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553 results about "Modulation transfer" patented technology

Optical transfer function or modulation transfer functions are thus generally two-dimensional functions. The following figures shows the two-dimensional equivalent of the ideal and the imperfect system discussed earlier, for an optical system with trefoil, a non-rotational-symmetric aberration.

Apparatus and method for measuring dynamic target modulation transfer function

The invention relates to a dynamic object modulation transfer function measuring method and a device thereof, pertaining to the optical property measurement field. The invention aims at providing a dynamic object modulation transfer function measuring method and a device thereof which can carry out the dynamic object modulation transfer function measurement under different fields of view, namely, uniform linear motion, uniformly-accelerated rectilinear motion, simple harmonic motion, but also can measure static target modulation transfer function and separate the static target modulation transfer function from whole machine modulation transfer function. The device consists of a light source, a collimating lens, a pupil coupling system and an electro-optical imaging system which are arranged along the ray propagation direction in sequence; the electro-optical imaging system carries out imaging towards the light source moving along the guide rail direction and line spread function is obtained from the image and carried out one-dimensional Fourier transformation so as to obtain the dynamic object modulation transfer function. The method and the device of the invention are not only suitable for static image evaluation field but also for the image evaluation field of dynamic object imaging by a time-delay electro-optical imaging system.
Owner:江苏亚星波纹管有限公司

Device and method for measuring modulation transfer function of optical lens based on infinite conjugate optical path

The invention relates to a device and method for measuring a modulation transfer function of an optical lens based on an infinite conjugate optical path. The method comprises the following steps: installing a slit target; enabling a to-be-measured lens to be placed in a lens pallet, and placing the lens pallet on a two-dimensional platform; turning on an LED light source, so as to provide illumination for a testing system; searching an optimal focal plane of the to-be-measured lens, and determining the accurate placement position of a slit; adjusting the specific position of an image collection unit, and obtaining the optimal photographing azimuth of a slit image; photographing the tilt image through the to-be-measured lens, and transmitting the slit image to a computer; processing the slit image and obtaining an MTF curve of the to-be-measured lens; precisely controlling the position of the tilt target and the position of the lens pallet through a motor controller, and achieving the continuous online testing of an MTF value of the to-be-measured lens on the computer platform. The method and device can be used for measuring the lens with a big field angle, and solve problems that a conventional infinite conjugate optical system and a conventional edge method are large in optical lens error and poor in stability.
Owner:上海信智精密光学有限公司

Device for measuring modulation transfer function of optical system and method thereof

The invention discloses a device for measuring a modulation transfer function of an optical system and a method thereof. A target generator of the device comprises a knife edge target (4), a light source (1) and an electrical machine (3), wherein the electrical machine drives the knife edge target (4), so that an inclined angle beta is formed between the arrangement direction of a knife edge pixel (12) of the knife edge target (4) and that of a pixel (13) of an area array detector, and the inclined angle meets the following condition: ds=d sin beta, wherein the ds is a sampling distance, and the d is the size of the edge length of the pixel of the area array detector. When measuring, the modulation transfer function, the electrical machine drives the knife edge target (4) to rotate at the angle of beta to perform image data collecting and data processing so as to obtain modulation transfer function of the optical system to be measured. The invention adopts the knife edge target to realize an oversampling technology and improve the sampling rate, thereby being capable of measuring the modulation transfer function of the optical system to be measured without a relay amplifying system, being capable of measuring the maximum frequency which is higher than the Nyquist frequency of the area array detector, simplifying a measuring system, and avoiding complex assembling and correcting work when manufacturing apparatuses.
Owner:SUZHOU UNIV

CCD chip modulation transfer function test device and method

InactiveCN103592108AReflect image qualityUnaffected by stray lightTesting optical propertiesMichelson interferometerHe ne laser
The invention discloses a CCD chip modulation transfer function test device and method. The CCD chip modulation transfer function test device mainly comprises a He-Ne laser, an adjustable attenuator, a beam expander, a pinhole filter, a diaphragm, a collimating lens, an improved Michelson interferometer, a camera obscura, an image capture card and a PC data processing system, wherein the He-Ne laser, the adjustable attenuator, the beam expander, the pinhole filter, the diaphragm and the collimating lens are arranged on the incident light path of the improved Michelson interferometer in sequence, and the optical axis of the He-Ne laser, the optical axis of the adjustable attenuator, the optical axis of the beam expander, the optical axis of the pinhole filter, the optical axis of the diaphragm and the optical axis of the collimating lens are arranged on the same straight line, the camera obscura is arranged on the emergent light path of the improved Michelson interferometer, and the PC data processing system is connected with the image capture card which is arranged in the camera obscura and is connected with a CCD. Incident light is processed through the CCD chip modulation transfer function test device to form parallel light, and goes out in a sine interference fringe mode through the improved Michelson interferometer, a sine interference fringe pattern is used as a target, imaging is carried out through the CCD, and a modulation transfer function of the CCD is obtained through a test by using the method of the ratio between the sine interference fringe contrast and the image contrast.
Owner:XIDIAN UNIV

Aberration-free image reconstruction method based on CCD array pixel response function frequency domain calibration

The invention discloses an aberration-free image reconstruction method based on CCD array pixel response function frequency domain calibration, and belongs to the technical field of detectors. A frequency domain model of pixel response functions is established, same-frequency lasers with high stability are utilized for generating sinusoidal interference fringes in a far field, fringe light fields at different spatial frequencies are acquired by changing the relative positions of the same-frequency lasers, frequency domain calibration is conducted on the pixel response functions, calibration coefficients in all orders of all the pixel response functions are acquired respectively, on the basis and in combination with a Fourier optics method, CCD imaging reconstruction is achieved, and aberration-free imaging of a CCD detector can be achieved. According to the method, the pixel frequency domain response functions can be calibrated, meanwhile, tiny offset of the relative positions of all pixels can be calibrated, reconstructed images are free of sample blurs, modulation transfer functions (MTF) approach 1, the contrast ratio is not decreased, and the aberration-free image reconstruction method has the advantages of being high in calibration accuracy and wide in application prospect.
Owner:ACAD OF OPTO ELECTRONICS CHINESE ACAD OF SCI
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