8121results about "Testing optical properties" patented technology

A method for accurately synthesizing a full-aperture data map from a series of overlapped sub-aperture data maps. In addition to conventional alignment uncertainties, a generalized compensation framework corrects a variety of errors, including compensators that are independent in each sub-aperture. Another class of compensators (interlocked) include coefficients that are the same across all the sub-apertures. A constrained least-squares optimization routine maximizes data consistency in sub-aperture overlap regions. The stitching algorithm includes constraints representative of the accuracies of the hardware to ensure that the results are within meaningful bounds. The constraints also enable the computation of estimates of uncertainties in the final results. The method therefore automatically calibrates the system, provides a full-aperture surface map, and an estimate of residual uncertainties. Therefore, larger surfaces can be tested with greater departures from a best-fit sphere to greater accuracy than was possible in the prior art.

An in-band OTDR uses a network's communication protocols to perform OTDR testing on a link. Because the OTDR signal (probe pulse) is handled like a data signal, the time required for OTDR testing is typically about the same as the time required for other global network events, and is not considered an interruption of service to users. A network equipment includes an optical time domain reflectometry (OTDR) transmitter and receiver, each operationally connected to a link to transmit and receive, respectively, an OTDR signal. When an OTDR is to be performed, a network device operationally connected to the link actuates the OTDR transmitter to transmit the OTDR signal on the link during a determined test time based on a communications protocol of the link, during which data signals are not transmitted to the network equipment. A processing system processes the OTDR signal to provide OTDR test results.

The invention discloses a test bed for testing comprehensive performance of LED modules in the technical field of LED measurement. A double-station mode is provided with two sets of independent automatic loading and unloading machines, a PCB (printed circuit board) detector, an LED module electrical parameter detector, an LED module light intensity detector, an LED module spectrum parameter and chromaticity detector, an LED module defect repairer and a qualified product and unqualified product sorter; and the LED modules of two different specifications can be tested at the same time. Multi-variety online quick test and sorting can be efficiently matched by adopting a rotary sorting mode, combining a computer and a motion control card and controlling independent operation of each tester. The test bed can be adaptive to performance test of the LED modules of multiple specifications, is simple and convenient to operate, has high automation degree, can effectively and comprehensively reflect the comprehensive performance indexes of the tested LED modules, and has actual significance for improving quality control of the LED modules and research on industrialized key test technology of the LED module industry.

In a method for performing OTDR measurement in an optical transmission system including a first terminal station and a second terminal station, OTDR signal light is transmitted from an OTDR provided in the first terminal station to the second terminal station, in which the OTDR signal light is Raman amplified by using main signal light of the optical transmission system as pump light.

A light pulse generator is connected with one end of an optical fiber which selectively emits light pulses of a plurality of wavelengths to the optical fiber. A photodetector outputs a signal corresponding to the strength of the light reflected from the optical fiber. A storage unit stores the signal output from the photodetector for each wavelength. A processor determines the position and characteristic of an event based on the waveform data for each wavelength stored in the storage device. A display device has first and second display areas. A display controller allows the first display area to display the waveform data for each wavelength stored in the storage unit in a discriminable manner, and allows the second display area to display a list of positions and characteristics of events for each wavelength determined by the processor.

The invention discloses an LED optical parameter comprehensive testing device, belonging to the technical field of optical parameter measurement. The LED optical parameter comprehensive testing device is technically characterized in that one end of a horizontal base provided with a one-dimensional mobile platform is fixedly provided with an arc-shaped clamp provided with a fiber-optic probe and astandard luminosity probe, the other end of the horizontal base is fixedly provided with an arc-shaped light collector consisting of an arc fiber-optic array and a linear array CCD (Charge Coupled Device), and a rotary clamping table for holding an LED to be tested is arranged on the one-dimensional mobile platform; light information acquired by the fiber-optic probe is converted into a spectrum band by a spectrograph and then is sent into a computer, outputs of the standard luminosity probe and the linear array CCD are sent to the computer through the data acquisition unit, the computer performs corresponding processing and operation on measurement data through measurement software to finally obtain the luminescence characteristics of the LED to be tested. According to the invention, theproblem on comprehensively measuring the LED on a single measurement instrument is solved; and the LED optical parameter comprehensive testing device has the characteristics of simplicity for operation, compact structure, fastness for measurement, easiness for realization and the like.

The invention relates to a device and a method for testing the LED light source intensity space distribution characteristic. The device comprises a base, a testing sample seat, a light intensity detecting unit, a detector bracket, a testing circuit, a computer and testing software. A multi-path synchronous testing method of a plurality of light intensity detecting units is adopted to replace one light intensity detector to sequentially test a plurality of points so as to realize the quick testing of the LED light source intensity space distribution characteristic. Compared with a conventional light distribution curve measuring method adopting one light intensity detector, if N light intensity detectors are used, the testing speed can be improved by more than N times. The device has the advantages of high testing speed and precision, abundant information content and real time and visualization.

The invention discloses a high-frequency error detection device and method in the large caliber large relative aperture non-spherical mirror, the device including the five-axis movement adjustment platform with the interferometer focusing platform, the side swing reflecting mirror side swing platform located in front of the interferometer focusing platform, and the measured non-spherical mirror 3D movement adjustment platform located below the side swing reflection mirror side swing platform, and the multiple points supporting machine with the laser wave surface interferometer, the side swing reflection mirrors, and the measured non-spherical mirror installed on the corresponding platforms, and the main control computer with built-in detection data-processing algorithm program connecting with the laser wave surface interferometer. The device uses the main control computer to process the detection data-processing algorithm, which can combine the detected multiple part regions error surface maps into error surface map with medium or high frequency in full caliber, including the initial pose determining method, the overlapping regional data extraction algorithm and the regional data stitching algorithm. The invention is a high-frequency error detection device and method with low-cost, high-precision, high-efficiency in the large caliber large relative aperture non-spherical mirror.

A test apparatus for an optical investigation system, with an imaging device and a light source for optical investigation of an object in remitted light and/or fluorescent light includes a housing with a hollow space and an aperture for inserting a distal end of the imaging device into the hollow space, a reference surface with predetermined optical properties in the hollow space, at least either for remission of illuminating light directed onto the reference surface or for emission of fluorescent light, and a positioning device to hold the imaging device of the distal end of the imaging device at a predetermined position in relation to the reference surface.

The invention provides a method and device for detecting a polarization extinction ratio of an optical polarizer. The detection method comprises the following steps of: making linear polarized light incident along a principal axis of an optical polarizer to be detected, and obtaining two light signals on two orthogonal optical axes at an outgoing end due to polarization crosstalk; interfering and carrying out photoelectric conversion and data acquisition on interfering light signals to obtain one group of discrete voltage signal values reflecting the interfering light intensity signals; and calculating coupling intensity h at each coupling spot based on a formula (1), and calculating an extinction ratio of the optical polarizer to be detected based on a formula (2). The device sequentially comprises a light source, an isolator module, a polarization module, the optical polarizer to be detected, a projection direction regulating module, an interferometer module, a data acquisition module and a central processor module. The invention has the advantage that the coupling intensity of the coupling spots is detected to induce the polarization extinction ratio, so that the measurement result is accurate. The invention is suitable for various optical polarizers, such as polarization maintaining fibers, polarization maintaining fiber couplers, polarizers and the like and has certain universality.

The invention provides an all-fiber testing device for testing the polarization crosstalk of an optical device. The all-fiber testing device comprises a wide-spectrum light source (501), a polarizer (511), a to-be-tested polarizing device (522), an optical path correlator (530), a difference detector (550) and a photoelectric signal conversion and signal recording device (560), wherein the wide-spectrum light source (501) is connected with the to-be-tested optical fiber device (522) through the polarizer (511) and a first rotary connector (521) and is connected with the optical path correlator (530) with a polarization beam splitting Michelson structure through a second rotary connector (523); and the optical path correlator (530) is connected with the polarization difference detector (550) through a third rotary connector (541) and is connected with an interference signal detecting and processing device (560). The all-fiber testing device has the advantages of small size, high measurement accuracy, high temperature and vibration stability and the like, so that the all-fiber testing device is widely applied to high-accuracy measurement and analysis of the polarization performance of the optical device.

The invention discloses a device for testing an infrared focal plane array device, which comprises a radiation source and focal plane array module, a drive control module and a data acquisition processing module, wherein the radiation source and focal plane array module comprises an infrared radiation source, an optical system and a tested infrared focal plane array; the drive control module comprises a bias control module, a temperature control module and a time sequence control module; and the data acquisition processing module comprises an analog-to-digital signal converter, a video output module, a data acquisition card and a data analysis processing module. The device of the invention has the characteristics of low cost, high efficiency, accuracy, reliability and the like, is suitable for testing the large-scale infrared focal plane array device, and is of very important instructive significance to the designer of the device and the designer of an imaging system.

Provided is a measuring device and a calibration method for optical lens distortion. The measuring device comprises a single star light simulator, an adjusting rack, a to-be-tested lens, a CCD (charge coupled device) camera, a one-dimensional air flotation turntable, an angle encoder, a computer and an optical platform. The calibration method includes the steps of using a centroid localization algorithm to determine centroid position coordinates of a star point image when the to-be-tested lens is under different fields of view, establishing a calibration model for the to-be-tested lens distortion based on the distribution of the centroid position coordinates of the star point image under the entire field of view, and realizing the calibration of the distorted to-be-tested lens. The measuring device and the calibration method for the optical lens distortion has the advantages that the device is simple; the method is convenient; measurement accuracy is high; and the optical lens distortion can be easily measured and calibrated.

The invention provides a device and a method for improving polarization crosstalk measurement performance of an optical device. The device comprises a wide spectrum light source (301), a polarizer (311), a polarization device to be tested (632), an optical path correlator (640) and a polarization crosstalk detection and signal recording device (150), wherein the wide spectrum light source (301) is connected with the optical device to be tested (632) by the polarizer (311) and a first rotation connector (631) and then is connected with the optical path correlator (640) by a second rotation connector (633). By the device and the method, noise amplitude can be greatly suppressed, the sensitivity of polarization crosstalk measurement is improved, the dynamic range of polarization crosstalk measurement is expanded, and the device and the method are widely used for high-precision measurement and analysis on polarization performance of the optical device.

The invention relates to a dynamic object modulation transfer function measuring method and a device thereof, pertaining to the optical property measurement field. The invention aims at providing a dynamic object modulation transfer function measuring method and a device thereof which can carry out the dynamic object modulation transfer function measurement under different fields of view, namely, uniform linear motion, uniformly-accelerated rectilinear motion, simple harmonic motion, but also can measure static target modulation transfer function and separate the static target modulation transfer function from whole machine modulation transfer function. The device consists of a light source, a collimating lens, a pupil coupling system and an electro-optical imaging system which are arranged along the ray propagation direction in sequence; the electro-optical imaging system carries out imaging towards the light source moving along the guide rail direction and line spread function is obtained from the image and carried out one-dimensional Fourier transformation so as to obtain the dynamic object modulation transfer function. The method and the device of the invention are not only suitable for static image evaluation field but also for the image evaluation field of dynamic object imaging by a time-delay electro-optical imaging system.

The invention belongs to the optical precise measurement technical field and relates to an ultra-long focal distance measuring method and a corresponding apparatus used for a differential confocal combined lens. The method firstly adopts the differential confocal focusing theory to respectively define the focus position of a reference lens and the focus position of the combination of measured lens and reference lens; then the distance delta between two focuses and the distance d<0> between two lenses are measured and then the formula is adopted to figure out the focal distance of the measured lens and the sensitivity for focal distance measurement can be simultaneously enhanced with the pupil filtering technique during the measuring process. The invention firstly puts forward the adoption of the features of the corresponding micro-lens focus while the differential confocal response curve passes the zero point so as to extend the differential confocal microscopy theory to the ultra-long focal distance measurement field and form the differential confocal focusing theory. The invention integrates the differential confocal focusing theory and the lens combination so as to get the advantages that the measurement precision is high and the anti-interference capability is strong. The invention can be applied to the detection for the lens with ultra-long focal distance and the high-precise focal distance measurement in the optical system assembling process.

The invention relates to a combined testing device of the laser damage thresholds of a film and an optical element and a testing method utilizing the device. The traditional testing device and testing method have greater error and poor suitability for various film materials. The combined testing device of the laser damage thresholds of a film and an optical element comprises a testing assembly and a processing assembly, wherein the testing assembly comprises a Nd:YAG laser, a switch baffle, a first beam splitter, a focusing lens, a second beam splitter, a sample platform, a photodiode array, a convergent lens, an optoelectronic detector, a CCD camera, and the like; and the processing assembly comprises a computer. The testing method comprises the step of: conveying a testing result to judge whether various types of film samples are damaged or not by a CCD video microscopy judging method and a plasma flashing method according to a judgment criterion that one displayed damage is conformed The structure and the testing method of the invention has minimum testing error without error judgments and strong suitability and practicability.

The invention relates to a device and method for detecting the dynamic properties of a two-dimensional directional mirror. The device comprises a dynamic photoelectric autocollimator, a controller of the dynamic photoelectric autocollimator, a hollow rotary platform, a controller of the hollow rotary platform, a rotary target, an adjustment platform, a data acquiring and processing system and a computer measurement and control system. Under the guidance of the computer measurement and control system, a target simulation reflector on the rotary target is driven by the rotary platform to simulate an optical target in movement, the dynamic photoelectric autocollimator provides the rapid and high-precision angle miss distance for the two-dimensional directional mirror, the data acquiring and processing system feeds back and controls the two-dimensional directional mirror to track the target simulation movement in real time, and the computer measurement and control system processes the measurement data of the photoelectric autocollimator in real time to obtain the data reflecting the dynamic response properties of the two-dimensional directional mirror. The device and method provided by the invention can be used for detection of properties of the two-dimensional directional mirror, such as axis shaking, step response, dynamic continuous tracking and the like.

The invention discloses a method for measuring high reflectivity based on self-mixing effect of semiconductor laser which belongs to the technical field of measuring optical elements parameter. The present cavity ringdown technique for determining high reflectivity by measuring ringdown time, using the self-mixing effect of semiconductor laser, improves laser power to coupling efficiency of ringdown cavity by controlling back feedback optical intensity of continuous wave semiconductor laser, greatly improves the signal-noise ratio of cavity outputting signal, thereby improving measuring precision and measuring range of high reflectivity. The methods for controlling back feedback optical intensity which can make the cavity output signal reach the maximum include: inserting a linear polarizer, an attenuation plate, an optical isolator or a variable aperture between the semiconductor laser and the first cavity mirror, or adjusting the pitching of the first cavity mirror, or changing the distance of the laser and the first cavity mirror.