The invention discloses a selector unit for
dynamic switching of a standard unit, a
ring oscillator and a
test structure. Wherein the selector unit is connected in parallel with standard units with different threshold voltages, driving capabilities and logic functions, and is matched with the first switch
control circuit, so that flexible switching of the differentiated standard units is realized, and the static architecture limitation of a traditional test circuit is broken through; according to the
ring oscillator, a selector unit is embedded into a closed oscillation loop of a standard unit chain, a
time sequence path of multiple unit combinations is formed through dynamic configuration, and the
delay superposition effect between mixing units in an actual circuit is effectively simulated; the
test structure is based on the configurable characteristic of the
ring oscillator, combines a pin sharing mechanism of the first
control signal multiplexing module, realizes parallel test of multiple unit combinations in a
single chip, and eliminates multi-
chip separate
test requirements, so that a high-efficiency and high-coverage standard
unit delay detection
system is realized under the constraint of hardware resources, and the
test efficiency is improved. And a
verification basis is provided for deviation analysis of the
process simulation model.