1056 results about "Aging test" patented technology

The invention relates to the technical field of chip testing, in particular to a chip aging test and analysis method, which comprises the following steps of: constructing an aging parameter matrix containing process deviation, electrical parameters and thermodynamic parameters on the basis of fusion of wafer level and packaged test data, multi-stress cooperative loading is realized through a programmable power supply and a multi-zone temperature control array, transient electric signals, thermal imaging data and leakage current frequency spectrums are acquired in real time, an electrical-thermal coupling coefficient and a process deviation sensitivity factor are extracted in a cross-dimension manner, a non-linear recession model is established, differential aging paths of chip functional blocks are evaluated, and the reliability of the chip functional blocks is improved. And based on the dynamic life prediction model and a fault early warning mechanism, generating and executing an adaptive test optimization strategy to realize early prediction and stress adjustment of multiple failure modes. According to the invention, the efficiency and accuracy of the aging test can be obviously improved, and technical support is provided for high-reliability evaluation of deep submicron and post-mole times of chips.

The invention discloses a cable aging test system and method based on the Internet of Things, and relates to the technical field of cable testing, and the method comprises the steps: collecting cable operation parameters in real time through a circuit breaker node disposed in a cable line, and synchronously monitoring the environment temperature and humidity; wherein the cable operation parameters comprise conductor temperature, leakage current, voltage fluctuation value and load power; the collected cable operation parameters are transmitted to a cloud platform through an Internet of Things communication module; analyzing the aging degree value of the cable insulation layer based on an electrothermal two-factor synergistic aging model; dynamically calculating an ignition risk value of the cable through a fire risk assessment algorithm in combination with the aging degree value; and when the aging degree value or the ignition risk value exceeds a threshold value, generating an early warning report, pushing the early warning report to the terminal equipment, and marking the position of the hidden danger at the same time.

The invention discloses a high-temperature aging test box health state assessment method and device. The method comprises the following steps: acquiring a nine-point temperature measurement signal, a compressor vibration signal and a fan rotation speed signal of a to-be-assessed high-temperature aging test box; performing feature extraction on the monitoring signal to obtain a multi-dimensional feature sequence; inputting the multi-dimensional feature sequence into a pre-trained time convolutional network model to obtain a degradation feature state of the high-temperature aging test box; and under the condition that the high-temperature aging test box is in a degradation state, determining a state degradation curve of the to-be-evaluated high-temperature aging test box based on the probability space point after the multi-dimensional feature sequence mapping and the health baseline in the time convolutional network model so as to determine the health state of the high-temperature aging test box. According to the method for evaluating the health state of the high-temperature aging test box, the health state of the high-temperature aging test box can be accurately evaluated.

The invention provides a method and system for preparing a high-temperature anti-aging test board for chip testing, and relates to the technical field of data energy storage and resource scheduling, and the method comprises the steps: designing a schematic circuit diagram and a PCB wiring scheme; a test plate is made of a high-temperature resistant material; bare board verification, electrical performance verification, program setting verification, high temperature verification and junction temperature measurement verification are carried out; using data is recorded, ultrasonic cleaning and drying are carried out, and a performance evaluation model is established through a hardware management system to judge whether maintenance or replacement is needed. According to the invention, the accuracy of chip testing in a high-temperature environment is improved, and the service life of the test board is prolonged.

The invention relates to the technical field of fault diagnosis, in particular to a fault self-diagnosis system and method for a high and low temperature aging test chamber of a storage chip and computer equipment. The temperature control abnormal index is obtained through the data of the temperature control system sensor, early warning can be performed when the temperature control system has abnormal fluctuation, the performance evaluation basis of the air circulation system is provided by the air system efficiency coefficient, the heating efficiency and the refrigeration coefficient are obtained through the data of the heating and refrigerating system sensor, and the performance of the heating and refrigerating system is evaluated. An electrical stability index is obtained through data of a test system sensor, the operation stability of an electrical system is evaluated, the stability of the electrical system is detected in time, and a fault probability index is obtained through a system entropy increase rate, the electrical stability index, a thermal coupling factor, a wind system efficiency coefficient and a temperature control abnormal index. Therefore, the stability and the reliability of the equipment can be improved, the maintenance cost can be reduced, the use efficiency of the equipment is improved, and the accuracy and the safety of test results are ensured.

The invention discloses a scene self-adaptive aging test method and system for an extra-high voltage MOS (Metal Oxide Semiconductor), and relates to the related technical field of MOS test, and the method comprises the steps: building a device aging test platform; performing test condition analysis on the application scene information of the target extra-high voltage MOS device; performing pretest adjustment on the target extra-high voltage MOS device, and determining an aging test update parameter table; performing aging test monitoring on the target extra-high voltage MOS device; and calling an extra-high voltage MOS aging adaptive evaluator to process and evaluate the device aging scene test data stream set to obtain a device scene aging performance test result. The technical problems that in the prior art, due to the fact that an MOS aging test lacks scene adaptability, the aging process of the MOS device in the actual application environment is difficult to accurately simulate, the test pertinence is insufficient, and the result accuracy is poor are solved, and the technical effect of improving the MOS device aging test pertinence and the result accuracy is achieved.

The invention provides a high polymer material performance prediction method based on deep learning, and relates to the technical field of material performance prediction.The method comprises the specific steps that variable parameters influencing high polymer material performance are determined, multiple sets of samples are prepared and subjected to a tensile test and an accelerated aging test, and initial and final tensile performance parameters are obtained; and constructing and training an initial performance prediction model and an aging performance prediction model based on a deep learning network model, inputting related parameters into the models to obtain performance parameters, generating an environment severe coefficient through data processing, calculating a performance evaluation index in combination with a tensile performance parameter variation, and comparing the performance evaluation index with a preset threshold value to evaluate the material performance. According to the method, the performance change of the aged material can be accurately predicted, the performance evolution can be reflected, the prediction result is closer to reality, the material performance can be comprehensively evaluated, and an effective reference and a scientific basis are provided for long-term use, selection and application of the material.

The invention provides a plywood weather resistance accelerated aging test device and test method, and belongs to the technical field of aging test equipment. The testing device comprises a supporting table and a testing box fixedly installed at the top of the supporting table, a rotary supporting mechanism is arranged in the testing box and used for positioning the plywood and adjusting the rotation angle of the plywood in the horizontal plane, and two waxing mechanisms are further arranged in the testing box and used for waxing the plywood in the horizontal plane. The two waxing mechanisms are used for conducting edge sealing treatment on the plywood. The testing method comprises the following steps: T2, placing the plywood on a positioning carrier plate on the rotary supporting mechanism to complete positioning; and T3, the plywood is fixed through a pressing mechanism. The plywood weatherability accelerated aging test device provided by the invention has the advantages that the plywood is automatically subjected to edge sealing and waxing, the human input can be reduced, and the reliability and integrity of wax layer coating can be improved.

The invention provides an automatic chip aging test method and system and a medium, and relates to the technical field of semiconductors, and the method comprises the steps: after a type identifier of a to-be-tested chip is identified, calling an aging test parameter group corresponding to the type identifier, and carrying out the aging test of the to-be-tested chip through the aging test parameter group, after the key electrical parameters of the to-be-tested chip in the aging test process are collected, comparison is carried out to obtain a comparison result, when the comparison result exceeds a preset threshold range, abnormal recording operation is automatically carried out, and the current aging test link of the to-be-tested chip is terminated. By automatically recording abnormal information and terminating the aging process, full-automatic closed-loop processing from data acquisition and analysis to decision and control is realized, the test efficiency is improved, test equipment and samples are effectively protected, resource waste and misjudgment risks are reduced, and the problems of low aging trend identification precision and slow response speed are solved.

The invention provides an aging test method and device of equipment, the equipment, a medium and a product, and relates to the technical field of laser test. The method comprises the following steps: acquiring a plurality of operation parameters of target equipment; determining the equipment performance stability of the target equipment based on the plurality of operation parameters; determining an aging test parameter combination for the equipment aging test stage of the target equipment according to the equipment performance stability; performing virtual verification of the aging test parameter combination on the target equipment to obtain an evaluation result; based on the evaluation result, correcting the aging test parameter combination to obtain a target aging test parameter combination; and according to the target aging test parameter combination, performing an equipment aging test on the target equipment. According to the invention, the accuracy of the equipment aging test is improved.

The embodiment of the invention relates to the photovoltaic field, and provides a test method of a photovoltaic module. A grid line material of a to-be-tested photovoltaic module comprises a plurality of metals, and the method comprises the following steps: carrying out a performance test on the to-be-tested photovoltaic module to obtain a first test result; in a test environment in which the temperature range is 73-92 DEG C and the relative humidity range is 70-95% RH, a predetermined current is continuously applied to the photovoltaic module to be tested for 800-2000 hours so as to carry out an aging test on the photovoltaic module to be tested, and the predetermined current is greater than or equal to the maximum power point current of the photovoltaic module to be tested and less than or equal to the short-circuit current of the photovoltaic module to be tested; performing a performance test on the to-be-tested photovoltaic module after the aging test to obtain a second test result; and determining the performance of the grid line material according to the first test result and the second test result. The problem that the reliability of a grid line material cannot be detected in an aging test of an existing photovoltaic module is at least solved.

The invention provides a damp heat-oxygen-internal pressure-load coupled non-metal pipeline aging device and a method capable of evaluating the service life of an in-service non-metal pipeline. The non-metal pipeline aging device comprises six parts, namely an inner cavity, a box body temperature control system, a box body humidity control system, a pipeline internal pressure control system, a pipeline external load loading device and an air supply circulating system, and an accelerated aging test of a non-metal pipeline under different working condition combinations of four factors, namely damp heat, oxygen, internal pressure and load can be carried out by virtue of the aging device. Measuring oxidation induction periods before and after aging of the in-service non-metal pipeline and the non-metal pipeline with the same mark through a differential heat scanning method, substituting the oxidation induction periods into a non-metal pipeline aging life prediction formula coupled with damp heat-oxygen-internal pressure-load factors, and calculating to obtain the service aging life. According to the method, damp heat-oxygen-internal pressure-external load multi-factor coupling is realized, so that an actual service environment is accurately simulated, and comprehensive technical support can be provided for safe operation of the non-metal pipeline.

The invention discloses a rapid aging test method and device for a memory array, and relates to the technical field of memory array test. Comprising the following steps: in a read-write operation process, capturing an instantaneous current waveform of each storage unit in a memory array, extracting current characteristics from the instantaneous current waveform, constructing a difference matrix by utilizing the extracted current characteristics, and dynamically marking the storage units exceeding a threshold value. According to the invention, by analyzing the difference of the stored data volume before and after the instantaneous current waveform capture of the storage unit, the capacity recession condition of the storage unit is evaluated, and the capacity recession data is used as an auxiliary evaluation index and combined with the aging rate of the storage unit. According to the invention, comprehensive evaluation of the aging degree of the memory units is completed without applying external influence conditions to the memory array, so that the accuracy of the aging test is improved, the aging difference between the memory units can be effectively identified, and the key memory units are ensured to be processed and maintained in time.

The invention discloses a multi-dimensional environment coupling aging test box and a self-adaptive control method thereof.The multi-dimensional environment coupling aging test box comprises a box body, a multi-dimensional environment coupling system and a self-adaptive control system.The box body is internally provided with a test cavity, the multi-dimensional environment coupling system is arranged in the test cavity, and the self-adaptive control system is arranged in the test cavity; and the multi-dimensional environment coupling system is connected with the adaptive control system. A multi-physics coupling environment is constructed by integrating four environment simulation modules of temperature and humidity, illumination, vibration and gas. The sensor group acquires environmental parameters (temperature and humidity, irradiance, acceleration and gas concentration) and state data of a test object in real time, and transmits the environmental parameters and the state data to the data processing unit. Based on a multi-physics field coupling model (such as finite element analysis or an empirical formula), the contribution degree of each environmental factor to material aging is calculated, a dynamic control instruction is generated, output parameters of each module are synchronously adjusted through an execution mechanism, and closed-loop control over environmental conditions is achieved.

The invention relates to the technical field of battery detection, and discloses a new energy battery aging test system capable of simulating temperature and humidity, which comprises a vacuum sealing test box chamber, a main control unit, a temperature control system, a humidity control system, a power supply management module, a battery tray and a vibration module, the main control unit, the temperature control system, the humidity control system, the power management module, the battery tray and the vibration module are all arranged in the vacuum sealing test box chamber. According to the new energy battery aging test system capable of simulating temperature and humidity, data comprehensiveness of new energy battery aging test is realized through the temperature control system, the humidity control system and the vibration module, the accuracy and stability of various parameters are ensured, the influence of personal errors is reduced, the comprehensiveness of battery aging test data is improved, and the test efficiency is improved. And a test environment is closer to an actual use scene, so that the performance and the service life of the battery in real use can be evaluated more accurately.

The invention relates to the technical field of wafer test equipment, in particular to a heating aging test tool which comprises a storage rack and further comprises a wafer clamp placed on the storage rack. The detection assembly comprises a plurality of elastic probes located on one side of the storage rack and a heating disc; and the hot air guide assembly comprises a ventilation male head arranged on one side of the heating disc, an air guide pipe is arranged on the side, away from the ventilation male head, of the heat conduction cover, the air amount in the cavity is gradually decreased from near to far away from the air guide pipe, and the air flow speed is gradually decreased. A hot air flow guide assembly is arranged on a conveying frame, heat of a heating disc is guided to the position above a wafer through airflow through a heat conduction cover, the space above the wafer is divided into a plurality of cavities, the space size and the space shape of each cavity are set, the air flow speed and the contained hot air amount of each space are adjusted, and therefore the heat conduction efficiency of the wafer is improved. The influence of heat loss in the air flow process is reduced, so that the heating effects of all parts of the wafer are similar, and the detection effect is improved.

The invention discloses a light aging test instrument, which includes a test cavity, a bottom baseplate, the top cover board which is fixed on the bottom and the top of the test cavity respectively. A lamp socket which fitted with a lamp is right on the centre of the base plate, the photo permeable holes are set at the same height on the side wall of the test cavity. A visual light narrow wave band filter sheet is in the photo permeable hole, and the sample trough is fitted on the photo permeable hole. The test instrument has a compact structure, easy to disassemble and assemble, inflexible for employ, with low cost of the production.

The embodiment of the invention provides a method and device for evaluating the health state of a front-end isolated switching power supply of an aging table, and relates to the technical field of aging tests.The method comprises the steps that in the aging test process, the front-end isolated switching power supply of the aging testbed can generate monitoring signals such as voltage and current; a directly measured monitoring signal is large in data size and contains a large amount of redundant information, firstly, feature extraction is conducted on directly measured data, and a feature sequence with high information density is obtained; further spatial mapping is carried out on the feature sequence by using a neighbor component analysis algorithm, and automatic segmentation of the health state and the degradation state of the new test sample is realized; and performing quantitative calculation of the health state on the mapped feature sequence by using a multi-distance measurement fusion algorithm with automatic weight optimization, and completing health assessment of the front-end isolated switching power supply of the aging test stand.

The invention relates to a multi-dimensional aging test data analysis system and method, and aims to realize real-time acquisition and intelligent analysis of multiple performance indexes in the aging process of electronic products. The system comprises an information acquisition module, a test scheduling module, a data processing module, an analysis module, an abnormity judgment module, a report module and a communication module. Cooperative work among the modules is realized based on task driving and data circulation, accurate association of test data is realized through bar code binding, and unified analysis is performed in combination with multi-source information such as USB read-write performance, network transmission state and display resolution. The system realizes multi-task concurrent acquisition through a resource-aware scheduling strategy, and the analysis module identifies performance abnormity and outputs a structured report by combining preprocessing, feature extraction and time sequence prediction. According to the method, the test automation level and the anomaly recognition accuracy are improved.

To provide an environmental test apparatus capable of performing a long-term deterioration test in which a test sample is exposed for a long period to methane-dissolved water under a low-temperature, high-pressure environment simulating a seafloor environment.SOLUTION: An environmental test apparatus 100 according to an embodiment is an environmental test apparatus for performing a long-term deterioration test in which a test sample is exposed to methane-dissolved water under an environment simulating a seafloor environment where methane hydrate is present and includes: a pressure-resistant vessel 110 which houses the test sample and in which the methane-dissolved water at a temperature and pressure corresponding to the seafloor environment flows through the test sample; a cooling unit 120 that cools and maintains the pressure-resistant vessel 110 at the temperature; and a pressurizing circulation unit 130 that pressurizes the methane-dissolved water flowing out from an outlet 110b of the pressure-resistant vessel 110 and sends it toward an inlet 110a of the pressure-resistant vessel 110.SELECTED DRAWING: Figure 1

The invention discloses a method for evaluating the quality of a photovoltaic module. The evaluation method comprises the following steps: before a sequence aging test, heating a to-be-tested photovoltaic module, and performing a power test on the to-be-tested photovoltaic module to obtain a first power test result; after the sequence aging test, performing EL test and power test on the to-be-tested photovoltaic module under a T98% temperature condition to obtain a first EL test result and a second power test result; the defect percentage is calculated according to a second EL test result and the first EL test result of the photovoltaic module to be tested under the STC, and the second EL test result is obtained before the sequence aging test; calculating the power attenuation of the to-be-tested photovoltaic module under the T98% temperature condition by using the first power test result and the second power test result; and evaluating the quality of the photovoltaic module to be tested by using the defect percentage and the power attenuation. The evaluation method can effectively improve the accuracy and integrity of quality evaluation of the photovoltaic module.

The utility model provides a sealing aging test device for multi-environment simulation. The sealing aging test device comprises an upper end cover, a lower end cover, a gasket, a to-be-tested sealing ring and a sealing ring, the gasket is arranged between each stage of lower end cover and the upper end cover, the to-be-tested sealing ring is arranged between each stage of lower end cover and the gasket, and the sealing rings are arranged between the gasket and each stage of upper end cover and between the middle upper end cover and the middle lower end cover; the end covers are connected through bolts, and the gaskets are in interference fit connection or threaded connection with the upper end covers; the end cover center hole channel forms a first flow channel, the outer side hole channel forms a second flow channel, and flow channel isolation is achieved through a sealing ring. The aging conditions of the sealing ring under different compression amounts can be tested by adjusting the thickness of the gasket, the influence of different unbalance loading forces on the aging performance of the sealing ring can be tested by adjusting the gradient of the first end face of the gasket, and the aging conditions of the sealing ring under different working conditions can be simulated by inputting media into the two flow channels. Multiple groups of upper and lower end covers can be continuously added in the device.

The invention discloses an aging performance test system for a cable, and relates to the technical field of cable reliability test. The device is applied to a multi-physics field coupling aging cabin to simulate a synergistic aging environment of various stresses such as electricity, heat, machinery and chemistry. The system integrates a high-precision sensing unit, an edge intelligent analysis unit, a man-machine interaction unit and a control feedback unit, and supports multi-dimensional modeling of cable structures, materials and process parameters. Multiple groups of aging test schemes are generated and recommended based on a conditional generative adversarial network and an unsupervised clustering algorithm, multi-source data are collected in real time in the test process, and aging trends are analyzed by using deep learning models such as CNN and LSTM. Carrying out risk grade judgment in combination with a historical model, introducing an anomaly detection mechanism, and realizing atypical aging sample identification based on Mahalanobis distance and local density scoring; intelligent simulation, accurate diagnosis and abnormal feedback of cable aging behaviors are realized, and the authenticity, accuracy and intelligent level of testing are remarkably improved.

The invention discloses a high-temperature aging test equipment secondary power supply time-frequency characteristic deep fusion method. The method comprises the following steps: acquiring a fault data set of a high-temperature aging test equipment device; preprocessing the fault data set to obtain a training data set and a test data set; performing short-time Fourier transform on each key parameter time sequence data in the training data set to obtain a time-frequency graph; performing random masking on each time-frequency graph and inputting the time-frequency graphs into a preset model for training to generate a feature extraction model; testing the feature extraction model according to the test data set; and after the test is passed, inputting key parameter time sequence data of a to-be-predicted device into the feature extraction model, and predicting to obtain a target time-frequency domain feature. According to the method provided by the invention, the characteristics of the secondary switching power supply can be accurately extracted, so that the health state of the secondary switching power supply of the high-temperature aging test equipment can be evaluated.

The invention discloses a sealing structure for a test, and an aging test and leakage rate detection method and system. The sealing structure comprises a tested sealing assembly and an air cavity assembly integrated in the tested sealing assembly, and serialized test samples with different filling rates and compression rates are formed by regulating and controlling the groove width and the groove depth of a sealing ring mounting groove so as to simulate various actual sealing states. An aging test adopts a multi-factor coupling accelerated aging method, and a plurality of material characterization means are combined to systematically evaluate the evolution rule of the sealing performance. According to leakage rate detection, static pressure maintaining and dynamic pressure adjusting dual-mode measurement is achieved through an air tightness detector, and the sealing characteristics under different pressure conditions are comprehensively reflected. According to the invention, direct and systematic detection of the leakage rate of the sealing structure is realized, and an innovative solution is provided for sealing performance evaluation and service life prediction of electrical equipment.

The application relates to the technical field of material testing, and relates to a high polymer material testing method and system based on image analysis, which comprises the following steps: collecting images of high polymer materials to obtain high polymer material images, performing pretreatment operations to obtain pretreated material images, identifying a defect region set in the pretreated material images, performing feature extraction on the defect regions to obtain defect region parameters, comparing the defect region parameters with defect thresholds to obtain defect deviation values, judging the defect conditions of the defect regions, confirming the high polymer materials as preliminary qualified materials if all the defect conditions are acceptable defects, performing accelerated aging tests to obtain aging test materials, performing image detection on the aging test materials to obtain detected defect regions, comparing the defect regions with the detected defect regions to obtain defect region expansion values, and obtaining material detection results. The application can solve the problem of low testing result accuracy in the current high polymer material testing process.

The invention discloses an accelerated aging test system for an intelligent electric meter in a composite environment, which relates to the field of aging test and comprises a data acquisition module, a power evaluation module, a battery evaluation module, a communication evaluation module, a fusion module and an environment-scheme matching module. The data acquisition module is used for generating a test data set, performing accelerated aging on the intelligent electric meter and acquiring aging data at the same time; the power evaluation module, the battery evaluation module and the general storage evaluation module respectively analyze the related data to obtain a power index, an electric quantity index and a general storage index; the fusion module obtains a test aging index; the environment-scheme matching module collects environment data of the target intelligent electric meter, and the environment data is matched with the test data set after being processed and converted to obtain an actual aging index of the target intelligent electric meter; compared with a traditional single stress test method, the scheme comprehensively considers multiple factors, and improves the accuracy of judging the aging degree of the intelligent electric meter.

The invention provides a thermal runaway early warning model generation method and device, equipment and a medium, and is applied to a vehicle battery, the method comprises the following steps: carrying out a cyclic aging test on the vehicle battery until the vehicle battery generates a thermal runaway reaction, and obtaining strain related data corresponding to the cyclic aging test; respectively carrying out impact test on the plurality of vehicle batteries in different health states until thermal runaway reaction of the vehicle batteries occurs, and obtaining gas component data corresponding to the health states; model training is carried out according to the strain related data and the gas component data, a thermal runaway early warning model is obtained, the thermal runaway early warning model is used for carrying out thermal runaway early warning in the charging and discharging process of the vehicle battery, and the thermal runaway precursor of the battery is more comprehensively captured according to the strain data and the gas data of the battery; the early warning of the thermal runaway reaction of the battery is realized, and the accuracy of thermal runaway early warning is improved.

The embodiment of the invention discloses a battery aging detection method, electronic equipment and a storage medium. The method comprises the following steps: performing calendar aging test on a target battery; under different multiplying power, carrying out cyclic aging test on the target battery; on the basis of the calendar aging test result, calendar aging attenuation generated in the cyclic aging test result is filtered out, and a cyclic attenuation curve corresponding to the target battery is obtained; and detecting the cyclic aging attenuation of the target battery through the cyclic attenuation curve. According to the scheme, the accuracy of a battery aging detection result can be improved.

The invention provides a method and device for evaluating weather resistance of a high polymer material, and relates to the technical field of aging tests of materials, and the method comprises the following specific steps: selecting a high polymer material sample to carry out an accelerated aging test, and obtaining accelerated aging conditions, mechanical property changes and appearance changes of different time periods according to a plurality of time periods; according to the method, the accelerated aging conditions in all time periods are averaged, correlation analysis is carried out, a plurality of environment severe coefficients are generated, the mechanical property changes in the adjacent time periods and the corresponding environment severe coefficients are calculated, different weather resistance coefficients are obtained, and the weather resistance of the material is comprehensively evaluated by comparing the different weather resistance coefficients with a preset threshold value. According to the method, the performance change of the material in the aging process is reflected from multiple aspects, so that the weather resistance evaluation is more comprehensive and truly matched with the performance of the material in actual use, the influence of each factor on the weather resistance of the high polymer material can be more accurately evaluated, and a more accurate basis is provided for the weather resistance evaluation.