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1660results about "Lamps testing" patented technology

Illumination Device and Method for Controlling an Illumination Device over Changes in Drive Current and Temperature

An illumination device and method is provided herein for controlling individual light emitting diodes (LEDs) in an LED illumination device, so that a desired luminous flux and a desired chromaticity of the device can be maintained over changes in drive current and temperature. According to one embodiment, the illumination device comprises a plurality of emission LEDs, a storage medium, an LED driver and receiver circuit and a control circuit. The storage medium may store a table of calibration values correlating forward voltage and drive current to chromaticity and luminous flux at a plurality of temperatures for each of the plurality of emission LEDs. The LED driver and receiver circuit may apply respective drive currents to the emission LEDs to produce substantially continuous illumination, and may periodically turn the emission LEDs off to measure operating forward voltages that develop across each emission LED. The control circuit may determine whether a target luminance setting or a target chromaticity setting for the illumination device has changed, and if so, may determine new respective drive currents needed to achieve the target luminance setting and the target chromaticity setting using the operating forward voltages measured across each emission LED, the table of calibration values and one or more interpolation techniques.
Owner:LUTRON TECH CO LLC

Illumination device and method for controlling an illumination device over changes in drive current and temperature

An illumination device and method is provided herein for controlling individual light emitting diodes (LEDs) in an LED illumination device, so that a desired luminous flux and a desired chromaticity of the device can be maintained over changes in drive current and temperature. According to one embodiment, the illumination device comprises a plurality of emission LEDs, a storage medium, an LED driver and receiver circuit and a control circuit. The storage medium may store a table of calibration values correlating forward voltage and drive current to chromaticity and luminous flux at a plurality of temperatures for each of the plurality of emission LEDs. The LED driver and receiver circuit may apply respective drive currents to the emission LEDs to produce substantially continuous illumination, and may periodically turn the emission LEDs off to measure operating forward voltages that develop across each emission LED. The control circuit may determine whether a target luminance setting or a target chromaticity setting for the illumination device has changed, and if so, may determine new respective drive currents needed to achieve the target luminance setting and the target chromaticity setting using the operating forward voltages measured across each emission LED, the table of calibration values and one or more interpolation techniques.
Owner:LUTRON TECH CO LLC

Performance measuring device of surface light source lamp

InactiveCN102620918ASolving the lack of measurement devices for the performance of surface light luminairesSimple structureLamps testingTesting optical propertiesColor rendering indexEngineering
A performance measuring device of a surface light source lamp comprises a horizontal baseboard, a support and a testing table. The support comprises a vertical support and a horizontal support, the vertical support is vertically fixed on the horizontal baseboard, the horizontal support is horizontally arranged on the vertical support and is capable of being in parallel translation vertically, and the horizontal support is provided with a lamp fixing device. The testing table comprises a horizontal disc, a probe and a detector, the horizontal disc is arranged on the horizontal baseboard and capable of rotating for 360 degrees, the horizontal disc is provided with a linear guiderail, the probe is installed on the linear guiderail and capable of moving along the linear guiderail, and the detector is arranged on the horizontal baseboard and connected with the probe. The performance measuring device is simple in structure, eliminates uncertainty in measuring, leads measuring to be standard, and can be used in measuring of parameters including light intensity, spectrum, color temperature, surface temperature and color rendering index of various surface light source lamps including light-emitting diode surface light source lamps, organic light-emitting diode surface light source lamps and electroluminescence surface light source lamps.
Owner:SHANGHAI JIAO TONG UNIV

LED lamp detecting device

The invention provides an LED lamp detecting device, and belongs to the technical field of detection. The LED lamp detecting device solves problems of small detection range and low precision of an existing LED lamp detecting device. The LED lamp detecting device comprises an elongated worktable, a conveying belt and chain wheels, the elongated worktable is disposed horizontally, the conveying belt is arranged on the worktable, the chain wheels used for driving the conveying belt to transmit LED lamps are disposed on the lower portion of the worktable and driven by a motor, the conveying belt is elliptical, the chain wheels are respectively positioned at two ends of the elliptical conveying belt, a plurality of lamp bank holders which are arranged along the width direction of the worktable are disposed on the surface of the conveying belt and are uniformly distributed, each lamp bank holder consists of 6-10 lamp holders uniformly distributed, and a high-voltage detecting unit, a photoelectric parameter testing unit and an automatic separating unit are respectively arranged above the worktable and are sequentially distributed along the conveying direction of the conveying belt. The LED lamp detecting device has the advantages of wide detection range, high detection precision and the like.
Owner:台州市远东铁马自动化设备有限公司

Method for measuring relation curve of forward voltage and junction temperature of LED (Light Emitting Diode) in lamp

ActiveCN102193053AEliminates cases where the junction temperature value deviates significantly from the correct valueSolve problems that cannot be measured accuratelyLamps testingIndividual semiconductor device testingWorking temperatureLight fixture
The invention discloses a method for measuring a relation curve of a forward voltage and a junction temperature of an LED (Light Emitting Diode) in a lamp. In the invention, the method comprises the steps of obtaining a dropping amount of the forward voltage under a set measuring current within a unit measuring time; correcting the forward voltage drop of the measured LED by using the dropping amount of the forward voltage drop within the unit measuring time and an actual measuring time so as to improve the measuring accuracies of the forward voltage drop and the corresponding junction temperature of the measured LED; and measuring the forward voltage drop of the measured LED and figuring out the forward voltage drop of the measured LED at the moment of disconnecting the working current when the continuous working temperature of the LED lamp reaches heat balance. By using the method disclosed by the invention, the situation that the junction temperature of the measured LED obviously biases from a correct value due to the disconnection of the working current of the measured LED and fast dropping of the junction temperature of the LED can be effectively eliminated. The method disclosed by the invention has the advantages of convenience in use and high measuring accuracy; and the difficulty that the actual working junction temperature and the heat resistance of the LED in the traditional lamp cannot be accurately measured is solved.
Owner:SHANGHAI ALPHA LIGHTING EQUIP TESTING +3

Detection bench, detection method and detection system

The invention discloses a detection bench, a detection method and a detection system. The detection bench can be used for the optical and electrical detection of the light-emitting component. The detection bench comprises a substrate platform, a probe mechanism, a heating device, a cooling device, an image sensing device, a temperature sensing device, and a movable platform. The probe mechanism is suitable for the contact with the light-emitting component, and is close to the substrate platform. The heating device is suitable for heating the light-emitting component to make the temperature of the light-emitting component to remain in the first temperature range. The cooling device can be used to cool the light-emitting component to make the temperature of the light-emitting component to remain in the second temperature range. The image sensing device can be used to sense the light-emitting image generated by the light-emitting component. The temperature sensing device can be used to sense the current temperature of the light-emitting component. The image sensing device is disposed on the movable platform, which is suitable for moving the image sensing device. The invention also provides a detection method and a detection system, which are suitable for the above mentioned detection bench.
Owner:LEXTAR ELECTRONICS CORP

LED (light emitting diode) service life test system and test method thereof

The invention discloses an LED (light emitting diode) service life test system, which comprises refrigerators, aluminum printed circuit boards (PCBs), a cold and hot two-region temperature box and an integrating sphere. An electric refrigerating plate and a subpanel of the refrigerator are fixedly installed on a radiator and the electric refrigerating plate is embedded into an opening of the subpanel. The aluminum PCB is fixed on the surface of the electric refrigerating plate. The cold and hot two-region temperature box comprises cold and hot boxes isolated by an insulation board. The insulation board and the integrating sphere are provided with installation holes for installing the refrigerators. When the refrigerators are respectively installed on the installation holes of the temperature box and the integrating sphere, the radiators are respectively placed outside the cold box and the integrating sphere while the aluminum PCBs are respectively placed inside the hot box and the integrating sphere. The refrigerators provided by the invention can move integrally without disassembling the LED, which facilitates the LED service life test greatly. In addition, each LED can be independently lighted by connecting a lead wire at the connection solder joint of the aluminum PCB to a switching circuit, thereby achieving the aim of testing the parameters of light, color and electricity of each LED independently.
Owner:常州市产品质量监督检验所 +1
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