52 results about "Test card" patented technology

Configurations for a system, method, and device for determining test card status and / or sample integrity are disclosed. Determining test card status and / or sample integrity includes assessing the pressure measurements of a pumping system in a sample analyzer to determine a threshold. The sample integrity may be determined by comparing pressure measurements of the pumping system attached to a test card to a threshold, which may be related to whether the test card is an empty test card or a prefilled test card. The sample integrity may be determined to be intact when the test card is determined to be an empty test card, and the user may be prompted to inject a sample into the test card. The sample integrity may be determined to be compromised when the test card is determined to be a prefilled test card, and the user may be prompted to discard the test card.

1. The name of the design product: test card hook (b). 2. The use of the design product: small tools used in the process of testing circuit board. 3. The design points of the design product: in shape. 4. The picture or photo that best shows the design points: perspective view 1.

This invention belongs to the field of micro / nano fabrication and optical testing technology, specifically relating to a high-resolution test card for dielectric materials in the EUV and soft X-ray bands. The test card includes a substrate and a Siemens star test pattern formed thereon. The test card uses silsesquioxane (HSQ) as the structural material and is fabricated using electron beam lithography. The structural height can reach 500 nm with a minimum linewidth of 10 nm. This invention utilizes the dual absorption and strong phase modulation capabilities of HSQ in the EUV / soft X-ray bands, making it suitable for both absorption contrast and phase contrast imaging modes in system resolution calibration and performance evaluation. This test card offers advantages such as standardized patterns, high resolution, adjustable contrast, and good fabrication consistency, providing crucial metrological support for the performance testing of high-end EUV / soft X-ray optical imaging and lithography systems.

This application relates to a reagent test card and its sample loading assembly. The sample loading assembly of the reagent test card includes a sample loading structure. The sample loading structure has a first end and a second end opposite to each other. The first end is used to connect to or abut against the detection part of the reagent test card. The sample loading structure forms a hollow channel extending from the first end to the second end. The inner wall material of the hollow channel is hydrophilically modified and the inner wall is smooth. And / or, the sample loading structure has a slit extending from the first end to the second end. The wall material of the slit is hydrophilically modified and the wall is smooth. On the one hand, the sample solution flows more uniformly and smoothly inside the hollow channel of the sample loading structure, and direct sample loading can be achieved while maintaining the original structure of the detection part. The sample loading operation is more convenient and reliable, and can realize the diversification of application scenarios and user groups. On the other hand, it can achieve uniform and residue-free sample loading, and the detection sensitivity and detection accuracy of the detection part are guaranteed.

This invention relates to the field of food safety testing technology and discloses an automatic matching method for batch parameters of malathion test cards with QR code traceability. The method includes collecting the dual-matrix Lab color space values ​​of the QR code label paper and NC film in the test card, constructing an aging decay function relationship table and an initial coupling correlation matrix, and encoding an encrypted QR code. During testing, a single frame of original image is acquired to extract real-time chromaticity feature vectors of the dual-matrix region, and the aging feature modulus is calculated by combining it with the initial coupling correlation matrix. Based on the aging feature modulus, the aging decay function relationship table is queried to dynamically correct the initial standard curve parameters and generate a real-time standard curve, thereby outputting the malathion concentration. This invention constructs an intrinsic aging indication mechanism through dual-matrix chromaticity difference, achieving adaptive reconstruction of the standard curve according to the aging state of the test card, ensuring detection accuracy throughout the entire lifecycle.

The present application belongs to the field of micro-nano processing and X-ray optical testing technology, and particularly relates to a high-resolution test card in hard X-ray band and a preparation method thereof. The test card adopts electron beam lithography combined with proximity effect correction technology to prepare an HSQ template pattern, forms a Siemens star structure with a minimum line width of 10 nm and a height of 500 nm, and then covers a metal working layer on the template surface through atomic layer deposition technology. The HSQ template pattern has a duty cycle less than 1, effectively improving the aspect ratio of the pattern. The covering of the metal working layer doubles the line density of the final pattern. The present application breaks through the resolution limit of the traditional test card, solves the problem of preparation of high-aspect-ratio nano structures, and has simple and reliable process, and is suitable for resolution calibration of absorption contrast and phase contrast imaging systems in hard X-ray band, thereby providing key technical support for performance evaluation of high-end X-ray optical systems.

1. The name of the design product: swab sample detection card. 2. The use of the design product: the design product is used for elution and detection of swab samples. 3. The design points of the design product: the combination of shape and pattern. 4. The picture or photo that best indicates the design points: usage state figure 1.

The application relates to a calibration method, device and computer equipment of a binocular device. The method comprises the following steps: acquiring and determining a rotation matrix, an offset matrix and an internal parameter of each camera based on a calibration board image pair; obtaining a reference image of the calibration board on the premise that the lens of a reference camera is parallel to the calibration board; determining the external parameter of the reference camera based on the reference image and the internal parameter of the reference camera; determining the transformation matrix of the reference camera and the transformation matrix of a non-reference camera based on the rotation matrix and the offset matrix between each camera of the binocular device and the external parameter of the reference camera; and calibrating the binocular device to obtain a binocular device with a fixed visual axis. The method can solve the problem that the existing calibration method of the binocular device cannot make the data of edge uniformity and unit relative distortion meet the test standard when the binocular endoscope is tested for edge uniformity or unit relative distortion, and the test card has trapezoidal distortion in the image.

The utility model provides a mobile device rear camera shooting test fixture, comprising a base plate, a support plate vertically arranged on the upper surface of the base plate, a camera test card arranged on the support plate, a device support slidably arranged on the upper surface of the base plate, a sliding mechanism arranged between the device support and the base plate, and a moving direction of the sliding mechanism perpendicular to the support plate. And the upper surface of the bottom plate is provided with a plurality of groups of positioning mechanisms for positioning a detection position. According to the utility model, through the arrangement of the equipment bracket capable of sliding, when equipment detection is carried out, equipment is placed on the equipment bracket, and then the equipment bracket is positioned by sliding the equipment bracket and using the positioning mechanism, so that the equipment is subjected to a post-shooting test at a corresponding detection position. The problem of inaccuracy caused by manual visual inspection detection is avoided, fatigue generated in the process that manual long-time multi-frequency equipment taking is carried out for horizontal lifting testing is reduced, and detection accuracy is guaranteed.

A card reading system in which electrical contact between a test card and a card reader is achieved by vertical actuation of a card interface relative to the test card. In one embodiment, a test card reading system includes: (a) a card reader including at least one card interface having a plurality of card interface contacts; (b) a test card having card contacts; and (c) a vertical actuating mechanism which is used for generating relative vertical movement between the test card and the card interface, so that at least one part of the card interface contacts are contacted with the card contacts.

1. Name of the product in this design: Test Card (1). 2. Purpose of this design: A test card for liquid sample testing. 3. The key design feature of this product is its shape. 4. The image or photograph that best illustrates the key design points: Design 2 3D diagram. 5. Design 2 is designated as the basic design.

The application discloses an optimization focusing method, system, device and storage medium of a camera module. The method comprises the following steps: acquiring a test card image by using a camera module; manually adjusting the focal length of the camera module and acquiring the first MTF value of all regions of the test card image in real time; comparing the first MTF value with the first specified threshold value; if the first MTF value is greater than the first specified threshold value, acquiring the second MTF value of the central region of the test card image; acquiring the drop value of the second MTF value; if the drop value is greater than the size of the multiple of the specified step length, and the second MTF value is greater than the set standard value, taking the focal length position corresponding to the second MTF value as the peak point of the camera module; if the second MTF value is less than the set standard value, repeatedly executing the above steps until the specified number of cycles is reached. By acquiring the corresponding focal length when the second MTF value decreases as the peak point of the camera module and stopping scanning defocus calculation, the uniform standard of the camera module product is ensured, and the optimization focusing time is shortened.

The invention discloses a test card and a host, and relates to the technical field of test.According to the technical scheme, firstly, after a plurality of different test interfaces are arranged on the test card, when the host comprises a plurality of different slots, the slots can be tested through the different test interfaces of the test card; in this way, the problem that part of the slots cannot be tested can be avoided, and then the test coverage rate can be increased. Secondly, the test interface comprises an identification pin, and the controller can determine a target test interface connected with the host based on the voltage of the identification pin of each test interface. Thus, in the testing process, different testing interfaces can be sequentially connected with the host, and the testing flexibility is improved. And finally, the test card supports loopback test and card function test, and test mode selection can be carried out through a configuration end of the information loading circuit. Therefore, each slot of the host can be tested according to a plurality of different test modes, so that the test coverage rate is improved.

This utility model relates to the field of electronic disk testing technology, and more particularly to an adapter test card for NVMe electronic disks. The adapter card includes a PCIe interface, an NVMe electronic disk interface, an external power interface, a DC-DC converter circuit, a sampling circuit, a PCIe signal repeater, and a data processing and output unit. The DC-DC converter circuit includes three DC-DC converters for receiving power input from the external power interface and providing 3.3V, 1.8V, and 12V power rails. The sampling circuit is connected in series with the power rails of the DC-DC converter circuit to monitor the instantaneous current and voltage of each rail. The PCIe signal repeater is electrically connected to the PCIe interface and the NVMe electronic disk interface to monitor link data. This utility model is powered by an external power interface, monitors the power consumption characteristics of multiple power rails, monitors link status, and achieves coordinated analysis of power consumption and signal quality to accelerate fault location. The design reduces noise interference and crosstalk, and is highly integrated.

This invention provides an automatic switching device for automotive camera test cards, comprising a frame with several card slots, several mounting frames containing test cards, a moving frame, a translation mechanism, a lifting frame, a lifting mechanism, a cleaning frame, and a lifting mechanism. The cleaning frame is equipped with an upper support with a dry wiping component and a lower support with a spray cleaning component and a drive mechanism, and is provided with an adjustment mechanism to adjust the positions of the two components. Through the cooperation of the moving frame, translation mechanism, lifting frame, and lifting mechanism, the lifting frame can be driven to move to any mounting frame and lift the mounting frame along with the test cards, realizing automatic switching of test cards and improving testing efficiency. Through the adjustment mechanism in conjunction with the lifting mechanism and drive mechanism, the dry wiping cleaning mode and the spray cleaning mode can be switched to maintain the cleanliness of the test card surface, improve the accuracy of testing, and reduce the labor consumption of manual cleaning.

This invention discloses a method for detecting answer sheet filling patterns based on YOLOv7 optimization. The method includes: acquiring simulated answer sheet images, generating an answer sheet image dataset, labeling the simulated answer sheet image data in the dataset, and performing enhanced preprocessing to obtain an expanded answer sheet image dataset, which is further divided into a training set, a validation set, and a test set; building an improved YOLOv7 network model; training the improved YOLOv7 network model using the training set and validating it using the validation set to obtain a trained improved YOLOv7 network model; finally, inputting the test set into the trained improved YOLOv7 network model to obtain the labeled information of the detected answer sheet filling patterns. The answer sheet filling patterns detected by this invention can clearly distinguish between correct and incorrect ones, providing corresponding technical support for answer sheet graders working in complex backgrounds of dense filling.

The application provides a dry biochemical test card, a method and a test card system capable of identifying detection items, wherein a plurality of holes with different colors are arranged in the test card, the colors in the holes are corresponded to categories of the detection items, and threshold values of the colors in the holes are stored in an ID card; when the colors in the holes are identified, the corresponding categories of the detection items can be obtained; in order to prevent the ID card corresponding to the test card from being inconsistent, the identified color information in the holes is compared with the threshold values stored in the ID card to determine consistency. The application can reduce the complexity in identifying the detection items of the test card, improve the identification efficiency, prevent inconsistency and improve effectiveness.

The embodiment of the invention provides a board card test system, a test method and computing equipment. Comprising a to-be-tested board card which comprises a first programmable logic controller, and the first programmable logic controller is provided with a first pin; the first programmable logic controller comprises a plurality of second pins, and after the first programmable logic controller enters a test state, the plurality of second pins are used for sending a test code stream; the test code stream is used for determining a to-be-tested signal path after entering a test state; the test card is connected with the to-be-tested board card and comprises a second programmable logic controller, and the second programmable logic controller is used for receiving the test code stream, determining a to-be-tested signal channel based on the test code stream, executing test operation on the to-be-tested signal channel, collecting signal level changes on the to-be-tested signal channel and sending the signal level changes to the to-be-tested board card. Therefore, whether the to-be-detected signal channel is normal is determined. In the unified test state, the to-be-tested signal path is detected, so that the test efficiency can be effectively improved.

The application provides a terminal testing method, device and computer readable storage medium, the method comprising: informing a target test card to generate a test short message; encapsulating the test short message, card information and network access information of the target test card into a first data packet and sending the first data packet to a card remote agent; receiving a reply short message sent by the test terminal for the test short message, the reply short message being obtained by processing the test short message according to the network access information and according to preset test requirements by the target simulation white card. The method, device and computer readable storage medium can solve the problem that the existing terminal testing method needs to have a real card built in the test terminal and occupies one-to-one code number resources, and cannot meet the remote testing requirements of the test terminal.

The invention relates to a method for cleaning contact needles (4) and an optical functional surface of a test card (1) for testing optoelectronic chips.

This invention discloses an early warning system and method for peritoneal dialysis infection. The early warning system includes a disposable test card and a detection device. The disposable test card has a sample inlet, a sampling chamber, a reaction chamber, and an observation window that are sequentially fluid-connected. The reaction chamber is pre-filled with a lyophilized metabolic catalytic medium, which includes a concentrated substrate, a metabolic activator, and a signal indicator. The detection device has a housing and a temperature control unit, a photoelectric detection unit, a signal processing unit, and a display unit installed within the housing. The temperature control unit controls the ambient temperature of the reaction chamber during a catalytic incubation period. The photoelectric detection unit periodically performs dynamic optical scanning of the observation window during the catalytic incubation period to obtain a time-series detection signal. The signal processing unit assesses the infection risk based on the time-series detection signal.

The invention relates to an online monitoring device, system and method for a sealing test of an optical cable connector box. The online monitoring device comprises an air pressure sensing assembly, a receiver and intelligent equipment, the air pressure sensing assembly comprises a suction cup body, an air pressure sensor and a height adjusting module. The sucker body is adsorbed and fixed on the surface of the optical cable connector box; the air pressure sensor is used for monitoring test data in the box; the height adjusting module can adjust the mounting height of the air pressure sensor; the assembly is installed on a connector box through a sucker to monitor data in real time. The data monitored by the component is wirelessly received; and the intelligent equipment is in Bluetooth matching with the receiver, and receives and visualizes the test data. According to the application, the problem of test clamping leakage can be eliminated, the equipment size is small, the protection level is high, synchronous tracking test can be carried out without dismounting the connector box, data can be read and uploaded in real time, and the data can be accessed to an Internet of Things platform as required for analysis and management.

The invention belongs to the technical field of nuclear power plant DCS board card detection and aging management, and particularly relates to a nuclear power plant IA system signal acquisition card detection system and method, and the system comprises an upper computer which is used for carrying out communication state detection, test card type selection and channel precision setting, and generating a control instruction; the IA signal acquisition card control system is used for installing a tested IA system acquisition card and transmitting a receiving signal of the tested IA system acquisition card; and the IA signal acquisition card detection device is used for generating a standard signal according to the control instruction, performing a performance test on the IA system acquisition card to be tested, automatically comparing the received signal with the standard signal, and judging a test result. According to the invention, rapid and accurate detection of the IA system signal acquisition card can be realized; through an automatic detection process, the detection efficiency is remarkably improved, the interference of human factors is reduced, and through an intelligent diagnosis technology, the reliability of a detection result is improved; safe and stable operation of the nuclear power plant is ensured.

The invention provides a dredging member used for dredging a medical test card, the dredging member comprises a support and a shell, the support is used for fixing the test card, the support is provided with a first docking port and a second docking port which are communicated with each other, the second docking port is used for being communicated with a liquid inlet hole or a liquid outlet hole of the test card, and the first docking port is used for being communicated with the liquid inlet hole or the liquid outlet hole of the test card. The first butt joint port is used for being in butt joint with a pressure source; the shell is provided with a containing cavity, and the support is located in the containing cavity. The dredging piece provided by the invention can dredge and clean the test card, so that the use of the test card is recovered, and the replacement cost of the test card is saved.

The utility model relates to the field of computer accessories, in particular to a switching test card for an NVME electronic disk, which comprises a PCB (printed circuit board), an adjusting component, a heat conduction silicon strip, a switching plug and a test socket are arranged on the PCB, a T-shaped column is mounted on the adjusting component, a tensioning component is arranged on the lower surface of the PCB, the adjusting component is slidably mounted on the tensioning component, and the testing socket is mounted on the T-shaped column. According to the utility model, the position of the T-shaped column can be adjusted according to the lengths of NVME electronic disks of different models, the NVME electronic disks of different models can be plugged, the pressing plate can move up and down through the limiting springback assembly, and meanwhile, the test pins are driven to move in the test socket, so that the test pins can be ensured to fully contact golden fingers of the NVME electronic disks, and the test efficiency of the NVME electronic disks is improved. Hard contact between the NVME electronic disk and the test pins is prevented, the service life of the transfer test card is prolonged, the tensioning assembly can apply pressure to the NVME electronic disk through the T-shaped column, the T-shaped column corresponds to the mounting notch in the rear side of the NVME electronic disk, the NVME electronic disk is prevented from being separated from the test card, and the test stability is improved.

The application discloses a test card and a host computer, and relates to the technical field of testing.The technical scheme of the application is characterized in that: firstly, after a plurality of different test interfaces are arranged on the test card, the different test interfaces of the test card can be used to test the plurality of different slots of the host computer, so that the problem that some slots cannot be tested can be avoided, and the test coverage can be improved; secondly, the test interface comprises an identification pin, and a controller can determine a target test interface connected to the host computer based on the voltage of the identification pin of each test interface, so that the different test interfaces can be connected to the host computer in turn during the test process, and the test flexibility is improved; and finally, the test card supports loopback test and card function test, and a configuration end of an information loading circuit can be used to select a test mode, so that each slot of the host computer can be tested according to a plurality of different test modes, and the test coverage is improved.

1. Name of the product in this design: Inspection Card. 2. Purpose of this design: A test card for testing samples. 3. The key design feature of this product is its shape. 4. The image or photograph that best illustrates the key design points: Design 2 3D diagram. 5. Design 2 is designated as the basic design.

The utility model belongs to PXI measuring instrument technical field, concretely relates to a modular test card shielding structure, through the shielding piece of sub -card cover, through the recess part and the convex part cooperation of shielding bottom plate and shielding cover board, the close surrounding is formed to the sub -card week side, the electromagnetic radiation of sub -card internal circuit is effectively suppressed, in addition, the plug -in panel and the bottom card and sub -card are through the metal shielding strip of setting in the joint transition position, further reduce the electromagnetic leakage path, the back surface of shielding bottom plate and shielding cover plate of shielding piece is provided with the heat dissipation groove separately, increases the heat dissipation area, is favorable to the heat of sub -card in the high -speed test is promptly dissipated, guarantees the stability and reliability of test card under the long time high load working condition, through the structure of bottom card and sub -card, has realized the separation and cooperation of control, interface and power, signal processing function, the modular degree is high, is convenient for the upgrade and maintenance of software and hardware.

The utility model discloses a kind of field test card fixing devices, including fixed plate, the upper end right side of the fixed plate is rotatably connected with support, multiple strong springs are fixedly connected between the support and fixed plate, the lower end left side of the support is fixedly connected with multiple fixed pressing blocks, sliding slot is opened on the fixed plate, sliding plate is slidably connected with sliding slot, and sliding plate is below fixed pressing block, multiple return springs are fixedly connected between the sliding plate and sliding slot. The utility model is easy to operate, simple, low in cost, can be easily fixed test card and reduce the pollution to test card, ensure the accuracy of measurement data, improve work efficiency.