Resistor-capacitor measurement module applied to flying probe tests

Abstract

The invention belongs to the technical field of flying probe tests, and particularly discloses a resistor-capacitor measurement module applied to the flying probe tests. The resistor-capacitor measurement module comprises a resistor test module, a capacitor test module and a control processing module. The resistor test module is used for testing a resistor value between same networks on a test substrate, and the capacitor test module is used for testing a capacitor value between different electric networks to the earth on the test substrate. The control processing module is respectively connected with the resistor test module and the capacitor test module, and is used for generating sine waves. The frequency and amplitude of the sine waves both are controllable, and the control processing module is used for controlling switching and electing between functions of the resistor test and the capacitor test, testing gear selection and probe assembly selection, receiving test data of the resistor test module and the capacitor test module for processing, and outputting test result data. The resistor-capacitor measurement module can be imbedded in a flying probe test device main system, realizes automatic probe selection test through software control, is quick in gear selection, accurate in test, and has the advantages of being high in test speed, and short in response time. The test accuracy can meet the technological requirements of the flying probe test.

Description

technical field [0001] The invention relates to the technical field of flying probe testing, in particular to a resistance-capacitance module for flying probe testing. Background technique [0002] Flying probe test equipment is the key equipment for semiconductor post-packaging. Its working mechanism is: the resistance and capacitance measurement module used for flying probe test generates GERBER process files according to the schematic diagram of the circuit substrate, converts the GERBER files into test files, and then performs automatic testing , and the test module is the execution component of the automated test. [0003] Substrate faults are generally formed during the manufacturing process. The most common faults are: short circuits between different network conductors and open circuits in the same network conductors. Flying probe testing has become the latest solution to some major problems in electrical testing. The equipment can be used for both bare board testin...

AI Technical Summary

Problems solved by technology

[0005] The purpose of the present invention is to provide a resistance and capacitance measurement module for flying probe testing, which aims to solve the problem that

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