45 results about "Test element" patented technology

Insert (40) for a test contactor (1) for testing an electrically conductive test element (10), - wherein the insert (40) comprises several contact elements (8) which are designed to electrically contact the electrically conductive test element (10) in the test state of the test contactor (1), - wherein the insert (40) comprises a plurality of openings (67), wherein the openings (66) are arranged on an upper side of the insert (40) facing the test element (10) in the test state, - wherein in the test state at least one pin (68) is arranged in at least one opening (67) of the plurality of openings (67) such that the insert has a coding for a test element (10) corresponding to the coding.

Provided are a test element group (TEG) device and a cryogenic intrinsic characteristic analysis method for quantitatively assessing impact of a high-k-based passivation layer on an electrical characteristic of a device in a two-dimensional (2D) field effect transistor (FET) structure. Herein, to analyze a FET device that includes a channel of a 2D material and a passivation layer of a high-k material, a first FET device in which the passivation layer is arranged in a first direction with respect to the channel and a second FET device in which the passivation layer is arranged in a second direction different from the first direction with respect to the channel may be prepared. The first and second charge amounts trapped in the passivation layers in the first and second FET devices, respectively, may be compared to assess quantitative impact of the shape of the passivation layer on the FET device.

The embodiment of the invention provides a carbon dioxide convective heat transfer coefficient testing system and method. The testing system comprises a filling module, a circulation loop unit and a data module. The circulation loop unit comprises a main pipeline, a circulation pump, a first flow regulating valve, a flow meter, a pressure regulating valve, a first heating temperature controller, a micro-channel test assembly and a carbon dioxide cooler which form a loop; the micro-channel testing assembly comprises a testing element with a micro-channel, a second heating temperature controller arranged on the outer wall surface of the micro-channel of the testing element, a plurality of temperature detectors, a first pressure detector, a first temperature detector, a second temperature detector and a second pressure detector; the filling module is connected to an inlet of the main pipeline and used for boosting the carbon dioxide working medium and filling the carbon dioxide working medium into the circulation loop unit, and the data module is electrically connected with the circulation loop unit. The micro-channel convective heat transfer coefficient can be directly obtained, the system is simple, the cost is low, and the test precision is high.

A display device includes: a substrate including a display area and a test area located adjacent the display area; a pixel arranged in the display area on the substrate and including a pixel transistor and a light-emitting element connected to the pixel transistor; and a unit test element arranged in the test area on the substrate and including a test active pattern. The unit test element includes: a first test element including a test transistor which includes the test active pattern, and a first pad portion connected to the test transistor; a second test element including the test active pattern and a second pad portion and a third pad portion which are connected to the test active pattern; and a third test element including test active pattern and a fourth pad portion connected to the test active pattern. The first to third test elements share the same test active pattern.

The utility model relates to the related technical field of electronic component testing, in particular to a batch tester for discharge tubes, which comprises a detection table, a test element is embedded on one side of the detection table, a combined mechanism is arranged on one side of the surface of the detection table, and a fixing mechanism is arranged at one end of the detection table. According to the batch tester for the discharge tubes, through the arrangement of the combined mechanism, when detection needs to be carried out and after a test element is installed, the test element is connected with an external detection device through a connector surrounding a connecting line, and then the two ends of a first pneumatic pump and the two ends of a second pneumatic pump are connected to the test element; and the processor is connected with an external power supply, so that an operator can send a control instruction to the processor through the first button and the second button so as to drive the first pneumatic pump and the second pneumatic pump to start at the same time to finish the test, and meanwhile, a test result is transmitted to an external detection device through the surrounding connecting line.

The invention discloses a thermal sensitive element jump judgment device for a dynamic thermal test of a fire-fighting sprinkler head, relates to the technical field of fire-fighting part detection equipment, and is used for testing the response performance of the fire-fighting sprinkler head. The device comprises a shell, a test piece mounting seat, a jump judgment mechanism and a plunger, the jump judgment mechanism comprises an elastic pressure applying assembly and a conductive detection assembly, a ceramic insulation ejector rod is sleeved with a stainless steel compression spring, after a test element is mounted, the spring is compressed to apply a preset load, and meanwhile high-temperature electric leakage is avoided; the conductive detection assembly forms a loop through the wire lug, the switch nut and the conductive material part, and the spring resets to trigger the loop to be conducted after the element jumps. The test piece mounting base is detachable and adapts to fire sprinkler heads of different specifications, the device is compact in structure, jumping judgment is accurate and free of lag, the problems that manual observation lags and recording errors are large in a traditional device are effectively solved, and the device is suitable for static action temperature testing of the fire sprinkler heads.

The utility model discloses a detection phantom, and relates to the technical field of model moulds, the detection phantom comprises a housing, a test element, an elastic member and a movable member, the housing is provided with a mounting cavity arranged along a first direction opening; a test element is placed in the mounting cavity; the elastic piece is arranged at the bottom of the mounting cavity, abuts against one side of the test element in the first direction and is used for applying elastic force to the test element in the opening direction of the mounting cavity; the movable part is detachably installed at the opening position of the installation cavity, one end of the movable part in the first direction abuts against the other side of the test element in the first direction, and the movable part has a moving stroke in the first direction. According to the technical scheme provided by the utility model, the detection element is moved to a desired to-be-detected position through position adjustment of the movable part, and then the detection element is fixed through common clamping of the elastic part and the movable part, so that the stability of the die body is improved.

A pet drinking water dispenser characterized in that it comprises a drinking water dispenser body, wherein the drinking water dispenser body includes a housing, a battery arranged on the housing, a water pump arranged in the housing, a filter insert arranged in the housing, a main board electrically connected to the battery and the water pump respectively, a test board electrically connected to the main board, a test element arranged on the test board and projecting outwards, a test connection structure connected between the test board and the main board, a power supply connection structure connected between the battery and the main board, and a water supply connection structure connected between the main board and the water pump.

The invention provides a test element group, a display panel, a preparation method of a display panel and a display device, relates to the technical field of display, and solves the problem that the lap joint condition of a cathode of a display product cannot be determined in the prior art. The test element group comprises a substrate, a leading-out structure, a supporting structure, a plurality of isolation structures and a test electrode, the leading-out structure is located on one side of the substrate, and the supporting structure is located on one side, deviating from the substrate, of the leading-out structure; the plurality of isolation structures comprise a first isolation structure and a second isolation structure which are arranged on the side, away from the substrate, of the supporting structure and are arranged at intervals, and the first isolation structure and the second isolation structure are electrically connected with the leading-out structure; each of the first isolation structure and the second isolation structure comprises a first part and a second part; the first part comprises a first side wall and a second side wall, the orthographic projection of the first side wall on the substrate is located in the orthographic projection of the supporting structure on the substrate, and the second side wall protrudes out of the supporting structure; the test electrode is in lap joint with the first side wall and is separated from the second side wall.

The application discloses a component performance test method and system, and relates to the technical field of automatic test. Theoretical parameter intervals of target test components are predicted according to target output voltage intervals and other related parameters. If actual parameters of the target test components exceed the theoretical parameter intervals during the test, it is determined that the performance of the target test components is poor. Therefore, the cause of substandard test data can be quickly determined, time wasted in repeated parameter adjustment and retest is saved, and test efficiency is improved.

The invention discloses a test carrier plate and a test method. The test carrier plate comprises a first lead, a second lead, a third lead, a slot and a switch. The first wire transmits a first test signal. The second wire transmits a second test signal. The third wire transmits a sensing signal. The slot is used for arranging a to-be-tested element. The switch provides a first test signal or a second test signal to the element to be tested, and comprises a first pin and a second pin. The first pin is electrically connected with the first wire. The second pin is electrically connected with the second and third wires.

A test element and a method of manufacturing the same are disclosed. The test element may include: a base layer; a bank on a portion of the base layer; a first layer on the base layer and on the bank; a photoresist layer on the first layer, the photoresist layer including a patterned region; and a second layer on the photoresist layer. A height of a first region of the first layer on the bank may be higher than a height of a second region of the first layer on the base layer.

A test socket and a method for manufacturing the same are disclosed, which can effectively prevent deformation during repeated testing while reducing adhesion of the test element, terminal damage, and repulsion force on the test element. A test socket according to an embodiment of the present invention comprises: a conductive part array including a plurality of conductive parts arranged spaced apart along a horizontal direction; a first insulating part formed between the plurality of conductive parts, insulating the plurality of conductive parts and supporting the conductive part array; a supporting film having a film through hole formed vertically at each position corresponding to the plurality of terminals of the test element; and a second insulating part interposed between the first insulating part and the supporting film, provided to have a hardness lower than that of the supporting film and higher than that of the first insulating part.

The invention provides a test key, a test structure and a test method, which are applied to the technical field of semiconductors. In the invention, test keys are divided into m test element groups, sub-gate lines in a test structure in each test element group are divided into n groups, and then each sub-gate line group in a plurality of test structures in each test element group is led out through m * n first interconnection lines and is connected to m * n different gate test pads, so that the test elements are tested. And then a stepping voltage test breakdown voltage is applied to the single or multiple gate test pads, so that the purpose of testing different gate oxide areas by selecting the combination of different gate test pads under the same test key is achieved.

The arrangement 10 comprises a thermoelectric device 14 with two dielectric plates (15(a), 15(b)) and two fans (16(a), 16(b)) connected to each of the dielectric plates (15(a) / 15(b)) and a voltage point for receiving a voltage. The arrangement 10 comprises a plurality of thermoelectric devices 14 connected via a communication means such that at least one device 14 is positioned near the component 12 to be tested and the plurality of thermoelectric devices 14 are supplied with a voltage to generate a temperature required for testing the component 12.

A testing device for high-load impact and surge pulse comprises a control box, a testing seat arranged on the control box and a testing plate clamped on the testing seat and used for installing an element to be tested. The test seat comprises a test seat body, a test cavity extending downwards from the top surface of the test seat body and a plurality of test probe assemblies arranged in the test cavity at intervals, each test probe assembly comprises two test probes oppositely arranged in the test cavity, and a plurality of conductive strip assemblies are arranged on the test plate at intervals. The plurality of conductive strip assemblies are in one-to-one correspondence with the plurality of test probe assemblies, each conductive strip assembly comprises a first conductive strip and a second conductive strip which are respectively opposite to the two test probes, and two ends of the test element are respectively connected with the first conductive strip and the second conductive strip; compared with an existing test mode, the test mode provided by the utility model has the advantages that the safety risk caused by an external lead is avoided, and meanwhile, the problem of low efficiency of the existing test mode is avoided; therefore, the test efficiency is improved, and the test safety can be ensured at the same time.

The invention relates to a temperature-control mount (10) for receiving a strip-like test element (12) having an optical reagent test zone (22) to which a sample of bodily fluid can be applied by a proband for self-testing, the temperature-control mount (10) comprising a flat base plate (40) adapted to support a single test element (12), a thermal element (16) arranged on the base plate (40) in a stacked configuration and configured for providing heating power and / or cooling power to the test element (12) when mounted thereupon, a positioning unit (18) adapted to ensure a predefined alignment of the test element (12) on the thermal element (16), a controller (20) configured for temperature control at least of the test zone (22) via the thermal element (16) and a power supply (24) to deliver electrical energy to the thermal element (16) and the controller (20).

The invention relates to the technical field of semiconductor testing, and discloses a semiconductor element aging test method and system, and the method is applied to an aging test system comprising an aging test board, a test station, and an automatic feeding and discharging mechanism. The method comprises the following steps: completing feeding and test station butt joint of an aging test board loaded with a to-be-tested element, starting an aging test process, and collecting test parameters of the to-be-tested element in real time; performing multi-level cross validation on the test parameters, and outputting a grading result including individual failure judgment and board-level fault judgment; executing hierarchical control according to a hierarchical result, synchronously executing power cut-off and physical isolation actions when an individual fails, and triggering a fault board to be automatically replaced when a board-level fault occurs; and after the test is completed, finished product discharging and new board feeding are executed. According to the invention, the judgment precision and operation safety of the aging test are improved, automatic continuous operation of the test process is realized, and the test efficiency is effectively improved.

The utility model provides a vibration damping performance testing tool. The vibration damping performance testing tool comprises a first mounting seat and a second mounting seat corresponding to the first mounting seat, a mounting groove for mounting a to-be-tested element is formed in the first mounting seat, and the first mounting seat is arranged on a test bed of the vibration damping performance test equipment; wherein the top of the to-be-tested element mounted in the mounting groove is higher than the preset height of the top surface of the mounting groove; and the second mounting seat is provided with a limiting groove which corresponds to the mounting groove and is matched with the upper section of the to-be-tested element, and the second mounting seat is connected with the first mounting seat through a positioning pin and is used for limiting the upper section of the to-be-tested element. Through the design of the first mounting seat, the second mounting seat, the mounting groove, the limiting groove and the like, the to-be-tested element can be effectively fixed on the vibration damping performance test equipment, so that the to-be-tested element is prevented from deviating, sliding or jumping on a test bed of the vibration damping performance test equipment; therefore, the accuracy of the vibration damping performance test result of the to-be-tested element is improved.

1. Name of the product in this design: Test Element (for Battery Testing). 2. Purpose of this design: A test element for testing hard-shell lithium-ion batteries, used to connect the test port and test sensor. 3. The key design feature of this product is its shape. 4. The image or photograph that best illustrates the design's key points: 3D view 1.

The utility model relates to the field of testing, in particular to testing equipment which comprises a circulating conveying assembly, at least one testing seat, a dust removal device, a cleaning device, a carrying device, a testing device and a control device, and the testing seat is controlled to move along the circulating conveying assembly; the test seat bears the to-be-tested element, the test device is electrically connected with the test seat to detect the to-be-tested element to form test result information, and the control device controls at least one of the dust removal device, the cleaning device and the carrying device to operate based on the test result information. And the test seat is automatically maintained, tested and replaced, so that the working efficiency is improved.

According to one or more embodiments of the disclosure, an apparatus comprising a plurality of active regions on a semiconductor substrate, an active bridge region connecting two active regions among the plurality of active regions, and a plurality of test circuit elements on the active bridge region and the two active regions.

The application discloses a test element group and a test method. The test element group comprises: a plurality of output drivers, an IO node end of each output driver is electrically connected with a data IO end of a memory, and is used for testing output signal quality of the data IO end. Each output driver comprises a pull-up driver and a pull-down driver. The pull-up driver comprises a plurality of P-type transistors, and the pull-down driver comprises a plurality of N-type transistors. By designing that the plurality of output drivers are electrically connected with DQ ends of the memory respectively, high level and low level are input from the DQ ends of the memory respectively, and different transistors in the output drivers are selectively turned on, so that a plurality of current values can be measured. Since the current values can reflect output signal quality of a single DQ end, whether the output signal quality of the single DQ end is good or bad can be accurately judged. Moreover, a chip problem can be detected early in a TEG stage, so that a chip end face is corrected, and test cost and time are saved.

A display device includes a display area and a test area disposed adjacent to the display area and a first test element disposed on a substrate in the test area. The first test element includes a first pad part including a first-first voltage pad, a first-second voltage pad, a first current pad, and a first ground pad, a first test pattern electrically connecting the first-first voltage pad and the first ground pad, and a second test pattern contacting the first test pattern and electrically connecting the first current pad and the first-second voltage pad. In an area where the first test pattern and the second test pattern contact each other, a direction of a first current that flows into the first ground pad and a direction of a second current that flows into the first-first voltage pad are opposite to each other.

The utility model discloses a kind of heat pipe heat exchange and flow resistance performance integration test device of strengthening heat transfer, comprising: atmospheric device, hot air inlet collection section, test section, hot air outlet collection section, hot air inlet pressure P1 detection port, hot air inlet temperature T1 detection port, water temperature T0 detection port blow-off port, hot air outlet pressure P2 detection port, hot air temperature T2 detection port, blow-off port and water level gauge.Temperature field is more uniform, higher testing accuracy, while reducing safety risk;Adopt multi-point temperature pressure monitoring, heat exchange and flow resistance performance can be measured simultaneously;The measured element and test section are connected using thread, different test elements can be conveniently replaced, test cost is reduced and test time is reduced;Adopting atmospheric volumetric test system water temperature keeps boiling state, keeps temperature constant, different operating conditions can be simulated by adjusting air intake parameter, and performance test result is more accurate.

Method for testing at least one electrical insulating device (2, 3), in particular for a high-voltage storage device, comprising the steps: - Providing at least one electrical insulating device (2, 3) between a punch (5) of a test device and a test element (6) of the test device; - Introducing at least one particle (11), in particular a metal particle, between the punch (5) and the test element (6); - Pressing the stamp (5) onto the test element (6) with a test force; - Applying an electrical test voltage between the punch (5) and the test element (6); - Monitoring of a test current between the punch (5) and the test element (6).

The application discloses a pixel structure measuring device and method. The pixel structure measuring device comprises a test element group, a disconnecting unit and an electrical measuring unit; the test element group is electrically connected with the source, the drain and the gate of a second thin film transistor in a pixel structure to be measured; the disconnecting unit is used for disconnecting the source of a third thin film transistor from a shared voltage dividing wire and disconnecting the drain of the third thin film transistor from the drain of the second thin film transistor; the electrical measuring unit is electrically connected with the test element group and is used for obtaining an electrical characteristic measurement value of the second thin film transistor according to a measurement signal of the test element group. The application can avoid the influence of the shared voltage dividing wire and the voltage dividing effect of the third thin film transistor on the second thin film transistor, let the signal collected by the test element group be the independent and real electrical signal of the second thin film transistor, and make the electrical signal of the second thin film transistor measured by the electrical measuring unit finally be real and accurate.

The application relates to the field of semiconductor processing, and discloses a photomask, a manufacturing method thereof, and an exposure method. The photomask comprises a first pattern area and a first cutting path area surrounding the first pattern area, the first cutting path area has a first test element group mark, and a side of the first test element group mark and an edge adjacent to the first test element group mark in the first cutting path area have a first gap in the width direction of the first cutting path area. In the photomask, the side of the first test element group mark and the edge adjacent to the first test element group mark in the first cutting path area have the first gap, that is, the first test element group mark and the first pattern area have the first gap, in the manufacturing process of the photomask, photoresist in the second scanning separates the metal, so that the metal in the first gap is removed, and no extra metal is left on the photomask, thereby avoiding the influence of the residual metal on the chip pattern area of a wafer.

Fluid connection device (1) comprising: - a plug connector (2) ; - a socket connector (4) that can be coupled to the plug connector (2) by interlocking it; wherein the socket connector (4) contains: a hollow body (7) that defines a cavity (5) which develops in the longitudinal direction between at least a first end (6) for connection to the plug connector (2) and a second end; and a connection test unit (10) mounted on the body (7), wherein this test unit (10) includes a test element (11) which includes an optical security element (13), wherein the test element (11) is movably mounted with respect to the body (7) between a reading position in which the optical security element (13) is fully readable outside the body (7) and a concealment position in which the optical security element (13) is unreadable, wherein the test element (11) is configured to be in the reading position when the plug connector (2) and socket connector (4) are coupled; wherein the test unit (10) also includes a return element (20) of the test element (11) to the concealed position, characterized in that at least a part (22) of the reset element (20) covers at least a part of the optical safety element (13) when the test element (11) is in a position other than the reading position in order to prevent the readability of the entirety of the optical safety element (13), wherein the return element (20) of the test element (10) is a single piece.

Insert (40) for a test contactor (1) for testing an electrically conductive test element (10), - wherein the insert (40) comprises several contact elements (8) which are designed to electrically contact the electrically conductive test element (10) in the test state of the test contactor (1), - wherein the insert (40) is designed in multiple parts, such that the insert (40) has an upper insert element (50) facing the test element (10) in the test state and a lower base section (60) facing away from the test element (10) in the test state, - wherein the insert element (50) is attached to the base section (60) by means of an elastically restorable fastening element (42), - wherein the insert element (50) has a translational degree of freedom relative to the base section (60) essentially in the top-bottom direction (H).