60 results about "Contact test" patented technology

The utility model relates to the technical field of battery testing, in particular to a main-grid-free battery testing device which comprises a testing base, the testing base comprises an elastic base station capable of elastically deforming, and the upper surface of the elastic base station is of a three-dimensional curved surface structure which is arched upwards in the direction from the periphery to the middle of the elastic base station. A plurality of contact test points used for forming ohmic contact with fine grid lines on a battery to be tested are arranged on the elastic base table, a flexible pressing and fixing mechanism capable of ascending and descending relative to the thickness direction of the test base is further arranged above the test base, and the flexible pressing and fixing mechanism comprises a pressing and fixing wire net. The pressing and fixing wire net comprises a plurality of first pressing wires parallel to one another and a plurality of second pressing wires parallel to one another, and the first pressing wires and the second pressing wires are arranged in a crossed mode to form a net structure. According to the testing device, the to-be-tested battery does not shake or displace when being pressed, the stress is more uniform, the thin grid lines at all positions can be in stable contact with the contact testing points, and the reliability of a detection result is ensured.

This invention discloses a method for manufacturing anti-slip children's shoes, relating to the field of anti-slip children's shoe production technology. The manufacturing process comprises a testing platform, a dynamic abrasive unit, a segmented control contact mechanism, and an asynchronous linkage mechanism. The dynamic abrasive unit automatically adjusts and changes the coefficient of friction during abrasion resistance testing. A shoe sole block is mounted on the right side of the trigger component. A cooperating unit works with the trigger component to move the shoe sole block, pushing against the foot area of ​​the shoe sole to contact the dynamic abrasive unit for testing. This invention uses a segmented control contact mechanism to bend the anti-slip children's shoe into three sections, allowing for separate testing of the forefoot, midfoot, and heel areas of the sole, providing more detailed wear data. Furthermore, by simulating the actual wear under heel-first and forefoot-first gait conditions through reciprocating oscillation, the invention improves the accuracy, representativeness, and data quality of the test, making the test results more practically meaningful.

The application discloses a method for non-contact testing of quantum efficiency (EQE) and short-circuit current (ISC) of a solar cell, relates to the technical field of photovoltaic device testing, and aims to solve the problems that the existing quantum efficiency and short-circuit current measurement must contact electrodes, is slow and cannot cover new gateless or process pieces; a non-contact testing method of "multi-wavelength LED excitation + local shielding + carrier lateral diffusion" is provided; the method blocks the excitation light by using a shielding filter, and only transmits the electroluminescence signal of the shielding area; the EL power of each wavelength is extracted through phase-locked amplification and deep learning denoising, the continuous EQE curve is calculated by using the calibrated incident photon flux ratio, and the ISC is obtained by convolution of the AM1.5 spectrum.

1. The name of the design product: non-contact test pen. 2. The use of the design product: for non-contact detection of whether the measured object has AC voltage, with lighting function. 3. The design points of the design product: in shape. 4. The picture or photo that best indicates the design points: perspective view 1.

The application discloses a kind of non-contact test solar cell IV characteristic method, it is related to optical imaging technology, for improving the problem of inaccurate test and mechanical damage to solar cell caused by poor contact due to contact type test, including setting excitation light source and light energy capture device;Utilize light energy capture device to capture transition light energy and generate light energy image, obtain the pixel point brightness value fluctuation of light energy image and judge light energy capture effect, and select whether to reset for secondary capture;After light energy capture is completed, first, the transition light energy in the local area of solar cell is photoelectric conversion characterization, and the local IV space uniformity difference is obtained;Then, the whole IV of solar cell is characterized, and the comprehensive IV characteristic curve of the whole to-be-tested cell is obtained.

The invention relates to a device (1) for testing at least one electrical energy store (2), comprising at least one coupling device (3) and at least one testing device (4). The connection device (3) and the test device (4) can be connected via at least one charging line (5). The coupling device (3) has at least one first coupling element (6a) and at least one second coupling element (6b) for electrical contact with the energy store (2). The test device (4) has at least one test device (9) and at least one safety circuit (10), the energy store (2) being able to be charged and discharged by means of the test device (9) via the charging line (5) with a test current. The test device (9) has at least one first measurement channel (15) and at least one second measurement channel (16). The first measuring channel (15) has at least two measuring lines (15a, 15b) which are each connected to the charging line (5) at a test device-side location (18a, 18b). The second measuring channel (16) has at least two measuring lines (16a, 16b) which are each connected to the charging line (5) at a connection-device-side location (19a, 19b). An electrical connection between the connection device (3) and the test device (9) can be established or disconnected at the charging line (5) by means of a safety circuit (10). In this case, the test device (9) has at least one third measurement channel (17), the third measurement channel (17) having at least one first measurement line (17a) and at least one second measurement line (17b), and the first measurement line (17a) is connected to the charging line (5) at a connection device-side location (19c) and the second measurement line (17b) at a test device-side location (18b).

This application relates to a semiconductor module testing device, comprising a fixture plate for holding a semiconductor module, the fixture plate having an interface for connecting to the pins of various functional devices in the semiconductor module; a test box including a current source, a measurement unit, and a switch module, the switch module connecting the current source and the measurement unit, and also connecting to the interface of the fixture plate; the switch module, through switching, changes the connection relationship between the current source, the measurement unit, and the interface of the fixture plate, enabling the current source and the measurement unit to perform pin contact tests on various functional devices in the semiconductor module; and an insulation withstand voltage tester connected to the switch module, the switch module also changing the connection relationship between the insulation withstand voltage tester and the interface of the fixture plate, enabling the insulation withstand voltage tester to perform insulation tests on the semiconductor module. By simply switching the switch module, pin contact tests and insulation tests on the semiconductor module can be performed separately, improving testing efficiency.

The utility model discloses a semi-automatic electrical testing machine which comprises a rack, a transplanting mechanism and an electrical testing mechanism, a workbench is arranged in the rack, the transplanting mechanism is arranged on the workbench, a replaceable jig with a workpiece is arranged on the transplanting mechanism, the semi-automatic electrical testing machine can move at different stations and can adapt to workpieces of multiple specifications, the equipment acquisition cost is reduced, the universality is improved, and automatic circulation of electrical testing of the workpiece is achieved. The efficiency is improved. The electrical testing mechanism is arranged above the transplanting mechanism and comprises a vertical guide column, a top plate, a second linear driving mechanism and an electrical testing assembly, the guide column is used for accurate guiding, and the driving mechanism controls the electrical testing assembly to move downwards to make contact with the workpiece for testing. The jig has a specific layout, and a carrier block precisely limits a workpiece. The machine frame is provided with the touch display screen, the idler wheels and the base, the advantages of being convenient and fast to operate, flexible to move and stable in supporting are achieved, and various production requirements are met.

The utility model provides a rebound amount test system relates to material test field, and test system is used for measuring the product to be tested, and the product to be tested includes product bottom support, product support beam and product top support, and product support beam is located between product bottom support and product top support, and it includes: support mechanism, support mechanism is used for supporting the product to be tested, and the product to be tested is connected with support mechanism;Telescopic mechanism, telescopic mechanism is located above support mechanism, and telescopic mechanism can extrude or stretch product top support;Test mechanism, the detection end of test mechanism is in contact with product top support, and test mechanism can detect the displacement distance of product top support, and the test system of the utility model can effectively realize the rebound amount test of the pressure of " C character " type product, prevents the product from the non - intended deformation of the test process simultaneously, improves the accuracy of test result.

The application discloses a kind of flexible straight film capacitor test equipment, belongs to capacitor test related technical field, including workbench, test unit, mobile unit.Workbench includes platen, which is provided with busbar.Test unit includes trolley and the integrated test device being arranged on its car plate, its one side is provided with display screen and negative terminal, negative lead wire is connected with busbar, test machine is arranged in device and multiple switching switch connected with positive terminal, the both ends of core contact test pole piece and busbar respectively.Moving unit includes a pair of second linear mechanism, the output end between two third linear mechanisms is alternately assembled with multiple first clamping components and multiple second clamping components, and is used for clamping positive lead wire.The application can automatically detect the core that has been arranged before copper sheet is welded to core, so as to find and replace unqualified core in time, save the loading, arrangement, unloading time spent for testing each core separately.

The invention relates to a testing device which comprises a probe structure, a first probe and a second probe are arranged on the probe structure, the first probe is used for being in contact with a first testing point, the second probe is used for being in contact with a second testing point, and the first probe and the second probe are each of a telescopic linear structure. The first probe and the second probe are obliquely arranged close to each other on the probe structure; the control center is used for determining a target distance between the first test point and the second test point in the detection image according to the obtained detection image of the tested piece; and controlling the first probe and the second probe to perform telescopic motion according to the target distance. The mode that the probe is controlled to stretch out and draw back to make contact with the test point is used for replacing the mode that in the prior art, a mechanical arm is controlled to make the probe make contact with the test point. As the space volume of the probe is small, the probe can be better and accurately contacted with a test point in a narrow space and is not easy to interfere with other elements, and the test efficiency is greatly improved.

The application belongs to the field of mechanical parts vibration monitoring, and proposes a non-contact blade vibration test test bed. High-pressure airflow or magnet is used as excitation load to synchronously or asynchronously excite the blade, the blade tip distance can be freely adjusted, and the non-contact test of the blade vibration condition is realized through the optical fiber type sensor. Specifically, the motor drives the blade to rotate or the magnet sleeved on the bolt to realize synchronous excitation of the blade, the motor drives the nozzle to rotate, the nozzle sprays high-speed gas to realize synchronous excitation or asynchronous excitation of the blade, and the position of the rubbing block can be adjusted to realize the rubbing experiment of the blade. The device can conveniently realize synchronous excitation and asynchronous excitation of the blade disc device, and provide strong support for vibration characteristic test research and blade rubbing experiment research of the blade disc structure, and is convenient for vibration test of the aero-engine whole blade disc.

The invention relates to the technical field of testing devices, and discloses an electronic pen multi-angle calibration testing device which comprises a testing table. The limiting bearing mechanism is arranged on the test bench in a sliding manner and comprises at least one group of rotation driving pieces and limiting seats connected to the output ends of the rotation driving pieces; the pressure testing mechanism is erected above the limiting bearing mechanism and comprises a linear lifting assembly, at least one pressure adjusting assembly connected to the output end of the linear lifting assembly and a contact testing assembly; the supporting and adjusting mechanism is arranged below the test board and comprises a lifting and adjusting assembly and a supporting roller arranged at the output end of the lifting and adjusting assembly; after the limiting bearing mechanism adsorbs and loads the electronic pen and conducts angle adjustment, the supporting adjusting mechanism abuts against and supports the lower surface of the electronic pen, and after the contact testing assembly makes contact with the pressure adjusting assembly, the contact testing assembly presses the upper surface of the electronic pen to conduct multi-gear pressure calibration testing.

The utility model discloses a PCB (Printed Circuit Board) test fixture, which comprises a base provided with a test board used for placing a PCB; the conduction test assembly is arranged on the base and comprises a test probe, a first mobile station and a first driver, the test probe is fixed on the first mobile station and / or the base, the test probe is used for being in contact with a test point on the PCB, and the first driver is in transmission connection with the first mobile station; the interface testing assembly is arranged on the base and comprises a connector, a second moving table and a second driver, the connector is arranged on the second moving table, the second driver is in transmission connection with the second moving table, and the connector is used for being connected with an interface on the PCB; the base is provided with the conduction test assembly and the interface test assembly at the same time, and the conduction test assembly and the interface test assembly jointly complete conduction test and interface test on the test bench, so that the conduction test and the interface test are completed on the same equipment, and the test work completion efficiency of the PCB is greatly improved.

The utility model discloses a testing device for a high-temperature bias test, which relates to the technical field of product testing and comprises a base and an electric contact testing plate, the electric contact testing plate is fixedly connected to the top end of the base, and a semiconductor device is placed at the top end of the electric contact testing plate. According to the utility model, the adjusting block moves on the outer side of the adjusting frame and the telescopic rod moves in the adjusting rod, so that the transverse and longitudinal adjustment of the pressing area of the bottom pressing block is realized, different use requirements are met, the pressing block is further contacted with the semiconductor device, and a four-point fixing mode is adopted. The overall limiting and fixing effect can be guaranteed while the contact area is reduced, the adjusting frame is further driven to move downwards through the action of the spring, namely, the pressing block is driven to press downwards for fixing, semiconductor devices of different thicknesses can be used, operation is easy, use is convenient and fast, multi-direction adjustment use can be conducted, and the fixing requirements of chips of different models and sizes can be met.

The embodiment of the invention provides a half-cut battery piece testing and sorting method and device. The method comprises the following steps: testing a whole battery piece, and decomposing test data into at least one piece of quasi-semi-cut battery piece test data; performing non-contact test on the cut half-cut battery piece based on the test data of the standard battery piece and the quasi half-cut battery piece to generate first non-contact test data; carrying out edge passivation deposition on the battery piece; based on the test data of the standard battery piece and the quasi-half-cut battery piece, performing non-contact test on the half-cut battery piece after edge passivation deposition to generate second non-contact test data; and according to the difference between the first non-contact test data and the second non-contact test data, determining the efficiency improving data of the half-cut battery piece after edge passivation deposition. According to the technical scheme provided by the embodiment of the invention, non-contact testing is carried out on the half-cut battery piece before and after edge passivation deposition, and damage to the half-cut battery piece is avoided.

An electric contact test equipment cabinet disclosed by the present invention comprises a cabinet body, a moving assembly is arranged on the cabinet body, the moving assembly comprises a motor, a threaded rod, a moving frame, a guide rail and an air cylinder, the motor is fixedly installed on the cabinet body, the threaded rod is connected to the output end of the motor, the moving frame is in threaded connection to the threaded rod, and the guide rail is connected to the air cylinder. The guide rail is arranged on the cabinet body, the moving frame is connected to the guide rail in a sliding mode, the air cylinder is fixedly installed at the top of the cabinet body, a fixing assembly is arranged on the moving frame, the fixing assembly comprises fixing rods, first springs and a fixing plate, the fixing rods are arranged at the four corners of the moving frame, the number of the fixing rods is four, and the first springs are arranged on the fixing plates. Every two fixing rods form a group, the fixing rods are sleeved with the first springs, and the fixing plates are connected to the fixing rods in a sliding mode so that the technical problem that in the background technology, the degree of freedom of adjustment of an existing equipment cabinet is low can be solved.

Provided in the present application are a camera lens assembly method and a camera lens. In the camera lens assembly method, coarse positioning of a first group and a second group is performed on the basis of visual inspection and non-contact testing, and during the coarse positioning, the first group and the second group are relatively independent of each other, and are not in contact connection or adhesive connection, thereby simplifying the assembly steps of a camera lens; in addition, the method provides a basis for subsequent AA adjustment, and if the AA adjustment fails, one of the groups may be replaced in time and the AA adjustment may then be performed again, thereby improving the assembly yield and material utilization efficiency of camera lenses.

The utility model discloses a full-function test platform, which is applied to the detection of a PCBA (Printed Circuit Board Assembly) mainboard, and comprises a test frame machine table which is provided with a mainboard fixing table; the vertical socket connecting device is arranged on the test frame machine table and is used for moving in the vertical direction to carry out interface contact test on the PCBA main board; the transverse socket connecting device is arranged on the test frame machine table and is used for moving in the horizontal direction to test an external socket of the PCBA main board; and the monitoring electric meter is electrically connected with the vertical socket connecting device and the transverse socket connecting device and is used for acquiring test data of the PCBA mainboard. According to the full-function test platform provided by the utility model, through the vertical socket connecting device and the transverse socket connecting device, the purpose of comprehensively and automatically testing the PCBA mainboard is realized.

The utility model is suitable for the technical field of electronic testing, and provides a traceless needle insertion testing device for a flexible board B2B. The traceless needle insertion testing device for the flexible board B2B comprises a first needle mold, a second needle mold and a third needle mold, wherein the first needle mold is provided with a station for placing the flexible board; the second needle die is arranged at the bottom of the first needle die and is in floating connection with the first needle die; a support column; the third needle die is connected with the second needle die through the supporting column; the long probe is limited in the third probe die and is used for being in contact with a test point on the flexible plate; and the buffer module is arranged at the bottom of the third probe die and is used for switching over signals of the long probes and relieving probe insertion impact. According to the utility model, by arranging the buffer module, different acupuncture elastic forces can be provided for different acupuncture areas of a product, and buffer and impact elimination can be realized.

The invention relates to the technical field of material and structure testing, in particular to a seat testing method and system combining a high and low temperature environment chamber and a robot, and the method comprises the steps: controlling the robot to execute a non-contact approaching action and a contact testing action, and collecting the joint operation data of the robot; according to joint operation data in a non-contact approaching action stage, a viscous resistance coefficient sequence is determined, and an internal friction power threshold model changing along with accumulated shearing duration is constructed; determining a current internal friction power threshold value according to the internal friction power threshold value model, the current accumulated shearing duration and the current joint rotating speed in the stage that the robot executes the contact test action; determining external contact power according to the joint operation data in the contact test action stage and the current internal friction power threshold; and determining a seat reaction force according to the external contact power, and controlling the robot to test the seat based on the seat reaction force. According to the invention, the seat can be accurately and reliably tested under a harsh temperature condition.

The utility model relates to a semi -automatic probe contact test machine belongs to chip production test technical field, in order to solve the effective contact area between probe end and chip pad in long -term continuous use process is reduced significantly, the contact resistance between both is increased sharply and stability is poor, forms local concentrated heating, leads to the problem that the precision circuit, metal connection and semiconductor structure in chip interior are damaged by heat, the invention includes test platform and the mobile piece of installation in test platform one side, one side of mobile piece is provided with buffer seat, and the probe platform is installed in one side of buffer seat, the utility model is through setting up memory alloy in the electrically conductive cylinder, utilizes the characteristics that probe wear leads to contact resistance increase, local concentrated heating, makes memory alloy heat phase change and pulls the probe automatic retraction, and the contact of probe and chip pad is disconnected quickly, avoids the chip internal circuit and melts pad from high temperature burnout fundamentally, significantly improves the safety and reliability of chip test process.

The invention discloses a non-feedback motor-oriented chip pin alignment contact test device and method in the technical field of electromagnetic compatibility. Comprising a probe, a chip to be tested and a binocular camera, a plurality of pins are sequentially arranged on the chip to be tested, the binocular camera is used for collecting images, an upper computer calculates the three-dimensional coordinate position of each pin and the initial coordinate position of a calibration point based on the images and sends a test instruction to a main control board, and a non-feedback motor is driven to drive the probe to complete the alignment contact test of the first pin. When the test succeeds, sequentially executing the following steps for the remaining pins: acquiring a calibration point image, calculating deviation information, and when the deviation information is greater than a preset minimum deviation threshold value, generating a correction instruction and a test instruction to complete the alignment contact test of the jth pin; and when the deviation information is smaller than or equal to the minimum deviation threshold value, only the test instruction is sent. According to the invention, the test probe is automatically driven to be aligned and contacted with the pin, the deviation is corrected in real time, and the problems of low alignment efficiency and low precision of the pin and the test probe are solved.

The application discloses a contact testing device for liquid crystal display screens, which comprises a backlight box body, a placing panel arranged on the backlight box body, fixing seats arranged on the two sides of the placing panel, a second shielding plate arranged on the top of the placing panel, a first shielding plate slidingly arranged on the side of the fixing seat opposite to the placing panel, the fixing seat being fixedly connected with the backlight box body, the second shielding plate being slidingly connected with the first shielding plate, the end of the first shielding plate close to the second shielding plate being provided with a transmission assembly, the transmission assembly being in transmission cooperation with the second shielding plate, and the first shielding plate being slid towards the display screen when the display screen is placed in the groove, so that the first shielding plate is attached to the side edge of the display screen, in the process, the first shielding plate drives the second shielding plate to move downwards and be attached to the top of the display screen through the transmission assembly, so that the interval between the display screen and the groove is blocked, and the strong light is prevented from being shot to the outside through the interval.

The application discloses the technical field of sensor calibration, and relates to an optical microphone test platform, a test system, a directivity test method, a non-contact frequency response test method, a minimum offset test method and a contact frequency response test method. The optical microphone test platform comprises a non-contact test platform and a contact test platform. The non-contact test platform comprises a test bench, a three-dimensional support, a rotating platform, a lifting platform, a first microphone fixing device and a reference sensor fixing device. The contact test platform comprises a test support, a test block, an optical microphone fixing support and a sound emitter fixing support. The optical microphone test platform and the test system can simultaneously complete non-contact test and contact test of a measured optical microphone, including directivity test, non-contact frequency response test, minimum offset test and contact frequency response test, and the measured product can be conveniently replaced for repeated test.

The utility model discloses a multi-union test strip inspection container stably placed and used, which comprises an inspection box body, a cover plate is arranged on the top surface of the inspection box body, the height of the inspection box body is smaller than the width of the inspection box body, a support frame is arranged on the peripheral side of the bottom surface of the inspection box body, and a plurality of short support blocks are fixedly connected between the support frame and the side wall of the bottom surface of the inspection box body. The top surface of the inspection box body is of an opening structure, a short square sleeve is fixedly connected to one side of the bottom surface of the cover plate, an inspection frame assembly is arranged on the short square sleeve, and an outer square sleeve is fixedly connected to one side, close to the short square sleeve, of the inner bottom surface of the cover plate; the test box body adopts a flat structure, the contact area of the bottom and a table top is large, the supporting frame is additionally arranged at the bottom to further increase the supporting area, the test box is not prone to toppling over under external force during use, and the liquid bin is used for containing detection liquid, so that the detection liquid can be concentrated on the side portion of the liquid bin to make contact with test paper when the handle is slightly pulled high. Normal detection is not affected, and the method is more practical.

The utility model provides a test fixture and test equipment suitable for a semiconductor module with a symmetrical shape. The test fixture comprises a test substrate, a test assembly and an auxiliary test assembly. A test circuit and an auxiliary function layer used for triggering the test circuit to be turned off are integrated in the test substrate. The test assembly and the auxiliary test assembly are both connected to the test substrate and are electrically isolated from each other. The test assembly includes a plurality of test probes connected to the test circuit. The plurality of test probes are arranged corresponding to a plurality of pins of the semiconductor module. The auxiliary test assembly is electrically connected with the auxiliary function layer. And when the semiconductor module is positively arranged, each pin is in contact with the corresponding test probe, and the test circuit is conducted. When the semiconductor module is reversely arranged, at least one pin is in contact with the test assembly, and the test circuit is disconnected. The testing jig can automatically stop testing when the semiconductor module is reversely arranged, testing errors or testing accidents caused by reverse connection are avoided, the testing cost can be reduced, and the testing efficiency can be improved.

The utility model discloses a non-contact testing device for testing the high-temperature performance of a wire rod, which comprises an environment box and a mounting rod, the mounting rod is arranged at the front part of a box door of the environment box, quartz glass is embedded in the center of the box door of the environment box, two fixing frames are arranged outside the mounting rod, and the fixing frames are fixed on the mounting rod. An adjustable adjusting frame is connected between the two fixing frames, a video extensometer and a green light source are arranged on the adjusting frame, the green light source is arranged on the side edge of the front portion of the video extensometer, an upper chuck and a lower chuck are connected to the upper position and the lower position in the environment box through sleeves respectively, and the upper chuck and the lower chuck are symmetrically arranged. Conical cavities are formed in the upper chuck and the lower chuck, and two wedge blocks are symmetrically embedded in the conical cavities; according to the testing device for non-contact testing of the high-temperature performance of the wire rod, the probability of jaw breaking, slipping and the like in the stretching process of the wire rod can be greatly reduced.

The utility model relates to the technical field of pole testing devices, in particular to a pole welding spot testing device. Comprising a machine base, two stand columns are symmetrically arranged above the machine base, a thrust piece is arranged between the tops of the two stand columns, and a placing table is arranged on the machine base and located between the two stand columns; the two sides of the combined testing head are connected with the stand columns in a sliding mode, the upper portion of the combined testing head is connected with the thrust piece, and the combined testing head is driven by the thrust piece to make contact with the pole columns on the placing table downwards; the combined testing head can be stably pushed to be in contact with the end part of the pole through the thrust piece, the welding strength of a welding spot is tested, the whole operation is stable, and the tool bit is prevented from being damaged.

A wafer bonding interface resistivity monitoring device disclosed by the present invention comprises a test function module, the test function module comprises a sample placing platform and a non-contact test device, the sample placing platform is used for placing a test sample, and the test sample is a first sample, a second sample, or a whole piece of sample after bonding of the first sample and the second sample. The non-contact test equipment comprises a probe, the probe and the test sample are spaced by a certain distance, a first resistivity corresponding to the first sample, a second resistivity corresponding to the second sample and a third resistivity corresponding to a whole sample formed by bonding the first sample and the second sample are sequentially obtained based on the non-contact test equipment, and then the interface resistivity is obtained. According to the method, the electrode preparation link can be thoroughly eliminated, sample damage and interface characteristic distortion are avoided, the measurement is ensured to reflect the original bonding state, meanwhile, the wide bandgap material test bottleneck can be overcome, and the universality and precision of interface resistivity measurement are improved.