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41 results about "Photoconductive detector" patented technology

Photoconductive detector based on boron-doped silicon quantum dot/graphene/silicon dioxide and preparation method thereof

The invention discloses a photoconductive detector based on boron-doped silicon quantum dot/graphene/silicon dioxide and a preparation method thereof. The photoconductive detector includes a p-type silicon substrate, a silicon dioxide isolation layer, a top electrode, a graphene film, a boron-doped silicon quantum dot film and a bottom electrode. The photoconductive detector is capable of carrying out wide-spectrum detection, so that a problem of low response to infrared detection by the traditional silicon-based PIN structure can be solved. Because the graphene is used to form an active layer and a transparent electrode, a dead layer is eliminated and incident light absorption is enhanced. With the silicon dioxide isolation layer, the silicon surface state can be reduced. The detector can work normally at a low bias voltage; the absorbed light of the boron-doped silicon quantum dot layer is converted into photon-generated carriers and the generated photon-generated carriers being hole electron pairs are separated under the effect of the built-in electric field, so that the high gain can be obtained. In addition, the preparation method is simple; the cost is low; the response degree is high; the response speed is fast; the internal gain is high; the switch ratio is low; and integration is easy to realize.
Owner:ZHEJIANG UNIV

Responsivity-enhanced ZnO-based photoconductive detector and preparation method thereof

Disclosed are a responsivity-enhanced ZnO-based photoconductive detector and a preparation method thereof. The responsivity-enhanced ZnO-based photoconductive detector comprises a substrate and a ZnO film on the substrate. The ZnO film is coated with Ag nano-particles, fork-finger-shaped Al electrodes are deposited on the Ag nano-particles, and the Ag nano-particles are exposed among adjacent fork fingers of the fork-finger-shaped Al electrodes; or the fork-finger-shaped Al electrodes are deposited on the ZnO film, the Ag nano-particles are filled among the adjacent fork fingers of the fork-finger-shaped Al electrodes, and the Ag nano-particles are arranged on the ZnO film through spin-coating. The method includes the steps that the ZnO film is formed on the substrate through RF magnetron sputtering, then the Ag nano-particles are arranged on the ZnO film through spin-coating, or the fork-finger-shaped Al electrodes are deposited on the ZnO film; the responsivity-enhanced ZnO-based photoconductive detector can be obtained by depositing the fork-finger-shaped Al electrodes on the Ag nano-particles or arranging the Ag nano-particles on a sample surface with the fork-finger-shaped Al electrodes through spin-coating. According to the responsivity-enhanced ZnO-based photoconductive detector and the preparation method thereof, the surface plasma resonance effect of the Ag nano-particles is used for improving light absorbing ability of the detector, and therefore responsivity of the obtained photoconductive detector in an ultraviolet light area can be greatly improved.
Owner:徐州国隆电力配件铸造有限公司

Tellurium-cadmium-mercury grid-controlled structure photoconductive detector for Hall test

InactiveCN103165724AShorten the development processOvercome the shortcomings of only performance testingFinal product manufactureSemiconductor devicesEpoxyPhotoconductive detector
The invention discloses a tellurium-cadmium-mercury grid-controlled structure photoconductive detector for Hall test. The tellurium-cadmium-mercury grid-controlled structure photoconductive detector structurally comprises a substrate, a tellurium-cadmium-mercury material, epoxy resin glue, a ZnS passivation layer, four Hall electrodes, a transparent grid electrode and a thickened electrode, the substrate is a sapphire wafer, the tellurium-cadmium-mercury material grows an anodic oxide layer after double-faced rough polishing and fine polishing, the epoxy resin glue is used for bonding the tellurium-cadmium-mercury material and the substrate, the ZnS passivation layer can function in passivating the surface of the material and increasing permeability, the four Hall electrodes positioned in the front and the rear grow on the tellurium-cadmium-mercury material and serve as signal extraction electrodes for the Hall test and device performance test, the transparent grid electrode grows on the ZnS passivation layer and is used for applying grid voltage to a device, and the thickened electrode grows on the transparent grid electrode. The detector with the structure can apply the grid voltage in the device performance test process and the Hall test process to obtain needed electrical parameter conditions such as the grid voltage, material carrier concentration and mobility when device performances are optimal, and the development process of the device is greatly shortened.
Owner:SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI

Phthalocyanine rare earth organic infrared semiconductor light guide detector

The invention relates to the technical field of photoelectron, in particular to a phthalocyanine rare earth organic infrared semiconductor light guide organic semi-conductor detector. The detector of the invention comprises a substrate, a metal or transparent conductive electrode, an organic infrared photosensitive material layer and the like. The detector is characterized in that the photosensitive material is phthalocyanine rare earth with a sandwich structure; the electrical parameters of the photosensitive material of the organic infrared semiconductor light guide detector are controllable, so that electric resistance of a device can be adjusted within a scope of three orders of magnitude by acceptor doping, the performance regulation of the device and the compatibility with the infrared system are enhanced; the photosensitive material is an organic infrared semiconductor material which can be used to fabricate a large-area and low-cost infrared photoconductive detector responsive to infrared light with the wavelength of 1.3-1.8 micron on a silicon substrate integrated circuit, a cheap substrate glass, a quartz plate and a flexible plastic substrate and has the advantages of simple technology, low cost, controllable performances and the like.
Owner:KUNMING INST OF PHYSICS

Thin film photoconductive detector and manufacturing method and application thereof

The invention discloses a thin film photoconductive detector and a manufacturing method and application thereof. The thin film photoconductive detector comprises a substrate, a carrier transport layer, an electrode layer and a light absorption layer from bottom to top, wherein the electrode layer consists of an anode layer and a cathode layer positioned on the same layer. The detector integrates high migration ratio of an inorganic material and high light absorptivity of an organic material; when light irradiates onto an organic layer of a photoelectric device, the uppermost organic material layer absorbs light to generate carriers; and by virtue of energy level difference between an inorganic layer and the organic layer and the concentration difference of the carriers, the photo-generated carriers enter the inorganic material layer and can be fast collected by electrodes, thereby having large G and R values. Meanwhile, due to high migration rate of the inorganic material, the light current response time and the fall time of the device are greatly shortened, and therefore the sensitivity of the thin film photoconductive device is improved; and the thin film photoconductive detector has an important application value.
Owner:INST OF CHEM CHINESE ACAD OF SCI

HgCdTe infrared photoconductive detector with reference element structure

The invention discloses an HgCdTe infrared photoconductive detector with a reference element structure, wherein the reference element comprises a substrate, an epoxy glue layer, a first-side HgCdTe oxidation layer, a bulk material HgCdTe layer, a second-side HgCdTe oxidation layer, a silica insulating layer, a negative photoresist insulating layer, a metal indium layer, and a metal gold layer; and the reference element is characterized in that an edge photosensitive surface is covered with a double-layer insulating layer, an infrared absorption layer and an infrared light reflection layer. The HgCdTe infrared photoconductive detector with a reference element structure has the advantages: the problem of temperature drift existing in the HgCdTe infrared photoconductive detector is solved, and because a differential circuit is adopted to replace a temperature-compensation circuit, the influence of ambient temperature variation on the accuracy of the HgCdTe detector can be reduced, and the circuit structure can greatly be simplified; the detector can be used for measuring the temperatures of low-speed moving objects and high-speed moving objects; and the detector is quick in response speed and has a self-compensating function.
Owner:SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI

Photoconductive detector and preparation method based on boron-doped silicon quantum dot/graphene/silicon dioxide

The invention discloses a photoconductive detector based on boron-doped silicon quantum dot / graphene / silicon dioxide and a preparation method thereof. The photoconductive detector includes a p-type silicon substrate, a silicon dioxide isolation layer, a top electrode, a graphene film, a boron-doped silicon quantum dot film and a bottom electrode. The photoconductive detector is capable of carrying out wide-spectrum detection, so that a problem of low response to infrared detection by the traditional silicon-based PIN structure can be solved. Because the graphene is used to form an active layer and a transparent electrode, a dead layer is eliminated and incident light absorption is enhanced. With the silicon dioxide isolation layer, the silicon surface state can be reduced. The detector can work normally at a low bias voltage; the absorbed light of the boron-doped silicon quantum dot layer is converted into photon-generated carriers and the generated photon-generated carriers being hole electron pairs are separated under the effect of the built-in electric field, so that the high gain can be obtained. In addition, the preparation method is simple; the cost is low; the response degree is high; the response speed is fast; the internal gain is high; the switch ratio is low; and integration is easy to realize.
Owner:ZHEJIANG UNIV

Complementary metal oxide semiconductor (CMOS) amplifying circuit matched with infrared low-impedance photoconductive detector

The invention discloses a complementary metal oxide semiconductor (CMOS) amplifying circuit matched with an infrared low-impedance photoconductive detector. The amplifying circuit adopts a bridge circuit mode at an input end, is suitable for amplifying 20-200 ohm low-input-impedance infrared photoconductive detector signals, and can work at liquid nitrogen temperature. A first-level double-end input single-ended output differential amplifier adopts a positive-negative power source for power supply, and enables input quiescent voltage to be free of limitation of the threshold voltage of a metal oxide semiconductor (MOS) transistor. Another branch circuit corresponding to a biasing resistor and the detector adopts 10 kilohms to be connected with 50 ohms in series, the noise rejection ratio led in from another biasing input end is enabled to reach 200 times, and reduction of circuit overall noise is benefited. Under the requirement of a certain bandwidth, in order to increase pre-level gain and lower equivalent input noise, a 1megohm feedback resistor is adopted between a negative input end of the amplifier and output. A direct connection mode is respectively adopted among a bridge input mode, the first-level amplifier and a second-level amplifier, and the amplifiers can amplify both alternate current signals and direct current signals.
Owner:SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI

Thin film photoconductive detector and manufacturing method and application thereof

The invention discloses a thin film photoconductive detector and a manufacturing method and application thereof. The thin film photoconductive detector comprises a substrate, a carrier transport layer, an electrode layer and a light absorption layer from bottom to top, wherein the electrode layer consists of an anode layer and a cathode layer positioned on the same layer. The detector integrates high migration ratio of an inorganic material and high light absorptivity of an organic material; when light irradiates onto an organic layer of a photoelectric device, the uppermost organic material layer absorbs light to generate carriers; and by virtue of energy level difference between an inorganic layer and the organic layer and the concentration difference of the carriers, the photo-generated carriers enter the inorganic material layer and can be fast collected by electrodes, thereby having large G and R values. Meanwhile, due to high migration rate of the inorganic material, the light current response time and the fall time of the device are greatly shortened, and therefore the sensitivity of the thin film photoconductive device is improved; and the thin film photoconductive detector has an important application value.
Owner:INST OF CHEM CHINESE ACAD OF SCI

Phthalocyanine rare earth organic infrared semiconductor light guide detector

The invention relates to the technical field of photoelectron, in particular to a phthalocyanine rare earth organic infrared semiconductor light guide organic semi-conductor detector. The detector of the invention comprises a substrate, a metal or transparent conductive electrode, an organic infrared photosensitive material layer and the like. The detector is characterized in that the photosensitive material is phthalocyanine rare earth with a sandwich structure; the electrical parameters of the photosensitive material of the organic infrared semiconductor light guide detector are controllable, so that electric resistance of a device can be adjusted within a scope of three orders of magnitude by acceptor doping, the performance regulation of the device and the compatibility with the infrared system are enhanced; the photosensitive material is an organic infrared semiconductor material which can be used to fabricate a large-area and low-cost infrared photoconductive detector responsiveto infrared light with the wavelength of 1.3-1.8 micron on a silicon substrate integrated circuit, a cheap substrate glass, a quartz plate and a flexible plastic substrate and has the advantages of simple technology, low cost, controllable performances and the like.
Owner:KUNMING INST OF PHYSICS

Ultraviolet-near infrared broadband photoconductive detector

The invention discloses an ultraviolet-near infrared broadband photoconductive detector. The ultraviolet-near infrared broadband photoconductive detector comprises a GaAs material substrate layer, a Bi2Se3 material layer arranged on the upper surface of the GaAs material substrate layer, and an electrode layer arranged on the upper surface of the Bi2Se3 material layer. By adjusting the voltage applied to the electrode layer, the GaAs material substrate layer can detect a near-infrared broadband, and the Bi2Se3 material layer can detect an ultraviolet waveband. The GaAs material substrate layer and the Bi2Se3 material layer are specifically designed, the Bi2Se3 material layer is arranged on the upper surface of the GaAs material substrate layer, the GaAs material substrate layer and the Bi2Se3 material layer can form a longitudinally vertical heterojunction structure, and the spectral response range is effectively widened; and the electrode layer is arranged on the upper surface of the Bi2Se3 material layer, the GaAs material substrate layer can detect the near-infrared broadband, the Bi2Se3 material layer can detect the ultraviolet waveband by adjusting the voltage applied to the electrode layer, and ultraviolet-near-infrared broadband detection is achieved.
Owner:TIANJIN JINHANG INST OF TECH PHYSICS
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