152 results about "Optical testing" patented technology

The invention discloses a rheology-birefringence combined in-situ testing device and method based on chopper rotation frequency signals, belongs to the technical field of optical testing, and aims to solve the technical problems that an existing Spark-FB device is low in measurement accuracy and limits application scenes. The laser emitter emits a light beam along a set angle (forming an angle of 45 degrees with the horizontal plane), the light beam is converted into linearly polarized light through the polarizer, and an optical signal is modulated through the rotating chopper; the modulated light beam penetrates through a polymer sample to which a shear flow field is applied by a commercial rheometer, and transmission light carrying optical anisotropy information of the sample sequentially passes through a 1 / 4 wave plate and a polarization analyzer, and is finally received by a photoelectric detector and transmitted to a lock-in amplifier for analysis. According to the invention, an independent datum reference signal is provided through the chopper, decoupling and combination of a commercial rheometer and a birefringence light path are realized, and synchronous and accurate in-situ measurement of rheological and optical properties of a high polymer material under a deformation condition can be realized.

Method for producing an optical test element (19) for determining a fit defect of an optical surface (20). The method comprises the following steps: - Determining a CGH design (24) suitable for measuring the optical surface (20), - Generating a CGH auxiliary structure (25) corresponding to the CGH design (24) on an auxiliary substrate (30) using a direct-write lithography process, - Generating an image of the CGH auxiliary structure (25) on a final substrate (40) using a transfer lithography process, - Generating a CGH structure (50) corresponding to the CGH design (24) based on the generated image. The method offers the advantage that the auxiliary substrate can be produced with high precision using a standardized direct-write lithography system, regardless of the size of the optical test element.

This invention provides a testing method and apparatus for a metasurface structure detector, relating to the field of photodetector testing technology. The method includes: mounting the metasurface structure detector on a sample stage with its photosensitive surface facing an optical testing system, the optical testing system including a coaxially arranged laser irradiation optical path and an infrared imaging optical path; imaging the photosensitive surface using the infrared imaging optical path to obtain a surface image of the photosensitive surface; determining multiple test positions on the photosensitive surface based on the surface image, and planning scanning paths for the multiple test positions on the photosensitive surface according to the structural period of the micro / nano periodic structural unit and the laser irradiation optical path; controlling the sample stage along the scanning path to sequentially align the multiple test positions with the laser irradiation optical path, and sequentially emitting laser light to the multiple test positions through the laser irradiation optical path to obtain scanning data for the multiple test positions; and generating a physical field distribution map of the photoelectric properties of the metasurface structure detector based on the scanning data.

Disclosed in the present invention are: a far-field simulator that simulates a beam in a form of propagation from a remote point; and an optical test system including same. The far-field simulator comprises: a beam splitter configured to split an incident beam into a first beam and a second beam; a first far-field simulation unit configured to increase the curvature of a wavefront of the first beam passing through the beam splitter to simulate the first beam in a form of propagation from a remote point; and a second far-field simulation unit configured to increase the curvature of a wavefront of the second beam passing through the beam splitter to simulate the second beam in a form of propagation from a remote point, wherein the first beam emitted through the first far-field simulation unit is formed to have a greater diameter than the diameter of the second beam emitted through the second far-field simulation unit.

According to one embodiment, an optical test apparatus includes a first aperture, a second aperture, an image sensor, and a first lens. The first aperture includes a first aperture plane provided with a first wavelength selecting region. The second aperture includes a second aperture plane provided with a second wavelength selecting region different from the first wavelength selecting region. The image sensor is configured to image a light beam passing through the first aperture plane and the second aperture plane and reaching an imaging plane. The first lens is configured to make a light beam passing through the first aperture plane and the second aperture plane be incident on the imaging plane.

The invention discloses a three-dimensional measurement device and method for optical signals in an optical engine cylinder based on a three-dimensional chromatography method, and belongs to the technical field of combustion diagnosis and optical testing of internal combustion engines. The control acquisition system is respectively matched with the first high-speed camera and the second high-speed camera to finish acquisition of output signals, transmits the acquired data to the control acquisition system, and finally obtains instantaneous three-dimensional distribution of optical signals in the cylinder through three-dimensional reconstruction; according to the three-dimensional measurement device and method for the optical signals in the optical engine cylinder based on the three-dimensional chromatography, projection data of the optical signals in the cylinder are synchronously obtained through a plurality of side cylinder wall visual angles and a bottom surface visual angle, and three-dimensional distribution of the optical signals in the cylinder is reconstructed by utilizing a three-dimensional chromatography algorithm, so that the spatial resolution is improved, and the measurement accuracy is improved. The measurement precision is enhanced, and accurate combustion process analysis is realized in a high-temperature and high-pressure environment.

The invention provides a TDLAS (tunable diode laser absorption spectroscopy) optical test window for a high-temperature and high-pressure environment, and belongs to the technical field of aero-engine tests. The mounting base is provided with a rectangular channel penetrating front and back and a mounting groove communicating with the rectangular channel, and the rectangular channel is provided with a cold water gas pipeline; the optical glass is installed in the installation groove, an elastic protection gasket is arranged on the side edge of the optical glass, the optical glass is limited through a gland fixed to the installation base, and elastic sealing gaskets are arranged between the gland and the optical glass and between the optical glass and the installation base; wherein a gap is formed between the optical glass and the mounting groove, a gas collecting cavity is formed in the mounting seat, a gas inlet hole communicated with the gas collecting cavity is formed in the outer side of the mounting seat, two rows of cooling holes are formed in one side, facing the optical glass, of the mounting seat, and cooling gas enters the gas collecting cavity through the gas inlet hole and then can flow out from the cooling holes; and the cooling gas cools the optical glass while blowing the optical glass and enters the gap to form gas seal.

This invention discloses a method for aligning and bonding flexible optoelectronic devices and determining rework based on multimodal metrological fusion. It relates to the field of flexible optoelectronic device testing technology. The method includes acquiring visual, electrical, and optical testing data of the bonded flexible optoelectronic device to form initial multimodal state data, applying boundary condition perturbation within the upper limit of the test perturbation and acquiring multimodal state data after the perturbation, performing fusion analysis on the response changes before and after the perturbation, and determining latent failures and rework window states. This relatively improves the ability of rework determination to reflect the actual health status of the device and the feasibility of actual rework.

The utility model discloses a lens optical detection equipment, including workstation and base, is equipped with annular air outlet strip, boss, circular air cavity, annular air cavity, dust suction hole no. The annular air outlet strip is hollow structure, is installed in the base top edge, and the side wall has the air outlet hole of annular distribution, and the boss is located in the base top middle part, and the silica gel pad in its recess is flexible bearing lens, and the circular air cavity is located in the base with annular air cavity, and the annular air cavity surrounds circular air cavity, and is connected dust suction hole no.

The invention discloses an optical test board and optical detection equipment, and belongs to the technical field of optical detection. A plate body of the optical test plate is provided with a test surface, the test surface is provided with an imaging effect detection area, the imaging effect detection area is provided with a picture frame and a first strip-shaped pattern, the picture frame comprises an inner frame and an outer frame, the inner frame is located in the outer frame, and the first strip-shaped pattern is located outside the outer frame. The optical detection equipment comprises a detection assembly and an optical test board, the detection assembly comprises a center imaging device and a side surface imaging device, and the optical test board is used for testing a plurality of imaging devices. According to the invention, the same optical test board can be utilized to meet the test requirements of a plurality of imaging devices.

This invention discloses a system and method for achieving single-mode transmission of sapphire optical fiber using a mechanically wound helical structure, belonging to the technical field of optical fiber transmission and high-temperature optical devices. The method involves winding sapphire optical fiber along a specific pitch to form a helical structure on a core, introducing controllable bending loss to suppress higher-order modes. Subsequently, high-temperature annealing and structural fixation ensure uniform stress distribution within the fiber and maintain a stable structure. Finally, optical testing verifies the single-mode transmission effect. This method offers advantages such as simple structure, no need for complex processing equipment, low cost, and high stability, and can be widely applied in high-temperature optical fiber sensing and high-power laser transmission.

The invention provides a horizontal reflectivity meter and a detection adjusting assembly thereof, and belongs to the technical field of optical test equipment, and the detection adjusting assembly comprises a base frame, a first rotary table, a second rotary table, a bearing mechanism, a sample adjusting assembly and a reflected light detector. Wherein the first rotary table is fixed on the base frame and is connected with a first swing arm; the second rotary table is fixed on the base frame and is coaxially arranged with the first rotary table; the bearing mechanism is rotationally connected to the base frame and fixedly connected with the driving shaft of the second rotary table, and the bearing mechanism is provided with a second swing arm; the sample adjusting assembly comprises a position adjusting assembly, a rack and a rotation adjusting assembly, the position adjusting assembly drives the rack to move on a linear degree of freedom orthogonal to the first direction, and the rotation adjusting assembly drives the sample to move on a rotation degree of freedom orthogonal to the first direction; the reflected light detector is arranged on the first swing arm. While multi-dimensional adjustment of the sample is achieved, the gravity center height of the sample is reduced, and the structural stability of sample adjustment is improved.

The invention provides a spherical mirror multi-working-condition surface shape stability measuring method and system, and relates to the technical field of optical testing, and the method comprises the steps: constructing a double-layer state machine, monitoring a supporting contact state and an air path state in real time, generating a corresponding state identifier based on load sensing data and light path monitoring data, and determining the stability of a spherical mirror surface shape. Determining topological annealing sequence parameters by using the state identifier, executing topological annealing, and finally executing interference measurement in a stable state and generating stability evaluation index data. According to the method, the problem of measurement uncertainty caused by support topology micro-slip and air path disturbance coupling in the prior art is solved, and the accuracy and reliability of profile stability evaluation of the large-aperture spherical mirror under multiple working conditions are improved.

An apparatus (100) for identifying precious stones and man-made stones is disclosed. The apparatus (100) includes a handheld device (2) with a probe (4), a thermal and optical testing assembly, a microcontroller (36), and a visual indicator (6). The probe is electronically coupled with the handheld device (2) and is removable and replaceable. The probe (4) includes a copper tube (5a) with an optical fiber (23) and a tip (5) for contacting the stone under test. The thermal testing assembly heats the copper tube (5a) and the optical assembly illuminates the stone (12, 13) under test with UV light. The microcontroller (36) determines heat transfer and determines at least one of: the electrical, thermal, and optical properties of the stone. The microcontroller (36) identifies the type of stone, and the visual indicator displays the result.

The utility model relates to the technical field of LED detection, and specifically relates to an LED light bar detection device. Comprising an integrating sphere, an adjusting mechanism, a shading plate and a detection mechanism, the detection mechanism comprises a fixed seat, a sliding seat, a sliding plate, an upper clamping plate, a lower clamping plate, an adjusting plate, a pulling plate and a spectrum device, during detection, an LED light bar is fixed to the bottom of the sliding plate, then the sliding plate is vertically and slidably installed on the sliding seat, and the adjusting plate is matched with a sliding groove in the lowest point of the sliding plate; therefore, the LED element is opposite to the probe part of the spectrum device, then the light shielding plate is inserted in a sliding manner, the single detection hole in the light shielding plate singly corresponds to the LED element during working, and then optical testing can be carried out through the spectrum device, so that whether the single LED element on the LED light bar meets optical requirements or not is known; and the LED elements on the LED light bar do not need to be desoldered manually in advance before testing, so that detection after single desoldering of a plurality of LED elements is not needed when the LED light bar is detected, and waste of samples is reduced.

This invention belongs to the field of micro / nano fabrication and optical testing technology, specifically relating to a high-resolution test card for dielectric materials in the EUV and soft X-ray bands. The test card includes a substrate and a Siemens star test pattern formed thereon. The test card uses silsesquioxane (HSQ) as the structural material and is fabricated using electron beam lithography. The structural height can reach 500 nm with a minimum linewidth of 10 nm. This invention utilizes the dual absorption and strong phase modulation capabilities of HSQ in the EUV / soft X-ray bands, making it suitable for both absorption contrast and phase contrast imaging modes in system resolution calibration and performance evaluation. This test card offers advantages such as standardized patterns, high resolution, adjustable contrast, and good fabrication consistency, providing crucial metrological support for the performance testing of high-end EUV / soft X-ray optical imaging and lithography systems.

This invention relates to the field of microscopic spectroscopy testing technology, specifically a tunable fiber bundle integrated optical measuring rod and testing method. The rod includes a carbon fiber shell-shaped main body, an optical fiber bundle fixedly mounted at the top of the main body, a focusing stage fixedly mounted at the bottom of the main body, a sample holder fixedly placed on the focusing stage, and an optical fiber collimator fixedly positioned above the sample to be tested. A laser is connected to the input end of the fiber bundle head, and a detector is connected to the output end. The tail of the fiber bundle is fixedly mounted on the optical fiber collimator. The position and angle of the focusing stage are adjustable. The sample to be tested is fixedly placed on the sample holder, and a power line is connected to the main body to supply power to the sample holder. This invention features a simple structure, convenient operation, adjustable focusing stage position and angle, good optical testing light collection efficiency, and the ability to perform optical measurements of samples and multifunctional transmission optical path testing using the fiber bundle as a carrier. It also boasts high detection efficiency and stable performance.

A device of integrating production line data as auxiliary data for abnormality analysis and a method thereof are disclosed. A repair / repairable system obtains defect repair information generated by an inspection station sited behind an automated optical inspection device and determining that a target material is abnormal, material data of the target material is read based on defect location information from an optical test data sheet generated by integrating an optical inspection data generated by the AOI device and a control management data generated by control management systems on a production line. A component location image is extracted from a material image of the target material based on the defect location information of the defect repair information, and the material data. The defect repair information and the component location image are integrated to generate integration information of the target material.

The application provides a spherical mirror multi-working-condition surface shape stability measurement method and system, relates to the optical testing technical field, and includes the following steps: constructing a double-layer state machine, monitoring a support contact state and an air path state in real time, generating corresponding state identifiers based on load sensing data and optical path monitoring data, determining topology annealing sequence parameters by using the state identifiers and performing topology annealing, and finally performing interference measurement in a stable state and generating stability evaluation index data. The application overcomes the problem of measurement uncertainty caused by the coupling of support topology micro-slippage and air path disturbance in the prior art, and improves the accuracy and reliability of surface shape stability evaluation of a large-aperture spherical mirror under multiple working conditions.

The invention provides a method and a device for evaluating usability of a panoramic looking-around system, a terminal and a medium. The method comprises the following steps: acquiring a plurality of test tasks of the panoramic looking-around system and test evaluation indexes for evaluating the plurality of test tasks; according to the test task, test environment parameters are set for a whole vehicle optical test platform, subjective scoring data and objective test data are obtained, and objective scoring data are obtained according to the objective test data; analyzing correlation intensity between a subjective evaluation index and an objective evaluation index based on the subjective scoring data and the objective scoring data to obtain objective forward close degree data and net correlation intensity data; and obtaining system usability according to the subjective score, the objective score, the objective forward close degree data and the net correlation intensity data. The fusion degree of technical parameters and user perception is improved, the evaluation dimension of the panoramic looking-around system is improved, and the evaluation effect of the panoramic looking-around system is improved.

The application provides a high-parallel test method of an optical comprehensive test platform, relates to the field of active optical testing, realizes parallel test of multiple measured objects or multiple test items through N independent test channels, avoids waiting time of traditional serial test, effectively improves manufacturing efficiency in combination with the high-parallel characteristics of the platform, dynamically allocates tasks based on real-time monitoring of channel resource states, avoids idle resources, cooperates with the high-integration characteristics of the platform, multiple modules share the platform, effectively shares costs, improves overall utilization of the equipment, the optical power meter, the adjustable optical attenuator and other modules integrated in each channel of the hardware architecture support hot plugging, the task analysis algorithm can flexibly map test items, adapts to different measured object requirements, conforms to the advantages of on-demand matching and easy expansion of the platform, can protect investment and adapt to dynamic changes of test scenes, a distributed data acquisition mechanism synchronously acquires channel data, and provides support for generating reliable test reports.

The invention discloses an adjustable phototropism test system, and belongs to the technical field of phototropism test.The adjustable phototropism test system comprises an optical test base and a culture water tank used for testing algae plants, and an adjustable spectrum light source is arranged above the culture water tank; an inner spacer ring, an outer spacer ring and an edge spacer ring which are used for separating a water area in the culture water cabin are fixed at the top end of the culture water cabin through a plurality of mounting seats. Through the arrangement of the light isolation plate and the deviation adjusting assembly, the angle of the light isolation plate can be precisely adjusted through a hydraulic system, three stable areas with different illumination intensities can be created in the culture water cabin, and the phenomenon that illumination in natural water is attenuated along with depth is simulated; researchers are allowed to research behaviors of the same seaweed under different light intensities at the same time or compare preferences of different seaweeds on the light intensities, meanwhile, shimmering of water surface is simulated through a reverse deflection mode, and physiological and behavior responses of the seaweeds under the more real and changing light environment of dynamic light are conveniently researched.

The embodiment of the utility model provides a chip module optical test fixture and test equipment. The jig comprises a carrying platform which comprises a carrying surface and a carrier, and the carrying surface comprises a plane part used for placing the display chip; a first gas channel is formed in the carrier and penetrates out of the carrying surface, and the first gas channel is connected with a vacuum system. The jig is used for installing the chip module, the display chip is fixed through vacuum adsorption force, the display chip can be fixed and disassembled only by controlling the vacuum negative pressure without applying extra acting force, and the risk that the display chip is damaged due to external force application is avoided.

Provided is a test method for a wafer on which a plurality of pixel ICs are formed, the test method comprising: preparing the wafer, each of the plurality of pixel ICs including a plurality of LEDs, a test driver that drives the plurality of LEDs, and a driver electrode that is different from the test driver and to which a separate driver for driving the plurality of LEDs is to be electrically connected; and optically testing the wafer by driving the plurality of LEDs with the test driver.

The utility model discloses a multi-parameter testing device for silicon optical wafer detection, which comprises a supporting seat, a rotating assembly and an auxiliary assembly, an operating platform is fixedly arranged at the top of the supporting seat, and the top of the operating platform is connected with four bottom plates through the rotating assembly. Optical testing equipment and probe testing equipment are fixedly installed on the left side and the rear side of the top of the operation table respectively. According to the multi-parameter testing device for silicon optical wafer detection, a to-be-detected silicon optical wafer is placed in the placing groove located in the front side of the top of the operation table, and the arranged rotating assembly drives the bottom plate to do clockwise circumferential rotation around the center axis of the operation table; the silicon optical wafer is detected through the optical testing device and the probe testing device in sequence, assembly line operation is simple and rapid, and the technical problems that in the prior art, most detection machines are independent, probe testing needs to be conducted after optical testing, and time and labor are wasted in movement are solved.

The present application belongs to the field of micro-nano processing and X-ray optical testing technology, and particularly relates to a high-resolution test card in hard X-ray band and a preparation method thereof. The test card adopts electron beam lithography combined with proximity effect correction technology to prepare an HSQ template pattern, forms a Siemens star structure with a minimum line width of 10 nm and a height of 500 nm, and then covers a metal working layer on the template surface through atomic layer deposition technology. The HSQ template pattern has a duty cycle less than 1, effectively improving the aspect ratio of the pattern. The covering of the metal working layer doubles the line density of the final pattern. The present application breaks through the resolution limit of the traditional test card, solves the problem of preparation of high-aspect-ratio nano structures, and has simple and reliable process, and is suitable for resolution calibration of absorption contrast and phase contrast imaging systems in hard X-ray band, thereby providing key technical support for performance evaluation of high-end X-ray optical systems.

The invention provides a method for visually controlling optical power density and safety on a retina, and the method comprises the steps: irradiating reference light on a simulated eye, and collecting optical reference data of a cornea region of the simulated eye and a retina region of the simulated eye, the reference light being red sunlight; irradiating light to be measured on a simulated eye, and collecting optical test data of a cornea area and a retina area of the simulated eye; determining an associated data set of the retina area of the simulated eye under different diopters based on an insert optometry; and adjusting the emergent equipment according to the type of the emergent equipment of the to-be-detected light, the optical reference data, the optical test data and the associated data set. According to the invention, the problem that a method for measuring and controlling the optical power density and the light spot size of the retina in the RLRL red light therapy technology is lacked in the prior art is solved.

The invention discloses an LED flip chip packaging test sorting system based on dynamic thermal characteristic analysis, and the system is characterized in that the system comprises a conveying mechanism which is used for bearing and conveying an LED device; the test station is arranged on a path of the conveying mechanism and comprises a test probe, an optical test module and an infrared thermal image module; the control and sorting system is respectively in signal connection with the test probe, the optical test module and the infrared thermal image module; and the sorting execution mechanism is in signal connection with the control and sorting system. According to the system, specific electric stress excitation is introduced in the testing process, and the dynamic thermal response of an LED chip is monitored in real time, so that the heat dissipation defect which cannot be found by a traditional method can be sensitively detected, and more accurate pre-judgment and sorting of the reliability of an LED device are realized.

This invention discloses a binocular AA testing and assembly device and method for intelligent glasses. The binocular AA testing and assembly device includes: a glasses placement device for fixing the glasses body; an optical engine placement device for fixing the optical engine; a first angle adjustment device, a second angle adjustment device, and a third angle adjustment device, capable of driving the optical engine to rotate and perform three-degree-of-freedom angle adjustment, with their rotation axes all passing through the center point of the top end face of the optical engine; a positioning device for adjusting the position of the optical engine relative to the glasses body; a detection device for detecting the image information projected by the optical engine through the glasses body; and a control system electrically connected to the first angle adjustment device, the second angle adjustment device, the third angle adjustment device, the positioning device, and the detection device. This binocular AA testing and assembly device integrates functions such as multi-degree-of-freedom precision adjustment, real-time optical testing, and component assembly, enabling efficient and high-precision testing and assembly of intelligent glasses.

The present invention relates to an optical coupling module (100) having a module carrier (110) with a surface (125) and a waveguide (120), which protrudes obliquely from the surface (125) of the module carrier (110) at a connection point (115), for outputting optical test signals (143) to an element (135) to be tested.