583 results about "Speed test" patented technology

The invention discloses a test method for real object crash of vehicle components and a test device thereof. The test method comprises the following steps: the vehicle components are fixed on a carrying trolley which can move on a track, the speed of the trolley is increased to a test value by traction with a drive system before preparing for crash an impact wall; when the carrying trolley moves to a set position before the impact wall, a trigger device is started to detach the drive system from the carrying trolley, a test component and the carrying trolley are caused to crash the impact wall without drive power; a vehicle-borne acceleration test system is arranged on the carrying trolley so as to complete data acquisition in real time; and the trigger device triggers a speed test system, an impact force test system and a high-speed camera system at the same time. The test method of the real object crash of the vehicle components and the test device can help measure objective data in real time such as the impact force, a transient acceleration, component deformation and speed output at the moment of crash, and further can record deformation sequence images of the components during the whole crash course so as to get scientific and exact analysis results.

A buffer device for testing a memory subsystem. The buffer device includes a parallel bus port adapted for connection to a slow speed bus and a serial bus port adapted for connection to a high speed bus. The high speed bus operates at a faster speed than the slow speed bus. The buffer device also includes a bus converter having a standard operating mode for converting serial packetized input data received via the serial bus port into parallel bus output data for output via the parallel bus port. The buffer device also includes an alternate operating mode for converting parallel bus input data received via the parallel bus port into serial packetized output data for output via the serial bus port. The serial packetized input data is consistent in function and timing to the serial packetized output data.

Systems and methods consistent with principles of the present invention allow contactless measuring of various kinds of electrical activity within an integrated circuit. The invention can be used for high-bandwidth, at speed testing of various devices on a wafer during the various stages of device processing, or on packaged parts at the end of the manufacturing cycle. Power is applied to the test circuit using conventional mechanical probes or other means, such as CW laser light applied to a photoreceiver provided on the test circuit. The electrical test signal is introduced into the test circuit by stimulating the circuit using a contactless method, such as by directing the output of one or more modelocked lasers onto high-speed receivers on the circuit, or by using a high-speed pulsed diode laser. The electrical activity within the circuit in response to the test signal is sensed by a receiver element, such as a time-resolved photon counting detector, a static emission camera system, or by an active laser probing system. The collected information is used for a variety of purposes, including manufacturing process monitoring, new process qualification, and model verification.

An apparatus to heat and test a semiconductor wafer includes a probe card and tests a plurality of die simultaneously at the wafer level. In the present invention, the apparatus heats the wafer to sufficient temperatures to perform burn-in and a speed test. A method of testing the semiconductor allows certain die to be repaired that would otherwise be scrapped in a conventional process where bun-in and other tests are performed on packaged die. The method also eliminates steps associated with handling individually packaged parts, reduces burn-in space and consolidates certain test steps.

The invention relates to an automatic analysis apparatus. The apparatus includes a reaction container supply unit, a reagent warehouse receipt, a sample transfer unit, a reaction incubation unit, a cleaning and separating unit, a detection unit, a sample adding unit, a transfer unit and a control system. An automatic analysis method using the automatic analysis apparatus includes the following steps: (1) supplying a reaction container; (2) adding an analysis sample and an analysis reagent; (3) reacting; (4) cleaning, and separating; (5) adding a detection reagent; (6) reacting; and (7) detecting. The automatic analysis apparatus and the automatic analysis method can flexibly realize a variety of test modes and reaction times, reduce the size of a whole machine, reduce the cost, and make the whole machine have a compact structure; and the automatic analysis apparatus has scalability, can easily realize high speed test, and is suitable for analysis under different test modes and reaction times.

This invention discloses a two-phase flow digital particle image speed test method and its device, which uses suitable particles to trace flow of fluids and uses high speed CCD camera to register motion images for tracing particles, liquid drops or gas bubbles, applies an image process method to separate the images of scattered phase particles drops or bubbles from original images and extracts velocities of them from their images and applies an improved cross correlation technology based on quick Fourier transformation to extract the velocity field of the tracing particles to realize the synchronous measurement to the two phase flows with different phase velocity fields. The device includes a HeNe laser, a triple prism and a cylinder lens, a high speed CCD camera, an image collecting card and a control and image process computer.

A bit fail map circuit accurately generates a bit fail map of an embedded memory such as a DRAM by utilizing a high speed multiplied clock generated from a low-speed Automated Test Equipment (ATE) tester. The circuit communicates between the ATE tester, the embedded memory under test, Built-In Self-Test (BIST) and Built-In Redundancy Analysis (BIRA). An accurate bit fail map of an embedded DRAM memory is provided by pausing the BIST test circuitry at a point when a fail is encountered, namely a mismatch between BIST expected data and the actual data read from the array, and then shifting the bit fail data off the chip using the low-speed ATE tester clock. Thereafter, the high-speed test is resumed from point of fail by again running the BIST using the high-speed internal clock, to provide at-speed bit Fail Maps.

The invention discloses an anti-collision method and system under different vehicle conditions, and belongs to the technical field of vehicle safety. The method includes the steps that the vehicle conditions are judged according to the vehicle speed and the corresponding safety distance, and the trajectory calculation quantity, the trajectory computing cycle, and the information sending cycle are determined according to the different vehicle conditions, vehicle trajectories are calculated according to the trajectory calculation quantity, the trajectory computing cycle and vehicle running states, the vehicle trajectories are periodically broadcast, anti-collision detection is conducted through the comparison between the vehicle trajectory of one vehicle and the vehicle trajectories of other vehicles, and if it is detected that a collision possible occurs, an early warning signal is output. The anti-collision method and system under the different vehicle conditions can achieve distinguishing of different risk levels of the vehicles through a vehicle condition determination strategy, targeted anti-collision warming for dangerous vehicles can be conducted, information transmission amount can be reduced through scattering the trajectory calculation to each vehicle, the decision making early warning speed test is improved, the occurrence of the vehicle collision is effectively prevented, and traffic accidents are reduced.

Automated test equipment capable of performing a high-speed test of semiconductor devices is presented. The automated test equipment comprises a system controller for controlling a test program, wherein the system controller is coupled to a bus. The tester system further comprises a plurality of modules also coupled to the bus, where each module is operable to test a plurality of DUTs. Each of the modules comprises a tester processor coupled to the bus and a plurality of configurable blocks communicatively coupled to the tester processor. Each of the configurable blocks is operable to communicate with an associated DUT and further operable to be programmed with a communication protocol for communicating test data to and from said associated device under test.

The invention relates to a high-temperature high-speed test method for a sealed bearing, which comprises the following steps of: firstly designing a testing device, installing two sets of testing accompanying bearings on a testing main shaft, and pretightening through a set of spring and a pressure ring; installing the two sets of testing bearings at the left end and the right end of the testing main shaft, connecting an electric main shaft through a shaft coupling and additionally covering a shield; starting cooling circulating water, adding cooling water into a loading sleeve, starting a hydraulic station, an electric main shaft variable-frequency driving system and a computer control system, applying 20-30 percent of the maximum axial test load and 20-30 percent of the maximum radial test load to the testing bearings, starting the electric main shaft to reach 15-20 percent of the highest rotational speed and running for 15-25 minutes after the heating temperature reaches a set value, and then sequentially adding axial loads and radial loads and increasing the rotational speed of the electric main shaft so as to reach the highest rotational speed when the power consumption current of the electric main shaft tends to be steady; and carrying out computer data processing for the data and images in different time periods of the whole testing process and working out a test conclusion.

The invention relates to one voltage decoupling transducer gear vector control method with parameters self-integrating functions, which tests transducer displacement motor stator end voltage, current and rotor speed through outlet voltage test unit, current test unit and speed test unit; according the vector converting the three-phase voltage, current into two-phase rotation coordinates value; for control given value exerting negative feedback adjust and for computation; through decoupling to get control value through inverse vector conversion computation to get three-phase voltage control value for recycle execution.

A control circuit for high-speed test of RAM is disclosed, which is based on hardware logic for correct location of failure and high test efficiency. Its test method includes such steps as setting up the state of test command register, choosing test type, strobing test register, testing data lines by comparison, testing address lines by comparison, step test of memory units, and analyzing error type by reading state registers.

Automated test equipment capable of performing a high-speed test of semiconductor devices is presented. The automated test equipment apparatus comprises a computer system comprising a tester processor, wherein the tester processor is communicatively coupled to a plurality of FPGA components. Each of the plurality of FPGA components is coupled to a memory module and comprises: an upstream port operable to receive commands and data from the tester processor; a downstream port operable to communicate with a respective DUT from a plurality of DUTs; and a plurality of hardware accelerator circuits, wherein each of the accelerator circuits is configured to communicate with one of the plurality of DUTs. Each of the plurality of hardware accelerator circuits comprises a pattern generator circuit configurable to automatically generate test pattern data to be written to the one of the plurality of DUTs and a comparator circuit configured to compare data read from the one of the plurality of DUTs with test pattern data written to the one of the plurality of DUTs

One or more test classes implement an object oriented interface that specifies an execution method and a results method called from a user interface running on the mobile terminal or an emulator. The user interface enables a user to select one or more tests to run, view results, and upload results to a server. For each test, the user interface calls the execution method to initiate the test and obtain a success or failure indication. The user interface also calls the results method to obtain data on a capability and/or to obtain validation that the capability is complete and reliable. Tests that require specific hardware are activated or deactivated, depending on whether the mobile terminal includes the required hardware. Test include a memory size test, a memory integrity test, a socket connection test, an HTTP test, a camera test, an image rendering speed test, a message test, and the like.

The invention discloses an online gas tightness detection device and method for a fuel cell stack. The online gas tightness detection device for the fuel cell stack comprises a pressure gauge, a gas tightness portable test box and a gas leakage speed test meter, wherein a pipe is arranged in the gas tightness portable test box, a required control valve is arranged on the pipe, and the pipe and the control valve can be matched to perform gas tightness detection on the fuel cell stack by testing gas. The online gas tightness detection device for the fuel cell stack is reasonable in structure and easy to operate. By means of the online gas tightness detection method for the fuel cell stack, work efficiency and economic benefit can be increased effectively, gas tightness detection operation is simplified greatly, and efficient and reasonable detection on the fuel cell stack can be achieved.

The invention discloses a testing method and device of webpage access speed, which can be used to solve the technical problems that the webpage access speed cannot be tested automatically, rapidly and accurately during the webpage access speed test based on a handheld device. According to the invention, first system time can be acquired through a first interface when a URL (uniform resource locator) address is submitted, and then a second interface can indicate the first interface to acquire second system time after the webpage rendering is finished and before the UI (user interface) is showed, and finally the total time of the webpage access can be obtained by calculating the difference value between the first system time and the second system time. By using the method and device provided by the invention, the webpage speed of the browser can be tested automatically and accurately.

A rocket solid propellant combustion speed test system relates to test equipment technology field. It enhances the test precision and test efficiency of the solid propellant combustion speed, achieves the management of the test date and data self-disposal to complete the automatization of the test process. It adopts the computer technology based on the existing technology. The system relates to firebox, signal collection equipment, gas way, waterway, temperature adjust equipment and designed system control equipment. The system control equipment relates to computer, control soft and control box made up of valve control drive circuit and ignition circuit. Signal collection equipment gets test signal from the firebox and magnifies it to carry to system control equipment. The computer deals with the data and sends control signal to the valve controlled by the valve control drive circuit and ignition circuit to switch on, interdict or ignite the solid propellant drug bar. It is mainly used for the rocket solid propellant combustion speed test.

Automatic test equipment is capable of performing a high-speed test of semiconductor devices, with a low cost and high efficiency. The automatic test equipment (ATE) comprises: an ATE body configured to electrically test semiconductor devices; a field programmable gate array (FPGA) controlling drivers and comparators on the ATE; an accelerator connected to an output terminal of the FPGA and that doubles an operating frequency of the FPGA; and a decelerator connected to an output terminal of the FPGA and that converts an operating frequency of data transferred from the semiconductor device to the operating frequency of the FPGA.

A SiP includes a logic chip and a memory chip. The memory chip includes a memory circuit to be tested, and the logic chip includes an internal logic circuit and a test processor electrically connected therewith. The test processor is connected with an access terminal of the memory circuit and supplies a test signal input from an external terminal to the access terminal to thereby test the memory circuit. The test processor includes a high-speed test control circuit to adjust signal delay and supplies a test signal from the external terminal to the access terminal through the high-speed test control circuit when performing high-speed test at an actual operation speed.

The invention relates to a network speed test method and a network speed test system. The method includes the following steps: a network speed test request is sent into a waiting queue of a server by a client to be queued; if the judgment result of the server is test starting, then the server judges the variety of a test mode; if the test mode is pressure test, then the server sends a speed-testing command to the client, and cooperates with the client to carry out a TCP (transfer control protocol) network speed test and/or an HTTP (hypertext transfer protocol) network speed test; if the test mode is sequence test, whether the TCP network speed test and/or the HTTP network speed test are/is executed by the current server is judged, if so, then a waiting command is sent to the client, and if not, then the server cooperates with the client to carry out the TCP network speed test and/or the HTTP network speed test. The invention can visually and objectively test the speed of all broadband networks to provide reliable technical support for users to obtain accurate bandwidth data of operators.