1416 results about "Aging test" patented technology

The invention relates to the technical field of chip aging tests, and discloses a chip aging test fixture control method and device and a storage medium, and the method comprises the steps: carrying out the parameter collection of a test fixture, and obtaining original test data; performing control signal analysis and signal fusion, and inputting a fused temperature control instruction into a temperature control unit of the test fixture to obtain steady-state test data; performing multi-dimensional analysis and data screening to obtain effective test data; performing performance feature extraction to obtain performance feature data; grouping is carried out, the weight coefficient of each test channel is calculated, weighting processing is carried out in combination with a failure mode standard, and aging characteristic data is obtained; and inputting the aging characteristic data into the life prediction model to calculate a performance prediction value and a life prediction value to obtain a chip aging test result, the chip performance degradation characteristics can be accurately captured, the performance prediction value and the life prediction value are output at the same time, and a comprehensive aging evaluation result is provided.

The invention relates to the technical field of chip testing, in particular to a chip aging test and analysis method, which comprises the following steps of: constructing an aging parameter matrix containing process deviation, electrical parameters and thermodynamic parameters on the basis of fusion of wafer level and packaged test data, multi-stress cooperative loading is realized through a programmable power supply and a multi-zone temperature control array, transient electric signals, thermal imaging data and leakage current frequency spectrums are acquired in real time, an electrical-thermal coupling coefficient and a process deviation sensitivity factor are extracted in a cross-dimension manner, a non-linear recession model is established, differential aging paths of chip functional blocks are evaluated, and the reliability of the chip functional blocks is improved. And based on the dynamic life prediction model and a fault early warning mechanism, generating and executing an adaptive test optimization strategy to realize early prediction and stress adjustment of multiple failure modes. According to the invention, the efficiency and accuracy of the aging test can be obviously improved, and technical support is provided for high-reliability evaluation of deep submicron and post-mole times of chips.

The invention discloses a cable aging test system and method based on the Internet of Things, and relates to the technical field of cable testing, and the method comprises the steps: collecting cable operation parameters in real time through a circuit breaker node disposed in a cable line, and synchronously monitoring the environment temperature and humidity; wherein the cable operation parameters comprise conductor temperature, leakage current, voltage fluctuation value and load power; the collected cable operation parameters are transmitted to a cloud platform through an Internet of Things communication module; analyzing the aging degree value of the cable insulation layer based on an electrothermal two-factor synergistic aging model; dynamically calculating an ignition risk value of the cable through a fire risk assessment algorithm in combination with the aging degree value; and when the aging degree value or the ignition risk value exceeds a threshold value, generating an early warning report, pushing the early warning report to the terminal equipment, and marking the position of the hidden danger at the same time.

The invention discloses a high-temperature aging test box health state assessment method and device. The method comprises the following steps: acquiring a nine-point temperature measurement signal, a compressor vibration signal and a fan rotation speed signal of a to-be-assessed high-temperature aging test box; performing feature extraction on the monitoring signal to obtain a multi-dimensional feature sequence; inputting the multi-dimensional feature sequence into a pre-trained time convolutional network model to obtain a degradation feature state of the high-temperature aging test box; and under the condition that the high-temperature aging test box is in a degradation state, determining a state degradation curve of the to-be-evaluated high-temperature aging test box based on the probability space point after the multi-dimensional feature sequence mapping and the health baseline in the time convolutional network model so as to determine the health state of the high-temperature aging test box. According to the method for evaluating the health state of the high-temperature aging test box, the health state of the high-temperature aging test box can be accurately evaluated.

The invention provides a method and system for preparing a high-temperature anti-aging test board for chip testing, and relates to the technical field of data energy storage and resource scheduling, and the method comprises the steps: designing a schematic circuit diagram and a PCB wiring scheme; a test plate is made of a high-temperature resistant material; bare board verification, electrical performance verification, program setting verification, high temperature verification and junction temperature measurement verification are carried out; using data is recorded, ultrasonic cleaning and drying are carried out, and a performance evaluation model is established through a hardware management system to judge whether maintenance or replacement is needed. According to the invention, the accuracy of chip testing in a high-temperature environment is improved, and the service life of the test board is prolonged.

The invention provides an LCM module aging test method, device and equipment and a storage medium, and the method comprises the steps: obtaining the initial state data and initial environment parameter combination of an LCM module through intelligent environment simulation and initialization processing, and carrying out the multi-mode alternate aging test and real-time monitoring processing of the module through an intelligent environment simulation system, and obtaining performance data in a dynamic environment, and carrying out surface periodic scanning and working sound recording to obtain microstructure data and acoustic data. Through intelligent fault detection and deep analysis processing, fault features and reasons of the module are identified, predictive analysis is performed on the fault in combination with a machine learning algorithm, and a predictive fault trend and an optimized environmental parameter combination are generated. And performing comprehensive performance evaluation on the module according to the fault features, the reason analysis, the prediction trend and the optimization parameters. According to the invention, through combination of intelligent environment simulation, real-time monitoring and deep analysis, accurate performance evaluation and fault prediction of the LCM are realized.

The invention relates to the technical field of fault diagnosis, in particular to a fault self-diagnosis system and method for a high and low temperature aging test chamber of a storage chip and computer equipment. The temperature control abnormal index is obtained through the data of the temperature control system sensor, early warning can be performed when the temperature control system has abnormal fluctuation, the performance evaluation basis of the air circulation system is provided by the air system efficiency coefficient, the heating efficiency and the refrigeration coefficient are obtained through the data of the heating and refrigerating system sensor, and the performance of the heating and refrigerating system is evaluated. An electrical stability index is obtained through data of a test system sensor, the operation stability of an electrical system is evaluated, the stability of the electrical system is detected in time, and a fault probability index is obtained through a system entropy increase rate, the electrical stability index, a thermal coupling factor, a wind system efficiency coefficient and a temperature control abnormal index. Therefore, the stability and the reliability of the equipment can be improved, the maintenance cost can be reduced, the use efficiency of the equipment is improved, and the accuracy and the safety of test results are ensured.

The invention discloses a scene self-adaptive aging test method and system for an extra-high voltage MOS (Metal Oxide Semiconductor), and relates to the related technical field of MOS test, and the method comprises the steps: building a device aging test platform; performing test condition analysis on the application scene information of the target extra-high voltage MOS device; performing pretest adjustment on the target extra-high voltage MOS device, and determining an aging test update parameter table; performing aging test monitoring on the target extra-high voltage MOS device; and calling an extra-high voltage MOS aging adaptive evaluator to process and evaluate the device aging scene test data stream set to obtain a device scene aging performance test result. The technical problems that in the prior art, due to the fact that an MOS aging test lacks scene adaptability, the aging process of the MOS device in the actual application environment is difficult to accurately simulate, the test pertinence is insufficient, and the result accuracy is poor are solved, and the technical effect of improving the MOS device aging test pertinence and the result accuracy is achieved.

The invention relates to an aging test method and device and a medium, and relates to the technical field of aging tests.The method comprises the steps that based on a distributed data acquisition system architecture, performance parameters of a to-be-tested product are synchronously acquired at a plurality of test points, data acquired at all the test points are synchronously integrated through timestamp alignment, and integrated data are obtained; based on a preset data analysis model, performing time sequence analysis on the continuously collected performance parameters, fitting a performance degradation curve by using a regression analysis method, determining a degradation function, and predicting the performance failure time of the to-be-tested product according to the degradation function; and determining a plurality of accelerated aging test schemes based on the performance failure time and a combination of a plurality of environmental factors, and executing all the accelerated aging test schemes through a simulator to obtain a plurality of life prediction results. The effect of improving the accuracy of performance evaluation and life prediction of the electronic product is achieved.

The invention provides a high polymer material performance prediction method based on deep learning, and relates to the technical field of material performance prediction.The method comprises the specific steps that variable parameters influencing high polymer material performance are determined, multiple sets of samples are prepared and subjected to a tensile test and an accelerated aging test, and initial and final tensile performance parameters are obtained; and constructing and training an initial performance prediction model and an aging performance prediction model based on a deep learning network model, inputting related parameters into the models to obtain performance parameters, generating an environment severe coefficient through data processing, calculating a performance evaluation index in combination with a tensile performance parameter variation, and comparing the performance evaluation index with a preset threshold value to evaluate the material performance. According to the method, the performance change of the aged material can be accurately predicted, the performance evolution can be reflected, the prediction result is closer to reality, the material performance can be comprehensively evaluated, and an effective reference and a scientific basis are provided for long-term use, selection and application of the material.

The invention provides a plywood weather resistance accelerated aging test device and test method, and belongs to the technical field of aging test equipment. The testing device comprises a supporting table and a testing box fixedly installed at the top of the supporting table, a rotary supporting mechanism is arranged in the testing box and used for positioning the plywood and adjusting the rotation angle of the plywood in the horizontal plane, and two waxing mechanisms are further arranged in the testing box and used for waxing the plywood in the horizontal plane. The two waxing mechanisms are used for conducting edge sealing treatment on the plywood. The testing method comprises the following steps: T2, placing the plywood on a positioning carrier plate on the rotary supporting mechanism to complete positioning; and T3, the plywood is fixed through a pressing mechanism. The plywood weatherability accelerated aging test device provided by the invention has the advantages that the plywood is automatically subjected to edge sealing and waxing, the human input can be reduced, and the reliability and integrity of wax layer coating can be improved.

The invention discloses an aging test method, particularly relates to the field of aging tests, and solves the problem that an aging test result is inaccurate due to the fact that a current shutdown circuit breaker aging test method excessively depends on previous data, and the aging test method specifically comprises the following steps: selecting a fixed number of shutdown circuit breaker screen model machines as test samples; constructing a first test environment and a second test environment of the test sample; performing a hygrothermal aging test on the test sample based on the test parameters of the test environment to obtain a hygrothermal aging normal signal or a hygrothermal aging abnormal signal corresponding to the test sample; performing an ultraviolet aging test on the test sample based on the test parameters of the test environment to obtain an ultraviolet aging normal signal or an ultraviolet aging abnormal signal corresponding to the test sample; the aging test result of the test sample is judged based on the test passing rate. The aging test result of the shutdown circuit breaker screen model machine is accurately analyzed.

The invention provides an automatic chip aging test method and system and a medium, and relates to the technical field of semiconductors, and the method comprises the steps: after a type identifier of a to-be-tested chip is identified, calling an aging test parameter group corresponding to the type identifier, and carrying out the aging test of the to-be-tested chip through the aging test parameter group, after the key electrical parameters of the to-be-tested chip in the aging test process are collected, comparison is carried out to obtain a comparison result, when the comparison result exceeds a preset threshold range, abnormal recording operation is automatically carried out, and the current aging test link of the to-be-tested chip is terminated. By automatically recording abnormal information and terminating the aging process, full-automatic closed-loop processing from data acquisition and analysis to decision and control is realized, the test efficiency is improved, test equipment and samples are effectively protected, resource waste and misjudgment risks are reduced, and the problems of low aging trend identification precision and slow response speed are solved.

The invention provides an aging test method and device of equipment, the equipment, a medium and a product, and relates to the technical field of laser test. The method comprises the following steps: acquiring a plurality of operation parameters of target equipment; determining the equipment performance stability of the target equipment based on the plurality of operation parameters; determining an aging test parameter combination for the equipment aging test stage of the target equipment according to the equipment performance stability; performing virtual verification of the aging test parameter combination on the target equipment to obtain an evaluation result; based on the evaluation result, correcting the aging test parameter combination to obtain a target aging test parameter combination; and according to the target aging test parameter combination, performing an equipment aging test on the target equipment. According to the invention, the accuracy of the equipment aging test is improved.

The embodiment of the invention relates to the photovoltaic field, and provides a test method of a photovoltaic module. A grid line material of a to-be-tested photovoltaic module comprises a plurality of metals, and the method comprises the following steps: carrying out a performance test on the to-be-tested photovoltaic module to obtain a first test result; in a test environment in which the temperature range is 73-92 DEG C and the relative humidity range is 70-95% RH, a predetermined current is continuously applied to the photovoltaic module to be tested for 800-2000 hours so as to carry out an aging test on the photovoltaic module to be tested, and the predetermined current is greater than or equal to the maximum power point current of the photovoltaic module to be tested and less than or equal to the short-circuit current of the photovoltaic module to be tested; performing a performance test on the to-be-tested photovoltaic module after the aging test to obtain a second test result; and determining the performance of the grid line material according to the first test result and the second test result. The problem that the reliability of a grid line material cannot be detected in an aging test of an existing photovoltaic module is at least solved.

The invention provides a wear resistance testing system of a high-strength guide plate, and relates to the technical field of wear resistance testing, and the wear resistance testing system comprises a simulation load module used for executing load control on a test guide plate sample by taking a load range and a wood environment as simulation conditions; the wear analysis module is used for performing wear analysis on the test guide plate sample; the model construction module is used for constructing a guide plate wear prediction model according to the simulation conditions, the accelerated aging environment and the guide plate wear data; the wear prediction module is used for performing wear prediction on the target guide plate through the guide plate wear prediction model to obtain target wear data; the wear-resistant coefficient calculation module is used for calculating a wear-resistant coefficient according to the target wear data to obtain a target wear-resistant coefficient. The guide plate wear resistance testing method can solve the technical problem of poor wear resistance testing accuracy caused by lack of comprehensive consideration of the influence of complex environmental conditions on wear in the prior art, and improves the accuracy of the guide plate wear resistance testing by simulating the actual use environment and accelerating the aging test.

The invention provides a damp heat-oxygen-internal pressure-load coupled non-metal pipeline aging device and a method capable of evaluating the service life of an in-service non-metal pipeline. The non-metal pipeline aging device comprises six parts, namely an inner cavity, a box body temperature control system, a box body humidity control system, a pipeline internal pressure control system, a pipeline external load loading device and an air supply circulating system, and an accelerated aging test of a non-metal pipeline under different working condition combinations of four factors, namely damp heat, oxygen, internal pressure and load can be carried out by virtue of the aging device. Measuring oxidation induction periods before and after aging of the in-service non-metal pipeline and the non-metal pipeline with the same mark through a differential heat scanning method, substituting the oxidation induction periods into a non-metal pipeline aging life prediction formula coupled with damp heat-oxygen-internal pressure-load factors, and calculating to obtain the service aging life. According to the method, damp heat-oxygen-internal pressure-external load multi-factor coupling is realized, so that an actual service environment is accurately simulated, and comprehensive technical support can be provided for safe operation of the non-metal pipeline.

The invention discloses a cyclic aging test and performance evaluation method, device and system of a battery cell and a storage medium, and is applied to the technical field of testing, and the cyclic aging test method of the battery cell comprises the following steps: executing a charging operation on a to-be-tested battery cell of the aging test; discharging operation is carried out on the to-be-detected battery cell after charging is finished, so that the to-be-detected battery cell enters an over-discharging state, and the over-discharging state is a state which is reached after the to-be-detected battery cell reaches a full discharging state and the discharging operation is continuously carried out on the to-be-detected battery cell; and data acquisition is performed on the to-be-tested cell entering the over-discharge state to obtain the total discharge capacity and the expansion force of the aging test, and the next aging test is cyclically performed until the cyclic aging test is stopped, so that the problem of low aging test efficiency of the cell is relieved, and the accelerated cyclic aging test efficiency of the cell is improved.

The invention provides a silicone rubber aging test method and device, electronic equipment and a storage medium, and relates to the technical field of silicone rubber. The silicone rubber aging test method comprises the following steps: according to a preset actual application environment of target silicone rubber, determining cycle test parameters of preset aging factors corresponding to the actual application environment; determining an acceleration factor of the aging test according to the cycle test parameters and a preset calculation mode; performing thermogravimetric analysis on the target silicone rubber according to the cycle test parameters to determine mass loss parameters of the target silicone rubber; and determining an aging test result according to the elongation at break, the acceleration factor and the mass loss parameter of the target silicone rubber. According to the method, the aging performance of the target silicone rubber is integrally and comprehensively evaluated by combining multiple indexes such as the elongation at break, the acceleration factor and the quality loss parameter, and the test efficiency is improved.

The invention discloses a rapid aging test method and device for a memory array, and relates to the technical field of memory array test. Comprising the following steps: in a read-write operation process, capturing an instantaneous current waveform of each storage unit in a memory array, extracting current characteristics from the instantaneous current waveform, constructing a difference matrix by utilizing the extracted current characteristics, and dynamically marking the storage units exceeding a threshold value. According to the invention, by analyzing the difference of the stored data volume before and after the instantaneous current waveform capture of the storage unit, the capacity recession condition of the storage unit is evaluated, and the capacity recession data is used as an auxiliary evaluation index and combined with the aging rate of the storage unit. According to the invention, comprehensive evaluation of the aging degree of the memory units is completed without applying external influence conditions to the memory array, so that the accuracy of the aging test is improved, the aging difference between the memory units can be effectively identified, and the key memory units are ensured to be processed and maintained in time.

The invention discloses a multi-dimensional environment coupling aging test box and a self-adaptive control method thereof.The multi-dimensional environment coupling aging test box comprises a box body, a multi-dimensional environment coupling system and a self-adaptive control system.The box body is internally provided with a test cavity, the multi-dimensional environment coupling system is arranged in the test cavity, and the self-adaptive control system is arranged in the test cavity; and the multi-dimensional environment coupling system is connected with the adaptive control system. A multi-physics coupling environment is constructed by integrating four environment simulation modules of temperature and humidity, illumination, vibration and gas. The sensor group acquires environmental parameters (temperature and humidity, irradiance, acceleration and gas concentration) and state data of a test object in real time, and transmits the environmental parameters and the state data to the data processing unit. Based on a multi-physics field coupling model (such as finite element analysis or an empirical formula), the contribution degree of each environmental factor to material aging is calculated, a dynamic control instruction is generated, output parameters of each module are synchronously adjusted through an execution mechanism, and closed-loop control over environmental conditions is achieved.

The invention relates to the technical field of battery detection, and discloses a new energy battery aging test system capable of simulating temperature and humidity, which comprises a vacuum sealing test box chamber, a main control unit, a temperature control system, a humidity control system, a power supply management module, a battery tray and a vibration module, the main control unit, the temperature control system, the humidity control system, the power management module, the battery tray and the vibration module are all arranged in the vacuum sealing test box chamber. According to the new energy battery aging test system capable of simulating temperature and humidity, data comprehensiveness of new energy battery aging test is realized through the temperature control system, the humidity control system and the vibration module, the accuracy and stability of various parameters are ensured, the influence of personal errors is reduced, the comprehensiveness of battery aging test data is improved, and the test efficiency is improved. And a test environment is closer to an actual use scene, so that the performance and the service life of the battery in real use can be evaluated more accurately.

The invention relates to the technical field of wafer test equipment, in particular to a heating aging test tool which comprises a storage rack and further comprises a wafer clamp placed on the storage rack. The detection assembly comprises a plurality of elastic probes located on one side of the storage rack and a heating disc; and the hot air guide assembly comprises a ventilation male head arranged on one side of the heating disc, an air guide pipe is arranged on the side, away from the ventilation male head, of the heat conduction cover, the air amount in the cavity is gradually decreased from near to far away from the air guide pipe, and the air flow speed is gradually decreased. A hot air flow guide assembly is arranged on a conveying frame, heat of a heating disc is guided to the position above a wafer through airflow through a heat conduction cover, the space above the wafer is divided into a plurality of cavities, the space size and the space shape of each cavity are set, the air flow speed and the contained hot air amount of each space are adjusted, and therefore the heat conduction efficiency of the wafer is improved. The influence of heat loss in the air flow process is reduced, so that the heating effects of all parts of the wafer are similar, and the detection effect is improved.

The invention discloses a light aging test instrument, which includes a test cavity, a bottom baseplate, the top cover board which is fixed on the bottom and the top of the test cavity respectively. A lamp socket which fitted with a lamp is right on the centre of the base plate, the photo permeable holes are set at the same height on the side wall of the test cavity. A visual light narrow wave band filter sheet is in the photo permeable hole, and the sample trough is fitted on the photo permeable hole. The test instrument has a compact structure, easy to disassemble and assemble, inflexible for employ, with low cost of the production.

The embodiment of the invention provides a method and device for evaluating the health state of a front-end isolated switching power supply of an aging table, and relates to the technical field of aging tests.The method comprises the steps that in the aging test process, the front-end isolated switching power supply of the aging testbed can generate monitoring signals such as voltage and current; a directly measured monitoring signal is large in data size and contains a large amount of redundant information, firstly, feature extraction is conducted on directly measured data, and a feature sequence with high information density is obtained; further spatial mapping is carried out on the feature sequence by using a neighbor component analysis algorithm, and automatic segmentation of the health state and the degradation state of the new test sample is realized; and performing quantitative calculation of the health state on the mapped feature sequence by using a multi-distance measurement fusion algorithm with automatic weight optimization, and completing health assessment of the front-end isolated switching power supply of the aging test stand.

The invention relates to a multi-dimensional aging test data analysis system and method, and aims to realize real-time acquisition and intelligent analysis of multiple performance indexes in the aging process of electronic products. The system comprises an information acquisition module, a test scheduling module, a data processing module, an analysis module, an abnormity judgment module, a report module and a communication module. Cooperative work among the modules is realized based on task driving and data circulation, accurate association of test data is realized through bar code binding, and unified analysis is performed in combination with multi-source information such as USB read-write performance, network transmission state and display resolution. The system realizes multi-task concurrent acquisition through a resource-aware scheduling strategy, and the analysis module identifies performance abnormity and outputs a structured report by combining preprocessing, feature extraction and time sequence prediction. According to the method, the test automation level and the anomaly recognition accuracy are improved.

To provide an environmental test apparatus capable of performing a long-term deterioration test in which a test sample is exposed for a long period to methane-dissolved water under a low-temperature, high-pressure environment simulating a seafloor environment.SOLUTION: An environmental test apparatus 100 according to an embodiment is an environmental test apparatus for performing a long-term deterioration test in which a test sample is exposed to methane-dissolved water under an environment simulating a seafloor environment where methane hydrate is present and includes: a pressure-resistant vessel 110 which houses the test sample and in which the methane-dissolved water at a temperature and pressure corresponding to the seafloor environment flows through the test sample; a cooling unit 120 that cools and maintains the pressure-resistant vessel 110 at the temperature; and a pressurizing circulation unit 130 that pressurizes the methane-dissolved water flowing out from an outlet 110b of the pressure-resistant vessel 110 and sends it toward an inlet 110a of the pressure-resistant vessel 110.SELECTED DRAWING: Figure 1

The invention belongs to the technical field of aging life evaluation of rubber sealing elements, and relates to an accelerated aging test device for a rubber sealing ring. Comprising a motor driving and torque detecting system (1), a rotating shaft system (2), a rubber sealing ring testing system (3) and a device mounting bottom plate (4), the rubber sealing ring accelerated aging test device provided by the invention is relatively simple in structural form and convenient to operate, and can be used for carrying out an accelerated aging test of the rubber sealing ring, so that the compression deformation during assembly of the rubber sealing ring can be flexibly controlled; parameters such as medium temperature, pressure, part rotating speed, torque, revolution and the like which are consistent with or higher than those of an actual sealing structure can be controlled in the test process, and the aging and failure processes of the rubber sealing ring during working in a weapon equipment structure can be effectively simulated; and the effect of improving the accuracy of aging resistance evaluation and service life prediction of the rubber sealing ring is achieved.

The invention discloses a method for evaluating the quality of a photovoltaic module. The evaluation method comprises the following steps: before a sequence aging test, heating a to-be-tested photovoltaic module, and performing a power test on the to-be-tested photovoltaic module to obtain a first power test result; after the sequence aging test, performing EL test and power test on the to-be-tested photovoltaic module under a T98% temperature condition to obtain a first EL test result and a second power test result; the defect percentage is calculated according to a second EL test result and the first EL test result of the photovoltaic module to be tested under the STC, and the second EL test result is obtained before the sequence aging test; calculating the power attenuation of the to-be-tested photovoltaic module under the T98% temperature condition by using the first power test result and the second power test result; and evaluating the quality of the photovoltaic module to be tested by using the defect percentage and the power attenuation. The evaluation method can effectively improve the accuracy and integrity of quality evaluation of the photovoltaic module.

The utility model provides a sealing aging test device for multi-environment simulation. The sealing aging test device comprises an upper end cover, a lower end cover, a gasket, a to-be-tested sealing ring and a sealing ring, the gasket is arranged between each stage of lower end cover and the upper end cover, the to-be-tested sealing ring is arranged between each stage of lower end cover and the gasket, and the sealing rings are arranged between the gasket and each stage of upper end cover and between the middle upper end cover and the middle lower end cover; the end covers are connected through bolts, and the gaskets are in interference fit connection or threaded connection with the upper end covers; the end cover center hole channel forms a first flow channel, the outer side hole channel forms a second flow channel, and flow channel isolation is achieved through a sealing ring. The aging conditions of the sealing ring under different compression amounts can be tested by adjusting the thickness of the gasket, the influence of different unbalance loading forces on the aging performance of the sealing ring can be tested by adjusting the gradient of the first end face of the gasket, and the aging conditions of the sealing ring under different working conditions can be simulated by inputting media into the two flow channels. Multiple groups of upper and lower end covers can be continuously added in the device.