The invention discloses a
system for automatically testing the parameters of a
quartz crystal oscillator, which comprises a master computer and a parameter
test card connected with the main board of the master computer, wherein the parameter
test card comprises a singlechip and a test circuit and a
reference circuit which are connected with the singlechip respectively. The singlechip has a D / A module, an A / D module, a first counter, a second counter and a
timer. The test circuit comprises a current amplification circuit, a
voltage sampling
resistor, a frequency dividing circuit, a first measurement
gate control circuit and the
crystal oscillator to be measured. The
reference circuit comprises a reference frequency source, a frequency multiplication circuit, a second measurement
gate control circuit and a frequency dividing and high-frequency
signal latch circuit. In the invention, the
test card integrates the functions of all apparatuses such as a
frequency counter, a digital
voltmeter and a digital oscillometer and can be directly inserted in the main board of the computer, and the
fully automatic test of various parameters, such as working frequency, working current and
start up time, of the
quartz crystal oscillator can be realized by a control program.