Optical device spectral response measurement method and device

Abstract

The present invention discloses an optical device spectral response measurement method, and belongs to the microwave photon measurement technology field. The method comprises the steps of utilizing a double-sideband phase modulation method and a double-sideband amplitude modulation method to modulate a microwave swept-frequency signal on an optical carrier separately to obtain a double-sideband phase modulation signal and a double-sideband amplitude modulation signal separately; taking the double-sideband phase modulation signal and the double-sideband amplitude modulation signal as the detection signals separately, enabling the detection signals to pass a to-be-measured optical device, then carrying out the beat frequency, transforming the spectral response information of the to-be-measured optical device into an electric domain, and then utilizing an amplitude phase extraction method to extract a transmission function of the to-be-measured optical device; adding and subtracting the transmission functions of the to-be-measured optical device under the two detection signals separately to obtain a broadband transmission function of the to-be-measured optical device. The present invention also discloses an optical device spectral response measurement. The measurement device of the present invention has a wider measurement range, and can work at any wavelength.

Description

technical field [0001] The invention relates to the technical field of microwave photonics measurement, in particular to a measurement method and a measurement device for the spectral response of an optical device. Background technique [0002] In recent years, with the rapid development of laser technology, photonic systems have been widely used, such as high-precision optical fiber sensing, long-distance optical fiber communication, etc. However, the measurement technology of optical devices has stagnated, which not only makes the development of high-precision optical devices difficult, but also makes the existing optical devices unable to exert their maximum effectiveness. For example: the minimum bandwidth of fiber grating has been as low as 9MHz, while the measurement accuracy of the existing optical device measurement technology is still on the order of hundreds of MHz, even the measurement accuracy of LunaOVA5000, the most advanced optical vector analyzer in the world...

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Problems solved by technology

However, this method needs to shift the frequency of the optical carrier separately and then combine the beams, so the carrier phase is easily disturbed by the external environment, and the phase response of the optical device under test cannot be accurately measured

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