349results about "Radiofrequency circuit testing" patented technology

The invention discloses a radio frequency on-chip test system and a radio frequency on-chip test method. The radio frequency on-chip test system comprises a probe temperature adjusting module, an instantaneous pulse acquisition module, a dynamic compensation module, a thermal isolation module, radio frequency measurement equipment and a bearing platform. Wherein the probe temperature adjusting module is used for independently adjusting the temperature of a probe to a target value; the instantaneous pulse acquisition module is used for transmitting a radio frequency pulse signal and acquiring a radio frequency parameter when the probe is in contact with the normal temperature calibration sheet; the dynamic compensation module dynamically corrects the radio frequency parameters based on the real-time temperature of the probe; the thermal isolation module is used for reducing heat exchange between the probe and the external environment; the radio frequency measuring equipment is used for collecting and analyzing the radio frequency parameters; the bearing platform is used for bearing the normal temperature calibration sheet or the device to be tested. Through the synergistic effect of multiple modules, the problem of test errors caused by temperature fluctuation is effectively solved, and the precision and stability of radio frequency on-chip test are remarkably improved.

A measurement system includes a signal analysis circuit, a signal generator circuit, a control circuit, and a DUT connector. The DUT connector is connectable to a device under test for receiving a measurement signal outputted by the DUT. The signal analysis circuit is connected to the DUT connector for receiving the measurement signal. The signal generator circuit is configured to generate a radio frequency (RF) test signal that is transmitted to the DUT. The signal analysis circuit is configured to digitize the measurement signal, thereby obtaining a digitized measurement signal. The control circuit is configured to control the signal generator circuit to generate the RF test signal based on the digitized measurement signal, based on known error parameters of an error model of the measurement system, and based on a desired reflection coefficient at a reference plane associated with the DUT.

The invention provides a microwave superheterodyne frequency sweep measurement system based on Rydberg atoms, and belongs to the technical field of microwave frequency measurement. The laser module excites detection light of 780 nm and coupling light of 480 nm, and the two beams of light are reversely input into the atomic gas chamber through the dichroscope; signal microwaves are generated by a radio frequency signal source and are radiated to the position of the atomic gas chamber through the horn antenna; local oscillation microwaves are generated by the microwave module and are also radiated to the position of the atomic gas chamber through the horn antenna; the atomic gas chamber serves as a mixer to form a difference frequency signal; the spectrum analyzer is used for monitoring low-frequency difference frequency signals generated in the frequency mixing process in real time and recording signal intensity in real time. According to the invention, high-precision and wide-band microwave frequency measurement is realized, continuous and smooth frequency sweeping response can be provided in a frequency range, and absolute frequency detection of microwave signals is realized under the condition that a complex frequency comb technology is not introduced. The hardware architecture is simplified, the automation degree is improved, and integration, popularization and application are facilitated.

A system comprises a signal generator circuit configured to generate a modulated radio frequency (RF) signal based on a predefined waveform. An output signal path is connected to the signal generator circuit and is connectable to a device under test. A first signal path is connected to the signal generator circuit so as to receive a reference signal corresponding to the modulated RF signal. A second signal path is connectable to the device under test so as to receive a measurement signal from the device under test. A analysis signal path is connected to the first and second signal paths for merging the reference signal and the measurement signal into an analysis signal. A signal analysis circuit is configured to separate the reference signal from the measurement signal for analyzing the analysis signal based on the predefined waveform.

Example automatic test equipment (ATE) includes a transmitter to output a waveform to a transmission line; circuitry to detect data for the waveform on the transmission line, with the circuitry being configured to scan the waveform across a range of times and across a range of voltages to obtain the data for the waveform; and memory to store the data detected by the circuitry.

The invention discloses a chip RF calibration method and system based on an artificial intelligence model, electronic equipment and a storage medium. The chip RF calibration method comprises the steps that S1, a mathematical model is constructed; constructing a chip RF calibration artificial intelligence AI mathematical model; the general-purpose tester is remotely controlled, the general-purpose tester extracts constellation diagram data of different DUTs in a non-air interference state by using VSA, and feature extraction is carried out through AI; s2, a model training step; a deep learning model with the minimum error is obtained through model training; taking the obtained deep learning model as a mathematical model for predicting RF correction parameters; step S3, an RF parameter prediction step; and predicting the RF parameters of the chip by using the constructed mathematical model. According to the chip RF calibration method and system based on the artificial intelligence model, the electronic equipment and the storage medium, RF calibration parameters of various chips can be accurately predicted in real time.

Aspects of this disclosure relate to a power amplifier system with symbol-based envelope tracking and fault protection. The system can include a power amplifier and a voltage modulator. The voltage modulator can include switches configured to provide the bias voltage and to provide electric circuit breaker protection. The voltage modulator can include a fault detection circuit that can cause a switch of the switches to provide electric circuit breaker protection in response to detecting a circuit fault. Related methods and voltage modulators are disclosed.

The invention provides a device aging device and method, and an aging plate in the device aging device is arranged in a heat preservation box, and is connected with a microwave test module and a power supply module outside the heat preservation box, so that the microwave test module and the power supply module provide microwave signals and power required by testing for the aging plate. The aging board is provided with a plurality of test stations, each test station is provided with a plurality of connecting terminals, the first end of each connecting terminal is connected with the connector of the heat preservation box, the aging board is connected with the microwave test module and the power supply module through the connecting terminals and the connector, and in the heat preservation box, the aging board is connected with the microwave test module and the power supply module through the connecting terminals and the connector. And aging at different environment temperatures can be realized. Each aging seat is used for installing a plurality of tested devices, after the plurality of tested devices are installed on the aging seats, the aging seats are installed on the test stations on the aging plate, and the aging plate is provided with the plurality of test stations, so that the plurality of aging seats can be arranged on the aging plate, and batch tested devices can be synchronously subjected to an aging experiment.

The invention discloses a method for eliminating interference of isolator chip radiation on a radio frequency system, which can measure the frequency of a low-frequency RC oscillator in a chip wafer test stage or a packaged finished product test stage, flexibly burn a corresponding frequency control signal of a storage unit according to the requirement of a client product communication system, and improve the reliability of the radio frequency system. Therefore, the local frequency and the harmonic frequency of the isolator chip are adjusted, so that the isolator chip can avoid the communication frequency band of a client. According to the method, a low-temperature-drift RC oscillation circuit is combined with a frequency-locked loop technology, and it is guaranteed that the frequency deviation of a local oscillation signal is controlled within 3% in different process deviations and a full-temperature range. Besides, the frequency of the high-frequency oscillator is accurately adjusted until the frequency is close to the target frequency, and the configuration parameters are stored in the nonvolatile storage module, so that the isolator chip does not interfere with other communication systems in the actual working process, and the stability and the reliability of the whole communication system are improved.

Techniques are provided for calibrating a signal current in a radio frequency signal generator system, such as an arbitrary waveform generator system. An apparatus includes a current measurement circuit and a current imbalance correction circuit. The current measurement circuit is configured to measure a first current in a first signal path of the radio frequency signal generator and to measure a second current in a second signal path of the radio frequency signal generator during a calibration process. The current imbalance correction circuit is configured to adjust a current level in at least one of the first signal path and the second signal path of the radio frequency signal generator to correct an imbalance between the measured first current and the measured second current.

Systems and methods for direct-to-RF (radio frequency) software-defined radio implementation of an active load-pull system are provided. A system may include a controller, a primary field-programmable gate array (FPGA) to control and collect waveform data from vector signal analyzers (VSAs), each comprising an analog-to-digital converter (ADC) connected to an ADC signal-conditioning circuit to directly capture RF measurements of an input signal at an RF fundamental frequency of test and harmonics, each ADC signal-conditioning circuit altering a signal amplitude and isolating a wanted RF frequency of measurement at either the RF fundamental frequency of test or a harmonic to be received by its ADC, first and second couplers generating each input signal by extracting forward and reverse traveling waves at RF from input and output ports of a device under test (DUT), the VSAs capturing the input signals directly at the RF fundamental frequency of test or a harmonic.

A power amplifier integrated circuit with a tunable impedance matching network and associated methods of testing and operation are provided. The power amplifier integrated circuit includes a power amplifier having an output, an output node coupled to the output of the power amplifier, and a tunable impedance matching network. The tunable impedance matching network includes a tunable inductor coupled to the output node. The tunable inductor includes switches configured to selectively modify an inductance of the tunable inductor. The switches may be configured to modify the tunable inductor to have different inductances in respective testing and functional modes.

The invention discloses a 5G microwave amplifier performance test method based on automatic spectrum analysis, and relates to the technical field of data analysis, by introducing a disturbance excitation and recovery behavior comparison mechanism, the short-time dynamic response of an amplifier spectrum is actively induced, the point-by-point difference of a reference spectrum, a disturbed spectrum and a recovery spectrum is analyzed, and the performance of a 5G microwave amplifier is tested. A response-recovery ratio indicator is constructed to identify a local indentation region that is difficult to perceive in the steady-state spectrum. Compared with a traditional method depending on a frequency spectrum smoothing strategy, the method has the advantages that the problem of slight indentation in a high-frequency bandwidth is easy to cover, specific frequency point response is excited through frequency perturbation, power fluctuation or narrow-band interference, and the disturbance response and recovery capability difference of the amplifier become an evaluation basis; therefore, the recognition accuracy of nonlinear response and early failure characteristics is improved, and the stability pre-judgment capability of the 5G amplifier is enhanced.

The invention relates to the technical field of test fixtures, in particular to a radio frequency power amplifier board test fixture which comprises a fixed seat, telescopic guide rods which are symmetrical to each other are fixedly connected to one side of the top of the fixed seat, a pressing plate is fixedly connected to the top ends of the telescopic guide rods, and an electric push rod is fixedly connected between the fixed seat and the pressing plate. A placing groove is formed in the top of the fixing base, a plurality of elastic probe pieces are installed on the pressing plate, the pressing plate which is pressed downwards can drive the elastic probe pieces to move and move towards a radio frequency power amplifier board placed in the placing groove, the elastic probe pieces are made to make contact with the radio frequency power amplifier board, and the radio frequency power amplifier board is placed in the placing groove through elastic components in the elastic probe pieces. The elastic probe piece can be in contact with each element on the radio frequency power amplifier board, so that the phenomenon that the elastic probe piece is not in contact with the element in place is reduced, the test error caused by the fact that the elastic probe piece is not in contact with the element is eliminated to the maximum extent, and the test accuracy of the radio frequency power amplifier board is improved.

A measurement system includes a narrowband receiver configured to receive an input signal with an initial bandwidth. The narrowband receiver includes at least one local oscillator configured to provide a local oscillator signal having a center frequency and at least one signal mixer configured to mix the input signal and the local oscillator signal to obtain a mixed signal including image portions. The mixed signal has a respective center frequency in view of the local oscillator signal mixed therein. The narrowband receiver is configured to process two or more mixed signals, thereby obtaining two or more captured signals for different center frequencies of the local oscillator signal. The two or more captured signals have a limited bandwidth compared to the initial bandwidth. The narrowband receiver is configured to combine the two or more captured signals in order to obtain a processed signal without image portions.

A calibration and impedance synthesis (tuning) method for active load pull systems employs prior calibration and dynamic interpolation routines. Since active load pull systems differ from passive load pull systems in that the device under test (DUT) is part of the tuner, in large signal the tuner cannot be calibrated independently. The new active load pull system comprises an impedance generation algorithm based on prior calibration and dynamic in memory interpolation routines. At small signal levels the procedure is like with passive load pull tuners. At higher power, where the DUT becomes nonlinear, the calibration yields only approximate data. For load pull contour generation this is still adequate.

A fault diagnosis method for the RF front-end circuit of a MIMO system includes using a Synchronous Enhancement Extracting Transform (SEET) to pre-process the acquired fault signal to extract fault feature, creating a fault identification model fused by a complex field based asymmetric convolutional neural network and a complex field based multi-head attention module to assign fault feature weights, extract key feature and identify fault status. The SEET can extract fault feature components, and calculate its real field feature and imaginary field feature to obtain a real field two-dimensional matrix i and an imaginary field two-dimensional matrix q, thus an enhanced time-frequency feature is obtained. The fault identification model is used for a transform from a complex field feature space to a high dimensional space and realizing the assignment of fault feature weights, key features extraction and fault status identification.

A radio frequency conduction test method and a test system are provided. The test method includes: moving a radio frequency test probe to a first pad of a board so as to allow a test signal on the first pad to be transmitted to the radio frequency test probe and then transmitted to a radio frequency test instrument for a radio frequency conduction test, where the test signal in the radio frequency test probe is transmitted to the radio frequency test instrument via an impedance conversion apparatus and a directional coupler, a straight-through output port of the directional coupler is connected to a first measurement port of the radio frequency test instrument, and a coupling output port of the directional coupler is connected to a second measurement port of the radio frequency test instrument.

A two-stage test process for testing IC packages having integrated launchers includes a first stage in which an RF-accurate test process is used to perform RF-accurate tests on a sample set of IC packages to obtain RF-accurate test results and a loop-back test process is performed to obtain loop-back test results. Test characterization data is obtained by comparing the RF-accurate test results to the loop-back test results. In a second stage, larger-scale testing is performed solely with the loop-back test process, and the loop-back test results for each tested IC package are compared with the test characterization data to characterize the test operation of the tested IC package. The loop-back test process can employ a test jig employing a PCB-mounted or PCB-integrated loop-back structure for relatively rapid test setup and test processing.

It is described an RF communication device comprising:i) an RF antenna functionality;ii) at least one antenna pad connected to the RF antenna functionality;iii) a further functionality which is not an RF antenna functionality; andiv) at least one non-antenna pad electrically connected to the further functionality.The antenna pad and the non-antenna pad are arranged to be short-circuited with each other, and the non-antenna pad is electrically connected via a connection line to the further functionality within the RF communication device.Further, a method of manufacturing an RF communication device is described.

The invention discloses a frequency mixer test method, and relates to the technical field of microwave radio frequency test, and the method comprises the following steps: S1, building a test platform; s2, calibrating the test platform; s3, testing indexes; and according to the received reflection signal and standing wave signal, port isolation test, frequency conversion loss test, port standing wave test and output 1dB compression point test are carried out on the mixer to be tested, and a test curve of each index is drawn after the test is completed. According to the method, all key indexes of the mixer can be tested at different power frequency points through one-time calibration, meanwhile, standing wave testing of the LO port under high power can be achieved, the testing efficiency and accuracy are greatly improved, and the technical problems that in the prior art, multiple times of calibration are needed in the testing process, and the testing efficiency is low are solved.

Disclosed is a test device for testing an electric characteristic of an object to be tested. The test device includes a block comprising a probe hole, a probe supported in the probe hole and retractably configured to connect a first contact point and a second contact point, and a coaxial cable comprising an insulated sheath, a main core surrounded with the insulated sheath, and a probe contact portion exposed from the insulated sheath and extended from the main core so as to be in contact with the probe. An axis of the probe is spaced apart from an axis of the coaxial cable, and the probe contact portion is extended from the main core toward the axis of the probe.

Capture time-correlated signals for SI / PI analysis. [Solution] The signal and power analyzer includes a high-bandwidth input channel set as a real-equivalent-time (RET) input channel or a radio frequency (RF) channel, an input channel set as a low-bandwidth real-time (RT) input channel, one or more analog-to-digital converters (ADCs) having multiple pipes, a first set of pipes connected to the high-bandwidth input channel and generating high-bandwidth data, a second set of pipes connected to the low-bandwidth RT input channel and generating low-bandwidth RT data, a system clock circuit 54 connected to the high-bandwidth input channel and the low-bandwidth RT input channel, a memory 34 connected to the system clock circuit 54, the first set of pipes and the second set of pipes, and one or more processors that store the low-bandwidth RT data and high-bandwidth data in the memory 34 and reconcile the high-bandwidth data and low-bandwidth data.

The invention discloses a testing device for a multichannel millimeter wave radio frequency chip, and relates to the technical field of radio frequency chip testing. The device comprises a structural body, a multilayer circuit board fixed on the structural body, and a waveguide cover plate combined with the structural body to form a waveguide. A substrate integrated waveguide and a strip line are integrated in the multilayer circuit board, and vertical conversion between a waveguide signal and an onboard signal is realized through a waveguide-microstrip transition structure. Through the integrated and double-sided design of the structural body, the multilayer board and the radio frequency link, the substrate integrated waveguide is used for vertical transmission of radio frequency signals, and the strip line is used for transmitting power supply and control signals, so that the problems that a traditional testing device is large in size, and ports of a W-waveband multichannel chip are dense and not easy to test are effectively solved; miniaturization, high integration and test convenience of the test device are realized.

A measurement system for active load traction testing and an active load traction measurement method are described. The measurement system comprises a signal analysis module, a signal generator module, a control module and a DUT connector. The DUT connector may be connected to a device under test to receive an output signal of the device under test. The signal analysis module is connected to the DUT connector such that the signal analysis module receives a measurement signal corresponding to the output signal. The signal generator module is configured to generate a radio frequency (RF) test signal. The signal generator module is connected to the DUT connector such that the RF test signal is applied to the device under test. The signal analysis module is configured to digitize the measurement signal to obtain a digitized measurement signal. The control module is configured to control the signal generator module to generate the RF test signal based on the digitized measurement signal, based on known error parameters of an error model of the measurement system, and based on a desired reflection coefficient at a reference plane associated with the device under test.

A wideband variable impedance load for high volume manufacturing qualification and diagnostic testing of a radio frequency power source, an impedance matching network and RF sensors for generating plasma in a semiconductor plasma chamber for semiconductor fabrication processes. The wideband variable impedance load may comprise a fixed value resistance operable at a plurality of frequencies and coupled with a variable impedance network capable of transforming the fixed value resistance into a wide range of complex impedances at the plurality of frequencies. Response times and match tuning element position repeatability may be verified. Automatic testing, verification and qualification of production and field installed radio frequency power sources for plasma generation are easily performed.

A computer-controlled load pull tuner is embedded in a quarter-circle waveguide-to-wafer-probe adapter and creates a compact and handy assembly. The tuner includes two, along the 90-degree arc of the waveguide, sliding carriages, each holding a tuning probe inserted at fixed penetration without cumbersome vertical axis mechanisms. The carriages holding the tuning probes are spring preloaded against the waveguide wall and can tilt, when hitting a stop, lifting the tuning probes out of the waveguide cavity, thus allowing for a low residual reflection and high transmission behavior. On top of full load pull capacity, the assembly can be used for instantaneous s-parameter measurement when the tuning probes are lifted. High-speed calibration and tuning algorithms allow efficient operation.

The invention discloses a broadband power amplifier detection circuit and method based on the resistance voltage division technology, and relates to the technical field of radio frequency signal detection, the detection circuit comprises a broadband power amplifier circuit, a resistance voltage division detection circuit and a digital interface board which are connected in sequence, the broadband power amplifier circuit is used for carrying out power amplification on an input radio frequency signal and outputting the amplified radio frequency signal, and the resistance voltage division detection circuit is used for outputting the amplified radio frequency signal. The resistance voltage-dividing detection circuit is used for carrying out voltage division on the amplified radio-frequency signal to obtain a detection signal and adjusting the size of the detection signal, and the digital interface board is used for comparing the voltage of the detection signal with a preset threshold value to obtain the fault condition of the broadband power amplifier circuit. The problem of in-band unevenness of detection in a traditional microstrip coupling mode is solved through the resistance voltage division detection technology, the in-band unevenness of traditional microstrip coupling detection is about 20 dB, the in-band unevenness of the detection method is only 2 dB, the in-band unevenness of a broadband power amplifier detection circuit is greatly improved, the false alarm rate of radio frequency detection is reduced, and the detection efficiency is improved. Therefore, the accuracy of power detection is improved.

The present invention discloses a method for eliminating the interference of isolator chip radiation on the radio frequency system. The method can measure the frequency of the low-frequency RC oscillator during the chip wafer test or the finished product test stage after packaging, and flexibly burn the corresponding frequency control signal of the storage unit according to the needs of the customer's product communication system to adjust the local oscillator frequency and its harmonic frequency of the isolator chip to avoid the customer's communication frequency band. This method uses a low-temperature drift RC oscillator circuit combined with frequency-locked loop technology to ensure that the frequency deviation of the local oscillator signal is controlled within 3% within different process deviations and the full temperature range. In addition, by accurately adjusting the frequency of the high-frequency oscillator until it is close to the target frequency, and storing these configuration parameters in a non-volatile storage module, the isolator chip will not interfere with other communication systems during actual operation, thereby improving the stability and reliability of the entire communication system.

The invention relates to the technical field of resonators, in particular to a resonator parameter analysis method and system based on artificial intelligence, and the method comprises the steps: generating an ideal coupling matrix of a target resonator according to the center frequency, the passband bandwidth and the in-passband return loss; acquiring a corresponding relationship among an external quality factor, a coupling coefficient between resonant cavities, a coupling window width and a resonant cavity length through electromagnetic simulation or theoretical calculation, constructing a training data set, and training a regression model to predict the coupling window width; obtaining an external quality factor and a coupling coefficient of a target frequency band by utilizing baseband-passband transformation, solving the width of each coupling window through a prediction model, calculating the length of a resonant cavity by combining interpolation and scale transformation to form an initial size, establishing a three-dimensional simulation model to extract a coupling matrix, and iteratively correcting the length of the resonant cavity according to diagonal elements, so as to obtain an initial size; and obtaining a final physical size meeting the index. According to the method, the problems that an existing resonator design and parameter analysis process depends on experience, the number of simulation iterations is large, and the parameter reverse solving efficiency is low can be solved.