100 results about "Contact test" patented technology

The invention discloses a water supply and water delivery pipeline welding positioning device, and relates to the technical field of water supply and water delivery pipeline welding, the water supply and water delivery pipeline welding positioning device comprises two fixing frames, the bottom of each fixing frame is provided with two symmetrically arranged moving roller mechanisms, the fixing frames are provided with lifting adjusting mechanisms, and the lifting adjusting mechanisms are connected with grabbing clamping jaw mechanisms; a synchronous folding mechanism is arranged between the two fixing frames, a lifting seat mechanism is arranged on the synchronous folding mechanism, a rotating arc plate mechanism is arranged on the lifting seat mechanism, two feeding welding mechanisms which are symmetrically arranged are arranged on the rotating arc plate mechanism, and a contact testing mechanism is arranged on the rotating arc plate mechanism; by arranging the grabbing clamping jaw mechanism, pipelines with different diameters can be grabbed and fixed, the lifting adjusting mechanism can drive the pipelines to ascend and descend for displacement, the synchronous folding mechanism can control butt joint of the two pipelines, meanwhile, folding, storage and carrying can be facilitated, and the water supply and delivery pipeline positioning and welding performance is improved.

The utility model relates to the technical field of battery testing, in particular to a main-grid-free battery testing device which comprises a testing base, the testing base comprises an elastic base station capable of elastically deforming, and the upper surface of the elastic base station is of a three-dimensional curved surface structure which is arched upwards in the direction from the periphery to the middle of the elastic base station. A plurality of contact test points used for forming ohmic contact with fine grid lines on a battery to be tested are arranged on the elastic base table, a flexible pressing and fixing mechanism capable of ascending and descending relative to the thickness direction of the test base is further arranged above the test base, and the flexible pressing and fixing mechanism comprises a pressing and fixing wire net. The pressing and fixing wire net comprises a plurality of first pressing wires parallel to one another and a plurality of second pressing wires parallel to one another, and the first pressing wires and the second pressing wires are arranged in a crossed mode to form a net structure. According to the testing device, the to-be-tested battery does not shake or displace when being pressed, the stress is more uniform, the thin grid lines at all positions can be in stable contact with the contact testing points, and the reliability of a detection result is ensured.

This invention discloses a method for manufacturing anti-slip children's shoes, relating to the field of anti-slip children's shoe production technology. The manufacturing process comprises a testing platform, a dynamic abrasive unit, a segmented control contact mechanism, and an asynchronous linkage mechanism. The dynamic abrasive unit automatically adjusts and changes the coefficient of friction during abrasion resistance testing. A shoe sole block is mounted on the right side of the trigger component. A cooperating unit works with the trigger component to move the shoe sole block, pushing against the foot area of ​​the shoe sole to contact the dynamic abrasive unit for testing. This invention uses a segmented control contact mechanism to bend the anti-slip children's shoe into three sections, allowing for separate testing of the forefoot, midfoot, and heel areas of the sole, providing more detailed wear data. Furthermore, by simulating the actual wear under heel-first and forefoot-first gait conditions through reciprocating oscillation, the invention improves the accuracy, representativeness, and data quality of the test, making the test results more practically meaningful.

The application discloses a method for non-contact testing of quantum efficiency (EQE) and short-circuit current (ISC) of a solar cell, relates to the technical field of photovoltaic device testing, and aims to solve the problems that the existing quantum efficiency and short-circuit current measurement must contact electrodes, is slow and cannot cover new gateless or process pieces; a non-contact testing method of "multi-wavelength LED excitation + local shielding + carrier lateral diffusion" is provided; the method blocks the excitation light by using a shielding filter, and only transmits the electroluminescence signal of the shielding area; the EL power of each wavelength is extracted through phase-locked amplification and deep learning denoising, the continuous EQE curve is calculated by using the calibrated incident photon flux ratio, and the ISC is obtained by convolution of the AM1.5 spectrum.

1. The name of the design product: non-contact test pen. 2. The use of the design product: for non-contact detection of whether the measured object has AC voltage, with lighting function. 3. The design points of the design product: in shape. 4. The picture or photo that best indicates the design points: perspective view 1.

The invention belongs to the technical field of circuit testing, and discloses a digital circuit wafer-oriented contact testing device, which comprises a probe card; a controllable power supply circuit framework and a contact test loop are integrated on the probe card; the controllable power supply circuit architecture is used for power supply multiplexing of various tested memory wafers, power supply switch adjustment under different working conditions and safety protection; and the contact test loop is used for detecting whether the probe on the probe card is connected with the signal of the tested memory wafer. The controllable power supply circuit architecture supports power supply multiplexing of multiple tested memory wafers, an independent power supply module does not need to be independently configured for each wafer or each test channel, the hardware layout of the test system is simplified, the overall building complexity is reduced, a contact test loop detects the signal connection state of a probe and the wafers in advance, and the test efficiency is improved. And misjudgment caused by poor contact such as installation deviation and inaccurate probe alignment can be directly eliminated, and a qualified wafer does not need to be misjudged as functional failure to be eliminated.

The application discloses a kind of non-contact test solar cell IV characteristic method, it is related to optical imaging technology, for improving the problem of inaccurate test and mechanical damage to solar cell caused by poor contact due to contact type test, including setting excitation light source and light energy capture device;Utilize light energy capture device to capture transition light energy and generate light energy image, obtain the pixel point brightness value fluctuation of light energy image and judge light energy capture effect, and select whether to reset for secondary capture;After light energy capture is completed, first, the transition light energy in the local area of solar cell is photoelectric conversion characterization, and the local IV space uniformity difference is obtained;Then, the whole IV of solar cell is characterized, and the comprehensive IV characteristic curve of the whole to-be-tested cell is obtained.

The invention relates to a device (1) for testing at least one electrical energy store (2), comprising at least one coupling device (3) and at least one testing device (4). The connection device (3) and the test device (4) can be connected via at least one charging line (5). The coupling device (3) has at least one first coupling element (6a) and at least one second coupling element (6b) for electrical contact with the energy store (2). The test device (4) has at least one test device (9) and at least one safety circuit (10), the energy store (2) being able to be charged and discharged by means of the test device (9) via the charging line (5) with a test current. The test device (9) has at least one first measurement channel (15) and at least one second measurement channel (16). The first measuring channel (15) has at least two measuring lines (15a, 15b) which are each connected to the charging line (5) at a test device-side location (18a, 18b). The second measuring channel (16) has at least two measuring lines (16a, 16b) which are each connected to the charging line (5) at a connection-device-side location (19a, 19b). An electrical connection between the connection device (3) and the test device (9) can be established or disconnected at the charging line (5) by means of a safety circuit (10). In this case, the test device (9) has at least one third measurement channel (17), the third measurement channel (17) having at least one first measurement line (17a) and at least one second measurement line (17b), and the first measurement line (17a) is connected to the charging line (5) at a connection device-side location (19c) and the second measurement line (17b) at a test device-side location (18b).

The embodiment of the invention provides a test structure and a test method, the test structure comprises a first comb-shaped structure, a snakelike structure and a second comb-shaped structure, and the first comb-shaped structure and the snakelike structure are not in contact with each other; the test structure is used for carrying out a metal interlayer dielectric layer test and an electromigration test, and the snakelike structure is used for carrying out the electromigration test; the first comb-shaped structure comprises a plurality of first metal wires which extend along a first direction and are arranged at intervals along a second direction, the snakelike structure comprises a plurality of second metal wires which extend along the first direction and are arranged at intervals along the second direction, and the second comb-shaped structure comprises a plurality of third metal wires which extend along the first direction and are arranged at intervals along the second direction; the plurality of first metal wires and the plurality of second metal wires are located on a first metal layer, the plurality of third metal wires are located on a second metal layer, and the first metal layer and the second metal layer are two adjacent metal layers; and one second metal wire is positioned between two adjacent first metal wires.

This application relates to a semiconductor module testing device, comprising a fixture plate for holding a semiconductor module, the fixture plate having an interface for connecting to the pins of various functional devices in the semiconductor module; a test box including a current source, a measurement unit, and a switch module, the switch module connecting the current source and the measurement unit, and also connecting to the interface of the fixture plate; the switch module, through switching, changes the connection relationship between the current source, the measurement unit, and the interface of the fixture plate, enabling the current source and the measurement unit to perform pin contact tests on various functional devices in the semiconductor module; and an insulation withstand voltage tester connected to the switch module, the switch module also changing the connection relationship between the insulation withstand voltage tester and the interface of the fixture plate, enabling the insulation withstand voltage tester to perform insulation tests on the semiconductor module. By simply switching the switch module, pin contact tests and insulation tests on the semiconductor module can be performed separately, improving testing efficiency.

The utility model discloses a semi-automatic electrical testing machine which comprises a rack, a transplanting mechanism and an electrical testing mechanism, a workbench is arranged in the rack, the transplanting mechanism is arranged on the workbench, a replaceable jig with a workpiece is arranged on the transplanting mechanism, the semi-automatic electrical testing machine can move at different stations and can adapt to workpieces of multiple specifications, the equipment acquisition cost is reduced, the universality is improved, and automatic circulation of electrical testing of the workpiece is achieved. The efficiency is improved. The electrical testing mechanism is arranged above the transplanting mechanism and comprises a vertical guide column, a top plate, a second linear driving mechanism and an electrical testing assembly, the guide column is used for accurate guiding, and the driving mechanism controls the electrical testing assembly to move downwards to make contact with the workpiece for testing. The jig has a specific layout, and a carrier block precisely limits a workpiece. The machine frame is provided with the touch display screen, the idler wheels and the base, the advantages of being convenient and fast to operate, flexible to move and stable in supporting are achieved, and various production requirements are met.

The utility model provides a rebound amount test system relates to material test field, and test system is used for measuring the product to be tested, and the product to be tested includes product bottom support, product support beam and product top support, and product support beam is located between product bottom support and product top support, and it includes: support mechanism, support mechanism is used for supporting the product to be tested, and the product to be tested is connected with support mechanism;Telescopic mechanism, telescopic mechanism is located above support mechanism, and telescopic mechanism can extrude or stretch product top support;Test mechanism, the detection end of test mechanism is in contact with product top support, and test mechanism can detect the displacement distance of product top support, and the test system of the utility model can effectively realize the rebound amount test of the pressure of " C character " type product, prevents the product from the non - intended deformation of the test process simultaneously, improves the accuracy of test result.

The utility model discloses an FPC line impedance automatic acquisition and determination intelligent device, and relates to the field of FPC line impedance testing. The FPC line impedance automatic acquisition and determination intelligent device comprises a test platform, a DC resistor, a test ammeter, a USB converter and a test sample. According to the intelligent device for automatically collecting and judging the FPC line impedance, the testing electric meter is in contact with the terminals of the testing sample, loop testing is carried out, a membrane switch is pressed, detection is carried out, the testing sample is placed between the fixing base and the clamping base, the testing sample is fixed, the testing electric meter is in contact with the corresponding terminals on the testing sample conveniently, and the testing efficiency is improved. The multi-point test can be conveniently carried out, and the situation that the single-point test efficiency is low can be effectively avoided.

The present application provides an interposer and a method for testing same, and a semiconductor structure. The interposer comprises a test region and a functional region. The interposer comprises an insulating layer and a conductive structure which are located in the test region and the functional region. The insulating layer comprises a plurality of insulating film layers and is provided with a plurality of holes, and each hole of the insulating layer comprises one sub-hole or at least two sub-holes. The conductive structure comprises a plurality of conductive portions and a plurality of rewiring layers; each sub-hole is internally provided with a conductive portion; a rewiring layer is provided between any two adjacent insulating film layers; each rewiring layer comprises a plurality of conductive wires and a plurality of conductive blocks; a conductive block is provided between two adjacent conductive portions in at least one hole, and each conductive wire is separately in contact with a conductive portion in at least one corresponding hole; at least one conductive wire and a plurality of conductive blocks are respectively provided in the test region and the functional region; a portion of the conductive structure located in the test region is insulated from a portion of the conductive structure located in the functional region; and the portion of the conductive structure located in the test region is used for testing whether there is a short circuit or an open circuit in the portion.

The application discloses a kind of flexible straight film capacitor test equipment, belongs to capacitor test related technical field, including workbench, test unit, mobile unit.Workbench includes platen, which is provided with busbar.Test unit includes trolley and the integrated test device being arranged on its car plate, its one side is provided with display screen and negative terminal, negative lead wire is connected with busbar, test machine is arranged in device and multiple switching switch connected with positive terminal, the both ends of core contact test pole piece and busbar respectively.Moving unit includes a pair of second linear mechanism, the output end between two third linear mechanisms is alternately assembled with multiple first clamping components and multiple second clamping components, and is used for clamping positive lead wire.The application can automatically detect the core that has been arranged before copper sheet is welded to core, so as to find and replace unqualified core in time, save the loading, arrangement, unloading time spent for testing each core separately.

The invention relates to a testing device which comprises a probe structure, a first probe and a second probe are arranged on the probe structure, the first probe is used for being in contact with a first testing point, the second probe is used for being in contact with a second testing point, and the first probe and the second probe are each of a telescopic linear structure. The first probe and the second probe are obliquely arranged close to each other on the probe structure; the control center is used for determining a target distance between the first test point and the second test point in the detection image according to the obtained detection image of the tested piece; and controlling the first probe and the second probe to perform telescopic motion according to the target distance. The mode that the probe is controlled to stretch out and draw back to make contact with the test point is used for replacing the mode that in the prior art, a mechanical arm is controlled to make the probe make contact with the test point. As the space volume of the probe is small, the probe can be better and accurately contacted with a test point in a narrow space and is not easy to interfere with other elements, and the test efficiency is greatly improved.

The application belongs to the field of mechanical parts vibration monitoring, and proposes a non-contact blade vibration test test bed. High-pressure airflow or magnet is used as excitation load to synchronously or asynchronously excite the blade, the blade tip distance can be freely adjusted, and the non-contact test of the blade vibration condition is realized through the optical fiber type sensor. Specifically, the motor drives the blade to rotate or the magnet sleeved on the bolt to realize synchronous excitation of the blade, the motor drives the nozzle to rotate, the nozzle sprays high-speed gas to realize synchronous excitation or asynchronous excitation of the blade, and the position of the rubbing block can be adjusted to realize the rubbing experiment of the blade. The device can conveniently realize synchronous excitation and asynchronous excitation of the blade disc device, and provide strong support for vibration characteristic test research and blade rubbing experiment research of the blade disc structure, and is convenient for vibration test of the aero-engine whole blade disc.

The invention relates to the technical field of testing devices, and discloses an electronic pen multi-angle calibration testing device which comprises a testing table. The limiting bearing mechanism is arranged on the test bench in a sliding manner and comprises at least one group of rotation driving pieces and limiting seats connected to the output ends of the rotation driving pieces; the pressure testing mechanism is erected above the limiting bearing mechanism and comprises a linear lifting assembly, at least one pressure adjusting assembly connected to the output end of the linear lifting assembly and a contact testing assembly; the supporting and adjusting mechanism is arranged below the test board and comprises a lifting and adjusting assembly and a supporting roller arranged at the output end of the lifting and adjusting assembly; after the limiting bearing mechanism adsorbs and loads the electronic pen and conducts angle adjustment, the supporting adjusting mechanism abuts against and supports the lower surface of the electronic pen, and after the contact testing assembly makes contact with the pressure adjusting assembly, the contact testing assembly presses the upper surface of the electronic pen to conduct multi-gear pressure calibration testing.

The utility model discloses a PCB (Printed Circuit Board) test fixture, which comprises a base provided with a test board used for placing a PCB; the conduction test assembly is arranged on the base and comprises a test probe, a first mobile station and a first driver, the test probe is fixed on the first mobile station and / or the base, the test probe is used for being in contact with a test point on the PCB, and the first driver is in transmission connection with the first mobile station; the interface testing assembly is arranged on the base and comprises a connector, a second moving table and a second driver, the connector is arranged on the second moving table, the second driver is in transmission connection with the second moving table, and the connector is used for being connected with an interface on the PCB; the base is provided with the conduction test assembly and the interface test assembly at the same time, and the conduction test assembly and the interface test assembly jointly complete conduction test and interface test on the test bench, so that the conduction test and the interface test are completed on the same equipment, and the test work completion efficiency of the PCB is greatly improved.

The utility model discloses a probe and a probe test mounting rack, and relates to the probe test technology field, the probe comprises a cylinder body, the bottom of the cylinder body is in threaded connection with an outer sleeve through a first nut, the outer sleeve is clamped with an inner sleeve, the probe is clamped in the inner sleeve, the upper part of the probe is provided with a spring, and the spring is connected with the inner sleeve. Contact testing is carried out on the probe and the to-be-tested point of the battery, when the applied pressure is within a normal range, the probe does not move, and when the stress of the probe is too large due to misoperation or other unforeseen circumstances, the probe is separated from the clamping part of the inner sleeve and moves upwards, and the bottom of the probe is retracted into the inner sleeve, so that the probe can be protected; according to the invention, damage is avoided, the to-be-detected point of the battery can be prevented from being damaged, the probe is pushed into the storage box for storage and protection, and the cleaning brush is arranged on the storage box, so that dust or impurities on the surface of the probe can be removed when the probe is fed into the storage box, and the probe is ensured to be clean.

The utility model provides a chip contact test device. The chip contact test device comprises a probe support and a test probe arranged on the probe support. Wherein the metal bump of the to-be-detected chip comprises a supporting column and a solder cap located at the end part of the supporting column; the test probe comprises at least two probe clamping jaws and memory metal pieces arranged on the probe clamping jaws; moreover, in an initial state, the probe clamping jaw is in an open state, and the size of the open end clamped by the probe is larger than the size of the solder cap. Under a preset condition, the memory metal piece contracts and drives the probe clamping jaw to be in contact conduction with the supporting column, and signal transmission between the to-be-detected chip and the test probe is achieved through the supporting column. According to the utility model, the related test of the chip can be completed under the condition that the solder cap is not damaged.

The utility model discloses a testing device for a high-temperature bias test, which relates to the technical field of product testing and comprises a base and an electric contact testing plate, the electric contact testing plate is fixedly connected to the top end of the base, and a semiconductor device is placed at the top end of the electric contact testing plate. According to the utility model, the adjusting block moves on the outer side of the adjusting frame and the telescopic rod moves in the adjusting rod, so that the transverse and longitudinal adjustment of the pressing area of the bottom pressing block is realized, different use requirements are met, the pressing block is further contacted with the semiconductor device, and a four-point fixing mode is adopted. The overall limiting and fixing effect can be guaranteed while the contact area is reduced, the adjusting frame is further driven to move downwards through the action of the spring, namely, the pressing block is driven to press downwards for fixing, semiconductor devices of different thicknesses can be used, operation is easy, use is convenient and fast, multi-direction adjustment use can be conducted, and the fixing requirements of chips of different models and sizes can be met.

The embodiment of the invention provides a half-cut battery piece testing and sorting method and device. The method comprises the following steps: testing a whole battery piece, and decomposing test data into at least one piece of quasi-semi-cut battery piece test data; performing non-contact test on the cut half-cut battery piece based on the test data of the standard battery piece and the quasi half-cut battery piece to generate first non-contact test data; carrying out edge passivation deposition on the battery piece; based on the test data of the standard battery piece and the quasi-half-cut battery piece, performing non-contact test on the half-cut battery piece after edge passivation deposition to generate second non-contact test data; and according to the difference between the first non-contact test data and the second non-contact test data, determining the efficiency improving data of the half-cut battery piece after edge passivation deposition. According to the technical scheme provided by the embodiment of the invention, non-contact testing is carried out on the half-cut battery piece before and after edge passivation deposition, and damage to the half-cut battery piece is avoided.

An analyte detection apparatus is disclosed and configured for testing a substance for the presence or absence of at least one target analyte. In at least one embodiment, a housing provides a mixing chamber and a testing chamber in selective fluid communication with the mixing chamber. During use of the apparatus, a volume of the substance is collected via a collection scoop and introduced into the mixing chamber where it is mixed with a delivery fluid within the mixing chamber. An end cap is engaged with the housing in order to seal the mixing chamber, and a mixing valve is moved into an open position, allowing the substance to travel into the testing chamber and come into contact with a test medium, with a resulting visual indication from the test medium being viewable via a result window.

The utility model discloses a gold thread testing mechanism, which relates to the field of photovoltaic equipment and comprises a base, a lower frame and an upper frame, the lower end of the lower frame and the upper end of the base are fixedly connected with the lower frame, the upper frame is fixedly connected to the upper end of the base through a support, and first sliding grooves are formed in the left side and the right side of the base in a penetrating mode. A first sliding groove is formed in the base, a plurality of evenly-distributed fixing supporting columns are connected into the first sliding groove in a sliding mode, one end of each fixing supporting column is fixedly connected with a spring, the other end of each spring is fixedly connected with a double-ring hook, and a testing gold wire is fixedly connected between every two double-ring hooks. Compared with the prior art, the contact area is increased, the contact resistance is reduced, the test data is more accurate and reliable, meanwhile, the gold thread is more wear-resistant compared with a traditional probe, and the requirement for frequent replacement is reduced, so that the maintenance cost and the downtime are reduced, and the overall service life of equipment is prolonged.

An electric contact test equipment cabinet disclosed by the present invention comprises a cabinet body, a moving assembly is arranged on the cabinet body, the moving assembly comprises a motor, a threaded rod, a moving frame, a guide rail and an air cylinder, the motor is fixedly installed on the cabinet body, the threaded rod is connected to the output end of the motor, the moving frame is in threaded connection to the threaded rod, and the guide rail is connected to the air cylinder. The guide rail is arranged on the cabinet body, the moving frame is connected to the guide rail in a sliding mode, the air cylinder is fixedly installed at the top of the cabinet body, a fixing assembly is arranged on the moving frame, the fixing assembly comprises fixing rods, first springs and a fixing plate, the fixing rods are arranged at the four corners of the moving frame, the number of the fixing rods is four, and the first springs are arranged on the fixing plates. Every two fixing rods form a group, the fixing rods are sleeved with the first springs, and the fixing plates are connected to the fixing rods in a sliding mode so that the technical problem that in the background technology, the degree of freedom of adjustment of an existing equipment cabinet is low can be solved.

The invention is suitable for the technical field of dynamic mechanical performance testing, and provides a non-contact test bench device, which comprises a base plate; the bedplate is fixed on the base plate through a connecting box; the disc is arranged on the bedplate, can rotate and is used for switching two groups of rotating parts to be tested; the mounting frame is fixed on the bedplate, a driving part used for adjusting lifting is arranged on the mounting frame, and the output end of the driving part is connected with an assembling plate; and the detection assembly comprises a fixing frame, a torque sensor and a processing module. According to the non-contact test bench device provided by the scheme, the torque of the rotating part to be tested is detected in a non-contact manner through the torque sensor of the detection assembly, so that the interference on the operation of the motor caused by direct contact is avoided.

Provided in the present application are a camera lens assembly method and a camera lens. In the camera lens assembly method, coarse positioning of a first group and a second group is performed on the basis of visual inspection and non-contact testing, and during the coarse positioning, the first group and the second group are relatively independent of each other, and are not in contact connection or adhesive connection, thereby simplifying the assembly steps of a camera lens; in addition, the method provides a basis for subsequent AA adjustment, and if the AA adjustment fails, one of the groups may be replaced in time and the AA adjustment may then be performed again, thereby improving the assembly yield and material utilization efficiency of camera lenses.

A wearable test system for monitoring an electrostatic voltage in real time, comprising: a test probe (40), which is disposed inside an outer frame structure and is used for testing an electrostatic voltage at a lower shielding metal plate (30) and converting the electrostatic voltage from a direct current to an alternating current or other electric signal; and a test system (50), which is allowed to obtain the alternating current or other electric signal released by the test probe (40), calibrate the voltage value of the alternating current or other electric signal, and display the same. By being in direct contact with an object / human body under test, the lower shielding metal plate (30) also carries the same electrostatic voltage. The test probe (40) converts the electrostatic voltage into the alternating current or other electric signal, and a central processing unit controls a data acquisition circuit to convert an analog signal of a signal processing circuit into a digital signal, processes and analyzes the digital signal, and then uploads same or gives an alarm, so as to form a whole set of test system, testing in real time the electrostatic voltage of the object / human body under test.

A device comprising a chamber 201 for receiving a liquid sample, comprising an opening and transparent side walls 216; a cover sealing the opening; and a carrier 30 with a groove (Fig. 3, 301), wherein a test strip 50 is held in the groove by a tubular structure (Fig. 3, 302). A cover plate (Fig. 3, 303) may cover an opening part of the groove facing side walls of the chamber, which may be enclosed by a bottom surface and two sides. The cover may comprise a hole connected to the carrier through which the test strip may be inserted into the groove, passing through the tubular structure. The cover may have a label (Fig. 4, 106) indicating an inclination direction, such that the sample contacts the test strip when the container is inclined accordingly. The groove may comprise one or more holes (Fig. 3, 306) allowing the sample to flow into the groove and contact testing areas of the strip. The carrier may be fixed to the cover. The tubular structure may be adjacent to the cover. An opaque label 210 may cover a bottom of the chamber and mark maximum and minimum liquid levels 209. A method for testing an analyte in a liquid sample using the device.