Accelerated life test load spectrum determining method with multiple mechanisms taken into consideration

A technology for accelerated life test and determination method, applied in electrical digital data processing, special data processing applications, instruments, etc., can solve problems such as high price, reduced test time, complex applied stress, etc., to achieve strong engineering applicability and guarantee accuracy sexual effect

Active Publication Date: 2014-11-19
BEIHANG UNIV
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  • Claims
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AI Technical Summary

Problems solved by technology

For mechanical long-life products, due to their high price, it is impossible to reduce the test time by increasing the sample size; and the stress in the working process is complex, and its failure is the result of multiple failure mechanisms, making it difficult to determine

Method used

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  • Accelerated life test load spectrum determining method with multiple mechanisms taken into consideration
  • Accelerated life test load spectrum determining method with multiple mechanisms taken into consideration
  • Accelerated life test load spectrum determining method with multiple mechanisms taken into consideration

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Embodiment Construction

[0042] The present invention will be further described in detail with the determination of the accelerated life test load spectrum of an actuator in conjunction with the accompanying drawings and embodiments.

[0043] The present invention considers a multi-mechanism accelerated life test load spectrum determination method, see figure 1 As shown, the specific steps of the method are as follows:

[0044] Step 1: Host mechanism analysis. Identify product weaknesses and their corresponding wear-out failure mechanisms. Main mechanism analysis According to the given load spectrum or task profile, combined with the composition, structure and principle of the actuator product, the failure mode, mechanism and effect analysis (FMMEA, Failure Mode, Mechanisms and Effects Analysis) is carried out on the basis of FMMEA According to the severity and occurrence frequency of the failure modes corresponding to each mechanism, comprehensively determine the weak link of the product and its co...

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Abstract

The invention discloses an accelerated life test load spectrum determining method with multiple mechanisms taken into consideration. The accelerated life test load spectrum determining method specifically comprises the following steps of analyzing the main mechanism, calculating an acceleration factor, initially determining the accelerated stress level and the acceleration factor, initially determining the test time based on the mechanisms such as the fatigue mechanism and the abrasion mechanism, finally determining the test time with aging and corroding mechanisms taken into consideration, and finally determining an accelerated life test load spectrum. The accelerated life test load spectrum determining method can be directly applied to products and can be used for determining parameters of the accelerated life test load spectrum based on mechanism calculation, and the engineering applicability is high. According to the accelerated life test load spectrum determining method, multi-mechanism test time collaborative analysis is carried out according to the fatigue and abrasion mechanisms and aging and colliding mechanisms, and the accuracy of the accelerated life test time is guaranteed.

Description

technical field [0001] The invention provides a method for determining a load spectrum of an accelerated life test considering multiple mechanisms, in particular relates to a method for determining each test parameter of an accelerated life test of a product layer under the action of multiple mechanisms, and belongs to the technical field of accelerated life tests. Background technique [0002] As a measure of durability, lifespan is an important tactical and technical indicator of weapons and equipment, and a key factor affecting the full effectiveness of equipment. How to design the accelerated life test load spectrum and verify the product life index through the test is a common problem faced by the current long-life product life analysis and test, and it is also a key technology in the long-life design, analysis, test, evaluation and prediction of the product. For mechanical long-life products, due to their high price, it is impossible to reduce the test time by increasi...

Claims

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Application Information

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IPC IPC(8): G06F19/00
Inventor 廖寻陈云霞井海龙康锐
Owner BEIHANG UNIV
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