Flying probe tester utilizing planar motor

A flying probe testing machine and plane motor technology, applied in the field of flying probe testing machines, can solve problems such as unreasonable structure and inability to meet test accuracy, and achieve the effects of simple structure, high test speed, and reasonable and reliable structure design.

Active Publication Date: 2016-02-24
ZHONGBEI UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In order to solve the problem that the existing flying probe testing machine cannot meet the test accuracy due to unreasonable structure, the present invention provides a flying probe testing machine using a planar motor

Method used

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  • Flying probe tester utilizing planar motor
  • Flying probe tester utilizing planar motor
  • Flying probe tester utilizing planar motor

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Embodiment Construction

[0016] A flying probe testing machine using a planar motor includes a frame 1, which is provided with a planar motor stator 2 distributed up and down, a probe loading device 3, a circuit board positioning fixture 4 and a lifting platform 5, and the lifting platform 5 is provided with The fixed probe 6 in contact with the lower surface of the circuit board, the probe loading device 3 includes a mover body 7 sliding on the surface of the plane motor stator 2, the mover body 7 surface is provided with a mover base plate 8, and the mover base plate 8 is fixed with a The support 9 that is arranged obliquely, a side of support 9 is fixed with linear motor 10, and the other side of support 9 is provided with driving wheel 11 and driven wheel 12, and driving wheel 11 is connected with the output shaft of linear motor 10, and driving wheel 11 is connected with A transmission belt 13 is provided between the driven wheels 12, a slide block 14 is provided on the transmission belt 13, an in...

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PUM

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Abstract

The invention specifically relates to a flying probe tester utilizing a planar motor and solves the problem of an existing flying probe tester that the testing precision cannot be satisfied due to an unreasonable structure. A machine frame is internally provided with a planar motor stator, a probe loading device, a circuit board positioning clamp and a lifting platform. The lifting platform is provided with a fixed probe. The probe loading device comprises a rotor body. The rotor body is provided with a support. A linear motor and a transmission belt are fixed at two sides of the support. The transmission belt is provided with an insulating block. A probe assembly is arranged on the lower end of the insulating block. The probe assembly comprises a sleeve. A probe penetrates through the sleeve. A buffering spring, in contact with the insulating block, sleeves the tail end of the probe. The probe is composed of a probe body and a probe sleeve, and a probe buffering spring is arranged between the probe sleeve and the probe body. According to the invention, the planar motor is adopted for realizing specific angle loading, an elastic contact circuit board, a programmable-control loading pressure, good conductivity, voltage resistance and insulation.

Description

technical field [0001] The invention relates to a circuit board testing device, in particular to a flying probe testing machine using a planar motor. Background technique [0002] The flying probe testing machine is installed on the X-axis and Y-axis with motor-driven probes that can move independently and quickly, and uses the controllable movement of the probes in the Z-axis direction to contact the solder joints of the PCB board and perform electrical measurements. equipment. Due to the functional requirements of the flying probe testing machine, the two ends of the Y-axis are generally erected on two X-axes respectively, and the span is relatively large, driven by two motors on the X-axis (dual drive) or by a single X-axis Motor drive (single drive). In order to improve testing efficiency, flying probe testing machines generally have multiple probes, and the number of X-Y axes increases accordingly. It is because the number of axes of the flying probe testing machine ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28
CPCG01R31/2818
Inventor 刘新妹殷俊龄侯文赵敏李晓飞陈云郭栋梁富强郭鑫姜伟王威舒
Owner ZHONGBEI UNIV
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