67 results about "Michelson interferometer" patented technology

The invention discloses a non-equilibrium Michelson interferometer electric field sensor capable of automatically calibrating temperature influence, which has the characteristics of wide bandwidth, high measurement precision and small interference of distribution of an electric field to be measured, and can also automatically calibrate temperature influence and prevent a working point of the non-equilibrium Michelson interferometer electric field sensor from deviating. The electric field sensor comprises a lithium niobate substrate, the lithium niobate substrate is provided with a non-equilibrium Michelson interferometer, the non-equilibrium Michelson interferometer comprises an input and output waveguide, the input and output waveguide is connected with a first waveguide arm and a second waveguide arm which are different in length, two sides of the first waveguide arm are provided with electrodes, and the second waveguide arm is provided with electrodes. An antenna is arranged on the electrode, a first metal reflecting mirror is arranged at the tail end of the first waveguide arm, a second metal reflecting mirror is arranged at the tail end of the second waveguide arm, the first metal reflecting mirror and the second metal reflecting mirror are both arranged on the lithium niobate substrate, and the thermal expansion coefficients of the first metal reflecting mirror and the second metal reflecting mirror are different.

The invention provides a dynamic interference focusing method and system based on a Michelson interferometer, and the method comprises the steps: obtaining interference fringes under different defocusing amounts through employing the dynamic interference focusing system based on the Michelson interferometer, carrying out the analysis of the received interference fringes through an upper computer, and obtaining phase information, based on the phase information of the interference fringes corresponding to different defocusing amounts, a mapping relation between the defocusing amounts and the phase information is constructed; in the application, the current interference fringes are obtained through the dynamic interference focus fixing system of the Michelson interferometer, the current interference fringes are analyzed through the upper computer to obtain the current phase information, and the current defocusing amount is obtained by adopting the mapping relation based on the current phase information. And moving the sample to a calibrated focal plane position by controlling a dynamic interference focus fixing system of a Michelson interferometer based on the current defocusing amount to complete automatic focus fixing. The method can achieve the nanoscale focusing sensitivity.

The invention provides a silicon-based free space type optical MEMS accelerometer and a manufacturing method, the upper layer of the accelerometer is a glass substrate free space optical sensitive structure, the lower layer of the accelerometer is a silicon-based horizontal axis MEMS sensitive structure, and the upper layer structure is fixed on the lower layer structure through a bonding process. Wherein the upper-layer optical sensitive structure consists of a pair of Michelson interferometers, a glass anchor point and a glass mass block; and the lower-layer MEMS sensitive structure consists of four groups of cantilever beams, a silicon anchor point and a silicon mass block. The lower layer MEMS sensitive structure converts the horizontal shaft input acceleration into the displacement of the silicon mass block, the displacement is synchronously transmitted to the glass mass block, and the pair of oppositely arranged Michelson interferometers converts the displacement into the reverse transformation of an interference light phase, so that the high-precision differential detection of the acceleration is realized. The micro-optical accelerometer scheme provided by the invention has the outstanding advantages of high detection sensitivity, strong common-mode error resistance and high integration level.

The invention relates to the technical field of ultrafast laser and light quantum, and provides a single-cavity double-optical-comb absolute distance measurement system and method based on repetition frequency scanning. The system comprises a single-cavity double-optical comb system which is used for simultaneously establishing clockwise and anticlockwise propagating mode-locked pulses in an annular cavity through a bidirectional pumping source and outputting a main oscillation optical comb and a local oscillation optical comb through a polarization maintaining optical fiber coupler; a first piezoelectric ceramic and a second piezoelectric ceramic are arranged in the annular cavity, and the first piezoelectric ceramic and the second piezoelectric ceramic are adjusted through a differential driving mode so as to lock and regulate the repetition frequency difference between the main oscillation optical comb and the local oscillation optical comb; the double-optical-comb distance measuring system is used for combining the main oscillation optical comb passing through the Michelson interferometer with the local oscillation optical comb not passing through the Michelson interferometer to generate a radio frequency beat frequency signal; and calculating the real-time absolute distance of the measured target according to the optical path difference of the radio frequency beat frequency signal and the repetition frequency difference of the main oscillation optical comb and the local oscillation optical comb.

The invention discloses a dual-wavelength polarization tuning interference spectrum frequency discrimination device and a synchronous frequency locking method, and the method specifically comprises the steps: enabling a polarization Michelson interferometer to divide incident laser into two beams of linearly polarized light through a plurality of achromatic wave plates and a polarization splitting prism, and enabling the two beams of linearly polarized light to form dual-wavelength circularly polarized light for output after the two beams of linearly polarized light are reflected and combined; the output light is divided into two beams after passing through a light splitting module, and the two beams are respectively collected and processed into a four-quadrant synchronous phase-shifting interferogram by a polarization camera after passing through an achromatic lens, and the wavefront phase difference is calculated in real time; the other beam is compensated by the rotary linear polarizer and then is received by the detector; through the corresponding relation between the wavefront phase difference and the rotation angle, the rotation linear polarizer is driven in real time to carry out phase compensation, so that polarization tuning and frequency locking are realized; meanwhile, a piezoelectric mirror bracket control signal is obtained through calculation, and interferometer parallelism error correction is carried out. According to the invention, synchronous real-time monitoring and active feedback locking of dual-wavelength interference signals can be realized, and the system has the advantages of high tuning resolution and accurate data.

The application provides a grinding liquid film thickness measuring device and a measuring method thereof and relates to the technical field of semiconductor processing processes. The light emitted by the light source forms first light and second light through the setting of the measuring assembly. Since the grinding liquid serves as a medium between the second light, the thickness of the grinding liquid can be obtained in real time by measuring the optical path difference change between the first light and the second light through the principle of the Michelson interferometer.

The invention discloses a precise measurement method for object surface out-of-plane displacement under high-frequency micro-vibration. The method comprises the following steps: exciting an object to generate high-frequency steady-state vibration through a vibration exciter, freezing a surface state at any vibration position of the object by adopting stroboscopic pulse laser with strictly same frequency as the vibration, and forming a shear speckle field by utilizing a Michelson interferometer comprising a piezoelectric ceramic driving phase-shifting mirror. The movement of the phase shift mirror and the acquisition of the high-speed camera as well as the actions of the stroboscopic laser and the vibration exciter are synchronously controlled through the double-signal controller, so that the accurate acquisition of multiple phase shift speckle interference images is realized. The image is processed based on a four-step phase shift algorithm, and the phase difference of the vibration position is calculated, so that the out-of-plane displacement derivative and the out-of-plane displacement in the shearing direction are calculated. According to the invention, the signal-to-noise ratio and the sensitivity of vibration measurement are obviously improved, and the method has full-field, non-contact and micro-nano displacement resolution capabilities, and is suitable for the fields of material nondestructive testing and structure health monitoring.

The invention relates to the field of optical fibers, in particular to a D-type optical fiber based on Fe3GaTe2 nanosheets and a preparation method and application of the D-type optical fiber. The invention discloses a D-type optical fiber based on a Fe3GaTe2 nanosheet. The D-type optical fiber comprises a D-type optical fiber and a Fe3GaTe2 layer deposited on a D-type plane of the D-type optical fiber. By utilizing the evanescent field characteristic of the D-type optical fiber, the Fe3GaTe2 nanosheet is deposited on the D-type plane of the D-type optical fiber, and magnetic anisotropy change (such as magnetization direction switching) is generated under the action of an external magnetic field, so that the effective refractive index of the optical fiber is changed; the change is converted into an optical path difference in the Michelson interferometer. Finally, the magnetic field intensity can be inverted by measuring the FSR change of the interference spectrum. The room-temperature MA adjustability of the Fe3GaTe2 nanosheets provides a larger refractive index change range (superior to that of magnetic fluid), and the nanosheets are not easy to degrade, so that the D-type optical fiber has higher sensitivity and temperature performance.

A push-pull type optical fiber MEMS accelerometer based on Michelson interferometer comprises a mechanical assembly and two sensing optical fibers, the mechanical assembly is composed of a fixed base and an acceleration sensing chip, the acceleration sensing chip comprises an outer frame, a mass block and two groups of spring cantilever beams, the outer frame is provided with a fine optical fiber slot, the mass block is provided with two convex structures as reflecting surfaces, the sensing optical fiber end face and the top surface of the mass block convex structure form two air cavities as sensing arms of the Michelson interferometer. When the accelerometer is subjected to external acceleration, the mass block moves relative to the outer frame, the cavity length of the two air cavities changes in a push-pull manner, thereby changing the optical path and generating an interference signal. The interference signal is collected and demodulated by a photoelectric detector, a data acquisition circuit and a computer, and a vibration acceleration signal can be obtained. The present application has the advantages of high sensitivity, strong noise common mode rejection capability and is suitable for various dynamic vibration response measurement occasions.

The application provides a time delay interferometric ground semi-physical experimental verification scheme, which comprises the following steps: (1) based on a space gravitational wave detection task and a load configuration scheme, acquiring a space gravitational wave detection task core measurement, and recording measurement data; (2) constructing an algebraic relationship of a time delay interferometric scheme capable of effectively eliminating laser frequency noise and secondary noise such as optical platform jitter, and calculating a first generation time delay interference and a first generation basic combination solution according to the algebraic relationship; (3) repeating the above step (2) for multiple rounds, compensating for the difference of the equivalent interference measurement arm length, and further suppressing laser frequency noise. The application has reasonable concept, and a semi-physical simulation platform of an equivalent million kilometer arm length unequal arm Michelson interferometer is built by combining a lock arm frequency stabilization system and an electronic phase delay system, so that effective suppression of laser frequency noise is realized.

An ultraprecision frequency-domain Light Detection and Ranging (LiDAR) system for remote micro-movement sensing includes a laser diode with a bandpass filter configured to modulate power using RF signals to generate intensity-modulated optical signals. The LiDAR system includes a Michelson interferometer to split generated optical signals via a 50 / 50 directional coupler into two optical paths. A first optical path includes a fiber-optic delay line with a silver-coated end reflecting phase-shifted optical signals towards a photodetector. A second optical path features a semiconductor optical amplifier amplifying the generated optical signals, with an optical collimator and a target beyond a free-space propagation region. A photodetector is connected to the 50 / 50 directional coupler that receives both the phase-shifted and amplified optical signals, converting them to electrical signals. A feedback loop, including a bandpass filter and a frequency-domain analyzer detects frequency shifts caused by micro-movements of the target.

The application discloses a moving mirror system of a Michelson interferometer based on magnetic suspension positioning technology, which comprises a moving mirror main body and three electromagnet groups. The moving mirror main body comprises a lens base, a metal mirror, connecting rods and magnetic pole balls. The number of the connecting rods is three, and the three connecting rods are arranged on the side edges of the lens base. The number of the magnetic pole balls is three, and the three magnetic pole balls are arranged on the other ends of the three connecting rods respectively. The electromagnet group comprises an electromagnet support, coils and magnetic pole heads. The electromagnet support is composed of three wedge-shaped bodies. The number of the coils is three, and the three coils are fixed on the three wedge-shaped bodies by electromagnet bolts respectively. The application has the advantages of no abrasion, simple realization, easy control and easy manufacturing. Meanwhile, the precision is not lost due to the increase of the use frequency and use time. Since only electromagnets are adopted as the core parts, the machining and manufacturing are very simple and easy, and the technical threshold of production design and manufacturing is lowered.

The application provides a silicon-based free-space optical MEMS accelerometer and a manufacturing method, the upper layer of the accelerometer is a glass substrate free-space optical sensitive structure, the lower layer is a silicon-based horizontal axis MEMS sensitive structure, and the upper layer structure is fixed on the lower layer structure through a bonding process. The upper layer optical sensitive structure is composed of a pair of Michelson interferometers, a glass anchor point and a glass mass; the lower layer MEMS sensitive structure is composed of four groups of cantilever beams, a silicon anchor point and a silicon mass. The lower layer MEMS sensitive structure converts the horizontal axis input acceleration into the displacement of the silicon mass, the displacement is synchronously transmitted to the glass mass, and a pair of reversely arranged Michelson interferometers convert the displacement into the reverse transformation of the phase of the interference light, so that the high-precision differential detection of the acceleration is realized. The micro-optical accelerometer scheme provided by the application has the outstanding advantages of high detection sensitivity, strong anti-common-mode error capability and high integration.

The invention discloses an infinitesimal displacement automatic measuring device and method based on a Michelson interferometer, and belongs to the technical field of infinitesimal displacement measurement. The system comprises an optical amplification and display system and a Michelson interference system, wherein the optical amplification and display system comprises a microscope, a high-definition camera and a display screen; wherein the high-definition camera is used for recording the moving process of an object to be measured; the display screen is used for displaying and playing pictures shot by the high-definition camera; indication marks are arranged on a movable mirror of the Michelson interference system and used for indicating the starting point and the ending point of an object to be detected on the display screen. According to the invention, through mutual cooperation of the optical amplification and display system and the Michelson interference system, a moving path of an object to be measured can be amplified firstly, then measurement is carried out, and compared with a traditional Michelson interferometer, the measurement precision is greatly improved. And meanwhile, a rigid linkage structure of the movable mirror and the indication mark is adopted, so that the purpose of inhibiting dynamic errors is achieved, and the accuracy of a measurement result is further improved.

A distance measuring device is provided with: a light source unit that emits a first laser beam and a reference laser beam; a reference interference system for detecting first interference light generated by interference of the first laser light and second interference light generated by interference of the reference laser light, and outputting a first signal; a measurement interference system to which first reflected light generated by reflecting the first laser light by the object is input, and which outputs a second signal; and a signal processing system that generates wavelength information relating to the wavelength of the first laser beam on the basis of the first signal, and calculates the distance from the distance measuring device to the object on the basis of the wavelength information and the second signal, the reference interference system being a Michelson interferometer.

This invention provides a system for simultaneously measuring thin film thickness and refractive index based on spectral domain optical coherence tomography. It employs a free-space Michelson interferometer structure, using a beam splitter to separate broadband low-coherence light into reference and sample light. The two beams propagate separately in the free-space reference arm and free-space sample arm, respectively, before being combined and interfering. This fundamentally avoids the adverse effects of dispersion, polarization changes, and optical path drift introduced during fiber optic transmission. Simultaneously, this invention utilizes spectral domain optical coherence tomography to obtain the depth position information of different reflective interfaces in the sample arm. Combined with the positional changes of the plane mirror under reference and sample conditions, the geometric thickness and refractive index of the thin film can be simultaneously obtained by solving a simple set of equations. This simplifies the measurement process, improves data processing efficiency and measurement operability, and provides a reliable technical foundation for online monitoring and quality control in industrial coating processes.

The invention relates to the technical field of engineering curvature measurement, and discloses a high curvature sensitivity Michelson interferometer structure and a preparation process, the high curvature sensitivity Michelson interferometer structure comprises a core sensing unit of a double non-adiabatic cone cascade solid sphere structure with a length of about 700 [mu] m, a single mode fiber with a core diameter of 8.2 [mu] m and a cladding of 125 [mu] m is tapered by a fusion splicer according to the parameters of tapering delay of 300 ms, a speed of 0.75 [mu] m / ms, a length of 350 [mu] m and the like, and a high curvature sensitivity Michelson interferometer is obtained. And discharging to form double cones, fusing and shrinking to prepare a solid ball, and calibrating the diameter of the waist of each cone to be 10-15 microns. The sensitivity of the interferometer within the curvature range of 0.18-0.8 m reaches-52.18 nm / m, the temperature crosstalk at 40-120 DEG C is 0.000282 m / DEG C, and the interferometer has the advantages of compactness, high sensitivity, low crosstalk and low cost and is suitable for health monitoring of high-precision structures in aerospace, precision industry and the like.

The invention relates to a pulse measurement method based on two-photon absorption, and the method comprises the following steps: S1, selecting perovskite as a medium, and placing the medium on a sample stage of a Michelson interferometer; s2, the light source emits an ultrashort laser pulse to be measured and divides the ultrashort laser pulse into two paths of pulses, one path of pulse passes through the adjustable delay line and then is combined with the other path of pulse in perovskite, and a two-photon absorption signal is generated; and S3, obtaining a two-photon absorption interference autocorrelation curve IAC experiment through the two paths of pulses and the two-photon absorption signal, and reconstructing to obtain complete information of the to-be-measured ultrashort laser pulse by combining the spectral intensity of the to-be-measured ultrashort laser pulse. According to the invention, multi-photon absorption response is taken as a core detection mechanism, so that the technical limitation of traditional non-linear effects depending on second harmonic generation and the like is effectively broken through, the problem that materials such as perovskite and the like do not have second harmonic so that pulse measurement cannot be realized is solved, and measurement of higher sensitivity and wider wave band of ultrafast light pulses is realized.

The invention belongs to the technical field of acoustic measurement, and discloses a free space sound field measurement method and system, and the method comprises the steps: constructing a free light path sound field measurement system based on a Michelson interferometer principle; acquiring a reference image, introducing a sound field to be measured, and controlling a loudspeaker or a laser beam to perform translation and rotary scanning through a computer to complete interference pattern data acquisition; preprocessing the acquired interference pattern, identifying the edge of the interference fringes by using an edge detection technology, and carrying out light phase variation calculation; and performing sound field reconstruction by adopting a Radon inverse transformation algorithm, converting sound field integral information carried by a laser beam into a sound pressure value of each point in a real space, and reconstructing a free field sound pressure distribution diagram. The method has the advantages of no damage and low cost, the measurement precision of the sound field and the integrity and reliability of reconstruction are remarkably improved, the nano-scale optical path change caused by the sound field can be effectively captured, and the high precision of sound field measurement and the accuracy of sound source recognition are ensured.

A light source unit (1) is provided with a semiconductor optical amplifier (10), a filter unit (30), a Michelson interferometer (40) and a detector (44). The Michelson interferometer (40) has: a coupler (41) which, with a predetermined branching ratio, branches light (L2) from a filter unit (30) inputted to a first port (41a) into a first waveguide (51) connected to a second port (41b) and a second waveguide (52) connected to a third port (41c) and having an optical path length different from that of the first waveguide (51); a first mirror (42) which returns, to the coupler, at least some of first branched light (Lb1) outputted from the second port (41b); and a second mirror (43) which returns, to the coupler, at least some of second branched light (Lb2) outputted from the third port. The detector (44) detects interference light among the light returned to the coupler (41) from the first mirror (42) and the second mirror (43). The branching ratio of the coupler (41) is set to an unequal ratio.

The invention designs a micro-vibration suppression system for micro-vibration based on an organic elastic damping material and an electromagnetic tuned mass damper, belongs to the technical field of vibration control, and is suitable for occasions sensitive to micro-vibration, such as precision optical experimental platforms, semiconductor manufacturing equipment, high-precision measuring instruments and the like. The preparation method is characterized by comprising the following steps: 1) preparing a hollow net-shaped nano organic silicon material through two kinds of click reaction; 2) an electromagnetic tuned mass damper and a design thereof; 3) a damping material layer and electromagnetic damper system integration scheme; 4) selecting a material for generating electromagnetism and a material of the damper; and 5) the device is applicable to various optical experiments of university physical experiments such as laser interferometers, Michelson interferometers, holographic imaging vibration isolation and the like.

A fiber-optic sensor for measuring direct-current electric field strength, the fiber-optic sensor comprising an equal-strain cantilever beam (1), wherein a metal conductor (2) is fixed on a free end of the equal-strain cantilever beam (1); the upper and lower surfaces of the metal conductor (2) are respectively an upper charge induction surface and a lower charge induction surface, with the surface area of the upper charge induction surface being larger than the surface area of the lower charge induction surface; and an interference optical fiber (3) in a Michelson interferometer configuration is also fixedly connected to the equal-strain cantilever beam (1). A direct-current electric field strength measurement apparatus, which comprises a laser source, a circulator, a spectrometer and a sensor. After the components are connected, a quadratic function relationship between a direct-current electric field strength value and the strength value of a same interference peak in an output spectrum is determined; a corresponding database is established on the basis of the quadratic function relationship; the direct-current electric field strength measurement apparatus is used to test a direct-current electric field to be tested, so as to obtain a corresponding interference-peak strength value in a corresponding output spectrum; and on the basis of corresponding data in the database, a direct-current electric field strength value of said direct-current electric field is obtained.

This invention relates to fiber optic gyroscopes, specifically to a method for obtaining the optimal modulation depth of a fiber optic gyroscope with a nested Michelson interferometer. This method addresses the shortcomings of existing technologies where determining the optimal modulation depth for a fiber optic gyroscope with a nested Michelson interferometer requires extensive debugging, testing, and data analysis, resulting in a complex and time-consuming process. The method for obtaining the optimal modulation depth of a fiber optic gyroscope with a nested Michelson interferometer includes the following steps: measuring the optical power P1 and superimposed optical power P2 of the interference optical signal; controlling the amplitude of the square wave electrical signal output by the signal generator at the electrical modulation port of the Y-waveguide integrated modulator; and taking the CT... 2i =0dB corresponds to the superimposed optical power P 2i The optimal modulation voltage is calculated, and then the optimal modulation depth is calculated based on the optimal modulation voltage. This method is convenient and efficient, and helps in the mass production and debugging of fiber optic gyroscopes.

The invention relates to a system (101) for measuring the photo-induced deformation of a sample, comprising a Michelson interferometer (103) which includes a first light source and means for acquiring and converting the optical interference signal into an electrical signal, a second light source (201), an arbitrary signal generator (205) configured to modulate the intensity of the second light source (201) at a frequency, and an electrical signal processing unit (211). The second beam (203) illuminates the sample, and the processing unit (211) is configured to determine the amplitude of the sample deformation from the electrical signal. Figure 2 is shown in the abstract.

The invention relates to the technical field of geometric quantity testing, and discloses an adjustable optical fiber delay line calibration device and method based on all-fiber interference, and the device comprises a laser transmitting module, a Michelson interferometer module, an optical modulation and demodulation module, and a metrological characteristic analysis module. The laser emitting module is used for emitting laser; the Michelson interferometer module is used for receiving the laser and then carrying out optical coupling to obtain an interference signal; the optical modulation and demodulation module is used for modulating laser, converting the interference signal into an electric signal and obtaining a phase variation based on the electric signal; and the metrological characteristic analysis module is used for calculating a measurement result from the phase change quantity to the light delay quantity, and completing the calibration of the adjustable optical fiber delay line based on all-fiber interference.

The application belongs to the technical field of acoustic measurement, and discloses a free space sound field measurement method and system, which constructs a free light path sound field measurement system based on the principle of Michelson interferometer; collects a reference image, introduces a sound field to be measured, performs translation and rotation scanning through a computer to control a loudspeaker or a laser beam, and completes interference pattern data collection; pre-processes the collected interference pattern, identifies the edge of the interference fringe by using edge detection technology, and calculates the light phase change amount; sound field reconstruction is performed by using a Radon inverse transform algorithm, sound field integral information carried by the laser beam is converted into the sound pressure value of each point in the real space, and a free field sound pressure distribution map is reconstructed. The application has the advantages of non-destructive and low cost, and significantly improves the sound field measurement accuracy and the integrity and reliability of reconstruction, can effectively capture the nanometer level optical path change caused by the sound field, and ensures the high accuracy of sound field measurement and the accuracy of sound source identification.

The invention discloses a non-Hermitian Michelson interferometer, sensor, system and method based on singular point enhancement, and the interferometer comprises a laser, a first beam splitter, a first reflector, a second reflector, a dual-mode cross optical cavity and a detector, and a light beam emitted by the laser is divided into a first input light beam and a second input light beam through the first beam splitter; the first beam splitter and the second beam splitter are arranged inside the first optical cavity and the second optical cavity respectively, the dual-mode cross optical cavity works at a singular point in a preset state, and the first beam splitter and the second beam splitter are arranged inside the first optical cavity and the second optical cavity respectively. And the second beam splitter mixes the first cavity mode and the second cavity mode, so that non-Hermite coupling with a singular point enhancement effect is generated between the first cavity mode and the second cavity mode, and finally, the coupled light beams are respectively output to the first beam splitter for beam combination and are detected by the detector. The device is small in structure, low in cost and good in detection effect.

The application provides a gas refractive index measuring device and method based on a Michelson interferometer. Based on the Michelson interference principle, one interference arm of the Michelson interferometer is sealed as a gas chamber, and a plane mirror at the end is replaced by a grating. When the refractive index of the gas in the chamber changes, the diffraction exit angle of the grating and the propagation path of the light in the chamber will change, the interference pattern is changed, and the refractive index can be calculated through the inversion of the change of the number of interference fringes or the interference phase. The structure is simple and convenient.

The application provides a carrier phase delay compensation method and system based on single-chip microcomputer control, and relates to the technical field of laser interferometry. The method comprises the following steps: determining an interference signal based on the basic principle of a Michelson interferometer; decomposing the interference signal through Bessel identity and a trigonometric function formula to obtain a target interference signal; filtering out a direct current component in the target interference signal through an alternating coupling sampling mode; performing mixing processing and low-pass filtering processing on the target interference signal after filtering out the direct current component to obtain a pair of quadrature interference signals; constructing a Lissajous figure according to the pair of quadrature interference signals; judging whether there is carrier phase delay according to the Lissajous figure; if yes, outputting a first control signal through a single-chip microcomputer, and adjusting a compensation phase and performing step-by-step frequency sweeping through a signal generator, until a first high-frequency carrier signal and a second high-frequency carrier signal output by the signal generator at a modulation end and a demodulation end are the same, so that the carrier phase delay is compensated.

The invention relates to the technical field of viscosity coefficient measurement, in particular to a liquid viscosity coefficient measuring device based on a Michelson interferometer. Comprising a wave source generation system, a ripple schlieren acquisition system, an interference pattern acquisition system and an image processing system, the wave source generation system is used for forming stably propagating surface waves on the surface of liquid to be measured, and the ripple schlieren acquisition system is used for acquiring projection schlieren of the surface waves to measure wavelength. The interference pattern acquisition system is used for capturing an interference circular ring change generated by the Michelson interferometer so as to calculate the amplitude of the surface wave, and the image processing system is used for analyzing acquired image data and fitting a surface wave amplitude attenuation curve by combining wavelength and amplitude information so as to calculate a liquid viscosity coefficient; the operation process is obviously simplified, the experiment threshold and the requirements on operators are greatly reduced, and the accuracy, repeatability and reliability of measurement are improved.