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224 results about "Acceleration factor" patented technology
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An Acceleration Factor is the constant multiplier between the two stress levels. When there is true acceleration, changing stress is equivalent to transforming the time scale used to record when failures occur.
Led-based illumination module on-board diagnostics
ActiveUS20110254554A1Light source combinationsElectrical apparatusLight-emitting diodeOperant conditioning
A light emitting diode (LED) based illumination module performs on-board diagnostics. For example, diagnostics may include estimating elapsed lifetime, degradation of phosphor, thermal failure, failure of LEDs, or LED current adjustment based on measured flux or temperature. The elapsed lifetime may be estimated by scaling accumulated elapsed time of operation by an acceleration factor derived from actual operating conditions, such as temperature, current and relative humidity. The degradation of phosphor may be estimated based on a measured response of the phosphor to pulsed light from the LEDs. A thermal failure may be diagnosed using a transient response of the module from a start up condition. The failure of LEDs may be diagnosed based on measured forward voltage. The current for LEDs may adjusted using measured flux values and current values and a desired ratio of flux values. Additionally, the LED current may be scaled based on a measured temperature.
Owner:SBC XICATO CORP
Battery monitoring system and method
ActiveUS7061246B2Circuit monitoring/indicationDifferent batteries chargingAcceleration factorElectrical battery
A method for predicting the remaining life of a battery for a vehicle includes obtaining a value representative of the amount of remaining life for a battery in a new and fully charged state and monitoring at least one parameter of the battery during use of the battery. The method also includes obtaining an acceleration factor based on the at least one monitored parameter and estimating the amount of life lost from the battery utilizing the acceleration factor.
Owner:CPS TECH HLDG LLC
Memory with high dielectric constant antifuses and method for using at low voltage
InactiveUS20070069241A1Reliable readWrite reliablySemiconductor/solid-state device detailsSolid-state devicesLow voltageAlloy
A memory array having memory cells comprising a diode and an antifuse can be made smaller and programmed at lower voltage by using antifuse materials having higher dielectric constant and higher acceleration factor than silicon dioxide, and by using diodes having lower band gaps than silicon. Such memory arrays can be made to have long operating lifetimes by using the high acceleration factor and lower band gap materials. Antifuse materials having dielectric constants between 5 and 27, for example hafnium silicon oxynitride or hafnium silicon oxide are particularly effective. Diode materials with band gaps lower than silicon, such as germanium or a silicon-germanium alloy are particularly effective.
Owner:SANDISK TECH LLC
Complete machine level product storage life acceleration test method
ActiveCN108333208AAccelerated storage life test is effectiveAccelerated test is validMaterial thermal analysisAcceleration factorSection analysis
The invention discloses a complete machine level product storage life acceleration test method. The method comprises steps as follows: sensitive environment factors related to the storage life are acquired according to cross-section analysis; the environment loading spectrum is analyzed and acquired with a corresponding data processing method and spectrum compiling theories; storage failure information related to a complete machine product storage failure mode and a failure mechanism is acquired, and storage life weak components of a complete machine product are determined according to the storage failure information; acceleration tests are performed on different weak parts, corresponding life distribution models, acceleration models and related parameters of the weak components are determined; a complete machine storage life model based on competing failure and an acceleration factor evaluation model of the complete machine storage life model are constructed according to analysis andcorresponding test results of the weak components; complete machine storage life acceleration verification tests are performed according to acceleration factors. By means of the complete machine levelproduct storage life acceleration test method, effective acceleration storage tests can be performed on the complete machine product, and the accurate life analysis result of the complete machine product is obtained.
Owner:CASIC DEFENSE TECH RES & TEST CENT
Reliability acceleration test method of electronic products
ActiveCN105572498ASolve engineering problems that are difficult to test and identify indicatorsSynthetic Stress Conditions for Growth TestsEnvironmental/reliability testsTemperature stressAcceleration factor
The invention discloses a reliability acceleration test method of electronic products, and belongs to the field of reliability designing and testing. The method comprises steps of firstly presetting an acceleration test temperature change curve boundary according to working stress limit obtained via a routine test for reliability of an electronic product, carrying out simulating calculation of temperature acceleration factors, and modifying and determining initial acceleration test temperature stress change curves; and secondly, calculating vibration acceleration factors according to the initial acceleration test temperature stress change curves and a test profile of the routine test for the reliability of the original electronic product, calculating acceleration test vibration stress change curves according to the vibration acceleration factors, and according to the acceleration test vibration stress change curves, determining the final temperature stress change curves and determining acceleration test time. According to the invention, by following the thought of testing and examining working stress of a product and properly increasing test stress level, test time is shortened; a reliability test of the electronic product can be accelerated; and diversity and controllability of the acceleration factors are achieved.
Owner:XIAN AIRCRAFT DESIGN INST OF AVIATION IND OF CHINA
Touch sensitive device adaptive scaling
InactiveUS20130002600A1Longer be performedNo longer performedInput/output processes for data processingAcceleration factorTouchpad
A method for performing adaptive scaling in a touch sensitive device including a touch pad is provided. The method includes obtaining a trajectory of touch positions from the touch pad; setting a first scaling factor; comparing an acceleration factor to a deceleration factor, and: setting a second scaling factor to the acceleration factor if the first scaling factor is lower than the acceleration factor when the acceleration factor is greater than the deceleration factor; setting the second scaling factor to the deceleration factor if the first scaling factor is greater than the deceleration factor when the acceleration factor is lower than or equal to the deceleration factor; and updating the trajectory with a new touch position provided by the touch pad and a scaling factor set to the second scaling factor. A touch sensitive device coupled to a display for use with the above method is also provided.
Owner:INTEGRATED DEVICE TECH INC
Motorized spindle accelerated life testing time design method
InactiveCN106874582AImprove accuracyGeometric CADSpecial data processing applicationsNumerical controlRelational model
The invention belongs to the technical field of numerical control machine tool and relates to a motorized spindle accelerated life testing time design method. The method includes the steps that firstly, product load data and fault information are collected; secondly, a load distribution model is established; thirdly, a program load spectrum is designed; fourthly, a product service life estimated formula is determined on the basis of the Miner fatigue accumulation damage theory, and an accelerated life testing accelerating factor model is built on the basis of the formula; fifthly, based on the fault information, a first fault time reliability mode is built through model hypothesis, parameter estimation and hypothesis testing; sixthly, testing time design is conducted on the basis of the first fault time, the first fault time corresponding to an acceptable reliability degree serves as a standard, and a relational model of motorized spindle testing time and the sample capacity is established; seventhly, an accelerating factor is considered for testing time design, and the creditability of the testing time design is verified. The relational model of the testing time and the sample capacity is considered, the accelerating factor model is established on the basis of the modification Miner theory, the modeling accuracy is improved, and the method better conforms to actual conditions.
Owner:JILIN UNIV
System and method of magnetic resonance imaging for producing successive magnetic resonance images
InactiveUS7330027B2Speed up SSFP dynamic imagingReduce dataMagnetic measurementsElectric/magnetic detectionTemporal resolutionData acquisition
This invention describes the combination of SSFP, a method for accelerating data acquisition, and an eddy current compensation method. This synergistic combination allows acquisition of images with high signal-to-noise ratio, high image contrast, high spatial and temporal resolutions, and good immunity against system instabilities. k-t BLAST and k-t SENSE are the preferred method for accelerating data acquisition, since they allow high acceleration factors, but other methods such as parallel imaging and reduced field-of-view imaging are also applicable. Typical applications of this invention include cine 3D cardiac imaging, and 2D real-time cardiac imaging.
Owner:UNIV ZURICH +1
Steer-by-wire double-motor system based on driver behavior identification and yaw stability compensation strategy thereof
PendingCN109664938AIncrease corner input speedReduce latencySteering linkagesAutomatic steering controlDriver/operatorLoop control
The invention discloses a steer-by-wire double-motor system based on driver behavior identification and a yaw stability compensation strategy thereof. The system comprises an acquisition unit, a central controller, a steering wheel assembly and a front wheel steering assembly; the compensation strategy of the steer-by-wire double-motor system is that: a predicted steering-wheel steering angle is obtained by driver behavior identification and a steering-wheel steering angle measured by a steering-wheel steering angle sensor, and is transferred to the central controller, a yaw angular speed gainand a lateral acceleration factor are integrated to obtain an ideal transmission ratio, and a relationship between the steering-wheel steering angle and an ideal input steering angle of a steering-angle motor is obtained and transferred to a steering angle motor controller so as to carry out open-loop control on the steering angle motor; then an ideal front wheel steering angle is obtained according to the steering-wheel steering angle and the ideal transmission ratio, an ideal yaw angular speed is obtained, a compensation torque of the system is obtained by a robust controller, and the compensation torque is transferred to a torque motor controller by a compensation control strategy so as to ensure rapid response performance of the system and driving stability in the driving process.
Owner:NANJING UNIV OF AERONAUTICS & ASTRONAUTICS
Electronic complete machine storage life assessment and prediction method
ActiveCN108446523APromote engineering applicationSimple calculationGeometric CADSpecial data processing applicationsAcceleration factorPrediction algorithms
The invention relates to an electronic complete machine storage life assessment and prediction method. On the basis of analyzing a typical complete machine failure mechanism, an Arrhenius model-basedcomplete machine level acceleration factor calculation method is proposed; the method can perform electronic complete machine acceleration factor calculation by only three parameters; an accelerationtest is performed according to a calculation result and data is obtained; by utilizing an optimized GM(1,1) grey model-based prediction algorithm, a degradation law of natural storage and accelerationtest data is researched; the consistency of degradation trends of two groups of data is analyzed; closed-loop correction of acceleration factor calculation model parameters is realized by utilizing aconsistency analysis result; and finally electronic complete machine storage life prediction is realized by utilizing a corrected model. The method is simple and easy to understand and relatively high in prediction precision, and is suitable for engineering popularization.
Owner:BEIJING AEROSPACE AUTOMATIC CONTROL RES INST +1
Dual ramp rate dielectric breakdown testing methodology
ActiveUS6967499B1Testing dielectric strengthSemiconductor/solid-state device testing/measurementElectricityAcceleration factor
The present invention provides, in one aspect, a method of testing an electrical breakdown characteristic of a dielectric in a microelectronic device. This method includes determining a first dielectric breakdown voltage distribution of a first test sample by using a first voltage ramp rate, determining a second dielectric breakdown voltage distribution of a second test sample by using a second voltage ramp rate and determining a spacing distribution between conductive lines in the first and second test samples based on a field acceleration factor associated with the dielectrics of the first and second test samples, the first and second voltage ramp rates, and a difference between the first and second breakdown voltage distributions. This spacing distribution is used to determine corrected electric breakdown fields based on a measured breakdown voltage of a test sample, to improve microelectronic-device screening for interconnect dielectric reliability.
Owner:TEXAS INSTR INC
Multi-element acceleration factor calculation method of electronic equipment
ActiveCN108399278AAccelerated test is accurateAccelerated test is reliableDesign optimisation/simulationSpecial data processing applicationsStress failureFault model
The invention discloses a multi-element acceleration factor calculation method of electronic equipment. The method includes: respectively constructing single-point stress damage models for different elements influencing life of the electronic equipment, and calculating and obtaining corresponding acceleration factors; constructing a competition failure-based failure model of the entire electronicequipment on the basis of the characteristics of the electronic equipment and the single-point stress damage models; and calculating and obtaining acceleration factors of the electronic equipment on the basis of the constructed fault model of competition failure according to a statistical equivalence principle. According to the method, for the current electronic equipment of which an equipment structure and failure modes are complicated, failure mechanisms and failure forms under various stress conditions of temperature, humidity, vibration, electrical stress, combinations thereof and the likeare analyzed, a corresponding stress failure model is constructed, and thus the acceleration factors of the electronic equipment can be obtained according to the different elements, the fault model and a corresponding system life model. The method is completely suitable for accelerated testing of the entire-machine equipment, and then enables accelerated testing of the electronic equipment to bemore accurate and reliable.
Owner:CASIC DEFENSE TECH RES & TEST CENT
Time terminated acceleration acceptance sampling test optimum design method based on Bayesian theory
ActiveCN103646138AGuaranteed test accuracyReduce test costsSpecial data processing applicationsAcceleration factorHypothesis
The invention discloses a time terminated acceleration acceptance sampling test optimum design method based on the Bayesian theory. The method comprises the following steps: step one, life distribution and verification index parameters of products are determined, and then a statistical hypothesis is established; step two, test decision-making rules are designed for a selected product, and testing and receiving processes of the product are determined; step three, constraint conditions which meet the requirements of two-party risks for the verification index parameters are deduced according to posterior risk criteria; step four, prior distribution of the verification index parameters is given based on historical data, and a scheme set meeting the conditions is calculated through WinBUGS14 on the basis of an MCMC method; step five, a test cost constraint is determined, and an optimal scheme is obtained through calculation. According to the time terminated acceleration acceptance sampling test optimum design method based on the Bayesian theory, the Bayesian theory is introduced into the optimum design of an acceleration acceptance sampling test for the first time, the posterior risk criteria are applied to the solving process of the test scheme, the influence of accelerated factor uncertainty in the test is taken into consideration for the first time, and the influence is expressed in a quantized mode.
Owner:BEIHANG UNIV
Accelerated life test load spectrum determining method with multiple mechanisms taken into consideration
ActiveCN104156599AImprove engineering applicabilityGuaranteed accuracySpecial data processing applicationsAcceleration factorStress level
The invention discloses an accelerated life test load spectrum determining method with multiple mechanisms taken into consideration. The accelerated life test load spectrum determining method specifically comprises the following steps of analyzing the main mechanism, calculating an acceleration factor, initially determining the accelerated stress level and the acceleration factor, initially determining the test time based on the mechanisms such as the fatigue mechanism and the abrasion mechanism, finally determining the test time with aging and corroding mechanisms taken into consideration, and finally determining an accelerated life test load spectrum. The accelerated life test load spectrum determining method can be directly applied to products and can be used for determining parameters of the accelerated life test load spectrum based on mechanism calculation, and the engineering applicability is high. According to the accelerated life test load spectrum determining method, multi-mechanism test time collaborative analysis is carried out according to the fatigue and abrasion mechanisms and aging and colliding mechanisms, and the accuracy of the accelerated life test time is guaranteed.
Owner:BEIHANG UNIV
Test run method for accelerated life test of gas turbine engine
ActiveCN103970965AShorten life test cycleReduce test costsSpecial data processing applicationsAcceleration factorSupport vector machine
The invention discloses a test run method for an accelerated life test of a gas turbine engine. The test run method comprises the steps that an accelerated factor analysis model of the gas turbine engine under simulated running conditions is established; according to the accelerated factor analysis model, a support vector machine method is used for establishing a surrogate model of three-dimensional finite element stress analysis; the surrogate model is used for obtaining dangerous point stress of the accelerated factor analysis model, and then life indexes of the accelerated factor analysis model are obtained; a Monte Carlo method is used for conducting stochastic simulation on random variables of the life indexes; an optimal design mathematical model of an accelerated life test scheme of stress under the simulated running conditions of the gas turbine engine is established and analyzed, and the test scheme is optimized according to the optimal design mathematical model; a mixing optimization method is adopted to optimize the mathematical model, and the optimized accelerated life test scheme is obtained according to the optimized mathematical model. By means of the test run method, the test period is shortened, and life test expenditure is reduced.
Owner:CHINA AVIATION POWER MACHINE INST
Method for verifying product reliability through temperature-stress-increased accelerated lift test
InactiveCN104459408ARealize reliability verificationReduce spendingElectrical testingTemperature stressSingle sample
The invention provides a method for verifying the product reliability through a temperature-stress-increased accelerated lift test. The method includes the steps that the initial temperature in a temperature-stress-increased test is firstly determined, then temperature accelerated factors and single-sample testing time of the temperature-stress-increased test are determined, the number of efficacy losing samples is further calculated, a temperature-stress-increased reliability verification test is finally carried out, the number of faults of the samples is counted, the number of the faults is compared with the number of the efficacy losing samples, and the test can be completed. By means of the method, under the condition that a fault mode and a fault mechanism are not changed, the testing time can be shortened, the test expenditure and the manpower expenditure can be saved, and the practical level of the mean time between faults of products can be accurately verified.
Owner:NO 20 RES INST OF CHINA ELECTRONICS TECH GRP
A micro-grid grid-connected optimal scheduling method based on improved subgradient particle swarms
InactiveCN106451550ANot easy to fall intoGuaranteed uptimeEnergy industrySingle network parallel feeding arrangementsPower BalancePower limits
A micro-grid grid-connected optimal scheduling method based on improved subgradient particle swarms comprises the steps of establishing a micro-grid grid-connected model including an energy storage device; according to the actual situation, establishing an optimal scheduling objective function at the smallest total micro-gird power generation costs and environmental pollution control costs; establishing operating constraints in a micro-grid system, and separately establishing system power balance constraints, storage battery charge and discharge power constraints, micro-power output power limits and electricity purchasing and selling constraints for interaction between the micro-grid and large grids; improving the standard particle swarm optimization; separately improving the inertia weight and acceleration factors; and proposing to use the sub-gradient optimization method to update the velocity of the particles in the particle swarm optimization. According to the micro-grid grid-connected optimal scheduling method based on the improved subgradient particle swarms, while the micro-grid grid-connected optimization involving the energy-storage device is solved, advantages such as a good optimization searching effect and a fast convergence speed are realized.
Owner:武汉弘文通信工程有限公司
Accelerated degradation data validity testing and model selection method
ActiveCN105468907AImprove stabilityEasy to operateInformaticsSpecial data processing applicationsAcceleration factorHypothesis
The invention discloses an accelerated degradation data validity testing and model selection method. The method comprises the five steps of 1, selecting a common degradation path model and performing standardization; 2, establishing an acceleration mechanism equality condition based on an acceleration factor invariance principle; 3, estimating model parameter values in different stress levels and performing hypothesis testing by applying Bartlett statistics; 4, calculating an acceleration factor variation coefficient and selecting a degradation path model; and 5, extrapolating the product life in a normal stress level based on regression analysis. According to the method, the acceleration mechanism equality condition is established for the degradation path model, so that the stability of an acceleration factor is improved; a testing process and a parameter estimation algorithm are very simple; and the method is high in operability and has an important significance for data validity testing.
Owner:BEIHANG UNIV
LED service life prediction method under actual operation environment
InactiveCN106405442AExtend your lifeImprove reliabilityLamps testingSystems designConfidence interval
The invention discloses an LED service life prediction method under an actual operation environment and belongs to the LED product test technology field. The method is characterized by through acceleration test report data, establishing a single LED service life model and a batch of LED service life models possessing a same acceleration factor; and through constructing an internal junction temperature feedback system graph of a key factor p-n junction influencing an LED service life, acquiring a real-time junction temperature during LED work. According to the real-time junction temperature during LED working and the batch of LED service life models, the LED service life is predicted. The method is suitable for various kinds of LED work current and extraneous environment temperature change occasions. A method of actually predicting a certain proportion of LED-failure required time under various confidence or confidence intervals is provided. The method is good for guiding LED heat dissipation and a system design, a service life and reliability of an LED illumination product are increased, and the method can be popularized in an LED driver and service life prediction of a whole LED illumination system.
Owner:SOUTHEAST UNIV
Method for predicting aging failure rule and service life of polymer material under multiple environmental factors
ActiveCN104181279AAchieve forecastShort test cycleMaterial analysisAcceleration factorPredictive methods
The invention relates to a method for predicting the aging failure rule and the service life of a polymer material under multiple environmental factors, belonging to the field of high polymer materials. According to the method, a lifetime characteristic index-aging time curve of the polymer material under an acceleration condition is obtained based on an accelerated aging test under the multiple environmental factors, corresponding aging failure acceleration factors are calculated by virtue of an Arrhenius formula, a reciprocity method and a superposition rule, an aging failure curve in a normal service environment (with multiple aging factors) is extrapolated from the failure curve under the acceleration condition by virtue of the aging failure acceleration factors, and the aging failure rule of the polymer material is predicted. The method has the beneficial effects of short test cycle, good repeatability, simplicity in theoretical derivation and high prediction reliability.
Owner:SICHUAN UNIV
Viral Particle-Like Construct and Method of Forming the Same Under Physiological Conditions
There is provided a novel method of forming uniform viral particles under physiological conditions. The method of forming uniform-sized viral particle aggregates composed of viral protein is characterized by incubating a viral protein such as SV40 virus VP1 at pH 5.0 to 7.0, room temperature, in the presence of 130 mM to 170 mM sodium chloride and 1.5 mM to 2.5 mM divalent cation, and in the presence of a particle formation acceleration factor such as SV40 VP2. For encapsulation of a substance to be encapsulated in the viral particles, the substance to be encapsulated is included during the incubation.
Owner:TOKYO INST OF TECH
Actuator product acceleration factor determining method based on theoretical lifetime calculation
ActiveCN104156600AClear thinkingEasy to operateSpecial data processing applicationsAcceleration factorStress level
The invention discloses an actuator product acceleration factor determining method based on theoretical lifetime calculation. The method comprises the specific steps that (1) conducting main mechanism analysis, wherein actuator product weak links and main mechanisms corresponding to the actuator product weak links are determined; (2) selecting lifetime calculation models, wherein the corresponding lifetime calculation models are selected according to the types of the main mechanisms; (3) comprehensively determining acceleration factors, wherein the acceleration factors, corresponding to the product weak links, of the main mechanisms under different stress levels are calculated according to the determined stress types and ranges, the acceleration stress level is determined according to the acceleration factor standard deviation minimum principle, and the acceleration factors are determined according to the acceleration factor minimum principle. The actuator product acceleration factor determining method can be directly applied to products, the acceleration factors of the products are determined through the acceleration factors of the product weak links obtained through main mechanism analysis calculation, theoretical supports are provided for a product layer acceleration lifetime test method, and the actuator product acceleration factor determining method has the advantages of being clear in thought, high in operability and the like.
Owner:BEIHANG UNIV
LED-based illumination module on-board diagnostics
ActiveUS8519714B2Light source combinationsElectrical apparatusLight-emitting diodeOperant conditioning
A light emitting diode (LED) based illumination module performs on-board diagnostics. For example, diagnostics may include estimating elapsed lifetime, degradation of phosphor, thermal failure, failure of LEDs, or LED current adjustment based on measured flux or temperature. The elapsed lifetime may be estimated by scaling accumulated elapsed time of operation by an acceleration factor derived from actual operating conditions, such as temperature, current and relative humidity. The degradation of phosphor may be estimated based on a measured response of the phosphor to pulsed light from the LEDs. A thermal failure may be diagnosed using a transient response of the module from a start up condition. The failure of LEDs may be diagnosed based on measured forward voltage. The current for LEDs may adjusted using measured flux values and current values and a desired ratio of flux values. Additionally, the LED current may be scaled based on a measured temperature.
Owner:SBC XICATO CORP
Rapid data de-duplication method adapted to big data application
ActiveCN103324699AEliminate redundant dataLower backup windowRedundant operation error correctionSpecial data processing applicationsAcceleration factorVariable length
The invention provides a rapid data de-duplication method adapted to a big data application. The rapid data de-duplication method is applied to backup de-duplication systems under the big data application and solves the problems that the existing variable-length partition algorithm based on content identification is low in de-duplication rate and fails to identify redundant data rapidly. According to the rapid data de-duplication method, through adjusting de-duplication factors and acceleration factors in a partition process, the de-duplication rate is substantially improved on the premise that the de-duplication ratio is ensured, de-duplication detection can be performed rapidly, the contradiction between the de-duplication ratio and the de-duplication rate is balanced, backup windows are reduced, and network bandwidth and memory spaces are saved.
Owner:和宇健康科技股份有限公司
Cursor motion control of a pointing device
ActiveUS20060132435A1Smooth movementCathode-ray tube indicatorsInput/output processes for data processingAcceleration factorDisplay device
A pointing device generates pixel counts at a predetermined frame rate indicative of motion in predetermined axes of a user's digit across an imaging surface. A cursor motion controller receives the pixel counts and generates navigation output signals representing averages over predetermined time intervals selected to smooth the motion of a cursor on the display of an electronic apparatus. Optionally, the cursor motion controller can multiply a pixel count in each frame by a predetermined acceleration factor so that a cursor on the display of an electronic apparatus will move a greater distance based on an increased rate of motion of the user's digit across the imaging surface. Optionally, the cursor motion controller can interrupt the generation of navigation output signals for a predetermined interrupt period after completion of a cursor stroke. The averaging, acceleration and interruption features can be used independently or in various combinations.
Owner:PIXART IMAGING INC
Method for predicting near-ground wind field point domain mapping space along railway
ActiveCN103996085AImprove securityGuarantee the safety of lifeForecastingSpecial data processing applicationsAcceleration factorPredictive methods
A method for predicting a near-ground wind field point domain mapping space along a railway comprises the following steps that S1 a three-dimensional model of a near-ground wind field is set up; S2 an installation position of a wind meter is determined, and under the restraint of the installation position of the wind meter, an arranging scheme of wind measuring points is determined with the least favorable wind acceleration factor and the largest turbulence intensity as targets; S3 a high wind speed numerical simulation model is set up, and a mapping relational expression of the wind speed at the wind measuring points and the wind speed of any one point in the three-dimensional model of the near-ground wind field is provided; S4 according to a predicted wind speed sequence and a mixed algorithm based on empirical mode decomposition and the self-adaptive neural-fuzzy reasoning, prediction of the wind speed along the railway to be predicted is achieved. The method for predicting the near-ground wind field point domain mapping space along the railway can monitor the wind speed of a point along the railway to predict continuous wind speed distribution of a domain, overcome the defect that a train is guided to run only according to real-time wind speeds before and behind the train in the prior art, and improve running safety coefficient of the train in a high wind environment.
Owner:CENT SOUTH UNIV
Method for determining acceleration factors in EM testing structure
ActiveCN101923124ASave experimental resourcesElectronic circuit testingResistance/reactance/impedenceFurnace temperatureElectrical resistance and conductance
The invention discloses a method for determining acceleration factors in an EM test structure. The method comprises the following steps: measuring the resistance temperature coefficient of the EM test structure by adopting current which cannot cause Joule heat on the EM structure in a furnace temperature rising process; 2, accelerating current in the condition of at least three groups of current after the furnace is heated to a preset temperature, wherein at least two groups ensure that the EM test structure generates different Joule heats, and measuring the resistance value of the EM test structure under the condition of different currents; 3, calculating the actual temperature of the EM test structure under the condition of different currents according to the resistance temperature coefficient an the resistance value; 4, performing EM experiment, and acquiring the center life of each group under the experimental condition after the experiment is completed; and 5, calculating the acceleration factors according to a black equation by using the actual temperature value and the current condition of the EM test structure and the center life. The method can reduce the cost for measuring two acceleration factors Ea and N of the EM test structure, and improves the production efficiency.
Owner:SHANGHAI HUAHONG GRACE SEMICON MFG CORP
Method for predicting failure rate of vehicle-mounted information terminal in entire life cycle
InactiveCN103310051AShort detection cycleShorten the timeSpecial data processing applicationsFailure rateAcceleration factor
Owner:TIANZE INFORMATION IND
Non-parallel storage life test evaluation method based on accelerating factor feasible region selection
ActiveCN104680005AGuaranteed accuracyIteration is simpleSpecial data processing applicationsAcceleration factorAlgorithm
The invention discloses a non-parallel storage life test evaluation method based on accelerating factor feasible region selection. The method comprises the following steps: I, calculating an accelerating factor and comprehensive failure time; II, discussing an accelerating factor feasible region; III, performing parameter selection by using an optimal linear unbiased estimation method; IV, calculating the point estimation and interval estimation of logarithm reliable life. Specific to the phenomenon of missing of storage data in non-parallel storage product life estimation, storage data and test data are integrated, and calculation is performed by making full use of data on the basis that the service life follows Weibull distribution, so that the accuracy of life model parameter estimation is ensured, an algorithm has low requirement on the initial value of a parameter, the algorithm iteration is rapid and simple, and the operability is high.
Owner:BEIHANG UNIV
Assessment method of storage lives of lead bonding air-impermeability encapsulation analogue integrated circuits
ActiveCN103197226AAccurate evaluationEliminate huge errorsElectronic circuit testingLead bondingEngineering
The invention provides an assessment method of storage lives of lead bonding air-impermeability encapsulation analogue integrated circuits. The method comprises the following steps: selecting and screening qualified samples, and separating the samples into a plurality of groups at random; measuring and calculating relative humidity inside one group of samples and an average value of bonding strength of bonding wires; conducting accelerated life tests by using steady temperature accelerated stress, temperature cycling accelerated stress and steady damp and heat accelerated stress, and enabling the samples under steady damp heat tests to be uncovered first; detecting sensitivity parameters of the samples at certain intervals; confirming the sensitivity parameters and life distribution types of the samples, and conducting matching to obtain distribution parameters; calculating average lives of the samples; calculating model parameters and accelerated factors of accelerated models according to the average lives of the samples under different stress conditions; and deducing the lives of the samples under actual storage conditions. According to the method, test stress is selected reasonably, monitored parameters are comprehensive, and the sensitivity parameters can be accurately distinguished. The method is mainly applied to the field of reliability assessment of semiconductor analogue integrated circuits.
Owner:NO 24 RES INST OF CETC
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