827 results about "Aging test" patented technology

The invention provides a method and system for preparing a high-temperature anti-aging test board for chip testing, and relates to the technical field of data energy storage and resource scheduling, and the method comprises the steps: designing a schematic circuit diagram and a PCB wiring scheme; a test plate is made of a high-temperature resistant material; bare board verification, electrical performance verification, program setting verification, high temperature verification and junction temperature measurement verification are carried out; using data is recorded, ultrasonic cleaning and drying are carried out, and a performance evaluation model is established through a hardware management system to judge whether maintenance or replacement is needed. According to the invention, the accuracy of chip testing in a high-temperature environment is improved, and the service life of the test board is prolonged.

The invention provides an automatic chip aging test method and system and a medium, and relates to the technical field of semiconductors, and the method comprises the steps: after a type identifier of a to-be-tested chip is identified, calling an aging test parameter group corresponding to the type identifier, and carrying out the aging test of the to-be-tested chip through the aging test parameter group, after the key electrical parameters of the to-be-tested chip in the aging test process are collected, comparison is carried out to obtain a comparison result, when the comparison result exceeds a preset threshold range, abnormal recording operation is automatically carried out, and the current aging test link of the to-be-tested chip is terminated. By automatically recording abnormal information and terminating the aging process, full-automatic closed-loop processing from data acquisition and analysis to decision and control is realized, the test efficiency is improved, test equipment and samples are effectively protected, resource waste and misjudgment risks are reduced, and the problems of low aging trend identification precision and slow response speed are solved.

The invention provides an aging test method and device of equipment, the equipment, a medium and a product, and relates to the technical field of laser test. The method comprises the following steps: acquiring a plurality of operation parameters of target equipment; determining the equipment performance stability of the target equipment based on the plurality of operation parameters; determining an aging test parameter combination for the equipment aging test stage of the target equipment according to the equipment performance stability; performing virtual verification of the aging test parameter combination on the target equipment to obtain an evaluation result; based on the evaluation result, correcting the aging test parameter combination to obtain a target aging test parameter combination; and according to the target aging test parameter combination, performing an equipment aging test on the target equipment. According to the invention, the accuracy of the equipment aging test is improved.

The embodiment of the invention relates to the photovoltaic field, and provides a test method of a photovoltaic module. A grid line material of a to-be-tested photovoltaic module comprises a plurality of metals, and the method comprises the following steps: carrying out a performance test on the to-be-tested photovoltaic module to obtain a first test result; in a test environment in which the temperature range is 73-92 DEG C and the relative humidity range is 70-95% RH, a predetermined current is continuously applied to the photovoltaic module to be tested for 800-2000 hours so as to carry out an aging test on the photovoltaic module to be tested, and the predetermined current is greater than or equal to the maximum power point current of the photovoltaic module to be tested and less than or equal to the short-circuit current of the photovoltaic module to be tested; performing a performance test on the to-be-tested photovoltaic module after the aging test to obtain a second test result; and determining the performance of the grid line material according to the first test result and the second test result. The problem that the reliability of a grid line material cannot be detected in an aging test of an existing photovoltaic module is at least solved.

The invention provides a damp heat-oxygen-internal pressure-load coupled non-metal pipeline aging device and a method capable of evaluating the service life of an in-service non-metal pipeline. The non-metal pipeline aging device comprises six parts, namely an inner cavity, a box body temperature control system, a box body humidity control system, a pipeline internal pressure control system, a pipeline external load loading device and an air supply circulating system, and an accelerated aging test of a non-metal pipeline under different working condition combinations of four factors, namely damp heat, oxygen, internal pressure and load can be carried out by virtue of the aging device. Measuring oxidation induction periods before and after aging of the in-service non-metal pipeline and the non-metal pipeline with the same mark through a differential heat scanning method, substituting the oxidation induction periods into a non-metal pipeline aging life prediction formula coupled with damp heat-oxygen-internal pressure-load factors, and calculating to obtain the service aging life. According to the method, damp heat-oxygen-internal pressure-external load multi-factor coupling is realized, so that an actual service environment is accurately simulated, and comprehensive technical support can be provided for safe operation of the non-metal pipeline.

The invention discloses a multi-dimensional environment coupling aging test box and a self-adaptive control method thereof.The multi-dimensional environment coupling aging test box comprises a box body, a multi-dimensional environment coupling system and a self-adaptive control system.The box body is internally provided with a test cavity, the multi-dimensional environment coupling system is arranged in the test cavity, and the self-adaptive control system is arranged in the test cavity; and the multi-dimensional environment coupling system is connected with the adaptive control system. A multi-physics coupling environment is constructed by integrating four environment simulation modules of temperature and humidity, illumination, vibration and gas. The sensor group acquires environmental parameters (temperature and humidity, irradiance, acceleration and gas concentration) and state data of a test object in real time, and transmits the environmental parameters and the state data to the data processing unit. Based on a multi-physics field coupling model (such as finite element analysis or an empirical formula), the contribution degree of each environmental factor to material aging is calculated, a dynamic control instruction is generated, output parameters of each module are synchronously adjusted through an execution mechanism, and closed-loop control over environmental conditions is achieved.

The invention relates to the technical field of wafer test equipment, in particular to a heating aging test tool which comprises a storage rack and further comprises a wafer clamp placed on the storage rack. The detection assembly comprises a plurality of elastic probes located on one side of the storage rack and a heating disc; and the hot air guide assembly comprises a ventilation male head arranged on one side of the heating disc, an air guide pipe is arranged on the side, away from the ventilation male head, of the heat conduction cover, the air amount in the cavity is gradually decreased from near to far away from the air guide pipe, and the air flow speed is gradually decreased. A hot air flow guide assembly is arranged on a conveying frame, heat of a heating disc is guided to the position above a wafer through airflow through a heat conduction cover, the space above the wafer is divided into a plurality of cavities, the space size and the space shape of each cavity are set, the air flow speed and the contained hot air amount of each space are adjusted, and therefore the heat conduction efficiency of the wafer is improved. The influence of heat loss in the air flow process is reduced, so that the heating effects of all parts of the wafer are similar, and the detection effect is improved.

The invention discloses a light aging test instrument, which includes a test cavity, a bottom baseplate, the top cover board which is fixed on the bottom and the top of the test cavity respectively. A lamp socket which fitted with a lamp is right on the centre of the base plate, the photo permeable holes are set at the same height on the side wall of the test cavity. A visual light narrow wave band filter sheet is in the photo permeable hole, and the sample trough is fitted on the photo permeable hole. The test instrument has a compact structure, easy to disassemble and assemble, inflexible for employ, with low cost of the production.

The invention relates to a multi-dimensional aging test data analysis system and method, and aims to realize real-time acquisition and intelligent analysis of multiple performance indexes in the aging process of electronic products. The system comprises an information acquisition module, a test scheduling module, a data processing module, an analysis module, an abnormity judgment module, a report module and a communication module. Cooperative work among the modules is realized based on task driving and data circulation, accurate association of test data is realized through bar code binding, and unified analysis is performed in combination with multi-source information such as USB read-write performance, network transmission state and display resolution. The system realizes multi-task concurrent acquisition through a resource-aware scheduling strategy, and the analysis module identifies performance abnormity and outputs a structured report by combining preprocessing, feature extraction and time sequence prediction. According to the method, the test automation level and the anomaly recognition accuracy are improved.

The invention discloses an aging performance test system for a cable, and relates to the technical field of cable reliability test. The device is applied to a multi-physics field coupling aging cabin to simulate a synergistic aging environment of various stresses such as electricity, heat, machinery and chemistry. The system integrates a high-precision sensing unit, an edge intelligent analysis unit, a man-machine interaction unit and a control feedback unit, and supports multi-dimensional modeling of cable structures, materials and process parameters. Multiple groups of aging test schemes are generated and recommended based on a conditional generative adversarial network and an unsupervised clustering algorithm, multi-source data are collected in real time in the test process, and aging trends are analyzed by using deep learning models such as CNN and LSTM. Carrying out risk grade judgment in combination with a historical model, introducing an anomaly detection mechanism, and realizing atypical aging sample identification based on Mahalanobis distance and local density scoring; intelligent simulation, accurate diagnosis and abnormal feedback of cable aging behaviors are realized, and the authenticity, accuracy and intelligent level of testing are remarkably improved.

The invention discloses a sealing structure for a test, and an aging test and leakage rate detection method and system. The sealing structure comprises a tested sealing assembly and an air cavity assembly integrated in the tested sealing assembly, and serialized test samples with different filling rates and compression rates are formed by regulating and controlling the groove width and the groove depth of a sealing ring mounting groove so as to simulate various actual sealing states. An aging test adopts a multi-factor coupling accelerated aging method, and a plurality of material characterization means are combined to systematically evaluate the evolution rule of the sealing performance. According to leakage rate detection, static pressure maintaining and dynamic pressure adjusting dual-mode measurement is achieved through an air tightness detector, and the sealing characteristics under different pressure conditions are comprehensively reflected. According to the invention, direct and systematic detection of the leakage rate of the sealing structure is realized, and an innovative solution is provided for sealing performance evaluation and service life prediction of electrical equipment.

The application relates to the technical field of material testing, and relates to a high polymer material testing method and system based on image analysis, which comprises the following steps: collecting images of high polymer materials to obtain high polymer material images, performing pretreatment operations to obtain pretreated material images, identifying a defect region set in the pretreated material images, performing feature extraction on the defect regions to obtain defect region parameters, comparing the defect region parameters with defect thresholds to obtain defect deviation values, judging the defect conditions of the defect regions, confirming the high polymer materials as preliminary qualified materials if all the defect conditions are acceptable defects, performing accelerated aging tests to obtain aging test materials, performing image detection on the aging test materials to obtain detected defect regions, comparing the defect regions with the detected defect regions to obtain defect region expansion values, and obtaining material detection results. The application can solve the problem of low testing result accuracy in the current high polymer material testing process.

The invention discloses a medium-frequency transformer insulation electrothermal aging evaluation method, a test device and a storage medium, and relates to the technical field of power transformers. The medium-frequency transformer insulation electric heating aging test device comprises a function signal generator, a high-voltage power amplifier, a protection and isolation unit, an electric-heat combined aging oven and a detection and monitoring unit. The electrothermal aging evaluation method comprises the following steps: acquiring an aged sample, testing the ultimate tensile strength and polymerization degree of the aged sample, introducing a frequency correction factor to correct an attenuation constant under a power frequency condition, establishing tensile strength attenuation equations under different frequencies, and evaluating the tensile strength of the aged sample. And respectively fitting the maximum value of the accumulated loss rate and the change rate of the accumulated loss rate under different frequencies to obtain a polymerization degree accumulated loss rate improvement formula, and carrying out aging characteristic analysis on the insulation of the intermediate-frequency transformer according to the actual working condition of the insulation of the intermediate-frequency transformer. According to the technical scheme, the blank of medium-frequency transformer insulation electrothermal aging research is filled.

The invention provides a simulated aging test method for an antifouling coating. The simulated aging test method comprises the following steps: S1, constructing a natural aging performance model of the antifouling coating; s2, constructing an accelerated aging model of the antifouling coating and acquiring an acceleration ratio N of natural aging to accelerated aging; s3, based on an accelerated aging model, acquiring an acceleration period Mi corresponding to a critical threshold R (temporary i) of a copper ion exudation rate, wherein the predicted life Lp (temporary i) of the antifouling coating is equal to Mi * N; and S4, based on a natural aging model, obtaining a predicted copper ion exudation rate R < pre-i > corresponding to the predicted life Lp < pre->, judging whether R < pre-i >-R < critical i > / R < critical i > is less than or equal to 10%, if so, outputting a near threshold R < critical i > and the predicted life Lp < pre-i >, and if not, adjusting the critical threshold of the copper ion exudation rate to R < critical i + 1 > and returning to the step S3. According to the method, the performance failure threshold value of the antifouling coating is taken as a boundary condition, the performance of the antifouling coating is rapidly evaluated, the service life of the antifouling coating is quantitatively predicted, the prediction result is subjected to cooperative cross validation through linkage double models, and the reliability is improved.

The invention relates to the technical field of wafer testing, and particularly provides a clamp for wafer aging test, which comprises a PCB (printed circuit board), the PCB is fixedly arranged below an upper cover plate, a fixer fixes a probe card below the PCB, the PCB covers a lower cover plate, and the fixer and the probe card are both positioned in a test cavity. The inner ring of the fixator protrudes inwards in the radial direction to form an annular bearing platform, the multiple positioning columns are installed on the surface of the bearing platform in an array mode in the circumferential direction, multiple positioning holes are formed in the edge of the probe card in the axial direction, each positioning column corresponds to one positioning hole in position, the positioning columns are embedded into the positioning holes, and the probe card is fixed to the bearing platform. A plurality of abutting columns with adjustable resilience force are elastically arranged on the side face of each positioning column in the circumferential direction, the tail ends of the abutting columns abut against the inner surfaces of the positioning holes, and the abutting columns can elastically move in the radial direction of the positioning columns. According to the invention, the problem of poor contact effect between the probe and the contact caused by deformation of the probe card due to a high-temperature atmosphere during an aging test can be avoided.

The invention discloses a rapid aging test device and evaluation method for an LED advertising lamp box, and relates to the field of aging test devices.The rapid aging test device comprises an end base and a supporting table, a lower test area is fixedly arranged on the upper side of the end base, a middle test area is installed on the upper side of the lower test area, and an upper test area is installed on the upper side of the middle test area; a top frame is fixedly mounted at the top of the upper test area, a supporting frame is connected to the bottom of the end seat, a base is fixedly connected to the bottom of the supporting frame, universal wheel mounting hole positions are formed in the bottom of the base, and the base is placed in the aging test room. According to the rapid aging test device for the LED advertising lamp box, the three-dimensional space of a test room is fully utilized through the layered and partitioned design, the containing capacity of a unit area is greatly improved, space waste caused by plane placement is avoided, LED lamp boxes of multiple batches and multiple models can be tested at the same time, and the test efficiency is improved.

The invention relates to the technical field of aging test, in particular to a multi-factor coupling accelerated aging test system, which has the technical scheme that actual working condition fluctuation is simulated through multi-factor coupling accelerated aging, multiple parameters such as temperature, humidity, illumination, mechanical stress and chemical media are controlled at the same time, dynamic cyclic change is realized, simplification of simulation influence factors is avoided, and the test efficiency is improved. The deviation to a real environment is reduced; a miniature temperature sensor, a strain sensor and an electrochemical impedance sensor are integrated on the surface of the sample, so that nondestructive continuous acquisition of performance parameters in the aging process is realized; a central control module is used for artificial intelligence life prediction, an aging model is dynamically corrected by using a machine learning algorithm based on real-time collected data and a historical database, residual life probability prediction is realized, and prediction precision is improved according to an AI dynamic correction model.

The invention discloses a capacitor multi-stage adaptive flexible aging test method and system, and belongs to the technical field of industrial process advanced control. According to the method, voltage, current and temperature response data in the aging process of the capacitor are collected in real time by defining charging and discharging time sequences and initial parameters of four stages of preheating, constant current, constant voltage and resting; and comparing real-time data based on a preset model (an internal resistance change rate model and a temperature rise curve model), and dynamically adjusting power supply parameters in the next stage or triggering a protection mechanism. According to the method, the overstress or understress problem of a traditional fixed parameter test is solved, intelligent and personalized control of the aging process is realized, the test accuracy and the capacitor reliability are improved, and the method is suitable for aging test scenes of various capacitors.

The invention relates to the technical field of aging test, and discloses a laser chip accelerated aging test method, which comprises the following steps: synchronously measuring the optical power, the threshold current, the slope efficiency and the emergent wavelength of a laser chip in an accelerated aging environment to obtain a time sequence data matrix; performing double sparse dictionary decomposition on the time series data matrix to obtain a normal feature coefficient and a degradation feature coefficient; calculating a target characteristic value of the time-varying covariance matrix based on the degradation characteristic coefficient, and generating a dynamic characteristic value sequence and a corresponding degradation stage identifier according to the target characteristic value; and based on the degradation stage identifier, inputting the dynamic characteristic value sequence into a life prediction model for life prediction, and obtaining the remaining service life. The method can accurately capture the nonlinear characteristic and the time evolution mode of the laser chip degradation process, automatically identify the time period characteristic which contributes to life prediction, and improve the service life of the laser chip. And the accelerated aging test accuracy of the laser chip is improved.

The invention relates to the technical field of electronic device testing, and discloses a high-stress acceleration type electronic device integrated aging test system. A central control unit of the system controls an environment simulation cabin module to start a test according to a test task instruction, and the environment simulation cabin module simulates a preset high-stress environment. The aging state evaluation module determines the real-time aging grade and the risk grade of the electronic device and sends the real-time aging grade and the risk grade to the central control unit, and the central control unit adjusts stress application parameters of the environment simulation cabin module according to the real-time aging grade and the risk grade. When the fault diagnosis module detects performance abnormity, real-time performance parameters and test timestamps are sent to the self-adaptive adjustment module, and the self-adaptive adjustment module judges whether stress parameters need to be adjusted or not and sends a correction instruction to the central control unit. And the aging state evaluation module analyzes the temperature distribution data, and sends a test timestamp and real-time performance parameters to the user interaction interface for real-time display when an overheating or performance attenuation signal is generated.

The invention discloses a chip temperature and humidity aging test system, which relates to the field of chip temperature and humidity aging test and comprises a core control and digital twinborn fusion module, a three-dimensional temperature and humidity field active construction module, a multi-physical field coupling stress loading module, an energy self-adaptive supply module and a full life cycle data traceability and intelligent evaluation module. According to the chip temperature and humidity aging test system, through the core control and digital twinning fusion module, chip cross-scale digital twinning modeling containing process deviation and deep closed loop of digital rehearsal, physical test and feedback regulation can be realized, aging key nodes can be pre-judged in advance, the physical test can be accurately guided, and the chip temperature and humidity aging test efficiency can be improved. The perspectiveness and the accuracy of the test are greatly improved; the three-dimensional temperature and humidity field active building module can build a three-dimensional non-uniform temperature and humidity field which is precisely regulated and controlled in a layered mode and driven by a dynamic flow field, the three-dimensional non-uniform temperature and humidity field is closer to a heat and humidity distribution and airflow disturbance scene in actual application of a chip, and temperature and humidity stress simulation is more real.

The invention belongs to the field of greenhouse film aging test methods, and relates to an aging test device considering greenhouse film stress and a test method thereof.The aging test device comprises an upper environment box, a lower environment box, a test observation box and a control panel which are arranged on a main frame, a support plate and an observation platform are arranged in the test observation box, and a greenhouse film fixing frame is arranged above the support plate and the observation platform; an arc-shaped arch frame is arranged in the greenhouse film fixing frame, a flexible film pressing rope is arranged at the top of the greenhouse film fixing frame, and the two ends of the greenhouse film fixing frame are connected with a rotary tensioning device at an end plate of the greenhouse film fixing frame and a force sensor at an end plate of the other opposite end of the greenhouse film fixing frame respectively. Tension needed in the test process can be accurately adjusted and applied before the test is started through the rotary tensioning device and the force sensor, if an electric tensioning actuator is used, greenhouse film stress can be compensated and calibrated in real time in the test process, and other environmental parameters such as temperature, humidity and ultraviolet light intensity can be further adjusted. And a multi-environmental factor interaction test of the greenhouse film in a natural curved surface and stress state is realized.

The invention discloses an anti-embrittlement flexible armored cable in an extremely cold environment. The anti-embrittlement flexible armored cable comprises a conductor, an insulating layer, a buffer isolation layer, a flexible armored layer and an outer sheath layer which are sequentially arranged from inside to outside. According to the armored cable, the structure of an existing cable is improved, the material formula of the insulating layer and the material formula of the outer sheath layer are optimized, the requirements for embrittlement resistance and high flexibility can be met, the protection performance of the armored cable can be enhanced, and aging tests show that the cable has good flexibility. The cable can meet the use requirement of long-term stable operation under the extremely cold severe condition with the temperature of-60 DEG C, has important practical significance and economic value, is reasonable in design, and is worthy of popularization and use.

The invention discloses a carbon fiber composite material cable core long-term performance detection device, and relates to the field of cable performance tests.The carbon fiber composite material cable core long-term performance detection device comprises a test box, a test cavity is formed in the test box, a bearing unit is arranged on the inner wall of the test cavity, a test piece is borne on the bearing unit, and an electric heating piece and a temperature and humidity sensor are arranged on the inner wall of the test cavity; and a controller is arranged on the test box. According to the long-term performance detection device for the carbon fiber composite material cable core, through cooperative use of the sand wind simulation unit and the moisture simulation unit, single environment simulation and complex environment simulation can be performed according to needs in the aging test process of the carbon fiber composite material cable; therefore, the aging test simulation data of the carbon fiber composite cable is more comprehensive.

The utility model discloses a capacitor aging device, and specifically relates to the capacitor aging device technology field, the capacitor aging device comprises a bottom box and a bedplate, one side of the upper end surface of the bedplate is provided with a drying oven, one side of the inlet of the drying oven is provided with a tray, one side of the outer surface wall of the bedplate is fixedly connected with a first supporting seat, and the first supporting seat is provided with a second supporting seat. And a first six-axis robot is mounted on the upper end surface of the first supporting seat. According to the utility model, the six-axis robot, the driving motor, the photoelectric sensor, the controller and the rail robot are arranged, so that the device carries out an aging test on the capacitor in an automatic mode, the work of placing, wiring and the like of the capacitor can be rapidly completed, manual operation is not needed, the preparation time of the test can be greatly shortened, and the test efficiency is improved. According to the aging test device, the aging test efficiency of the capacitor is improved, the situation that wire connection errors and incorrect capacitor direction placement are prone to occurring due to manual operation is also avoided, the error rate caused by human factors is effectively reduced, and the test accuracy is improved.

The invention provides a device for electrical performance test and high-temperature aging test of a high-power-density module product, and relates to the technical field of electronic product test and aging. A large-current clamping structure is arranged, so that the reliability requirement of long-time repeated clamping of a large-current pin in the electrical performance test and high-temperature aging test process of the high-power density module is met; a vertical pressing structure and a double-sided heat dissipation structure are arranged, so that the heat dissipation requirement of a high-power density module in an electrical performance test and a high-temperature aging test when a product works in a high heating state is met; and a double-sided temperature measurement structure is arranged, so that real-time temperature measurement and monitoring can be carried out on the upper surface and the lower surface of the high-power density module product in the electrical performance test and high-temperature aging test processes.

The invention relates to the technical field of power equipment testing, in particular to a high-voltage direct-current switch integrated equipment aging test platform which comprises a multi-dimensional interface adaptation module, a collaborative aging test module, an aging feature extraction module and a cyclic test control module. The multi-dimensional interface adaptation module realizes rapid access and standardization by acquiring device interface features and comparing and adjusting, cooperates with the aging test module to synchronously apply four stresses, obtains a dynamic acceleration factor quantitative acceleration effect through a coupling formula, the aging feature extraction module extracts related parameters, quantifies the degradation degree in combination with a dynamic weight formula, and finally obtains the aging test result. The cycle test control module adjusts the cycle index according to the acceleration factor and the degradation degree and in combination with the fluctuation amplitude, rapid equipment adaptation is achieved, the composite aging process can be accurately reproduced, the test process is dynamically optimized, the test standardization level, the consistency with the actual working condition and the test efficiency are remarkably improved, and the test efficiency is improved. And reliable technical support is provided for equipment aging characteristic evaluation.

The invention relates to the technical field of electric power fitting testing, in particular to an electric power fitting aging testing device and method, the stress state of an electric power fitting in actual use is simulated through the cooperation of a tensioning mechanism and a mechanical loading mechanism, environmental loads such as temperature change, humidity change and salt mist are applied through an environmental load simulation mechanism, and the aging test of the electric power fitting is achieved. And meanwhile, alternating current is applied to the electric power fitting through the power supply module, so that the actual load of the electric power fitting is comprehensively simulated, a test environment identical to an actual application environment is constructed, and the reliability of a test result is ensured. And meanwhile, an equivalent cable simulation load spectrum is deduced according to historical load data by using a fatigue damage model, and the tensioning mechanism, the mechanical loading mechanism and the environment simulation mechanism act cooperatively according to the cable simulation load spectrum to carry out aging test on the electric power fitting, so that the test time is shortened, and the accuracy of an aging test result is ensured.

The invention relates to a life evaluation method suitable for an initiating explosive material in a temperature and pressure dual-stress environment, and belongs to the technical field of initiating explosive devices. According to the method, by establishing the temperature and pressure dual-stress accelerated aging test method for the initiating explosive material, a mathematical model adaptation method is adopted to research the performance degradation law of the initiating explosive material in the temperature and pressure environment, and a pre-estimation model of the storage life in the temperature and pressure environment is established; the storage life data of the initiating explosive material in the temperature and pressure environment is obtained, the reliability analysis of the initiating explosive material in the temperature and pressure dual-stress environment is more comprehensive and accurate, and the method is suitable for the reliability analysis of various initiating explosive materials in the temperature and pressure dual-stress environment; and corresponding data basis and theoretical basis are provided for storage environment requirements and working reliability of initiating explosive devices.

The invention relates to the technical field of power device testing, and discloses an aging test method of a power device, electronic equipment and a storage medium, and the aging test method of the power device comprises the steps: cutting a wafer into bare chips; when the bare chip is loaded in the aging test fixture, performing an aging test on the bare chip through the aging test fixture; carrying out performance test on the bare chip through the aging test fixture; packaging the bare chip passing the aging test and the performance test; according to the technical scheme, the aging test and the performance test are performed on the bare chip after the wafer is cut, and the same aging test fixture is adopted to complete the two processes, so that secondary damage to the chip caused by multiple times of needle insertion and multiple times of carrying in a traditional method is avoided, and the reliability of the power device is effectively improved.