Auxiliary testing circuit, chip with auxiliary testing circuit and circuit board with auxiliary testing circuit

Abstract

The invention relates to an auxiliary testing circuit, a chip with the auxiliary testing circuit and a circuit board with the auxiliary testing circuit. The auxiliary testing circuit is used for assisting in testing the state of electrical connection between a plurality of pins and corresponding functional circuits of the chip. The auxiliary testing circuit comprises a pin selection unit, a voltage division unit and a test result output end. The voltage division unit comprises a test voltage input end, a voltage output end and a voltage division element connected between the test voltage input end and the voltage output end, wherein the test voltage input end is used for receiving test voltage. The pin selection unit is connected between the plurality of pins and the voltage output end and is used for controlling one of the pins to be electrically connected with the voltage output end according to an external control signal. The voltage output end is directly or indirectly connected to the test result output end. The auxiliary testing circuit of the invention has the advantages of simple detection process and few test points.

Description

technical field [0001] The invention relates to an auxiliary test circuit and a chip and a circuit board with the auxiliary test circuit. Background technique [0002] There are many chips integrated on the circuit board. At present, when detecting whether the functional circuits connected to the pins of these chips are normal, open circuit or short circuit, a test point is usually electrically connected to a pin, and then the voltage of the test point is measured by the test equipment. value to judge whether the functional circuit connected to the pin is normal, open circuit or short circuit. However, when the number of chip pins is large, the required test points also increase accordingly. During the test, it is necessary to manually connect the test equipment to multiple test points in order to sequentially connect the corresponding functional circuits of each pin. The state is detected, which requires manual replacement of test points in sequence, which makes the detect...

AI Technical Summary

Problems solved by technology

However, when the number of chip pins is large, the required test points also increase accordingly. During the test, it is necessary to manually connect the test equipment to multiple test points in order to sequentially connect the corresponding functional circuits of each pin. The state is detected, which requires manual replacement of test points in sequence, which makes the detection process cumbersome and time-consuming

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