170results about How to "Guaranteed test efficiency" patented technology

The invention discloses a white car body static stiffness restriction device of a passenger car and a static stiffness detection method. The device is characterized in that: one side of a front bearing support is provided with a pressure transducer and a hydraulic jack, a plurality of displacement sensors are arranged at the periphery of the white car body bottom surface; the front bearing support comprises a front rack, a T-shaped rack, and a I-shaped guide rail, wherein, the end portion of the front rack is connected with the very center of a crossbeam of the T-shaped rack through bolts and nuts, the crossbeam of the T-shaped rack is arranged at the left and right side of the white car body, and the lower side of the crossbeam is provided with the hydraulic jack; the bottom of the T-shaped rack is connected with the bottom of the front rack through a pin roll and a split pin; the upper surface of the crossbeam of the T-shaped rack is symmetrically provided with I-shaped guide rails; a torque value of the applied load is divided by a twisting angle to calculate a twisting stiffness, and the actual value of the load is divided by a car body deformation displacement to obtain a bending stiffness. According to the invention, the efficiency of various vehicle tests is increased, and the device cost is obviously reduced on the premise that the test accuracy is guaranteed.

The invention belongs to the technical field of testing and relates to a performance degradation testing method of an insulated gate bipolar transistor. According to the method, the insulated gate bipolar transistor is taken as an object, a programmable pulse generator, a programmable electronic switch, a programmable digital universal meter, a power resistor, a working resistor and a direct current power supply are utilized, and offset values of conduction saturation voltage of the insulated gate bipolar transistor along with the impact number of times of short-circuit current under different short-circuit current values can be obtained through short-circuit current impact and further used as performance degradation data of the insulated gate bipolar transistor. According to the method, the accurate performance degradation data of the insulated gate bipolar transistor caused by short-circuit current can be obtained within a short period of time, and the data can be utilized for accurately predicting the failure time of the insulated gate bipolar transistor in the using process so as to take measures in time before the failure of the insulated gate bipolar transistor, prevent serious faults caused by the failure of the insulated gate bipolar transistor and further reduce the economic loss.

The invention provides a high-density printed circuit board (PCB) test machine comprising a material platform, PCB clamping sampling mechanisms, an automatic material feeding and discharging device, a test clamp and a central controller. Due to the combination of the operation of the automatic material feeding and discharging device and the control of the alignment of the PCB clamping sampling mechanisms and the test clamp, the PCB can be tested automatically, and the PCB test capacity, precision and efficiency of the high-density PCB test machine can be greatly improved. The invention also provides a high-density PCB test method based on the high-density PCB test machine. Due to the unified material loading and the combination of the two PCB clamping sampling mechanisms, the two PCB clamping sampling mechanisms can collect the images of the PCBs thereon at the same time and feed back the collected images of the PCBS to the central controller to test the alignment of the two PCB clamping sampling mechanisms and the test clamp. Due to the timely material unloading and the material reloading after the test of two PCB clamping sampling mechanisms and the test clamp, the standby time of the test clamp is shorted to the maximum extent, the whole test process is standardized, and the test efficiency is ensured.

The invention relates to a testing method of PCBs, in particular to a computing method of the probe lifting heights of test probes of a flying-probe tester. Each probe independently and rapidly moves under driving of a motor installed on the X-Y axis and makes contact with a corresponding welding point on a PCB to be tested under driving of a stepping motor in the Z direction for necessary electrical measurement. The computing method comprises the following steps that height differences and coordinate differences among the four probes are obtained; a relation curve between a PCB testing area and the number of drive pulses generated when each probe is fed from the zero position until the probe makes contact with the PCB is obtained; the number of drive pulses of each measurement point is worked out by utilization of the obtained relation curves; the number of drive pulses corresponding to the probe lifting height of each probe is worked out according to the set probe lifting height. The computing method can reduce the board scraping probability of the probes in the testing process under the condition of ensuring the testing efficiency.

The invention discloses a test and calculation method for determining a true stress-strain curve of a material, which specifically relates to a uniaxial tensile material DIC test and data output, calculation and drawing of the true stress-strain curve, and acquisition of a whole-course true stress-strain curve and local elongation. According to the invention, a detailed technical process is formulated for the uniaxial tensile test, a clear technical requirement that the number of grids arranged in the width direction of the test piece is twice of the width is provided, an integer scale distance of 1.0 mm is ensured to be taken in the physical sense, the technical target of obtaining the whole-course true stress-strain curve and the local elongation of the material is achieved, cognitive obstacles, technical obstacles and effect obstacles in actual engineering application are swept away, and a road is laid for large-scale engineering application of the material, so that the method has important theoretical and engineering practice significance.

The invention provides a test method of an SGPIO (Serial General Purpose Input/Output) signal on an SAS (Serial Attached Small Computer System Interface) backboard. The method comprises the following steps of: accessing an MINI SAS cable in the SAS backboard and a test system; and then carrying out controlling test through a visualized unit. The SAS backboard structurally comprises a data generating and processing unit simulating an SGPIO signal, the visualized unit and an MINI SAS interface. Compared with the prior art, the test method of the SGPIO signal on the SAS backboard has the advantages of reasonable design, simple structure, convenient use, easy maintenance, and the like, greatly simplifies the test flow under the conditions that server and hard disk resources are not occupied, avoids repeatedly plugging a hard disk and repeatedly booting up or shutting down a server in a traditional test mode and realizes the graphic interface of the SGPIO signal test flow.

The present invention relates to a system and method of probe grinding and probe cleaning for testing probe oxidation. The system comprises: a probe test unit comprising a probe card and a protruded probe arranged in the probe card; an imaging analysis unit comprising a plurality of imaging devices arranged on the substrate of the probe card, wherein the imaging device is aligned to the tip of the probe and is configured to perform imaging of the probe and perform analysis of the gray level of the probe; a probe grinding and probe cleaning unit comprising a probe grinding device and a plurality of gas cleaning devices, wherein the gas cleaning devices directly face the probe and are configured spray gas to remove foreign materials on the probe; and a control unit communicated with the imaging analysis unit and the probe grinding and probe cleaning unit and configured to control the imaging analysis unit to perform probe imaging and perform gray scale analysis, control the probe grinding device to perform probe grinding process and control the switching of the gas in the gas cleaning devices. The test efficiency is ensured, and the service life of the probe card is prolonged.

The invention provides a memory testing method for reducing a cache hit rate. The method comprises: dividing a to-be-tested memory into a plurality of memory sections of preset sizes; dividing a preset memory testing algorithm into a plurality of testing steps; and performing the testing steps on the memory sections in sequence, wherein one testing step is performed on another memory section between any two continuous testing steps performed on each memory section. According to the method, the testing steps are performed on different memory sections in sequence, so that a cache cannot continuously form effective concerned sections, the cache is always in a shake state, the cache hit rate is reduced, and the validity of memory testing is improved; and further, execution time and cache hit of an execution process of the memory testing algorithm are subjected to monitoring and statistics, and testing step division of the memory testing algorithm is optimized according to a statistic result, so that the efficiency and validity of memory testing are both considered and the memory testing method is optimized.

The present invention discloses a passenger car control shaft assembly gear selection and shift performance test testbed. The testbed comprises a test fixing mechanism for fixing a control shaft assembly, a servo drive mechanism for driving the control shaft assembly to move vertically and rotatably to test the gear selection and shift performance and a servo control mechanism for controlling the servo drive mechanism to move, and also comprises a liquid crystal display cabinet electrically connected with the servo control mechanism and used for the data real-time output. The test testbed has a gear selection and shift transmission mechanism of high response and high reliability, totally satisfies the combined gear shift test of any gear, and can test a gear selection force, a gear shift force, a gear selection stroke and a gear shift angle during a control shaft assembly gear selection and shift process, so that the passenger car control shaft assembly gear selection and shift performance test testbed is compact in structure and high in automation degree, and can detect the production quality of the control shaft assembly products efficiently and at a high precision.

The invention discloses an MOCK test method and device and equipment, relates to the technical field of tests, and can perform end-to-end test acceptance when a platform application tests an application scene of an external application, thereby ensuring the test efficiency of a platform application project. The method comprises: sending a test request for a tested application, wherein the test request carries request attribute information of a target login user, and different login users respectively and correspondingly test one application scene of the tested application; receiving an MOCK object matched according to the request attribute information; and according to the MOCK object, realizing a link MOCK test of a target application scene tested corresponding to the target login user. The method, device and equipment are suitable for MOCK testing.

The invention discloses a spindle axial static rigidity test method and control system. The spindle axial static rigidity test control system is mainly composed of a data acquisition and processing system, a movement control system, a loading and unloading performance unit and a human-computer interaction interface. The data acquisition system comprises a pressure sensor, an eddy current displacement sensor, an NI data acquisition card and a computer. The movement control system comprises an NI movement control card, a server driver and a servo motor. The loading and unloading performance unit comprises a locking rod sleeve ring and a locking rod. The locking rod is connected with the locking rod sleeve ring through a thread pair. The computer is provided with data acquisition and processing programs and movement control programs complied based on LabVIEW and the human-computer interaction interface so as to realize data acquisition, operation, analysis, processing, display and storage and control of the loading and unloading performance unit. The spindle axial static rigidity test control system is suitable for static rigidity testing of various types of vertical and horizontal numerical control machine tool spindle units so that universality is great and efficiency is high.

The invention provides a wafer testing system and a testing method thereof. The wafer testing system comprises a testing instrument, a first relay module, a single-chip microcomputer, a second relay module and a third relay module, wherein the testing instrument is used for performing a first test on a wafer, the first relay module is connected between the testing instrument and the wafer and used for receiving a first on-off signal output by the testing instrument, the single-chip microcomputer receives a starting signal of the testing instrument and performs a second test on the wafer through an encryption algorithm, the second relay module is connected between the single-chip microcomputer and the wafer and used for receiving a second on-off signal output by the testing instrument, and the third relay module is connected between the testing instrument and the single-chip microcomputer and receives a third on-off signal output by the testing instrument. The wafer testing system has the advantages that the testing instrument and the single-chip microcomputer are used to perform different tests on the wafer respectively, switching can be performed by the relay modules, and testing efficiency can be increased greatly.

The invention discloses a railway wagon brake beam fatigue test bench guide sleeve clearance elimination device, which is used for eliminating clearance between the guide sleeve and a test bench baffle in the railway wagon brake beam fatigue test. The device comprises a first adjusting device and a second adjusting device which are used in a pair, wherein each of the first adjusting device and the second adjusting device comprises a pressing plate, an inner adjusting shaft and a lower adjusting block; the lower adjusting block is arranged on the inner adjusting shaft, and the two are in threaded connection; a shaft groove is arranged in the pressing plate, and the inner adjusting shaft passes through the shaft groove; and one surface, facing the guide sleeve, of the lower adjusting block is an oblique surface, and the oblique surface is fit with the outer wall of the guide sleeve. After the clearance between the baffle and the guide sleeve is eliminated, the brake beam can be prevented from being unreasonably impacted during a loading process, accuracy of a test result is ensured, and reduction of the test loading frequency can be avoided. After the clearance is eliminated, loading in the test is ensured to be carried out at a set frequency, and the test efficiency is ensured; and the tested brake beam can be ensured to be always at the correct test position, and accuracy of the test result is thus ensured.

The invention relates to the technical field of integrated circuit production and processing, and discloses semiconductor integrated circuit test equipment. The semiconductor integrated circuit test equipment comprises a workbench, wherein a test board is fixedly installed at the center of the top part of the workbench, a probe board is arranged at the top part of the test board, a lifting mechanism is arranged at the top part of the workbench, and the lifting mechanism comprises a lifting table. According to the semiconductor integrated circuit test equipment, a rotating ring rotates in one direction on the outer wall of the lifting table, so that a positioning frame is driven by four groups of moving rods and four groups of linkage rods to continuously reciprocate up and down in a hollow part in the middle of the lifting table, the positioning frame drives a circuit board limited in a cavity of the positioning frame to reciprocate up and down, when the positioning frame moves to the lowest part of the lifting platform, the circuit board is in extrusion contact with a probe on the top part of the probe plate, and the circuit board is accurately butted with the probe on the probe plate up and down. The positioning test efficiency of a semiconductor integrated circuit board is improved.

The invention provides an instrument autonomous alignment device in a starlight simulation test and an alignment method. According to the instrument autonomous alignment device and the alignment method, the alignment function can be completed autonomously before a simulation test, and human participation is not needed; the alignment process is controlled by means of a starlight simulation computer, and a three-dimensional turntable and a star sensor fixing tool can adapt to tested equipment in a large size range, so that the influence on the tested equipment is small; the instrument autonomousalignment device and the alignment method can ensure that the attitude information output by the star sensor and the attitude information of a starlight simulator are kept consistent in the testing process, so that the testing precision and the testing efficiency are ensured.

The invention discloses a sealing device for an explosion-proof valve of an airtightness test of a lithium battery box. The sealing device comprises a box body plate, an explosion-proof valve fixed at the upper part of the box body plate and a sealing unit arranged above the explosion-proof valve. The sealing unit includes a support base, a fixed plate fixed at the upper part of the support base and a pressing plate moving up and down at one side of the fixed plate. The sealing device is mounted or dismounted rapidly and conveniently. With the pressing plate, a compression unit, and a moving unit, rapid sealing of the explosion-proof valve is realized and the sealing effect is good; the pressure withstanding capability and the test efficiency during testing are improved; and the testing precision is guaranteed. With an elastic component, dismounting becomes convenient, so that the labor intensity is reduced, the operation becomes convenient, and the time and force are saved. Moreover, the structure is simple and the manufacturing cost is low; the sealing device can be used repeatedly by multiple times, so that the usage cost is lowered. The sealing device can be widely applied.

The invention discloses a test probe cleaning method and friction scraping, viscous adsorption and probe fixing methods, relates to the technical field of semiconductors, and aims to solve the problems of how to effectively replace manual cleaning and how to thoroughly clean a probe in the prior art. A test probe cleaning device comprises a cleaning component, a clamping component, a test socket,a test base and a test probe. The clamping component is arranged above the cleaning component, a test socket is arranged below the cleaning component, the test socket is installed on the test base, and the clamping component can move and control the cleaning component above the test socket through a transmission mechanical arm so that the cleaning component can move into the test socket, and is abutted against the probe head of the test probe in the test socket. The problems of how to effectively replace manual cleaning and how to thoroughly clean the probe in the prior art are solved, so thatmanual cleaning is effectively replaced, and meanwhile, the cleaning quality and the testing efficiency are ensured.

The invention relates to a coal pillar stability distributed monitoring system and method. The system comprises a strain data acquisition system used for monitoring coal pillar stress, a data transmission system used for data transmission, a data parsing system used for signal parsing, a data analysis system used for analysis expression and an early warning system used for early warning decision making. According to the invention, a distributed optical fiber sensing device is implanted into a coal pillar; the stress condition of the coal pillar in the recovery process and the stability condition of the coal pillar under influence of mining are sensed; distributed monitoring is carried out in a drilling length range; a real-time result can be formed after data acquisition is completed; thestability of the coal pillar is efficiently and visually analyzed and evaluated, the method can adapt to analysis of internal force characteristics and stability states of different types of underground coal pillars, the interference depth of the protected coal pillar under the mining influence is given, scientific technical guidance is provided for coal pillar reservation parameter optimization,and the problem that coal pillar reservation mainly depends on experience is solved.

The invention is suitable for the technical field of test and provides a low-impedance contact conductive test electrode. A sleeve provided with an accommodation cavity is sleeved on a pin rod of a probe, a first spring is abutted between the side wall of the pin rod of the probe and the side wall of the accommodation cavity of the sleeve, a second spring is abutted between the tail end of the probe and the closed end of the accommodation cavity, and the pin rod of the probe is provided with an anti-drop device to prevent the probe from dropping from the sleeve, so that when the probe makes contact with and is pressed by an electrical element under test, the probe and the sleeve can be still in good electric connection even if the axial deviation and angle deviation occur, discharge capacity of the electrical signal is ensured, and test effect and test efficiency are guaranteed.

The invention provides an automatic test method and system, and the automatic test method comprises the following steps: S1, operating a test program, selecting a root node value of a to-be-checked node tree on a pop-up interface, clicking to start a test, and enabling the test program to monitor a TCP connection request transmitted by a tested household intelligent gateway; S2, the test program automatically responding to TCP connection actively initiated by the tested home intelligent gateway and performs HTTP service initial message interaction; S3; S4; S5; S6; S7; S8. The method has the beneficial effects that 1, a program automatically completes TCP and HTTP interaction, so that the test efficiency is ensured, and the test manpower is reduced; 2, the program effectively saves the testtime, and reduces the missed test caused by the negligence of a tester;

The invention discloses a satellite load data simulation source testing method and device. The method comprises the steps of: receiving a testing instruction, and generating and transmitting a pseudo-random data simulation source; receiving the pseudo-random data simulation source, generating a comparison template in real time, comparing the comparison template with filling data in real time, andjudging whether the filling data has an error code or not; verifying the frame header information and the data filling, generating a comparison template for verification filling, comparing the comparison template for verification filling with the verification filling in the pseudo-random data simulation source, and judging whether the whole data frame has an error code or not; and caching the frame header information of a plurality of channels for the condition that the frame header information part has an error code or may have an error code, performing grouping sorting on the frame header information according to the virtual channel identifier, judging whether the frame header information part has an error code or not again, determining an error code position, and obtaining error code related information. According to the invention, real-time online interpretation of data can be realized, not only are storage resources of a test system saved, but also the test efficiency of a solid-state memory is improved.

The invention discloses a chip testing device and a chip testing method. According to the embodiment of the invention, the chip testing device comprises a testing unit which is used for providing a testing signal for a chip and obtaining a feedback signal fed back by the chip; a probe card, used for electrically connecting the test unit and the chip, and the probe card being used for transmitting a test signal and a feedback signal; and a decoupling unit, electrically connected with the test unit, the feedback signal comprising a normal feedback signal fed back by a normal chip and an abnormal feedback signal fed back by a failure chip, and when the probe card is electrically connected with the chip, the decoupling unit filtering the abnormal feedback signal. According to the chip testing device and the chip testing method provided by the embodiment of the invention, the decoupling unit for filtering the abnormal feedback signal is arranged, so that the abnormal feedback signal and a normal feedback signal can be prevented from generating a coupling effect, and a condition that a qualified chip is judged as a failure chip during testing is prevented.