218results about "Printed circuit testing" patented technology

The invention provides PCB deviation detection equipment and a detection method, and relates to the technical field of PCB detection, a feeding arm and a carrying arm are matched with a partition adsorption and pressing assembly to be matched with a detection platform and a feeding platform, so that the problem of uneven adsorption of an FPC is effectively avoided; the detection platform adopts the adsorption assembly with adjustable spacing, and the levelness is accurately regulated and controlled by combining with the jackscrew adjusting piece, so that the detection platform can adapt to the layout of components on the back of the PCB to avoid interference, and can guarantee the bearing stability and eliminate the positioning deviation. Meanwhile, the detection method supports the combination of PCBs and FPCs with different characteristics in a terminal area, and by calculating X and Y bidirectional deviation values, the adaptive range is widened, the detection precision is improved, and the missing detection and false detection rate is reduced.

The invention relates to the technical field of probe testing, in particular to a PCB flying probe test path optimization method based on electrical characteristics, which comprises the following steps: calculating accessibility scores of test points according to the distribution of board surface test points and elements to determine risk types of the test points; determining a risk area grade corresponding to the grid unit according to the accessibility score in combination with the potential shadow area; optimizing the test path of the probe according to the risk area grade corresponding to the grid unit, and adjusting the initial moving speed of the test path of the probe in different grid units; for the same moving time sequence of different probe groups, determining overlapped grids according to the initial probe angles and the test paths corresponding to the probes, and determining whether there is a collision risk between the probes in combination with the initial moving speeds of the probes in different grid units; and when a collision risk exists between the probes, corresponding adjustment measures are taken according to the number of the overlapped grids. According to the invention, the test path is optimized in combination with multi-dimensional design based on the electrical characteristics and testability of the board.

The invention relates to the technical field of insertion loss test, and discloses a spring force control insertion loss test probe device which comprises a mounting seat, an elastic probe assembly and a fine adjustment assembly. A supporting frame is arranged at the bottom of the mounting base, the elastic probe assembly is located below the mounting base, the elastic probe assembly is connected with the supporting frame, the height of the elastic probe assembly is adjustable, the fine adjustment assembly is located on one side of the probe assembly, one end of the fine adjustment assembly is connected with the elastic probe assembly, and the fine adjustment assembly is used for adjusting the elastic value of the elastic probe assembly. The optimal contact pressure can be accurately set according to the characteristics of different circuit boards, poor contact caused by too small pressure or needle mark damage caused by too large pressure is avoided, the same set of device can adapt to the test pressure requirements of different circuit boards, and the problem that the fixed elastic K value cannot be adjusted, and consequently the needle mark difference between different boards is large is solved.

The invention relates to the technical field of PCBs, and discloses a PCB hole chain capability test module and a design method and a test method thereof. At least a test point area and a hole chain test area are arranged in the test module; the design method comprises the following steps: according to the laminated structure of a target circuit board and the hole pattern distribution of each layer, determining the pattern and arrangement distribution of each test hole in the test module with the same laminated structure; based on the verification demand type of the test module, determining the hole wall spacing between the test holes; and determining a test hole chain formed by all the test holes in the hole chain test area according to the form and arrangement distribution of the test holes and the hole wall spacing, and further obtaining the structure of the test module. The test module obtained by the design method not only can realize the basic test of the reliability of the hole chain of the PCB product, but also can meet the verification requirements of different types such as equipment detection precision or materials.

The invention discloses a test fixture and a test method suitable for various circuit boards, and the test fixture comprises a bottom plate, the top of which is provided with at least one first positioning groove; each fixing assembly comprises a fixing plate and a clamping groove structure, and the bottom of each fixing plate is provided with a fixing rib in sliding fit with the corresponding first positioning groove; the test probe assembly is detachably installed on the first set of fixing assemblies, the test probe assembly comprises a PCB, test probes and a probe pressure adjusting structure, the probe pressure adjusting structure comprises an elastic support installed on the PCB and a driving mechanism driving the elastic support to stretch out and draw back, and the multiple test probes are installed on the elastic support; and the electric connection assembly is detachably mounted on the second group of fixing assemblies. The test fixture provided by the invention can adapt to the test requirements of different types of circuit boards, the test pressure of the probe can be freely adjusted, the test fixture is simple and reliable in structure, and the fault rate and the maintenance cost are effectively reduced.

The invention relates to the technical field of flying probe testing, and discloses a probe deviation compensation method and device, electronic equipment and a storage medium, and the method comprises the steps: collecting the tip coordinates of a replaced probe corresponding to different angles after the probe of the flying probe testing is replaced; calculating an eccentric parameter of the probe based on the tip coordinate; calculating a target rotation angle of the probe based on the eccentricity parameter and the camera view center coordinate; calculating the total compensation displacement based on the camera view center coordinate, the tip center point coordinate and the target rotation angle; and controlling the probe based on the target rotation angle and the total compensation displacement amount. According to the method, after the probe is replaced, the target rotation angle and the total compensation displacement are respectively calculated by detecting the coordinates of the probe tip, and then the probe is compensated according to the target rotation angle and the total compensation displacement, so that manual adjustment is not needed, and the calibration efficiency of probe compensation and the precision of flying probe testing are improved.

After the wafer is singulated, the individual die may need to be tested again, and the die may need to be tested again after it is attached to a support plate. A tester apparatus is disclosed. Various components contribute to the functionality of the tester apparatus and facilitate movement of the wafer pack to maintain a vacuum without human supervision. These functionalities include a latching system that holds the wafer pack intact and a pressure sensing means that detects and relays pressure within the wafer pack.

This document describes a test fixture for PCB components. The test fixture includes a pad with holes configured to direct RF energy from the component on the PCB through an end of the PCB to a top clamp of the test fixture. The end of the PCB may correspond to a cut line for destructive testing. The test fixture also includes a top clamp with a test port and a tapered shape configured to direct RF energy from the holes to the test port. The test fixture also includes a bottom clamp attached to the top clamp to hold the PCB between the top and bottom clamps for testing. The test fixture allows for rapid mounting of the PCB and test component without modifying the PCB design or requiring specific drilling of the PCB.

A method and system for calibration of a vector network analyser (2) of the measurement apparatus (1) wherein calibration components (10) are connected automatically by a connector positoner system (3) of the measurement apparatus (1) under control of a controller to ports of the vector network analyser (2) of the measurement apparatus (1).

A printed circuit board (PCB) test system and method including temperature chamber including at least one slot to accommodate at least one PCB test coupon, input bus connected to inputs of the at least one slot, and output bus connected to outputs of the at least one slot, wherein temperature chamber is configured to apply a temperature to the at least one PCB test coupon; signal generator including output bus connected to the input bus of the at least one slot, frequency meter comprising an input bus connected to the output bus of the at least one slot and an output bus, and a comparator connected to the output bus of the signal generator and the output bus of the frequency meter for comparing corresponding outputs of the signal generator and the frequency meter.

The invention provides a cartridge comprising a socket of insulative material and having upper and lower sides and a formation on the upper side to hold an electronic device; a set of contacts held in the socket to connect to the electronic device; a set of terminals connected to the set of contacts held by the socket; a circuit board, the set of terminals connected to the set of contacts being connected to a set of contacts on the circuit board; a lid; a detector mounted to the lid, the lid being movable to be positioned over the socket with the detector located in a position to detect a feature of the electronic device when and due to power being supplied through at least one of the set of terminals held by the socket to the electronic device; and a measurement channel connecting the detector to an interface on the circuit board.

The invention relates to the field of circuit board detection, in particular to an automatic detection device for circuit board processing, which comprises a base, a flying probe detection mechanism and a visual sensor are fixedly mounted on the base, two symmetrically arranged telescopic support plates are fixedly mounted on the base, and an annular guide rail is arranged between the telescopic support plates on two sides. And two rotating rods are fixedly mounted on the side wall of the annular guide rail and are coaxially arranged. By arranging the linear guide rail and the annular guide rail, the limiting column and the pushing block can be flexibly adjusted according to circuit boards of different specifications. Meanwhile, the driving motor is matched to drive the rotating rod to rotate, so that the circuit board rotates, the flying probe can detect the complex circuit board by changing the angle direction of the circuit board, and meanwhile, the back face of the circuit board can be detected; and the detection efficiency of the circuit board is greatly improved while the application range of the detection device is ensured through mutual cooperative use of a limiting column and a pushing block.

The invention provides a cartridge comprising a socket made of insulative material and having upper and lower sides, the upper side having a first formation for releasably holding a first electronic device, the socket having a first socket thermal opening formed from the lower side to the upper side through the socket, an interface connected to the socket to connect the first electronic device to an electric tester, a chuck of a thermally conductive material, a first thermal post attached to the chuck, the first thermal post being inserted into the first socket thermal opening, an end of the first thermal post being thermally connected to and in contact with the first electronic device, such that heat transfers primarily through the first thermal post as opposed to the insulative material of the socket between the chuck and the first electronic device, and a first set of contacts held in the socket and connecting terminals of the first electronic device to the interface, the first set of contacts being resiliently depressible to bring the first electronic device into contact with the end forming a first thermal surface of the first thermal post.

This is an improvement of a measuring device, for example, it is possible to stably measure an electrical characteristic even when a component is small. In the present measuring device, a recessed portion capable of accommodating at least a part of the components is provided in at least one of the pair of probes that grips the components. As described above, since a part of the components is accommodated in the recessed portion, it is possible to obtain at least one of the following: it is possible to more favorably grip the component by the pair of probes, and it is possible to grip the component at a fixed position by the pair of probes. As a result, it is possible to stably measure the electrical characteristic of the component.

The present disclosure relates to a method of debugging a printed circuit board having at least one boundary-scan compliant device, the method using an electronic processing unit and comprising the steps of: retrieving boundary-scan properties of the at least one boundary-scan compliant device, the boundary-scan compliant device comprising a list of boundary-scan compliant circuit terminals of the at least one boundary-scan compliant device; selecting and displaying a circuit diagram of at least a portion of the device mounted on the printed circuit board, the circuit diagram comprising at least one device of a plurality of devices mounted on the printed circuit board and at least one other device of the plurality of devices, the other device comprising circuit terminals that are interconnected with circuit terminals of the device for visualizing at least the device, the other device and the interconnections. The present disclosure also relates to a corresponding debugging apparatus and to a corresponding computer program product.

A device for measuring a property of a substrate comprises an enclosure, two resonators, and two probes. The substrate has a top surface, and the enclosure defines a cavity for placing the substrate. The resonators extend into the cavity of the enclosure. The probes extend into the cavity, and each of the probes comprises a loop that extends about an axis that is substantially parallel to the top surface of the substrate so that the probes are operable to excite a transverse magnetic mode signal in the cavity.

The application discloses a detachable modular test platform, which comprises a gantry, a control box and a jig box, the jig box is installed at the bottom of the gantry, the control box is installed on one side of the gantry, the jig box is provided with a test area, the gantry is provided with a cylinder opposite to the test area, the control box is provided with a control assembly, and the jig box is provided with a test assembly; the control box is connected with an upper computer through the control assembly, the control assembly is connected with the test assembly to realize signal transmission, during testing, a sample to be tested is placed on the test area of the jig box, the upper computer sends a command to control the cylinder to extend a driving rod to the sample to be tested; the upper computer sends a command to the control assembly in the control box, different test conditions are provided, the test of the sample is completed, test data are output and uploaded to a server and saved. The application adopts a modular structure, reduces the volume, is convenient for detection and is suitable for various applications.

An engaging device of a Mass-Interconnect includes an interchangeable test adapter (ITA) and a locking mechanism. The locking mechanism includes a slide movable between an engaged position and a disengaged position, a dual cam including a first cam arm and a second cam arm respectively configured to contact a first slide leg and a second slide leg to drive the slide between the engaged and disengaged positions, and plurality of contact pads disposed on the slide at regions engaged by the dual cam, the contact pads being made of a resilient polymeric material. The contact pads provide elastic compressibility that enables the receiver and ITA to achieve a substantially zero-gap condition at their mating surfaces while the locking mechanism advances into an over-dead-center locked state.

This invention belongs to the technical field of testing devices, specifically an electrical testing mechanism for the production of light guide film assemblies for luminous keyboards. It includes an electrical component and a transport component. The transport component includes two parallel drive belts, each with evenly spaced through-holes in its inner cavity; and a transmission mechanism whose outer surface of the shaft is rotatably connected to one side of the inner wall of the two parallel drive belts. This device can quickly adjust the actual distance between the two moving sliding shells according to the actual length of the FPC board, adapting to the actual length of the FPC board and clamping both ends of the FPC board. Because the moving sliding shells are fixed in position after being pulled open, it can not only clamp FPC boards of different sizes but also avoid the problem of the belt breaking when the FPC board is tightened. It can cyclically test placed FPC boards, thereby improving actual testing efficiency.

Systems and methods herein are for an automatic board probing station in which a plurality of probe tips are associated with a plurality of probe arms and with a plurality of motorized connectors, where the plurality of motorized connectors is to cause individual ones of the plurality of probe tips and individual ones of the plurality of probe arms to be movable independently, and where the plurality of probe tips is to communicate probe signals with a circuit analysis system and is to concurrently probe a plurality of probe points of a circuit board.

The application discloses a flexible integrated test method and system, which realizes equipment interconnection by adding a network communication interface circuit on hardware, realizes burning and writing of MAC addresses and product SNs in a normal working mode on software, replaces a tool provided by a CPU manufacturer and capable of burning and writing MAC addresses and product SNs only in a recover mode, integrates circuit parameter test, software loading, MAC address and product SN burning and function performance test (four-in-one), realizes all tests in one process, and further realizes flexible integrated test by flexible setting of a configuration file, avoids quality risk of missing test, is compatible with previous process test, can be used in processes when special production requirements are encountered, and is flexible and integrated. The flexible integrated test method and system provided by the application reduce quality risk, improve production efficiency, and realize flexible and integrated test.

An electronic load testing system is configured to emulate aspects of an integrated circuit (IC). A control module of the system is configured to be electrically coupled to a first location on a printed circuit board (PCB) of an electronic assembly, and a load module is configured to be electrically coupled to a second location on the PCB. The load module includes a load cell configured to selectively conduct current from a power supply of the electronic assembly. The first location and the second location are spaced apart and in electronic communication via one or more traces of the PCB. The control module is configured to communicate with the load module via the one or more traces of the PCB. In some examples, the load module and the IC have an equivalent form factor, such that the load module can be installed in place of the IC.

The invention provides an ECU instruction test method and device based on hierarchical fuzzy matching, and relates to the technical field of ECU testing, and the method comprises the steps: obtaining configuration files of all effective test instructions of a static curing storage ECU, and storing the configuration files in corresponding memory arrays in a hierarchical manner according to functional domains; performing prefix verification on a to-be-matched character string input by a user, and screening effective input; determining a target test instruction from the memory array instruction through dual fuzzy matching of a functional domain and instruction characters; and executing an ECU test according to the target instruction. The matching range is narrowed through hierarchical storage, input fault tolerance is improved through dual fuzzy matching, a user is allowed to input an approximate character string, complex instructions do not need to be accurately memorized, invalid input is filtered in combination with prefix verification, the test accuracy and reliability are guaranteed, the operation threshold is lowered, the test efficiency is improved, and the user experience is improved. And the method is suitable for scenes such as automobile embedded ECU factory test and the like.

A method and system for calibration of a vector network analyser of the measurement apparatus. Calibration components are connected automatically by a connector positoner system of the measurement apparatus under control of a controller to ports of the vector network analyser of the measurement apparatus.

The present application relates to the technical field of detection devices for burn-in boards. Disclosed is a detection device for burn-in boards. The detection device comprises a base, wherein a test board is connected to the base, several retractable detection pins are connected to the side of the test board away from the base, a mounting plate is slidably connected to the base, a first driving member for driving the mounting plate to slide in a direction close to or away from the test board is connected to the base, the mounting plate is provided with a mounting slot for a burn-in board to be engaged in and is provided with channels for the several retractable detection pins to pass through, the mounting slot is in communication with the channels, several limiting blocks for abutting against the burn-in board are connected to each of the inner walls of two opposite sides of the mounting slot, and the channels are located between the limiting blocks and the retractable detection pins. In the present application, the inner walls of the mounting slot, the several retractable detection pins and the several limiting blocks play a limiting role in the movement of a burn-in board, thereby improving the stability of the placement of the burn-in board.

The embodiment of the application belongs to the field of production testing, and relates to a PCB testing mechanism. The PCB testing mechanism comprises a mounting frame, a driving device, a quick-change device and a needle plate device. The driving device is arranged on the mounting frame, the quick-change device is connected with the moving end of the driving device, and the needle plate device is connected with the quick-change device. The quick-change device comprises a first fixed plate, a first sliding rail and a stop block. The first fixed plate is connected with the movable end of the driving device, the first sliding rail is arranged on the end face of the first fixed plate away from the driving device, a sliding groove is formed in the side of the first sliding rail opposite to the first fixed plate, the needle plate device is slidably arranged in the sliding groove, and the stop block is rotatably arranged at the end of the first sliding rail to abut against the entrance and exit of the sliding groove. The application not only has a simple structure, but also realizes fast dismounting and mounting of the needle plate device, thereby improving the efficiency of maintaining the needle plate device and the efficiency of testing various PCBs.

The application discloses a PCBA test tool capable of rapid change type, which comprises a lower computer, a tool frame and a needle bed module. The lower computer is internally provided with an intelligent plug-in, a backboard and a female connector of the needle bed module connector; the tool frame is provided with a needle bed module tray and a sliding guide rail; and the needle bed module is provided with a test probe, a bottom plate PCB and a male connector of the needle bed module connector. The lower computer is installed in the tool frame, the needle bed module is placed in the needle bed module tray, and the female connector of the needle bed module connector is connected with the male connector of the needle bed module connector. During testing, the PCBA to be tested is in contact with the needle bed module and is pressed tightly, and the test probe is in contact with the test point of the PCBA to be tested. The application is not connected with any cable or flying wire between the needle bed module and the lower computer, can realize drawer type plugging and unplugging, is convenient to change type and reliable in connection, and the lower computer is provided with a test signal switching matrix module, and is suitable for the differentiated needs of different PCBAs to be tested to test signal sources. The test tool can be applied to a PCBA production flow line, and realizes continuous flow of PCBA welding and testing links.

The present disclosure provides a floating-connectable chip testing connector, the floating-connectable chip testing connector includes a metal conductor assembly, a plastic base, a metal frame, and a fixing plate, the metal conductor assembly and the plastic base are connected to form a connector assembly, the fixing plate connects the connector assembly and the metal frame, the plastic base is provided with a hole for mounting the metal conductor assembly, and an assembly step is provided on the inner wall of the hole, the metal conductor assembly includes a main body, a spring, and an elastic locking ring, the spring and the elastic locking ring are annularly mounted on the outside of the main body, the elastic locking ring has a diameter larger than the inner diameter of the assembly step in a natural state and a diameter smaller than the inner diameter of the assembly step in a compressed state, a floating force applying step is provided at an end of the main body, the diameter of the floating force applying step is larger than the diameter of the spring, and the spring is located between the floating force applying step and the elastic locking ring.

The invention discloses an automatic testing device, and relates to the technical field of circuit board testing, the automatic testing device comprises a rack, positioning assemblies, a first moving module, a second moving module and a pressing mechanism, and the multiple positioning assemblies flexibly move in a two-dimensional plane through the first moving module and the second moving module. When the positioning assemblies surround and abut against the outer side of the periphery of the to-be-tested circuit board, accurate limiting of the to-be-tested circuit board can be achieved through the multiple positioning assemblies, the positioning assemblies at different positions move independently and can also adapt to the to-be-tested circuit boards of different sizes and shapes, and after the positioning assemblies move in place, the positioning assemblies can be used for positioning the to-be-tested circuit board. The upper pressing plate can press the upper surface of the to-be-tested circuit board, the lower pressing plate can press the lower surface of the to-be-tested circuit board, the to-be-tested circuit board is automatically pressed under the action of elastic force of the upper pressing plate and the lower pressing plate, the to-be-tested circuit board can be prevented from shifting in the testing process, and the stability of the to-be-tested circuit board in the testing process is ensured.