448results about "Printed circuit testing" patented technology

The invention relates to a PCBA automatic testing system and method, and relates to the technical field of PCBA automatic testing, and the system comprises a multi-source data collection module which is used for collecting chip dynamic power consumption waveform, PCB interlayer temperature gradient, and multi-source data of signal loop impedance change, and eliminating the sampling delay error of a sensor through a synchronous collection time sequence alignment algorithm; transmitting the acquired multi-source data to a dynamic modeling engine; according to the invention, by dynamically fusing the multi-physical-quantity data and adaptively generating the test path, the system can detect the fault of the PCBA more comprehensively and accurately, the detection efficiency is improved, and the false detection rate is reduced; the thermal aging and faults of the PCB are predicted by using a dynamic modeling engine, so that potential failure risks can be found in advance, and a powerful guarantee is provided for quality control of the PCB; and the test path is automatically generated according to the dynamic modeling result and the data of the fault knowledge graph, so that the workload and error of manually planning the test path are reduced.

The invention provides PCB deviation detection equipment and a detection method, and relates to the technical field of PCB detection, a feeding arm and a carrying arm are matched with a partition adsorption and pressing assembly to be matched with a detection platform and a feeding platform, so that the problem of uneven adsorption of an FPC is effectively avoided; the detection platform adopts the adsorption assembly with adjustable spacing, and the levelness is accurately regulated and controlled by combining with the jackscrew adjusting piece, so that the detection platform can adapt to the layout of components on the back of the PCB to avoid interference, and can guarantee the bearing stability and eliminate the positioning deviation. Meanwhile, the detection method supports the combination of PCBs and FPCs with different characteristics in a terminal area, and by calculating X and Y bidirectional deviation values, the adaptive range is widened, the detection precision is improved, and the missing detection and false detection rate is reduced.

The invention relates to the technical field of PCBA testing devices, in particular to a production line PCBA full-automatic testing device which comprises a supporting box, a supporting frame, a pressing assembly, a detection assembly, a bearing plate and a display screen. The pressing assembly is arranged on one side of the top of the supporting frame, the detection assembly is installed on the lower side of the supporting frame, and the bearing plate is fixed to the other side of the bottom of the supporting frame. A U-shaped containing groove is formed in the bearing plate, pressing frames are arranged on the two opposite sides of the groove in a lifting mode, and pressing blocks are arranged at the four corners of the groove in an inward rotating mode. And the bottoms of the pressing frame and the pressing block are connected with a driving assembly for controlling the lifting of the pressing frame and the rotation of the pressing block. Through cooperative work of the linkage clamping mechanism and the U-shaped placement groove, rigid fixation and quick release of the PCBA board are synchronously realized in single operation, so that the offset risk caused by human force difference in the testing process is eliminated, the contact precision of a probe is ensured, an open type part taking channel is optimized, and the detection reliability and the operation practicability are improved.

The invention discloses a circuit board functional defect positioning method based on dynamic signal feature extraction, which belongs to the technical field of electronic equipment detection, and comprises the following steps: S10, acquiring normal signal data of key nodes of a circuit board, the key nodes comprising a power supply input end, a signal input end and a signal output end; the normal signal data comprises a voltage signal and a current signal; constructing a database about normal signal data; s20, voltage signals and current signals of key nodes of the circuit board are collected, the change rules of the voltage signals and the current signals are analyzed, and the change rules are compared with the database. According to the circuit board fault diagnosis system and method, more comprehensive, accurate and reliable fault diagnosis can be carried out on the circuit board by comprehensively applying methods of signal acquisition, data analysis, fault diagnosis and the like, and the detection quality and reliability of functions of the circuit board are improved.

The invention relates to the technical field of probe testing, in particular to a PCB flying probe test path optimization method based on electrical characteristics, which comprises the following steps: calculating accessibility scores of test points according to the distribution of board surface test points and elements to determine risk types of the test points; determining a risk area grade corresponding to the grid unit according to the accessibility score in combination with the potential shadow area; optimizing the test path of the probe according to the risk area grade corresponding to the grid unit, and adjusting the initial moving speed of the test path of the probe in different grid units; for the same moving time sequence of different probe groups, determining overlapped grids according to the initial probe angles and the test paths corresponding to the probes, and determining whether there is a collision risk between the probes in combination with the initial moving speeds of the probes in different grid units; and when a collision risk exists between the probes, corresponding adjustment measures are taken according to the number of the overlapped grids. According to the invention, the test path is optimized in combination with multi-dimensional design based on the electrical characteristics and testability of the board.

The invention belongs to the technical field of ultra-high voltage direct current power transmission, and discloses a test system and method of a converter valve thyristor voltage detection board card, and the test system comprises a test cabinet and a test tool. An industrial control system is integrated in the test cabinet to set test parameters and criteria, an electric control unit loads an excitation source, an acquisition display unit acquires test data and presents the test data in an oscillogram, and a test tool fixes a tested board card. The industrial control system outputs a control instruction to drive the electric control unit to apply system test excitation, the actual working condition of the thyristor is simulated, and meanwhile, the acquisition and display unit automatically captures multichannel signal data; data are transmitted to the industrial control system through the electric control unit, and the board card performance is automatically analyzed and a test report is generated in combination with a preset criterion. By adopting the system, the problems of insufficient function verification, low test efficiency, vulnerable equipment, poor data accuracy and large manpower occupation are solved, efficient and lossless automatic test is realized, the test reliability is improved, and the operation process is simplified.

The invention relates to the technical field of insertion loss test, and discloses a spring force control insertion loss test probe device which comprises a mounting seat, an elastic probe assembly and a fine adjustment assembly. A supporting frame is arranged at the bottom of the mounting base, the elastic probe assembly is located below the mounting base, the elastic probe assembly is connected with the supporting frame, the height of the elastic probe assembly is adjustable, the fine adjustment assembly is located on one side of the probe assembly, one end of the fine adjustment assembly is connected with the elastic probe assembly, and the fine adjustment assembly is used for adjusting the elastic value of the elastic probe assembly. The optimal contact pressure can be accurately set according to the characteristics of different circuit boards, poor contact caused by too small pressure or needle mark damage caused by too large pressure is avoided, the same set of device can adapt to the test pressure requirements of different circuit boards, and the problem that the fixed elastic K value cannot be adjusted, and consequently the needle mark difference between different boards is large is solved.

The invention relates to the technical field of PCBs, and discloses a PCB hole chain capability test module and a design method and a test method thereof. At least a test point area and a hole chain test area are arranged in the test module; the design method comprises the following steps: according to the laminated structure of a target circuit board and the hole pattern distribution of each layer, determining the pattern and arrangement distribution of each test hole in the test module with the same laminated structure; based on the verification demand type of the test module, determining the hole wall spacing between the test holes; and determining a test hole chain formed by all the test holes in the hole chain test area according to the form and arrangement distribution of the test holes and the hole wall spacing, and further obtaining the structure of the test module. The test module obtained by the design method not only can realize the basic test of the reliability of the hole chain of the PCB product, but also can meet the verification requirements of different types such as equipment detection precision or materials.

The invention relates to the field of circuit board development and test, and discloses a circuit board simulation test system and method and electronic equipment, and the system comprises a data collection module, a performance prediction module, a test task generation module, a priority scoring module, a resource scheduling module, and a test execution and feedback module. The method comprises the steps that simulation environment parameters are collected, and the performance of a circuit board is predicted; identifying a function item based on the prediction result and generating a test task; the scheduling priority is calculated, and resource matching and task scheduling are completed; testing is executed, response data are collected, and a feedback result is generated; the electronic equipment comprises a memory, a processor and a communication module, wherein the circuit board simulation test method is realized when the processor is executed. According to the method, the environmental adaptability and precision of the test are improved, intelligent task scheduling and efficient resource utilization are realized, the prediction correction capability is realized, and the fault discovery efficiency and the system adaptability are enhanced.

The invention belongs to the field of rectifier bridge detection, and provides a precise part intelligent detection jig which comprises a detection table, a mounting cover is mounted at the bottom of the detection table, a rotating pipe is rotatably mounted in the mounting cover, one end, extending to the top of the detection table, of the rotating pipe is fixedly connected with a station rotating disc, the station rotating disc is provided with a plurality of stations, and the stations are arranged on the detection table. The station rotating disc is provided with a plurality of stations which are a detection station, a discharging station, a feeding station and a clamping station, and the multiple stations of the station rotating disc are each provided with a positioning and clamping mechanism. According to the invention, the component is positioned and clamped through the positioning and clamping mechanism, and when the positioning and clamping mechanism drives the component to move below the detection assembly, the output end of the detection assembly can be accurately connected to each pin of the component without repeated adjustment, so that the connection time is greatly saved, and the detection efficiency is improved; and each machine only needs one worker to be responsible for feeding and discharging, a large number of detection posts do not need to be arranged, and the labor cost is reduced.

The invention provides a PCB performance testing device and method, and particularly relates to the technical field of circuit board tests.The PCB performance testing device comprises a base, a main control displayer is installed on the front side of the top of the base, a testboard is fixedly arranged on the top face of the base, a PCB loading area is arranged in the center of the top face of the testboard, and a circuit board to be tested is loaded in the loading area; efficient cleaning pretreatment before testing is achieved through the combined treatment mechanism, plasma generated by the low-temperature plasma generator can remove an oxide layer and oil dirt on the surface of a testing point, ultrasonic vibration assists in stripping tiny impurities, impurities and chippings can be removed in time in cooperation with negative pressure adsorption of the rectangular suction nozzle, testing errors caused by surface pollution are effectively reduced, and the testing efficiency is improved. Meanwhile, by means of airflow purging and surrounding type high-frequency ultrasonic vibration, physical and mechanical friction is avoided, in the process of removing the oxide layer, the circuit board is not prone to being damaged, and the testing cost of the circuit board can be effectively reduced.

The invention relates to the technical field of PCB visual inspection, and discloses PCB automatic visual inspection equipment which comprises a machine body, a first conveying mechanism is installed on the lower portion of the inner side of the machine body, a partition plate is fixedly connected to the position, on the upper side of the first conveying mechanism, of the inner side of the machine body, and a second conveying mechanism is installed on the upper side of the partition plate. Two sets of lifting mechanisms are fixedly installed on the inner side of the machine body and on the outer sides of the first conveying mechanism and the second conveying mechanism, and the upper side of the partition plate is fixedly connected with a visual inspection mechanism through evenly-distributed supporting rods. Through cooperation of the lifting mechanism, the first conveying mechanism, the second conveying mechanism, the visual detection mechanism, the PCB carrying table, the laser marking mechanism and the lower die jacking mechanism, the purposes that more than two kinds of visual detection items are continuously carried out on multiple PCBs, meanwhile, laser marking is carried out on the PCBs twice, and detection data are recorded are achieved.

The invention discloses a test fixture and a test method suitable for various circuit boards, and the test fixture comprises a bottom plate, the top of which is provided with at least one first positioning groove; each fixing assembly comprises a fixing plate and a clamping groove structure, and the bottom of each fixing plate is provided with a fixing rib in sliding fit with the corresponding first positioning groove; the test probe assembly is detachably installed on the first set of fixing assemblies, the test probe assembly comprises a PCB, test probes and a probe pressure adjusting structure, the probe pressure adjusting structure comprises an elastic support installed on the PCB and a driving mechanism driving the elastic support to stretch out and draw back, and the multiple test probes are installed on the elastic support; and the electric connection assembly is detachably mounted on the second group of fixing assemblies. The test fixture provided by the invention can adapt to the test requirements of different types of circuit boards, the test pressure of the probe can be freely adjusted, the test fixture is simple and reliable in structure, and the fault rate and the maintenance cost are effectively reduced.

The invention provides an automatic testing method and system for a stepping servo driver and a medium. The method comprises the steps of automatically generating a unique number and binding a record, sending a data packet, detecting external network communication, collecting first fault information, collecting bus data, detecting a board card state, collecting second fault information, docking driver module ports, and respectively performing automatic polling detection and internal communication detection. Collecting third and fourth fault information; reading preset synchronous register data; carrying out synchronous state detection and collecting fifth fault information; reading back motor data to carry out performance detection on a motor and collecting sixth fault information; therefore, through a full-process automatic dynamic analysis technology, IO self-closed-loop testing and centralized data management, data transmission and cooperative work are realized, the testing efficiency and accuracy of the servo driver are improved, and automatic testing is realized.

A method of estimating a breakdown voltage of a silicon dioxide film includes; generating breakdown voltage information associated with first test dies selected from among test dies, generating a breakdown voltage estimation model by updating a parameter of a neural network model based on the breakdown voltage information, applying test voltages to second test die selected from among the test dies and distinct from the first dies and receiving currents levels for current generated by the second test dies in response to the test voltages, wherein the test voltages have respective levels lower than levels of breakdown voltages for the first test dies, and estimating breakdown voltages of the second test dies using the breakdown voltage estimation model in relation to the currents levels.

The invention relates to the technical field of flying probe testing, and discloses a probe deviation compensation method and device, electronic equipment and a storage medium, and the method comprises the steps: collecting the tip coordinates of a replaced probe corresponding to different angles after the probe of the flying probe testing is replaced; calculating an eccentric parameter of the probe based on the tip coordinate; calculating a target rotation angle of the probe based on the eccentricity parameter and the camera view center coordinate; calculating the total compensation displacement based on the camera view center coordinate, the tip center point coordinate and the target rotation angle; and controlling the probe based on the target rotation angle and the total compensation displacement amount. According to the method, after the probe is replaced, the target rotation angle and the total compensation displacement are respectively calculated by detecting the coordinates of the probe tip, and then the probe is compensated according to the target rotation angle and the total compensation displacement, so that manual adjustment is not needed, and the calibration efficiency of probe compensation and the precision of flying probe testing are improved.

After the wafer is singulated, the individual die may need to be tested again, and the die may need to be tested again after it is attached to a support plate. A tester apparatus is disclosed. Various components contribute to the functionality of the tester apparatus and facilitate movement of the wafer pack to maintain a vacuum without human supervision. These functionalities include a latching system that holds the wafer pack intact and a pressure sensing means that detects and relays pressure within the wafer pack.

Embodiments of methods and semiconductor devices are described that are configured to determine a negative resistance margin (NRM) of an oscillator circuit. The semiconductor device may include an integrated circuit including an amplifier circuit coupled between a first node and a second node and NRM test circuitry including a resistor circuit selectively coupled between a first contact pad and the first node. The integrated circuit may receive an oscillating signal from an oscillator circuit coupled to the first contact pad and a second contact pad of the integrated circuit. In an NRM test mode, a resistance of the resistor circuit is selectively varied from an initial resistance value to one or more second resistance values and the oscillating signal is monitored at the second node to determine the NRM based on the one or more second resistance values when an amplitude of the oscillating signal falls below a threshold amplitude.

The present application relates to four-probe flying probe test equipment path optimization method, device and storage medium, the method includes task input module receives basic constraint condition and test task information, if using fixed grouping mode, according to the basic constraint condition fixedly divide four probes into two groups, the distance of two groups of probes from the current test task to the selectable next test task is calculated in turn and the moving path of each group of probes is planned, if using the variable grouping mode that allows probe to change group in each step test process, the optimization objective function of each step of each probe is calculated in turn and the moving path of each probe is planned, according to the moving path of each planned probe, control execution module controls each probe to move in turn and completes test task. The mathematical model constructed more comprehensively and accurately reflects the actual situation of four-probe flying probe test, provides more reliable theoretical basis for path optimization, and helps to improve the optimization precision of test path.

A contactor assembly for a testing system for testing integrated circuit devices includes a contact, and a housing having a contact slot. The contact is receivable in the contact slot. The contact includes a tip, a body, and a tail; and is configured to be in a free state, a preload state, and an actuated state. The housing includes a housing backstop. When the contact is in the preload state, a contact backstop of the contact is biased against the housing backstop.

The present invention relates to the technical field of integrated circuit board finished product detection, and more specifically, to a method and system for monitoring finished computing and processing modules. A linear array laser scanner disposed above a finished product conveyor belt is used to scan multiple finished computing and processing modules passing on the finished product conveyor belt in real time, thereby obtaining a spectral pattern corresponding to each finished computing and processing module; local spectral patterns corresponding to multiple chip components are identified in the spectral pattern; and each local spectral pattern is sequentially detected to determine whether there is a planar defect. If so, the damaged surface of the planar defect is evaluated, and the degree of damage to the damaged chip component is evaluated based on the proportion of the damaged surface. The monitoring method described in the present invention generates a spectral pattern representing height information in real time through a linear array laser scanner, combines RGB color thresholds with an image feature extraction algorithm, accurately identifies local areas of multiple chip components, effectively avoids interference caused by the dense arrangement of multiple components, and improves the positioning accuracy and noise resistance of planar defect detection.

The invention relates to the technical field of fault diagnosis, in particular to a charging pile main power circuit fault diagnosis system construction method based on a digital-physical hybrid platform, and the method comprises the steps: constructing a fault database based on historical fault data; diversified fault features are injected into a charging pile main circuit discrete model in the core processing module through a random extraction strategy, and a fault reaching the standard is dynamically forbidden in combination with a closed-loop verification mechanism, so that a diagnosis model continuously adapts to an unknown fault type. Fault diagnosis models in a core processing module and an auxiliary processing module in an upper computer are respectively optimized by verifying diagnosis results, fault library dynamic injection is combined with double-level diagnosis verification, the limitation of center AI static modeling in the prior art is broken through, and a digital-physical hybrid verification closed loop is constructed, so that the fault diagnosis accuracy is improved. The two times of verification and optimization of the charging pile fault diagnosis model in the hardware-in-the-loop are realized, and the accuracy and the real-time performance of the fault diagnosis of the charging pile main power circuit under the complex working condition are comprehensively improved.

The invention relates to the technical field of circuit board production, in particular to a probe anti-breaking structure for a circuit board flying probe test, which comprises a probe, a connecting line is arranged at the upper end of the probe, and the outer end surface of the probe is recessed inwards to form a plurality of chutes; the straight tube is movably connected with the upper end of the probe; the guide cylinder sleeves the outer side of the probe, and the transverse part of the guide cylinder is in threaded connection with the lower end of the straight cylinder; the mounting piece is connected with the upper end of the straight cylinder; the guide plate is connected with the outer end of the probe and is slidably connected in the straight cylinder; the fourth elastic piece is connected with the upper end of the guide plate, and the other end is connected with the lower end of the mounting piece; and a plurality of guide members which are installed on the inner wall of the guide cylinder at equal intervals and are slidably connected to the outward ends of the plurality of sliding grooves respectively, so that elastic contact between the probe and the test position of the circuit board is realized, the probability of breakage and the like of the probe when the probe is in contact with the test position of the circuit board is effectively reduced, and the test efficiency is improved. The probability of damage of the test position of the circuit board is effectively reduced, and the test effect and quality are effectively ensured.

This document describes a test fixture for PCB components. The test fixture includes a pad with holes configured to direct RF energy from the component on the PCB through an end of the PCB to a top clamp of the test fixture. The end of the PCB may correspond to a cut line for destructive testing. The test fixture also includes a top clamp with a test port and a tapered shape configured to direct RF energy from the holes to the test port. The test fixture also includes a bottom clamp attached to the top clamp to hold the PCB between the top and bottom clamps for testing. The test fixture allows for rapid mounting of the PCB and test component without modifying the PCB design or requiring specific drilling of the PCB.

A method and system for calibration of a vector network analyser (2) of the measurement apparatus (1) wherein calibration components (10) are connected automatically by a connector positoner system (3) of the measurement apparatus (1) under control of a controller to ports of the vector network analyser (2) of the measurement apparatus (1).

A printed circuit board (PCB) test system and method including temperature chamber including at least one slot to accommodate at least one PCB test coupon, input bus connected to inputs of the at least one slot, and output bus connected to outputs of the at least one slot, wherein temperature chamber is configured to apply a temperature to the at least one PCB test coupon; signal generator including output bus connected to the input bus of the at least one slot, frequency meter comprising an input bus connected to the output bus of the at least one slot and an output bus, and a comparator connected to the output bus of the signal generator and the output bus of the frequency meter for comparing corresponding outputs of the signal generator and the frequency meter.

The invention provides a cartridge comprising a socket of insulative material and having upper and lower sides and a formation on the upper side to hold an electronic device; a set of contacts held in the socket to connect to the electronic device; a set of terminals connected to the set of contacts held by the socket; a circuit board, the set of terminals connected to the set of contacts being connected to a set of contacts on the circuit board; a lid; a detector mounted to the lid, the lid being movable to be positioned over the socket with the detector located in a position to detect a feature of the electronic device when and due to power being supplied through at least one of the set of terminals held by the socket to the electronic device; and a measurement channel connecting the detector to an interface on the circuit board.

The invention belongs to the technical field of PCBs, and discloses a preparation method and a detection method of a blind hole deviation detection module of a circuit board, and the method comprises the steps: S1, manufacturing the circuit board layer by layer until a blind hole at the outermost layer needs to be manufactured; s2, manufacturing an outermost product blind hole in a product area of the circuit board, and manufacturing a detection blind hole special for detecting deviation in a non-product area of the circuit board; and S3, the outermost layer circuit of the circuit board is printed, a marking outer frame which surrounds the detection blind holes in the frame is printed, under the condition of precise printing and precise drilling, the outermost layer circuit and the marking outer frame avoid positions at the detection blind holes so that the bottom faces of the detection blind holes can be exposed, and one detection blind hole and one marking outer frame on the periphery of the detection blind hole form a detection unit. By means of deviation detection, large-scale reworking and scrapping caused by the fact that deviation is not detected can be avoided, problems in the production process can be corrected in time, cost is saved, the production process is optimized, and production efficiency is improved.

The invention relates to the field of circuit board detection, in particular to an automatic detection device for circuit board processing, which comprises a base, a flying probe detection mechanism and a visual sensor are fixedly mounted on the base, two symmetrically arranged telescopic support plates are fixedly mounted on the base, and an annular guide rail is arranged between the telescopic support plates on two sides. And two rotating rods are fixedly mounted on the side wall of the annular guide rail and are coaxially arranged. By arranging the linear guide rail and the annular guide rail, the limiting column and the pushing block can be flexibly adjusted according to circuit boards of different specifications. Meanwhile, the driving motor is matched to drive the rotating rod to rotate, so that the circuit board rotates, the flying probe can detect the complex circuit board by changing the angle direction of the circuit board, and meanwhile, the back face of the circuit board can be detected; and the detection efficiency of the circuit board is greatly improved while the application range of the detection device is ensured through mutual cooperative use of a limiting column and a pushing block.