Electronic complete machine storage life assessment and prediction method

A storage life and prediction method technology, which is applied in the field of system storage life extension research, can solve the problems of non-standard determination of storage life acceleration factor and storage time parameters of the electronic complete machine, and achieves easy engineering application, high fitting accuracy and simple calculation. Effect

Active Publication Date: 2018-08-24
BEIJING AEROSPACE AUTOMATIC CONTROL RES INST +1
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Problems solved by technology

[0004] The purpose of the present invention is to overcome the deficiencies of the prior art, provide a method for evaluating and predicting the storage life of an electronic complete machine, solve the problem that the acceleration factor and storage time parameters of the electronic complete Carry out accelerated storage test

Method used

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  • Electronic complete machine storage life assessment and prediction method
  • Electronic complete machine storage life assessment and prediction method
  • Electronic complete machine storage life assessment and prediction method

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Embodiment Construction

[0036] The invention provides a method for evaluating and predicting the storage life of a bomb-borne electronic complete machine, which combines figure 1 , including the following steps:

[0037] (1) The calculation method of the acceleration factor of the whole machine based on the component information, the steps are as follows:

[0038] Among the temperature stress accelerated test models, the most commonly used is the Arrhenius model:

[0039]

[0040] However, this model is only applicable to components and cannot be directly used for the whole machine. Based on this, a new method is proposed to calculate the "whole machine acceleration factor" by using component information:

[0041]

[0042] where A FT is the acceleration factor of the whole machine; λ AT is the overall average failure rate of equipment under accelerated stress; λ UT It is the total average failure rate of the equipment in actual use.

[0043] Since the sum of component failure rates is the ...

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Abstract

The invention relates to an electronic complete machine storage life assessment and prediction method. On the basis of analyzing a typical complete machine failure mechanism, an Arrhenius model-basedcomplete machine level acceleration factor calculation method is proposed; the method can perform electronic complete machine acceleration factor calculation by only three parameters; an accelerationtest is performed according to a calculation result and data is obtained; by utilizing an optimized GM(1,1) grey model-based prediction algorithm, a degradation law of natural storage and accelerationtest data is researched; the consistency of degradation trends of two groups of data is analyzed; closed-loop correction of acceleration factor calculation model parameters is realized by utilizing aconsistency analysis result; and finally electronic complete machine storage life prediction is realized by utilizing a corrected model. The method is simple and easy to understand and relatively high in prediction precision, and is suitable for engineering popularization.

Description

technical field [0001] The invention relates to a method for evaluating and predicting the storage life of an electronic complete machine, and belongs to the technical field of system storage life extension research. . Background technique [0002] Electronic products are the core components of spacecraft, and correctly predicting their storage life has important theoretical and practical significance, as well as military and economic value. Due to the lack of storage time, the evaluation of storage period generally adopts the accelerated test method, that is, by applying high stress, the product fails under the established acceleration model, and then the storage period evaluation is completed by combining statistical analysis methods such as timing or fixed number censoring. However, spacecraft in active service often have high reliability characteristics, and it is difficult to cause failure in storage accelerated tests. [0003] Traditional reliability theory only pays...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/50
CPCG06F30/15G06F30/17
Inventor 郑伟张洁邵进段然刘江邓钊刘孟语林瑞仕杨轶彭红五唐阳徐嫣
Owner BEIJING AEROSPACE AUTOMATIC CONTROL RES INST
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