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1248 results about "Test point" patented technology

A test point is a location within an electronic circuit that is used to either monitor the state of the circuitry or to inject test signals. Test points have two primary uses: During manufacturing they are used to verify that a newly assembled device is working correctly.

Circuit board interlayer connection detection method, device and equipment

The invention relates to the technical field of circuit boards, and discloses a circuit board interlayer connection detection method, device and equipment, and the method comprises the steps: carrying out the electrical characteristic parameter measurement of a multilayer flexible circuit board, and obtaining the characteristic parameter data of the circuit board; designing and arranging a multi-test-point detection structure on the multi-layer flexible circuit board, and performing signal excitation to obtain test point position information; applying a differential excitation signal, and collecting a differential response waveform between the test points to obtain a time domain reflection signal feature; impedance spectrum conversion and parameter extraction are carried out on the time domain reflection signal features, and an interlayer connection impedance distribution diagram is obtained; and establishing an interlayer connection defect characteristic model aiming at nickel-based alloy wire fracture, interface cracking and liquid metal fiber felt delamination in various bending states by utilizing the interlayer connection impedance distribution diagram, so that accurate classification of defect types and severity is realized, and interlayer connection faults and surface welding quality problems can be distinguished; and the misjudgment rate is greatly reduced.
Owner:SHENZHEN HONGFU ELECTRONIC TECH CO LTD

Titanium plate performance analysis method and system

The invention provides a titanium plate performance analysis method and system, and relates to the technical field of metal material detection.The method comprises the steps that an optical scanner is adopted to establish a three-dimensional structure on the surface of a titanium plate, and test areas are divided; synchronously acquiring stress, hardness and conductivity data of a test point by using a multi-probe collaborative detection device; constructing a dual-branch feature extraction network, wherein the dual-branch feature extraction network comprises a surface topography feature branch and a physical feature branch; performing statistical integration on the features in the test area, calculating distribution features and determining a weight coefficient; and generating a performance analysis result through feature fusion and a multi-task output layer, and finally determining the performance grade of the titanium plate. According to the method, deep fusion of morphology information and physical characteristics is realized, and the accuracy and reliability of titanium plate performance evaluation are improved.
Owner:SHAANXI HANGTI NEW MATERIAL TECH CO LTD

Test case generation method and device based on intelligent agent, equipment and medium

The invention discloses an agent-based test case generation method and device, equipment and a medium, and relates to the technical field of software testing, the method comprises the following steps: in response to a test case generation instruction for a target function, displaying a test case framework of the target function; in response to an interaction instruction for a preset position in the test case framework, obtaining a target test code of the target function; wherein the interaction instruction is used for triggering interaction between a first agent and a second agent, and the first agent is configured to be used for analyzing a logic structure of a function code of a target function to obtain a structure code of a test point of the target function; the second intelligent agent is configured to be used for generating a target test code based on the structure code of the test point; and displaying the target test code at a preset position to obtain a target test case of the target function. The problem that the generation accuracy of the test case is low can be solved.
Owner:BEIJING YOUZHUJU NETWORK TECH CO LTD

Flow field reconstruction method based on test point position optimization and multi-source data fusion and related device

The invention belongs to the field of turbine tests, and discloses a flow field reconstruction method based on test measuring point position optimization and multi-source data fusion and a related device, and the method comprises the steps: building a CFD data set and a sparse measuring point test data set; carrying out POD decomposition on the CFD data set; according to the sparse measurement point test data set, a correction modal coefficient is obtained by using a Gappy POD algorithm; according to the POD mode and the correction mode coefficient, obtaining a Gappy POD reconstruction flow field parameter; taking the minimum error of the global low-fidelity flow field parameter and the Gappy POD reconstruction flow field parameter as a target to obtain an optimal measurement point position; based on the optimal measurement point position, high-fidelity discrete test data is obtained, and an optimized modal coefficient is obtained by using a Gappy POD algorithm; obtaining a flow field reconstruction result of the turbine blade according to the POD mode and the optimization mode coefficient; according to the method, fine reconstruction of the global flow field distribution of the turbine blade is realized.
Owner:XI AN JIAOTONG UNIV +1

Voltage-sensitive device damage diagnosis system combined with pulse test

The invention relates to the technical field of electrical fault detection, in particular to a voltage-sensitive device damage diagnosis system combined with pulse test, which comprises the following modules: an original signal acquisition module for inputting pulse sequences to a voltage-sensitive device, respectively recording voltage response signals and current response signals under each pulse sequence, and generating a response signal set; and performing wavelet decomposition on the voltage response signal and the current response signal based on the response signal set. According to the method, the pulse sequences are input, and the voltage response signals and the current response signals under the pulse sequences are recorded, so that data acquisition covers different working states, and feature missing possibly caused by a single test point is reduced. A wavelet decomposition mode is adopted, a voltage response signal and a current response signal are divided into different frequency intervals, separation of high-frequency and low-frequency characteristics is facilitated, local abnormal signals are not covered by global characteristics, and the capability of analyzing short-time fault characteristics is enhanced.
Owner:QINGDAO AIPU INTELLIGENT INSTR

Test case generation method and system for security and futures software

The invention discloses a test case generation method and system for security and futures software. The method comprises the following steps: converting data in an original file into an embedded vector through an information analysis agent, and storing the embedded vector in a vector database; generating an initial test case set by using the plurality of test points and the data fragments corresponding to each test point through a case generation agent; constructing a business rule atlas to perform rule similarity scoring on each test case, deleting the test cases with low scores, and forming a high-score test case set by the test cases with high scores; semantic similarity scoring is carried out according to the historical test cases, sorting is carried out according to scores from high to low to form an optimal test case set, and the test case with the highest score is marked as the historical test case to be stored in the vector database. According to the method, the test cases of the security futures software can be automatically generated, redundant cases are reduced by evaluating the test cases, the case quality is improved, the workload of testers is greatly reduced, and the test efficiency is greatly improved.
Owner:SHANGHAI FUTURES INFORMATION TECH CO LTD

Electromagnetic environment influence assessment method for offshore wind plant

The invention provides an offshore wind farm electromagnetic environment influence assessment method, and particularly relates to the field of electromagnetic environment influence analysis, and the method comprises the steps: firstly determining a wind farm center point, setting radiation test points in a preset radius, and obtaining electromagnetic environment test data of each test point through an electromagnetic environment test system; according to the method, electromagnetic interference signals overflowing from a wind power plant in electromagnetic environment test data are sorted out, a maritime electromagnetic wave propagation loss model is utilized to perform deduction calculation, the signal receiving strength of the position where existing equipment is located is obtained, and whether the electromagnetic interference signals have interference influence on the existing equipment or not is comprehensively evaluated by combining the technical standard requirements of the existing equipment. And the electromagnetic environment safety of the offshore wind plant is ensured. According to the method, the technical problem that the electromagnetic environment generated in the operation process of the wind power plant and the influence of the electromagnetic environment on peripheral radio frequency equipment are difficult to effectively test and analyze in the special environment of the offshore wind power plant is solved, so that the position and layout of the offshore wind power plant are reasonably planned according to the evaluation result.
Owner:THE NAT RES INST OF RADIO SPECTRUM MANAGEMENT CO LTD

Flying probe compensation method and system based on PCB curved surface modeling

The invention belongs to the technical field of PCB flying probe detection equipment, and particularly relates to a flying probe compensation method and system based on PCB curved surface modeling, and the method comprises the steps: obtaining the size of a PCB, and carrying out the equilateral triangle grid division; in the visual alignment process, the laser distance measuring sensor is synchronously driven to carry out rapid non-contact height measurement on the vertex of the grid; based on the vertex three-dimensional coordinates, fitting triangular patches through a space plane equation and splicing the triangular patches into a three-dimensional curved surface model; performing bilinear interpolation on an area formed by adjacent patches in the model to smooth a curved surface; and finally, selecting an interpolation function according to the position of the test point to calculate the accurate height, and generating a Z-axis displacement compensation value of the probe. According to the high-precision measurement and self-adaptive compensation of the PCB warpage, the efficiency and precision of the flying probe test are considered, and the problem of poor contact or overvoltage damage of the probe caused by the board warpage is effectively solved.
Owner:合肥九川智能装备有限公司

Speed reducer box sealing performance testing method and system based on intelligent sensor

The invention provides a reducer box sealing performance test method and system based on an intelligent sensor, and relates to the technical field of sealing detection, and the method comprises the steps: collecting each sealing test point; generating a primary sealing test result; building a primary sealing test platform based on the intelligent sensor, generating a primary sealing test result, carrying out factory verification based on the primary sealing test result, and calling the box simulation model and the secondary leakage variable after leaving a factory to generate a secondary leakage model; secondary leakage fitness monitoring is performed, including instantaneous fitness monitoring and cumulative fitness monitoring. The technical problem that in the prior art, due to the fact that the sealing state change of the speed reducer under the actual working condition is difficult to reflect, sealing detection is inaccurate can be solved, and intelligent detection and evolution monitoring of the sealing performance of the speed reducer in the whole process from factory leaving to service are achieved through the intelligent sensor. The technical effects of improving the sealing reliability and preventing leakage faults are achieved.
Owner:江苏枫景舜精密机械有限公司

Optical fiber sensor battery cell integration method, optical fiber sensor battery system and vehicle

The invention provides an optical fiber sensor battery monomer integration method, an optical fiber sensor battery system and a vehicle, and the method comprises the steps: carrying out the simulation of the charging and discharging process of a battery, screening out a plurality of target test point positions from the test point positions of target battery parameters of the battery based on a simulation result, the target battery parameter is air pressure, temperature, stress or gas; determining a blank area for placing an optical fiber sensor in the battery according to each target test point, and providing a placement space for the optical fiber sensor at the blank area by using a battery monomer electrode blank process; and placing the optical fiber sensor in the placement space, and fixing the optical fiber sensor and the battery to obtain an optical fiber sensor battery monomer. By adopting the scheme, the hierarchical perception of the single battery is realized, the detection dimension is expanded, and the acquisition of internal characteristics of the battery is increased, so that the accuracy and reliability of state estimation and fault diagnosis of the lithium ion battery are improved.
Owner:CHINA FAW CO LTD

3D structure core particle test layout design method supporting cross-level cascade test and single core particle self-test

The invention provides a 3D structure core particle test layout design method supporting cross-layer cascade test and single core particle self-test, and the method comprises the following steps: a, designing the test point layout of 3D stacked core particles, each layer of core particles adopting a hexagonal arrangement mode, and enabling a test PIN in one layer to be connected with six signal PINs in the same layer; and meanwhile, a vertical test channel is arranged, so that the in-layer test PIN of each layer is connected with the corresponding test PIN of the adjacent layer through a vertical interconnection structure. According to the invention, full test coverage of 3D stacking is adapted, the problem that interlayer signals are difficult to test in a 3D structure is solved through the in-layer hexagonal layout and the vertical test channel, and full-scene coverage of in-layer, interlayer and cross-core particle signals is realized.
Owner:CHINA ELECTRONICS STANDARDIZATION INST +1

Circuit board damage detection optimization method and system

The invention relates to the technical field of circuit board detection, and provides a circuit board damage detection optimization method and system, and the method comprises the following steps: S1, synchronously collecting a contact resistance signal, a probe pressure signal and environment data of a circuit board test point through a probe array, and carrying out the optimization processing of the collected data parameters; s2, establishing a contact impedance dynamic model, depicting the dynamic change of the contact impedance of the circuit board, extracting a characteristic signal for analysis, and mining the mode characteristics of an abnormal signal; and S3, fusing the abnormal multi-source evidences of the circuit board, processing the uncertainty and relevance among the evidences, and reversely deducing the positions and reasons of the potential defects on the circuit board. Through a multi-dimensional verification and error self-correction mechanism, the error between a defect solution and a real defect is quantified and reversely deduced by using posterior error estimation, so that the reliability and consistency of a detection result are improved, a reliable result support is provided for engineering application of circuit board damage detection, and meanwhile, the dependence on detection experience of detection personnel is avoided.
Owner:SHENZHEN UNITED MULTILAYER CIRCUIT BOARD CO LTD

Hardware-in-the-loop test method and device and electronic equipment

The invention discloses a hardware-in-the-loop test method and device and electronic equipment, relates to the technical field of automotive electronics, and adopts a simulated annealing algorithm in an optimization stage, adjusts parameters according to characteristics of an electronic stability control system, optimizes data distribution, and improves test data quality and fault detection capability. In the verification stage, the generated test data is subjected to actual operation test, the data problem is fed back by comparing actual output with an expected result, and the optimized test data which does not pass verification is sent to the target hardware-in-loop test model for optimization adjustment, so that a closed-loop optimization verification process is formed. The iterative closed-loop process comprehensively covers all possible working conditions and fault modes, key test points are prevented from being omitted, the reliability of the electronic stability control system is enhanced, the accuracy, effectiveness, comprehensiveness and sufficiency of hardware-in-the-loop test of the electronic stability control system are ensured, and the reliability of the electronic stability control system is improved. And the limitation of hardware-in-the-loop test of the electronic stability control system is reduced.
Owner:BEIJING JINGWEI HIRAIN TECH CO INC

Dynamic adjustment system and method for uniform distribution of test points of flying probe machine

The invention belongs to the technical field of PCB (printed circuit board) detection equipment, and particularly relates to a dynamic adjustment system and method for uniform distribution of test points of a flying probe machine, and the system comprises a flying probe test machine, a camera alignment system, a data processing unit and a movement mechanism. The flying probe testing machine is provided with at least two guide rails, and flying probes are arranged on the guide rails and used for testing test points on the PCB. And the camera alignment system carries out at least two times of alignment with the PCB, and outputs alignment information. And the data processing unit receives the alignment information, loads PCB data, and determines the offset of the PCB according to the distribution of the test points and the alignment information. And the movement mechanism is connected with the PCB and responds to the offset to control the PCB to translate, so that the test points are uniformly distributed on the flying probe test machine. According to the invention, by dynamically adjusting the position of the PCB, the test efficiency of the flying probe tester is improved, the distribution uniformity of test points is ensured, and the test flow of the PCB is optimized.
Owner:合肥九川智能装备有限公司

Test case generation method and device and electronic equipment

The embodiment of the invention discloses a test case generation method and device and electronic equipment. In the method, under the condition that object information of a test object is obtained, a first cue word can be obtained through the object information and a first network model, then after a first test point is determined according to the first cue word, a second cue word is obtained through a historical test case corresponding to the first test point and the first cue word, and then the second cue word is sent to the test object. And obtaining the target test case through the second prompt word and the second network model. Therefore, under the condition that the first cue word is obtained through the object information, the first test point can be further determined through the first cue word, so that the first cue word can be updated based on the historical test case corresponding to the first test point to obtain a more accurate second cue word, and the user experience is improved. The target test case obtained through the second cue word and the second network model is more accurate, so that the quality of the test case is improved.
Owner:SHENZHEN HEYTAP TECHNOLOGY CO LTD

Roadbed humidity nondestructive testing method based on wireless radio frequency signal multi-parameter inversion

The invention belongs to the technical field of road engineering roadbed nondestructive testing, discloses a roadbed humidity nondestructive testing method based on wireless radio frequency signal multi-parameter inversion, and aims to solve the problems that a traditional roadbed humidity testing method is destructive, low in efficiency and discontinuous in monitoring or detection parameters are easily interfered. The method specifically comprises the following steps of: firstly, embedding an RFID tag and acquiring an on-site received signal strength indication value; then establishing a relation model of the received signal strength indication value and the roadbed moisture content, and extracting characteristic parameters only influenced by the moisture content; then, constructing a neural network model, taking the extracted characteristic parameters as input, and utilizing field data to train the model to invert the roadbed moisture content; and finally, the spatial distribution of the moisture content of the roadbed is obtained by combining the distribution of the test points and the roadbed structure information, so that the efficient, non-contact and continuous monitoring of the humidity state of the roadbed is realized.
Owner:CHANGSHA UNIVERSITY OF SCIENCE AND TECHNOLOGY

VCSEL epitaxial wafer resistivity distribution measurement method and system

The invention belongs to the technical field of semiconductor device performance testing, and particularly relates to a VCSEL epitaxial wafer resistivity distribution measuring method and system, and the method comprises the steps: constructing a three-dimensional discretization model representing an epitaxial wafer and an unknown parameter vector containing the vertical resistivity, the top transverse resistivity and the substrate leakage junction nonlinear resistance; a physical response function is defined, the vector is iterated through a discrete point fitting algorithm, so that the total residual error between the analog voltage difference output by the function and the actually measured voltage value under the cross-order-of-magnitude current is minimum, and the real vertical resistivity is extracted from the optimal parameter vector; and obtaining the vertical resistivity of each point on the two-dimensional test point grid so as to generate a distribution diagram and carry out anomaly detection. According to the invention, the problem of measurement distortion caused by the leakage defect of the substrate is solved, and the measurement accuracy of the vertical resistivity is improved.
Owner:WAFERCHINA CO LTD

PCB double-sided four-flying-probe test path optimization method

The invention discloses a PCB double-sided four-flying-probe test path optimization method, and belongs to the technical field of path optimization, and the method comprises the following steps: importing double-sided PCB data containing a test network and test points; obtaining an initial matching scheme of a network internal test point corresponding to each test network through the matching strategy, and optimizing each initial matching scheme to obtain a network internal test point path; constructing an initial test sequence between test networks through a recent insertion heuristic algorithm, and then introducing a local search algorithm into an adaptive large-scale neighborhood search algorithm to carry out iterative optimization on the initial test sequence to obtain a test sequence between the networks; and combining the test point paths in the networks and the test sequence between the networks, and outputting a double-sided four-flying-probe test path. According to the PCB double-sided four-flying-probe test path optimization method, the problem that the overall moving cost is difficult to further reduce in an existing method is solved.
Owner:GUANGDONG UNIV OF TECH

Dynamic simulation test verification method and system for pumped storage unit monitoring system

The invention discloses a dynamic simulation test verification method and system for a pumped storage unit monitoring system, and the method comprises the steps: building a high-dimensional system state matrix of a pumped storage unit based on the physical parameters and structural features of a hydraulic, mechanical and electrical system of the unit, carrying out the dimension reduction of the high-dimensional system state matrix, and obtaining a dynamic simulation test result of the pumped storage unit; a dynamic simulation model of unit multi-physics field coupling is obtained; constructing a multi-dimensional parameter space based on the parameter sensitivity coefficient and the working condition boundary condition of the dynamic simulation model, and calculating optimal test point distribution through a high-dimensional point flow diameter algorithm to obtain a test scene library; based on the dynamic simulation model and the test scene library, obtaining a real-time monitoring signal sequence conforming to a monitoring system communication protocol; and based on the real-time monitoring signal sequence, signal acquisition, logic judgment and alarm control functions of the monitoring system are tested through an automatic test script, and a performance evaluation result of the monitoring system is obtained. The test comprehensiveness and effectiveness of the pumped storage unit monitoring system are improved.
Owner:CHINA YANGTZE POWER +2

Detection tool for capacitor processing

The utility model relates to the technical field of capacitor processing, in particular to a detection tool for capacitor processing, which comprises a supporting mechanism used for supporting the whole device, the supporting mechanism comprises a workbench and two fixing blocks, and the supporting mechanism is provided with a detection mechanism used for applying pressure to different point positions of a capacitor shell. The detection mechanism comprises two electric telescopic rods. According to the utility model, through the arrangement of the detection mechanism, the device can carry out pressure detection on a plurality of point positions of the capacitor shell, the electric telescopic rod drives the detection head a to carry out pressure detection on the upper part of the capacitor shell, and the bidirectional threaded rod drives the two side plates to move oppositely. And meanwhile, a gear is driven to rotate through a micro electrode, so that a bearing circular plate can drive the capacitor shell to rotate, thereby changing a test point position, reducing manual operation and ensuring the detection effect of the device.
Owner:TONGLING INTEGRITY SANLIAN ELECTRONICS

Partailly guarded switching matrix for automatic electronic test equipment

Systems and Methods for capacitance testing of a unit under test with parasitic capacitance directed to a guard rail. The system includes test points, wherein the plurality of test points are divided into at least two groups; a stimulus source; a first group guard relay electrically connected to each of the test points in a first; a second group guard relay electrically connected to each of the test points in a second; a guard rail coupled to the first group guard relay and the second group guard relay; a first group return relay electrically connected to each of the test points in a first group; a second group return relay electrically connected to each of the test points in a second group; a current measurement rail coupled to the first group return relay and the second group return relay; a current meter coupled to the measurement rail; and a controller.
Owner:DIT-MCO INTERNATIONAL LLC

Safety collision avoidance risk assessment method for crane jib and electrified equipment

The invention relates to a safety collision avoidance risk assessment method for a crane jib and electrified equipment, and belongs to the technical field of power construction. The method comprises the following steps: measuring electric field intensity by using an electric field sensor, and measuring and calculating a distance L1 from high-voltage live equipment to a test point; measuring and calculating the radial length L2 of the crane jib by using a pulse laser flight time measurement method; comparing the distance L1 from the electrified high-voltage equipment to the test point with the safety distance Ls1, and calculating a risk coefficient K1; comparing the radial length L2 of the crane jib with a safety threshold value Ls2, and calculating a risk coefficient K2; calculating a comprehensive risk coefficient Kave; and then the risk level is judged, and corresponding early warning is carried out. According to the invention, the problems of complex installation, high cost, poor compatibility and the like of a traditional anti-collision system are solved, the safety distance between the suspension arm and the electrified equipment in the hoisting operation can be evaluated in real time, the occurrence of collision accidents is effectively avoided, and the operation safety of an electric power construction site is guaranteed.
Owner:YUXI POWER SUPPLY BUREAU OF YUNNAN POWER GRID

Intelligent control method and system for calibration of full-automatic sectional direct-current voltage divider

The invention discloses an intelligent control method and system for calibration of a full-automatic sectional direct-current voltage divider, and relates to the technical field of intelligent control and decision making, and the method comprises the steps: automatically recognizing basic parameters of a calibrated voltage divider through a scanning test, detecting the sectional characteristics of the calibrated voltage divider, and building a characteristic model of the calibrated voltage divider; determining a calibration scheme according to the characteristic model, generating test point distribution, time sequence control parameters and a security policy, performing segmented calibration based on the calibration scheme, calculating error information of each test point, obtaining an independent compensation coefficient of each segment according to segmentation characteristics by combining temperature compensation, and performing compensation correction; and obtaining the corrected test point calibration result distribution to evaluate the health state of the calibrated voltage divider, and outputting a calibration conclusion including health state evaluation. Through the intelligent calibration process, the calibration efficiency and accuracy of the direct current voltage divider are remarkably improved, meanwhile, the operation risk is reduced, and reliable technical guarantee is provided for high-voltage direct current measurement.
Owner:SUZHOU QUNYE SOFTWARE TECHNOLOGY CO LTD

Method and device for testing air interface performance of ground terminal of low-orbit satellite

The invention provides a low-orbit satellite ground terminal air interface performance test method and device, and the method comprises the steps: calculating satellite position data observed by a to-be-tested ground terminal at different moments according to a preset ground terminal position and low-orbit communication satellite ephemeris data, and generating a visible satellite motion track of the ground terminal position; selecting a preset number of track points on the visible satellite motion track as test points, and importing satellite position data of the test points into a test system; when the measurement antenna moves to the first test point, satellite position data corresponding to the first test point is transmitted back to the ground terminal to be tested; the to-be-tested ground terminal generates wave beams according to the received satellite position data, connection is established, and the test system completes air interface wireless performance measurement of the first test point; all the test points are traversed through the processing process, air interface wireless performance measurement of the ground terminal to be tested is completed, and air interface wireless performance measurement results corresponding to all the test points are obtained.
Owner:CHINA ACADEMY OF INFORMATION & COMM +1

Non-standard ammeter anomaly detection system and method based on parameterized protocol model

The invention discloses a non-standard ammeter anomaly detection method based on a parameterized protocol model, and the method comprises the steps: firstly constructing a parameterized protocol model which comprises test point models corresponding to a plurality of test points; loading the parameterized protocol model, and determining a detection execution sequence; generating a request frame for any test point according to communication information configured in the parameterized protocol model, sending the request frame to a tested ammeter, performing communication interaction with the tested ammeter, and receiving a response frame returned by the tested ammeter; performing verification on the response data, and performing field-level analysis and data conversion according to a verification result to obtain an actual detection value of the test point; and performing fault judgment according to the actual detection value and generating a detection report. According to the method, non-standard electricity meters of different models and different protocol formats can be adapted under the condition that detection program codes do not need to be modified.
Owner:HANGZHOU DIANZI UNIV

Aluminum substrate voltage withstanding test equipment

The utility model relates to the technical field of aluminum substrate processing, in particular to aluminum substrate withstand voltage test equipment, which comprises an operation table, an aluminum substrate adjusting component and a withstand voltage test component, the withstand voltage test component comprises a test frame, a first electric adjusting telescopic rod is mounted at the upper end of the test frame, and a second electric adjusting telescopic rod is mounted at the lower end of the test frame. A testing head is mounted at the lower end of the first electric adjusting telescopic rod and comprises a mounting seat, a pressure sensor is mounted on the upper side of the mounting seat, a magnetic suction head is arranged on the lower side of the mounting seat, an adsorption seat is arranged on the outer side of the magnetic suction head, and a first mounting plate is arranged on the lower side of the adsorption seat. According to the utility model, the image of the aluminum substrate is detected through the image probe, the test point position of the aluminum substrate is automatically adjusted through the aluminum substrate adjusting component according to the image analysis, the test accuracy is improved, the voltage-withstanding test component is disassembled through the limiting plate and the pressing plate, the test needle is replaced through the magnetic suction head and the adsorption seat, and the replacement convenience of the test needle is improved.
Owner:ZHONGSHAN HUABANG ELECTRONICS CO LTD

Testing device

The utility model relates to a testing device, which comprises a machine table, a carrier plate, a crimping module and a testing module, and is characterized in that the carrier plate is arranged on the machine table and is provided with a bearing position for bearing a to-be-tested product; the crimping module is movably arranged on the machine table and can move in the direction close to or away from the bearing position; the test module is arranged on the machine table and comprises a plurality of probe modules, and when the crimping module crimps the to-be-tested product, any probe module can abut against the test point of the to-be-tested product to form a test loop. According to the test device provided by the invention, any one probe module can abut against the test point of the to-be-tested product to form the test loop, the probe modules are mutually independent, and the test point of the to-be-tested product is selectively and electrically connected with one or more probe modules. The test device is suitable for crimping tests of to-be-tested products of different specifications and different positions or spacing test points of the to-be-tested products, and the application scene of the test device is expanded.
Owner:SUZHOU HUAXING YUANCHUANG TECH CO LTD

PCB flying probe test path optimization method based on electrical characteristics

ActiveCN121522421APrinted circuit testingDesign for testingComputational physics
The invention relates to the technical field of probe testing, in particular to a PCB flying probe test path optimization method based on electrical characteristics, which comprises the following steps: calculating accessibility scores of test points according to the distribution of board surface test points and elements to determine risk types of the test points; determining a risk area grade corresponding to the grid unit according to the accessibility score in combination with the potential shadow area; optimizing the test path of the probe according to the risk area grade corresponding to the grid unit, and adjusting the initial moving speed of the test path of the probe in different grid units; for the same moving time sequence of different probe groups, determining overlapped grids according to the initial probe angles and the test paths corresponding to the probes, and determining whether there is a collision risk between the probes in combination with the initial moving speeds of the probes in different grid units; and when a collision risk exists between the probes, corresponding adjustment measures are taken according to the number of the overlapped grids. According to the invention, the test path is optimized in combination with multi-dimensional design based on the electrical characteristics and testability of the board.
Owner:JINGGANGSHAN UNIVERSITY

PCB probe positioning method and system and storage medium

The invention relates to the technical field of probe testing, in particular to a PCB probe positioning method and system and a storage medium, and the method comprises the steps: obtaining a three-dimensional contour of a bonding pad, screening interference nodes, evaluating a contact error in combination with a probe structure, analyzing the density of test points, dividing a compression region, and carrying out the statistics of a space interference probability. And probe positioning and contact verification are completed according to the error and probability sorting path. The method has the beneficial effects that the dot matrix height on the surface of the bonding pad is comprehensively sampled, the space contour of the bonding pad is reconstructed, and the edge point residual error is extracted, so that the identification of the interference node is more accurate. And in combination with CAD boundary identification of a probe end face structure, comparing a node set formed by three-dimensional sampling points of a bonding pad, and establishing a contact area error evaluation mechanism in normal distance standard deviation calculation to realize multi-dimensional contact adaptation judgment. And forming a density evaluation sequence by the ratio of the spatial distribution to the projection area of all point locations in the test area, mining a local abnormal compression state, and completing the calibration of the high-density interference area.
Owner:TRANTEST PRECISION (CHINA) CO LTD

Quick connection testing device for printed circuit assembly board

The invention discloses a rapid connection testing device for a printed circuit assembly board, and aims to solve the problems of high cost, low connection density, large occupied space, tedious operation and the like in the existing testing technology. The device comprises a quick-connection probe module, a positioning tray and a pull pin, the quick-connection probe module comprises a quick-connection probe seat module, a protective cover module and a spring, positioning and locking are realized by multiplexing existing mounting holes of a to-be-tested PCB, electrical connection is realized by utilizing contact of a spring probe and a test point, a quick-connection positioning guide sleeve, a lock bead and a quick-connection ring are combined to form a quick locking / unlocking structure, and the quick-connection probe seat module and the protective cover module are connected with the pull pin. The conductive bushing and the grounding support ring form a grounding loop in cooperation with auxiliary positioning of the guide pin. A special test connector is omitted, so that the material cost is reduced; the connection density and the signal rate are improved, and the PCB space is saved; the operation efficiency is improved through the quick connection structure, and the device is suitable for efficient mass production testing.
Owner:ZHEJIANG ELECTROMECHANICAL VOCATIONAL & TECH COLLEGE