The invention discloses a testing device for an arm sleeve of a
semiconductor chip transfer
robot, and relates to the technical field of robots, the testing device comprises a testing platform, a controller and a grabbing module, the grabbing module is connected with the controller through a
signal line, the controller is installed on the left side of the outer wall of the testing platform, and the grabbing module is installed on the upper side of the outer wall of the testing platform. The grabbing module comprises a storage box, a lifting rod, a rotating shaft, a first moving
assembly and a grabbing motor, the lifting rod, the rotating shaft and the first moving
assembly are connected with the grabbing motor through a connecting shaft, and the grabbing motor is connected with the controller through a
signal line. By installing the grabbing module, the multi-scene grabbing
simulation function is achieved, the problems that the environment interferes with the test result, the adjustment time is long and the
test scene is single are solved, different test scenes can be set, the coverage range of grabbing test is widened, manual intervention is reduced, and the
test efficiency and the test precision are improved.