104 results about "Test card" patented technology

The invention discloses a universal detection system and method for providing different types of connection interfaces, and the method comprises the steps: simulating a boundary scanning element through an FPGA chip of a universal test card, and cooperating with an RC circuit and a differential signal mode conversion element; therefore, different types of to-be-tested interfaces can be provided, the same general test card can be used for pin detection of an input and output pin, a grounding pin, a differential signal pin, a power supply pin and a differential clock signal pin, and the technical effect of universal detection of different types of connection interfaces can be achieved.

The utility model relates to a detection card ferry device suitable for integrated detection equipment, which comprises a ferry vehicle matched with a detection card, and a one-way conduction push-out mechanism and a transfer push-in mechanism are respectively matched with the ferry vehicle. The one-way conduction push-out mechanism is used for pushing in the ferry vehicle in one direction and pushing out the detection card from the ferry vehicle and avoiding the detection card in the other direction, and the transfer push-in mechanism is used for pushing in the detection card to the ferry vehicle in the other direction; a controller is arranged in cooperation with the one-way conduction push-out mechanism and the transfer push-in mechanism. According to the utility model, the ferry vehicle can complete multi-station transfer of detection cards in a larger horizontal plane, and only a small number of moving mechanisms covering a preset range need to be arranged in the process; when the size difference exists in the detection card, only the ferry vehicle with the suitable size needs to be selected, the whole device does not need to be replaced, the maintenance is convenient, and the precision difference and the adjustment difficulty caused by module disassembly are reduced; and the compatibility to other modules in the equipment is high, the maintenance difficulty is low, and the working efficiency is high.

The utility model relates to the technical field of detection equipment, in particular to a fluorescence immunoassay analyzer. Comprising a machine body, a detection window is arranged on the front side of the machine body, a multi-channel reaction disc is arranged on one side of the detection window, a plurality of incubation grooves are formed in the front side of the multi-channel reaction disc, the multi-channel reaction disc comprises a plurality of independently arranged timing modules, buzzers and indicator lamps, and the buzzers and the indicator lamps are electrically connected with the timing modules. When the reaction time of the test card on a certain channel in the multi-channel reaction disc is over, the buzzer and the indicator light can give an alarm; the device can immediately detect a plurality of temperature-controlled test cards in sequence, and does not need to wait for the completion of the temperature control of the next test card, so that a large amount of time can be saved.

The utility model discloses an intelligent card test system. The system comprises a main control processor, a first radio frequency induction module, a second radio frequency induction module, a time accumulator, a counter and a power supply module, the first radio frequency induction module is used for uninterruptedly reading a test card, acquiring a first light emitting state of an LED lamp of the test card, and outputting a first electric signal to the time accumulator according to the first light emitting state; the time accumulator is used for accumulatively receiving the first electric signal so as to determine the accumulative test time length of the test card; the second radio frequency induction module is used for periodically reading the test card according to a preset time interval, acquiring a second light-emitting state of the LED lamp of the test card, and outputting a second electric signal to the counter according to the second light-emitting state; and the counter is used for accumulating the received second electric signal so as to determine the accumulated test times of the test card, thereby realizing the durability test of the product added with the LED optical signal feedback in the intelligent card.

A heater for a microfluidic test card is disclosed herein. In a general example embodiment, a test card for analyzing a fluid sample includes at least one substrate layer including a microchannel extending through at least a portion of one of the substrate layers, and a printed substrate layer that is bonded to or printed on one substrate layer of the at least one substrate layer. The printed substrate layer includes a heater printed on the printed substrate layer so as to align with at least a portion of the microchannel. The heater includes two electrodes aligned on opposite sides of the microchannel, and a plurality of heater bars electrically connecting the two electrodes. The plurality of heater bars includes a central heater bar disposed between outer heater bars.

1. The name of the design product: immunity test card. 2. The use of the design product: immunity test card for testing. 3. The design points of the design product: in the front view. 4. The picture or photo that best indicates the design points: front view.

Apparatuses and methods related to a point-of-care portable assay device are described herein. In an embodiment, a device for analyzing a fluid sample includes a fluid actuation source configured to engage a port on a test card. The fluid actuation source is configured to apply pressure to the port to cause the fluid sample to move along a microchannel of the test card to enable one or more assays to be performed. The device also includes a controller configured to receive an indication as to which one or more assays are to be performed, cause the fluid actuation source to move the fluid sample into one or more regions on the test card, cause a plurality of electrical contacts to provide power to the test card for performing the one or more assays, and determine at least one test result based on the performed assays.

Configurations for a system, method, and device for determining test card status and / or sample integrity are disclosed. Determining test card status and / or sample integrity includes assessing the pressure measurements of a pumping system in a sample analyzer to determine a threshold. The sample integrity may be determined by comparing pressure measurements of the pumping system attached to a test card to a threshold, which may be related to whether the test card is an empty test card or a prefilled test card. The sample integrity may be determined to be intact when the test card is determined to be an empty test card, and the user may be prompted to inject a sample into the test card. The sample integrity may be determined to be compromised when the test card is determined to be a prefilled test card, and the user may be prompted to discard the test card.

1. The name of the design product: test card hook (b). 2. The use of the design product: small tools used in the process of testing circuit board. 3. The design points of the design product: in shape. 4. The picture or photo that best shows the design points: perspective view 1.

This invention belongs to the field of micro / nano fabrication and optical testing technology, specifically relating to a high-resolution test card for dielectric materials in the EUV and soft X-ray bands. The test card includes a substrate and a Siemens star test pattern formed thereon. The test card uses silsesquioxane (HSQ) as the structural material and is fabricated using electron beam lithography. The structural height can reach 500 nm with a minimum linewidth of 10 nm. This invention utilizes the dual absorption and strong phase modulation capabilities of HSQ in the EUV / soft X-ray bands, making it suitable for both absorption contrast and phase contrast imaging modes in system resolution calibration and performance evaluation. This test card offers advantages such as standardized patterns, high resolution, adjustable contrast, and good fabrication consistency, providing crucial metrological support for the performance testing of high-end EUV / soft X-ray optical imaging and lithography systems.

The utility model discloses a shell structure of a test card. The shell structure comprises a fixing component, a clamping component and a clamping component, wherein the fixing component is arranged in a bottom shell; and the liquid storage tank is arranged in the bottom shell and is positioned below the liquid dropping opening in the surface of the upper shell of the test card. According to the scheme, the liquid storage tank is arranged in the bottom shell and located below the liquid dropping opening, redundant diluent can be stored through the liquid storage tank, the diluent is prevented from flowing to other spaces of the bottom shell, the accuracy of a detection result can be guaranteed, and meanwhile the risk of liquid leakage is avoided.

This application relates to a reagent test card and its sample loading assembly. The sample loading assembly of the reagent test card includes a sample loading structure. The sample loading structure has a first end and a second end opposite to each other. The first end is used to connect to or abut against the detection part of the reagent test card. The sample loading structure forms a hollow channel extending from the first end to the second end. The inner wall material of the hollow channel is hydrophilically modified and the inner wall is smooth. And / or, the sample loading structure has a slit extending from the first end to the second end. The wall material of the slit is hydrophilically modified and the wall is smooth. On the one hand, the sample solution flows more uniformly and smoothly inside the hollow channel of the sample loading structure, and direct sample loading can be achieved while maintaining the original structure of the detection part. The sample loading operation is more convenient and reliable, and can realize the diversification of application scenarios and user groups. On the other hand, it can achieve uniform and residue-free sample loading, and the detection sensitivity and detection accuracy of the detection part are guaranteed.

This invention relates to the field of food safety testing technology and discloses an automatic matching method for batch parameters of malathion test cards with QR code traceability. The method includes collecting the dual-matrix Lab color space values ​​of the QR code label paper and NC film in the test card, constructing an aging decay function relationship table and an initial coupling correlation matrix, and encoding an encrypted QR code. During testing, a single frame of original image is acquired to extract real-time chromaticity feature vectors of the dual-matrix region, and the aging feature modulus is calculated by combining it with the initial coupling correlation matrix. Based on the aging feature modulus, the aging decay function relationship table is queried to dynamically correct the initial standard curve parameters and generate a real-time standard curve, thereby outputting the malathion concentration. This invention constructs an intrinsic aging indication mechanism through dual-matrix chromaticity difference, achieving adaptive reconstruction of the standard curve according to the aging state of the test card, ensuring detection accuracy throughout the entire lifecycle.

The invention discloses a camera local test system, a camera test method and system and a storage medium. The camera local test system comprises a resolution test cabin, a dynamic range test cabin, a driving device, a test controller and a communication device. The resolution test cabin is provided with a resolution test card; the state range test cabin comprises a plurality of light source compartments, and each light source compartment is internally provided with a light source and a characteristic object; the driving device is suitable for mounting a test camera, and the driving device is used for controlling the image acquisition direction of the test camera; the test controller is connected with the driving device and used for controlling the driving device according to the target test instruction; and the communication device is connected with the test controller and is used for sending the image information of the test symbol and / or the image information of the feature object. According to the system, the resolution and the dynamic range of the camera can be automatically tested, meanwhile, composite testing can be carried out, the resolution of the camera in the actual dynamic range is tested, and the intelligent degree and the testing efficiency are effectively improved.

Embodiments of the present disclosure disclose a camera holder offset test method, device, electronic equipment and readable medium. A specific embodiment of the method comprises: adjusting the distance between the camera holder and the white background black rectangle test card in the preset test light box; collecting a test card image sequence of the white background black rectangle test card within a preset test time period; obtaining camera image resolution information and lens field of view angle information of the camera; obtaining preset reference point pixel coordinate information; performing test reference point extraction processing on the test card image; generating a test reference point pixel coordinate information sequence; based on the test reference point pixel coordinate information sequence, the camera image resolution information, the lens field of view angle information and the preset reference point pixel coordinate information, generating an angle offset curve corresponding to the camera holder; and displaying the generated angle offset curve on a preset camera holder offset test page. The embodiment improves the accuracy of camera holder offset test.

The invention relates to a JTAG (Joint Test Action Group) standard pin test system, which is characterized in that slots to be tested are electrically connected with each other to form different serial links to be tested, or adapter cards are electrically connected with each other through respective first JTAG input interfaces and first JTAG output interfaces or second JTAG input interfaces and second JTAG output interfaces to form different adapter card serial links. And the TAP controller provides a corresponding test signal in a JTAG format to the to-be-tested serial connection chain or the adapter card serial connection chain so as to enable the test card to test the JTAG standard pins, thereby achieving the technical effect that the test machine provides a plurality of to-be-tested slots on different to-be-tested machine boards to test the JTAG standard pins.

The present application belongs to the field of micro-nano processing and X-ray optical testing technology, and particularly relates to a high-resolution test card in hard X-ray band and a preparation method thereof. The test card adopts electron beam lithography combined with proximity effect correction technology to prepare an HSQ template pattern, forms a Siemens star structure with a minimum line width of 10 nm and a height of 500 nm, and then covers a metal working layer on the template surface through atomic layer deposition technology. The HSQ template pattern has a duty cycle less than 1, effectively improving the aspect ratio of the pattern. The covering of the metal working layer doubles the line density of the final pattern. The present application breaks through the resolution limit of the traditional test card, solves the problem of preparation of high-aspect-ratio nano structures, and has simple and reliable process, and is suitable for resolution calibration of absorption contrast and phase contrast imaging systems in hard X-ray band, thereby providing key technical support for performance evaluation of high-end X-ray optical systems.

1. The name of the design product: swab sample detection card. 2. The use of the design product: the design product is used for elution and detection of swab samples. 3. The design points of the design product: the combination of shape and pattern. 4. The picture or photo that best indicates the design points: usage state figure 1.

The application relates to a calibration method, device and computer equipment of a binocular device. The method comprises the following steps: acquiring and determining a rotation matrix, an offset matrix and an internal parameter of each camera based on a calibration board image pair; obtaining a reference image of the calibration board on the premise that the lens of a reference camera is parallel to the calibration board; determining the external parameter of the reference camera based on the reference image and the internal parameter of the reference camera; determining the transformation matrix of the reference camera and the transformation matrix of a non-reference camera based on the rotation matrix and the offset matrix between each camera of the binocular device and the external parameter of the reference camera; and calibrating the binocular device to obtain a binocular device with a fixed visual axis. The method can solve the problem that the existing calibration method of the binocular device cannot make the data of edge uniformity and unit relative distortion meet the test standard when the binocular endoscope is tested for edge uniformity or unit relative distortion, and the test card has trapezoidal distortion in the image.

The utility model provides a mobile device rear camera shooting test fixture, comprising a base plate, a support plate vertically arranged on the upper surface of the base plate, a camera test card arranged on the support plate, a device support slidably arranged on the upper surface of the base plate, a sliding mechanism arranged between the device support and the base plate, and a moving direction of the sliding mechanism perpendicular to the support plate. And the upper surface of the bottom plate is provided with a plurality of groups of positioning mechanisms for positioning a detection position. According to the utility model, through the arrangement of the equipment bracket capable of sliding, when equipment detection is carried out, equipment is placed on the equipment bracket, and then the equipment bracket is positioned by sliding the equipment bracket and using the positioning mechanism, so that the equipment is subjected to a post-shooting test at a corresponding detection position. The problem of inaccuracy caused by manual visual inspection detection is avoided, fatigue generated in the process that manual long-time multi-frequency equipment taking is carried out for horizontal lifting testing is reduced, and detection accuracy is guaranteed.

A card reading system in which electrical contact between a test card and a card reader is achieved by vertical actuation of a card interface relative to the test card. In one embodiment, a test card reading system includes: (a) a card reader including at least one card interface having a plurality of card interface contacts; (b) a test card having card contacts; and (c) a vertical actuating mechanism which is used for generating relative vertical movement between the test card and the card interface, so that at least one part of the card interface contacts are contacted with the card contacts.

1. Name of the product in this design: Test Card (1). 2. Purpose of this design: A test card for liquid sample testing. 3. The key design feature of this product is its shape. 4. The image or photograph that best illustrates the key design points: Design 2 3D diagram. 5. Design 2 is designated as the basic design.

The application discloses an optimization focusing method, system, device and storage medium of a camera module. The method comprises the following steps: acquiring a test card image by using a camera module; manually adjusting the focal length of the camera module and acquiring the first MTF value of all regions of the test card image in real time; comparing the first MTF value with the first specified threshold value; if the first MTF value is greater than the first specified threshold value, acquiring the second MTF value of the central region of the test card image; acquiring the drop value of the second MTF value; if the drop value is greater than the size of the multiple of the specified step length, and the second MTF value is greater than the set standard value, taking the focal length position corresponding to the second MTF value as the peak point of the camera module; if the second MTF value is less than the set standard value, repeatedly executing the above steps until the specified number of cycles is reached. By acquiring the corresponding focal length when the second MTF value decreases as the peak point of the camera module and stopping scanning defocus calculation, the uniform standard of the camera module product is ensured, and the optimization focusing time is shortened.

1. Name of the product in this design: Test hook (A). 2. Purpose of this design: A small tool used in the process of testing circuit boards. 3. The key design feature of this product is its shape. 4. The image or photograph that best illustrates the design's key points: 3D view 1.

The invention relates to the field of nuclear power station protection systems, in particular to a test method for a protection system card. The test method comprises the following steps: carrying out indicator light test and logic function test on all protection system cards in sequence; the logic function test specifically comprises the step of testing each non-triggering condition and the lowest triggering condition in sequence; confirming the type of the protection system card; performing delay unit testing, self-holding unit testing and anti-interference testing on the logic card in sequence; response time testing is carried out on the signal cards in sequence; and carrying out self-holding unit testing and response time testing on the output card in sequence. The performance of the card is comprehensively tested, and the reliability is high.

The invention discloses a test card and a host, and relates to the technical field of test.According to the technical scheme, firstly, after a plurality of different test interfaces are arranged on the test card, when the host comprises a plurality of different slots, the slots can be tested through the different test interfaces of the test card; in this way, the problem that part of the slots cannot be tested can be avoided, and then the test coverage rate can be increased. Secondly, the test interface comprises an identification pin, and the controller can determine a target test interface connected with the host based on the voltage of the identification pin of each test interface. Thus, in the testing process, different testing interfaces can be sequentially connected with the host, and the testing flexibility is improved. And finally, the test card supports loopback test and card function test, and test mode selection can be carried out through a configuration end of the information loading circuit. Therefore, each slot of the host can be tested according to a plurality of different test modes, so that the test coverage rate is improved.

A boundary-scan standard pin test system is disclosed. In the system, to-be-tested slots are electrically connected to form different to-be-tested series chains, or riser cards which are inserted into the to-be-tested slots are electrically connected to each other through first boundary-scan input interfaces and first boundary-scan output interfaces thereof or through second boundary-scan input interfaces and second boundary-scan output interfaces thereof, to form different riser-card series chains; a TAP controller provides a boundary-scan format test signal to a to-be-tested series chain or a riser-card series chain to make a test card perform a boundary-scan standard pin test, so as to achieve the technical effect of efficiency of providing the boundary-scan standard pin test for the to-be-tested slots on different to-be-tested boards by a testing machine.

This utility model relates to the field of electronic disk testing technology, and more particularly to an adapter test card for NVMe electronic disks. The adapter card includes a PCIe interface, an NVMe electronic disk interface, an external power interface, a DC-DC converter circuit, a sampling circuit, a PCIe signal repeater, and a data processing and output unit. The DC-DC converter circuit includes three DC-DC converters for receiving power input from the external power interface and providing 3.3V, 1.8V, and 12V power rails. The sampling circuit is connected in series with the power rails of the DC-DC converter circuit to monitor the instantaneous current and voltage of each rail. The PCIe signal repeater is electrically connected to the PCIe interface and the NVMe electronic disk interface to monitor link data. This utility model is powered by an external power interface, monitors the power consumption characteristics of multiple power rails, monitors link status, and achieves coordinated analysis of power consumption and signal quality to accelerate fault location. The design reduces noise interference and crosstalk, and is highly integrated.

This invention provides an automatic switching device for automotive camera test cards, comprising a frame with several card slots, several mounting frames containing test cards, a moving frame, a translation mechanism, a lifting frame, a lifting mechanism, a cleaning frame, and a lifting mechanism. The cleaning frame is equipped with an upper support with a dry wiping component and a lower support with a spray cleaning component and a drive mechanism, and is provided with an adjustment mechanism to adjust the positions of the two components. Through the cooperation of the moving frame, translation mechanism, lifting frame, and lifting mechanism, the lifting frame can be driven to move to any mounting frame and lift the mounting frame along with the test cards, realizing automatic switching of test cards and improving testing efficiency. Through the adjustment mechanism in conjunction with the lifting mechanism and drive mechanism, the dry wiping cleaning mode and the spray cleaning mode can be switched to maintain the cleanliness of the test card surface, improve the accuracy of testing, and reduce the labor consumption of manual cleaning.

This invention discloses a method for detecting answer sheet filling patterns based on YOLOv7 optimization. The method includes: acquiring simulated answer sheet images, generating an answer sheet image dataset, labeling the simulated answer sheet image data in the dataset, and performing enhanced preprocessing to obtain an expanded answer sheet image dataset, which is further divided into a training set, a validation set, and a test set; building an improved YOLOv7 network model; training the improved YOLOv7 network model using the training set and validating it using the validation set to obtain a trained improved YOLOv7 network model; finally, inputting the test set into the trained improved YOLOv7 network model to obtain the labeled information of the detected answer sheet filling patterns. The answer sheet filling patterns detected by this invention can clearly distinguish between correct and incorrect ones, providing corresponding technical support for answer sheet graders working in complex backgrounds of dense filling.