This invention discloses a depth measurement and
edge extraction method based on a single all-
dielectric metasurface, belonging to the fields of micro-nano
optics and image
information extraction applications. The phase distribution of the all-
dielectric metasurface is obtained using the
Fresnel zone method. Each Fresnel region corresponds to a spiral phase with a different topological
charge number, increasing sequentially from the inside out, generating a double-
helix point spread function. The metasurface is placed on the spectral plane of a 4f
system, with a pair of linear polarizers and a quarter-wave plate placed before and after it respectively, achieving corresponding
circular polarization selection and ensuring
phase modulation based on the
geometric phase modulation principle, thus obtaining the designed metasurface optical
system for depth measurement and
edge extraction. When incoherent light is incident, the
main lobe rotation angle of the double-
helix point spread function corresponding to the "twin image" is extracted using image cepstral analysis, thus deducing the object's depth information. When coherent light is incident, the incident light interacts with the central part of the metasurface. Through the
convolution of the target object with the spiral phase, coherent destructive phase can be achieved for regions with uniform phase / amplitude, extracting the edge information of the target object. This invention enables both depth measurement and
edge extraction.