294 results about "Optical testing" patented technology

The invention relates to the technical field of optical nondestructive testing equipment for the sealing performance of a blueberry bottle opening, in particular to an optical nondestructive testing device and method for the sealing performance of the blueberry bottle opening. According to the technical scheme, the optical nondestructive testing device for the sealing performance of the blueberry bottle opening comprises an optical testing device, mounting grooves, a lead screw, a mounting support, a mounting ring, a Fresnel lens, a micrometer caliper, a double-color laser line light source and a rotating motor, and the mounting grooves are formed in the two sides of the interior of the optical testing device; compared with a traditional optical nondestructive testing device for the sealing performance of the blueberry bottle opening, a single light source or a simple lens group is mostly adopted, a 360-degree annular area of the bottle opening is difficult to cover, illumination on the edge of the bottle opening or a complex curved surface area is insufficient, and tiny defects are prone to being omitted; according to the optical nondestructive testing device for the sealing performance of the blueberry bottle opening, the double-color laser line light source is matched with the Fresnel lens array, multispectral reflection data are synchronously collected, the surface micro-mark contrast is enhanced by utilizing wavelength difference, and the monochromatic light detection sensitivity is effectively improved.

According to one embodiment, an optical test apparatus includes a first aperture, a second aperture, an image sensor, and a first lens. The first aperture includes a first aperture plane provided with a first wavelength selecting region. The second aperture includes a second aperture plane provided with a second wavelength selecting region different from the first wavelength selecting region. The image sensor is configured to image a light beam passing through the first aperture plane and the second aperture plane and reaching an imaging plane. The first lens is configured to make a light beam passing through the first aperture plane and the second aperture plane be incident on the imaging plane.

The invention relates to a method for extracting the mass center of a laser spot image based on laser size and gray scale, and relates to the technical field of digital image processing, optical testing and Matlab programming. The method comprises the following steps: step 1, obtaining a fourth grayscale image; 2, processing the generated fourth gray level image, and solving an X coordinate value and a Y coordinate value of the mass center of each image in the test time period; and step 3, obtaining a final centroid coordinate value. According to the method for extracting the mass center of the laser spot image based on the laser size and the gray level, the influence of noise points, stray light and the like on the overall measurement result is reduced to the maximum extent, meanwhile, the numerical image processing process is clear in logic and reasonable in analysis, the actually obtained result meets the expectation, data calculation is simple, and the processing process is efficient and rapid. And adopted data processing software is also universal and common, and is easy to popularize.

The present invention relates to optical coupling between optical components, and more particularly to an optical probe (1) configured for optical testing of at least one micro-optical component (50), a method for manufacturing an optical probe (1), and a method for optical testing of at least one micro-optical component (50). The invention relates to an optical probe (1) comprising:-a probe head (10) wherein the optical properties of the probe head (10) are calibrated and wherein the probe head (10) comprises a test circuit (2) wherein the test circuit (2) is fixed on a mechanical support; -at least one micro-optical element (20), where the micro-optical element (20) is a separate component with respect to the test circuit (2) and is in mechanical contact with the test circuit (2), where the micro-optical element (20) is configured to optically couple light between the test circuit (2) and the micro-optical component (50), thereby being configured to determine an optical performance of the micro-optical component (50).

The invention provides a Faraday sheet performance measurement and polarization imaging system and method, and relates to the technical field of optical testing. The system comprises a light source system, an optical research platform, a polarizer, a first analyzer, a microscopic imaging system and an image acquisition system, the light source system is used for emitting laser; the optical research platform is used for arranging a to-be-measured Faraday sheet and generating a magnetic field; the microscopic imaging system comprises an eyepiece and an objective lens, and the image acquisition system comprises an image acquisition mechanism; in the first propagation direction of the laser, the light source system, the polarizer, the Faraday piece to be measured, the objective lens, the first polarization analyzer, the eyepiece and the image acquisition mechanism are sequentially arranged. According to the Faraday piece performance measurement and polarized light imaging system, the laser polarization state is accurately controlled, the polarization direction change is accurately detected, and the amplification and focusing functions of a microscopic imaging system are combined, so that the accuracy and comprehensiveness of the performance test of the Faraday piece adopting a magneto-optical film are improved, and the test cost is reduced.

The invention provides a high-parallelism test method of an optical comprehensive test platform, relates to the field of active optical testing, and aims to realize parallel testing of multiple tested objects or multiple test items through N independent test channels, avoid waiting time of traditional serial testing, and effectively improve manufacturing efficiency by combining the high-parallelism characteristic of the platform. Dynamic resource scheduling distributes tasks based on channel resource states monitored in real time, resource idling is avoided, the characteristic of high integration of a platform is matched, multiple modules share the platform, cost is effectively shared, the overall utilization rate of equipment is improved, modules such as optical power meters and variable optical attenuators integrated in all channels in a hardware architecture support hot plugging, and the overall performance of the equipment is improved. And the task analysis algorithm can flexibly map test items, adapt to requirements of different tested objects, conform to the advantages that the platform is matched as needed and easy to expand, can protect investment and adapt to dynamic changes of a test scene, and a distributed data acquisition mechanism synchronously acquires data of each channel and provides support for generating a reliable test report.

The invention relates to the technical field of lens module detection, in particular to lens module EOL detection equipment and method, and the equipment comprises a four-station turntable mechanism which is provided with a plurality of bearing test seats for placing lens modules after code scanning; and a plurality of functional modules arranged around the four-station turntable mechanism, wherein the functional modules comprise a surface light test module for optical test, a white field detection assembly, a collimator test module and a black field test assembly. By integrating a multi-station automatic detection process, multiple performance detections such as electrical test, definition, color, signal-to-noise ratio, FOV angle of view, COD decentration, white balance, dark corner, stain and black field of the lens module can be synchronously completed, the coverage of detection items is comprehensive, and compared with traditional equipment only performing white field or black field detection, the full-automatic lens module detection equipment has the advantages that the full-automatic lens module detection equipment is simple in structure and convenient to operate.

The invention relates to a double-anti-terahertz compact range assembly error compensation method, which comprises the following steps of: assembling a main support structure, and removing assembly stress through high-temperature aging; a main reflector is installed on the main supporting structure, and the main reflector is calibrated; the current position of the main reflector is calibrated to a reference mirror on the side edge of the main reflector, and a test coordinate system is established based on the reference mirror; an auxiliary reflector mounting bottom plate is mounted on the main supporting structure, an auxiliary reflector is mounted on the auxiliary reflector mounting bottom plate, and the auxiliary reflector is calibrated; calculating the offset of the final position of the feed source assembly relative to the theoretical position of the feed source assembly; and with the main reflector as a reference, the position of the feed source assembly is adjusted based on the offset by adopting a high-precision six-degree-of-freedom platform, so that the feed source assembly is located at a final position. According to the invention, the assembly and calibration difficulty of the sub-reflector is effectively reduced, and the final assembly and calibration precision of the terahertz compact range system is equivalent to the test precision of an optical test instrument, namely the highest precision can be achieved.

The invention discloses a rheology-birefringence combined in-situ testing device and method based on chopper rotation frequency signals, belongs to the technical field of optical testing, and aims to solve the technical problems that an existing Spark-FB device is low in measurement accuracy and limits application scenes. The laser emitter emits a light beam along a set angle (forming an angle of 45 degrees with the horizontal plane), the light beam is converted into linearly polarized light through the polarizer, and an optical signal is modulated through the rotating chopper; the modulated light beam penetrates through a polymer sample to which a shear flow field is applied by a commercial rheometer, and transmission light carrying optical anisotropy information of the sample sequentially passes through a 1 / 4 wave plate and a polarization analyzer, and is finally received by a photoelectric detector and transmitted to a lock-in amplifier for analysis. According to the invention, an independent datum reference signal is provided through the chopper, decoupling and combination of a commercial rheometer and a birefringence light path are realized, and synchronous and accurate in-situ measurement of rheological and optical properties of a high polymer material under a deformation condition can be realized.

The invention provides a detonation pressure optical testing device for a micro-dose powdery explosive, which comprises a rotating mirror type scanning camera and an explosive detonation unit, and is characterized in that the rotating mirror type scanning camera is used for collecting a shock wave motion trail image when the powdery explosive is detonated; the explosive detonating unit comprises an organic glass column body and a high-pressure exploder, an explosive charging hole with an open top is formed in the organic glass column body in the axial direction, a stress wave adjusting rod is arranged in the explosive charging hole in a penetrating mode, and the bottom face of the stress wave adjusting rod can make contact with powdery explosives charged into the explosive charging hole; a first detonating hole and a second detonating hole are coaxially formed in the organic glass column body in the radial direction, and both the first detonating hole and the second detonating hole communicate with the charging hole; the heating wire penetrating through the first detonating hole, the charging hole and the second detonating hole can make contact with the powdery explosive in the charging hole, and the two ends of the heating wire are connected with the positive electrode and the negative electrode of the high-pressure exploder correspondingly. According to the invention, a traditional detonation mode is not needed, the interference of the detonator and the explosion expanding explosive on the measurement process of the sample with the small explosive quantity is solved, and the test convenience and the test precision are improved.

Method for producing an optical test element (19) for determining a fit defect of an optical surface (20). The method comprises the following steps: - Determining a CGH design (24) suitable for measuring the optical surface (20), - Generating a CGH auxiliary structure (25) corresponding to the CGH design (24) on an auxiliary substrate (30) using a direct-write lithography process, - Generating an image of the CGH auxiliary structure (25) on a final substrate (40) using a transfer lithography process, - Generating a CGH structure (50) corresponding to the CGH design (24) based on the generated image. The method offers the advantage that the auxiliary substrate can be produced with high precision using a standardized direct-write lithography system, regardless of the size of the optical test element.

The invention provides an optical test function high and low temperature test box control system for electronic components, relates to the technical field of optical test, and provides an optical test function high and low temperature test box control system for electronic components through innovative technologies such as a double-target real-time sensing module, core temperature feed-forward compensation, window distortion active compensation, data validity discrimination and adaptive scheduling. The real junction temperature of an electronic component in a high and low temperature test box is highly consistent with the ambient temperature, the wavefront aberration of an observation window is counteracted in real time, abnormal data are automatically discriminated and remeasured, the temperature control precision is improved to + / -0.1 DEG C and the wavefront distortion residual error is reduced to lambda / 20 through dynamic temperature point selection based on gauss process regression and thermal inertia model game, and the temperature control precision is improved to + / -0.1 DEG C and the thermal inertia model game. The test period is shortened by more than 30%, the data misjudgment rate is lower than 1%, and the test precision, fidelity and efficiency are remarkably improved.

The invention relates to an optical automatic centering method, aims to solve the technical problems that an existing cross-core positioning method is low in working efficiency and cannot meet the high image quality requirement of optical system testing, and provides an optical testing system with an automatic centering function and an automatic centering method. The method comprises the following steps: presetting parameters of a to-be-detected lens, controlling an electric control turntable to rotate to drive the to-be-detected lens to rotate to two contrast view fields, and performing automatic focus scanning at the two contrast view fields by using a microscopic detection system to obtain image quality parameters or other reference parameters of different image surfaces of the to-be-detected lens at the two contrast view fields; the included angle between the optical axis of the to-be-measured lens and the optical axis of the light source system is calculated, and the included angle is eliminated by rotating the high-precision rotating table, thereby realizing automatic centering.

The invention discloses a performance test device for metal cutting fluid production, which comprises a test workbench, a test turntable and an optical test probe, the test turntable is arranged at the top of the test workbench, and the optical test probe is arranged above the test turntable. The test turntable is used for transferring different metal cutting fluids to the detection end of the optical test probe, and the optical test probe is used for detecting the concentration of nano-scale wear particles in the metal cutting fluids by virtue of a quantum dot luminescence technology. Through the design of a cutting fluid circulating assembly, by means of work of a driving motor, a driving rotating shaft can be driven to rotate, then a turbine is driven to rotate, and when the turbine rotates, cutting fluid in an inner cavity of a cutting fluid circulating bin can be driven to circulate through inner cavities of a downward-extending square pipe, an attaching pipeline, a circulating hose, a pipeline connector and a gooseneck pipe; the environment for using the cutting fluid is conveniently simulated, and meanwhile, the sampling uniformity can be improved by the continuously flowing cutting fluid.

The invention discloses a radiation intensity measurement method of an infrared radiation simulation source system, and belongs to the technical field of infrared radiation characteristic measurement. The method comprises the following steps: firstly, performing radiometric calibration operation on an infrared radiation simulation source system and an infrared detector; a medium-wave infrared optical system and an infrared detector are used for receiving infrared radiation signals, and continuous radiation is converted into alternating signals through modulation of an optical chopper, so that the measurement signal-to-noise ratio is increased. Collected alternating signals are processed by the filtering gain amplification circuit so as to enhance signal stability. And then dynamic denoising and state estimation are carried out on measured data by adopting a Kalman filtering algorithm, and nonlinear error compensation is carried out in combination with a medium-wave infrared radiation coefficient correction algorithm, so that a high-precision radiation intensity correction coefficient is obtained. Compared with a traditional method, the self-adaptive filtering and radiation intensity correction technology is combined, the measurement precision and the real-time performance are improved, and the method can be widely applied to the fields of infrared optical testing, target characteristic analysis and radiation measurement.

This invention provides a testing method and apparatus for a metasurface structure detector, relating to the field of photodetector testing technology. The method includes: mounting the metasurface structure detector on a sample stage with its photosensitive surface facing an optical testing system, the optical testing system including a coaxially arranged laser irradiation optical path and an infrared imaging optical path; imaging the photosensitive surface using the infrared imaging optical path to obtain a surface image of the photosensitive surface; determining multiple test positions on the photosensitive surface based on the surface image, and planning scanning paths for the multiple test positions on the photosensitive surface according to the structural period of the micro / nano periodic structural unit and the laser irradiation optical path; controlling the sample stage along the scanning path to sequentially align the multiple test positions with the laser irradiation optical path, and sequentially emitting laser light to the multiple test positions through the laser irradiation optical path to obtain scanning data for the multiple test positions; and generating a physical field distribution map of the photoelectric properties of the metasurface structure detector based on the scanning data.

Disclosed in the present invention are: a far-field simulator that simulates a beam in a form of propagation from a remote point; and an optical test system including same. The far-field simulator comprises: a beam splitter configured to split an incident beam into a first beam and a second beam; a first far-field simulation unit configured to increase the curvature of a wavefront of the first beam passing through the beam splitter to simulate the first beam in a form of propagation from a remote point; and a second far-field simulation unit configured to increase the curvature of a wavefront of the second beam passing through the beam splitter to simulate the second beam in a form of propagation from a remote point, wherein the first beam emitted through the first far-field simulation unit is formed to have a greater diameter than the diameter of the second beam emitted through the second far-field simulation unit.

The present invention belongs to the field of optical testing technology, and in particular relates to a ghost image analysis method, device and storage medium for a space telescope bandpass camera. The ghost image analysis method for a space telescope bandpass camera comprises the following steps: obtaining a square aperture angle #imgabs0# of the space telescope bandpass camera; measuring the transmittance and reflectance of a filter, wherein the transmittance of the front surface of the filter is #imgabs1#, the transmittance of the rear surface of the filter is #imgabs2#, the reflectance of the front surface of the filter is #imgabs3#, and the reflectance of the rear surface of the filter is #imgabs4#; measuring the reflectance of a detector, wherein the reflectance of the surface of the detector is #imgabs5#; measuring the thickness #imgabs6# of the filter, and measuring the distance #imgabs7# between the filter and the detector; and performing ghost image analysis based on an illumination distribution function of the ghost image and energy, radius, coordinate calculation formulas and the like. The present invention achieves, for the first time, quantitative analysis of the specific position, shape and magnitude of the ghost image, and can be used for generating scientific simulation images.

The utility model relates to an optical testing device for a detector, which comprises a bottom plate, a base and a detector fixing assembly, the bottom plate comprises a base connecting part and a limiting part, the base connecting part is used for being rotatably connected with the base, and the limiting part is used for limiting the rotation angle of the base. The base is detachably arranged on the bottom plate and can rotate on the bottom plate; the base comprises a first bottom plate connecting part, a second bottom plate connecting part, a first limiting matching part and a second limiting matching part; wherein the first bottom plate connecting part and the second bottom plate connecting part are located on two planes perpendicular to each other, and the base can be taken down to change the bottom plate connecting part matched with the base connecting part. The detector fixing assembly is arranged on the base and is used for fixing a detected detector; when the base rotates, the detector fixing assembly rotates along with the base to drive the detector to swing. The operation is simple, the test process is simplified, and the production efficiency is improved.

According to one embodiment, an optical test apparatus includes a first aperture, a second aperture, an image sensor, and a first lens. The first aperture includes a first aperture plane provided with a first wavelength selecting region. The second aperture includes a second aperture plane provided with a second wavelength selecting region different from the first wavelength selecting region. The image sensor is configured to image a light beam passing through the first aperture plane and the second aperture plane and reaching an imaging plane. The first lens is configured to make a light beam passing through the first aperture plane and the second aperture plane be incident on the imaging plane.

The invention relates to wafer test equipment, which comprises an electric test assembly, which is arranged on a mounting rack and comprises a telescopic member, a fixed end of the telescopic member is provided with a probe disc, the probe disc is provided with a plurality of probes corresponding to electrode pads of a wafer chip to be tested one by one, the probe disc is provided with a plurality of through holes between the probes, and the through holes are communicated with the probe disc. The telescopic end of the telescopic piece is provided with a suction cup, the suction cup is located below the probe disc, and the suction cup is provided with a plurality of suction rods extending into the through holes; and a light testing assembly. According to the wafer test equipment, the to-be-tested wafer is fixed on the suction rod after the angle and the position of the to-be-tested wafer are adjusted, and then the suction cup is driven to move downwards, so that the probes on the probe disc can be in contact with the metal bonding pads of the chips on the to-be-tested wafer, and electrical performance tests can be simultaneously carried out on all the chips on the wafer through the plurality of probes; and the optical fiber array disc is moved to be positioned on the wafer, so that all chips can be subjected to optical testing at one time, and the testing efficiency of the wafer is greatly improved.

The utility model relates to the field of optical testing equipment, and particularly provides a tool for testing a laser, which comprises an installation platform; the rotating platform is rotationally arranged on the surface of the mounting platform; a driving part of the rotary driving assembly is connected with the rotary platform; the laser mounting platform is arranged at the upper part of the rotary driving assembly, and a plurality of to-be-tested lasers are arranged in the laser mounting platform; the test circuit board is arranged between the laser mounting platform and the rotating platform; the laser receiving device is arranged on one side of the rotating platform; the automatic filling platform is arranged on the other side of the rotating platform, and the filling end of the automatic filling platform is arranged close to the laser mounting platform; according to the utility model, through the above structural design, the performance of the laser can be rapidly tested, and the problem that the pins of the laser are easy to damage due to the traditional test means is solved.

The invention discloses a three-dimensional measurement device and method for optical signals in an optical engine cylinder based on a three-dimensional chromatography method, and belongs to the technical field of combustion diagnosis and optical testing of internal combustion engines. The control acquisition system is respectively matched with the first high-speed camera and the second high-speed camera to finish acquisition of output signals, transmits the acquired data to the control acquisition system, and finally obtains instantaneous three-dimensional distribution of optical signals in the cylinder through three-dimensional reconstruction; according to the three-dimensional measurement device and method for the optical signals in the optical engine cylinder based on the three-dimensional chromatography, projection data of the optical signals in the cylinder are synchronously obtained through a plurality of side cylinder wall visual angles and a bottom surface visual angle, and three-dimensional distribution of the optical signals in the cylinder is reconstructed by utilizing a three-dimensional chromatography algorithm, so that the spatial resolution is improved, and the measurement accuracy is improved. The measurement precision is enhanced, and accurate combustion process analysis is realized in a high-temperature and high-pressure environment.

The invention relates to a method for determining an optical reflectivity of a curved surface (3) of an optical test object (2), in particular a mirror or lens, wherein the reflectivity (R) is determined using a reflectometer (4), in particular an EUV reflectometer, which comprises a light source (5) and a light sensor (6), and wherein, in order to determine the reflectivity, a light beam (7) from the light source (6) reflected on the surface (3) is captured by the light sensor (6) at least at a predetermined distance from the test object (2). According to the invention: the light sensor (6) is displaced at least once for a calibration process such that the reflected light beam (7) is captured at varying distances (x) from the surface (3) of the test object (2), and a reflectivity (R) is determined for each distance (x); and a baseline reflectivity of the surface (3) is determined depending on the captured reflectivities (R).

The invention discloses a lithium ion battery explosive power testing device and method. The testing device comprises an anti-explosion tank, a functional material, a thermal runaway triggering unit, a shock wave overpressure testing unit, an optical testing unit and an explosion noise testing unit. The functional material is laid on the inner wall of the anti-explosion tank and has the functions of heat insulation, flame retardance, sound absorption and wave absorption; a lithium ion battery to be tested is arranged in the anti-explosion tank; the thermal runaway triggering unit is used for triggering thermal runaway of the lithium ion battery to explode; the shock wave overpressure test unit is used for measuring a shock wave pressure curve after the battery explodes; the optical test unit is used for measuring luminous intensity and temperature after the battery explodes; the explosion noise test unit is located above the lithium ion battery to be tested and is used for measuring the sound intensity generated by battery explosion. According to the invention, the explosive power of the battery after thermal runaway can be comprehensively evaluated through a multi-dimensional test means.

The present invention relates to optical coupling between optical components, and more particularly, to an optical probe (1) configured for optical testing of at least one micro-optical component (50), a method for producing an optical probe (1), and a method for optical testing of at least one micro-optical component (50). The optical probe (1) comprises:-a probe head (10), wherein the probe head (10) comprises a test assembly (2); -at least one micro-optical element (20), where the micro-optical element (20) is a separate element with respect to the test component (2) and is in mechanical contact with the test component (2), where the micro-optical element (20) is configured to optically couple light (3) between the test component (2) and the micro-optical component (50), thereby being configured to determine an optical property of the micro-optical component (50), and wherein the micro-optical element (20) is configured to operate in an index matching liquid (17).

The invention provides a TDLAS (tunable diode laser absorption spectroscopy) optical test window for a high-temperature and high-pressure environment, and belongs to the technical field of aero-engine tests. The mounting base is provided with a rectangular channel penetrating front and back and a mounting groove communicating with the rectangular channel, and the rectangular channel is provided with a cold water gas pipeline; the optical glass is installed in the installation groove, an elastic protection gasket is arranged on the side edge of the optical glass, the optical glass is limited through a gland fixed to the installation base, and elastic sealing gaskets are arranged between the gland and the optical glass and between the optical glass and the installation base; wherein a gap is formed between the optical glass and the mounting groove, a gas collecting cavity is formed in the mounting seat, a gas inlet hole communicated with the gas collecting cavity is formed in the outer side of the mounting seat, two rows of cooling holes are formed in one side, facing the optical glass, of the mounting seat, and cooling gas enters the gas collecting cavity through the gas inlet hole and then can flow out from the cooling holes; and the cooling gas cools the optical glass while blowing the optical glass and enters the gap to form gas seal.

This invention discloses a method for aligning and bonding flexible optoelectronic devices and determining rework based on multimodal metrological fusion. It relates to the field of flexible optoelectronic device testing technology. The method includes acquiring visual, electrical, and optical testing data of the bonded flexible optoelectronic device to form initial multimodal state data, applying boundary condition perturbation within the upper limit of the test perturbation and acquiring multimodal state data after the perturbation, performing fusion analysis on the response changes before and after the perturbation, and determining latent failures and rework window states. This relatively improves the ability of rework determination to reflect the actual health status of the device and the feasibility of actual rework.

The utility model discloses a lens optical detection equipment, including workstation and base, is equipped with annular air outlet strip, boss, circular air cavity, annular air cavity, dust suction hole no. The annular air outlet strip is hollow structure, is installed in the base top edge, and the side wall has the air outlet hole of annular distribution, and the boss is located in the base top middle part, and the silica gel pad in its recess is flexible bearing lens, and the circular air cavity is located in the base with annular air cavity, and the annular air cavity surrounds circular air cavity, and is connected dust suction hole no.

The invention discloses an optical test board and optical detection equipment, and belongs to the technical field of optical detection. A plate body of the optical test plate is provided with a test surface, the test surface is provided with an imaging effect detection area, the imaging effect detection area is provided with a picture frame and a first strip-shaped pattern, the picture frame comprises an inner frame and an outer frame, the inner frame is located in the outer frame, and the first strip-shaped pattern is located outside the outer frame. The optical detection equipment comprises a detection assembly and an optical test board, the detection assembly comprises a center imaging device and a side surface imaging device, and the optical test board is used for testing a plurality of imaging devices. According to the invention, the same optical test board can be utilized to meet the test requirements of a plurality of imaging devices.