224 results about "Acceleration factor" patented technology

A light emitting diode (LED) based illumination module performs on-board diagnostics. For example, diagnostics may include estimating elapsed lifetime, degradation of phosphor, thermal failure, failure of LEDs, or LED current adjustment based on measured flux or temperature. The elapsed lifetime may be estimated by scaling accumulated elapsed time of operation by an acceleration factor derived from actual operating conditions, such as temperature, current and relative humidity. The degradation of phosphor may be estimated based on a measured response of the phosphor to pulsed light from the LEDs. A thermal failure may be diagnosed using a transient response of the module from a start up condition. The failure of LEDs may be diagnosed based on measured forward voltage. The current for LEDs may adjusted using measured flux values and current values and a desired ratio of flux values. Additionally, the LED current may be scaled based on a measured temperature.

The invention discloses a reliability acceleration test method of electronic products, and belongs to the field of reliability designing and testing. The method comprises steps of firstly presetting an acceleration test temperature change curve boundary according to working stress limit obtained via a routine test for reliability of an electronic product, carrying out simulating calculation of temperature acceleration factors, and modifying and determining initial acceleration test temperature stress change curves; and secondly, calculating vibration acceleration factors according to the initial acceleration test temperature stress change curves and a test profile of the routine test for the reliability of the original electronic product, calculating acceleration test vibration stress change curves according to the vibration acceleration factors, and according to the acceleration test vibration stress change curves, determining the final temperature stress change curves and determining acceleration test time. According to the invention, by following the thought of testing and examining working stress of a product and properly increasing test stress level, test time is shortened; a reliability test of the electronic product can be accelerated; and diversity and controllability of the acceleration factors are achieved.

A method for performing adaptive scaling in a touch sensitive device including a touch pad is provided. The method includes obtaining a trajectory of touch positions from the touch pad; setting a first scaling factor; comparing an acceleration factor to a deceleration factor, and: setting a second scaling factor to the acceleration factor if the first scaling factor is lower than the acceleration factor when the acceleration factor is greater than the deceleration factor; setting the second scaling factor to the deceleration factor if the first scaling factor is greater than the deceleration factor when the acceleration factor is lower than or equal to the deceleration factor; and updating the trajectory with a new touch position provided by the touch pad and a scaling factor set to the second scaling factor. A touch sensitive device coupled to a display for use with the above method is also provided.

The invention belongs to the technical field of numerical control machine tool and relates to a motorized spindle accelerated life testing time design method. The method includes the steps that firstly, product load data and fault information are collected; secondly, a load distribution model is established; thirdly, a program load spectrum is designed; fourthly, a product service life estimated formula is determined on the basis of the Miner fatigue accumulation damage theory, and an accelerated life testing accelerating factor model is built on the basis of the formula; fifthly, based on the fault information, a first fault time reliability mode is built through model hypothesis, parameter estimation and hypothesis testing; sixthly, testing time design is conducted on the basis of the first fault time, the first fault time corresponding to an acceptable reliability degree serves as a standard, and a relational model of motorized spindle testing time and the sample capacity is established; seventhly, an accelerating factor is considered for testing time design, and the creditability of the testing time design is verified. The relational model of the testing time and the sample capacity is considered, the accelerating factor model is established on the basis of the modification Miner theory, the modeling accuracy is improved, and the method better conforms to actual conditions.

This invention describes the combination of SSFP, a method for accelerating data acquisition, and an eddy current compensation method. This synergistic combination allows acquisition of images with high signal-to-noise ratio, high image contrast, high spatial and temporal resolutions, and good immunity against system instabilities. k-t BLAST and k-t SENSE are the preferred method for accelerating data acquisition, since they allow high acceleration factors, but other methods such as parallel imaging and reduced field-of-view imaging are also applicable. Typical applications of this invention include cine 3D cardiac imaging, and 2D real-time cardiac imaging.

The invention relates to an electronic complete machine storage life assessment and prediction method. On the basis of analyzing a typical complete machine failure mechanism, an Arrhenius model-basedcomplete machine level acceleration factor calculation method is proposed; the method can perform electronic complete machine acceleration factor calculation by only three parameters; an accelerationtest is performed according to a calculation result and data is obtained; by utilizing an optimized GM(1,1) grey model-based prediction algorithm, a degradation law of natural storage and accelerationtest data is researched; the consistency of degradation trends of two groups of data is analyzed; closed-loop correction of acceleration factor calculation model parameters is realized by utilizing aconsistency analysis result; and finally electronic complete machine storage life prediction is realized by utilizing a corrected model. The method is simple and easy to understand and relatively high in prediction precision, and is suitable for engineering popularization.

The invention discloses a multi-element acceleration factor calculation method of electronic equipment. The method includes: respectively constructing single-point stress damage models for different elements influencing life of the electronic equipment, and calculating and obtaining corresponding acceleration factors; constructing a competition failure-based failure model of the entire electronicequipment on the basis of the characteristics of the electronic equipment and the single-point stress damage models; and calculating and obtaining acceleration factors of the electronic equipment on the basis of the constructed fault model of competition failure according to a statistical equivalence principle. According to the method, for the current electronic equipment of which an equipment structure and failure modes are complicated, failure mechanisms and failure forms under various stress conditions of temperature, humidity, vibration, electrical stress, combinations thereof and the likeare analyzed, a corresponding stress failure model is constructed, and thus the acceleration factors of the electronic equipment can be obtained according to the different elements, the fault model and a corresponding system life model. The method is completely suitable for accelerated testing of the entire-machine equipment, and then enables accelerated testing of the electronic equipment to bemore accurate and reliable.

The invention discloses a time terminated acceleration acceptance sampling test optimum design method based on the Bayesian theory. The method comprises the following steps: step one, life distribution and verification index parameters of products are determined, and then a statistical hypothesis is established; step two, test decision-making rules are designed for a selected product, and testing and receiving processes of the product are determined; step three, constraint conditions which meet the requirements of two-party risks for the verification index parameters are deduced according to posterior risk criteria; step four, prior distribution of the verification index parameters is given based on historical data, and a scheme set meeting the conditions is calculated through WinBUGS14 on the basis of an MCMC method; step five, a test cost constraint is determined, and an optimal scheme is obtained through calculation. According to the time terminated acceleration acceptance sampling test optimum design method based on the Bayesian theory, the Bayesian theory is introduced into the optimum design of an acceleration acceptance sampling test for the first time, the posterior risk criteria are applied to the solving process of the test scheme, the influence of accelerated factor uncertainty in the test is taken into consideration for the first time, and the influence is expressed in a quantized mode.

The invention discloses an accelerated life test load spectrum determining method with multiple mechanisms taken into consideration. The accelerated life test load spectrum determining method specifically comprises the following steps of analyzing the main mechanism, calculating an acceleration factor, initially determining the accelerated stress level and the acceleration factor, initially determining the test time based on the mechanisms such as the fatigue mechanism and the abrasion mechanism, finally determining the test time with aging and corroding mechanisms taken into consideration, and finally determining an accelerated life test load spectrum. The accelerated life test load spectrum determining method can be directly applied to products and can be used for determining parameters of the accelerated life test load spectrum based on mechanism calculation, and the engineering applicability is high. According to the accelerated life test load spectrum determining method, multi-mechanism test time collaborative analysis is carried out according to the fatigue and abrasion mechanisms and aging and colliding mechanisms, and the accuracy of the accelerated life test time is guaranteed.

The invention discloses a test run method for an accelerated life test of a gas turbine engine. The test run method comprises the steps that an accelerated factor analysis model of the gas turbine engine under simulated running conditions is established; according to the accelerated factor analysis model, a support vector machine method is used for establishing a surrogate model of three-dimensional finite element stress analysis; the surrogate model is used for obtaining dangerous point stress of the accelerated factor analysis model, and then life indexes of the accelerated factor analysis model are obtained; a Monte Carlo method is used for conducting stochastic simulation on random variables of the life indexes; an optimal design mathematical model of an accelerated life test scheme of stress under the simulated running conditions of the gas turbine engine is established and analyzed, and the test scheme is optimized according to the optimal design mathematical model; a mixing optimization method is adopted to optimize the mathematical model, and the optimized accelerated life test scheme is obtained according to the optimized mathematical model. By means of the test run method, the test period is shortened, and life test expenditure is reduced.

A micro-grid grid-connected optimal scheduling method based on improved subgradient particle swarms comprises the steps of establishing a micro-grid grid-connected model including an energy storage device; according to the actual situation, establishing an optimal scheduling objective function at the smallest total micro-gird power generation costs and environmental pollution control costs; establishing operating constraints in a micro-grid system, and separately establishing system power balance constraints, storage battery charge and discharge power constraints, micro-power output power limits and electricity purchasing and selling constraints for interaction between the micro-grid and large grids; improving the standard particle swarm optimization; separately improving the inertia weight and acceleration factors; and proposing to use the sub-gradient optimization method to update the velocity of the particles in the particle swarm optimization. According to the micro-grid grid-connected optimal scheduling method based on the improved subgradient particle swarms, while the micro-grid grid-connected optimization involving the energy-storage device is solved, advantages such as a good optimization searching effect and a fast convergence speed are realized.

The invention discloses an accelerated degradation data validity testing and model selection method. The method comprises the five steps of 1, selecting a common degradation path model and performing standardization; 2, establishing an acceleration mechanism equality condition based on an acceleration factor invariance principle; 3, estimating model parameter values in different stress levels and performing hypothesis testing by applying Bartlett statistics; 4, calculating an acceleration factor variation coefficient and selecting a degradation path model; and 5, extrapolating the product life in a normal stress level based on regression analysis. According to the method, the acceleration mechanism equality condition is established for the degradation path model, so that the stability of an acceleration factor is improved; a testing process and a parameter estimation algorithm are very simple; and the method is high in operability and has an important significance for data validity testing.

The invention relates to a method for predicting the aging failure rule and the service life of a polymer material under multiple environmental factors, belonging to the field of high polymer materials. According to the method, a lifetime characteristic index-aging time curve of the polymer material under an acceleration condition is obtained based on an accelerated aging test under the multiple environmental factors, corresponding aging failure acceleration factors are calculated by virtue of an Arrhenius formula, a reciprocity method and a superposition rule, an aging failure curve in a normal service environment (with multiple aging factors) is extrapolated from the failure curve under the acceleration condition by virtue of the aging failure acceleration factors, and the aging failure rule of the polymer material is predicted. The method has the beneficial effects of short test cycle, good repeatability, simplicity in theoretical derivation and high prediction reliability.

The invention discloses an actuator product acceleration factor determining method based on theoretical lifetime calculation. The method comprises the specific steps that (1) conducting main mechanism analysis, wherein actuator product weak links and main mechanisms corresponding to the actuator product weak links are determined; (2) selecting lifetime calculation models, wherein the corresponding lifetime calculation models are selected according to the types of the main mechanisms; (3) comprehensively determining acceleration factors, wherein the acceleration factors, corresponding to the product weak links, of the main mechanisms under different stress levels are calculated according to the determined stress types and ranges, the acceleration stress level is determined according to the acceleration factor standard deviation minimum principle, and the acceleration factors are determined according to the acceleration factor minimum principle. The actuator product acceleration factor determining method can be directly applied to products, the acceleration factors of the products are determined through the acceleration factors of the product weak links obtained through main mechanism analysis calculation, theoretical supports are provided for a product layer acceleration lifetime test method, and the actuator product acceleration factor determining method has the advantages of being clear in thought, high in operability and the like.

The invention provides a rapid data de-duplication method adapted to a big data application. The rapid data de-duplication method is applied to backup de-duplication systems under the big data application and solves the problems that the existing variable-length partition algorithm based on content identification is low in de-duplication rate and fails to identify redundant data rapidly. According to the rapid data de-duplication method, through adjusting de-duplication factors and acceleration factors in a partition process, the de-duplication rate is substantially improved on the premise that the de-duplication ratio is ensured, de-duplication detection can be performed rapidly, the contradiction between the de-duplication ratio and the de-duplication rate is balanced, backup windows are reduced, and network bandwidth and memory spaces are saved.

A pointing device generates pixel counts at a predetermined frame rate indicative of motion in predetermined axes of a user's digit across an imaging surface. A cursor motion controller receives the pixel counts and generates navigation output signals representing averages over predetermined time intervals selected to smooth the motion of a cursor on the display of an electronic apparatus. Optionally, the cursor motion controller can multiply a pixel count in each frame by a predetermined acceleration factor so that a cursor on the display of an electronic apparatus will move a greater distance based on an increased rate of motion of the user's digit across the imaging surface. Optionally, the cursor motion controller can interrupt the generation of navigation output signals for a predetermined interrupt period after completion of a cursor stroke. The averaging, acceleration and interruption features can be used independently or in various combinations.

The invention provides an assessment method of storage lives of lead bonding air-impermeability encapsulation analogue integrated circuits. The method comprises the following steps: selecting and screening qualified samples, and separating the samples into a plurality of groups at random; measuring and calculating relative humidity inside one group of samples and an average value of bonding strength of bonding wires; conducting accelerated life tests by using steady temperature accelerated stress, temperature cycling accelerated stress and steady damp and heat accelerated stress, and enabling the samples under steady damp heat tests to be uncovered first; detecting sensitivity parameters of the samples at certain intervals; confirming the sensitivity parameters and life distribution types of the samples, and conducting matching to obtain distribution parameters; calculating average lives of the samples; calculating model parameters and accelerated factors of accelerated models according to the average lives of the samples under different stress conditions; and deducing the lives of the samples under actual storage conditions. According to the method, test stress is selected reasonably, monitored parameters are comprehensive, and the sensitivity parameters can be accurately distinguished. The method is mainly applied to the field of reliability assessment of semiconductor analogue integrated circuits.