121results about "Radiofrequency circuit testing" patented technology

A system comprises a signal generator circuit configured to generate a modulated radio frequency (RF) signal based on a predefined waveform. An output signal path is connected to the signal generator circuit and is connectable to a device under test. A first signal path is connected to the signal generator circuit so as to receive a reference signal corresponding to the modulated RF signal. A second signal path is connectable to the device under test so as to receive a measurement signal from the device under test. A analysis signal path is connected to the first and second signal paths for merging the reference signal and the measurement signal into an analysis signal. A signal analysis circuit is configured to separate the reference signal from the measurement signal for analyzing the analysis signal based on the predefined waveform.

Systems and methods for direct-to-RF (radio frequency) software-defined radio implementation of an active load-pull system are provided. A system may include a controller, a primary field-programmable gate array (FPGA) to control and collect waveform data from vector signal analyzers (VSAs), each comprising an analog-to-digital converter (ADC) connected to an ADC signal-conditioning circuit to directly capture RF measurements of an input signal at an RF fundamental frequency of test and harmonics, each ADC signal-conditioning circuit altering a signal amplitude and isolating a wanted RF frequency of measurement at either the RF fundamental frequency of test or a harmonic to be received by its ADC, first and second couplers generating each input signal by extracting forward and reverse traveling waves at RF from input and output ports of a device under test (DUT), the VSAs capturing the input signals directly at the RF fundamental frequency of test or a harmonic.

The invention discloses a 5G microwave amplifier performance test method based on automatic spectrum analysis, and relates to the technical field of data analysis, by introducing a disturbance excitation and recovery behavior comparison mechanism, the short-time dynamic response of an amplifier spectrum is actively induced, the point-by-point difference of a reference spectrum, a disturbed spectrum and a recovery spectrum is analyzed, and the performance of a 5G microwave amplifier is tested. A response-recovery ratio indicator is constructed to identify a local indentation region that is difficult to perceive in the steady-state spectrum. Compared with a traditional method depending on a frequency spectrum smoothing strategy, the method has the advantages that the problem of slight indentation in a high-frequency bandwidth is easy to cover, specific frequency point response is excited through frequency perturbation, power fluctuation or narrow-band interference, and the disturbance response and recovery capability difference of the amplifier become an evaluation basis; therefore, the recognition accuracy of nonlinear response and early failure characteristics is improved, and the stability pre-judgment capability of the 5G amplifier is enhanced.

The invention discloses a frequency mixer test method, and relates to the technical field of microwave radio frequency test, and the method comprises the following steps: S1, building a test platform; s2, calibrating the test platform; s3, testing indexes; and according to the received reflection signal and standing wave signal, port isolation test, frequency conversion loss test, port standing wave test and output 1dB compression point test are carried out on the mixer to be tested, and a test curve of each index is drawn after the test is completed. According to the method, all key indexes of the mixer can be tested at different power frequency points through one-time calibration, meanwhile, standing wave testing of the LO port under high power can be achieved, the testing efficiency and accuracy are greatly improved, and the technical problems that in the prior art, multiple times of calibration are needed in the testing process, and the testing efficiency is low are solved.

Disclosed is a test device for testing an electric characteristic of an object to be tested. The test device includes a block comprising a probe hole, a probe supported in the probe hole and retractably configured to connect a first contact point and a second contact point, and a coaxial cable comprising an insulated sheath, a main core surrounded with the insulated sheath, and a probe contact portion exposed from the insulated sheath and extended from the main core so as to be in contact with the probe. An axis of the probe is spaced apart from an axis of the coaxial cable, and the probe contact portion is extended from the main core toward the axis of the probe.

Capture time-correlated signals for SI / PI analysis. [Solution] The signal and power analyzer includes a high-bandwidth input channel set as a real-equivalent-time (RET) input channel or a radio frequency (RF) channel, an input channel set as a low-bandwidth real-time (RT) input channel, one or more analog-to-digital converters (ADCs) having multiple pipes, a first set of pipes connected to the high-bandwidth input channel and generating high-bandwidth data, a second set of pipes connected to the low-bandwidth RT input channel and generating low-bandwidth RT data, a system clock circuit 54 connected to the high-bandwidth input channel and the low-bandwidth RT input channel, a memory 34 connected to the system clock circuit 54, the first set of pipes and the second set of pipes, and one or more processors that store the low-bandwidth RT data and high-bandwidth data in the memory 34 and reconcile the high-bandwidth data and low-bandwidth data.

The invention discloses a testing device for a multichannel millimeter wave radio frequency chip, and relates to the technical field of radio frequency chip testing. The device comprises a structural body, a multilayer circuit board fixed on the structural body, and a waveguide cover plate combined with the structural body to form a waveguide. A substrate integrated waveguide and a strip line are integrated in the multilayer circuit board, and vertical conversion between a waveguide signal and an onboard signal is realized through a waveguide-microstrip transition structure. Through the integrated and double-sided design of the structural body, the multilayer board and the radio frequency link, the substrate integrated waveguide is used for vertical transmission of radio frequency signals, and the strip line is used for transmitting power supply and control signals, so that the problems that a traditional testing device is large in size, and ports of a W-waveband multichannel chip are dense and not easy to test are effectively solved; miniaturization, high integration and test convenience of the test device are realized.

The invention relates to the technical field of resonators, in particular to a resonator parameter analysis method and system based on artificial intelligence, and the method comprises the steps: generating an ideal coupling matrix of a target resonator according to the center frequency, the passband bandwidth and the in-passband return loss; acquiring a corresponding relationship among an external quality factor, a coupling coefficient between resonant cavities, a coupling window width and a resonant cavity length through electromagnetic simulation or theoretical calculation, constructing a training data set, and training a regression model to predict the coupling window width; obtaining an external quality factor and a coupling coefficient of a target frequency band by utilizing baseband-passband transformation, solving the width of each coupling window through a prediction model, calculating the length of a resonant cavity by combining interpolation and scale transformation to form an initial size, establishing a three-dimensional simulation model to extract a coupling matrix, and iteratively correcting the length of the resonant cavity according to diagonal elements, so as to obtain an initial size; and obtaining a final physical size meeting the index. According to the method, the problems that an existing resonator design and parameter analysis process depends on experience, the number of simulation iterations is large, and the parameter reverse solving efficiency is low can be solved.

This document describes a test fixture for PCB components. The test fixture includes a pad with holes configured to direct RF energy from the component on the PCB through an end of the PCB to a top clamp of the test fixture. The end of the PCB may correspond to a cut line for destructive testing. The test fixture also includes a top clamp with a test port and a tapered shape configured to direct RF energy from the holes to the test port. The test fixture also includes a bottom clamp attached to the top clamp to hold the PCB between the top and bottom clamps for testing. The test fixture allows for rapid mounting of the PCB and test component without modifying the PCB design or requiring specific drilling of the PCB.

The invention discloses a semiconductor structure and a forming method thereof, and the structure comprises a substrate which comprises a first device region, a second device region, and a loading region located between the first device region and the second device region; the first signal welding pad is located in the loading area; the second signal welding pad is positioned in the loading area at the side part of the first signal welding pad, and the second signal welding pad and the first signal welding pad are arranged along the first direction; a first coil device in the first device region; a second coil device in the second device region; a first signal lead electrically connecting the first coil device and the first signal pad; a second signal lead electrically connecting the first coil device and the second signal pad; a third signal lead electrically connecting the second coil device and the first signal pad; and a fourth signal lead electrically connecting the second coil device and the second signal pad. The accuracy of capacitance values of the first coil device and the second coil device obtained through parasitic capacitance de-embedding is improved, and the accuracy of device coil parameter measurement is improved.

The application discloses a correction and group measurement system and method of radio frequency unit, which comprises a control device, a signal source device, a test platform and a measurement device. The test platform and the measurement device are used for M times of measurement. In each measurement, the microwave signal source provided by the signal source device is converted into a random microwave signal with N random amplitudes and phases by the test platform, and the N radio frequency units placed on the test platform are excited to output each random microwave signal. Each random microwave signal is superimposed on the measured path to form a measurement signal. The measurement device receives the measurement signals of the M times of measurement and converts them into M measurement information respectively. The control device solves the signal of the M measurement information, and performs iteration and convergence calculation on all the solving results to obtain the correction information of the N radio frequency units in a specific state, so as to correct the radio frequency unit by using the correction information.

A test and / or measurement system includes a signal generator module is configured to generate a modulated radio frequency (RF) signal based on a predetermined waveform. The system further includes a signal analysis module is configured to receive an analysis signal via at least one signal path, and wherein the analysis signal corresponds to the modulated RF signal. The analysis signal includes at least one wanted signal portion and at least one unwanted signal portion. The unwanted signal portion corresponds to a spurious signal originating in the due to signal leakage and / or due to reflections. The signal analysis module is configured to identify the unwanted signal portion in the analysis signal based on the predetermined waveform. The signal analysis module further is configured to analyze the analysis signal taking the identified unwanted signal portion into account, thereby obtaining analysis data.

An inspection device is disclosed for inspecting the characteristics of an object under test which has a built-in antenna that emits a wireless signal. The inspection device includes a signal probe whose one end contacts a first terminal of the object under test to transmit an inspection signal, a ground probe which contacts a second terminal of the object under test, a probe support portion which supports the signal probe and the ground probe, and a socket block which corresponds to the antenna of the object under test and has a waveguide that penetrates the longitudinal direction of the signal probe in order to measure the wireless signal in a region different from the probe support portion.

The application discloses a microwave chip testing tool, relates to the technical field of microwave chip testing, and aims to solve the technical problem of insufficient function of clamping equipment in the microwave chip testing tool, and comprises a testing machine table; a conveying assembly is arranged on the testing machine table; a basic transfer assembly is arranged on the testing machine table and is located opposite an output end of the conveying assembly; a plurality of auxiliary tables for energizing operation of microwave chips are arranged below the basic transfer assembly; and a clamping assembly for stable and limited positioning of the microwave chip testing operation is arranged on the side of the auxiliary table. Based on the adjustment and setting of the clamping assembly, the clamping assembly has two different clamping modes, i.e., a flexible clamping state and an elastic retaining state, the two different clamping modes are used to simulate the different thermal expansion coefficients of gallium arsenide and gallium nitride microwave chips in the energizing test, and the functionality of the operation is effectively improved.

The present invention provides a test system and a test method for performing a wireless test on a device under test (500) to obtain electromagnetic radiation performance. The test system includes a support table (100) for supporting the device under test, a plurality of test antennas (200), and a moving mechanism including at least two moving units (300). Each moving unit (300) is provided with a test antenna (200), and the test antennas (200) are arranged to have a predetermined angular interval with respect to the support table (100). The moving mechanism further includes a driving unit for driving the moving unit (300) so that the test antennas (200) reach a plurality of sampling points (600). The sampling points (600) are located at a plurality of different angles with respect to the support table (100), and the angular intervals of the sampling points (600) with respect to the support table (100) are smaller than the predetermined angular intervals.

A radio frequency, RF, frontend (12) for a vector network analyzer, VNA, measurement system (10) is described. The RF frontend (12) comprises a first frontend portion (20) and a second frontend portion (22). The first frontend portion (20) comprises a first directional unit (28) being configured to couple an RF signal traveling towards at least one port (16) out of at least one measurement path (18). The first frontend portion (20) further comprises a second directional unit (34) being configured to couple an RF signal traveling away from the at least one port (16) out of the at least one measurement path (18). The second frontend portion (22) comprises a frequency combining unit (42) and a switching stage (40). The switching stage (40) has a first switching state, wherein the switching stage (40) is configured to forward a stimulus RF signal received by an input port (44) to a common port (46) via a first signal path (50) in the first switching state. The switching stage (40) has a second switching state, wherein the switching stage (40) is configured to forward an RF signal received by the common port (46) to an output port (48) via a second signal path (52) in the second switching state. The frequency combining unit (42) is configured to couple the stimulus RF signal into the at least one measurement path (18). The frequency combining unit (42) further is configured to couple an RF signal traveling away from the at least one port (16) out of the at least one measurement path (18). The second frontend portion (22) comprises a first amplifier (54) that is arranged within the second signal path (52).

A measurement system is described for the comprehensive characterization of millimeter-wave / sub-THz devices under both continuous-wave (CW) and modulated signal excitation. CW measurement setups, which include a vector network analyzer (VNA) and VNA frequency extenders (VNA-EXT) are enhanced by the integration of an IF vector signal generator (VSG) and IF vector signal analyzer (VSA). The measurement system incorporates a processing unit configured and operable to process a modulated test signal to mitigate nonlinear behavior. A linearization algorithm is used to linearize the frequency multipliers within the VNA-EXT, ensuring error-free RF modulated signal generation at a device under test (DUT) input reference plane.

A method for measuring a resonance frequency response of passive microwave devices PMD 316 e.g. dielectric resonator includes transmitting RF signals through the passive microwave device, and measuring the resonance frequency response. One or more dielectric lossless mediums are placed within a distance of the passive microwave device. The distance may be adjusted, or the thickness of the dielectric lossless medium, or the effective permittivity of the dielectric lossless medium may be altered by subjecting it to an electric field. This modifies the effective permittivity of the PMD without directly modifying the PMD itself, which produces a frequency shift the PMD. Measuring the responses before and after this modification enables the resonance frequency response to be determined. An apparatus 300 includes a housing 302 for the PMD 316 and dielectric lossless media 308. A positioning mechanism 310 alters the distance between them. The thickness can be varied by dielectric stacking (611,612,613 Figure 6B). A digital signal processing unit 318 determines the resonance frequency response.

High-frequency test probe device (10) for releasably contacting a, preferably multi-pole, contact partner (50), in particular an H-MTD connector, with an inner housing (1) having an end-side arranged and at least one inner and outer contact (4a, 4b;4c) forming a contact section (4) for interaction with the contact partner (50) for testing purposes, wherein the inner housing (1) is guided in an outer housing (2) of the high-frequency test probe device (10) and relative to it, in particular along a longitudinal axis (L) of the device, such that in a first contact-free relative position the inner housing (1) is arranged in a positionally secure manner about the longitudinal axis (L) of the device in the outer housing (2) and is rotationally fixed, and in a second relative position contacting a contact partner (50) at least a rotation about the longitudinal axis (L) of the device and / or a tilting in a plane perpendicular to the longitudinal axis (L) of the device is enabled, characterized in that the outer housing (2) has on a side facing the contact section (4) of the inner housing (1) a sleeve-like guide section (11) with guide means (11a) formed on its inner circumferential surface for interaction with the inner housing (1).

A test and / or measurement system (10) is described. The test and / or measurement system (10) comprises a signal generator module (16), wherein the signal generator module (16) is configured to generate a modulated radio frequency, RF, signal based on a predetermined waveform. The test and / or measurement system further comprises a signal analysis module (34), wherein the signal analysis module (34) is configured to receive an analysis signal via at least one signal path, and wherein the analysis signal corresponds to the modulated RF signal. The analysis signal comprises at least one wanted signal portion, wherein the at least one wanted signal portion is a portion of the analysis signal to be analyzed. The analysis signal further comprises at least one unwanted signal portion, wherein the at least one unwanted signal portion corresponds to a spurious signal originating in the test and / or measurement system (10) due to signal leakage and / or due to reflections. The signal analysis module (34) is configured to identify the at least one unwanted signal portion in the analysis signal based on the predetermined waveform. The signal analysis module (34) further is configured to analyze the analysis signal taking the identified at least one unwanted signal portion into account, thereby obtaining analysis data.

A radio frequency, RF, frontend (12) for a vector network analyzer, VNA, measurement system (10) is described. The RF frontend (12) comprises a first frontend portion (20) and a second frontend portion (22). The first frontend portion (20) comprises a first directional unit (28) being configured to couple an RF signal traveling towards at least one port (16) out of at least one measurement path (18). The first frontend portion (20) further comprises a second directional unit (34) being configured to couple an RF signal traveling away from the at least one port (16) out of the at least one measurement path (18). The second frontend portion (22) comprises a frequency combining unit (42) and a switching stage (40). The switching stage (40) has a first switching state, wherein the switching stage (40) is configured to forward a stimulus RF signal received by an input port (44) to a common port (46) via a first signal path (50) in the first switching state. The switching stage (40) has a second switching state, wherein the switching stage (40) is configured to forward an RF signal received by the common port (46) to an output port (48) via a second signal path (52) in the second switching state. The frequency combining unit (42) is configured to couple the stimulus RF signal into the at least one measurement path (18). The frequency combining unit (42) further is configured to couple an RF signal traveling away from the at least one port (16) out of the at least one measurement path (18). The second frontend portion (22) comprises a first amplifier (54) that is arranged within the second signal path (52).

An evaluation device includes a holder that holds the radio communication module, a measurement antenna that transmits and receives radio waves for measurement, and a temperature regulator that adjusts a temperature of the radio communication module. The temperature regulator is in direct or in indirect contact with the radio communication module so as to be capable of transferring heat.

Multi-band remotely configurable tuning probes for slide screw impedance tuners allow instantaneous larger frequency coverage beyond the capacity of existing tuning probes using the single horizontal and vertical axis mechanism of a prior art single probe, single band tuner. This is done by carving multiple slugs of different length and frequency coverage as segments of a disc-shaped revolving slab, which rotates inside the legs of a captive unit and locks at distinct angles. The captive unit is attached to the vertical control mechanism of the tuner and rotation is ensured using multiple traverse lateral studs on the disc unit and a set of vertical studs on the slabline close to the idle port of the tuner. An automated procedure ensures remote switching between tuning slugs. Calibration and tuning is as in prior art single probe tuners.

A radio frequency, RF, front end (12) for a vector network analyzer, VNA, measurement system (10) is described. The RF front end (12) includes a first front end portion (20) and a second front end portion (22). The first front end portion (20) comprises a first orientation unit (28) configured to couple an RF signal traveling toward the at least one port (16) out of the at least one measurement path (18). The first front end portion (20) further comprises a second directional unit (34) configured to couple RF signals traveling away from the at least one port (16) out of the at least one measurement path (18). The second front end portion (22) includes a frequency combining unit (42) and a switching stage (40).

In a general aspect, vapor cells are disclosed that include a dielectric body and an optical window. The dielectric body has a cavity and an exterior surface that defines an opening to the cavity. The optical window includes a substrate and first and second multilayer coatings. In some aspects, the substrate has first and second substrate surfaces on opposite sides of the substrate, and the first and second multilayer coatings are disposed on, respectively, the first and second substrate surfaces. The first multilayer coating defines a first window surface that is bonded to the exterior surface of the dielectric body and extends across the opening. The second multilayer coating defines a second window surface that faces an exterior of a vapor cell. The first and second multilayer coatings apply, respectively, first and second stresses to the substrate, with the second stress counteracting the first stress.

A system includes a clock generator circuit configured to generate a clock signal and a capture start circuit configured to generate a capture start signal based on the clock signal. A measurement circuit is configured to receive the capture start signal from the capture start circuit and to digitize an RF signal based on the capture start signal, thereby obtaining a digitized RF signal. The system further includes a signal analysis circuit that is configured to determine at least one signal parameter of the digitized RF signal. The system further includes a signal prediction circuit that is configured to generate at least one predicted signal parameter based on a first starting point and based on a second starting point. The system further includes a signal comparison circuit configured to compare the at least one signal parameter of the digitized RF signal with the at least one predicted signal parameter.

What is needed is an improved signal transmission system that can preserve the bandwidth, accuracy, and fidelity of all of the high speed differential signals under severe common mode and environmental conditions.SOLUTION: Optical probing systems transmit high fidelity analog signals from a device under test (DUT) to a measurement instrument. The system receives a differential input signal and splits the differential input signal into a high frequency (HF) component and a low frequency (LF) component. Each component is independently modulated using a different analog modulation technique and transmitted over a separate optical fiber. The architecture maintains galvanic isolation between the input and output devices and allows for independent transmission of signal portions optimized for bandwidth and accuracy. The signals are demodulated, delay-matched, and recombined in the analog domain to produce a reconstructed full-bandwidth output.SELECTED DRAWING: Figure 3

The invention discloses a radio frequency power amplifier detection protection system and a detection protection method thereof, and belongs to the technical field of radio frequency power amplifiers. Comprising a power sampling unit, the input end of the power sampling unit is connected with the output end of a radio frequency power amplifier, and the output end of the power sampling unit is connected with the input end of a sampling processing unit and the input end of a load. The output end of the sampling processing unit is connected with the input end of the processing judgment unit, the processing judgment unit carries out subtraction operation and comparison judgment on voltage analog signals output by the sampling processing unit, the output end of the processing judgment unit is connected with the input end of the radio frequency power amplifier, and an alarm signal is sent to the radio frequency power amplifier through the processing judgment unit. According to the invention, the sampling processing unit is used for converting the detection microstrip output reflection power signal and the forward output power signal into the voltage analog signal, so that the radio frequency power amplifier detection system equipment is integrated in a small size.

The application discloses a kind of calibration chip sets for calibrating error factor of chip to be measured, the calibration chip set includes short-circuit calibration chip, open-circuit calibration chip, matching load calibration chip and straight-through calibration chip, any calibration chip in the calibration chip set is identical with the size of the chip to be measured, wherein the test pin of the short-circuit calibration chip is short-circuit connected with the ground metal layer itself;The test pin of the open-circuit calibration chip is open between the ground metal layer itself;The test pin of the matching load calibration chip is connected with the ground metal layer itself through load resistance;Two test pins of the straight-through calibration chip are electrically connected between the two test pins of the straight-through relationship on the straight-through calibration chip.The calibration chip used in the application directly sets the calibration reference surface of the vector network analyzer at the pin of the packaged chip, without additional consideration of the parasitic parameter introduced by the test fixture, improves the test accuracy of the chip, simplifies the calibration step and test data processing process.

The invention relates to the technical field of semiconductors, and provides a microwave power divider, a high-frequency PCB substrate, a test board and a chip test system. According to the microwave power divider, power division networks from the first stage to the Nth stage are cascaded in sequence to form an N-stage cascaded structure, and N is greater than or equal to 2; the first-stage power division network comprises a first-stage main transmission line and a first-stage two-path power division unit; the first end of the first-stage main transmission line is connected with the input port, and the second end of the first-stage main transmission line is connected with the first-stage two-path power division unit through a first balance resistor; and the Nth-stage power division network comprises 2N-1 Nth-stage two-path power division units, and the two Nth-stage two-path power division units are respectively connected with the (N-1) th-stage two-path power division unit through an Nth balance resistor. The microwave power divider provided by the invention can adapt to the miniaturization and lightweight installation requirements of high-frequency communication equipment, can meet the simultaneous test of a plurality of radio frequency chips of the same model or different models, and can ensure the quality of high-frequency signals input to each radio frequency chip.