Reliability acceleration test method of electronic products

A technology for accelerated testing and electronic products, which is applied in the field of design and reliability testing, can solve the problems of inability to investigate the acceleration relationship and the inability to conduct acceleration tests, etc., and achieve the effect of strengthening the profile and engineering implementation

Active Publication Date: 2016-05-11
XIAN AIRCRAFT DESIGN INST OF AVIATION IND OF CHINA
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Problems solved by technology

Obviously, according to the traditional concept of reliability, failures occur randomly, and the root cau

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  • Reliability acceleration test method of electronic products
  • Reliability acceleration test method of electronic products
  • Reliability acceleration test method of electronic products

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Embodiment Construction

[0025] In order to make the objectives, technical solutions and advantages of the present invention clearer, the technical solutions in the embodiments of the present invention will be described in more detail below in conjunction with the drawings in the embodiments of the present invention. In the drawings, the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The described embodiments are some, but not all, embodiments of the invention. The embodiments described below by referring to the figures are exemplary and are intended to explain the present invention and should not be construed as limiting the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention. Embodiments of the present invention will be described in detail below ...

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Abstract

The invention discloses a reliability acceleration test method of electronic products, and belongs to the field of reliability designing and testing. The method comprises steps of firstly presetting an acceleration test temperature change curve boundary according to working stress limit obtained via a routine test for reliability of an electronic product, carrying out simulating calculation of temperature acceleration factors, and modifying and determining initial acceleration test temperature stress change curves; and secondly, calculating vibration acceleration factors according to the initial acceleration test temperature stress change curves and a test profile of the routine test for the reliability of the original electronic product, calculating acceleration test vibration stress change curves according to the vibration acceleration factors, and according to the acceleration test vibration stress change curves, determining the final temperature stress change curves and determining acceleration test time. According to the invention, by following the thought of testing and examining working stress of a product and properly increasing test stress level, test time is shortened; a reliability test of the electronic product can be accelerated; and diversity and controllability of the acceleration factors are achieved.

Description

technical field [0001] The invention belongs to the field of reliability test and design, and in particular relates to a reliability accelerated test method for electronic products. Background technique [0002] The traditional reliability statistical test method and evaluation technology based on environmental simulation can no longer meet the needs of equipment development with high reliability requirements, fast replacement speed, and short development cycle. The increasingly accelerated development of electronic equipment also urgently requires high-efficiency reliability tests. With the support of technology, the reliability level of electronic products is getting higher and higher. The indicators of many products have exceeded 3000 hours. The traditional reliability environment simulation test is far from meeting the requirements of modern aircraft system development. In order to effectively solve the contradiction between the reliability and complexity of modern elect...

Claims

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Application Information

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IPC IPC(8): G01R31/00
CPCG01R31/003
Inventor 赵晓东樊西龙薛海红梁力
Owner XIAN AIRCRAFT DESIGN INST OF AVIATION IND OF CHINA
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