57 results about "Flying probe" patented technology

The invention relates to the technical field of probe testing, in particular to a PCB flying probe test path optimization method based on electrical characteristics, which comprises the following steps: calculating accessibility scores of test points according to the distribution of board surface test points and elements to determine risk types of the test points; determining a risk area grade corresponding to the grid unit according to the accessibility score in combination with the potential shadow area; optimizing the test path of the probe according to the risk area grade corresponding to the grid unit, and adjusting the initial moving speed of the test path of the probe in different grid units; for the same moving time sequence of different probe groups, determining overlapped grids according to the initial probe angles and the test paths corresponding to the probes, and determining whether there is a collision risk between the probes in combination with the initial moving speeds of the probes in different grid units; and when a collision risk exists between the probes, corresponding adjustment measures are taken according to the number of the overlapped grids. According to the invention, the test path is optimized in combination with multi-dimensional design based on the electrical characteristics and testability of the board.

The invention relates to the technical field of flying probe testing, and discloses a probe deviation compensation method and device, electronic equipment and a storage medium, and the method comprises the steps: collecting the tip coordinates of a replaced probe corresponding to different angles after the probe of the flying probe testing is replaced; calculating an eccentric parameter of the probe based on the tip coordinate; calculating a target rotation angle of the probe based on the eccentricity parameter and the camera view center coordinate; calculating the total compensation displacement based on the camera view center coordinate, the tip center point coordinate and the target rotation angle; and controlling the probe based on the target rotation angle and the total compensation displacement amount. According to the method, after the probe is replaced, the target rotation angle and the total compensation displacement are respectively calculated by detecting the coordinates of the probe tip, and then the probe is compensated according to the target rotation angle and the total compensation displacement, so that manual adjustment is not needed, and the calibration efficiency of probe compensation and the precision of flying probe testing are improved.

The application discloses a test fixture for electrical performance of FCBGA single product, and belongs to the field of electrical performance test of FCBGA single product. The FCBGA single product is in a rectangular structure. The fixture substrate is fixedly installed on an external flying probe test machine. A plurality of rectangular test sites are arranged on the fixture substrate and used for placing the FCBGA single product. The size of the test site is greater than that of the largest specification of the rectangular FCBGA single product. An L-shaped reference block is fixedly arranged at a first reference corner of the test site, and an inner corner is arranged on the L-shaped reference block. The inner corner is designed to be matched with a first corner and two side edges of the FCBGA single product. A strip-shaped stopper is arranged at a second reference corner of the test site. The first reference corner and the second reference corner are two opposite reference corners of the test site diagonal line. The first corner of the FCBGA single product is abutted against the L-shaped reference block, and the strip-shaped stopper is abutted against the second corner of the FCBGA single product. The first corner and the second corner are two opposite corners of the FCBGA single product diagonal line. Based on the above structure, the efficiency and quality of the flying probe test link are improved, and the test work on different size products is met.

The invention relates to the field of circuit board detection, in particular to an automatic detection device for circuit board processing, which comprises a base, a flying probe detection mechanism and a visual sensor are fixedly mounted on the base, two symmetrically arranged telescopic support plates are fixedly mounted on the base, and an annular guide rail is arranged between the telescopic support plates on two sides. And two rotating rods are fixedly mounted on the side wall of the annular guide rail and are coaxially arranged. By arranging the linear guide rail and the annular guide rail, the limiting column and the pushing block can be flexibly adjusted according to circuit boards of different specifications. Meanwhile, the driving motor is matched to drive the rotating rod to rotate, so that the circuit board rotates, the flying probe can detect the complex circuit board by changing the angle direction of the circuit board, and meanwhile, the back face of the circuit board can be detected; and the detection efficiency of the circuit board is greatly improved while the application range of the detection device is ensured through mutual cooperative use of a limiting column and a pushing block.

The invention relates to the field of flying probe testing, and discloses a five-cycle reference-locked four-terminal low-resistance data processing method, which comprises the following steps of: 1, acquiring continuous five-frame initial data of a flying probe machine four-terminal test, restarting cycle if single-frame data exceeds a preset tolerance, and screening to obtain effective reference data; 2, carrying out abnormal value elimination on the effective reference data, calculating a data mean value, completing benchmark calibration, and generating a calibration reference value of a target test point; 3, based on the calibration reference value, establishing a mapping relation between the probe contact parameter of the flying probe machine and a test resistance value, and compensating a resistance value error caused by contact deviation; and step 4, adjusting test parameters such as probe pressure and staying duration of the flying probe machine according to a deviation compensation result, and outputting an optimized test scheme. The method has the following beneficial effects that the test precision is obviously improved, the robustness is strong, the cost is low, the method is easy to land, the consistency is good, and the production efficiency is improved.

The invention discloses an intelligent test system and an intelligent test method for a gas meter circuit board, and belongs to the technical field of intelligent test of circuit boards. The intelligent test system for the gas meter circuit board comprises an automatic optical detection module which is used for collecting a circuit board image, identifying element missing and polarity errors and outputting a preliminary screening result; the function test module comprises an ICT test unit and a flying probe test unit and is used for performing electrical function and performance test on the circuit board; the control and analysis module is connected with the automatic optical detection module and the function test module and used for controlling the test process and analyzing test data; the data storage module is used for storing test historical data and a fault mode database; according to the invention, the problems of low efficiency, high misjudgment and poor adaptation of a traditional test can be solved, full-process intelligent detection and accurate fault diagnosis are realized, and the test reliability and economical efficiency are improved.

The utility model relates to the technical field of semiconductor testing, and provides a probe assembly used for a flying probe testing machine and capable of identifying a needle point in the vertical direction, which comprises a main support, a cantilever support arranged on the main support, a probe arranged on the cantilever support, and a camera identification assembly arranged horizontally and used for identifying the position of the needle point of the probe in the vertical direction. The camera identification assembly comprises a mounting bracket arranged on the main bracket, an identification camera arranged on the mounting bracket, a lens matched with the identification camera and a prism matched with the lens; the camera identification assembly and the probe are always in a relative static state, the problem of interference and shielding of image acquisition does not exist, the needle point position of the probe in the vertical direction can be accurately and clearly identified through the camera identification assembly, so that debugging alignment operation is accurately carried out, the problem of mutual interference and influence does not exist among a plurality of structures, and the debugging precision is improved. Therefore, small bonding pad testing work can be carried out, and the application range of the flying probe testing machine is expanded.

This application relates to a horizontal flying probe inspection device, belonging to the field of flying probe inspection technology. It includes a loading mechanism, a first inspection mechanism, a flipping mechanism, a second inspection mechanism, and an unloading mechanism. The loading mechanism includes a frame, a transport cart, a loading platform, a robotic arm, a suction cup, and a transfer assembly, used to load PCB boards to be inspected and transfer them to the first inspection mechanism. The transfer assembly is mounted on the frame, and the loading platform slides on the transfer assembly to carry the PCB boards to be inspected. The transport cart is used to transport the loading platform to the transfer assembly. The first inspection mechanism is used to inspect the front side of the PCB boards transferred by the storage assembly. This application has the following advantages: it realizes automated PCB board inspection and double-sided inspection of PCB boards, improving inspection efficiency while reducing manual intervention, lowering labor intensity and labor costs, and improving machine utilization efficiency. Furthermore, the horizontal inspection design also enables the inspection of batches of PCB boards.

The invention relates to a test needle for measuring electrically conductive layers in holes of printed circuit boards, as well as to a test probe equipped with such a test needle and to a flying probe tester for testing printed circuit boards equipped with such a test needle or such a test probe.The test needle has a capacitive measuring body, which is connected via a cable to a capacitive measuring device. The cable is shielded so that only the capacitive measuring body can form a capacitive coupling with other electrically conductive bodies. This makes it possible to determine this capacitive coupling with a high local resolution.

The utility model belongs to the technical field of semiconductor testing, and particularly relates to a flying probe testing machine which comprises a probe assembly driven by a voice coil motor, a camera assembly coaxially arranged and a mechanical structure used for supporting and guiding. The voice coil motor directly drives the probe, so that rapid linear motion is realized, and the needle inserting precision and the response speed are improved. The coaxial design of the camera assembly ensures accurate synchronization of image acquisition and probe action, and the test accuracy is improved. The equipment structure is simplified, the occupied space is reduced, and the installation and maintenance cost is reduced. The method is suitable for high-efficiency and high-precision batch detection of electronic components, and has remarkable technical and economic benefits.

The invention relates to the technical field of flying probe equipment, and discloses a power-down probe protection device, which comprises a base; the moving assembly is installed on the base and comprises a guide rail and a sliding block, the guide rail is fixed to the base, the sliding block is in sliding fit with the guide rail in the first direction, and the moving assembly further comprises a motor suitable for driving the sliding block to move along the guide rail; one end of the arm is fixedly connected with the sliding block, and the other end is used for mounting a probe; and the control board card is used for receiving an equipment power-off signal and issuing a driving instruction after receiving the power-off signal, so that the sliding block moves towards the direction of the bulge by a preset distance, and the bulge is clamped into the clamping part. Through cooperative cooperation of the control board card, the moving assembly and the arm, a driving instruction can be rapidly triggered when the equipment is powered off, so that the sliding block drives the arm to move towards the protruding direction and achieve clamping, falling of the arm due to power failure is effectively prevented, damage of a probe and a tested product due to falling is avoided, and the risks of probe damage and product scrapping are reduced.

This invention discloses a double-sided flying probe testing and calibration method and a double-sided flying probe testing device. The method includes fixing and leveling a micro-pinhole array calibration plate, presetting the hole spacing and reference origin; moving the upper probe holder above the first hole, capturing the hole center image with a camera, obtaining pixel coordinates through sub-pixel edge detection and circle fitting, and fine-tuning to coincide with the optical axis to record the mechanical coordinates; the lower probe holder emits a transmitted light beam via an optical fiber, the upper camera captures the center of the light spot, and fine-tunes to coincide with the optical axis to record the coordinates; traversing each hole position according to the array, recording the mechanical coordinates of the upper and lower probe holders and calculating the relative offset; performing least-squares fitting between the offset sequence and the theoretical coordinate matrix to solve for translation, rotation, and scaling parameters, generating a global compensation mapping table; during testing, coordinate commands are output after compensation transformation to achieve precise double-sided alignment. The technical solution of this invention aims to eliminate the pose deviation introduced by the assembly and processing of the front and rear probe holders, and improve the collaborative alignment accuracy of the device.

The invention discloses a parallel grounding device and method for a flying probe test, and the device comprises an X-direction driver which is fixedly disposed in an inner cavity of a circuit board conveying track, and the outer end of a piston rod of the X-direction driver is fixedly connected with a probe translation pedestal. A probe translation base is fixedly connected to the upper end of the circuit board conveying track, a Z-direction driver is fixedly connected to the outer side of the probe translation base, a plurality of array type parallel concentrated grounding modules are fixedly connected to the upper end of a piston rod of the Z-direction driver, and the array type parallel concentrated grounding modules are horizontally arranged in the transverse direction of the circuit board conveying track. During the flying probe test, the test equipment control terminal controls the independent communication of the array type parallel concentrated grounding module, thereby realizing the parallel grounding of a single board and multiple jointed boards, reducing the time of independent switching grounding, improving the operation efficiency, realizing the parallel grounding function of the flying probe test, and greatly improving the test efficiency and stability.

The utility model relates to a kind of ceramic substrate with flying probe tester positioning tooling.It includes: test table, support sheet, clamping assembly and negative pressure component;Support sheet is equipped with detection area, and several detection holes are equipped in detection area;The clamping assembly is composed of fixed clamping plate, movable clamping plate and first cylinder, and movable clamping groove is equipped on movable clamping plate, and fixed clamping groove is equipped on fixed clamping plate;The negative pressure component is composed of negative pressure cavity, movable cover plate and second cylinder, and negative pressure cavity with the detection area one-to-one correspondence, movable cover plate or the test table is equipped with the air extraction connector that is communicated with negative pressure cavity.The clamping assembly provides vacuum adsorption effect in clamping process, ensure that ceramic substrate is closely adhered on support sheet, so that it can guarantee that ceramic substrate is still kept horizontal when being clamped and fixed, ensure that detection hole in detection area and the pad on the bottom surface of ceramic substrate one-to-one correspondence.

The utility model discloses a flying probe testing machine, which relates to the field of flying probe testing and comprises a support frame, an upper cross beam, a lower cross beam, a mounting plate, a flying probe testing mechanism and a workbench used for fixing a plate to be tested, the flying probe testing mechanism and the workbench are sequentially arranged along the horizontal direction, and the upper cross beam, the mounting plate and the lower cross beam are arranged along the gravity direction. The workbench is embedded in the center of the mounting plate, the upper end and the lower end of the flying probe testing mechanism are arranged on the upper cross beam and the lower cross beam respectively, the upper cross beam and the lower cross beam are arranged at the upper end and the lower end of the supporting frame respectively, and the mounting plate is parallel to the gravity direction and detachably arranged in the center of the supporting frame. The mounting plate is made of marble, and the cross beam and the supporting frame are high in strength and heavy in weight, so that shaking of the mounting plate in the inserting groove is reduced. When circuit boards of different specifications need to be tested, the original mounting plate is dismounted, the workbench and the testing mechanism are adjusted, and then the mounting plate is mounted back to the supporting frame, so that the time required for replacement can be shortened.

The invention provides a universal carrier device for a double-sided flying probe test, which comprises a carrier base, a supporting platform, a first adjusting mechanism, a second adjusting mechanism and a third adjusting mechanism, and is characterized in that the carrier base is of a rectangular frame structure; the supporting platform is arranged on the carrier base through the first adjusting mechanism and moves in the carrier base in the Z direction through the first adjusting mechanism. And through the second adjusting mechanism and the third adjusting mechanism, the to-be-tested product on the supporting platform can move along the X direction and the Y direction and can be positioned. The embodiment of the invention is compact in structure, does not affect the work of the probe head of the flying probe tester, is convenient to adjust and position, can achieve the simultaneous double-sided flying probe testing of a plurality of products, is high in universality, and is convenient to operate.

The invention relates to high-precision CCS electrical logging and AVI detection integrated equipment, relates to the technical field of CCS detection equipment, and aims to solve the problem that split type detection is low in efficiency and the like. The high-precision CCS electrical logging and AVI detection integrated equipment comprises a rack, a flying probe test module and an AOI detection module are arranged on the rack in parallel, and the flying probe test module is provided with a flying probe three-axis module driving the flying probe test module to do three-dimensional motion; the AOI detection module is provided with an AOI detection three-axis module for driving the AOI detection module to do three-dimensional motion; an upper-layer conveying track and a lower-layer conveying track are arranged below the rack, the upper-layer conveying track is used for bearing and conveying a line body carrier to a detection station, and the lower-layer conveying track is used for receiving and returning the detected line body carrier; and the upper-layer conveying track is provided with a connector plug-in module which is used for plug-in with a product female head on the wire body carrier. The mechanical alignment error between equipment is eliminated, only one-time positioning is needed, and the detection efficiency is improved.

The invention provides a flying probe testing machine loading and unloading scheduling prompting method and system, and relates to the technical field of industrial automation, and the method comprises the steps: collecting production data of a flying probe testing machine in real time, calculating dynamic decision parameters for triggering loading and unloading prompting, comparing the estimated residual test time with a personalized prompt threshold value, generating a corresponding feeding and discharging prompt instruction by combining the board card states of the feeding area and the receiving area, and controlling a prompt device arranged on the flying probe test machine to provide visual and auditory prompts for an operator according to the feeding and discharging prompt instruction; the prompting device comprises an equipment state indicating lamp, a test result indicating lamp, a board inlet indicating lamp group and a board outlet indicating lamp group. According to the invention, the test time of each plate type is dynamically predicted, and prompting is carried out based on the accurate remaining time, so that the standby time of equipment caused by waiting for feeding and discharging is shortened to the greatest extent.

The present application belongs to the technical field of PCB flying probe detection equipment, and particularly relates to a flying probe compensation method and system based on PCB plate curved surface modeling, which comprises the following steps: obtaining the size of a PCB plate and performing equilateral triangle grid division; in the visual alignment process, a laser ranging sensor is synchronously driven to quickly and non-contactly measure the height of the grid vertex; based on the three-dimensional coordinates of the vertex, a triangular facet is fitted through a spatial plane equation and spliced into a three-dimensional curved surface model; the area formed by the adjacent facets in the model is subjected to bilinear interpolation to smooth the curved surface; finally, an interpolation function is selected according to the position of a test point to calculate the accurate height thereof, and a probe Z-axis displacement compensation value is generated. The present application realizes high-precision measurement and adaptive compensation of the PCB plate warping, takes into account the efficiency and precision of the flying probe test, and effectively solves the problems of poor probe contact or overpressure damage caused by plate warping.

This invention belongs to the technical field of PCB testing equipment, specifically involving an autonomous multi-segment contact control method for probes, flying probe testing equipment, and a medium. The method uses a driver to pre-store motion parameters, including the starting position Z1 of the fast segment, the starting position Z2 of the slow segment, the ending position Z3, and the speed and delay t for each segment. Responding to a start command triggered by a control word, the driver autonomously controls the probe to move rapidly from Z1 to Z2, and then slowly to Z3. The probe tip is equipped with a contact sensing element, whose feedback signal is connected to the driver's I / O port. When a signal change is detected, contact with the workpiece is determined, and the probe stops immediately. After stopping, a delay t is performed for the equipment to collect electrical signals to determine circuit continuity. After the delay ends, the probe quickly rises. This invention autonomously completes the entire probe insertion process through the driver, without real-time intervention from a host computer, improving testing efficiency and contact reliability.

The invention discloses an efficient mark identification method for a flying probe. The method comprises the steps of establishing a jointed board partition model, designing a differentiated identification strategy for each area, implementing a dynamic identification process, calculating a final position coordinate, and performing characteristic analysis and a dynamic adjustment mechanism based on different areas of a jointed board. And the most representative and stable point is selected as a reference according to the characteristics of each region, so that the recognition accuracy is improved. A final position coordinate is calculated through a region weight fusion algorithm, a more accurate and reliable final position coordinate is obtained, and powerful support is provided for efficient operation of the flying probe. According to the method, the mark identification efficiency and accuracy of the flying probe can be remarkably improved, the production pause and the defective rate caused by mark identification errors are reduced, the equipment adaptability is remarkably enhanced, and the method can quickly adapt to jointed boards of different specifications.

The invention relates to a self-cleaning VI flying probe detection device for motor train unit board card maintenance, and relates to the technical field of motor train unit maintenance. The VI flying probe detection device solves the technical problems of probe pollution, poor contact stability and low operation efficiency of a VI flying probe detection device in the prior art. The device comprises a signal acquisition module, a main control unit and a directional cleaning execution system. According to the self-cleaning VI flying probe detection device for the maintenance of the motor train unit board card, the probe contact impedance obtained through real-time monitoring is analyzed by using the pollution feature recognition model; according to a historical database, pollution types (welding flux residues / dust attachment / oxide layers and the like) are judged, and key parameters (pollutant particle sizes, adhesion strength and the like) are identified according to pollution characteristics; a directional cleaning execution system is integrated on the VI probe equipment, and a corresponding cleaning mode is dynamically triggered, so that high-precision testing and self-cleaning of the VI probe equipment are realized.

The invention discloses a circuit board stabilizer for a flying probe tester, which belongs to the related technical field of circuit board testing and comprises a motion unit, a following unit and a top frame. The motion unit is fixed on the inner bottom wall of the flying probe tester. The pair of following units is arranged at the upper end of the moving unit, one following unit is arranged above the second linear mechanism, the other following unit is arranged on the transverse part of the n-shaped plate, each following unit comprises a pair of vertically-arranged third linear mechanisms, and a transverse plate is arranged at the sliding end of each third linear mechanism; a plurality of fifth linear mechanisms arranged in a rectangular array are arranged on one side of the output end of the fourth linear mechanism, one ends of the vacuum pipes are open, air exhaust holes are formed in the other ends of the vacuum pipes, and a plurality of hoses correspondingly connected to the air exhaust holes are arranged on one side of each vacuum mechanism. When the flying probe testing machine tests a thin circuit board, the flying probe testing machine can automatically move along with the testing head and stably support the circuit board on the reverse side of the circuit board at the testing position.

The invention discloses a flying probe parallel test method and system based on dynamic channel allocation. The flying probe parallel test method based on dynamic channel allocation comprises the following steps: analyzing a test program to dynamically group a plurality of test tasks into at least one parallel test task group; controlling a plurality of flying probes corresponding to the task group to move at the same time and contact a test point; synchronously switching a plurality of test instrument channels to the plurality of probes while the probes are in place; sending a synchronous trigger signal to the test instrument so as to execute measurement at the same time; according to the method, the measurement data is recovered in parallel and the plurality of probes are controlled to be lifted at the same time, and the traditional test mode is upgraded from N-time serial to N / M-time parallel, so that the total moving times of the probes and the frequent switching operation between instruments are greatly reduced in the test process, and the overall test efficiency is improved by several times.

The invention belongs to the technical field of flying probe testing of rigid-flex boards, and discloses a flying probe testing auxiliary device of a flying tail structure rigid-flex board and a manufacturing and testing method. The device comprises a top surface clamp plate and a bottom surface clamp plate, the top surface clamp plate and the bottom surface clamp plate form hinge style structures, and a to-be-tested R-FPCB is clamped between the hinge style structures; the R-FPCB to be tested comprises a bottom surface test point and a top surface test point, and a bottom surface punching area and a top surface punching area are respectively punched on the bottom surface test point and the top surface test point. According to the invention, conventional and simple materials of the circuit board are used; according to the flexible circuit board, conventional processing equipment of a circuit board is adopted, a simple test fixture is manufactured, and the problems that the flexible circuit board which needs to be subjected to shape punching firstly and then subjected to electric function test is not suitable for flying probe machine production, and a high-price special test fixture needs to be purchased are solved.

The utility model relates to a PCB insulation impedance flying probe test circuit, which is used for testing insulation impedance of a PCB tested unit and comprises an access circuit, an amplifying circuit and a measuring circuit, the access circuit comprises a power supply, an accompanying resistor and a grounding resistor, the tested unit and the accompanying resistor are connected in parallel to form a parallel circuit, a first end of the parallel circuit is connected with an output end of the power supply, and a second end of the parallel circuit is connected with an output end of the grounding resistor. The second end is connected with the amplifying circuit and is connected with the grounding resistor, and the output end of the amplifying circuit is connected with the measuring circuit. According to the utility model, the parallel accompanying test resistors are added in the access circuit, a parallel resistor working mode is adopted, and the tested unit and the known accompanying test resistor are connected in parallel, so that the channel test current is improved, the stability of test parameters is improved, the current output by the amplifying circuit is in a smaller interval range, and the accurate detection of the measuring circuit is facilitated.

The utility model discloses a resistance value detector for a thick film chip resistor, and relates to the technical field of detection equipment. The device comprises a moving mechanism, the moving mechanism comprises a moving assembly and an auxiliary assembly, the moving assembly comprises two adjusting boxes connected to the front side of a first supporting plate in a sliding mode, and two motors are fixedly connected to the sides, away from each other, of the two adjusting boxes. According to the utility model, the flying probe can be accurately moved to a corresponding position through the moving mechanism according to the coordinates of the chip pins, so that high-precision detection is realized, for some detected objects with irregular layout, independent movement of the flying probe can better adapt to the layout and accurately contact with each detection point, and the detection accuracy is improved. The situation that the flying probes cannot accurately reach detection points at certain special positions due to overall movement is avoided, the precision of detecting objects with complex layout is further improved, meanwhile, the two flying probes can start detection from different areas respectively, the detection time is saved, and the efficiency is improved.

The utility model discloses a PCB flying probe impedance test tool, which comprises a workbench, a camera assembly located above the workbench and a test arm arranged on the workbench, and an alignment platform located on the workbench and used for placing a PCB is arranged below the camera assembly; the test arm is connected with the workbench through an electric linear displacement table, the test arm comprises a test support fixed on the electric linear displacement table, a Z-axis translation sliding table for fixing the test support and an R-axis rotation sliding table connected to the Z-axis translation sliding table, and the bottom of the R-axis rotation sliding table is connected with a probe assembly; the position of the probe assembly relative to the PCB placed on the alignment platform is adjusted through the electric linear displacement table, the Z-axis translation sliding table and the R-axis rotation sliding table, so that impedance testing of the PCB is completed, the tool can meet the testing requirement of the complex or high-density PCB, and a specific clamp is not needed.

The invention discloses a flying probe machine for PCB testing and a testing process thereof, and belongs to the technical field of flying probe machine equipment.The flying probe machine comprises an X-axis moving testing platform, two symmetrically-arranged Y-axis moving mechanisms are slidably connected to the upper side wall of the X-axis moving testing platform, each Y-axis moving mechanism comprises two supporting tables, a lead screw is rotatably connected between the two supporting tables, and the lead screw is connected with the X-axis moving testing platform. A lead screw is arranged on the support table, a moving block is in threaded connection with the lead screw, a Z-axis moving mechanism is fixedly connected to the moving block, a fixed plate is fixedly connected between the two support tables, the moving block is slidably connected to the fixed plate, and a first motor is fixedly connected to the side wall of each support table. According to the technical scheme, the Z-axis moving mechanism and the turnover mechanism are matched to drive the replacement mechanism to turn over so as to detect the detection plate, and whether the current probe is in a normal state or not is judged according to detection of the detection plate, so that the detection accuracy is effectively improved, the phenomenon of misjudgment is reduced, and the processing efficiency of workers is improved.