, the trigger assembly, the linkage assembly and the driving block, when the plug-in times of the data line reach the set threshold, the next sector display area is aligned with the display window under the cooperation of the trigger assembly, the linkage assembly and the driving block, so as to remind the user of the current plug-in life of the data line.

The utility model relates to the technical field of magnetic switches, in particular to a magnetic switch full-load life time testing device, which comprises a machine body, a plurality of magnetic switches are circumferentially arranged on the machine body, a power supply is arranged on the machine body, the power supply is electrically connected with the plurality of magnetic switches, the magnetic switches are electrically connected with a load module, and the load module is electrically connected with the machine body. A plurality of magnetic switches are arranged on the machine body, a rotating rod is rotatably arranged on the machine body, the rotating rod is located among the plurality of magnetic switches, a magnet is arranged on the rotating rod, the magnet is used for turning on and turning off the plurality of magnetic switches, a driving part used for driving the rotating rod to rotate is arranged on the machine body, and when the rotating rod rotates, the magnet on the rotating rod is close to or far away from the magnetic switches. The testing device has the effect of high testing efficiency.

The present application relates to the field of power cable engineering, and discloses a low-cost repair decision method for a cable, which comprises the following steps: on-line monitoring the insulation state of the cable by a spread spectrum time domain reflection method, recording the end-of-life time of the cable, collecting the end-of-life time of a plurality of different cables; establishing a cable reliability model according to the Weibull distribution law of the end-of-life time of the plurality of different cables; establishing an average cost rate model according to a preventive repair probability, a failure probability, a preventive repair cost and a failure repair cost; introducing a chaos factor into a mathematical model of a chimpanzee optimization algorithm, and optimizing and solving a target function by a chaotic chimpanzee optimization algorithm according to the preventive repair cost and the failure repair cost to obtain a minimum average cost rate, and outputting a best maintenance period and a repair threshold of the cable. The present application can output the best maintenance period and the repair threshold of the cable under the condition of ensuring the reliability of the cable, and realize a low-cost repair decision.

To increase life times of non-volatile memory devices, the bad block information for a device includes not just whether a device is considered good or bad, but, for bad blocks data on the category of the block's failure. When the number of bad blocks exceeds a threshold level, blocks formerly marked bad can, based on their failure category, have their status updated to good for subsequent usage. This information can also be used during factory testing to update the status of blocks initially marked as bad based on failure category.

The application discloses a life evaluation method of a dynamic operation cellular network, a computer device and a medium, and the method comprises the following steps: S1, setting an initial value; S2, obtaining a first life distribution parameter and a second life distribution parameter of each base station; S3, obtaining a jth fault interval time τ i,j of an ith base station; S4, obtaining the working states of all the base stations at different time points t i ; S5, obtaining the ratio δ T of the network coverage at each time point to the initial coverage based on the working states of all the base stations at different time points; S6, comparing the ratio δ T with a specified value P L , and judging whether the life time is reached; if δ T ≤ P L , a life value T is obtained, k=k+1, and the step S7 is entered; if δ T >P L , j=j+1, and the step S3 is entered; S7, comparing the cycle number k of the life value T with a cycle number n, and judging: if k

The invention discloses an aging life prediction method and system for a SiC MOSFET, and relates to the technical field of silicon carbide field effect transistor aging life prediction, and the method comprises the steps: obtaining an initial life time data set corresponding to each experiment point combination; utilizing a response surface analysis method to construct a response surface model according to the initial life time data set; performing residual analysis on the response surface model to obtain qualified life time data with a residual analysis result meeting the model suitability and the assumed condition conformity; based on the coupling effect between the aging influence factors, combining with the response surface model to construct an aging life prediction initial model; training the aging life prediction initial model by using the qualified life time data to obtain an aging life prediction model; and outputting an aging life prediction result of the SiC MOSFET according to the real-time aging influence factor data and the aging life prediction model. The beneficial effects of the invention are that the experiment data demand is reduced and the aging life prediction accuracy is improved synchronously.

A control gate voltage generating circuit for a non-volatile memory is provided. After the non-volatile memory leaves the factory, the control gate voltage is appropriately adjusted by the control gate voltage generating circuit according to the characteristics changes of the memory cells. When the read action is performed, the control gate voltage generating circuit provides the adjusted control gate voltage to the control gate line of the array structure. The magnitude of the reference current can be maintained in the range between the read current in the erase state and the read current in the program state. Consequently, the storage state of the selected memory cell can be accurately determined, and the life time of the non-volatile memory will be extended.

The application provides a fatigue curve calibration method and a readable storage medium. The fatigue curve calibration method comprises the following steps: obtaining test data under a preset test condition, wherein the test data comprises voltage levels and life time lengths with a corresponding relationship; linearizing a preset life function expression; fitting the linearized preset life function expression based on the test data to obtain a first undetermined coefficient; and substituting the first undetermined coefficient into the preset life function expression to obtain an expected life curve. Based on the expected life curve, a designer can estimate the failure probability and expected service life of a specific component in an actual working condition, thereby solving the problem that the failure probability and / or expected service life of a specific component are unclear in the prior art.

The application relates to a target time sequence alignment method and device, equipment and a readable storage medium, and relates to the technical field of automatic driving. When target identification of an initial frame is performed, a target array is constructed based on the number of target objects when at least one target object is identified; each target object is added to a corresponding index in the target array to construct a mapping relationship between the ID value of the target object and the index, and a life time length value is set for each target object; when target matching of a subsequent frame is performed, the size of each life time length value is adjusted according to the target matching result; when a new target object is identified and at least one target life time length value is less than a preset drop frame threshold value, a target index in which the target object corresponding to the target life time length value is located is released, the new target object is added to the target index, the ID value corresponding to the target index is updated to the ID value of the new target object, and a life time length value is set for the new target object, so that the alignment of the time sequence of the target object is effectively realized.

The utility model provides a feeding channel of a crushing device, and aims to solve the technical problem that in the prior art, materials need to enter a crusher from a high position, so that the service life of the crusher is seriously influenced. The feeding channel comprises a channel body arranged on an inlet of the crushing device in the vertical direction, and a feeding port is formed in the top of the channel body; the flow guide plates are all detachably arranged in the channel body, and all the flow guide plates are arranged in an inclined mode; wherein the two sides in the channel body are each provided with a plurality of flow guide plates, the flow guide plates on the two sides of the channel body are distributed in a staggered mode, and the inclination directions of the flow guide plates on the two sides of the channel body are opposite. According to the feeding channel, the flow guide plate is additionally arranged in the channel body, materials are buffered and decelerated, the potential energy of the materials is reduced, and therefore the impact force of the materials on the toothed plate is reduced, and it is guaranteed that the toothed plate of the crusher is within the normal service life time.

The application discloses a kind of test methods of nanometer FinFET device atmospheric neutron radiation and time breakdown, including comprehensive effect test device, sample is placed into comprehensive effect test device, atmospheric neutron radiation beam line is applied to sample, voltage and temperature are applied to sample by the comprehensive effect test device;The life time of sample is calculated by experiment, the nanometer FinFET device is tested by time breakdown test in atmospheric neutron radiation environment, to evaluate the comprehensive stress influence of nanometer FinFET device on ground and flight altitude, without separately carrying out two tests to evaluate, more convenient, fast.

The utility model discloses a kind of high-life microswitch, and its technical solution main points include base and the press handle that moves up and down relative to base, the base is provided with several electric contacts, the electric contact top is provided with the pot piece for the electric contact is conducted, the press handle is provided with auxiliary elastic member, the auxiliary elastic member one end protrudes the bottom of press handle, so that when press handle is pressed down, protruding auxiliary elastic member is used on pot piece. The utility model is driven with the auxiliary elastic member set in press handle to pot piece deformation, reduce the impact force too big and deformation too big etc. Problem brought by press handle direct drive pot piece deformation, prolong the service life of microswitch.

This invention discloses a long-life power cable resistant to extreme environments, comprising a main body, which, from the outside in, consists of a cable sheath, a shielding layer, an insulation layer, and a conductor layer. The shielding layer includes a shielding mesh and a metal foil. The shielding mesh is a three-dimensional mesh structure woven from a mixture of copper-magnesium alloy wire and shape memory alloy, and it completely wraps around the insulation layer. A graphene coating is applied between the insulation layer and the shielding mesh. The metal foil is tightly adhered to the surface of the shielding mesh, and its outer surface undergoes micro-arc oxidation treatment to form a protective layer, which is then coated with a self-cleaning coating. The adaptive shielding mesh in this invention is woven from a mixture of copper-magnesium alloy wire and shape memory alloy wire into a three-dimensional mesh structure. The shape memory alloy wire can drive the shielding mesh to adaptively deform, maintaining a tight wrapping around the insulation layer. Combined with the metal foil, this ensures stable shielding performance, effectively protecting cable transmission from interference even in complex electromagnetic environments under various extreme conditions.

To increase life times of non-volatile memory devices, the bad block information for a device includes not just whether a device is considered good or bad, but, for bad blocks data on the category of the block's failure. When the number of bad blocks exceeds a threshold level, blocks formerly marked bad can, based on their failure category, have their status updated to good for subsequent usage. This information can also be used during factory testing to update the status of blocks initially marked as bad based on failure category.

The UE determines, on the basis that uplink data about the logical channel is available for the transmission, an SR resource associated with a logical channel and can transmit an SR on the SR resource. Transmitting the SR on the SR resource can include transmitting information related to life time or a PDB of the uplink data.

The application discloses an aging life prediction method and system for SiC MOSFET, relates to the technical field of silicon carbide field effect tube aging life prediction, and comprises the following steps: acquiring an initial life time data set corresponding to each experimental point combination; constructing a response surface model according to the initial life time data set by using a response surface analysis method; performing residual analysis on the response surface model to obtain qualified life time data that meets model adaptability and hypothesis condition compliance; constructing an aging life prediction initial model based on the coupling effect between aging influence factors and combining the response surface model; training the aging life prediction initial model by using the qualified life time data to obtain an aging life prediction model; and outputting an aging life prediction result of the SiC MOSFET according to real-time aging influence factor data and the aging life prediction model. The application has the beneficial effects that the experimental data demand is reduced and the aging life prediction accuracy is improved simultaneously.

The utility model provides a long -life migration RS485 data cable belongs to cable technical field, it includes conductor, insulation, expansion layer, shield layer and outer sheath, the whole characteristic impedance of cable satisfies 120Omega 15Omega, the insulating layer is the polyethylene material quality of good mechanical property, smaller dielectric constant, the expansion layer material quality is the elastomer material quality of good mechanical property, smaller dielectric constant soft, the sheath material quality is wear -resisting polyether type polyurethane material quality, through the reasonable insulation and expansion layer outer diameter cooperation, make the whole characteristic impedance of cable satisfy 120Omega 15Omega, even in the cable long -time migration under the condition of shield layer breakage fracture, characteristic impedance still can satisfy transmission requirement, guarantee the ability of cable long -time trailing operation transmission signal.