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5697results about "Pyrometry using electric radation detectors" patented technology

Visible/near infrared image sensor

A MOS or CMOS sensor for high performance imaging in broad spectral ranges including portions of the infrared spectral band. These broad spectral ranges may also include portions or all of the visible spectrum, therefore the sensor has both daylight and night vision capabilities. The sensor includes a continuous multi-layer photodiode structure on a many pixel MOS or CMOS readout array where the photodiode structure is chosen to include responses in the near infrared spectral ranges. A preferred embodiment incorporates a microcrystalline copper indium diselenide/cadmium sulfide photodiode structure on a CMOS readout array. An alternate preferred embodiment incorporates a microcrystalline silicon germanium photodiode structure on a CMOS readout array. Each of these embodiments provides night vision with image performance that greatly surpasses the GEN III night vision technology in terms of enhanced sensitivity, pixel size and pixel count. Further advantages of the invention include low electrical bias voltages, low power consumption, compact packaging, and radiation hardness. In special preferred embodiments CMOS stitching technology is used to provide multi-million pixel focal plane array sensors. One embodiments of the invention made without stitching is a two-million pixel sensor. Other preferred embodiments available using stitching techniques include sensors with 250 million (or more) pixels fabricated on a single wafer. A particular application of these very high pixel count sensors is as a focal plane array for a rapid beam steering telescope in a low earth orbit satellite useful for tracking over a 1500-meter wide track with a resolution of 0.3 meter.
Owner:C PHOCUS

Infrared detector with micro-bridge structure and manufacturing method thereof

The invention relates to an infrared detector with a micro-bridge structure, which belongs to the technical field of micro-electromechanics, and comprises a silicon substrate as a read-out circuit of the infrared detector; a metal reflecting layer deposited on the silicon substrate; a dielectric layer which is deposited in a groove of the metal reflecting layer and has the height being consistentwith that of the metal reflecting layer; a sacrifice layer and a first release protection layer used as protection of release of the sacrifice layer which are deposited on the dielectric layer and the metal reflecting layer and form through holes by lithography and etching; a copper or tungsten pier which is deposited in the through hole of the sacrifice layer; a metal electrode deposited on the copper or tungsten pier and the first release protection layer; and a sensitive material detecting layer which is deposited on the metal electrode and the first release protection layer. A Cu-column micro-bridge structure is manufactured by using the damascene process, and a flat micro-bridge plane is manufactured by introducing the chemical mechanical polishing process (CMP), thereby being conductive to the follow-up process and improving the performances.
Owner:ZHEJIANG DALI TECH +1

Thermal image device and shooting method for thermal image

The invention discloses a thermal image device and a shooting method for the thermal image, and relates to the thermal image device and the field of application of infrared thermal imaging detection. According to the thermal device in the prior art, the shooting part, angle and distance of an object to be shot are selected according to subjective experience of a user during shooting; and the thermal device in the prior art is low in shooting speed, key shooting parts are missed, and the positions, sizes and angles of thermal images of similar objects which are to be shot and shot each time in infrared thermal images are almost different, so the effect of state estimation of the thermal image is influenced. According to the thermal image device and the shooting method, a specified position and size are displayed in the infrared thermal image, and the reference image of the predetermined morphological characteristics of the object to be shot is showed, expected thermal image quality of the object to be shot and the visual reference required by the shooting are provided for the user, the user is assisted in correctly grasping the imaging state and the shooting distance of the thermal image of the object to be shot, the technical requirement on the user is reduced, shooting speed is improved, and the estimation quality of the thermal image is improved.
Owner:MISSION INFRARED ELECTRO OPTICS TECH
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