The invention discloses a Fourier infrared spectrum analysis method for a SF6 (sulfur hexafluoride) decomposition product. The method is characterized by comprising the following steps: introducing sample gas into an absorption cavity of a Fourier infrared spectrum spectrophotometer for performing Fourier infrared spectrum analysis, wherein the analysis parameters are that a detector is a photoconductive detector, the pressure balance is 0.1+/-0.01mbar, a refrigerant is 400+/-1mL and the temperature is 196 DEG C below zero+/-1 DEG C. According to the method, the problems that HF, SF4, S2F10 and SiF4 in the SF6 decomposition product cannot be accurately analyzed in the conventional technical means can be effectively solved, the decomposition products such as SO2, HF, SF4, SOF2, SOF4, SO2F2, S2F10, SiF4, CF4, CO and COS in the SF6 are accurately analyzed, the internal operating conditions of SF6 gas insulated equipment are effectively judged, the failure of electrical equipment is successfully judged, and the safety operation of the electrical equipment is guaranteed.