The invention relates to the technical field of semiconductors, and discloses a full-temperature-zone polynomial digital temperature compensation method and
system based on an SOI
chip, and the method comprises the steps: obtaining the temperature
frequency data of a preset temperature zone of a target SOI
chip, fitting a full-temperature-zone curve, extracting a critical point of the temperature zone, dividing a segmented compensation interval according to the critical point, and obtaining the temperature
frequency data of the preset temperature zone of the target SOI
chip; the method comprises the following steps: calculating
frequency drift amounts under different voltages to construct a full-automatic test framework, acquiring an environment temperature parameter and an instantaneous temperature value by using the framework, analyzing a temperature compensation vector of a segmented compensation interval, further monitoring a
signal frequency interval output by a chip, extracting a
phase noise parameter, calculating a
frequency offset error amount with a preset value, and calculating the
frequency offset error amount. And analyzing an error source, optimizing a polynomial compensation order, and collecting temperature drift suppression data to generate a full temperature region compensation report. According to the invention, the performance stability of the chip in a complex environment can be improved.