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Accelerated degradation data validity testing and model selection method

A data validity and accelerated degradation technology, applied in the direction of electrical digital data processing, special data processing applications, instruments, etc., can solve the problems of unreasonable degradation model processing test data, less validity of accelerated degradation test data, etc.

Active Publication Date: 2016-04-06
BEIHANG UNIV
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Problems solved by technology

However, there are very few studies on the validity of accelerated degradation test data, and it is unreasonable to apply any degradation model to process test data when the acceleration mechanism changes

Method used

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  • Accelerated degradation data validity testing and model selection method
  • Accelerated degradation data validity testing and model selection method
  • Accelerated degradation data validity testing and model selection method

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Embodiment Construction

[0075] The present invention will be described in further detail below in conjunction with accompanying drawings and examples.

[0076] The main cause of failure of an electronic device is the degradation of the contacts of the internal electrical connector due to stress relaxation. The degradation process is mainly affected by temperature. Therefore, the constant temperature stress accelerated degradation test method was used to study the performance degradation of the electronic device. In three sets of accelerated stresses T 1 =65℃、T 2 =85°C and T 3 = Perform performance degradation test at 100°C, and put 6 samples under each stress. Table 2 records the detection time and the stress relaxation data of the samples under three groups of different accelerated stresses. The failure threshold of the electronic device is defined as the stress relaxation exceeding 30%, ie D=30.

[0077] Table 2 Stress relaxation data of an electronic device

[0078]

[0079] According to th...

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Abstract

The invention discloses an accelerated degradation data validity testing and model selection method. The method comprises the five steps of 1, selecting a common degradation path model and performing standardization; 2, establishing an acceleration mechanism equality condition based on an acceleration factor invariance principle; 3, estimating model parameter values in different stress levels and performing hypothesis testing by applying Bartlett statistics; 4, calculating an acceleration factor variation coefficient and selecting a degradation path model; and 5, extrapolating the product life in a normal stress level based on regression analysis. According to the method, the acceleration mechanism equality condition is established for the degradation path model, so that the stability of an acceleration factor is improved; a testing process and a parameter estimation algorithm are very simple; and the method is high in operability and has an important significance for data validity testing.

Description

technical field [0001] The invention relates to a method for checking the validity of accelerated degradation data and selecting a model. It aims at the degradation track model and uses the acceleration mechanism equivalence criterion as the basis to check the relationship between the model parameters of the product under different stress levels and the hypothesis testing method. have a discussion. Furthermore, considering the stability requirements of the acceleration factor, the accelerated degradation model is selected. It is suitable for fields such as accelerated degradation test life evaluation. Background technique [0002] With the rapid development of science and technology, global competition and consumers' increasingly high performance requirements for products, the reliability level of products has reached an unprecedented height. The traditional accelerated life test is no longer suitable for such high-reliability products, because in order to obtain sufficien...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F19/00
CPCG16Z99/00Y02E60/00
Inventor 马小兵王晗赵宇
Owner BEIHANG UNIV
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