9410results about "Using wave/particle radiation means" patented technology

A method for the detection of analytes using resonant mass sensors or sensor arrays comprises frequency encoding each sensor element, acquiring a time-domain resonance signal from the sensor or sensor array as it is exposed to analyte, detecting change in the frequency or resonant properties of each sensor element using a Fourier transform or other spectral analysis method, and classifying, identifying, and/or quantifying analyte using an appropriate data analysis procedure. Frequency encoded sensors or sensor arrays comprise sensor elements with frequency domain resonance signals that can be uniquely identified under a defined range of operating conditions. Frequency encoding can be realized either by fabricating individual sensor elements with unique resonant frequencies or by tuning or modifying identical resonant devices to unique frequencies by adding or removing mass from individual sensor elements. The array of sensor elements comprises multiple resonant structures that may have identical or unique sensing layers. The sensing layers influence the sensor elements' response to analyte. Time-domain signal is acquired, typically in a single data acquisition channel, and typically using either (1) a pulsed excitation followed by acquisition of the free oscillatory decay of the entire array or (2) a rapid scan acquisition of signal from the entire array in a direct or heterodyne configuration. Spectrum analysis of the time domain data is typically accomplished with Fourier transform analysis. The methods and sensor arrays of the invention enable rapid and sensitive analyte detection, classification and/or identification of complex mixtures and unknown compounds, and quantification of known analytes, using sensor element design and signal detection hardware that are robust, simple and low cost.

An integrated system is described in which digital image data of a patient, obtained from a variety of image sources, including CT scanner, X-Ray, 2D or 3D scanners and color photographs, are combined into a common coordinate system to create a virtual three-dimensional patient model. Software tools are provided for manipulating the virtual patient model to simulation changes in position or orientation of craniofacial structures (e.g., jaw or teeth) and simulate their affect on the appearance of the patient. The simulation (which may be pure simulations or may be so-called “morphing” type simulations) enables a comprehensive approach to planning treatment for the patient. In one embodiment, the treatment may encompass orthodontic treatment. Similarly, surgical treatment plans can be created. Data is extracted from the virtual patient model or simulations thereof for purposes of manufacture of customized therapeutic devices for any component of the craniofacial structures, e.g., orthodontic appliances.

The invention relates to devices and methods for designing and manufacturing customized footwear, and components thereof. An example method includes a method of designing at least a portion of a sole of an article of footwear customized for a user. The method includes the steps of determining at least one input parameter related to a user, analyzing the at least one input parameter to determine at least one performance metric of a foot of the user, and determining at least one customized structural characteristic of at least a portion of a sole of an article of footwear for the user based on the performance metric.

Described are methods for patterning a substrate by imprint lithography. Imprint lithography is a process in which a liquid is dispensed onto a substrate. A template is brought into contact with the liquid and the liquid is cured. The cured liquid includes an imprint of any patterns formed in the template. Alignment of the template with the substrate is performed prior to curing the liquid. Alignment of the template with the substrate includes rotational alignment of the template with respect to the substrate.

A profile model for use in optical metrology of structures in a wafer is selected, the profile model having a set of geometric parameters associated with the dimensions of the structure. A set of optimization parameters is selected for the profile model using one or more input diffraction signals and one or more parameter selection criteria. The selected profile model and the set of optimization parameters are tested against one or more termination criteria. The process of selecting a profile model, selecting a set of optimization parameters, and testing the selected profile model and set of optimization parameters is performed until the one or more termination criteria are met.

The present invention is directed to automated apparatuses and methods for measuring fastener hole depth, fastener length, countersink depth and/or hole diameters in a workpiece (or other object) in an automated and extremely rapid, efficient and accurate manner. The apparatuses may be operably connected with a power source and with one or a plurality of computers or other data collection devices to transmit fastener hole depth, countersink depth and/or hole diameter measurement data and/or information to them each time that a fastener hole is measured, while the apparatus is continuously measuring fastener holes (i.e., with no interruptions). Extremely advantageously, using only one hand, and by only squeezing a trigger only one time, an operator of such an apparatus may successfully and very rapidly and accurately perform more than one, or all three, of the following functions: (i) normalize the apparatus relative to one or a plurality of fastener holes and/or workpiece surfaces; (ii) make one or a plurality of accurate measurements; and (iii) transmit the one or more measurements from the apparatus to one or a plurality of computers and/or other data collection devices for, for example, recordation, storage, manipulation, other use and/or the like.

The invention provides consumers, private enterprises, government agencies, contractors and third party vendors with tools and resources for gathering site specific information related to purchase and installation of energy systems. A system according to one embodiment of the invention remotely determines the measurements of a roof. An exemplary system comprises a computer including an input means, a display means and a working memory. An aerial image file database contains a plurality of aerial images of roofs of buildings in a selected region. A roof estimating software program receives location information of a building in the selected region and then presents the aerial image files showing roof sections of building located at the location information. Some embodiments of the system include a sizing tool for determining the size, geometry, and pitch of the roof sections of a building being displayed.

In one embodiment the invention comprises a particle velocity sensor that includes a housing with a geophone mounted in the housing. A fluid that substantially surrounds the geophone is included within the housing. The particle velocity sensor has an acoustic impedance within the range of about 750,000 Newton seconds per cubic meter (Ns/m<3>) to about 3,000,000 Newton seconds per cubic meter (Ns/m<3>). In another embodiment the invention comprises method of geophysical exploration in which a seismic signal is generated in a body of water and detected with a plurality of co-located particle velocity sensors and pressure gradient sensors positioned within a seismic cable. The output signal of either or both of the particle velocity sensors or the pressure gradient sensors is modified to substantially equalize the output signals from the particle velocity sensors and the pressure gradient sensors. The output signals from particle velocity sensors and pressure gradient sensors are then combined.

A method for modeling diffraction includes constructing a theoretical model of the subject. A numerical method is then used to predict the output field that is created when an incident field is diffracted by the subject. The numerical method begins by computing the output field at the upper boundary of the substrate and then iterates upward through each of the subject's layers. Structurally simple layers are evaluated directly. More complex layers are discretized into slices. A finite difference scheme is performed for these layers using a recursive expansion of the field-current ratio that starts (or has a base case) at the lowermost slice. The combined evaluation, through all layers, creates a scattering matrix that is evaluated to determine the output field for the subject.

The top-view profiles of repeating structures in a wafer are characterized and parameters to represent variations in the top-view profile of the repeating structures are selected. An optical metrology model is developed that includes the selected top-view profile parameters of the repeating structures. The optimized optical metrology model is used to generate simulated diffraction signals that are compared to measured diffraction signals.

A system and method for high-speed radiographic inspection of fluid transport vessels in which a radiation source and a radiation detector are positioned on opposite sides of the outside surface of the vessel. A positioning system is provided for moving and locating the radiation source and radiation detector longitudinally with respect to the vessel and for moving the radiation source and radiation detector circumferentially with respect to the vessel. In operation, the positioning system causes the radiation source and radiation detector to spiral along the vessel in a coordinated manner while the radiation source illuminates an adjacent region of the vessel with radiation. The radiation is converted into corresponding electrical signals used to generate images of objects in the radiation path. Finally, an operator inspects the images for defects.

Provided is an information processing apparatus including a position detection unit that detects a position of an operating tool pressing a screen, a pressure intensity detection unit that detects pressure intensity of the operating tool, a movement detection unit that detects a movement of the operating tool based on information on the position detected by the position detection unit, and a function providing unit that provides a specific function corresponding to an increase in the pressure intensity in a case a rest state or a subtly-moving state of the operating tool is detected by the movement detection unit and the pressure intensity detected by the pressure intensity detection unit increases.

A dual energy scanning densitometry system for imaging and measuring bone density maintains acceptable flux by adjusting the x-ray current or scan speed according to preceding scan line data. The amount of acceptable flux is maintained within limits modified by information about the region of the body being scanned so that different precisions may be maintained for different body regions. Scan speed and current may be controlled so that scan speed is maximized within the current limits. Essentially continuous flux control can be achieved.

Apparatus for inspection of a sample includes a radiation source and an array of detector elements arranged to receive radiation from the surface due to irradiation of an area of the surface by the radiation source. The array has a first operative configuration for resolving the received radiation along a first axis perpendicular to the surface, and a second operative configuration for resolving the received radiation along a second axis parallel to the surface. A signal processor processes the signal from the detector array in the two configurations so as to determine a reflectance of the surface as a function of elevation angle relative to the surface and a scattering profile of the surface as a function of azimuthal angle in a plane of the surface.

Radiation scanning systems to inspect objects are disclosed comprising a first vehicle supporting a radiation source. A second vehicle supports a detector. The source and the detector may be moved to scan an object, such as a cargo conveyance, between the vehicles. The first and second vehicles may having an expandable length and the source and detector may be moved across the expandable length, to scan long objects. The radiation source may be adapted to emit a vertically diverging beam of radiation, such as a fan beam. The radiation may be X-ray radiation, for example. The vehicle may comprise a truck and an expandable trailer releasably coupled to the truck. The trailer may comprise telescoping rails. The first and second vehicles may be driven to an inspection site, where they may be rapidly deployed. Methods of inspecting objects are disclosed, as well.