312results about "Digital variable display" patented technology

A system includes an input to receive a digital waveform signal, a memory, and one or more processors configured to execute code to cause the one or more processors to: generate a horizontal ramp sweep signal based on the digital waveform signal; receive a selection input to identify a segment of the digital waveform signal; gate the horizontal ramp sweep signal and the digital waveform signal based on the selection input to produce cyclic loop image data for the segment of the digital waveform; store the cyclic loop image data in the memory; and provide the cyclic loop image data as one or more inputs into a machine learning system. A method of waveform classification using a cyclic loop image includes receiving an input waveform, receiving a selection of a segment of the input waveform, transforming the segment of the input waveform into cyclic loop image data, the transforming comprising generating a horizontal ramp sweep signal based on edge transitions in the input waveform, and storing the cyclic loop image data in a memory; and sending the cyclic loop image data to a machine learning system to determine an attribute of the input waveform.

A signal processing method for selectively removing noise from a digital input signal is provided. The method includes the steps of, for example, receiving, by a signal input, a digital input signal of a device under test, determining, by an analysis circuit, a DUT noise contribution to noise of the digital input signal, wherein the DUT noise contribution is associated with noise originating from the device under test, reducing, by the analysis circuit, a noise level of the digital input signal to a noise level of the DUT noise contribution determined, thereby obtaining a noise-reduced output signal, and providing the noise-reduced output signal to a measurement application for further processing. A signal processing system for carrying out the method or others is also provided.

A multi-channel analog-digital converter (ADC) subsystem for test device such as a spectrum analyzer may include multiple multi-channel ADCs to receive down-converted signals and convert the received signals to digital output signals, a field programmable gate array (FPGA) to select one or more ADCs based on a frequency, a bandwidth, and / or a signal type of each received signal and a characteristic of each ADC, and an ADC sample clock to provide a clock signal to the selected ADCs. Characteristics of the ADCs may include a resolution, a signal-to-noise-and-distortion ratio (SINAD), an effective number of bits (ENOB), a signal-to-noise ratio (SNR), a total harmonic distortion (THD), a total harmonic distortion plus noise (THD+N), and / or a spurious free dynamic range (SFDR).

The invention discloses a signal measurement method of an oscilloscope, the oscilloscope and a storage medium, and belongs to the technical field of oscilloscopes. The method comprises the following steps: controlling to display a measurement group interface, wherein the measurement group interface comprises a target measurement group; in response to a first operation on the target measurement group, controlling to display a measurement type interface, and determining at least two target measurement types based on the measurement type interface so as to update the measurement types in the target measurement group into the at least two target measurement types; and / or, in response to a second operation on the target measurement group, controlling to display the information source interface, determining at least one target information source based on the information source interface, and updating the information source in the target measurement group to the at least one target information source; and updating and applying the current measurement type in the target measurement group to the current information source in the target measurement group to obtain an updated target measurement group, and measuring the signal according to the updated target measurement group. Through the measurement group mode, the operation process can be reduced, and the measurement efficiency can be improved.

A test and measurement instrument includes one or more ports to receive a signal from a device under test (DUT), an array of analog to digital converters (ADC) to receive the signal, a data collector to output one sample from each ADCs during one ADC clock cycle, and one or more processors to provide a sample clock to each ADC having a different clock phase from other ADCs to cause non-uniform sample spacing at or below a Nyquist frequency, and to cause the ADCs to output samples with non-uniform spacing. A method includes receiving a signal from a device under test, providing a sample clock to each ADC in an array of ADCs having a different clock phase from clock phases provided to other ADCs causing non-uniform sample spacing at or below a Nyquist frequency, sampling the signal with a non-uniform sample clock, and outputting the samples with non-uniform spacing.

A test and measurement device has an input port to receive a signal from a device under test (DUT), the signal having a symbol rate, one or more analog-to-digital converters (ADC) to convert the signal to waveform samples at a sampling rate, and one or more processors, when aliasing is present: up-sample a portion of the signal having aliased samples to produce up-sampled samples; use the up-sampled samples to produce a real-time waveform; perform clock recovery on the real-time waveform to produce a recovered clock; and resample the aliased samples to produce a non-aliased waveform.

The invention provides an automatic waveform identification method for an intelligent oscilloscope, and relates to the technical field of signal processing, and the method comprises the steps: carrying out the time sequence compression processing and cross-scale frequency band aggregation operation of a waveform signal of the intelligent oscilloscope, and obtaining a time sequence compression sequence and multi-resolution frequency spectrum information of the waveform signal; time sequence energy characteristics and complex domain characteristics are determined through the time sequence compression sequence and the multi-resolution frequency spectrum information, spatial-temporal characteristic interaction is carried out on the time sequence energy characteristics and the complex domain characteristics based on a multi-head self-attention mechanism and a bidirectional long-short-term memory network, and a spatial-temporal characteristic weight matrix is obtained; constructing a teacher network and a student network according to the waveform signals, and determining waveform alignment features through the spatial-temporal feature weight matrix, the teacher network and the student network; and finally, the intelligent oscilloscope outputs a waveform recognition result based on the waveform alignment feature, and multi-scale waveform feature extraction and attention enhancement recognition of the waveform signal can be realized, so that the recognition accuracy of the intelligent oscilloscope is improved.

A power system may receive power signals for one or more monitored devices, where a respective power signal includes at least one of a current or a voltage; perform discrete wavelet transforms (DWTs) of the power signals to generate DWT coefficients associated with the power signals; classify the power signals within two or more classes based on the DWT coefficients, where the two or more classes include one or more normal classes associated with one or more acceptable operational conditions and one or more atypical classes associated with one or more atypical operational conditions; and generate one or more alert signals based on the classified power signals when one or more alert conditions are met.

The invention provides a frequency converter embedded current waveform analysis method and system and a medium, and relates to the technical field of current waveform analysis, and the method comprises the steps: obtaining a sampling circuit configured in a current path of a frequency converter; calculating the required total gain based on the original output voltage signal of the sampling resistor and the required input voltage of the analog-to-digital converter; the signal quality of the original output voltage signal is evaluated, the required total gain is dynamically distributed to an instrument amplifier and a programmable gain amplifier, the original output voltage signal is amplified and then passes through an analog-to-digital converter, and current waveform data is obtained for current anomaly analysis; when the signal quality is lower than a first threshold value, the gain share of the instrument amplifier is increased preferentially; when the signal quality is higher than a second threshold, the gain share of the programmable gain amplifier is increased preferentially. According to the invention, the technical problem of low accuracy of current waveform analysis in the prior art can be solved, and the technical effect of improving the accuracy of waveform analysis is achieved.

The invention discloses a method and a system for displaying a test waveform of ATE (automatic test equipment), and belongs to the technical field of automatic test, and the method comprises the following steps: receiving a waveform display request sent by an upper computer, the waveform display request comprising a trigger condition for triggering a logic controller to store waveform digital information; triggering conditions in the waveform conversion request are set to a register address corresponding to the logic controller, a pattern program is executed, test data are sent to a tested device, and return data of the tested device are received; after the pattern program is executed, the waveform digital information is obtained from a register address corresponding to the logic controller, and the waveform digital information is all test data and return data which are started to be stored by the logic controller after a trigger condition is met; and analyzing and converting the waveform digital information, and forwarding the waveform digital information to an upper computer for waveform analog signal display. According to the application, a section of waveform at any time node is captured in real time, the time sequence problem of a pattern program is quickly positioned by comparing the captured waveform signal with the pattern time sequence, the debugging period is shortened, and the development difficulty is reduced.

The invention belongs to the technical field of lightning current monitoring, and particularly discloses an intelligent lightning arrester capable of monitoring lightning current and a monitoring method, which have the beneficial effects that localized operation calculation is performed through a rule engine, the diagnosis time consumption can be reduced, sampling can be quickly triggered through a dynamic threshold value, communication is performed through a dual-mode communication module, and the intelligent lightning arrester capable of monitoring the lightning current can be used for monitoring the lightning current. Therefore, timely data detection and real-time alarm can be realized, the characteristic extraction unit is used for extracting peak current Ip, wavefront time Tf, wave tail time Tt and oscillation index Oi to realize full coverage of waveform characteristics, and the life evaluation unit is used for calculating accumulated damage and residual life percentage of the equipment to realize full coverage of the waveform characteristics. The trigger threshold value of the current is calculated through the threshold value calculation formula according to the environment temperature and the relative humidity detected by the temperature and humidity sensor, accurate monitoring is achieved, and the situation of false alarm is avoided.

The invention relates to a device and method for measuring system delay by using an oscilloscope, and belongs to the technical field of system delay measurement, and the method comprises the following steps: obtaining a to-be-measured system, connecting the output end of a signal generator with the input end of the to-be-measured system, and connecting the output end of the to-be-measured system with a first channel of the oscilloscope; the output end of the signal generator is connected to the second channel of the oscilloscope at the same time; a signal generator is used for generating a test signal, the test signal is processed by a to-be-tested system and then input to a first channel of an oscilloscope, and meanwhile the test signal is directly input to a second channel of the oscilloscope; setting a test signal input by a trigger source as the second channel on the oscilloscope, and setting a trigger condition; the waveforms of the test signals received by the first channel and the second channel are respectively obtained on the oscilloscope, and the time delay of the to-be-tested system is calculated according to the time difference of the waveforms of the two channels; the method has the beneficial effects that the measurement error is minimized by selecting consistent feature points and reasonably setting time base gears.

A digital signal processing method is for enhancing fidelity of equivalent-time waveform measurements. The method includes receiving a digitized equivalent-time waveform of a repeating signal under test (SUT), applying a low-pass filter to the digitized equivalent-time waveform to obtain a smoothed waveform, generating a residual waveform by subtracting the smoothed waveform from the digitized equivalent-time waveform, estimating contributions of multiple noise sources in the residual waveform using a regression model, computing target noise and jitter values by removing known intrinsic contributions, and reconstructing a corrected waveform by combining the smoothed waveform with a scaled version of the residual waveform, wherein the scaling is based on the target noise source contributions.

The invention discloses a power supply detection device and a test method thereof, particularly relates to the field of power electronic control, and is used for solving the problems of high-frequency phase distortion and incapability of reflecting a stability boundary under a real load dynamic state in an open-loop state caused by introduction of additional impedance due to disconnection of a loop in an existing open-loop injection test method. A switching node voltage ripple signal is synchronously collected as a disturbance input signal and an output voltage feedback signal is synchronously collected as a response output signal in a power supply closed-loop state; performing time domain alignment on the two signals to generate a time correlation signal pair; fourier transform is carried out on the signal pair to extract open-loop transfer function characteristics; mapping the characteristics to an intersection phase angle of a Nyquist plane identification curve and a unit circle; generating a chaos distortion index based on the local curvature change characteristics of the Nyquist curve of the intersection neighborhood; and correcting the phase angle of the intersection point by using a chaotic distortion index, and outputting a loop stability evaluation conclusion according to a correction result, thereby realizing high-precision stability evaluation of uninterrupted closed-loop control.

The invention relates to the technical field of jitter analysis, in particular to a high-speed oscilloscope eye diagram real-time jitter detection method and system, and the method comprises the following steps: carrying out high-speed collection waveform zero-cross detection to obtain a timestamp, calculating offset grouping to obtain a cross-period edge time sequence, merging a jump cluster according to a sequence hierarchy cluster, calculating offset, obtaining a drift trend vector, and calculating the jitter of the drift trend vector; and based on the trend vector distribution compensation weight, weighting and correcting the time coordinate, calling a corrected coordinate detection period boundary to calculate a difference value exceeding a threshold value, triggering correction to obtain a period correction rear edge coordinate, and extracting a jitter frequency amplitude according to corrected coordinate Fourier analysis to generate an eye pattern jitter detection result. Phase correlation is established based on a cross-period sequence, an analyzable offset mode is formed through a clustering identification distribution structure, accumulated deviation is suppressed through a drift trend and weight correction, an abnormal period is calibrated through period dynamic discrimination, and the relation between a jitter structure and amplitude is separated through frequency analysis, so that the overall stability and integrity are enhanced.

The invention relates to the technical field of data acquisition, in particular to a chip data acquisition method and system and a storage medium. The method comprises the following steps: acquiring working parameters of a chip in real time by using an intelligent sensor, and recording initial performance data of the chip; establishing an initial test data set of the working state of the chip by using data analysis software according to the initial performance data; performing data cleaning based on the initial test data set, and performing chip key feature vector extraction on the initial test preprocessing data to obtain a chip data feature data set; therefore, by dynamically adjusting the data acquisition strategy and enhancing the sensor configuration, the problems of inaccurate traditional data acquisition and improper redundant data processing are solved, and the accuracy of chip performance diagnosis and the production efficiency are improved.

The invention relates to a method for acquiring on-site observed quantity by an oscillographic device and the oscillographic device, and belongs to the technical field of oscilloscopes. The method specifically comprises the steps that field equipment is used for collecting field observed quantity, the collected field observed quantity is transmitted to an oscillographic device through a communication interface of the field equipment, and when the field observed quantity is analog quantity, the analog quantity is transmitted to the oscillographic device after being subjected to sampling conditioning and analog-to-digital conversion of the field equipment; dozens or even hundreds of conditioning circuits and analog-to-digital conversion circuits do not need to be additionally configured, so that the analog quantity acquisition cost of the oscillographic device is reduced, and the debugging cost of field equipment is further reduced; meanwhile, digital quantity parameters such as control parameters in the field observed quantity collected by the field equipment can be directly transmitted to the oscillographic device through a communication interface of the field equipment, so that the oscilloscope can collect analog quantity and also can collect digital quantity, and the debugging efficiency of the field equipment is improved.

The invention discloses an oscilloscope intelligent trigger setting method. Firstly, an ADC in an oscilloscope is used for collecting an input signal to obtain a sampling signal; carrying out statistics on the maximum amplitude Vmax and the minimum amplitude Vmin in all sampling points through a histogram; the amplitudes of all the sampling points are added and then averaged to obtain an initial trigger level Vinitial; and finally, based on the maximum amplitude Vmax, the minimum amplitude Vmin and the initial trigger level Vinitial of the sampling signal, rising edge trigger, pulse width trigger, slope trigger and quartile method intelligent trigger setting of the intelligent oscilloscope are realized, the debugging time is shortened, and the debugging efficiency is improved.

The utility model discloses a shielding device for electrical calibration, which belongs to the field of electrical calibration and comprises a movable box body, a cavity is arranged on the upper surface of the movable box body, an electrical shielding tube interface is fixedly mounted on the front surface of the movable box body, a through hole is arranged on one side of the electrical shielding tube interface, and a through hole is formed in the other side of the electrical shielding tube interface. A through hole in one side of the electric shielding pipe connector penetrates into the movable box body, a cover plate is connected to the upper surface of the movable box body in a penetrating mode, an inserting part is arranged on one side of the lower surface of the cover plate, a finger-shaped part is arranged on the other side of the lower surface of the cover plate and is of an arc-shaped structure, and the lower surface of the inserting part is connected to the inner side wall of the movable box body in a penetrating mode. The cover plate is stably and fixedly installed on the surface of the movable box body through the two acting points, a stable, reliable and convenient-to-disassemble structure is constructed, a continuous and stable protection environment is provided for precise elements in the box body, the risk of equipment failures caused by environmental factors is greatly reduced, daily protection requirements are met, and emergency maintenance convenience is achieved.

A test and measurement device has a port to receive a signal from a device under test (DUT), one or more analog-to-digital converters (ADC) to digitize the signal to create one or more waveforms, a display, and one or more processors configured to execute code that causes the one or more processors to: generate a histogram from the waveform, the histogram having one or more dimensions; and calculate one or more entropy values for each of the one or more dimensions. A method includes receiving a signal from a device under test (DUT) at a test and measurement device, digitizing the signal using one or more analog-to-digital converters (ADC) to produce a waveform, generating a histogram from the waveform, the histogram having one or more dimensions, and calculating one or more entropy values for each of the one or more dimensions.

The invention relates to a power distribution network harmonic analysis method and system, and the method comprises the steps: constructing a digital twinborn model of a power distribution network region, and selecting transformers in the region as analysis objects one by one; for each analysis object, various working conditions are simulated by changing the transformation ratio of the analysis object in a digital twin model, and voltage and current waveforms are collected and subjected to Fourier decomposition to obtain harmonic phasors; thirdly, performing phase reduction on the phasor data, separating a real part from an imaginary part to construct a matrix, and solving a harmonic coefficient matrix by using a least square method to realize error minimization; separating linear and nonlinear parts of the harmonic current, and calculating a harmonic emission capability parameter and a harmonic current risk parameter for quantitative evaluation; according to the method, all transformers are traversed and analyzed, and systematic harmonic evaluation of the whole power distribution network area is finally realized.

The invention discloses a multi-channel phase stability testing device based on a high-bandwidth oscilloscope, and aims to solve the problem that the requirement of pulse type output of quantum bit measurement and control signals cannot be met due to the fact that coherent measurement is carried out on continuous signals through a network analyzer in an existing method. The phase synchronization performance measurement among multi-channel superconducting quantum bit pulse type measurement and control signals is realized by adopting a reverse demodulo coherent calculation method.

A device for testing a voltage level in an electrical terminal cavity including a testing body and a probe for contacting the electrical terminal cavity. The probe includes a tip portion having a first cross-sectional area, a base portion having a second cross-sectional area, and an intermediate portion extending from the tip portion to the base portion having a third cross-sectional area. The first cross-sectional area is smaller than the third cross-sectional area, the third cross-sectional area is smaller than the second cross-sectional area, and the intermediate portion is concentric with the tip portion and the base portion. An axis extends between a center of the tip portion, a center of the intermediate portion, a center of the base portion, and a center of the testing body. The device also includes a circuit operatively coupled with the probe to sense the voltage level in the electrical terminal cavity.

A test and measurement device comprises two or more channels to enable the test and measurement device to connect to a device under test (DUT), each channel comprising an analog-to-digital converter (ADC) and one or more trigger devices, each trigger device determining one or more trigger conditions, a display to enable the test and measurement device to display data from the ADC, a user interface, and one or more processors configured to execute code to cause the one or more processors to acquire data from the two or more channels at a different time than other two or more channels in response to one or more trigger conditions.A test and measuring instrument similar to the one mentioned above, except that in addition to one or more channels with ADCs, it includes at least one channel with an auxiliary input and a threshold detector instead of an ADC.

A method and apparatus for plasma assisted semiconductor processing is provided. The method comprises: a) providing a substrate at each of the plurality of stations; b) allocating RF power comprising a first target frequency to a plurality of stations, thereby generating plasma within the stations, where the RF power is allocated according to RF power parameters configured to reduce variations between stations; c) tuning an impedance matching circuit for a first station included in the plurality of stations while distributing RF power to the first station by: i) measuring a capacitance of a capacitor in the impedance matching circuit without disconnecting the capacitor from the impedance matching circuit; and ii) adjusting the capacitance of the capacitor according to the capacitance and the RF power parameter measured in (i); and d) performing a semiconductor processing operation on the substrate at each station.

The application discloses a digital oscilloscope variable sampling rate acquisition and storage device, which comprises a data acquisition module, an upper computer, a data preprocessing module and a data cache module. The data acquisition module acquires data and sends the data to the data preprocessing module. The upper computer sets a threshold start position, a threshold end position and a sampling rate increase multiple according to user needs, and sets parameters for the data preprocessing module and the data cache module. According to control signals of the upper computer and the data cache module, the data preprocessing module changes the data extraction multiple, thereby changing the data sampling rate, and sends the data after the extraction to the data cache module. The data cache module caches the data, and sends control signals to the data preprocessing module according to the data cache condition. The application can adopt the variable sampling rate in the same waveform data, so that the user can observe the waveform details without wasting the storage space.

The invention discloses an anomaly detection method based on time-domain joint features, which comprises the following steps: sampling different types of signals, extracting time-domain features including extreme values, rise time, fall time and pulse width, forming a comparison set for abnormal signal detection, then identifying a to-be-detected signal, and determining whether the to-be-detected signal is abnormal or not. The abnormal signal detection method based on the time domain joint features is realized.

The invention discloses a full-parameter automatic test system suitable for a dual three-channel RD converter. The system sets and controls a tested product and a test instrument through computer control software, and realizes automatic test of performance parameters and functions of the to-be-tested dual three-channel RD converter under different temperature conditions according to a full-parameter automatic test process set by the computer control software. And automatically recording the test data and storing the test data to form a test record table. According to the invention, the test efficiency and test coverage of the dual three-channel RD converter can be effectively improved, and the actual result shows that a single converter can complete the test of all parameters within 5 minutes and automatically form a test record. Compared with a traditional manual test, the method has better efficiency and consistency, and is suitable for batch production test of the dual three-channel RD converter.

The invention discloses an adaptive vertical resolution enhancement method based on a digital oscilloscope, and the method comprises the steps: constructing a coefficient table composed of different types of prototype low-pass filter coefficients and corresponding different enhancement resolution digits and index values through designing different types of low-pass filter time domain coefficients; then sampling input data in real time, estimating an index value and a frequency shift point number of a resolution enhancement digit corresponding to a sampling signal through a library function in an upper computer, calling a corresponding prototype low-pass filter coefficient from a coefficient table according to the index value, issuing the prototype low-pass filter coefficient to the FPGA, and then generating a target band-pass filter in the FPGA by combining the frequency shift point number; and finally, performing frequency domain filtering to obtain an output signal after adaptive resolution enhancement so as to realize resolution enhancement.

The invention relates to the technical field of pulse trigger circuits, in particular to a transient high-frequency pulse waveform capturing method of a pulse trigger circuit, which comprises the following steps: acquiring a first sampling signal sequence and a second sampling signal sequence; determining a plurality of prediction sampling signals in a future preset time period based on the first sampling signal sequence so as to determine a prediction trigger characterization value; determining a plurality of key sampling signals in a target time period based on the second sampling signal sequence so as to determine a key trigger characterization value; judging whether a pre-trigger signal is generated or not based on the predicted trigger characterization value and the key trigger characterization value; in response to generation of the pre-trigger signal, obtaining a plurality of continuous sampling signals based on the second sampling signal sequence to determine a signal stability degree value; and determining a waveform generation mode based on a comparison result of the signal stability degree value and a preset stability degree value. The transient high-frequency pulse waveform capture false triggering rate can be reduced, and the waveform capture rate and the waveform integrity are ensured.