3290results about "Functional testing" patented technology

Disclosed are embodiments of a built-in self-test (BIST) architecture that incorporates a standalone controller that operates at a lower frequency to remotely perform test functions common to a plurality of embedded memory arrays. The architecture also incorporates command multipliers that are associated with the embedded memory arrays and that selectively operate in one of two different modes: a normal mode or a bypass mode. In the normal mode, instructions from the controller are multiplied so that memory array-specific test functions can be performed locally at the higher operating frequency of each specific memory array. Whereas, in the bypass mode, multiplication of the instructions is suspended so that memory array-specific test functions can be performed locally at the lower operating frequency of the controller. The ability to vary the frequency at which test functions are performed locally, allows for more test pattern flexibility.

In-circuit emulation (ICE) and software debug facilities are included in a processor via a debug interface that interfaces a target processor to a host system. The debug interface includes a trace controller that monitors signals produced by the target processor to detect specified conditions and produce a trace record of the specified conditions including a notification of the conditions are selected information relating to the conditions. The trace controller formats a trace information record and stores the trace information record in a trace buffer in a plurality of trace data storage elements. The trace data storage elements have a format that includes a trace code (TCODE) field indicative of a type of trace information and a trace data (TDATA) field indicative of a type of trace information data.

System and method of systems and methods of controlling an IC test equipment in response to verbal commands issued by test equipment users. A control apparatus according to the present disclosure includes a speech detection device operable to detect verbal commands and test control software configured to control operations of the test equipment. The control software is added with verbal command recognition capabilities. Program action commands defined in the test control software are associated with respective recognizable verbal commands. Upon a recognizable verbal command is detected, it is interpreted into the corresponding program action command which triggers the intended test program actions. The control apparatus may also have a gesture detection device, through which user gesture commands can be detected and interpreted into corresponding program actions commands.

A virtual appliance environment (VAE) consists of components residing on a computer BIOS ROM and also on a mass storage device. The VAE includes a virtual appliance (VA) for diagnosing malfunctioning hardware or software. The VA for diagnosing malfunctions tests the hardware and/or software resident in the computer and transmits the results of the test to a server, which diagnoses the problem and transmits instructions to the VAE for saving the data, determining whether the computer is under warranty, and providing shipping information to a user. The VAE can also download a VA for scanning viruses. The VAE transmits the results of the virus scan to the server, which determines the type of virus infecting the computer and transmits instructions to the virtual appliance for downloading the appropriate VA for removing the virus. The VAE can save the data to another source, remove the virus, and restore the data or simply remove the virus.

An electronic circuit includes a first processor (100) operable to perform processing operations, a first trace buffer (230) coupled to the first processor (100), a first triggering circuit (210) coupled to the first processor (100), the first triggering circuit (210) operable to detect a specified sequence of particular processing operations in the first processor (100); a second processor (101), a second trace buffer (231) coupled to the second processor (101), a second triggering circuit (211) coupled to the second processor (101), the second triggering circuit (211) operable to detect at least one other processing operation in the second processor (101); and a cross trace circuit (330) having a trace output and having inputs coupled to the first triggering circuit (210) and to the second triggering circuit (211), the cross trace circuit (330) configurably operable to respond to a sequence including both a detection of the sequence of particular processing operations of the first processor (100) by the first triggering circuit (210) and a detection of the at least one other processing operation of the second processor (101) by the second triggering circuit (211), to couple at least one of the first trace buffer (230) and the second trace buffer (231) to the trace output. Various circuits, devices, telecommunications products, wireless handsets, systems and processes of operation and manufacture are disclosed.

The invention relates to a software system and method for dynamically varying context sensitive menus of a software system. In this method, a menu item is added to a context sensitive menu of a graphical user interface (GUI) at the request of a subsystem module. Then, an activation event for the context sensitive menu is received from the GUI. The added menu item is displayed as either active or inactive based on a response to a query from the software system to a second subsystem module. The action associated with the menu item specified by the first subsystem module is executed when the menu item is selected only if it is active.

A processor core for transitioning a debugging unit between a plurality of operating states in response to an instruction stream is disclosed. The processor core generates trace data as it processes operating signals of the instruction stream. The processor core provides a first trigger event signal to the debugging unit in response to a first trigger instruction signal within the instruction stream that is representative of a triggering instruction to transitions the debugging unit to a base operating state. The processor core provides a second trigger event signal to the debugging unit in response to a second trigger instruction signal within the instruction stream that is representative of a triggering instruction to dynamically store trace data within the memory component of the debugging unit. The processor core provides a third trigger event signal to the debugging unit in response to a third trigger instruction signal within the instruction stream that is representative of a triggering instruction to statically store trace data within the memory component of the debugging unit. Concurrently or alternatively, the processor core can provide one or more of the trigger event signals to the debugging unit as a function of a generated trigger data in response to additional operational instructions within the instruction stream.

Checking the consistency of a lock step process while debugging a microcontroller code is in progress. A method provides a production microcontroller to execute an instruction code and provides the result of the instruction code to an ICE. The ICE, independent from the production microcontroller and simultaneously, executes the same instruction code and produces a result. The ICE compares the result of its computation and the result received from the production microcontroller. The ICE issues a “lock step error” when the result of the comparison is a mismatch. A trace buffer residing in the host device provides the location of the line of code causing the mismatch. After identifying the line of code causing the mismatch the user debugs the erroneous line of code. The debugging process resumes on the next line of code in the microcontroller code under test.

A microcode programmable built-in-self-test (BIST) circuit and method for testing a multiported memory via multiple ports, either simultaneously or sequentially, as directed by a microcode instruction word. The microcode instruction word contains a plurality of executable subinstructions and one bit of information that controls whether the test operations prescribed in the plurality of subinstructions shall be executed in parallel or in series. The executable subinstructions are dispatched by a primary controller to subcontrollers which perform test operations at each port according to the subinstructions. The microcode programable BIST architecture flexibly facilitates the testing of multiple devices, multiported devices, including multiported memory structures and complex dependent multiported memory structures. The BIST supports in-situ testing of the functionality of the memory at wafer, module, and burn-in, as well as system-level testing.

The Advanced Logic System (ALS) is a complete control system architecture, based on a hardware platform rather than a software-based microprocessor system. It is significantly different from other PLC-type control system architectures, by implementing a FPGA in the central control unit. Standard FPGA logic circuits are used rather than a software-based microprocessor which eliminate problems with software based microprocessor systems, such as software common-mode failures. It provides a highly reliable system suitable for safety critical control systems, including nuclear plant protection systems. The system samples process inputs, provides for digital bus communications, applies a control logic function, and provides for controlled outputs. The architecture incorporates advanced features such as diagnostics, testability, and redundancy on multiple levels. It additionally provides significant improvements in failure detection, isolation, and mitigation for the highest level of integrity and reliability.

A system for debugging a processor includes logic circuits for communicating commands and data between a serial input/output port, a trace logic, and the processor. Some embodiments of the debugging system also include a parallel input/output port so that the logic circuits also communicate commands and data between the parallel input/output port, the trace logic, and the processor. The debug system includes a plurality of state machines that read the commands and data from the serial input/output ports. The commands are decoded by a decode logic. Some of the commands, such as commands for reading data from memory, utilize processor intervention and are transferred to the processor for execution. The state machines operate only on a single command at one time so that an active state machine does not accept additional commands until completion of the command that is currently executed. Once execution of the command is complete, the state machines generate an indication of the completion event or condition, typically by setting a flag in a debug register or by asserting a readable output pin. The completion event or condition is accessed by a debug tool such as a host processor, a monitoring tool, or the like.

An integrated bus controller and power supply device includes a typical or standard bus controller and a bus power supply disposed in a common housing, the size and external configuration of which may match a standard bus controller device associated with a typical I/O communication network. The bus controller may store and implement one or more control routines using one or more field devices connected to the I/O communication network while the bus power supply generates and provides the appropriate power signal to the bus of the I/O communication network, the power signal being used to power the field devices connected to the I/O communication network. The integrated bus controller and power supply device can be easily connected to the bus of the I/O communication network to provide both bus controller functionality and bus power supply functionality on the I/O communication network, without the need of configuring and attaching separate, dedicated bus controller and power supply devices to the bus and having to wire these devices together using multiple different terminal blocks.

A method for managing a pattern object file in a modular test system is disclosed. The method includes providing a modular test system, where the modular test system comprises a system controller for controlling at least one site controller, and where the at least one site controller controls at least one test module and its corresponding device under test (DUT). The method further includes creating an object file management framework for establishing a standard interface between vendor-supplied pattern compilers and the modular test system, receiving a pattern source file, creating a pattern object metafile based on the pattern source file using the object file management framework, and testing the device under test through the test module using the pattern object metafile.