442results about "Radiofrequency circuit testing" patented technology

The invention discloses a radio frequency on-chip test system and a radio frequency on-chip test method. The radio frequency on-chip test system comprises a probe temperature adjusting module, an instantaneous pulse acquisition module, a dynamic compensation module, a thermal isolation module, radio frequency measurement equipment and a bearing platform. Wherein the probe temperature adjusting module is used for independently adjusting the temperature of a probe to a target value; the instantaneous pulse acquisition module is used for transmitting a radio frequency pulse signal and acquiring a radio frequency parameter when the probe is in contact with the normal temperature calibration sheet; the dynamic compensation module dynamically corrects the radio frequency parameters based on the real-time temperature of the probe; the thermal isolation module is used for reducing heat exchange between the probe and the external environment; the radio frequency measuring equipment is used for collecting and analyzing the radio frequency parameters; the bearing platform is used for bearing the normal temperature calibration sheet or the device to be tested. Through the synergistic effect of multiple modules, the problem of test errors caused by temperature fluctuation is effectively solved, and the precision and stability of radio frequency on-chip test are remarkably improved.

The invention provides a radio frequency chip high-frequency performance test process and a clamp. The radio frequency chip high-frequency performance test process comprises the following steps: S1, welding a crimping shaft sleeve to one end of a radio frequency cable; by adopting the scheme of combining the coaxial cable and the PCB, the PCB part can be used for digital signal transmission and product power supply, and the coaxial cable is used for radio frequency signal transmission, so that the microwave interference caused by the use of a PCB microstrip line and the signal influence caused by 90-degree switching between the conductive part and a PCB plane microstrip can be reduced, the high-frequency test requirement of a radio frequency chip is met, and the test efficiency is improved. Through the crimping mode, the problems of long welding time, high operation requirements, unmaintainability and the like in the welding process are solved, the situation that after a radio frequency cable is heated for a long time, the high-frequency test index of the clamp is affected is avoided, the independently designed elastic conductive film serves as a transmission elastic carrier of the clamp, the influence of the conductive film on the radio frequency index is reduced to the minimum, and the reliability of the clamp is improved. The fixture is suitable for double-sided chip layout, and the top of the fixture is also provided with a test assembly, so that double-sided radio frequency chip test can be realized.

A measurement system includes a signal analysis circuit, a signal generator circuit, a control circuit, and a DUT connector. The DUT connector is connectable to a device under test for receiving a measurement signal outputted by the DUT. The signal analysis circuit is connected to the DUT connector for receiving the measurement signal. The signal generator circuit is configured to generate a radio frequency (RF) test signal that is transmitted to the DUT. The signal analysis circuit is configured to digitize the measurement signal, thereby obtaining a digitized measurement signal. The control circuit is configured to control the signal generator circuit to generate the RF test signal based on the digitized measurement signal, based on known error parameters of an error model of the measurement system, and based on a desired reflection coefficient at a reference plane associated with the DUT.

The invention provides a microwave superheterodyne frequency sweep measurement system based on Rydberg atoms, and belongs to the technical field of microwave frequency measurement. The laser module excites detection light of 780 nm and coupling light of 480 nm, and the two beams of light are reversely input into the atomic gas chamber through the dichroscope; signal microwaves are generated by a radio frequency signal source and are radiated to the position of the atomic gas chamber through the horn antenna; local oscillation microwaves are generated by the microwave module and are also radiated to the position of the atomic gas chamber through the horn antenna; the atomic gas chamber serves as a mixer to form a difference frequency signal; the spectrum analyzer is used for monitoring low-frequency difference frequency signals generated in the frequency mixing process in real time and recording signal intensity in real time. According to the invention, high-precision and wide-band microwave frequency measurement is realized, continuous and smooth frequency sweeping response can be provided in a frequency range, and absolute frequency detection of microwave signals is realized under the condition that a complex frequency comb technology is not introduced. The hardware architecture is simplified, the automation degree is improved, and integration, popularization and application are facilitated.

The invention discloses a vector frequency conversion phase automatic test system and method, and the system is characterized in that a switch matrix is in communication connection with a frequency conversion TR assembly, and is used for switching a switch link to a test channel corresponding to the current to-be-tested phase test type of the frequency conversion TR assembly; a port of the change-over switch is respectively connected with a vector network analyzer and a reference mixer, and the change-over switch is used for switching a signal connection channel between the vector network analyzer and the reference mixer according to a current to-be-tested phase test type of the frequency conversion TR assembly; and the vector network analyzer is in communication connection with the switch matrix and is used for receiving to-be-tested data from the test channel switched by the switch matrix and completing a phase test on the frequency conversion TR assembly in combination with the reference mixer. The switching of the signal connection channel between the vector network analyzer and the reference mixer can be realized according to the current phase test type without pulling out a cable joint, and the automatic test efficiency is improved.

A system comprises a signal generator circuit configured to generate a modulated radio frequency (RF) signal based on a predefined waveform. An output signal path is connected to the signal generator circuit and is connectable to a device under test. A first signal path is connected to the signal generator circuit so as to receive a reference signal corresponding to the modulated RF signal. A second signal path is connectable to the device under test so as to receive a measurement signal from the device under test. A analysis signal path is connected to the first and second signal paths for merging the reference signal and the measurement signal into an analysis signal. A signal analysis circuit is configured to separate the reference signal from the measurement signal for analyzing the analysis signal based on the predefined waveform.

Example automatic test equipment (ATE) includes a transmitter to output a waveform to a transmission line; circuitry to detect data for the waveform on the transmission line, with the circuitry being configured to scan the waveform across a range of times and across a range of voltages to obtain the data for the waveform; and memory to store the data detected by the circuitry.

The invention discloses a chip RF calibration method and system based on an artificial intelligence model, electronic equipment and a storage medium. The chip RF calibration method comprises the steps that S1, a mathematical model is constructed; constructing a chip RF calibration artificial intelligence AI mathematical model; the general-purpose tester is remotely controlled, the general-purpose tester extracts constellation diagram data of different DUTs in a non-air interference state by using VSA, and feature extraction is carried out through AI; s2, a model training step; a deep learning model with the minimum error is obtained through model training; taking the obtained deep learning model as a mathematical model for predicting RF correction parameters; step S3, an RF parameter prediction step; and predicting the RF parameters of the chip by using the constructed mathematical model. According to the chip RF calibration method and system based on the artificial intelligence model, the electronic equipment and the storage medium, RF calibration parameters of various chips can be accurately predicted in real time.

The present disclosure relates to a test and / or measurement system. The test and / or measurement system comprises a base unit which comprises: an LO signal source configured to generate an LO signal, a first LO port and a second LO port, wherein the LO signal source is connected to the first LO port and the second LO port, and an LO measurement device. The test and / or measurement system further comprises: a first external frontend which is connected to the first LO port of the base unit via a first cable, and which is configured to receive a first fraction of the LO signal from the first LO port, wherein the first external frontend comprises one or more calibration standards; and a second external frontend which is connected to the second LO port of the base unit via a second cable, and which is configured to receive a second fraction of the LO signal from the second LO port, wherein the second external frontend comprises one or more calibration standards. The test and / or measurement system is operable in a calibration mode in which: the first external frontend is configured to connect the first LO port with one of its one or more calibration standards, the second external frontend is configured to connect the second LO port with one of its one or more calibration standards, and the LO measurement device is configured to measure: the LO signal which is generated by the LO signal source, a reflection of the first fraction of the LO signal received at the first LO port, and a reflection of the second fraction of the LO signal received at the second LO port.

The present disclosure relates to a measurement device for characterizing a device-under-test, DUT. The device includes an RF signal generator to generate test signals in parallel. The test signals each have a different frequency. A signal path connects the RF signal generator to a port of the measurement device. The port is connected to the DUT. The signal path feeds test signals to the port and receives response signals of the DUT from the port. The device includes a measurement unit; a forward coupler connected to the signal path and forwards at least a part of each of the test signals to the measurement unit; and a reverse coupler is connected to the signal path and forwards at least a part of the response signals to the measurement unit. The measurement unit simultaneously measures the forwarded parts of the test and response signals, each in amplitude and phase.

Aspects of this disclosure relate to a power amplifier system with symbol-based envelope tracking and fault protection. The system can include a power amplifier and a voltage modulator. The voltage modulator can include switches configured to provide the bias voltage and to provide electric circuit breaker protection. The voltage modulator can include a fault detection circuit that can cause a switch of the switches to provide electric circuit breaker protection in response to detecting a circuit fault. Related methods and voltage modulators are disclosed.

A calibration and group testing system for RF units and a method therefor are provided. The system includes a control device, a signal source device, a test platform, and a measurement device. M times of measurements are performed between the test platform and the measurement device. For each measurement, a microwave signal source is converted into random microwave signals with N random amplitudes and phases, and the RF units are respectively stimulated to output the random microwave signals superimposed on a measured path to form a measurement signal. The measurement device receives measurement signals of the M times of measurements and converts them into M pieces of measurement information, respectively. The control device solves the measurement information and performs iterative and convergent calculations on all solution results to obtain calibration information of the RF units in a specific state, thereby correcting the RF units according to the calibration information.

The invention provides a device aging device and method, and an aging plate in the device aging device is arranged in a heat preservation box, and is connected with a microwave test module and a power supply module outside the heat preservation box, so that the microwave test module and the power supply module provide microwave signals and power required by testing for the aging plate. The aging board is provided with a plurality of test stations, each test station is provided with a plurality of connecting terminals, the first end of each connecting terminal is connected with the connector of the heat preservation box, the aging board is connected with the microwave test module and the power supply module through the connecting terminals and the connector, and in the heat preservation box, the aging board is connected with the microwave test module and the power supply module through the connecting terminals and the connector. And aging at different environment temperatures can be realized. Each aging seat is used for installing a plurality of tested devices, after the plurality of tested devices are installed on the aging seats, the aging seats are installed on the test stations on the aging plate, and the aging plate is provided with the plurality of test stations, so that the plurality of aging seats can be arranged on the aging plate, and batch tested devices can be synchronously subjected to an aging experiment.

The invention discloses a method for eliminating interference of isolator chip radiation on a radio frequency system, which can measure the frequency of a low-frequency RC oscillator in a chip wafer test stage or a packaged finished product test stage, flexibly burn a corresponding frequency control signal of a storage unit according to the requirement of a client product communication system, and improve the reliability of the radio frequency system. Therefore, the local frequency and the harmonic frequency of the isolator chip are adjusted, so that the isolator chip can avoid the communication frequency band of a client. According to the method, a low-temperature-drift RC oscillation circuit is combined with a frequency-locked loop technology, and it is guaranteed that the frequency deviation of a local oscillation signal is controlled within 3% in different process deviations and a full-temperature range. Besides, the frequency of the high-frequency oscillator is accurately adjusted until the frequency is close to the target frequency, and the configuration parameters are stored in the nonvolatile storage module, so that the isolator chip does not interfere with other communication systems in the actual working process, and the stability and the reliability of the whole communication system are improved.

Techniques are provided for calibrating a signal current in a radio frequency signal generator system, such as an arbitrary waveform generator system. An apparatus includes a current measurement circuit and a current imbalance correction circuit. The current measurement circuit is configured to measure a first current in a first signal path of the radio frequency signal generator and to measure a second current in a second signal path of the radio frequency signal generator during a calibration process. The current imbalance correction circuit is configured to adjust a current level in at least one of the first signal path and the second signal path of the radio frequency signal generator to correct an imbalance between the measured first current and the measured second current.

A high-frequency component test device including a test key and a test module is provided. The test key includes a front-level key and a back-level key which are arranged symmetrically and have the same electrical length and characteristic impedance. The test module is used to measure an S parameter of the front-level key and the back-level key connected directly and an S parameter of a structure where a device under test (DUT) is added between the front-level key and the back-level key. The test module performs S parameter calculation in the frequency domain and converts the S parameter into an ABCD parameter matrix, and then obtains an ABCD parameter of a de-embedded DUT using a matrix root-opening operation and an inverse matrix operation.

The present disclosure relates to a measurement system comprising a vector analyzer (VNA), at least one remote frontend, and a cable connection connecting the at least one frontend to the VNA. The VNA comprises at least one signal source generating a RF signal and providing the RF signal via the cable connection to the at least one remote frontend. The remote frontend includes at least one measurement port for connecting a device under test (DUT) and transmitting the RF signal to the DUT, and at least one directive element. The at least one directive element couples out a transmitted portion of the RF signal and a reflected portion of the RF signal received at the at least one measurement port for measuring the transmitted portion and the reflected portion of the RF signal. The remote frontend further includes at least one dedicated calibration circuit connected between the at least one directive element and the at least one measurement port. The at least one dedicated calibration circuit provides calibration standards for calibrating the measurement system.

Systems and methods for direct-to-RF (radio frequency) software-defined radio implementation of an active load-pull system are provided. A system may include a controller, a primary field-programmable gate array (FPGA) to control and collect waveform data from vector signal analyzers (VSAs), each comprising an analog-to-digital converter (ADC) connected to an ADC signal-conditioning circuit to directly capture RF measurements of an input signal at an RF fundamental frequency of test and harmonics, each ADC signal-conditioning circuit altering a signal amplitude and isolating a wanted RF frequency of measurement at either the RF fundamental frequency of test or a harmonic to be received by its ADC, first and second couplers generating each input signal by extracting forward and reverse traveling waves at RF from input and output ports of a device under test (DUT), the VSAs capturing the input signals directly at the RF fundamental frequency of test or a harmonic.

The invention discloses a radio frequency chip test electromagnetic shielding box, and belongs to the field of electromagnetic shielding boxes. Comprising a shielding box body, a bearing plate body is arranged in the shielding box body, the right side of the shielding box body is rotationally connected with a hollow screw tube through a rotating shaft, the right end of the hollow screw tube extends into the shielding box body, the outer side wall of the hollow screw tube is in threaded connection with a threaded sleeve, and a fixing block is fixedly connected to the front of the right side in the shielding box body. The outer side wall of the fixing block is rotationally connected with a concave piece through a rotating shaft, and the rear surface of the concave piece is fixedly connected with an inclined abutting piece. The bearing plate body is used for placing a radio frequency chip and can slide in the shielding box body to form a radio frequency chip protection shell together, the cover plate is inserted into the inner side of the clamping seat through the insertion box on the cover plate and can be clamped into the clamping opening through the clamping block, so that the cover plate can cover the shielding box body, the closed shielding effect of the radio frequency chip is achieved, and the service life of the radio frequency chip is prolonged. And the subsequent test is facilitated.

A system for wireless power reception, preferably including one or more: antennas, dynamic impedance matches, RF-DC converters, DC impedance converters, and / or DC power outputs. A method for wireless power reception, preferably including: receiving power wirelessly at an antenna, dynamically adjusting an input impedance of a dynamic impedance match coupled to the antenna, and / or delivering the power to a load.

A power amplifier integrated circuit with a tunable impedance matching network and associated methods of testing and operation are provided. The power amplifier integrated circuit includes a power amplifier having an output, an output node coupled to the output of the power amplifier, and a tunable impedance matching network. The tunable impedance matching network includes a tunable inductor coupled to the output node. The tunable inductor includes switches configured to selectively modify an inductance of the tunable inductor. The switches may be configured to modify the tunable inductor to have different inductances in respective testing and functional modes.

The invention discloses a 5G microwave amplifier performance test method based on automatic spectrum analysis, and relates to the technical field of data analysis, by introducing a disturbance excitation and recovery behavior comparison mechanism, the short-time dynamic response of an amplifier spectrum is actively induced, the point-by-point difference of a reference spectrum, a disturbed spectrum and a recovery spectrum is analyzed, and the performance of a 5G microwave amplifier is tested. A response-recovery ratio indicator is constructed to identify a local indentation region that is difficult to perceive in the steady-state spectrum. Compared with a traditional method depending on a frequency spectrum smoothing strategy, the method has the advantages that the problem of slight indentation in a high-frequency bandwidth is easy to cover, specific frequency point response is excited through frequency perturbation, power fluctuation or narrow-band interference, and the disturbance response and recovery capability difference of the amplifier become an evaluation basis; therefore, the recognition accuracy of nonlinear response and early failure characteristics is improved, and the stability pre-judgment capability of the 5G amplifier is enhanced.

The invention relates to the technical field of test fixtures, in particular to a radio frequency power amplifier board test fixture which comprises a fixed seat, telescopic guide rods which are symmetrical to each other are fixedly connected to one side of the top of the fixed seat, a pressing plate is fixedly connected to the top ends of the telescopic guide rods, and an electric push rod is fixedly connected between the fixed seat and the pressing plate. A placing groove is formed in the top of the fixing base, a plurality of elastic probe pieces are installed on the pressing plate, the pressing plate which is pressed downwards can drive the elastic probe pieces to move and move towards a radio frequency power amplifier board placed in the placing groove, the elastic probe pieces are made to make contact with the radio frequency power amplifier board, and the radio frequency power amplifier board is placed in the placing groove through elastic components in the elastic probe pieces. The elastic probe piece can be in contact with each element on the radio frequency power amplifier board, so that the phenomenon that the elastic probe piece is not in contact with the element in place is reduced, the test error caused by the fact that the elastic probe piece is not in contact with the element is eliminated to the maximum extent, and the test accuracy of the radio frequency power amplifier board is improved.

A measurement system includes a narrowband receiver configured to receive an input signal with an initial bandwidth. The narrowband receiver includes at least one local oscillator configured to provide a local oscillator signal having a center frequency and at least one signal mixer configured to mix the input signal and the local oscillator signal to obtain a mixed signal including image portions. The mixed signal has a respective center frequency in view of the local oscillator signal mixed therein. The narrowband receiver is configured to process two or more mixed signals, thereby obtaining two or more captured signals for different center frequencies of the local oscillator signal. The two or more captured signals have a limited bandwidth compared to the initial bandwidth. The narrowband receiver is configured to combine the two or more captured signals in order to obtain a processed signal without image portions.

A calibration and impedance synthesis (tuning) method for active load pull systems employs prior calibration and dynamic interpolation routines. Since active load pull systems differ from passive load pull systems in that the device under test (DUT) is part of the tuner, in large signal the tuner cannot be calibrated independently. The new active load pull system comprises an impedance generation algorithm based on prior calibration and dynamic in memory interpolation routines. At small signal levels the procedure is like with passive load pull tuners. At higher power, where the DUT becomes nonlinear, the calibration yields only approximate data. For load pull contour generation this is still adequate.

The invention relates to the technical field of radio frequency microwave measurement, in particular to a tested piece harmonic test link and an active load traction system and method.The system comprises a control module and a test link. Determining a test signal value of the vector signal source in the test link and a phase adjustable signal value of the first adjustable phase vector signal source according to the target mismatch degree; then, a plurality of impedance points on the Smith chart are simulated by adjusting the amplitude and the phase of the first adjustable phase vector signal source, the vector signal source is controlled to send out a test signal value, and the first adjustable phase vector signal source is controlled to send out a phase adjustable signal value, so that a tested piece is tested; and finally, obtaining a harmonic value corresponding to each impedance point, and obtaining the maximum harmonic of the tested piece under the target mismatch degree according to the harmonic value corresponding to each impedance point. According to the invention, the impedance adjusting range and precision are higher, and the adjusting speed is higher.

A fault diagnosis method for the RF front-end circuit of a MIMO system includes using a Synchronous Enhancement Extracting Transform (SEET) to pre-process the acquired fault signal to extract fault feature, creating a fault identification model fused by a complex field based asymmetric convolutional neural network and a complex field based multi-head attention module to assign fault feature weights, extract key feature and identify fault status. The SEET can extract fault feature components, and calculate its real field feature and imaginary field feature to obtain a real field two-dimensional matrix i and an imaginary field two-dimensional matrix q, thus an enhanced time-frequency feature is obtained. The fault identification model is used for a transform from a complex field feature space to a high dimensional space and realizing the assignment of fault feature weights, key features extraction and fault status identification.

A method for manufacturing a first radio-frequency (RF) device, including: receiving a substrate having the first RF device, wherein the first RF device has a signal port for receiving or transmitting RF signals with an input impedance greater than ten times an input impedance of a testing tool; causing a probe assembly to connect to the signal port and the testing tool; and causing the probe assembly to connect to a first terminal of a resistive element having a resistance equal to the input impedance.

A system can comprise a radio unit comprising a digital front end chain. The system can further comprise a tap point disposed within the digital front end chain, wherein the tap point is configured to time align a signal at the tap point with a system time of the radio unit. The system can further comprise a first hardware component that is configured to selectively read the signal at the tap point to produce a read signal. The system can further comprise a second hardware component that is configured to store the read signal.

A radio frequency conduction test method and a test system are provided. The test method includes: moving a radio frequency test probe to a first pad of a board so as to allow a test signal on the first pad to be transmitted to the radio frequency test probe and then transmitted to a radio frequency test instrument for a radio frequency conduction test, where the test signal in the radio frequency test probe is transmitted to the radio frequency test instrument via an impedance conversion apparatus and a directional coupler, a straight-through output port of the directional coupler is connected to a first measurement port of the radio frequency test instrument, and a coupling output port of the directional coupler is connected to a second measurement port of the radio frequency test instrument.