194 results about "Test failure" patented technology

The invention discloses an automatic UI self-healing test method and system based on multi-agent AI, and belongs to the technical field of automatic UI tests.The automatic UI self-healing test method comprises the steps that an original test script is semantized through a test reasoning interpretation class, and an expected intention is output; when the test fails, synchronously collecting multi-source data and extracting multi-modal features, constructing a fault propagation graph according to an expected intention and the multi-modal features, and performing fault propagation analysis by using a graph attention network to obtain a fault diagnosis result; according to a fault diagnosis result, a deep Q network, a greedy strategy and a Byzantine fault-tolerant algorithm are adopted to negotiate and decide a repair strategy through a distributed agent cooperation mechanism, and feedback is obtained; optimizing and dynamically adjusting the repair strategy and the test reasoning interpretation class through a meta-learning algorithm based on feedback; a test intention is deeply understood by constructing a test reasoning interpretation class, and fault diagnosis and automatic repair are cooperatively completed by adopting a distributed intelligent agent, so that the semantic understanding capability, the diagnosis accuracy and the repair success rate are improved.

The invention discloses a test failure root cause diagnosis method, which relates to the technical field of electric digital data processing, and is characterized in that after a test failure signal is captured, comprehensive analysis is carried out in combination with multi-source log information of a test case and test environment configuration data, so that the influence of environment configuration on a test is fully considered, and information in a log is fully mined; according to the method, a more accurate diagnosis result is obtained, and a corresponding solution is matched according to a test failure root cause to solve the problem of test failure, so that the problems of low efficiency and high misjudgment probability of manual analysis, neglect of the influence of a test environment on the test failure, difficulty in identifying implicit connection between texts in a log and difficulty in testing failure in the prior art can be solved. Therefore, the technical problem that the obtained analysis result is difficult to be used for accurate root cause diagnosis is solved, the diagnosis efficiency of test failure root causes is improved, the diagnosis precision is improved, and the overall test period is shortened.

Implementations are described herein for network testing using machine learning. In some implementations, a testing system receives an indication of a test failure associated with a test of a wireless communication system. The testing system stores one or more packet capture files associated with the test failure. A machine learning model associated with the testing system performs a root cause analysis of the test failure using the one or more packet capture files. The testing system determines a configuration update for the wireless communication system based on a result of the root cause analysis. The testing system generates an output that indicates the configuration update.

The invention discloses a log analysis method and device, equipment, a medium and a program product, and relates to the technical field of software testing, and the method comprises the steps: obtaining failure log data of a failure test case, and success log data of a success test case corresponding to the failure test case; extracting target content related to the test failure in the failure log data through a preset large language model; performing semantic comparison on log data corresponding to the test steps in the failure log data and the success log data through a preset large language model to obtain difference information; analyzing the failure log data based on a target cue word through a preset large language model to obtain a failure reason of the failed test case, the target cue word being obtained by combining a first cue word and a second cue word, and generating the first cue word by embedding a target content into a first cue word template; and embedding the difference information into a second cue word template to generate a second cue word. The log analysis efficiency is improved.

The invention relates to the technical field of data storage, and discloses a method for testing the signal quality of an IO interface of a memory module, and the method comprises the steps: verifying the signal integrity of the I / O interface in the memory module based on an eye diagram analysis method; after the signal is verified to be complete, the morphological characteristics of the input eye pattern and the output eye pattern are quantitatively compared, whether morphological characteristic changes occur in the signal transmission process or not is judged, and the morphological characteristic changes at least comprise logic level flipping errors, time sequence recognition errors and signal quality degradation; if the morphological characteristics of the input eye pattern are consistent with the morphological characteristics of the output eye pattern, the test is successful; and if the morphological characteristics of the input eye pattern are inconsistent with the morphological characteristics of the output eye pattern, determining that the test fails. Visual and quantitative verification of signal integrity is realized through eye pattern analysis, multi-dimensional indexes such as voltage, time sequence and noise are covered, and the signal transmission quality is reflected more comprehensively compared with a single parameter test.

The invention provides a multichannel platinum thermal resistor program control simulation card and method, the multichannel platinum thermal resistor program control simulation card comprises a resistor gating array, a relay driving array, a microcontroller module, a communication interface module and a power supply module, and the method comprises the following steps: inputting a temperature value in an upper computer; the upper computer carries out temperature-resistance value conversion; the upper computer sets resistance precision; the upper computer packages the resistance value data into a data packet according to a communication protocol, and the data packet is sent to a microcontroller of the lower computer after CRC verification; the microcontroller receives the data packet, analyzes the data packet according to a communication protocol after performing CRC (Cyclic Redundancy Check), and obtains resistance value data; the microcontroller performs'resistance value-I / O state 'conversion; the microcontroller sets an I / O state. The method has the beneficial effects that the integration and automation levels of test equipment are remarkably improved, and the test failure risk caused by the problems of instrument consistency and the like is reduced.

The invention relates to the technical field of Web component testing, in particular to an automatic test case generation method, system and device for a Web component and a medium, and the method comprises the following steps: extracting a front-end frame type and code features to which the Web component belongs, constructing a visual state transition network, and constructing a unified data flow diagram; based on the code features, the visual state transition network and the unified data flow diagram, semantic reasoning is carried out by utilizing a large language model to generate a test path combination, and a minimum complete test case set is generated by applying a combination test algorithm; generating a composite assertion logic; frame type conversion is executed, and the minimum complete test case set and the composite assertion logic are converted into test codes capable of being executed by a front-end frame type; the test code is executed, and the minimum complete test case set and the composite assertion logic are updated and circulated based on Web component change or test failure in the execution process. According to the method and the device, the Web component automatic test which is high in accuracy, cross-frame adaptive and capable of realizing continuous self-healing can be realized.

The invention discloses a test sequence optimization method and device, equipment and a storage medium. Comprising the steps of obtaining function point related data, and generating a function point test sequence based on an upper confidence bound algorithm; defining a global resource occupancy matrix, and according to the function point test sequence, sequentially importing the function points, traversing and querying the global resource occupancy matrix, and generating a parallel scheduling task; and executing the parallel scheduling task, and monitoring resource conflict conditions and test failure information in real time. By comprehensively considering related data of the function points, intelligent sorting of the function points is achieved, and the problems that in a traditional sorting method, exploration and utilization are difficult to balance and global dynamic optimization is lacked are solved. By reasonably distributing parallel tasks, resource conflicts are avoided, the utilization rate of limited test resources is improved, and efficiency reduction caused by unreasonable resource planning is reduced. Resource conflicts are found and processed in time through real-time monitoring, the conflicts are prevented from influencing the test process, test failures can be quickly responded, and the test efficiency is improved.

The invention relates to the technical field of material performance test devices, in particular to a low-temperature tensile test device for an insulating material. The problems that an existing low-temperature stretching tool is poor in clamping and fixing effect on an insulating material in the nuclear fusion field, a sample is prone to torsion sliding in a test, stress relaxation is generated, and adaptability is insufficient are mainly solved. According to the technical scheme, the testing device comprises a clamp, a loading controller, a loading rod, a tensile sample, a force sensor, a supporting device, a testing machine reaction frame and a low-temperature environment box; the clamp comprises an upper clamp and a lower clamp; the low-temperature environment box is arranged outside the testing machine reaction frame, and the supporting device is installed outside the low-temperature environment box. According to the test device, stable positive pressure is applied to a sample, torsion sliding and stress relaxation are prevented, it is ensured that the stretching position of the sampled sample is stable and free of errors, the test failure rate is reduced, the qualification rate is increased, the clamp structures are the same, the pressing blocks are detachable, and universality and efficiency are improved.

The invention relates to the technical field of terminals, in particular to a camera parameter reporting method, a readable storage medium, a program product and electronic equipment. The camera parameter reporting method is applied to the electronic equipment, and the electronic equipment can screen the resolution parameters reported by the cameras based on a pre-stored white list of the resolution parameters after acquiring the resolution parameters reported by the cameras so as to clear redundant resolution parameters. When the compatibility test is carried out on the camera of the electronic equipment, the test quantity of the resolution parameter can be reduced, so that the test time is reduced, and the test failure caused by overtime compatibility test of the electronic equipment is avoided.

This utility model discloses a manual testing circuit and device for an IPM driver board. The circuit includes VIN, VCC, GND, G, and A terminals, and UH, VH, WH upper bridge input switch groups, N-segment lower bridge input switch groups, and BR, UH, VH, WH, UL, VL, WL output switch groups, respectively connected to the IPM driver board under test. VIN, VCC, and GND terminals are connected to the UH, VH, WH upper bridge input switch groups and the N-segment lower bridge input switch groups, respectively. G and A terminals are connected to the BR, UH, VH, WH, UL, VL, WL output switch groups, respectively. Using the circuit provided by this utility model, the switching function of the IPM driver board under test can be tested individually. By setting the UH, VH, WH upper bridge switch groups to control the individual power supply of the upper bridge arms of the IPM driver board under test, and by switching the N-segment lower bridge input switch groups to control the individual power supply of each phase of the lower bridge arm, fault analysis of a single bridge arm can be achieved. This allows for the screening of problematic IPM module driver boards before assembly, reducing losses caused by overall module test failures.

The invention relates to the technical field of electronic design, in particular to a software testing method, computer equipment, a readable storage medium and a program product. According to the software testing method provided by the invention, the testing scheme is generated according to the code of the to-be-detected software through the testing strategy module, so that the pertinence is improved, and the resource consumption of the server is reduced. According to the test scheme, the metadata module and the execution module are utilized to create and run the test case, flexible configuration and automation of the test process are achieved, manpower and time cost is reduced, and efficiency and accuracy are improved. Meanwhile, through multi-level test result judgment of the judgment module, public test judgment and a test case exclusive judgment mode are combined, it is ensured that problems are exposed at the fastest speed, and the test efficiency is improved. The modularized testing process enables the method to have high expandability, new requirements can be met, it is ensured that the software quality is continuously and effectively evaluated, and the testing failure risk is reduced.

This application discloses a software testing method and related equipment based on dual-model collaboration, relating to the field of software testing technology. The method includes: processing a natural language requirements document using a pre-defined large language model to obtain a test script for testing the software under test; if the software test result is a test failure, verifying and classifying the test result using a pre-defined algorithm model to obtain abnormal scripts and system bugs; correcting the abnormal scripts and system bugs; and iteratively testing the software under test based on the corrected test script and the corrected software under test until the software test is completed. This application, through a collaborative architecture of "large model understanding + small model judgment" and a semantic consistency detection mechanism, effectively corrects logical deviations in the generated content (test script), ensuring a high degree of matching between test cases and system functional behavior, significantly improving the reliability and executability of test cases, and thus achieving high-quality and high-efficiency software testing.

The application discloses a multi-position defect repairing method based on repairing sequence scheduling and multi-agent cooperation. First, the defect analysis agent is used to identify the code error root cause and generate a defect analysis report. Then, the report, error code, local context, failed test cases and test error information are combined to build a repair context. Then, the multi-agent architecture is used to iteratively generate patches: the coordinator agent analyzes the dependency relationship between code blocks and schedules the repair sequence, the proposer agent generates a local candidate patch, and the coordinator evaluates and selects the optimal patch. Repeat the process until all repairs are completed and a complete patch is assembled. Finally, according to the compilation error and test failure report, the patch is executed in two stages of syntax and semantics refinement. The application overcomes the defects of the existing large model repairing method, such as lack of sequence scheduling and difficulty in handling code block dependencies, and realizes efficient repair of complex multi-position defects.

The utility model is applicable to the technical field of pipeline pressure test tools, and provides a pipeline interface sealing water injection pressure test tool, which comprises a bottom plate, vertical plates are arranged at two ends of the top of the bottom plate in a left-right movable manner, a first bearing plate short pipe and a second bearing plate short pipe are arranged on the inner side of each vertical plate, and the second bearing plate short pipe is provided with a water inlet pipe. According to the pipeline interface sealing type water injection pressure test tool, pipelines to be subjected to pressure test are horizontally stacked in the containing box, an arc-shaped feeding plate is driven to ascend, the pipelines ascend to a discharging opening along with the arc-shaped feeding plate, then a material guide plate is rotated to be aligned with a placement seat, a push plate is pushed to push the pipelines out of the discharging opening, the pipelines slide to the placement seat along the material guide plate, and a transverse plate is driven to ascend; the arc-shaped supporting seat receives the pipeline on the placing seat, the first sliding block is driven to slide, the vertical plate is driven to move to the two ends of the pipeline, the bearing disc short pipe is in butt joint with the pipeline, manual carrying and adjusting are reduced, the labor intensity is reduced, the operation efficiency is improved, pressure test failure caused by positioning errors is avoided, and the pressure test success rate is improved.

The application provides a kind of inter-station safety information transmission system testing device and method, the one-way test component and two-way test component of the device are connected with inter-station safety information transmission system through driving line, and the connection line is connected with the one-way communication board and two-way communication board of inter-station safety information transmission system.In the scheme, the one-way test component and two-way test component are connected with inter-station safety information transmission system through driving line respectively, when the status signal generated by one-way test component is transmitted to two-way test component, it is determined that the signal transmission from one-way to two-way of inter-station safety information transmission system is normal, when the status signal generated by two-way test component is transmitted to one-way test component, it is determined that the signal transmission from two-way to one-way of inter-station safety information transmission system is normal, and inter-station safety information transmission system is connected through two driving lines, to realize the purpose of simplifying wiring and preventing wiring error test failure.

The application discloses a aligning tool for aligning an experimental support, which is used for bearing a rotor, and comprises a simulation bearing seat, which is installed on the experimental support and has a horizontal bearing hole; a simulation shaft, which is sleeved in the bearing hole of the simulation bearing seat and protrudes from both ends of the bearing hole after being sleeved; and an aligning instrument, which is clamped on the end of the simulation shaft to realize the alignment of the experimental support. The application can ensure good alignment between each shaft system or each experimental support, avoid test failure caused by misalignment during the test, and affect the test safety.

The present application belongs to the technical field of probe card batch detection, and provides a chip batch detection method and system based on a probe card multiplexing strategy, comprising: obtaining the number of times of multiplexing of the probe card, analyzing the change of temperature drift of the probe card, constructing a temperature drift prediction model based on a deep learning model; based on the temperature drift prediction model, taking the current number of multiplexing and the current working temperature of the probe card as input, outputting the temperature drift prediction value of the current number of multiplexing, adopting a preset temperature drift compensation strategy to perform temperature drift compensation, and performing quantitative deviation analysis on the temperature drift compensation to determine whether the temperature drift compensation is out of limit; the present application realizes dynamic monitoring of the whole life cycle of the probe card, guides the staff to reasonably dispose, and avoids test failure and cost waste.

A verification method of a panoramic lens focusing station comprises the following steps: controlling a lens actuator assembly and a focusing device according to preset data so as to move a focusing adjustment ring of a panoramic lens to the position of a caliper of the focusing device and enable the caliper to be engaged with the focusing adjustment ring; when the focusing adjusting ring cannot be correctly meshed with the calipers, a test result including test failure is generated, and the lens actuator assembly is controlled to return to the original point; when the focusing adjusting ring can be correctly engaged with the calipers, the focalizer is controlled to adjust the focal length of the panoramic lens according to the preset data, and a focusing test is carried out; and when the panoramic lens passes the focusing test, generating a test result including the passing of the test, and controlling the lens actuator assembly to return to an original point.

A disclosed method defines root cause failure categories for a test case and associates each category with a corresponding test configuration property. Test configuration property information, indicative of the test configuration properties, are embedded in test case metadata. After generating test results, including test script messages, the test script messages assessed to identify the “N” most significant keywords in the message. The significance of a term in the test script message may be calculated based on an inverse document frequent parameter, independent of the term frequency within the document. Test result groups may then be determined by invoking a suitable clustering algorithm, e.g., a k-means clustering algorithm, to cluster the test script messages based on their corresponding keyword sets. Hypothesis test statistics may then be calculated for each test result group. A most probable root cause may then be identified for some or all of the test result groups.

The embodiment of the invention provides semiconductor testing equipment and a current gear switching method and device thereof, and relates to the technical field of semiconductor testing. The current gear switching method is applied to semiconductor test equipment, and comprises the following steps: detecting whether a first switching instruction sent by an upper computer is received or not; if a first switching instruction is detected, a first smooth transition module is controlled to be connected to a circuit in the current gear switching process, and based on a plurality of resistance values output by the first smooth transition module under the current current gear, a current current gear module is firstly disconnected, and then a target current gear module is closed; or if the first switching instruction is detected, the target current gear module is firstly closed and then the current current gear module is disconnected based on the capacitance value which is output by the second smooth transition module and corresponds to the current current gear. According to the embodiment of the invention, the problem of test failure easily caused by transient voltage abrupt change when the current gear is switched in the prior art is solved.

The invention provides a user interface testing method which can be applied to the technical field of artificial intelligence, and relates to application of a large model in the fields of information security and financial science and technology. The user interface testing method comprises the steps that on the basis of a pre-constructed user interface component model library, intention inference is conducted on initial abstract syntax tree nodes of codes to be tested, target abstract syntax tree nodes are obtained, the target abstract syntax tree nodes comprise variable fields, user interface component type fields and service intention fields, and the variable fields are selected from the variable fields, the user interface component type fields and the service intention fields; the business intention field represents the business meaning of the user interface level; based on the target abstract syntax tree node and the to-be-tested code, testing the target user interface, and outputting a test result; and under the condition that the test fails, constructing an execution snapshot graph based on the target abstract syntax tree node and the test data in the test result to obtain a repair scheme. The invention further provides a user interface testing device and equipment, a storage medium and a program product.

The invention discloses a self-adaptive test method and system for an automobile body controller based on data driving and a dynamic strategy, and belongs to the technical field of automobile electronic test. The method comprises the following steps: S1, generating an initial risk portrait and a test sequence based on identity features; s2, testing is executed, multi-dimensional performance feature vectors are collected, and a testing queue is dynamically updated through a strategy model; s3, when the test fails, triggering intelligent diagnosis to generate a root cause hypothesis and inserting a verification case; and S4, applying the whole process data to the evolution learning of the knowledge base and the model. According to the method, a'perception-decision-learning 'closed loop is constructed, normal form transformation of testing from automatic execution to intelligent exploration is realized, and the testing efficiency and the defect discovery depth are improved.

The invention provides a software test failure root cause positioning method and device, electronic equipment and a storage medium, and the method comprises the steps: obtaining multi-modal data associated with a software test failure event, the multi-modal data comprising test log data, test scene data and system performance index data; performing preprocessing and feature extraction on the multi-modal data to obtain a test log feature vector, a test scene feature vector and a system performance feature vector; inputting the test log feature vector, the test scene feature vector and the system performance feature vector into a root cause positioning model, performing root cause positioning by combining the root cause positioning model with a pre-constructed test failure root cause knowledge graph, and outputting a root cause positioning result of a software test failure event; the root cause positioning model is obtained by training based on a multi-modal feature vector sample and a root cause positioning result label. According to the invention, root cause positioning is carried out by adopting the root cause positioning model and combining the multi-modal features, so that the efficiency and accuracy of root cause positioning are improved.

The utility model relates to the technical field of side-hung vibration fixtures, in particular to a high-rigidity side-hung vibration fixture, which comprises a frame body, a mounting plate is fixedly mounted in the frame body, a test piece is movably mounted on the front surface of the mounting plate, the frame body comprises a bottom plate, a rear plate is fixedly mounted on the back surface of the bottom plate, and the test piece is movably mounted on the rear plate. A middle support plate is fixedly mounted in the middle of the bottom plate on the front side of the rear plate, and side plates are fixedly mounted on two sides of the upper surface of the bottom plate on two sides of the front side of the rear plate respectively; the back face of the mounting plate is fixedly connected with the middle supporting plate, the two sides of the mounting plate are fixedly connected with the side plates respectively, the steel bushings are fixedly mounted on the front face of the mounting plate in a rectangular array mode, and holes are formed in the four corners of the test piece respectively, and the test piece is arranged on the steel bushings in a sleeving mode. The side hanging type vibration clamp has the advantages of being high in structural stability, large in rigidity and good in damping performance, and solves the problem that a traditional side hanging type vibration clamp is low in fundamental frequency and prone to resonance to cause test failure.

According to the test structure for the high-side switching device, the high-side switching device comprises a substrate, a shield gate trench device and a bipolar complementary metal oxide device, the shield gate trench device and the bipolar complementary metal oxide device are located on the substrate and arranged at an interval, and a gate of the shield gate trench device and a gate of the bipolar complementary metal oxide device are electrically connected with each other through a gate interconnection line; the test structure includes a first test pad on the substrate and a diode string structure in which at least two diodes are connected in series, in which cathodes of the at least two diodes are connected to each other, an anode of one of the diodes is connected to the gate interconnection line, and the first test pad is also connected to the gate interconnection line. According to the invention, under the condition that the bipolar complementary metal oxide device is not affected, the voltage endurance capability parameter of the shield gate trench device can be tested and monitored, the test failure ratio is reduced, and the product quality of a high-side switching device is improved.

Techniques for supervised access to the error logs stored on a protected database to perform test failure remediation with respect to the failures associated with prior executions of test scripts. In some cases, when the execution of a test script is aborted because a data value provided by the test script fails to match a corresponding data record stored on a target database, a corresponding error log may be created. To remediate the noted test failure, an example system may select a test correction template that is associated with a corresponding test correction script and provide a corrected data value as a parameter of the selected template. Subsequently, the system may perform operations associated with a database transaction that is configured to: (i) re-execute the operations associated with the previously aborted test script, and (ii) upon successful re-execution, remove the corresponding error log.

The invention belongs to the technical field of electric cooker manufacturing, particularly relates to pressure resistance detection equipment for an electric cooker inner container arc limiting test, and aims to solve the problems that a clamp and the bottom of an inner container only form point contact or line contact, and the inner container possibly slides, deviates and even overturns due to uneven stress in the pressurizing process, so that the test fails, and the test efficiency is low. In order to solve the problem that sudden slippage of a pressure head is more likely to cause equipment damage or personnel safety risks, the following scheme is proposed that the tool detection device comprises a tool detection table, a self-adaptive limiting module is arranged above the tool detection table, and the self-adaptive limiting module comprises a plurality of supporting columns. The pressure resistance detection equipment for the arc-shaped limiting test of the inner container of the electric cooker has the advantages that full-fitting flexible clamping is achieved, sliding and overturning of the inner container in the testing process are completely eradicated, meanwhile, excellent self-adaptability and universality are achieved, the equipment can be rapidly adapted to various products, complex clamps do not need to be replaced, the detection efficiency is improved, and the detection cost is reduced. And the equipment cost is reduced.

An analysis device specifies a cause when a test of test target software fails in a test environment that is an environment for executing a test. In the test, execution of test target software and confirmation of an execution result are executed by a test script without human intervention. Test data is data read into the test target software and the test script when the test is executed. The analysis device includes: a score calculation unit that calculates a failure cause score for each of test target software, test data, a test script, and a test environment based on the presence or absence of a change; and an estimation unit that estimates, based on a failure cause score, whether the test has failed due to test target software, test data, a test script, or a test environment.

The embodiment of the invention provides a scanning test device and method and a chip, and the device comprises a switching network configuration unit which comprises a configuration array and a configuration array repair logic; the configuration array is used for generating a configuration signal to configure gating of the test channel; the configuration array repairing logic is used for repairing the configuration signal based on a repairing signal when the configuration array fails; and the switching network repairing unit is used for generating a repairing signal so as to repair the configuration signal. The configuration array repairing logic is set in the switching network configuration unit, and when the configuration array fails, the configuration signal is repaired based on the repairing signal generated by the switching network repairing unit, so that the problem that the switching network configuration array cannot provide a correct configuration path for the switching network due to the existence of production defects is avoided; therefore, the test efficiency of the scanning test is improved.