3792 results about "Quantum electrodynamics" patented technology

A method for computing using a quantum system comprising a plurality of superconducting qubits is provided. Quantum system can be in any one of at least two configurations including (i) an initialization Hamiltonian H₀ and (ii) a problem Hamiltonian H_P. The plurality of superconducting qubits are arranged with respect to one another, with a predetermined number of couplings between respective pairs of superconducting qubits in the plurality of qubits, such that the plurality of superconducting qubits, coupled by the predetermined number of couplings, collectively define a computational problem to be solved. In the method, quantum system is initialized to the initialization Hamiltonian H_O. Quantum system is then adiabatically changed until it is described by the ground state of the problem Hamiltonian H_P. The quantum state of quantum system is then readout thereby solving the computational problem to be solved.

An energy conversion film and a quantum dot film which contain a quantum dot compound, an energy conversion layer including the quantum dot film, and a solar cell including the energy conversion layer. The films act as cut-off filters blocking light of a particular energy level using the light absorption and emission effects of quantum dots and can convert high energy light to low energy light. The efficiency of a solar cell may be improved by providing the cell with a film that converts light above the spectrum-responsive region to light in the cell's spectrum-responsive region. The absorption wavelength region of the films can be broadened by providing the quantum dot compound in a variety of average particle sizes, for example, by providing a mixture of a first quantum dot compound having a first average particle size and a first quantum dot compound having a second average particle size.

A quantum computing structure comprising a superconducting phase-charge qubit, wherein the superconducting phase-charge qubit comprises a superconducting loop with at least one Josephson junction. The quantum computing structure also comprises a first mechanism for controlling a charge of the superconducting phase-charge qubit and a second mechanism for detecting a charge of the superconducting phase-charge qubit, wherein the first mechanism and the second mechanism are each capacitively connected to the superconducting phase-charge qubit.

A quadrupole ion trap mass analyzer in which the trapping volume is defined by spaced linear rods in which linear elements located between the spaced linear rods produce image currents produced by motion of ions in the trapping volume.

A superconducting readout system includes a computation qubit; a measurement device to measure a state of the computation qubit; and a latch qubit that mediates communicative coupling between the computation qubit and the measurement device. The latch qubit includes a qubit loop that includes at least two superconducting inductors coupled in series with each other; a compound Josephson junction that interrupts the qubit loop that includes at least two Josephson junctions coupled in series with each other in the compound Josephson junction and coupled in parallel with each other with respect to the qubit loop; and a first clock signal input structure to couple clock signals to the compound Josephson junction.

Ion manipulation systems include ion repulsion by an RF field penetrating through a mesh. Another comprises trapping ions in a symmetric RF field around a mesh. The system uses macroscopic parts, or readily available fine meshes, or miniaturized devices made by MEMS, or flexible PCB methods. One application is ion transfer from gaseous ion sources with focusing at intermediate and elevated gas pressures. Another application is the formation of pulsed ion packets for TOF MS within trap array. Such trapping is preferably accompanied by pulsed switching of RF field and by gas pulses, preferably formed by pulsed vapor desorption. Ion guidance, ion flow manipulation, trapping, preparation of pulsed ion packets, confining ions during fragmentation or exposure to ion to particle reactions and for mass separation are disclosed. Ion chromatography employs an ion passage within a gas flow and through a set of multiple traps with a mass dependent well depth.

An integrated FIB/PEM apparatus and method for performing failure analysis on integrated circuits. In-situ failure analysis is enabled by integrating Photon Emission Microscopy into a Focused Ion Beam system, thereby improving throughput and efficiency of Failure Analysis. An iterative method is described for identifying and localizing fault sites on the circuit.

Multipole ion guides configured with one or mote segments and positioned in a higher pressure vacuum region, are operated in mass to charge selection and ion fragmentation modes. Individual multipole ion guides are mounted in a linear assembly with no electrodes configured in between each multipole ion guide. At least a portion of each multipole ion guide mounted in a linear assembly resides in a vacuum region with higher background pressure. At least one ion guide can be configured to extend continuously from one vacuum stage into another. Individual sets of RF, +/− DC and secular frequency voltage supplies provide potentials to the rods of each multipole ion guide allowing the operation of ion transmission, ion trapping, mass to charge selection and ion fragmentation functions independently in each ion guide. The presence of higher background pressure along a portion of the multiple ion guide linear assembly allows the Collisional Induced Dissociation (CID) fragmentation of ions by axially accelerating ions from one multipole ion guide to an adjacent ion guide, analogous to a triple quadrupole function. A variety of MS and MS/MSⁿ analysis functions can be achieved with a mass analyzer configured with multiple ion guide linear assembly operated in a higher background pressure.

An electron beam inspection system of the image projection type includes a primary electron optical system for shaping an electron beam emitted from an electron gun into a rectangular configuration and applying the shaped electron beam to a sample surface to be inspected. A secondary electron optical system converges secondary electrons emitted from the sample. A detector converts the converged secondary electrons into an optical image through a fluorescent screen and focuses the image to a line sensor. A controller controls the charge transfer time of the line sensor at which the picked-up line image is transferred between each pair of adjacent pixel rows provided in the line sensor in association with the moving speed of a stage for moving the sample.

The purpose of the invention is to provide an improved electron beam apparatus with improvements in throughput, accuracy, etc. One of the characterizing features of the electron beam apparatus of the present invention is that it has a plurality of optical systems, each of which comprises a primary electron optical system for scanning and irradiating a sample with a plurality of primary electron beams; a detector device for detecting a plurality of secondary beams emitted by irradiating the sample with the primary electron beams; and a secondary electron optical system for guiding the secondary electron beams from the sample to the detector device; all configured so that the plurality of optical systems scan different regions of the sample with their primary electron beams, and detect the respective secondary electron beams emitted from each of the respective regions. This is what makes higher throughput possible. To provide high accuracy, the apparatus is configured such that the axes of its optical systems can be aligned, and aberrations corrected, by a variety of methods.

A qubit generating unit 40 generates a qubit having a predetermined quantum state. A qubit encoding unit 70 performs quantum encoding of the generated qubit. A first pseudo-random number generating unit 60 generates a first pseudo-random number from secretly shared information 3 which has been secretly shared with the quantum receiving device 200 in advance. A quantum modulator 80 performs quantum modulation of the qubit on which quantum encoding has been performed based on the first pseudo-random number and sends the modulated qubit to the quantum receiving device 200. A second pseudo-random number generating unit 220 generates a second pseudo-random number from secretly shared information 21 which has been secretly shared with the above quantum sending device 100 in advance synchronously with generation of the above first pseudo-random number. A qubit demodulator 230 performs quantum demodulation of the qubit which has been received from the quantum demodulator 80 based on the second pseudo-random number.

There is provided a method for obtaining at least one calibration filter for a Mass Spectrometry (MS) instrument system. Measured isotope peak cluster data in a mass spectral range is obtained for a given calibration standard. Relative isotope abundances and actual mass locations of isotopes corresponding thereto are calculated for the given calibration standard. Mass spectral target peak shape functions centered within respective mass spectral ranges are specified. Convolution operations are performed between the calculated relative isotope abundances and the mass spectral target peak shape functions to form calculated isotope peak cluster data. A deconvolution operation is peformed between the measured isotope peak cluster data and the calculated isotope peak cluster data after the convolution operations to obtain the at least one calibration filter.

An emission current (Ie1) emitted by the electron-emitting device and/or a device current (If1) flowing through the electron-emitting device are measured when a voltage (V1) is applied to the electron-emitting device and an emission current (Ie2) emitted by the electron-emitting device and/or a device current (If2) flowing through the electron-emitting device are measured when the voltage (V1) is applied to the electron-emitting device after the measurement step. A voltage (V2) higher than the voltage (V1) is applied to the electron-emitting device when the emission current (Ie2) is larger than the emission current (Ie1) and/or the device current (If2) is larger than the device current (If1).