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465 results about "Arbitrary waveform generator" patented technology

An arbitrary waveform generator (AWG) is a piece of electronic test equipment used to generate electrical waveforms. These waveforms can be either repetitive or single-shot (once only) in which case some kind of triggering source is required (internal or external). The resulting waveforms can be injected into a device under test and analyzed as they progress through it, confirming the proper operation of the device or pinpointing a fault in it.

Arbitrary waveform generator having programmably configurable architecture

An arbitrary waveform generator (AWG) for producing an analog output current signal includes a random access memory (RAM), a programmable logic device (PLD), a programmable pattern generator, several digital-to analog converters (DACS) and a current multiplexer. The RAM store data sequences representing the analog waveform to be generated. The pattern generator read addresses the RAM causing it to sequentially read out its stored data sequence to the PLD. The PLD routes selected fields of each data sequence word to one or more of the DACs in response to timing signals provided by the pattern generator. Each DAC produces an output current of magnitude determined by its input waveform and range data. The pattern generator also signals the analog multiplexer to sum currents produced by one or more selected DACs to produce the AWG output waveform. The nature of the AWG output waveform is flexibly determined by the nature of the data sequence and the frequency at which it is read out of the RAM, the manner in which the PLD routes the data sequence to the DACs, the value of the range data supplied to each DAC, and the output pattern generated by the pattern generator. The flexible AWG architecture permits the AWG to be appropriately configured for various combinations of output waveform frequency, bandwidth and resolution requirements.
Owner:CREDENCE SYSTEMS

Enhanced test and measurement instruments using compression and decompression

An enhancement that improves the performance of test and measurement equipment such as digital oscilloscopes and arbitrary waveform generators through the use of compression and decompression is described. The present invention is particularly effective for compressing and decompressing high-speed, bandlimited analog signals that are not appropriately or cannot effectively be compressed by prior art speech, audio, image, and video compression algorithms due to various limitations of such prior art compression solutions. The present invention improves digital oscilloscopes by compressing the sampled version of an analog waveform under observation in real time, allowing a significantly longer duration of the waveform to be stored in the oscilloscope's capture memory, when compared with the duration of the same signal's uncompressed waveform stored in the same memory. Similarly, the present invention improves arbitrary waveform generators by storing a compressed version of a desired arbitrary waveform, instead of the uncompressed version of the arbitrary waveform, in the signal generator's waveform memory. During signal generation, the compressed waveform is decompressed in real time. The uncompressed waveform drives a D/A converter that generates the desired analog waveform. The present invention's simplicity, and its ability to be implemented using parallel compression and decompression elements, allows its use at the high sampling rates of test and measurement instruments. Using the present invention, storage elements in test and measurement equipment can hold significantly longer waveforms in a fixed amount of memory. Users of the present invention can also determine the proper balance between the fidelity and the duration of the decompressed waveform by adjusting various compression and decompression control parameters.
Owner:ALTERA CORP

Radar target intermediate frequency (IR) echo simulation system based on multi-beam amplitude-comparison angle measurement and control method thereof

The invention relates to a radar target intermediate frequency (IR) echo simulation system based on multi-beam amplitude-comparison angle measurement and a control method thereof, relating to the field of radar target echo simulation. The system comprises three target echo simulation boards and an arbitrary waveform generator instrument fixture, wherein the echo simulation boards are designed with a computer module PC104, a field programmable gate array (FPGA), direct digital synthesis (DDS) technique and a simulation circuit as cores; and the arbitrary waveform generator instrument fixture is designed with instrument programming control as the core. According to the invention, simultaneous 6-channel simulated target IR echo simulation of the radar of the multi-beam amplitude-comparison angle measurement system is realized, parameters of the simulated target echo such as distance, delay, echo amplitude, Doppler shift, pattern, direction pattern modulation, noise superposition and the like can be controlled, single-channel switching and output of dual-beam echo is realized, and the test use requirement of the radar signal processor of the system is met. In the invention, the arbitrary waveform generator instrument frock is utilized, thus improving the amplitude precision of the output echo signals; and the control program in the FPGA in the target echo simulation boards is designed by the soft IP core, thus providing convenience for hardware transplanting and clipping.
Owner:中国兵器工业第二0六研究所

Device for compensating non-linear damage of optical fiber

The invention discloses a device for compensating a non-linear damage of optical fiber, belongs to an optical fiber communication device, solves the problem of limitation on transmission speed rate or higher complexity of the conventional restraint device, and guarantees the transmission speed rate of an optical fiber system during compensation of the non-linear damage of the optical fiber. The device comprises an arbitrary waveform generator, a driving amplifier, a first electro-optical phase modulator, a dispersion medium and a second electro-optical phase modulator, wherein a clock signal is input to a trigger end of the arbitrary waveform generator; the arbitrary waveform generator outputs a periodic parabola type waveform signal, and the periodic parabola type waveform signal is amplified by using the driving amplifier into an electric driving signal and sent to driving ends of the first electro-optical phase modulator and the second electro-optical phase modulator at the same time; an optical transmitter outputs a data signal to an input end of the first electro-optical phase modulator; and an output end of the second electro-optical phase modulator is connected with an optical fiber link. The invention has the advantages that: an adopted optical device is simple; the bit error rate of signal receiving reaches 10<-7> to 10<-9>; optical power cost is reduced by about 3 dB; and the device is applicable to a long-distance high-capacity and ultra-high-speed optical fiber communication system of all kinds of modulation formats and transmission speed rate.
Owner:HUAZHONG UNIV OF SCI & TECH

Ultrasonic guided wave device and method for detecting defect at rail bottom of steel rail at long distance

The invention discloses an ultrasonic guided wave device for detecting a defect at the rail bottom of a steel rail at a long distance, which comprises a computer, a data acquisition card, a detection signal amplifier, an arbitrary waveform generator, a power amplifier, a change-over switch and a guided wave array probe. The ultrasonic guided wave device is characterized in that: the computer serves as a control center of the device, and controls the arbitrary waveform generator to generate a single-audio frequency signal of which central frequency is selected detection frequency; the single-audio frequency signal is transmitted to the guided wave array probe after passing through the power amplifier to excite guided waves of a vertical bending mode in the rail bottom of the steel rail; and under the regulation and control of the change-over switch, the guided wave array probe receives a defect reflection echo signal which is transmitted to the computer for processing and display after passing through the detection signal amplifier and the data acquisition card. The ultrasonic guided wave device realizes the rapid nondestructive detection of the defect at the rail bottom of the steel rail.
Owner:NANCHANG HANGKONG UNIVERSITY

Arbitrary waveform generator based on PXIe bus

The invention relates to the field of signal generator, and specifically relates to an arbitrary waveform generator based on a PXIe bus. The generator comprises a waveform generation part and a waveform conditioning part. The waveform generation part comprises an FPGA and a crystal oscillator. The waveform conditioning part comprises a 16-bit DAC, an operational amplifier, an SPI program control amplifier, a filter circuit, an SPI program control DAC, a differential operational amplifier, and a subtracter. The generator employs the PXIe bus as a channel which is used by an upper computer for transmitting waveform data. The FPGA continuously process the waveform data transmitted by the upper computer in a waveform generation process, so as to guarantee the integrity of high-frequency signal quality. In a waveform conditioning process, the generator respectively employs a Bessel filter and an elliptic filter according to the frequency characteristics of signals and the difference of anti-noise capabilities, and meets the filtering requirements of different types of signals. For a signal with the amplitude being less than 50mV, a small signal processing branch circuit is designed, thereby guaranteeing that a signal with a small amplitude value cannot be flooded by noise. The generator employs a mode of internal and external synchronization adjustment for signal amplitude and bias, and guarantees the accuracy of a signal.
Owner:AVIC BEIJING CHANGCHENG AVIATION MEASUREMENT & CONTROL TECH INST +2

Phase-sensitive optical time-domain reflectometer based on linear frequency-modulation pulse and measurement method of phase-sensitive optical time-domain reflectometer

The invention relates to a phase-sensitive optical time-domain reflectometer based on a linear frequency-modulation pulse and a measurement method of the phase-sensitive optical time-domain reflectometer. The phase-sensitive optical time-domain reflectometer comprises a laser device, a single side band modulator SSBM, an acoustic optical modulator AOM, an erbium-doped optical fiber amplifier EDFAI, an EDFAII, an arbitrary waveform generator AWG, an optical fiber circulator, a fiber Bragg grating filter FBG, a photoelectric detector, a data collection module and a to-be-measured optical fiber, wherein laser enters the single side band modulator SSBM and is modulated into pulsed light by virtue of the acoustic optical modulator AOM, and the pulsed light is amplified by virtue of the erbium-doped optical fiber amplifier EDFAI and enters the to-be-measured optical fiber through the optical fiber circulator; and a backward Rayleigh scattering signal is output through the optical fiber circulator, a backward Rayleigh scattering optical signal is amplified by virtue of the erbium-doped optical fiber amplifier EDFAII and is detected and converted into an electric signal through the fiber Bragg grating filter FBG, and the data collection module executes data collection and data analysis. By the utilizing linear frequency-modulation pulse, the measurement time is shortened, and the dynamic performance of a system is improved; and the scheme provided by the invention is convenient and feasible, and the structure of the system is relatively simple.
Owner:ANSHAN REALPHOTONICS TECH CO LTD

Kelvin probe force microscope synchronously measuring multiple parameters

The invention discloses a Kelvin probe force microscope synchronously measuring multiple parameters and relates to a Kelvin probe force microscope. The invention aims to solve the problem that surface appearance, mechanical property and surface local potential of a sample cannot be synchronously represented by using a conventional Kelvin probe force microscope. In the invention, a direct current power supply is used for generating a direct current signal and loads the same between a conductive probe and the sample, a signal generator generates three-path same signals, the frequency of which is the same as a second order resonant frequency of the conductive probe, and the first-path signal is overlaid with a signal generated by an arbitrary waveform generator for controlling a #3 piezoelectric controller, so that the #3 piezoelectric controller drives a piezoelectric ceramic on a probe hand; the second-path signal as a reference signal is sent to a lock phase amplifier; the third-path signal which is shifted by 90 degrees by a phase shifter is loaded between the conductive probe and the sample; and a signal output by the lock phase amplifier is sent to an upper computer. The Kelvin probe force microscope disclosed by the invention is suitable for measuring the surface appearance, the mechanical properties and the surface local potential of the sample.
Owner:HARBIN INST OF TECH
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