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965 results about "Testing position" patented technology

Automatic testing and sorting machine for integrated circuit IC chip

The invention discloses an automatic testing and sorting machine for an integrated circuit IC chip. The machine comprises a charging tray separating and inputting device, a material boat module device, a qualified product sorting and collecting module and an inferior-quality product sorting and collecting module, wherein the charging tray separating and inputting device can separate stacked material trays one by one; the material boat module device comprises a left material boat for holding chips to be tested and a right material boat for holding the tested chips, and the left material boat and the right material boat are controlled by a servo motor to swing left and right; the qualified product sorting and collecting module is used for holding the chips tested to be qualified in the right material boat; and the inferior-quality product sorting and collecting module is used for holding the chips tested to be unqualified. A tray full of chips to be tested and sorted is automatically input to the right position by the tray separating and inputting device, then, the chips are transferred to the boats by a charging gripper platform device one by one; and the chips to be tested in the left material boat are precisely absorbed and moved to a testing position to be tested by a testing gripper combined module device, then, are placed back to the right material boat to be further conveyed to a sorting position, and finally, are sorted and placed in a corresponding finished product tray or inferior-quality product tray by a discharging and sorting gripper platform device according to the test result, and conveyed out of the machine in order after fully filled in the tray.
Owner:深圳格芯集成电路装备有限公司

Fluid sample distriution system for test device

Diagnostic products having multiple test strips within a unitary diagnostic test device, or test icon, are described herein. In the preferred embodiments of the diagnostic test device of this invention, a fluid sample distribution system is provided wherein a sample collection and distribution port is provided in the housing for receipt of a biologic fluid sample and the channeling of such sample onto a sample receiving web. The sample receiving web, which is located within the test device, is in fluid communication with an array of test strips, and is configured to deliver an aliquot of biologic fluid sample to the test site of each such test strip at essentially the same rate. In the preferred embodiments of this invention, the sample receiving web comprises at least one base segment and at least one branched segment. Each of the base and branched segments can be formed or cut from a common sheet of material or from separate sheet material and thereafter placed in contiguous relationship one another. The relative placement of the sample receiving web within the test device is coincident with a portion of each test strip and designed to effect the balanced distribution and delivery of an aliquot of the biologic fluid sample to the test site of each of the test strips within the test device.
Owner:BIONIKE

Method of multiple pulse laser annealing to activate ultra-shallow junctions

A method for forming a highly activated ultra shallow ion implanted semiconductive elements for use in sub-tenth micron MOSFET technology is described. A key feature of the method is the ability to activate the implanted impurity to a highly active state without permitting the dopant to diffuse further to deepen the junction. A selected single crystalline silicon active region is first amorphized by implanting a heavy ion such as silicon or germanium. A semiconductive impurity for example boron is then implanted and activated by pulsed laser annealing whereby the pulse fluence, frequency, and duration are chosen to maintain the amorphized region just below it's melting temperature. It is found that just below the melting temperature there is sufficient local ion mobility to secure the dopant into active positions within the silicon matrix to achieve a high degree of activation with essentially no change in concentration profile. The selection of the proper laser annealing parameters is optimized by observation of the reduction of sheet resistance and concentration profile as measured on a test site. Application of the method is applied to forming a MOS FET and a CMOS device. The additional processing steps required by the invention are applied simultaneously to both n-channel and p-channel devices of the CMOS device pair.
Owner:CHARTERED SEMICONDUCTOR MANUFACTURING

Method and system for testing RFID devices

A method and system for testing a plurality of RFID devices disposed on a common carrier. In one embodiment, the RFID devices are evenly spaced along the length of the carrier, and the system comprises a short-range tester, a long-range tester and a computer, the short-range tester being coupled to the computer and having a short-range testing position, the long-range tester being coupled to the computer and having a long-range testing position, the long-range testing position being spaced downstream from the short-range testing position by a known number of device positions. In use, an RFID device of interest is first positioned at the short-range testing position, and the short-range tester reads a unique identifier for that RFID device and communicates the identifier to the computer. The carrier is then advanced so that subsequent RFID devices are read by the short-range tester. When the RFID device of interest has advanced to the long-range testing position, the long-range tester conducts a performance test and communicates any detected results to the computer. Because the distance between the two testing positions is known, the computer knows when the RFID device of interest is at the long-range testing position and uses the identifier to distinguish the results for that device from the results of any other devices.
Owner:AVERY DENNISON CORP

Method and system for testing RFID devices

A method and system for testing a plurality of RFID devices disposed on a common carrier. In one embodiment, the RFID devices are evenly spaced along the length of the carrier, and the system comprises a short-range tester, a long-range tester and a computer, the short-range tester being coupled to the computer and having a short-range testing position, the long-range tester being coupled to the computer and having a long-range testing position, the long-range testing position being spaced downstream from the short-range testing position by a known number of device positions. In use, an RFID device of interest is first positioned at the short-range testing position, and the short-range tester reads a unique identifier for that RFID device and communicates the identifier to the computer. The carrier is then advanced so that subsequent RFID devices are read by the short-range tester. When the RFID device of interest has advanced to the long-range testing position, the long-range tester conducts a performance test and communicates any detected results to the computer. Because the distance between the two testing positions is known, the computer knows when the RFID device of interest is at the long-range testing position and uses the identifier to distinguish the results for that device from the results of any other devices.
Owner:AVERY DENNISON CORP

Integrated circuit optical detector for biological detection

This invention provides an integrated circuit (IC) optical detector. The IC optical detector comprises a substrate and an IC. The substrate comprises a plurality of test sites defined thereon. The test sites comprise a surface suitably treated for coating of at least one test sample. The at least one test sample is capable of being changed by a reaction. The IC comprises at least one optical sensor array for simultaneously receiving and sensing optical signals from the test sites during operations Presence of at least one changed test sample at a test site changes the quantity of light directed through the test site. The change in quantity of light is detectable by the sensor array. The optical sensor array further converts the sensed optical signals to electrical signals. The IC automatically processes and outputs the electrical signals during operation. This invention further provides a method for detecting a specific sample within at least one test sample. The method comprises securing said test sample on a plurality of test sites defined on a substrate; processing said test sample to allow said test sample to be optically differentiated; directing a light at said test sample; simultaneously receiving and sensing optical signals from said test sample using at least one optical sensor array of an IC; converting said sensed optical signals to electrical signals by said optical sensor array; and automatically processing and outputting said electrical signals by said IC to detect said specific sample within said test sample.
Owner:THE HONG KONG UNIV OF SCI & TECH
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