783 results about "Built-in self-test" patented technology

Disclosed are embodiments of a built-in self-test (BIST) architecture that incorporates a standalone controller that operates at a lower frequency to remotely perform test functions common to a plurality of embedded memory arrays. The architecture also incorporates command multipliers that are associated with the embedded memory arrays and that selectively operate in one of two different modes: a normal mode or a bypass mode. In the normal mode, instructions from the controller are multiplied so that memory array-specific test functions can be performed locally at the higher operating frequency of each specific memory array. Whereas, in the bypass mode, multiplication of the instructions is suspended so that memory array-specific test functions can be performed locally at the lower operating frequency of the controller. The ability to vary the frequency at which test functions are performed locally, allows for more test pattern flexibility.

Systems, methods and devices related to detecting and transmitting images. Imaging system and devices, as well as methods of using such that are provided herein include flicker detection and/or correction; and/or built-in self test (170) associated with various analog circuitry in the imaging devices; and/or power reduction ability; and/or pixels with charge evacuation functionality; and/or parallel to serial conversion (190) unit and associated serial output interface (106); and/or other advanced functionality.

A magnetic field sensor includes built in self-test circuits that allow a self-test of most of, or all of, the circuitry of the magnetic field sensor, including self-test of a magnetic field sensing element used within the magnetic field sensor, while the magnetic field sensor is functioning in normal operation.

A monitoring system for a communications network includes a set of components for transmitting and receiving data signals over the communications network. Each component includes a built-in self-test system for performing tests within the component and outputting corresponding test results. Each self-test system is configured to non-invasively determine waveform characteristics of the data signals. The system includes a set of processors. Each processor is coupled to a subset of the set of components, and is configured to evaluate the test results output by the components coupled to the processor. Each processor is configured to detect and predict faults in the communications network based on the evaluation of the test results.

A microcode programmable built-in-self-test (BIST) circuit and method for testing a multiported memory via multiple ports, either simultaneously or sequentially, as directed by a microcode instruction word. The microcode instruction word contains a plurality of executable subinstructions and one bit of information that controls whether the test operations prescribed in the plurality of subinstructions shall be executed in parallel or in series. The executable subinstructions are dispatched by a primary controller to subcontrollers which perform test operations at each port according to the subinstructions. The microcode programable BIST architecture flexibly facilitates the testing of multiple devices, multiported devices, including multiported memory structures and complex dependent multiported memory structures. The BIST supports in-situ testing of the functionality of the memory at wafer, module, and burn-in, as well as system-level testing.

A built-in self test (BIST) circuit comprising a linear feedback shift register is disclosed. The BIST circuit comprises a controller for controlling a self-testing operation of a memory chip embedded in an integrated circuit, an address generator for generating pseudo-random address patterns under control of the controller, a data generator for producing test data associated with data backgrounds of the address bits under the control of the controller, and a comparator for comparing the test data with memory data output from the memory chip to detect a defect, if any, of the memory chip. The pseudo-random random pattern comprises a single-random pseudo-random address pattern.

A structure and method for an integrated circuit which includes read/write memory having a plurality of memory devices, each of the memory devices having a unique address; a built-in self-test (BIST) engine, the BIST engine having a controller responsive to a test enable signal and operative to generate and store test data in the read/write memory; a comparator operative to compare retrieved data read from the read/write memory and the test data during a first pass test, the comparator identifying failed cycles where the retrieved data does not correspond correctly to the test data; and a diagnostic unit operative to store the failed cycles and being responsive to the controller generating and storing the test data in the read/write memory and operative to store failed data and failing addresses during a first pass test, wherein the BIST engine stops only at each of the failed cycles during the first pass test.

A test access control apparatus includes test access mechanism (TAM) buses and an extended IEEE 1149.1 Test Access Port (TAP) Controller. The TAM buses support memory built-in-self-test (BIST) circuit for the memory known-good-die (KGD) test, scan chains for the logic KGD test; and through-silicon-via (TSV) chains that are configured to conduct the TSV test that verifies any defect in vertical interconnects between any two chip layers of the stacked chip device. The TAP Controller is coupled to the TAM buses and is configured to control the memory KGD test, the logic KGD test and the TSV test between two chip layers. A cost-effective connection or configuration of test access control apparatus in 3D-IC is also present. In accordance with an embodiment of the present invention, a test access control method includes a yield-concerned test methodology for 3D-IC, and an integrated flow of test access control apparatus supporting heterogeneous test protocols of SOC

An integrated circuit (12) contains a serializing transmitter, including a phase locked loop (31) that supplies seven clocks (41) with different phases to a serializer circuit (32). The serializer circuit accepts 7-bit words at a parallel input (42), and outputs these words serially in an end-to-end manner on a twisted pair (17), as a clock signal. The serializer circuit also accepts 7-bit words on a further parallel input (43), and transmits them serially in an end-to-end manner on a twisted pair (18), as serialized data. The integrated circuit also includes a built-in self-test circuit (33), which can supply test information to the two parallel inputs of the serializer circuit, and which can monitor the two twisted pairs while the serializer circuit operates at high data rates typical of normal operation, in order to detect any errors introduced by the serializer circuit. The self-test circuit produces a single digital output (48) to indicate whether an error has been detected.

Column based defect management techniques are presented. Each column of the memory has an associated isolation latch or register whose value indicates whether the column is defective, but in addition to this information, for columns marked as defective, additional information is used to indicate whether the column as a whole is to be treated as defective, or whether just individual bits of the column are defective. The defective elements can then be re-mapped to a redundant element at either the appropriate bit or column level based on the data. When a column is bad, but only on the bit level, the good bits can still be used for data, although this may be done at a penalty of under programming for some bits, as is described further below. A self contained Built In Self Test (BIST) flow constructed to collect the bit information through a set of column tests is also described. Based on this information, the bad bits can be extracted and re-grouped into bytes by the controller or on the memory to more efficiently use the column redundancy area.

An integrated circuit (IC) chip wherein a built-in self test determines the IC's optimum electrical performance. A corresponding optimum performance setting is stored in NVRAM on the chip. Upon each chip power-up, the optimum performance setting is retrieved and provided to chip control which sets the chip for its best performance.

A testable integrated circuit chip (80, 100) includes a functional circuit (80) having modules (IP.i), a storage circuit (110) operable to hold a table representing sets of compatible tests that are compatible for concurrence, and an on-chip test controller (140, 150) coupled with said storage circuit (110) and with said functional circuit modules (IP.i), said test controller (140, 150) operable to dynamically schedule and trigger the tests in those sets, whereby promoting concurrent execution of tests in said functional circuit modules (IP.i). Other circuits, wireless chips, systems, and processes of operation and processes of manufacture are disclosed.

Testing a transceiver includes providing a sequence of test signals. A serialization clock is generated and jitter is added to the clock in a known and controlled manner. The test signals can then be transmitted using the serialization clock. After the test signals are recovered by the clock and data recovery mechanism, the recovered sequence is compared to the original sequence, to test for jitter tolerance. Preferably, each of these steps is performed on chip. In other aspects, a jitter transfer test and/or a FIFO test can be performed.

According to one embodiment, a programmable logic assembly (200) may include a nonvolatile memory (202) may be coupled to an associated volatile programmable logic device (PLD) (204). Built-in-self-test (BIST) data (208) may be stored in a nonvolatile memory (202) that places the volatile PLD (204) in a self-test configuration. If a volatile PLD (204) passes a self-test, user data (210) may be stored in a nonvolatile memory (202) that places a volatile PLD (204) into a user determined configuration.

A bit fail map circuit accurately generates a bit fail map of an embedded memory such as a DRAM by utilizing a high speed multiplied clock generated from a low-speed Automated Test Equipment (ATE) tester. The circuit communicates between the ATE tester, the embedded memory under test, Built-In Self-Test (BIST) and Built-In Redundancy Analysis (BIRA). An accurate bit fail map of an embedded DRAM memory is provided by pausing the BIST test circuitry at a point when a fail is encountered, namely a mismatch between BIST expected data and the actual data read from the array, and then shifting the bit fail data off the chip using the low-speed ATE tester clock. Thereafter, the high-speed test is resumed from point of fail by again running the BIST using the high-speed internal clock, to provide at-speed bit Fail Maps.

A built-in, at-speed BERT is provided that may be part of high-speed serial interface circuitry implemented on an integrated circuit. The built-in, at-speed BERT takes advantage of an existing clock data recovery (CDR) dual-loop architecture and built-in self test (BIST) circuitry. The built-in, at-speed BERT provides a low-cost solution for production testing of high-speed serial links, facilitating jitter analysis and evaluation of pre-emphasis and equalization performance. This further allows adaptation of pre-emphasis and equalization.

There is disclosed a semiconductor integrated circuit comprising a logic BIST circuit which includes a test pattern generator and test result compressor and which performs a built-in self test (logic BIST) of a logic circuit, a pattern counter which counts test patterns during the logic BIST, an expected value comparison circuit which compares a compressed value output of the test result compressor with an expected value input from an external tester for each test pattern and which outputs a failure flag at a mismatch detection time, an external terminal which outputs the failure flag from the LSI, and an external terminal which outputs from the LSI a pattern count signal at a time when the pattern counter receives the failure flag.

An apparatus and method for protecting a computer system from array reliability failures uses Array Built-In Self-Test logic along with code and hardware to delete cache lines or sets that are defective, identify corresponding fuse repair values, proactively call home if spare fuses are not available, schedule soft fuse repairs for the next system restart, schedule line deletes at the next restart, store delete and fuse repairs in a table (tagged with electronic serial id, timestamp of delete or ABIST fail event, address, and type of failure) and proactively call home if there were any missed deletes that were not logged. Fuse information can also be more permanently stored into hardware electronic fuses and/or EPROMs. During a restart, previous repairs are able to be applied to the machine so that ABIST will run successfully and previous deletes to be maintained with checking to allow some ABIST failures which are protected by the line deletes to pass.