85 results about "Flying probe" patented technology

The invention belongs to the technical field of PCB flying probe detection equipment, and particularly relates to a flying probe compensation method and system based on PCB curved surface modeling, and the method comprises the steps: obtaining the size of a PCB, and carrying out the equilateral triangle grid division; in the visual alignment process, the laser distance measuring sensor is synchronously driven to carry out rapid non-contact height measurement on the vertex of the grid; based on the vertex three-dimensional coordinates, fitting triangular patches through a space plane equation and splicing the triangular patches into a three-dimensional curved surface model; performing bilinear interpolation on an area formed by adjacent patches in the model to smooth a curved surface; and finally, selecting an interpolation function according to the position of the test point to calculate the accurate height, and generating a Z-axis displacement compensation value of the probe. According to the high-precision measurement and self-adaptive compensation of the PCB warpage, the efficiency and precision of the flying probe test are considered, and the problem of poor contact or overvoltage damage of the probe caused by the board warpage is effectively solved.

The invention discloses a high-precision and high-frequency visual flying probe detection mechanism in the technical field of circuit board detection. The high-precision and high-frequency visual flying probe detection mechanism comprises a rotating unit, a linear driving unit, a visual monitoring unit, a detection probe unit and a guide connecting unit, wherein the linear driving unit and the visual monitoring unit are arranged on the rotating unit; the detection probe unit is arranged at the output end of the linear driving unit; according to the visual monitoring unit, the light path layout is simplified through the prism piece, the space layout is saved, meanwhile, the adjusting piece is arranged so that the image acquisition equipment can be rapidly and manually adjusted, the operation convenience and the adjusting precision are both considered, the single focusing time is shortened, meanwhile, circuit boards with different thickness ranges can be detected in a matched mode, and the use range is widened.

The invention relates to the technical field of probe testing, in particular to a PCB flying probe test path optimization method based on electrical characteristics, which comprises the following steps: calculating accessibility scores of test points according to the distribution of board surface test points and elements to determine risk types of the test points; determining a risk area grade corresponding to the grid unit according to the accessibility score in combination with the potential shadow area; optimizing the test path of the probe according to the risk area grade corresponding to the grid unit, and adjusting the initial moving speed of the test path of the probe in different grid units; for the same moving time sequence of different probe groups, determining overlapped grids according to the initial probe angles and the test paths corresponding to the probes, and determining whether there is a collision risk between the probes in combination with the initial moving speeds of the probes in different grid units; and when a collision risk exists between the probes, corresponding adjustment measures are taken according to the number of the overlapped grids. According to the invention, the test path is optimized in combination with multi-dimensional design based on the electrical characteristics and testability of the board.

The invention relates to the technical field of flying probe testing, and discloses a probe deviation compensation method and device, electronic equipment and a storage medium, and the method comprises the steps: collecting the tip coordinates of a replaced probe corresponding to different angles after the probe of the flying probe testing is replaced; calculating an eccentric parameter of the probe based on the tip coordinate; calculating a target rotation angle of the probe based on the eccentricity parameter and the camera view center coordinate; calculating the total compensation displacement based on the camera view center coordinate, the tip center point coordinate and the target rotation angle; and controlling the probe based on the target rotation angle and the total compensation displacement amount. According to the method, after the probe is replaced, the target rotation angle and the total compensation displacement are respectively calculated by detecting the coordinates of the probe tip, and then the probe is compensated according to the target rotation angle and the total compensation displacement, so that manual adjustment is not needed, and the calibration efficiency of probe compensation and the precision of flying probe testing are improved.

The present application relates to four-probe flying probe test equipment path optimization method, device and storage medium, the method includes task input module receives basic constraint condition and test task information, if using fixed grouping mode, according to the basic constraint condition fixedly divide four probes into two groups, the distance of two groups of probes from the current test task to the selectable next test task is calculated in turn and the moving path of each group of probes is planned, if using the variable grouping mode that allows probe to change group in each step test process, the optimization objective function of each step of each probe is calculated in turn and the moving path of each probe is planned, according to the moving path of each planned probe, control execution module controls each probe to move in turn and completes test task. The mathematical model constructed more comprehensively and accurately reflects the actual situation of four-probe flying probe test, provides more reliable theoretical basis for path optimization, and helps to improve the optimization precision of test path.

The invention relates to the technical field of circuit board production, in particular to a probe anti-breaking structure for a circuit board flying probe test, which comprises a probe, a connecting line is arranged at the upper end of the probe, and the outer end surface of the probe is recessed inwards to form a plurality of chutes; the straight tube is movably connected with the upper end of the probe; the guide cylinder sleeves the outer side of the probe, and the transverse part of the guide cylinder is in threaded connection with the lower end of the straight cylinder; the mounting piece is connected with the upper end of the straight cylinder; the guide plate is connected with the outer end of the probe and is slidably connected in the straight cylinder; the fourth elastic piece is connected with the upper end of the guide plate, and the other end is connected with the lower end of the mounting piece; and a plurality of guide members which are installed on the inner wall of the guide cylinder at equal intervals and are slidably connected to the outward ends of the plurality of sliding grooves respectively, so that elastic contact between the probe and the test position of the circuit board is realized, the probability of breakage and the like of the probe when the probe is in contact with the test position of the circuit board is effectively reduced, and the test efficiency is improved. The probability of damage of the test position of the circuit board is effectively reduced, and the test effect and quality are effectively ensured.

The application discloses a test fixture for electrical performance of FCBGA single product, and belongs to the field of electrical performance test of FCBGA single product. The FCBGA single product is in a rectangular structure. The fixture substrate is fixedly installed on an external flying probe test machine. A plurality of rectangular test sites are arranged on the fixture substrate and used for placing the FCBGA single product. The size of the test site is greater than that of the largest specification of the rectangular FCBGA single product. An L-shaped reference block is fixedly arranged at a first reference corner of the test site, and an inner corner is arranged on the L-shaped reference block. The inner corner is designed to be matched with a first corner and two side edges of the FCBGA single product. A strip-shaped stopper is arranged at a second reference corner of the test site. The first reference corner and the second reference corner are two opposite reference corners of the test site diagonal line. The first corner of the FCBGA single product is abutted against the L-shaped reference block, and the strip-shaped stopper is abutted against the second corner of the FCBGA single product. The first corner and the second corner are two opposite corners of the FCBGA single product diagonal line. Based on the above structure, the efficiency and quality of the flying probe test link are improved, and the test work on different size products is met.

The invention relates to the field of circuit board detection, in particular to an automatic detection device for circuit board processing, which comprises a base, a flying probe detection mechanism and a visual sensor are fixedly mounted on the base, two symmetrically arranged telescopic support plates are fixedly mounted on the base, and an annular guide rail is arranged between the telescopic support plates on two sides. And two rotating rods are fixedly mounted on the side wall of the annular guide rail and are coaxially arranged. By arranging the linear guide rail and the annular guide rail, the limiting column and the pushing block can be flexibly adjusted according to circuit boards of different specifications. Meanwhile, the driving motor is matched to drive the rotating rod to rotate, so that the circuit board rotates, the flying probe can detect the complex circuit board by changing the angle direction of the circuit board, and meanwhile, the back face of the circuit board can be detected; and the detection efficiency of the circuit board is greatly improved while the application range of the detection device is ensured through mutual cooperative use of a limiting column and a pushing block.

The invention relates to the field of flying probe testing, and discloses a five-cycle reference-locked four-terminal low-resistance data processing method, which comprises the following steps of: 1, acquiring continuous five-frame initial data of a flying probe machine four-terminal test, restarting cycle if single-frame data exceeds a preset tolerance, and screening to obtain effective reference data; 2, carrying out abnormal value elimination on the effective reference data, calculating a data mean value, completing benchmark calibration, and generating a calibration reference value of a target test point; 3, based on the calibration reference value, establishing a mapping relation between the probe contact parameter of the flying probe machine and a test resistance value, and compensating a resistance value error caused by contact deviation; and step 4, adjusting test parameters such as probe pressure and staying duration of the flying probe machine according to a deviation compensation result, and outputting an optimized test scheme. The method has the following beneficial effects that the test precision is obviously improved, the robustness is strong, the cost is low, the method is easy to land, the consistency is good, and the production efficiency is improved.

The invention discloses an intelligent test system and an intelligent test method for a gas meter circuit board, and belongs to the technical field of intelligent test of circuit boards. The intelligent test system for the gas meter circuit board comprises an automatic optical detection module which is used for collecting a circuit board image, identifying element missing and polarity errors and outputting a preliminary screening result; the function test module comprises an ICT test unit and a flying probe test unit and is used for performing electrical function and performance test on the circuit board; the control and analysis module is connected with the automatic optical detection module and the function test module and used for controlling the test process and analyzing test data; the data storage module is used for storing test historical data and a fault mode database; according to the invention, the problems of low efficiency, high misjudgment and poor adaptation of a traditional test can be solved, full-process intelligent detection and accurate fault diagnosis are realized, and the test reliability and economical efficiency are improved.

The utility model relates to the technical field of semiconductor testing, and provides a probe assembly used for a flying probe testing machine and capable of identifying a needle point in the vertical direction, which comprises a main support, a cantilever support arranged on the main support, a probe arranged on the cantilever support, and a camera identification assembly arranged horizontally and used for identifying the position of the needle point of the probe in the vertical direction. The camera identification assembly comprises a mounting bracket arranged on the main bracket, an identification camera arranged on the mounting bracket, a lens matched with the identification camera and a prism matched with the lens; the camera identification assembly and the probe are always in a relative static state, the problem of interference and shielding of image acquisition does not exist, the needle point position of the probe in the vertical direction can be accurately and clearly identified through the camera identification assembly, so that debugging alignment operation is accurately carried out, the problem of mutual interference and influence does not exist among a plurality of structures, and the debugging precision is improved. Therefore, small bonding pad testing work can be carried out, and the application range of the flying probe testing machine is expanded.

This application relates to a horizontal flying probe inspection device, belonging to the field of flying probe inspection technology. It includes a loading mechanism, a first inspection mechanism, a flipping mechanism, a second inspection mechanism, and an unloading mechanism. The loading mechanism includes a frame, a transport cart, a loading platform, a robotic arm, a suction cup, and a transfer assembly, used to load PCB boards to be inspected and transfer them to the first inspection mechanism. The transfer assembly is mounted on the frame, and the loading platform slides on the transfer assembly to carry the PCB boards to be inspected. The transport cart is used to transport the loading platform to the transfer assembly. The first inspection mechanism is used to inspect the front side of the PCB boards transferred by the storage assembly. This application has the following advantages: it realizes automated PCB board inspection and double-sided inspection of PCB boards, improving inspection efficiency while reducing manual intervention, lowering labor intensity and labor costs, and improving machine utilization efficiency. Furthermore, the horizontal inspection design also enables the inspection of batches of PCB boards.

The invention belongs to the technical field of PCBA board detection, and particularly relates to an automobile PCBA board detection device which comprises a detection machine body, a gantry sliding table installed in the detection machine body and used for adjusting the detection position, and a flying probe detection head installed on the surface of the gantry sliding table and used for detection. And the conveying assembly comprises two groups of conveying frames which penetrate through the interior of the detection machine body and are oppositely arranged on the bottom side of the flying probe detection head, and conveying mechanisms which are respectively arranged on the inner sides of the two conveying frames. PCBA boards are sequentially arranged and placed on the surface of a conveying roller of the conveying assembly according to a fixed angle through the suction cup mechanical arm, then automatic conveying of the PCBA boards can be achieved through the arrangement of the conveying assembly, a second telescopic rod operates when the conveying assembly drives the PCBA boards to move to the bottom side of a flying probe detection head, the second telescopic rod drives a clamping mechanism to move upwards when extending, and the PCBA boards are clamped through the clamping mechanism. And then the PCBA board is clamped and fixed through the arrangement of the clamping mechanism, so that the intelligence of the device can be improved, and the detection efficiency of the PCBA board can be improved.

The utility model relates to the PCB automatic positioning detection field, and discloses a PCB automatic positioning detection tool comprising a box body, the top side of the box body is provided with an ejector plate, the top side of the ejector plate is provided with a tray, the top side of the tray is provided with a lower pressing plate, the inner wall of the lower pressing plate is provided with a protection baffle plate, and the inner wall of the lower pressing plate is provided with a baffle plate. A mainboard to be tested is arranged on the inner wall of the lower pressing plate. According to the utility model, the test frame adopts a modular design and comprises a mechanical transmission part, an electrical parameter measurement system, a field data test system and a heat dissipation control system, a contact part adopts a flying probe test, and the test frame has the key points that the flexibility is high, a plurality of test points are designed, wide test coverage is provided, and rapid and comprehensive test can be realized; the PCB testing device is especially suitable for large-batch and standardized production of PCBs, and through the design of trays and limiting columns in four directions and a pressing assembly sliding in the height direction, rapid positioning of the PCBAs is achieved, and efficient testing of power panels is achieved.

The invention relates to a test needle for measuring electrically conductive layers in holes of printed circuit boards, as well as to a test probe equipped with such a test needle and to a flying probe tester for testing printed circuit boards equipped with such a test needle or such a test probe.The test needle has a capacitive measuring body, which is connected via a cable to a capacitive measuring device. The cable is shielded so that only the capacitive measuring body can form a capacitive coupling with other electrically conductive bodies. This makes it possible to determine this capacitive coupling with a high local resolution.

The utility model belongs to the technical field of semiconductor testing, and particularly relates to a flying probe testing machine which comprises a probe assembly driven by a voice coil motor, a camera assembly coaxially arranged and a mechanical structure used for supporting and guiding. The voice coil motor directly drives the probe, so that rapid linear motion is realized, and the needle inserting precision and the response speed are improved. The coaxial design of the camera assembly ensures accurate synchronization of image acquisition and probe action, and the test accuracy is improved. The equipment structure is simplified, the occupied space is reduced, and the installation and maintenance cost is reduced. The method is suitable for high-efficiency and high-precision batch detection of electronic components, and has remarkable technical and economic benefits.

The invention relates to the technical field of detection equipment, in particular to a PCB (Printed Circuit Board) detection device, which comprises a base, a clamping frame and an electric detection mechanism, the PCB is installed on the clamping frame, and the electrical testing mechanism makes contact with the PCB through a flying probe to conduct electrical testing. The base is further provided with a knocking mechanism surrounding the clamping frame. The knocking mechanism is used for knocking the clamping frame and impacting a PCB (Printed Circuit Board) on the clamping frame; according to the invention, the electromagnet attracts the knocking block and extrudes the knocking spring, and the knocking spring pushes the knocking block to impact the PCB, so that the impact on the PCB in actual use is simulated, and flying probe detection is carried out on the PCB again after the impact is completed, so that the influence of the impact on the PCB can be detected. The knocking block is driven by the moving seat to move around the PCB, and the impact direction on the PCB is adjusted, so that the PCB is impacted at different positions.

The invention relates to the technical field of flying probe equipment, and discloses a power-down probe protection device, which comprises a base; the moving assembly is installed on the base and comprises a guide rail and a sliding block, the guide rail is fixed to the base, the sliding block is in sliding fit with the guide rail in the first direction, and the moving assembly further comprises a motor suitable for driving the sliding block to move along the guide rail; one end of the arm is fixedly connected with the sliding block, and the other end is used for mounting a probe; and the control board card is used for receiving an equipment power-off signal and issuing a driving instruction after receiving the power-off signal, so that the sliding block moves towards the direction of the bulge by a preset distance, and the bulge is clamped into the clamping part. Through cooperative cooperation of the control board card, the moving assembly and the arm, a driving instruction can be rapidly triggered when the equipment is powered off, so that the sliding block drives the arm to move towards the protruding direction and achieve clamping, falling of the arm due to power failure is effectively prevented, damage of a probe and a tested product due to falling is avoided, and the risks of probe damage and product scrapping are reduced.

The present invention relates to the field of flying probe detection technology, specifically a cable shaft assembly and a flying probe detection device having the cable shaft assembly, the cable shaft assembly including: an elastic member, a sliding assembly, a guide mechanism, a bearing mechanism, and a pressure wheel assembly. A flying probe detection device having the cable shaft assembly includes the above-mentioned cable shaft assembly, the cable shaft assembly is arranged at the upper end of the whole machine, and the cable hangs down from the upper end. Through the cooperation of the slider structure and the slide rail, the elastic member is in a fully contracted state, so that the cable will not fall when the cable is stored; when the flying probe is at the farthest distance, the elastic member is stretched and the cable is released. During the entire action process, the cable is always in a tensioned state, and the operating platform is very tidy. Compared with the cable routing form of the drag chain, the cable length is greatly reduced, and no delay is generated during signal transmission.

This invention discloses a double-sided flying probe testing and calibration method and a double-sided flying probe testing device. The method includes fixing and leveling a micro-pinhole array calibration plate, presetting the hole spacing and reference origin; moving the upper probe holder above the first hole, capturing the hole center image with a camera, obtaining pixel coordinates through sub-pixel edge detection and circle fitting, and fine-tuning to coincide with the optical axis to record the mechanical coordinates; the lower probe holder emits a transmitted light beam via an optical fiber, the upper camera captures the center of the light spot, and fine-tunes to coincide with the optical axis to record the coordinates; traversing each hole position according to the array, recording the mechanical coordinates of the upper and lower probe holders and calculating the relative offset; performing least-squares fitting between the offset sequence and the theoretical coordinate matrix to solve for translation, rotation, and scaling parameters, generating a global compensation mapping table; during testing, coordinate commands are output after compensation transformation to achieve precise double-sided alignment. The technical solution of this invention aims to eliminate the pose deviation introduced by the assembly and processing of the front and rear probe holders, and improve the collaborative alignment accuracy of the device.

The invention discloses a parallel grounding device and method for a flying probe test, and the device comprises an X-direction driver which is fixedly disposed in an inner cavity of a circuit board conveying track, and the outer end of a piston rod of the X-direction driver is fixedly connected with a probe translation pedestal. A probe translation base is fixedly connected to the upper end of the circuit board conveying track, a Z-direction driver is fixedly connected to the outer side of the probe translation base, a plurality of array type parallel concentrated grounding modules are fixedly connected to the upper end of a piston rod of the Z-direction driver, and the array type parallel concentrated grounding modules are horizontally arranged in the transverse direction of the circuit board conveying track. During the flying probe test, the test equipment control terminal controls the independent communication of the array type parallel concentrated grounding module, thereby realizing the parallel grounding of a single board and multiple jointed boards, reducing the time of independent switching grounding, improving the operation efficiency, realizing the parallel grounding function of the flying probe test, and greatly improving the test efficiency and stability.

The utility model relates to a kind of ceramic substrate with flying probe tester positioning tooling.It includes: test table, support sheet, clamping assembly and negative pressure component;Support sheet is equipped with detection area, and several detection holes are equipped in detection area;The clamping assembly is composed of fixed clamping plate, movable clamping plate and first cylinder, and movable clamping groove is equipped on movable clamping plate, and fixed clamping groove is equipped on fixed clamping plate;The negative pressure component is composed of negative pressure cavity, movable cover plate and second cylinder, and negative pressure cavity with the detection area one-to-one correspondence, movable cover plate or the test table is equipped with the air extraction connector that is communicated with negative pressure cavity.The clamping assembly provides vacuum adsorption effect in clamping process, ensure that ceramic substrate is closely adhered on support sheet, so that it can guarantee that ceramic substrate is still kept horizontal when being clamped and fixed, ensure that detection hole in detection area and the pad on the bottom surface of ceramic substrate one-to-one correspondence.

The utility model discloses a flying probe testing machine, which relates to the field of flying probe testing and comprises a support frame, an upper cross beam, a lower cross beam, a mounting plate, a flying probe testing mechanism and a workbench used for fixing a plate to be tested, the flying probe testing mechanism and the workbench are sequentially arranged along the horizontal direction, and the upper cross beam, the mounting plate and the lower cross beam are arranged along the gravity direction. The workbench is embedded in the center of the mounting plate, the upper end and the lower end of the flying probe testing mechanism are arranged on the upper cross beam and the lower cross beam respectively, the upper cross beam and the lower cross beam are arranged at the upper end and the lower end of the supporting frame respectively, and the mounting plate is parallel to the gravity direction and detachably arranged in the center of the supporting frame. The mounting plate is made of marble, and the cross beam and the supporting frame are high in strength and heavy in weight, so that shaking of the mounting plate in the inserting groove is reduced. When circuit boards of different specifications need to be tested, the original mounting plate is dismounted, the workbench and the testing mechanism are adjusted, and then the mounting plate is mounted back to the supporting frame, so that the time required for replacement can be shortened.

The invention provides a universal carrier device for a double-sided flying probe test, which comprises a carrier base, a supporting platform, a first adjusting mechanism, a second adjusting mechanism and a third adjusting mechanism, and is characterized in that the carrier base is of a rectangular frame structure; the supporting platform is arranged on the carrier base through the first adjusting mechanism and moves in the carrier base in the Z direction through the first adjusting mechanism. And through the second adjusting mechanism and the third adjusting mechanism, the to-be-tested product on the supporting platform can move along the X direction and the Y direction and can be positioned. The embodiment of the invention is compact in structure, does not affect the work of the probe head of the flying probe tester, is convenient to adjust and position, can achieve the simultaneous double-sided flying probe testing of a plurality of products, is high in universality, and is convenient to operate.

The utility model relates to a flying probe circuit used for PCB insulation impedance test and a test device, comprising a plurality of probes, two ends of each probe are connected in series with sub-switches to form series units, the series units are connected in parallel to form a parallel circuit, two ends of the parallel circuit are provided with main switches, and the main switches are connected in parallel with the parallel circuit. The free end of the main switch is connected with a power supply and a detection circuit. According to the utility model, the on-off relationship among the probes is controlled through the on-off of each sub-switch, and any two probes can be combined into a test pair, which has higher flexibility in the insulation impedance test of the PCB, and compared with the mode that the positions of the probes are readjusted through a mechanical arm, the test efficiency is greatly improved. According to the scheme, the probes can be quickly switched by controlling the on-off of the sub-switches, and the detection efficiency can be greatly improved.

The invention relates to high-precision CCS electrical logging and AVI detection integrated equipment, relates to the technical field of CCS detection equipment, and aims to solve the problem that split type detection is low in efficiency and the like. The high-precision CCS electrical logging and AVI detection integrated equipment comprises a rack, a flying probe test module and an AOI detection module are arranged on the rack in parallel, and the flying probe test module is provided with a flying probe three-axis module driving the flying probe test module to do three-dimensional motion; the AOI detection module is provided with an AOI detection three-axis module for driving the AOI detection module to do three-dimensional motion; an upper-layer conveying track and a lower-layer conveying track are arranged below the rack, the upper-layer conveying track is used for bearing and conveying a line body carrier to a detection station, and the lower-layer conveying track is used for receiving and returning the detected line body carrier; and the upper-layer conveying track is provided with a connector plug-in module which is used for plug-in with a product female head on the wire body carrier. The mechanical alignment error between equipment is eliminated, only one-time positioning is needed, and the detection efficiency is improved.

The invention provides a flying probe testing machine loading and unloading scheduling prompting method and system, and relates to the technical field of industrial automation, and the method comprises the steps: collecting production data of a flying probe testing machine in real time, calculating dynamic decision parameters for triggering loading and unloading prompting, comparing the estimated residual test time with a personalized prompt threshold value, generating a corresponding feeding and discharging prompt instruction by combining the board card states of the feeding area and the receiving area, and controlling a prompt device arranged on the flying probe test machine to provide visual and auditory prompts for an operator according to the feeding and discharging prompt instruction; the prompting device comprises an equipment state indicating lamp, a test result indicating lamp, a board inlet indicating lamp group and a board outlet indicating lamp group. According to the invention, the test time of each plate type is dynamically predicted, and prompting is carried out based on the accurate remaining time, so that the standby time of equipment caused by waiting for feeding and discharging is shortened to the greatest extent.

The invention provides a jig mechanism for SIP product double-sided flying probe testing, which comprises a jig base, the jig base is provided with an annular outer wall, an installation space is defined by the outer wall, a lifting platform is arranged in the installation space, the inner side of the outer wall of the jig base is connected with the outer side of the lifting platform through a connecting assembly, the bottom of the jig base is provided with a bottom plate, and the bottom plate is connected with the lifting platform through a connecting assembly. The bottom plate is connected with the two opposite outer walls of the jig base and strides across the mounting space, a top bearing mounting plate opposite to the bottom plate is arranged above the jig base, a lead screw nut is arranged between the bottom plate and the top bearing mounting plate and comprises a lead screw and a nut, the top end of the lead screw is connected with a lifting platform height adjusting knob, and the top end of the lead screw is connected with a lifting platform height adjusting knob. The nut is connected with the upper surface of the lifting platform, a plurality of compression springs are arranged between the bottom plate and the lifting platform, and the lifting platform is adjusted to move up and down by operating the lifting platform height adjusting knob. According to the embodiment of the invention, the vertical position of the lifting platform can be continuously adjusted, and accurate positioning and quick and efficient clamping can be realized.

The present application belongs to the technical field of PCB flying probe detection equipment, and particularly relates to a flying probe compensation method and system based on PCB plate curved surface modeling, which comprises the following steps: obtaining the size of a PCB plate and performing equilateral triangle grid division; in the visual alignment process, a laser ranging sensor is synchronously driven to quickly and non-contactly measure the height of the grid vertex; based on the three-dimensional coordinates of the vertex, a triangular facet is fitted through a spatial plane equation and spliced into a three-dimensional curved surface model; the area formed by the adjacent facets in the model is subjected to bilinear interpolation to smooth the curved surface; finally, an interpolation function is selected according to the position of a test point to calculate the accurate height thereof, and a probe Z-axis displacement compensation value is generated. The present application realizes high-precision measurement and adaptive compensation of the PCB plate warping, takes into account the efficiency and precision of the flying probe test, and effectively solves the problems of poor probe contact or overpressure damage caused by plate warping.

This invention belongs to the technical field of PCB testing equipment, specifically involving an autonomous multi-segment contact control method for probes, flying probe testing equipment, and a medium. The method uses a driver to pre-store motion parameters, including the starting position Z1 of the fast segment, the starting position Z2 of the slow segment, the ending position Z3, and the speed and delay t for each segment. Responding to a start command triggered by a control word, the driver autonomously controls the probe to move rapidly from Z1 to Z2, and then slowly to Z3. The probe tip is equipped with a contact sensing element, whose feedback signal is connected to the driver's I / O port. When a signal change is detected, contact with the workpiece is determined, and the probe stops immediately. After stopping, a delay t is performed for the equipment to collect electrical signals to determine circuit continuity. After the delay ends, the probe quickly rises. This invention autonomously completes the entire probe insertion process through the driver, without real-time intervention from a host computer, improving testing efficiency and contact reliability.