7results about "Imaging devices" patented technology

An X-ray imaging system is disclosed, comprising an X-ray source; a sample position; a detector arranged to detect X-ray radiation downstream of said sample position; wherein said X-ray source comprises an electron source arranged to provide an electron beam; a target arranged to produce X-ray radiation upon impact by said electron beam, the target comprising a substrate and a target layer at least partly covering said substrate, wherein said target layer is arranged to produce X-ray radiation upon impact by said electron beam; means for directing the electron beam to a first position on said target layer and a second position selected from a position on said target at which the electron beam impacts directly upon the substrate and a position on an electron beam dump arranged so that substantially no X-ray radiation created by interaction between the electron beam and the electron beam dump reaches the detector; a controller arranged to record, using said detector, a first image with the electron beam directed to said first position, and a second image with the electron beam directed to said second position, and generate a difference image between the first image and the second image. A method for X-ray imaging is also disclosed.

The disclosure relates to a grating and a radiation imaging device. The grating comprises a plurality of stacked grating elements (1). The grating elements (1) are stacked to form a grid. The grating element (1) comprises a first sheet (11, 21) and a second sheet (12, 22) having two parallel planes. The second sheet (12, 22) is stacked at the first sheet (11, 21) in a length direction of the first sheet (11, 21). The first sheet (11, 21) is almost impervious to radiation. The present disclosure stacks the sheets having different specifications together to form the grating with uniform grating slits, such that there is no limitation on the thickness of the grating and the grating can be used along with high-energy radiations.

A method and system for scanning a sample to minimize the effects of anomalous detector pixels and fixed defects in the imaging path in an X-ray microscope. Methods involve moving (i.e. Dithering) a sample between a source and a detector perpendicular to an X-ray beam line while projections of the sample may be captured in a continuous manner. Projection parameters associated with sample movement, including non-ideal movement of the sample toward and away from the detector, are calculated based on the precise or average position at exposure / trigger. By changing the geometric description, the projection is compensated for non-ideal movement. The viewing angle may be re-estimated and the projections are ranked according to the viewing angle instead of the acquisition order. Finally, reconstruction of the ordered projections is performed using a varying magnification reconstruction method to compensate for the slightly changing geometric magnification.

A method and system for scanning a sample to minimize effects of aberrant detector pixels and fixed imperfections in the imaging path in X-ray microscopy. The method involves moving, i.e., dithering, the sample perpendicular to the X-ray beamline between the source and the detector while capturing projections of the sample, possibly in a continuous fashion. Projection parameters associated with the sample movement, including non-ideal movement of the sample toward and away from the detector, are calculated based on the exact or average position at the time of exposure / trigger. The projections are compensated for the non-ideal movement by changing the geometry description. View angles can be re-estimated and the projections are sorted according to view angle instead of acquisition order. Finally, the reconstruction of the sorted projections is performed using varying magnification reconstruction methods to compensate for the slightly changed geometric magnification.

An X-ray microscopy system and method for phase contrast and dark-field imaging are provided, utilizing a partially coherent X-ray beam generated by a micro-focused X-ray source with a small focal spot size. A spatial beam modulator such as a random phase object, e.g., silicon carbide sandpaper, is placed between the source and the sample to create a random granular speckle pattern. The system employs a high-resolution detection setup with a thin scintillator and a spatially resolved detector with small pixel size to capture shifts in the speckle pattern caused by the sample's refraction effects. By analyzing these shifts, the system computes phase gradients and integrates them to produce detailed phase images, enhancing contrast in low-atomic-number materials like soft tissues and polymers. The compact design reduces source-to-detector distance, improving flux efficiency and system throughput while enabling high-resolution, three-dimensional tomographic imaging.

A method and system for scanning a sample to minimize effects of aberrant detector pixels and fixed imperfections in the imaging path in X-ray microscopy. The method involves moving, i.e., dithering, the sample perpendicular to the X-ray beamline between the source and the detector while capturing projections of the sample, possibly in a continuous fashion. Projection parameters associated with the sample movement, including non-ideal movement of the sample toward and away from the detector, are calculated based on the exact or average position at the time of exposure / trigger. The projections are compensated for the non-ideal movement by changing the geometry description. View angles can be re-estimated and the projections are sorted according to view angle instead of acquisition order. Finally, the reconstruction of the sorted projections is performed using varying magnification reconstruction methods to compensate for the slightly changed geometric magnification.

A co-axial angular rotator device is disclosed. The rotator device can include a container including a slot for receiving a sample. The angle of the slot can be configured to be between 0 degrees and 180 degrees relative to a vertical plane of irradiation of a radiation device. The rotator device can include a cup positioned within an opening of the container. Additionally, the rotator device can include a drive shaft configured to transmit torque to cause the cup to rotate when the cup is positioned within the opening. When a sample resides within the slot and the drive shaft transmits torque to the cup, the cup can cause the sample to rotate about a central axis of the sample. When the radiation device emits radiation, the angle of the slot containing the sample and the rotation of the sample about the central axis can facilitate uniform radiation exposure of the sample.