212 results about "Optical testing" patented technology

The invention relates to a method for extracting the mass center of a laser spot image based on laser size and gray scale, and relates to the technical field of digital image processing, optical testing and Matlab programming. The method comprises the following steps: step 1, obtaining a fourth grayscale image; 2, processing the generated fourth gray level image, and solving an X coordinate value and a Y coordinate value of the mass center of each image in the test time period; and step 3, obtaining a final centroid coordinate value. According to the method for extracting the mass center of the laser spot image based on the laser size and the gray level, the influence of noise points, stray light and the like on the overall measurement result is reduced to the maximum extent, meanwhile, the numerical image processing process is clear in logic and reasonable in analysis, the actually obtained result meets the expectation, data calculation is simple, and the processing process is efficient and rapid. And adopted data processing software is also universal and common, and is easy to popularize.

The invention provides a high-parallelism test method of an optical comprehensive test platform, relates to the field of active optical testing, and aims to realize parallel testing of multiple tested objects or multiple test items through N independent test channels, avoid waiting time of traditional serial testing, and effectively improve manufacturing efficiency by combining the high-parallelism characteristic of the platform. Dynamic resource scheduling distributes tasks based on channel resource states monitored in real time, resource idling is avoided, the characteristic of high integration of a platform is matched, multiple modules share the platform, cost is effectively shared, the overall utilization rate of equipment is improved, modules such as optical power meters and variable optical attenuators integrated in all channels in a hardware architecture support hot plugging, and the overall performance of the equipment is improved. And the task analysis algorithm can flexibly map test items, adapt to requirements of different tested objects, conform to the advantages that the platform is matched as needed and easy to expand, can protect investment and adapt to dynamic changes of a test scene, and a distributed data acquisition mechanism synchronously acquires data of each channel and provides support for generating a reliable test report.

The invention relates to the technical field of lens module detection, in particular to lens module EOL detection equipment and method, and the equipment comprises a four-station turntable mechanism which is provided with a plurality of bearing test seats for placing lens modules after code scanning; and a plurality of functional modules arranged around the four-station turntable mechanism, wherein the functional modules comprise a surface light test module for optical test, a white field detection assembly, a collimator test module and a black field test assembly. By integrating a multi-station automatic detection process, multiple performance detections such as electrical test, definition, color, signal-to-noise ratio, FOV angle of view, COD decentration, white balance, dark corner, stain and black field of the lens module can be synchronously completed, the coverage of detection items is comprehensive, and compared with traditional equipment only performing white field or black field detection, the full-automatic lens module detection equipment has the advantages that the full-automatic lens module detection equipment is simple in structure and convenient to operate.

The invention discloses a rheology-birefringence combined in-situ testing device and method based on chopper rotation frequency signals, belongs to the technical field of optical testing, and aims to solve the technical problems that an existing Spark-FB device is low in measurement accuracy and limits application scenes. The laser emitter emits a light beam along a set angle (forming an angle of 45 degrees with the horizontal plane), the light beam is converted into linearly polarized light through the polarizer, and an optical signal is modulated through the rotating chopper; the modulated light beam penetrates through a polymer sample to which a shear flow field is applied by a commercial rheometer, and transmission light carrying optical anisotropy information of the sample sequentially passes through a 1 / 4 wave plate and a polarization analyzer, and is finally received by a photoelectric detector and transmitted to a lock-in amplifier for analysis. According to the invention, an independent datum reference signal is provided through the chopper, decoupling and combination of a commercial rheometer and a birefringence light path are realized, and synchronous and accurate in-situ measurement of rheological and optical properties of a high polymer material under a deformation condition can be realized.

The invention provides a detonation pressure optical testing device for a micro-dose powdery explosive, which comprises a rotating mirror type scanning camera and an explosive detonation unit, and is characterized in that the rotating mirror type scanning camera is used for collecting a shock wave motion trail image when the powdery explosive is detonated; the explosive detonating unit comprises an organic glass column body and a high-pressure exploder, an explosive charging hole with an open top is formed in the organic glass column body in the axial direction, a stress wave adjusting rod is arranged in the explosive charging hole in a penetrating mode, and the bottom face of the stress wave adjusting rod can make contact with powdery explosives charged into the explosive charging hole; a first detonating hole and a second detonating hole are coaxially formed in the organic glass column body in the radial direction, and both the first detonating hole and the second detonating hole communicate with the charging hole; the heating wire penetrating through the first detonating hole, the charging hole and the second detonating hole can make contact with the powdery explosive in the charging hole, and the two ends of the heating wire are connected with the positive electrode and the negative electrode of the high-pressure exploder correspondingly. According to the invention, a traditional detonation mode is not needed, the interference of the detonator and the explosion expanding explosive on the measurement process of the sample with the small explosive quantity is solved, and the test convenience and the test precision are improved.

Method for producing an optical test element (19) for determining a fit defect of an optical surface (20). The method comprises the following steps: - Determining a CGH design (24) suitable for measuring the optical surface (20), - Generating a CGH auxiliary structure (25) corresponding to the CGH design (24) on an auxiliary substrate (30) using a direct-write lithography process, - Generating an image of the CGH auxiliary structure (25) on a final substrate (40) using a transfer lithography process, - Generating a CGH structure (50) corresponding to the CGH design (24) based on the generated image. The method offers the advantage that the auxiliary substrate can be produced with high precision using a standardized direct-write lithography system, regardless of the size of the optical test element.

The invention provides an optical test function high and low temperature test box control system for electronic components, relates to the technical field of optical test, and provides an optical test function high and low temperature test box control system for electronic components through innovative technologies such as a double-target real-time sensing module, core temperature feed-forward compensation, window distortion active compensation, data validity discrimination and adaptive scheduling. The real junction temperature of an electronic component in a high and low temperature test box is highly consistent with the ambient temperature, the wavefront aberration of an observation window is counteracted in real time, abnormal data are automatically discriminated and remeasured, the temperature control precision is improved to + / -0.1 DEG C and the wavefront distortion residual error is reduced to lambda / 20 through dynamic temperature point selection based on gauss process regression and thermal inertia model game, and the temperature control precision is improved to + / -0.1 DEG C and the thermal inertia model game. The test period is shortened by more than 30%, the data misjudgment rate is lower than 1%, and the test precision, fidelity and efficiency are remarkably improved.

The invention relates to an optical automatic centering method, aims to solve the technical problems that an existing cross-core positioning method is low in working efficiency and cannot meet the high image quality requirement of optical system testing, and provides an optical testing system with an automatic centering function and an automatic centering method. The method comprises the following steps: presetting parameters of a to-be-detected lens, controlling an electric control turntable to rotate to drive the to-be-detected lens to rotate to two contrast view fields, and performing automatic focus scanning at the two contrast view fields by using a microscopic detection system to obtain image quality parameters or other reference parameters of different image surfaces of the to-be-detected lens at the two contrast view fields; the included angle between the optical axis of the to-be-measured lens and the optical axis of the light source system is calculated, and the included angle is eliminated by rotating the high-precision rotating table, thereby realizing automatic centering.

This invention provides a testing method and apparatus for a metasurface structure detector, relating to the field of photodetector testing technology. The method includes: mounting the metasurface structure detector on a sample stage with its photosensitive surface facing an optical testing system, the optical testing system including a coaxially arranged laser irradiation optical path and an infrared imaging optical path; imaging the photosensitive surface using the infrared imaging optical path to obtain a surface image of the photosensitive surface; determining multiple test positions on the photosensitive surface based on the surface image, and planning scanning paths for the multiple test positions on the photosensitive surface according to the structural period of the micro / nano periodic structural unit and the laser irradiation optical path; controlling the sample stage along the scanning path to sequentially align the multiple test positions with the laser irradiation optical path, and sequentially emitting laser light to the multiple test positions through the laser irradiation optical path to obtain scanning data for the multiple test positions; and generating a physical field distribution map of the photoelectric properties of the metasurface structure detector based on the scanning data.

Disclosed in the present invention are: a far-field simulator that simulates a beam in a form of propagation from a remote point; and an optical test system including same. The far-field simulator comprises: a beam splitter configured to split an incident beam into a first beam and a second beam; a first far-field simulation unit configured to increase the curvature of a wavefront of the first beam passing through the beam splitter to simulate the first beam in a form of propagation from a remote point; and a second far-field simulation unit configured to increase the curvature of a wavefront of the second beam passing through the beam splitter to simulate the second beam in a form of propagation from a remote point, wherein the first beam emitted through the first far-field simulation unit is formed to have a greater diameter than the diameter of the second beam emitted through the second far-field simulation unit.

The utility model relates to an optical testing device for a detector, which comprises a bottom plate, a base and a detector fixing assembly, the bottom plate comprises a base connecting part and a limiting part, the base connecting part is used for being rotatably connected with the base, and the limiting part is used for limiting the rotation angle of the base. The base is detachably arranged on the bottom plate and can rotate on the bottom plate; the base comprises a first bottom plate connecting part, a second bottom plate connecting part, a first limiting matching part and a second limiting matching part; wherein the first bottom plate connecting part and the second bottom plate connecting part are located on two planes perpendicular to each other, and the base can be taken down to change the bottom plate connecting part matched with the base connecting part. The detector fixing assembly is arranged on the base and is used for fixing a detected detector; when the base rotates, the detector fixing assembly rotates along with the base to drive the detector to swing. The operation is simple, the test process is simplified, and the production efficiency is improved.

According to one embodiment, an optical test apparatus includes a first aperture, a second aperture, an image sensor, and a first lens. The first aperture includes a first aperture plane provided with a first wavelength selecting region. The second aperture includes a second aperture plane provided with a second wavelength selecting region different from the first wavelength selecting region. The image sensor is configured to image a light beam passing through the first aperture plane and the second aperture plane and reaching an imaging plane. The first lens is configured to make a light beam passing through the first aperture plane and the second aperture plane be incident on the imaging plane.

The invention relates to wafer test equipment, which comprises an electric test assembly, which is arranged on a mounting rack and comprises a telescopic member, a fixed end of the telescopic member is provided with a probe disc, the probe disc is provided with a plurality of probes corresponding to electrode pads of a wafer chip to be tested one by one, the probe disc is provided with a plurality of through holes between the probes, and the through holes are communicated with the probe disc. The telescopic end of the telescopic piece is provided with a suction cup, the suction cup is located below the probe disc, and the suction cup is provided with a plurality of suction rods extending into the through holes; and a light testing assembly. According to the wafer test equipment, the to-be-tested wafer is fixed on the suction rod after the angle and the position of the to-be-tested wafer are adjusted, and then the suction cup is driven to move downwards, so that the probes on the probe disc can be in contact with the metal bonding pads of the chips on the to-be-tested wafer, and electrical performance tests can be simultaneously carried out on all the chips on the wafer through the plurality of probes; and the optical fiber array disc is moved to be positioned on the wafer, so that all chips can be subjected to optical testing at one time, and the testing efficiency of the wafer is greatly improved.

The invention discloses a three-dimensional measurement device and method for optical signals in an optical engine cylinder based on a three-dimensional chromatography method, and belongs to the technical field of combustion diagnosis and optical testing of internal combustion engines. The control acquisition system is respectively matched with the first high-speed camera and the second high-speed camera to finish acquisition of output signals, transmits the acquired data to the control acquisition system, and finally obtains instantaneous three-dimensional distribution of optical signals in the cylinder through three-dimensional reconstruction; according to the three-dimensional measurement device and method for the optical signals in the optical engine cylinder based on the three-dimensional chromatography, projection data of the optical signals in the cylinder are synchronously obtained through a plurality of side cylinder wall visual angles and a bottom surface visual angle, and three-dimensional distribution of the optical signals in the cylinder is reconstructed by utilizing a three-dimensional chromatography algorithm, so that the spatial resolution is improved, and the measurement accuracy is improved. The measurement precision is enhanced, and accurate combustion process analysis is realized in a high-temperature and high-pressure environment.

The present invention relates to optical coupling between optical components, and more particularly, to an optical probe (1) configured for optical testing of at least one micro-optical component (50), a method for producing an optical probe (1), and a method for optical testing of at least one micro-optical component (50). The optical probe (1) comprises:-a probe head (10), wherein the probe head (10) comprises a test assembly (2); -at least one micro-optical element (20), where the micro-optical element (20) is a separate element with respect to the test component (2) and is in mechanical contact with the test component (2), where the micro-optical element (20) is configured to optically couple light (3) between the test component (2) and the micro-optical component (50), thereby being configured to determine an optical property of the micro-optical component (50), and wherein the micro-optical element (20) is configured to operate in an index matching liquid (17).

The invention provides a TDLAS (tunable diode laser absorption spectroscopy) optical test window for a high-temperature and high-pressure environment, and belongs to the technical field of aero-engine tests. The mounting base is provided with a rectangular channel penetrating front and back and a mounting groove communicating with the rectangular channel, and the rectangular channel is provided with a cold water gas pipeline; the optical glass is installed in the installation groove, an elastic protection gasket is arranged on the side edge of the optical glass, the optical glass is limited through a gland fixed to the installation base, and elastic sealing gaskets are arranged between the gland and the optical glass and between the optical glass and the installation base; wherein a gap is formed between the optical glass and the mounting groove, a gas collecting cavity is formed in the mounting seat, a gas inlet hole communicated with the gas collecting cavity is formed in the outer side of the mounting seat, two rows of cooling holes are formed in one side, facing the optical glass, of the mounting seat, and cooling gas enters the gas collecting cavity through the gas inlet hole and then can flow out from the cooling holes; and the cooling gas cools the optical glass while blowing the optical glass and enters the gap to form gas seal.

This invention discloses a method for aligning and bonding flexible optoelectronic devices and determining rework based on multimodal metrological fusion. It relates to the field of flexible optoelectronic device testing technology. The method includes acquiring visual, electrical, and optical testing data of the bonded flexible optoelectronic device to form initial multimodal state data, applying boundary condition perturbation within the upper limit of the test perturbation and acquiring multimodal state data after the perturbation, performing fusion analysis on the response changes before and after the perturbation, and determining latent failures and rework window states. This relatively improves the ability of rework determination to reflect the actual health status of the device and the feasibility of actual rework.

The utility model discloses a lens optical detection equipment, including workstation and base, is equipped with annular air outlet strip, boss, circular air cavity, annular air cavity, dust suction hole no. The annular air outlet strip is hollow structure, is installed in the base top edge, and the side wall has the air outlet hole of annular distribution, and the boss is located in the base top middle part, and the silica gel pad in its recess is flexible bearing lens, and the circular air cavity is located in the base with annular air cavity, and the annular air cavity surrounds circular air cavity, and is connected dust suction hole no.

The invention discloses an optical test board and optical detection equipment, and belongs to the technical field of optical detection. A plate body of the optical test plate is provided with a test surface, the test surface is provided with an imaging effect detection area, the imaging effect detection area is provided with a picture frame and a first strip-shaped pattern, the picture frame comprises an inner frame and an outer frame, the inner frame is located in the outer frame, and the first strip-shaped pattern is located outside the outer frame. The optical detection equipment comprises a detection assembly and an optical test board, the detection assembly comprises a center imaging device and a side surface imaging device, and the optical test board is used for testing a plurality of imaging devices. According to the invention, the same optical test board can be utilized to meet the test requirements of a plurality of imaging devices.

This invention discloses a system and method for achieving single-mode transmission of sapphire optical fiber using a mechanically wound helical structure, belonging to the technical field of optical fiber transmission and high-temperature optical devices. The method involves winding sapphire optical fiber along a specific pitch to form a helical structure on a core, introducing controllable bending loss to suppress higher-order modes. Subsequently, high-temperature annealing and structural fixation ensure uniform stress distribution within the fiber and maintain a stable structure. Finally, optical testing verifies the single-mode transmission effect. This method offers advantages such as simple structure, no need for complex processing equipment, low cost, and high stability, and can be widely applied in high-temperature optical fiber sensing and high-power laser transmission.

The invention provides a horizontal reflectivity meter and a detection adjusting assembly thereof, and belongs to the technical field of optical test equipment, and the detection adjusting assembly comprises a base frame, a first rotary table, a second rotary table, a bearing mechanism, a sample adjusting assembly and a reflected light detector. Wherein the first rotary table is fixed on the base frame and is connected with a first swing arm; the second rotary table is fixed on the base frame and is coaxially arranged with the first rotary table; the bearing mechanism is rotationally connected to the base frame and fixedly connected with the driving shaft of the second rotary table, and the bearing mechanism is provided with a second swing arm; the sample adjusting assembly comprises a position adjusting assembly, a rack and a rotation adjusting assembly, the position adjusting assembly drives the rack to move on a linear degree of freedom orthogonal to the first direction, and the rotation adjusting assembly drives the sample to move on a rotation degree of freedom orthogonal to the first direction; the reflected light detector is arranged on the first swing arm. While multi-dimensional adjustment of the sample is achieved, the gravity center height of the sample is reduced, and the structural stability of sample adjustment is improved.

The utility model provides a roller mold which is applied to processing a light guide plate base material. The roller mold comprises a roller body and a characteristic structure layer, the roller body is provided with a sensor, and the sensor is used for detecting the pressure when the roller mold processes the light guide plate base material; the characteristic structure layer is attached to the outer surface of the roller body in a surrounding mode and comprises a plurality of structure units, a plurality of microstructures are arranged on the surface, away from the roller body, of each structure unit, and the structure units are movably connected with the outer surface of the roller body. Therefore, in the process of processing the light guide plate base material, the pressure sensor can monitor the pressure change, so that a connected processing system can take countermeasures in time; when a certain structural unit has a defect, only the structural unit needs to be replaced, and the whole roller mold does not need to be replaced; the local light guide plate base material can be subjected to optical test, so that which structural unit has defects can be quickly detected, and the trial and error cost is reduced.

The invention provides a spherical mirror multi-working-condition surface shape stability measuring method and system, and relates to the technical field of optical testing, and the method comprises the steps: constructing a double-layer state machine, monitoring a supporting contact state and an air path state in real time, generating a corresponding state identifier based on load sensing data and light path monitoring data, and determining the stability of a spherical mirror surface shape. Determining topological annealing sequence parameters by using the state identifier, executing topological annealing, and finally executing interference measurement in a stable state and generating stability evaluation index data. According to the method, the problem of measurement uncertainty caused by support topology micro-slip and air path disturbance coupling in the prior art is solved, and the accuracy and reliability of profile stability evaluation of the large-aperture spherical mirror under multiple working conditions are improved.

An apparatus (100) for identifying precious stones and man-made stones is disclosed. The apparatus (100) includes a handheld device (2) with a probe (4), a thermal and optical testing assembly, a microcontroller (36), and a visual indicator (6). The probe is electronically coupled with the handheld device (2) and is removable and replaceable. The probe (4) includes a copper tube (5a) with an optical fiber (23) and a tip (5) for contacting the stone under test. The thermal testing assembly heats the copper tube (5a) and the optical assembly illuminates the stone (12, 13) under test with UV light. The microcontroller (36) determines heat transfer and determines at least one of: the electrical, thermal, and optical properties of the stone. The microcontroller (36) identifies the type of stone, and the visual indicator displays the result.

The utility model relates to the technical field of LED detection, and specifically relates to an LED light bar detection device. Comprising an integrating sphere, an adjusting mechanism, a shading plate and a detection mechanism, the detection mechanism comprises a fixed seat, a sliding seat, a sliding plate, an upper clamping plate, a lower clamping plate, an adjusting plate, a pulling plate and a spectrum device, during detection, an LED light bar is fixed to the bottom of the sliding plate, then the sliding plate is vertically and slidably installed on the sliding seat, and the adjusting plate is matched with a sliding groove in the lowest point of the sliding plate; therefore, the LED element is opposite to the probe part of the spectrum device, then the light shielding plate is inserted in a sliding manner, the single detection hole in the light shielding plate singly corresponds to the LED element during working, and then optical testing can be carried out through the spectrum device, so that whether the single LED element on the LED light bar meets optical requirements or not is known; and the LED elements on the LED light bar do not need to be desoldered manually in advance before testing, so that detection after single desoldering of a plurality of LED elements is not needed when the LED light bar is detected, and waste of samples is reduced.

This invention belongs to the field of micro / nano fabrication and optical testing technology, specifically relating to a high-resolution test card for dielectric materials in the EUV and soft X-ray bands. The test card includes a substrate and a Siemens star test pattern formed thereon. The test card uses silsesquioxane (HSQ) as the structural material and is fabricated using electron beam lithography. The structural height can reach 500 nm with a minimum linewidth of 10 nm. This invention utilizes the dual absorption and strong phase modulation capabilities of HSQ in the EUV / soft X-ray bands, making it suitable for both absorption contrast and phase contrast imaging modes in system resolution calibration and performance evaluation. This test card offers advantages such as standardized patterns, high resolution, adjustable contrast, and good fabrication consistency, providing crucial metrological support for the performance testing of high-end EUV / soft X-ray optical imaging and lithography systems.

This invention relates to the field of microscopic spectroscopy testing technology, specifically a tunable fiber bundle integrated optical measuring rod and testing method. The rod includes a carbon fiber shell-shaped main body, an optical fiber bundle fixedly mounted at the top of the main body, a focusing stage fixedly mounted at the bottom of the main body, a sample holder fixedly placed on the focusing stage, and an optical fiber collimator fixedly positioned above the sample to be tested. A laser is connected to the input end of the fiber bundle head, and a detector is connected to the output end. The tail of the fiber bundle is fixedly mounted on the optical fiber collimator. The position and angle of the focusing stage are adjustable. The sample to be tested is fixedly placed on the sample holder, and a power line is connected to the main body to supply power to the sample holder. This invention features a simple structure, convenient operation, adjustable focusing stage position and angle, good optical testing light collection efficiency, and the ability to perform optical measurements of samples and multifunctional transmission optical path testing using the fiber bundle as a carrier. It also boasts high detection efficiency and stable performance.

A device of integrating production line data as auxiliary data for abnormality analysis and a method thereof are disclosed. A repair / repairable system obtains defect repair information generated by an inspection station sited behind an automated optical inspection device and determining that a target material is abnormal, material data of the target material is read based on defect location information from an optical test data sheet generated by integrating an optical inspection data generated by the AOI device and a control management data generated by control management systems on a production line. A component location image is extracted from a material image of the target material based on the defect location information of the defect repair information, and the material data. The defect repair information and the component location image are integrated to generate integration information of the target material.

A structure and method for the wafer level testing of interposer-based photonic integrated circuits is described that includes the formation of an upturned mirror structure and the method of utilizing the interposer-based mirror structure for electrical and optical testing of optoelectrical circuits that include emitting components such as lasers, detecting components such as photodetectors, and both emitting and detecting components. Electrical activation of the optoelectrical emitting or sending devices and the subsequent detection and measurement of the optical signals in detecting or receiving devices provides information on the operability or functionality of the PIC on the die at the wafer level, prior to die separation or singulation, using the electrical and optical components of the PIC circuit.

The application provides a spherical mirror multi-working-condition surface shape stability measurement method and system, relates to the optical testing technical field, and includes the following steps: constructing a double-layer state machine, monitoring a support contact state and an air path state in real time, generating corresponding state identifiers based on load sensing data and optical path monitoring data, determining topology annealing sequence parameters by using the state identifiers and performing topology annealing, and finally performing interference measurement in a stable state and generating stability evaluation index data. The application overcomes the problem of measurement uncertainty caused by the coupling of support topology micro-slippage and air path disturbance in the prior art, and improves the accuracy and reliability of surface shape stability evaluation of a large-aperture spherical mirror under multiple working conditions.