16 results about "Spectral responsivity" patented technology

The invention discloses a 3D stacked silicon-based germanium detector, relates to the field of short-wave infrared light detection and imaging, and solves the technical problem that an existing silicon-based germanium photoelectric detector is low in spectral responsivity. The detector is formed by a first wafer and a second wafer in an inverted bonding mode, an MOSFET structure is arranged in the first wafer, a Ge-on-Si photodiode structure is arranged in the second wafer and used for receiving external light and generating electrons and holes, and the electrons and the holes are accumulated in a substrate of the MOSFET structure to change the potential of the substrate so as to increase output current. The gain, the responsivity and the spectral range of the device are improved by adopting the light-induced substrate bias effect.

The invention relates to a spectrum technology, and particularly provides a dual-mode photolysis rate analyzer and a method. The analyzer comprises an optical receiving head and a spectrograph; the optical unit comprises a collimator, an optical filter and a detector, the spectral responsivity of the combination of the optical filter and the detector simulates the spectral characteristics of the photolysis reaction, and the output electric signal of the detector is in direct proportion to the photolysis frequency of the factor to be detected; the optical fiber is used for transmitting output light of the receiving head to the spectrograph and the optical unit; for the same factor to be measured, the switching unit selectively adopts output results of the spectrograph and the optical unit according to a measurement environment; the spectrograph and the optical unit are arranged in the case, and the temperature control unit is used for adjusting the temperature of the spectrograph and the optical unit. The method has the advantages of accurate measurement and the like, and is applied to atmospheric monitoring.

An optical detector unit (10) comprising an optical sensor (16) arranged in a chamber (14) having an aperture (18) in a housing (12), the optical sensor (16) being arranged to detect photons received through the aperture (18), where the optical sensor (16) comprises a plurality of sensor channels (44) arranged to receive photons through the aperture (18). Each channel (44) comprises a sensor pixel (38) and an optical filter (42) associated with the sensor pixel (38), each channel should be implemented to perform a UV index determination with higher accuracy and data reliability. According to the invention, this is achieved in that at least two of the channels (44), in one preferred embodiment, are designed for three channels as UVI measurement channels (44), each UVI measurement channel (44) having a spectral responsivity with a peak wavelength between 280 nm and 370 nm.

The application belongs to the technical field of wide band gap semiconductor photoelectric detection devices, and relates to a vertical structure GaN-based p-i-n type ultraviolet detector on a metal molybdenum substrate. Metal molybdenum is used as a substrate, there is a patterned back electrode layer on the upper surface of the metal molybdenum substrate, there is a molybdenum diffusion barrier layer on the upper surface of the metal molybdenum substrate which is not covered by the patterned back electrode layer, there are GaN buffer layer, n-type GaN layer, n-type Al x Ga 1‑x N layer, i-type Al y Ga 1‑y N layer and p-type Al z Ga 1‑z N layer are grown in sequence on the upper surface of the patterned back electrode layer and the molybdenum diffusion barrier layer in a lateral epitaxial growth mode, there is a passivation layer on the upper surface of the p-type Al z Ga 1‑z N layer, the passivation layer is slotted until the p-type Al z Ga 1‑z N layer is exposed, and a p-type electrode is arranged in the slot of the passivation layer. The application avoids cracks of each GaN-based film layer in the ultraviolet detector caused by thermal stress, increases spectral responsivity, and reduces response time.

The application provides a kind of satellite-borne infrared hyperspectral detector spectral response rate automatic maintenance device, it relates to the technical field of satellite-borne infrared hyperspectral detection, the device includes: on-board data processor, for receiving and processing on-board blackbody measurement data and cold empty background data in real time, spectral response rate is obtained in real time in orbit calculation;Spectral response rate memory, for storing the spectral response rate data calculated;Response rate threshold comparator, for comparing the calculated spectral response rate with the preset threshold;Heating decontamination driver, for starting heating decontamination operation to restore the spectral response rate of instrument when the spectral response rate is lower than the set threshold.The application is used to characterize the signal detection capability of instrument and maintain the stability of detection capability, when calculating the spectral response rate of instrument, a large number of data samples are not needed to be counted, and temperature fluctuation factors in sensitivity statistics are not needed to be considered when calculating, so that the spectral response rate algorithm is simple, the calculation speed is fast, and the real-time performance is good.

The present application relates to a kind of automobile interior atmosphere lamp color calibration methods based on multi-channel fiber synchronous acquisition, color calibration is carried out by the measuring system of two-stage calibration, wherein two-stage calibration includes first stage: under the same geometric condition, the same region of the N fiber probes is simultaneously aligned with a uniformity standard light source, the original spectral signal of each channel is synchronously collected, the relative spectral response correction coefficient of each channel relative to reference channel is calculated based on the signal;Second stage: select a standard transfer light source measured, and using any one specified fiber probe calibrated by the first stage, under standard geometric conditions, the standard transfer light source is aligned and collected, to obtain the original signal;Combined with the known absolute spectral radiance value of the standard transfer light source and the corresponding, the absolute spectral responsivity function of the entire system is calculated.The present application can multi-channel synchronous acquisition, and greatly shorten the measurement time.

The application provides a kind of optical sensing component differential spectral responsivity test system, belongs to the technical field of spectral responsivity test, comprising: modulation light source, for emitting modulation light;Bias light source, for emitting bias light, bias light and modulation light form superimposed light;Standard optical sensing module, obtains the standard value of superimposed light intensity;Measured optical sensing module, obtains the measured value of superimposed light intensity;Signal and control unit calculates the differential spectral responsivity of measured optical sensing module under superimposed light.The application also provides a kind of optical sensing component differential spectral responsivity test method, solves the problem that the test method under darkroom condition in prior art is difficult to test and calibrate the spectral responsivity of optical sensing component under actual application scene condition, realizes the spectral responsivity of measured optical sensing module in the case of background light, and evaluates the anti-interference ability of measured optical sensing module.

An integrating sphere photometer spectral response measurement system has an integrating sphere photometer and three or more reference light sources having different peak wavelengths. The integrating sphere photometer has an integrating sphere and a broadband photodetector, wherein the broadband photodetector is mounted on a sphere wall of the integrating sphere. Emergent light of the reference light sources is incident to the integrating sphere. The total spectral radiation flux Pi(λ)(i=1, 2, . . . n) received by an integrating sphere photometer system is acquired; the response Mi(i=1, 2, . . . n) of a photometer of mixed light in the integrating sphere is read by the broadband photodetector; an equation set is established; and the spectral responsivity Srel(λ) of the integrating sphere photometer is obtained by means of numerical solution.

The invention belongs to the technical field of wide bandgap semiconductor photoelectric detectors, and relates to a GaN-based p-i-n type ultraviolet detector with a vertical structure on a metal molybdenum substrate. Metal molybdenum is adopted as a substrate, a patterned back electrode layer is arranged on the upper surface of the metal molybdenum substrate, a molybdenum diffusion barrier layer is arranged on the upper surface, not covered by the patterned back electrode layer, of the metal molybdenum substrate, and a GaN buffer layer, an n-type GaN layer, an n-type Al < x > Ga < 1-x > N layer, an i-type Al < y > Ga < 1-y > N layer and a p-type Al < z > Ga < 1-z > N layer are sequentially and transversely grown on the upper surfaces of the patterned back electrode layer and the molybdenum diffusion barrier layer in an epitaxial manner, a passivation layer is arranged on the upper surface of the p-type Al < z > Ga < 1-z > N layer, a groove is formed in the passivation layer until the p-type Al < z > Ga < 1-z > N layer is exposed, and a p-type electrode is arranged in the groove of the passivation layer. According to the invention, cracking of each GaN-based film layer in the ultraviolet detector caused by thermal stress is avoided, the spectral response rate is increased, and the response time is shortened.

This invention discloses a method for correcting the background radiation response of a polarization remote sensor in the shortwave infrared band. The method includes: first, establishing a remote sensor response function based on the sensor's absolute spectral responsivity, target spectral radiance, and background radiation; dividing the test temperature into multiple temperature levels and obtaining the background radiation response using polynomial fitting; measuring the background radiation responsivity using an integrating sphere and a vacuum high-low temperature environment simulation test system to obtain the equivalent blackbody temperature; obtaining the corresponding in-band weighted radiance using the ratio of the background radiation response signal to the equivalent spectral responsivity at a known reference temperature; calculating the total background radiation response using the evaluated weighted spectral radiance and the instrument's internal equivalent spectral responsivity; and analyzing the accuracy of the background radiation polarization response correction using a combined uncertainty assessment method. This invention can be used to eliminate background radiation, increase the dynamic range of the detection system, and improve the system's signal-to-noise ratio and measurement accuracy.

The invention discloses a method for calibrating the spectral responsivity of an array spectral radiometer based on monochromatic LEDs, and the method comprises the steps: providing a monochromatic LED group as a calibration light source, and sequentially igniting each monochromatic LED in the monochromatic LED group according to a peak wavelength sequence; calibrating the array spectrum radiometer according to the quantity value provided by the corresponding traceability certificate after the light emitting of the currently ignited monochromatic LED is stable, and generating a calibration file; turning off the current single-color LED, repeating the calibration step until the nth LED in the single-color LED group completes the calibration of the array spectrum radiometer, and obtaining n original calibration files in total; carrying out normalization and splicing processing on the n original calibration files; forming a calibration file and a complete spectral irradiance responsivity calibration file covering the wave band of 380-780 nm, and completing the calibration of the array spectrum radiometer. Out-of-band stray light caused by high-level spectrum and long-wave scattering in the array spectrum radiometer is remarkably reduced, so that the spectral radiation illuminance responsivity is closer to a true value, and the calibration accuracy is improved.

The application discloses an absolute spectral responsivity calibration system and method of an infrared detector based on an optical microcavity, and the system comprises a pump light generating device, a first photon counting module capable of being switched in an optical path, an optical microcavity module, a background light elimination module, a tentative calibration infrared detector, a second photon counting module, a current measurement module and a control and data acquisition module. The application introduces the optical microcavity technology into the spectral responsivity calibration of the infrared detector based on the spontaneous parametric down-conversion calibration principle, solves the problem that the existing spontaneous parametric down-conversion calibration method can only be implemented at a single wavelength point or a narrow waveband, and realizes the absolute calibration of the wide waveband continuous spectral responsivity of the infrared detector.

This invention relates to the field of optical technology, and discloses a calibration system and method for the relative spectral responsivity of an optical power meter to improve calibration efficiency and accuracy. The system includes: a GranTaylor prism and a Wollaston prism arranged adjacent to each other; a set of concave mirrors with increasing curvature positioned between the GranTaylor prism and the monochromator light source; and, following the Wollaston prism, a third concave mirror and a first y-cylindrical mirror for projecting a first beam of light onto a first detector, and a fourth concave mirror and a second y-cylindrical mirror for projecting a second beam of light onto a second detector; wherein the GranTaylor prism is used to adjust the outgoing light into linearly polarized light with an angle of 45° to the vertical direction, and the y-direction of the reflecting cylinder of the cylindrical mirror is the vertical direction, while the plane on which the breadboard used to deploy the calibration system components is located is a horizontal plane.

This invention relates to the field of photoelectric detection technology, providing an integrating sphere detector, a spectral responsivity calibration device, and a calibration method. The integrating sphere detector includes a hollow sphere and multiple photodetectors. The hollow sphere has a spherical cavity, a light inlet, and multiple light outlets. The inner wall of the spherical cavity is coated with a diffuse reflection layer. The light inlet is located on one side of a first reference surface passing through the center of the sphere. The multiple light outlets are evenly distributed circumferentially on a second reference surface. The second reference surface is parallel to a third reference surface passing through the center of the sphere, on the side opposite to the light inlet. The third reference surface is perpendicular to the first reference surface. The multiple photodetectors and multiple light outlets are arranged one-to-one. A light beam enters the spherical cavity through the light inlet, with the incident direction deviating from the center of the sphere and incident on the inner wall of the spherical cavity on the side of the second reference surface opposite to the light inlet. The integrating sphere detector of this invention has a simple structure, good uniformity, and facilitates accurate spectral responsivity calibration in the 1200-2300 nm range.

The application discloses a method for determining the transparency of insulating material and the bifaciality of a back contact component, relates to the technical field of photovoltaic cells, and aims to determine the transparency of insulating material, thereby improving the calculation accuracy of the bifaciality of a back contact cell or a back contact component. The insulating material is formed on part of the back light surface of the back contact cell. The method for determining the transparency of the insulating material comprises the following steps: obtaining the first spectral responsivity corresponding to a first region on the back light surface side of the back contact cell and the second spectral responsivity corresponding to a second region under the same incident wave band. The surface of the first region is covered with the insulating material, and the surface of the second region is not covered with the insulating material. Based on the wavelength range of the incident wave band, the first spectral responsivity and the second spectral responsivity, the transparency of the insulating material under the incident wave band is determined. The method for determining the bifaciality of the back contact component comprises the method for determining the transparency of the insulating material.

A diffractive optical network-based multispectral imaging system is trained using deep learning to create a virtual spectral filter array at the output image field-of-view. The diffractive multispectral imager performs spatially-coherent imaging over a large spectrum, and at the same time, routes a pre-determined set of spectral channels onto an array of pixels at the output plane, converting a monochrome focal plane array or image sensor into a multispectral imaging device without any spectral filters or image recovery algorithms. Furthermore, the spectral responsivity of this diffractive multispectral imager is not sensitive to input polarization states. Due to its compact form factor and computation-free, power-efficient and polarization-insensitive forward operation, the diffractive multispectral imager can be transformative for various imaging and sensing applications and be used at different parts of the electromagnetic spectrum where high-density and wide-area multispectral pixel arrays are not widely available.