30results about "Imaging devices" patented technology

An X-ray focal spot shape evaluation apparatus 10 is an apparatus for evaluating an X-ray focal spot shape including an X-ray focal spot size on a target 22 of an X-ray source 20, and includes an imaging unit 11 and an operation unit 12. The imaging unit 11 acquires a phase contrast image in a range including an edge of an object 30 disposed on a propagation path of X-rays generated on the target 22 of the X-ray source 20. The operation unit 12 evaluates the X-ray focal spot shape on the target 22 based on at least the phase contrast image, a linear attenuation coefficient of the object 30, and a refractive index of the object 30. Thus, an apparatus and a method capable of easily evaluating a focal spot shape including an X-ray focal spot size on a target of an X-ray source are realized.

Device for rotating an X-ray grating (1) about an axis of rotation (20) aligned parallel to the beam path during X-ray imaging, comprising: - a grid frame (2) in which the X-ray grid (1) is clamped, - a base plate (21) on which the grid frame (2) is rotatably arranged, and - a drive unit (3) configured to rotate the lattice frame (2), characterized by: - bearing rollers (6) arranged on the base plate (21), in which the grid frame (2) is rotatably and without play clamped, - a pre-tensioned tension spring (7) whose first end (13) is connected to the lattice frame (2) and whose second end (14) is connected to the base plate (21) such that the tension spring (7) is arranged tangentially to a rotational movement about the axis of rotation (20), and - a lever arm (8) formed on the lattice frame (2) which can be moved about the axis of rotation (20) by the drive unit (3).

A masking assembly is presented for use in inspecting a region of interest by creating structured high photon energy radiation to interact with the region of interest. The masking assembly comprises at least one mask structure, the mask structure having a predetermined effective thickness t, and comprising a mask pattern formed by an arrangement of spaced-apart features of absorption properties with respect to said high photon energy radiation different from spaces between said features. The arrangement of said features along a lateral dimension of the pattern defines a predetermined effective pattern size P. The features have a characteristic lateral size I providing a substantially high aspect ratio t / l.

To provide a device and method which can easily evaluate a focus shape that includes X-ray focus dimensions at an X-ray source target.SOLUTION: An X-ray focus shape evaluation device 10 evaluates an X-ray focus shape that includes X-ray focus dimensions at a target 22 of an X-ray source 20, and includes an imaging unit 11 and a computation unit 12. The imaging unit 11 acquires the phase contrast image in an edge-including range of an object 30 which is located on a propagation path of the X-ray generated at the target 22 of the X-ray source 20. The computation unit 12 evaluates an X-ray focus shape at the target 22 on the basis of at least the phase contrast image, a linear attenuation coefficient of the object 30, and a refractive index of the object 30.SELECTED DRAWING: Figure 1

An X-ray imaging system is disclosed, comprising an X-ray source; a sample position; a detector arranged to detect X-ray radiation downstream of said sample position; wherein said X-ray source comprises an electron source arranged to provide an electron beam; a target arranged to produce X-ray radiation upon impact by said electron beam, the target comprising a substrate and a target layer at least partly covering said substrate, wherein said target layer is arranged to produce X-ray radiation upon impact by said electron beam; means for directing the electron beam to a first position on said target layer and a second position selected from a position on said target at which the electron beam impacts directly upon the substrate and a position on an electron beam dump arranged so that substantially no X-ray radiation created by interaction between the electron beam and the electron beam dump reaches the detector; a controller arranged to record, using said detector, a first image with the electron beam directed to said first position, and a second image with the electron beam directed to said second position, and generate a difference image between the first image and the second image. A method for X-ray imaging is also disclosed.

In order to improve the mechanical stability of an X-ray grating with top bridges for X-ray dark field imaging and / or X-ray phase contrast imaging, it is proposed to reduce or prevent the undesired high stress on the top bridges by a change in the manufacturing process. Specifically, it is proposed to electroplate the top bridges after the bending. In other words, the electroplating of the top bridges is performed on the bent geometry.

The disclosure relates to a grating and a radiation imaging device. The grating comprises a plurality of stacked grating elements (1). The grating elements (1) are stacked to form a grid. The grating element (1) comprises a first sheet (11, 21) and a second sheet (12, 22) having two parallel planes. The second sheet (12, 22) is stacked at the first sheet (11, 21) in a length direction of the first sheet (11, 21). The first sheet (11, 21) is almost impervious to radiation. The present disclosure stacks the sheets having different specifications together to form the grating with uniform grating slits, such that there is no limitation on the thickness of the grating and the grating can be used along with high-energy radiations.

A method and system for scanning a sample to minimize the effects of anomalous detector pixels and fixed defects in the imaging path in an X-ray microscope. Methods involve moving (i.e. Dithering) a sample between a source and a detector perpendicular to an X-ray beam line while projections of the sample may be captured in a continuous manner. Projection parameters associated with sample movement, including non-ideal movement of the sample toward and away from the detector, are calculated based on the precise or average position at exposure / trigger. By changing the geometric description, the projection is compensated for non-ideal movement. The viewing angle may be re-estimated and the projections are ranked according to the viewing angle instead of the acquisition order. Finally, reconstruction of the ordered projections is performed using a varying magnification reconstruction method to compensate for the slightly changing geometric magnification.

A method and system for scanning a sample to minimize effects of aberrant detector pixels and fixed imperfections in the imaging path in X-ray microscopy. The method involves moving, i.e., dithering, the sample perpendicular to the X-ray beamline between the source and the detector while capturing projections of the sample, possibly in a continuous fashion. Projection parameters associated with the sample movement, including non-ideal movement of the sample toward and away from the detector, are calculated based on the exact or average position at the time of exposure / trigger. The projections are compensated for the non-ideal movement by changing the geometry description. View angles can be re-estimated and the projections are sorted according to view angle instead of acquisition order. Finally, the reconstruction of the sorted projections is performed using varying magnification reconstruction methods to compensate for the slightly changed geometric magnification.

A method for manufacturing a grating assembly (GA) from grating tiles for use in interferometric X-ray imaging, and related apparatus for facilitating the practice of the method, the method comprising applying (S350) a grating (GT) tile to a curved carrier substrate, or applying the curved carrier substrate to the grating tile, such that the curvature of the tile matches the curvature of the carrier substrate.

A device (1; 2; 3; 4; 5; 6; 7) for taking a radiograph comprises an x-ray source for providing x-rays (20) and an object receiver for accommodating an object (10) in the beam path of the x-rays (20). A propagation distance lengthening means (40) is disposed downstream of the object (10) in the beam path of the x-rays (20). A detector (50) is disposed downstream of the propagation distance lengthening means (40) in the beam path of the x-rays (20). In this case, the propagation distance lengthening means (40) is designed such that it increases a real propagation distance (z1), over which the x-rays (20) propagate between the propagation distance lengthening means (40) and the detector (50), to an effective propagation distance (zeff).

An X-ray generation device includes an electron gun emitting an electron beam, an X-ray generation target including a plurality of target parts generating X-rays in response to incidence of the electron beam from the electron gun, and an irradiation area switching unit switching an area of the X-ray generation target irradiated with the electron beam between a first irradiation area and a second irradiation area. The number of target parts included in the first irradiation area is larger than the number of target parts included in the second irradiation area. An area of the target parts included in the first irradiation area is larger than an area of the target parts included in the second irradiation area.

A mask for use in a speckle-based x-ray or neutron phase contrast imaging system and methods of making the mask are disclosed. The mask may either absorb or change the phase of the incident x-ray or neutron beam. The mask in various embodiments has consistent statistics across the mask, is locally unique (thereby avoiding ambiguous correlations), has a speckle size on the order of the imaging system's resolution, has a speckle pattern that is visible through the sample being imaged, and / or is matched to the energy level of the imaging system and the sample density. These mask attributes are controlled by the method and materials used in the fabrication of the mask. Various embodiments use a pseudo-random binary array for generating the required speckle pattern.

Disclosed is an x-ray imaging system comprising an x-ray source, a sample position, and a detector arranged to detect x-ray radiation downstream of the sample position, the x-ray source comprising an electron source arranged to provide an electron beam, a target arranged to produce x-ray radiation upon impact by the electron beam, the target comprising a substrate and a target layer at least partially covering the substrate, the target layer arranged to produce x-ray radiation upon impact by the electron beam, means for directing the electron beam to a first position on the target layer and a second position selected from a position on the target where the electron beam directly impinges on the substrate and a position on an electron beam dump arranged such that x-ray radiation produced by interaction between the electron beam and the electron beam dump does not substantially reach a detector, and a controller arranged to use the detector to direct the electron beam to the first position to record a first image and to direct the electron beam to the second position to record a second image, and to generate an image that differs between the first image and the second image. A method for x-ray imaging is also disclosed.

To improve the mechanical stability of X-ray gratings with top bridges for X-ray dark-field and / or X-ray phase-contrast imaging, a change in the manufacturing process is proposed to reduce or prevent undesirably high stresses on the top bridges. Specifically, it is proposed to electroplate the top bridges after bending. In other words, the electroplating of the top bridges is performed on the curved geometry.

An X-ray microscopy system and method for phase contrast and dark-field imaging are provided, utilizing a partially coherent X-ray beam generated by a micro-focused X-ray source with a small focal spot size. A spatial beam modulator such as a random phase object, e.g., silicon carbide sandpaper, is placed between the source and the sample to create a random granular speckle pattern. The system employs a high-resolution detection setup with a thin scintillator and a spatially resolved detector with small pixel size to capture shifts in the speckle pattern caused by the sample's refraction effects. By analyzing these shifts, the system computes phase gradients and integrates them to produce detailed phase images, enhancing contrast in low-atomic-number materials like soft tissues and polymers. The compact design reduces source-to-detector distance, improving flux efficiency and system throughput while enabling high-resolution, three-dimensional tomographic imaging.

The present invention relates to an X-ray imaging device (1) comprising an X-ray source (2) that generates an X-ray beam (F), a two-dimensional X-ray detector (3) comprising pixels (3a), a sample holder (4) configured to hold a sample (E), and at least one modulator (5), wherein the at least one modulator (5) is a membrane on which a spiral-shaped transmission modulation pattern is formed.

A grid assembly (G0-G2) for interference X-ray imaging is provided. The assembly (GA) comprises a carrier sheet (CS) on which a grating tile (GT) is deposited, the carrier sheet having edge portions (E1-E4) and a coefficient of thermal expansion. Unlike the sheet, stabilizing rod members (S1-S4) are fixed along respective ones of the edge portions, the stabilizing rod members having substantially the same coefficient of thermal expansion as the sheet.

An X-ray imaging system is disclosed, comprising an X-ray source; a sample position; a detector arranged to detect X-ray radiation downstream of said sample position; wherein said X-ray source comprises an electron source arranged to provide an electron beam; a target arranged to produce X-ray radiation upon impact by said electron beam, the target comprising a substrate and a target layer at least partly covering said substrate, wherein said target layer is arranged to produce X-ray radiation upon impact by said electron beam; means for directing the electron beam to a first position on said target layer and a second position selected from a position on said target at which the electron beam impacts directly upon the substrate and a position on an electron beam dump arranged so that substantially no X-ray radiation created by interaction between the electron beam and the electron beam dump reaches the detector; a controller arranged to record, using said detector, a first image with the electron beam directed to said first position, and a second image with the electron beam directed to said second position, and generate a difference image between the first image and the second image. A method for X-ray imaging is also disclosed.

------ Imaging device, imaging apparatus or material characterization apparatus comprising thereon and imaging method. The present invention relates to an X-ray imaging device (1), comprising an X-ray source (2) generating an X-ray beam (F), a two-dimensional X-ray detector (3) comprising pixels (3a), a sample holder (4) configured to support a sample (E), at least one modulator (5), the at least one modulator (5) being a membrane on which a spiral-shaped transmission modulation pattern is formed. Figure to be published with the abbreviation: Figure 1a

A method and system for scanning a sample to minimize effects of aberrant detector pixels and fixed imperfections in the imaging path in X-ray microscopy. The method involves moving, i.e., dithering, the sample perpendicular to the X-ray beamline between the source and the detector while capturing projections of the sample, possibly in a continuous fashion. Projection parameters associated with the sample movement, including non-ideal movement of the sample toward and away from the detector, are calculated based on the exact or average position at the time of exposure / trigger. The projections are compensated for the non-ideal movement by changing the geometry description. View angles can be re-estimated and the projections are sorted according to view angle instead of acquisition order. Finally, the reconstruction of the sorted projections is performed using varying magnification reconstruction methods to compensate for the slightly changed geometric magnification.

An X-ray generation target includes a plurality of long target parts generating X-rays in response to incidence of an electron beam and a target part holder in which the plurality of target parts are buried to be parallel to each other. The target part holder includes a mark part indicating an arrangement state of the target parts.

A co-axial angular rotator device is disclosed. The rotator device can include a container including a slot for receiving a sample. The angle of the slot can be configured to be between 0 degrees and 180 degrees relative to a vertical plane of irradiation of a radiation device. The rotator device can include a cup positioned within an opening of the container. Additionally, the rotator device can include a drive shaft configured to transmit torque to cause the cup to rotate when the cup is positioned within the opening. When a sample resides within the slot and the drive shaft transmits torque to the cup, the cup can cause the sample to rotate about a central axis of the sample. When the radiation device emits radiation, the angle of the slot containing the sample and the rotation of the sample about the central axis can facilitate uniform radiation exposure of the sample.

To provide an X-ray microscope that has a size small enough to be brought into a room by shortening the path length, an X-ray microscope including at least one of each of an X-ray source 1, a sample holding part 3, a concave KB mirror 4, a convex KB mirror 5, and a light receiving part 8 located at a position in an imaging relation to a position of the sample holding part 3 in this order along an optical axis is fabricated.

In general, the technology disclosed herein relates object inspection utilizing radiation imaging, more specifically, edge illumination phase contrast X-ray imaging. The apparatus and methods described in the present disclosure can be applied for inspection of various objects in different industrial settings, such as manufacturing, food, agriculture, aerospace, automotive, electronics, healthcare, transport, logistics, security, and others. An aspect of the present invention relates to a mask assembly for radiation phase contrast imaging apparatus, comprising a first mask comprising a plurality of X-ray absorbing element and apertures arranged in a manner that gradually diverges from one portion to an opposite portion of the body, resulting in a variable pitch perpendicular to the optical axis direction; and a mask alignment mechanism configured to adjust a position and / or orientation of the first mask to align the variable pitch of the first mask for phase contrast imaging.

An X-ray focal spot shape evaluation apparatus is an apparatus for evaluating an X-ray focal spot shape including an X-ray focal spot size on a target of an X-ray source, and includes an imaging unit and an operation unit. The imaging unit acquires a phase contrast image in a range including an edge of an object disposed on a propagation path of X-rays generated on the target of the X-ray source. The operation unit evaluates the X-ray focal spot shape on the target based on at least the phase contrast image, a linear attenuation coefficient of the object, and a refractive index of the object.

An X-ray imaging system is disclosed, comprising an X-ray source; a sample position; a detector arranged to detect X-ray radiation downstream of said sample position; wherein said X-ray source comprises an electron source arranged to provide an electron beam; a target arranged to produce X-ray radiation upon impact by said electron beam, the target comprising a substrate and a target layer at least partly covering said substrate, wherein said target layer is arranged to produce X-ray radiation upon impact by said electron beam; means for directing the electron beam to a first position on said target layer and a second position selected from a position on said target at which the electron beam impacts directly upon the substrate and a position on an electron beam dump arranged so that substantially no X-ray radiation created by interaction between the electron beam and the electron beam dump reaches the detector; a controller arranged to record, using said detector, a first image with the electron beam directed to said first position, and a second image with the electron beam directed to said second position, and generate a difference image between the first image and the second image. A method for X-ray imaging is also disclosed.

------ Imaging device, apparatus for imaging or characterizing materials comprising it and imaging method The present invention relates to an X-ray imaging device (1), comprising an X-ray source (2) generating a beam (F) of X-rays, a two-dimensional X-ray detector (3) comprising pixels (3a), a sample support (4) configured to support a sample (E), at least one modulator (5), the at least one modulator (5) being a membrane on which a spiral-shaped transmission modulation pattern is formed. Figure to be published with the abstract: Figure 1a

A grating assembly (G0-G2) for interferometric X-ray imaging. The assembly (GA) comprises a carrier sheet (CS) having deposited thereon grating tiles (GT), the said sheet having edge portions (E1-E4) and a thermal expansion coefficient. Distinct from the sheet, there are stabilizer bar members (S1-S4) affixed along respective ones of the said edge portions, the stabilizer bar members having substantially the same thermal expansion coefficient as the said sheet.

In accordance with the invention, an X-ray amplitude analyzer grating adapted for use in an interferometric imaging system, the interferometric imaging system comprising an X-ray source and an X-ray detector with an X-ray fringe plane between the X-ray source and the X-ray detector, wherein an X-ray fringe pattern is formed at the X-ray fringe plane, wherein the X-ray amplitude analyzer grating is provided. The X-ray amplitude analyzer grating comprises a plurality of grating pixels across two dimensions of the X-ray amplitude analyzer grating, wherein each grating pixels of the plurality of grating pixels has a different pattern with respect to all adjacent grating pixels to the grating pixel so that all adjacent grating pixels do not have a same pattern as the grating pixel.